CN218546944U

CN218546944U - Chip test socket assembly

Info

Publication number: CN218546944U
Application number: CN202222809856.6U
Authority: CN
Inventors: 陶品岳; 陶柳; 杨镇武
Original assignee: Suzhou Ensbei Electronic Technology Co ltd
Current assignee: Suzhou Ensbei Electronic Technology Co ltd
Priority date: 2022-10-25
Filing date: 2022-10-25
Publication date: 2023-02-28
Anticipated expiration: 2032-10-25

Abstract

The utility model belongs to the technical field of the chip testing technique and specifically relates to a chip test seat subassembly, including the chip test seat, the top fixedly connected with vertical cylinder of chip test seat, the inner wall clearance fit of vertical cylinder has the chip, the top of vertical cylinder is equipped with the diaphragm. Through the chip test seat, the chip, the riser, the straight board, the bolt, the riser, the block, the round bar, the cooperation of diaphragm and promotion structure, the spring drives the montant and moves down, the montant drives the push pedal and moves down, the push pedal compresses tightly the chip, make the chip that is located the bottom can contact with chip test seat, and then can test the chip of bottom, after the test is accomplished, promote the push rod right, the push rod releases the chip of bottom from one side top opening part of chip test seat, two drive push rods left movement of spring resume the normal position, the push pedal continues the downward promotion with the chip, and then make next chip and chip test seat contact, and then realize the continuous test to the chip, save test time, and the improvement work efficiency.

Description

Chip test socket assembly

Technical Field

The utility model relates to a chip test technical field specifically is a chip test seat subassembly.

Background

Before the chip is packaged, manufactured and delivered from a factory, multiple testing procedures are required to screen and eliminate defective products, the quality of chip products is maintained, the cost of subsequent product maintenance is avoided to be increased, and a chip testing seat is required to be used when the chip is tested.

When testing the chip, place the chip in the recess of chip test seat, compress tightly the chip through the apron, testing the chip, accomplish the back with the chip test, taking out the chip, carry out the test of next chip, and once when testing the chip, need open the apron incessantly and put into the chip at the lock, and then comparatively extravagant test time, work efficiency is low.

SUMMERY OF THE UTILITY MODEL

The utility model aims at solving the shortcoming that the chip is not convenient for carry out the continuous test to the chip among the prior art, extravagant test time, work efficiency is low, and a chip test seat subassembly that proposes.

In order to achieve the above object, the utility model provides a following technical scheme:

the design is a chip testing seat assembly which comprises a chip testing seat, wherein a vertical cylinder is fixedly connected to the top of the chip testing seat, a chip is arranged on the inner wall of the vertical cylinder in a clearance fit mode, a transverse plate is arranged above the vertical cylinder, and a pushing structure is arranged on one side of the transverse plate.

Preferably, the pushing structure includes spring one, montant, push pedal, push rod, spring two and crosspiece, the outer wall top of montant and one side inner wall clearance fit of diaphragm, the outer wall top clearance fit of montant has spring one, the upper and lower both ends of spring one respectively with the outer wall top of montant and top one side fixed connection of diaphragm, the bottom fixedly connected with push pedal of montant, the bottom of push pedal is laminated with the top of chip mutually, one side of montant is equipped with the push rod, the outer wall of push rod and one side top inner wall clearance fit of chip test seat, the inner wall slip joint of push rod has the crosspiece, the rear end of crosspiece and one side top inner wall fixed connection of chip test seat, the one end fixedly connected with spring two of crosspiece, the one end of spring two and the inner wall one end fixed connection of push rod.

Preferably, one side inner wall fixedly connected with round bar of diaphragm, the outer wall below of round bar is connected with the straight plate through the bearing rotation.

Preferably, one end of the straight plate is fixedly connected with the upper part of one side of the vertical cylinder, and the bottom of the round rod is fixedly connected with the block body.

Preferably, the inner wall of one end of the block body is connected with a vertical block through a bolt thread, and the top of the vertical block is fixedly connected with one side of the bottom of the straight plate.

The utility model provides a pair of chip test seat subassembly, beneficial effect lies in: through the chip test seat, the chip, the vertical cylinder, the straight plate, the bolt, the riser block, the round bar, the cooperation of diaphragm and promotion structure, make the device when using, can drive the montant downstream through the spring, the montant drives the push pedal downstream, the push pedal compresses tightly the chip, make the chip that is located the bottom can contact with the chip test seat, and then can test the chip of bottom, after the test is accomplished, promote the push rod right, the push rod is released the chip of bottom from one side top opening part of chip test seat, two drive push rods move the recovery normal position left, the push pedal continues the chip to promote downwards, and then make next chip and chip test seat contact, and then realize the continuous test to the chip, save test time, and the operating efficiency is improved.

Drawings

FIG. 1 is a schematic structural view of the present invention;

FIG. 2 is a schematic view of the structure of the straight plate, the round bar and the transverse plate of the present invention;

FIG. 3 is a schematic structural view of the bolt, vertical block and block body of the present invention;

FIG. 4 is a schematic structural view of the push rod, the second spring and the cross block of the present invention;

fig. 5 is the schematic view of the first spring, the vertical rod and the horizontal plate of the present invention.

In the figure: 1. chip test seat, 2, promote structure, 201, spring one, 202, montant, 203, push pedal, 204, push rod, 205, spring two, 206, horizontal piece, 3, chip, 4, riser, 5, straight board, 6, bolt, 7, riser, 8, block, 9, round bar, 10, diaphragm.

Detailed Description

The present invention will be further explained with reference to the accompanying drawings:

referring to figures 1-5: in the embodiment, a chip test socket assembly, including chip test socket 1, chip test socket 1's top fixedly connected with vertical section of thick bamboo 4, chip test socket 1's one side top processing has the opening, vertical section of thick bamboo 4's inner wall clearance fit has chip 3, vertical section of thick bamboo 4's top is equipped with diaphragm 10, one side inner wall fixedly connected with round bar 9 of diaphragm 10, it is connected with straight board 5 to rotate through the bearing below the outer wall of round bar 9, can rotate at the inner wall of straight board 5 when the bearing makes round bar 9 atress, one end of straight board 5 and one side top fixed connection of vertical section of thick bamboo 4, the bottom fixedly connected with block 8 of round bar 9, the outer wall top fixedly connected with handle of round bar 9, the one end inner wall of block 8 has vertical block 7 through 6 threaded connection of bolt, the design can fix a position push pedal 203 like this, the top of vertical block 7 and the bottom one side fixed connection of straight board 5, one side of diaphragm 10 is equipped with and promotes structure 2, it realizes the continuous test to chip 3 to promote structure 2, save test time, and improve work efficiency.

The pushing structure 2 comprises a first spring 201, a vertical rod 202, a push plate 203, a push rod 204, a second spring 205 and a transverse block 206, wherein the upper part of the outer wall of the vertical rod 202 is in clearance fit with the inner wall of one side of the transverse plate 10, the vertical rod 202 can move up and down on the inner wall of one side of the transverse plate 10 when being stressed, the first spring 201 is in clearance fit with the upper part of the outer wall of the vertical rod 202, the spring 201 gives downward movement to the vertical rod 202, the upper end and the lower end of the first spring 201 are respectively fixedly connected with the upper part of the outer wall of the vertical rod 202 and one side of the top of the transverse plate 10, the bottom of the vertical rod 202 is fixedly connected with the push plate 203, the bottom of the push plate 203 is attached to the top of the chip 3, one side of the vertical rod 202 is provided with the push rod 204, the outer wall of the push rod 204 is in clearance fit with the upper inner wall of one side of the chip testing seat 1, the inner wall of the push rod 204 is slidably clamped with the transverse block 206, the transverse block 206 plays a limiting role when the push rod 204 is stressed, the rear end of the transverse block 206 is fixedly connected with the inner wall of the chip 1, one side of the transverse block 203 which is fixedly connected with the inner wall of the push rod 204, one end of the spring 205 which is fixedly connected with the inner wall of the push rod 204, the chip 1, the push rod 203, the chip 202, the push rod 203 is in contact with the chip 1, the chip 202, the push rod 202, the chip can drive the chip 1, the push plate 202, the chip to move downwards, and then the chip 3 at the bottom can be tested, after the test is finished, the push rod 204 is pushed rightwards, the push rod 204 pushes the chip 3 at the bottom out of the opening at the upper side of one side of the chip test seat 1, the second spring 205 drives the push rod 204 to move leftwards to restore the original position, the push rod 204 continuously pushes the chip 3 downwards, and then make next chip 3 and chip test seat 1 contact, and then realize the continuous test to chip 3, save test time, improve work efficiency.

The working principle is as follows:

firstly, a chip 3 is placed on the inner wall of a vertical cylinder 4, a round rod 9 is rotated, the round rod 9 drives a transverse plate 10 to rotate, the transverse plate 10 drives a vertical rod 202 to rotate, a push plate 203 is located above the vertical cylinder 4, meanwhile, the round rod 9 drives a block body 8 to rotate, after the rotation is completed, a bolt 6 is rotated, the bolt 6 enters the inner walls of a vertical block 7 and the block body 8, and further positioning of the push plate 203 is achieved, a spring I201 drives the vertical rod 202 to move downwards, the vertical rod 202 drives the push plate 203 to move downwards, the push plate 203 is in contact with the chip 3, and further the chip at the bottom can be tested, after the test is completed, a push rod 204 is pushed rightwards, the chip 3 at the bottom is pushed out from an opening above one side of a chip test seat 1 by the push rod 204, a spring II 205 drives the push rod 204 to move leftwards to recover the original position, the chip 3 is continuously pushed downwards by the push plate 204, and further the next chip 3 is in contact with the chip test seat 1, and further continuous testing of the chip 3 is achieved.

While the invention has been shown and described with reference to a preferred embodiment, it will be understood by those skilled in the art that various changes in form and detail may be made therein without departing from the scope of the appended claims.

Claims

1. A chip test socket assembly comprises a chip test socket (1), and is characterized in that: the top fixedly connected with vertical cylinder (4) of chip test seat (1), the inner wall clearance fit of vertical cylinder (4) has chip (3), the top of vertical cylinder (4) is equipped with diaphragm (10), one side of diaphragm (10) is equipped with promotion structure (2).

2. The chip test socket assembly of claim 1, wherein: promote structure (2) including spring one (201), montant (202), push pedal (203), push rod (204), spring two (205) and horizontal piece (206), the outer wall top of montant (202) and one side inner wall clearance fit of diaphragm (10), the outer wall top clearance fit of montant (202) has spring one (201), the upper and lower both ends of spring one (201) respectively with the outer wall top of montant (202) and top one side fixed connection of diaphragm (10), the bottom fixedly connected with push pedal (203) of montant (202), the bottom of push pedal (203) is laminated with the top of chip (3), one side of montant (202) is equipped with push rod (204), the outer wall of push rod (204) and one side top inner wall clearance fit of chip test seat (1), the inner wall slip joint of push rod (204) has horizontal piece (206), the rear end of horizontal piece (206) and one side inner wall top fixed connection of chip test seat (1), the one end fixedly connected with spring two (205) of push rod (204), the one end of fixed connection of spring two (204).

3. The chip test socket assembly of claim 1, wherein: one side inner wall fixedly connected with round bar (9) of diaphragm (10), the outer wall below of round bar (9) is rotated through the bearing and is connected with straight board (5).

4. The chip test socket assembly of claim 3, wherein: one end of the straight plate (5) is fixedly connected with the upper part of one side of the vertical cylinder (4), and the bottom of the round rod (9) is fixedly connected with a block body (8).

5. The chip test socket assembly of claim 4, wherein: the inner wall of one end of the block body (8) is connected with a vertical block (7) through a bolt (6) in a threaded manner, and the top of the vertical block (7) is fixedly connected with one side of the bottom of the straight plate (5).