CN218497040U - Test device and test system - Google Patents
Test device and test system Download PDFInfo
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- CN218497040U CN218497040U CN202222422307.3U CN202222422307U CN218497040U CN 218497040 U CN218497040 U CN 218497040U CN 202222422307 U CN202222422307 U CN 202222422307U CN 218497040 U CN218497040 U CN 218497040U
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Abstract
The utility model provides a testing arrangement and test system, include: the device comprises a test antenna, a test instrument, a bearing table, an amplifier and a radio frequency cable; the test antenna is connected with the test instrument, and the amplifier is connected with the test instrument and the tested device through the radio frequency cable; the test instrument is used for outputting a test signal and/or receiving a signal sent by the tested device; the test antenna is used for sending a test signal to the tested device and/or sending a received signal sent by the tested device to the test instrument; the amplifier is used for amplifying the test signal and sending the amplified test signal to the tested device. The utility model provides high testing arrangement's efficiency of software testing.
Description
Technical Field
The utility model belongs to the technical field of the wireless capability test technique and specifically relates to a testing arrangement and test system are related to.
Background
An amplifier, or radio frequency amplifier, is an electronic device used to increase signal power, a very important component in wireless communication systems, and is often used as an enhancer downstream of a signal generator to increase signal level. The ideal amplifier is a linear device, but in practice, the amplifier behaves as a linear amplification only to a limited extent. The dynamic range of an amplifier refers to the ratio of the amplified small signal level to the large signal level without distortion of the amplifier, which is usually expressed in dB as the difference in the levels of the two signals. Given a sufficiently strong input signal, a linear system will reach a critical point that deviates from the linear relationship between input and output, at which point the system can be considered to enter compression or begin to saturate. When the critical point is exceeded, there is no longer an effective linear relationship between the input and the output and the amplifier is no longer considered linear. The output power of the amplifier cannot be increased infinitely, and when the input power of the amplifier is increased to a certain value, the input power is increased again, so that the output power cannot be changed, which is called the saturated output power of the power amplifier and is the upper limit of the output power of the amplifier. Currently, when testing the wireless performance of a Device Under Test (DUT), the loss of the rf cable affects the testing efficiency.
SUMMERY OF THE UTILITY MODEL
In view of this, the present invention provides a testing apparatus and a testing system to improve the testing efficiency of the testing apparatus.
In order to achieve the above object, the embodiment of the present invention adopts the following technical solutions:
in a first aspect, an embodiment of the present invention provides a testing apparatus, including: the device comprises a test antenna, a test instrument, a bearing table, an amplifier and a radio frequency cable; the device under test comprises a bearing table, an amplifier, a test antenna, a test instrument, a test antenna, a radio frequency cable and a test instrument, wherein the bearing table is used for bearing the device under test, the distance between the amplifier and the bearing table is smaller than the distance between the amplifier and the test instrument, the test instrument is connected with the test antenna and the device under test, and the amplifier is connected with the test instrument and the device under test through the radio frequency cable; the test instrument is used for outputting a test signal and/or receiving a signal sent by the tested device; the test antenna is used for sending a test signal to the tested device and/or sending a received signal sent by the tested device to the test instrument; the amplifier is used for amplifying the test signal and sending the amplified test signal to the device under test.
In one embodiment, a radio frequency cable includes: the device comprises an instrument end radio frequency cable and a tested device end radio frequency cable; the instrument end radio frequency cable is used for connecting the input port of the amplifier and the output port of the test instrument; the device-under-test end radio frequency cable is used for connecting the output port of the amplifier with the device under test; the length of the instrument end radio frequency cable and the length of the tested device end radio frequency cable are smaller than the length of the instrument end radio frequency cable.
In one embodiment, the test device further comprises: a coupler; the input port of the coupler is connected with the output port of the amplifier, the main output port of the coupler is connected with the device to be tested, and the coupling loop port of the coupler is connected with the test instrument.
In one embodiment, the test device further comprises: a radio frequency switch; the radio frequency switch is respectively connected with the main output port of the coupler and at least one tested device.
In one embodiment, the carrier is a rotatable turntable.
In one embodiment, the amplifier is disposed on the stage.
In one embodiment, a test meter comprises: a signal generator or a vector network analyzer.
In a second aspect, an embodiment of the present invention provides a test system, including: the test apparatus of any one of the first aspect, and at least one device under test.
The embodiment of the utility model provides a following beneficial effect has been brought:
the embodiment of the utility model provides an above-mentioned testing arrangement and test system, include: the device comprises a test antenna, a test instrument, a bearing table, an amplifier and a radio frequency cable; the test antenna is connected with the test instrument, and the amplifier is connected with the test instrument and the tested device through the radio frequency cable; the test instrument is used for outputting a test signal and/or receiving a signal sent by the tested device; the test antenna is used for sending a test signal to the tested device and/or sending a received signal sent by the tested device to the test instrument; the amplifier is used for amplifying the test signal and sending the amplified test signal to the tested device. Among the above-mentioned testing arrangement, the amplifier is connected tester and device under test respectively, sends the test signal that test instrument sent to the device under test after enlargiing to the amplifier sets up around the plummer to can reduce the cable length of connecting amplifier and device under test, and then reduce test signal's loss, improve efficiency of software testing.
Additional features and advantages of the invention will be set forth in the description which follows, and in part will be obvious from the description, or may be learned by practice of the invention. The objectives and other advantages of the invention will be realized and attained by the structure particularly pointed out in the written description and claims hereof as well as the appended drawings.
In order to make the aforementioned and other objects, features and advantages of the present invention comprehensible, preferred embodiments accompanied with figures are described in detail below.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the embodiments or the technical solutions in the prior art will be briefly described below, and it is obvious that the drawings in the following description are some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to these drawings without creative efforts.
Fig. 1 is a schematic structural diagram of a testing apparatus according to an embodiment of the present invention;
fig. 2 is a schematic structural diagram of another testing apparatus according to an embodiment of the present invention;
fig. 3 is a schematic view of a testing apparatus according to an embodiment of the present invention;
fig. 4 is a schematic view of another testing apparatus provided in an embodiment of the present invention;
FIG. 5 is a schematic diagram illustrating a conventional testing apparatus;
fig. 6 is a schematic test diagram of a testing apparatus according to an embodiment of the present invention.
Icon:
100-a test meter; 200-an amplifier; 300-a carrier table; 400-test antenna; 500-a coupler; 900-DUT; 201-instrument end radio frequency cable; 202-device under test end radio frequency cable.
Detailed Description
To make the objects, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions of the present invention will be described clearly and completely with reference to the accompanying drawings, and obviously, the described embodiments are some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.
The present disclosure is presented based on the following findings:
currently, when testing the wireless performance of a Device Under Test (DUT), an amplifier is usually connected to a test instrument and the DUT via cables, and in order to avoid the test instrument interfering with the test, the test instrument is usually far away from a test quiet zone or is placed outside an anechoic chamber, and the amplifier is usually placed near the test instrument. In this case, for a larger test system, the rf cable connecting the DUT and the test meter may be long, the long cable means a large loss, and the signal amplified by the amplifier may be weak after the loss through the rf cable, and thus the test efficiency may be affected.
Based on this, the embodiment of the utility model provides a pair of testing arrangement and test system can improve testing arrangement's efficiency of software testing.
In order to facilitate understanding of the present embodiment, first, a testing apparatus disclosed in an embodiment of the present invention is described in detail, referring to a schematic structural diagram of the testing apparatus shown in fig. 1, which illustrates that the testing apparatus mainly includes the following structures: test meter 100, amplifier 200, carrier 300, test antenna 400, and radio frequency cable.
The bearing table 300 is used for bearing a device to be tested, the amplifier 200 is arranged around the bearing table 300, the distance between the amplifier 200 and the bearing table 300 is smaller than the distance between the amplifier 200 and the test instrument 100, the test instrument 100 is connected with the test antenna 400, and the test instrument 100 is also connected with the device to be tested through the amplifier 200; the amplifier 200 is connected with the test instrument 100 and the device under test through a radio frequency cable; the test instrument 100 is used for generating and outputting test signals and/or receiving signals sent by a device under test; the test antenna 400 is used for transmitting test signals to the device under test and/or transmitting received signals transmitted by the device under test to the test instrument 100, and the test antenna 400 can be one or more; the amplifier 200 is used for amplifying the test signal and transmitting the amplified test signal to the device under test.
In one embodiment, the test apparatus may be used to obtain wireless performance of a device under test, which may be an antenna or a wireless device having an antenna.
The amplifier 200 is connected to the test meter 100 and the DUT, respectively, for amplifying the test signal output from the test meter 100 and transmitting it to the DUT.
The embodiment of the utility model provides an above-mentioned testing arrangement, test instrument and device under test are connected respectively to the amplifier, send the test signal that test instrument sent to the device under test after enlargiing to the amplifier sets up around the plummer to can reduce the cable length of connecting the amplifier with the device under test, and then reduce test signal's loss, improve efficiency of software testing. Optionally, in order to reduce the influence of the amplifier on the test dead space, a wave-absorbing material may be placed or adhered on the surface of the amplifier to reduce the interference on the dead space.
Referring to fig. 1, the radio frequency cable includes: an instrument end radio frequency cable 201 and a device under test end radio frequency cable 202; the meter-end radio frequency cable 201 is used for connecting the input port of the amplifier 200 and the output port of the test meter 100; the device under test end rf cable 202 is used to connect the output port of the amplifier 200 with the device under test.
In a specific application, referring to fig. 1, an amplifier 200 is connected to a test meter 100 and a DUT via rf cables, respectively, wherein the rf cables include a meter end rf cable 201 for connecting an input port of the amplifier 200 with an output port of the test meter 100; a device-under-test end rf cable 202 (i.e., DUT end rf cable) is used to connect the output port of the amplifier 200 to the DUT.
In order to reduce the loss that the signal of enlargeing through the amplifier caused at the in-process through the transmission of radio frequency cable, the embodiment of the utility model provides an among the testing arrangement, the length of minimize DUT end radio frequency cable, instrument end radio frequency cable and device under test end radio frequency cable's length is less than the length of instrument end radio frequency cable promptly. Optionally, the amplifier 200 may be placed in the vicinity of the carrier stage 300. Further, the amplifier 200 may be placed on the carrier 300, the carrier 300 may be a rotatable turntable, and when the carrier 300 is a rotatable turntable, the amplifier 200 may rotate with the turntable.
Referring to fig. 2, the embodiment of the present invention further provides another testing apparatus, which on the basis of fig. 1, further includes: and a coupler 500, wherein an input port of the coupler 500 is connected to an output port of the amplifier 200, a main output port of the coupler 500 is connected to the device under test, and a coupling loop port of the coupler 500 is connected to the test instrument 100.
In one embodiment, a coupler 500 is also connected between amplifier 200 and the DUT. Specifically, the output port of amplifier 200 is connected to the input port of coupler 500, the main output port of coupler 500 is connected to the DUT for feeding test signals to the DUT, and the coupled loop port of coupler 500 is connected to test meter 100 via an rf cable.
Further, the test apparatus further comprises: a radio frequency switch (not shown in fig. 2); wherein, the rf switch is respectively connected to the main output port of the coupler 500 and at least one device under test.
In one embodiment, the main output port of the coupler 500 may be connected to a multi-output rf switch, which may be connected to multiple DUTs, or one or more DUTs may have multiple Antennas Under Test (AUT) to be tested for fast switching during testing. For example, in the test of one of the test coordinates, different DUTs or different AUTs are switched until all DUTs or AUTs are traversed, and then the test of the next test coordinate is performed, so that the test efficiency is improved.
Alternatively, referring to a schematic diagram of a test apparatus shown in FIG. 3, the 2-port of the test meter 100 is connected to the amplifier 200 via an RF cable, and a coupler 500 is connected between the amplifier 200 and the DUT 900. The output port of the amplifier 200 is connected to the input port of the coupler 500, the main output port of the coupler 500 is connected to the DUT900 for feeding test signals to the DUT900, the coupling loop port of the coupler 500 is connected to the 1 port of the test meter 100 via an rf cable, and the 3 port of the test meter 100 is connected to the test antenna 400 via an rf cable.
Since the complex gain (including amplitude and phase) of amplifier 200 may vary uncontrollably with temperature, operating time, etc., this variation may introduce random errors in the gain of amplifier 200 in the test results. This error can be avoided from being introduced into the test results in the above-described embodiment. In particular, gain errors of the amplifier can be prevented from being introduced into the test result through the S parameter test. The S parameter represents a scattering parameter, which is a parameter representing a power ratio between signal components passing through various paths, i.e., a network parameter established on the basis of the relationship between incident microwaves and reflected microwaves, and in practical applications, the S parameter can be directly measured by a vector network analyzer. The specific method adopted in the embodiment is as follows: testing S32 (i.e., S parameters of 3-port and 2-port of test meter 100) and S12 (i.e., S parameters of 1-port and 2-port of test meter 100), and then dividing S12 by S32, can obtain the gain from the output port of coupler 500 to 3-port, where the obtained gain does not include the gain of the amplifier, thereby eliminating the error of the amplifier.
Further, referring to fig. 4, the main output port of the coupler 500 is connected to a multi-rf switch (not shown) that can be connected to multiple DUTs 900 or to multiple AUTs of one or more DUTs 900 for fast switching during testing. For example, in the test of one of the test coordinates, different DUTs or different AUTs are switched until all DUTs or AUTs are traversed, and then the test of the next test coordinate is performed, so that the test efficiency is improved.
The amplification effect of the above-mentioned testing device provided by the present invention is explained by specific examples below.
Referring to the prior art schematic shown in fig. 5, assuming that the saturated output power of amplifier 200 is +30dBm, the linear gain of amplifier 200 is 40dB, the signal power at the output port of test meter 100 is +10dBm, and the meter end rf cable 201 between test meter 100 and amplifier 200 is short, so the loss of signal transmission is small and negligible. The test signal output by the test meter 100 is amplified by the amplifier 200 to +30dBm (limited by the saturation output power of the amplifier), that is, the signal power at the output port of the amplifier 200 is +30dBm, and then is transmitted through the longer rf cable 202 at the DUT end, so that the loss is large, and if the loss is 30dB, the signal finally reaching the input port of the DUT900 is only 0dBm.
Referring to fig. 6, the embodiment of the present invention provides a test schematic diagram of a test apparatus, assuming that the saturated output power of the amplifier 200 is +30dBm, the linear gain of the amplifier 200 is 40dB, the signal power of the output port of the test instrument 100 is +10dBm, and the test signal output by the test instrument 100 needs to reach the amplifier 200 through the longer instrument end radio frequency cable 201. Assuming a 30dB loss, the test signal arrives at the input port of amplifier 200 at-20 dBm, at which time amplifier 200 can operate within its linear amplification range, i.e., the test signal can be amplified by 40dB, and the signal at the output port of amplifier 200 is +20dBm, i.e., the signal power fed into the input port of DUT900 is +20dBm (the device under test end RF cable 202 between amplifier 200 and DUT900 is short, with low loss, which is negligible).
To sum up, the utility model discloses the implementation provides an above-mentioned testing arrangement under the great condition of radio frequency cable loss, still can guarantee that the DUT obtains great powerful feed-in signal and is used for the test. Thus, testing of the DUT is brought about effects including, but not limited to: firstly, the signal-to-noise ratio of the test is large, and the test precision is high; secondly, the link dynamic of the test device is large, and the gain fluctuation range of the DUT allowed to be tested is large; third, when the signal power fed to the DUT is large, a larger intermediate frequency bandwidth may be used for sampling, e.g., the VNA is set to be larger, so that a faster sampling speed may be achieved.
The embodiment of the utility model provides a test system, include: the foregoing embodiments provide a test apparatus, and at least one device under test.
The embodiment of the utility model provides an above-mentioned test system, test instrument and device under test are connected respectively to the amplifier, send the test signal that test instrument sent to the device under test after enlargiing to the amplifier sets up around the plummer to can reduce the cable length of connecting the amplifier with the device under test, and then reduce test signal's loss, improve efficiency of software testing.
It should be noted that, the system provided by the embodiment of the present invention, which has the same implementation principle and the same technical effect as the foregoing device embodiment, for the sake of brief description, reference may be made to the corresponding contents in the foregoing device embodiment for the part of the system embodiment that is not mentioned.
In addition, in the description of the embodiments of the present invention, unless otherwise explicitly specified or limited, the terms "mounted," "connected," and "connected" are to be construed broadly, e.g., as being fixedly connected, detachably connected, or integrally connected; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The specific meaning of the above terms in the present invention can be understood in specific cases to those skilled in the art.
Finally, it should be noted that: the above-mentioned embodiments are only specific embodiments of the present invention, and are not intended to limit the technical solution of the present invention, and the protection scope of the present invention is not limited thereto, although the present invention is described in detail with reference to the foregoing embodiments, those skilled in the art should understand that: those skilled in the art can still modify or easily conceive of changes in the technical solutions described in the foregoing embodiments or make equivalent substitutions for some technical features within the technical scope of the present disclosure; such modifications, changes or substitutions do not substantially depart from the spirit and scope of the embodiments of the present invention, and are intended to be included within the scope of the present invention. Therefore, the protection scope of the present invention shall be subject to the protection scope of the claims.
Claims (8)
1. A test apparatus, comprising: the device comprises a test antenna, a test instrument, a bearing table, an amplifier and a radio frequency cable; the bearing table is used for bearing a device under test, the distance between the amplifier and the bearing table is smaller than the distance between the amplifier and the test instrument, the test instrument is connected with the test antenna, and the amplifier is connected with the test instrument and the device under test through the radio frequency cable;
the test instrument is used for outputting a test signal and/or receiving a signal sent by the device under test;
the test antenna is used for sending the test signal to the device under test and/or sending the received signal sent by the device under test to the test instrument;
the amplifier is used for amplifying the test signal and sending the amplified test signal to the tested device.
2. The testing device of claim 1, wherein the radio frequency cable comprises: the device comprises an instrument end radio frequency cable and a tested device end radio frequency cable;
the instrument end radio frequency cable is used for connecting the input port of the amplifier and the output port of the test instrument;
the device under test end radio frequency cable is used for connecting the output port of the amplifier and the device under test;
the length of the tested device end radio frequency cable is smaller than that of the instrument end radio frequency cable.
3. The testing device of claim 1, further comprising: a coupler; the input port of the coupler is connected with the output port of the amplifier, the main output port of the coupler is connected with the device under test, and the coupling loop port of the coupler is connected with the test instrument.
4. The testing device of claim 3, further comprising: a radio frequency switch; wherein, the radio frequency switch is respectively connected with the main output port of the coupler and at least one tested device.
5. The test device of claim 1, wherein the carrier is a rotatable turntable.
6. The testing device of claim 1, wherein the amplifier is disposed on the stage.
7. The test device of claim 1, wherein the test meter comprises: a signal generator or a vector network analyzer.
8. A test system, comprising: the test apparatus of any of claims 1 to 7, and at least one device under test.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202222422307.3U CN218497040U (en) | 2022-09-13 | 2022-09-13 | Test device and test system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202222422307.3U CN218497040U (en) | 2022-09-13 | 2022-09-13 | Test device and test system |
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| Publication Number | Publication Date |
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| CN218497040U true CN218497040U (en) | 2023-02-17 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN202222422307.3U Active CN218497040U (en) | 2022-09-13 | 2022-09-13 | Test device and test system |
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| CN (1) | CN218497040U (en) |
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