CN218481610U - TFT drive test panel machine recognition device that crashes - Google Patents

Abstract

The utility model relates to a TFT drive test panel recognition device that crashes, survey test panel and a plurality of TFT display module group that is connected with the TFT drive respectively including the TFT drive, each the TFT display module group all include a driver chip who is used for sending TE pulse signal, TE pulse signal's frequency with the screen display frame rate of TFT display module group is synchronous, the TFT drive test panel includes TE signal identification module and a plurality of TE signal line, each the TFT display module group all through corresponding TE signal line with TE signal identification module connects, this TFT drive test panel crash recognition device simple structure, convenient operation need not manpower to confirm whether the TFT drive test panel crashes, compare with original technique, the device can in time confirm whether the TFT drive test panel crashes, can not lead to the condition of extravagant test resource because can't learn the TFT drive test panel crashes for a long time, and this method has improved the reliability test efficiency of TFT display module group.

Description

TFT drive test panel machine recognition device that crashes

Technical Field

The utility model belongs to the technical field of TFT drive test technique and specifically relates to a TFT drive test panel recognition device that crashes is related to.

Background

With the rapid development of liquid crystal display technology, the liquid crystal terminal equipment has higher and higher requirements on the cost control of the display module; under the intense market competition, the product quality requirement becomes an inevitable trend of the industry technology, the quality reliability of the display module is more and more severe on the premise of meeting the cost advantage requirement of customers, and more product reliability test items are provided; in the reliability aging testing of TFT display module assembly, be usually to be connected by the TFT display module assembly that is surveyed with the TFT drive test board, the screen that drives TFT display module assembly by the TFT drive test board lights, the whole set of subassembly after lighting is put into the high temperature and high humidity experiment incubator and is carried out reliability testing, in the test process, sometimes the TFT drive test board that appears is down and the screen that leads to the TFT display module assembly that is surveyed extinguishes, even damage TFT display module assembly, tester can only observe whether the screen of the TFT display module assembly that is surveyed from the experiment incubator outside extinguishes usually, this kind of mode exists following defect: the discernment personnel of dying can't confirm in time whether going out by survey TFT display module, can't know in time promptly whether dying in TFT drive test panel promptly, extravagant test resource, this kind of mode must rely on the manpower to judge, extravagant manpower to reduce TFT display module's reliability test efficiency, still can influence the judgement of TFT display module's test result simultaneously.

SUMMERY OF THE UTILITY MODEL

The utility model aims to solve the technical problem that a use manpower sparingly, avoid testing the wasting of resources is provided to improve TFT display module's reliability testing efficiency's TFT drive and survey test panel recognition device that crashes.

The utility model provides a technical scheme be, a TFT drive test panel recognition device that crashes, survey test panel and survey a plurality of TFT display module group of being connected with the TFT drive respectively including the TFT drive, each the TFT display module group all include a driver chip who is used for sending TE pulse signal, TE pulse signal's frequency with the screen display frame rate of TFT display module group is synchronous, the TFT drive test panel includes TE signal identification module and a plurality of TE signal line, each the TFT display module group all through the TE signal line that corresponds with TE signal identification module connects, each the TE pulse signal that the driver chip of TFT display module group sent all transmit to through the TE signal line that corresponds TE signal identification module and by TE signal identification module receives, the TFT drive test panel still include with the alarm device that TE signal identification module connects, TE signal identification module is used for judging the TFT drive test panel whether crashes according to the frequency of received TE pulse signal unusually to report to the police through alarm device.

The utility model has the advantages that: by adopting the TFT driving test board downtime identification device, a driving chip in the TFT display module sends a TE pulse signal with a certain frequency to a TE signal identification module in the TFT driving test board, the TE pulse signal is synchronous with the screen display frame rate of the TFT display module, and the TE signal identification module judges whether the TFT driving test board is downtime according to whether the frequency of the received TE pulse signal is abnormal, namely if the frequency of the TE pulse signal received by the TE signal identification module is abnormal, the screen of the TFT display module is in a blanking state at the moment, the TFT driving test board downtime at the moment can be proved, and once the downtime occurs, an alarm device alarms; the TFT drive test board downtime identification device is simple in structure and convenient to operate, whether the TFT drive test board crashes or not is confirmed without manpower, compared with the prior art, the device can confirm whether the TFT drive test board crashes or not in time, the situation that test resources are wasted due to the fact that the TFT drive test board crashes cannot be known for a long time is avoided, and the reliability test efficiency of the TFT display module is improved.

Preferably, the TE signal identification module includes a single chip microcomputer, each TFT display module is connected to the single chip microcomputer through a corresponding TE signal line, and the single chip microcomputer is configured to determine whether the TFT driving test board is down according to whether the frequency of the received TE pulse signal is abnormal, and to alarm through an alarm device. By adopting the structure, whether the frequency of the received TE pulse signal is abnormal or not is determined according to the fixed frequency of the singlechip, and the mode is simple and efficient.

Preferably, the single chip microcomputer is STM32F103, the external crystal oscillator of the single chip microcomputer is 8HZ, the maximum frequency multiplication of the internal clock is 72MHZ, the performance is good, and the cost performance is high.

Preferably, the alarm device is a buzzer, and by adopting the structure, when the TFT driving test board is identified to be shut down, the buzzer gives an alarm, and the structure is simple and low in cost.

Drawings

Fig. 1 is a schematic structural view of a downtime identification device of a TFT driving test board according to the present invention;

fig. 2 is a frequency comparison diagram of a frequency measurement method described in the embodiment of the present invention;

as shown in the figure: 1. a TFT drive test board; 2. a TFT display module; 3. a TE signal line; 4. a TE signal identification module; 5. and an alarm device.

Detailed Description

The invention is further described below with reference to the accompanying drawings in combination with the embodiments so that those skilled in the art can implement the invention with reference to the description, and the scope of the invention is not limited to the embodiments.

It will be understood by those skilled in the art that in the present disclosure, the terms "longitudinal," "lateral," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," and the like are used in an orientation or positional relationship indicated in the drawings for convenience in describing the invention and simplicity in description, but do not indicate or imply that the device or element so referred to must have a particular orientation, be constructed in a particular orientation, and be constructed in a particular manner of operation, and thus, the terms are not to be construed as limiting the invention.

Furthermore, the terms "first," "second," "third," and the like are used solely to distinguish one from another and are not to be construed as indicating or implying relative importance.

In the description of the embodiments of the present application, it should also be noted that, unless otherwise explicitly stated or limited, the terms "disposed," "mounted," "connected," and "connected" are to be construed broadly and may, for example, be fixedly connected, detachably connected, or integrally connected; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The specific meaning of the above terms in the present application can be understood in a specific case by those of ordinary skill in the art.

The utility model relates to a TFT drive test panel machine recognition device that crashes, as shown in figure 1, survey test panel 1 and survey a plurality of TFT display module group 2 of being connected with TFT drive test panel 1 respectively including a TFT display module group 2, each TFT display module group 2 all include a driver chip who is used for sending TE pulse signal, TE pulse signal's frequency with TFT display module group 2's screen display frame rate is synchronous, TFT drive test panel 1 includes TE signal identification module 4 and a plurality of TE signal line 3, each TFT display module group 2 all through the TE signal line 3 that corresponds with TE signal identification module 4 is connected, each TE pulse signal that TFT display module group 2's driver chip sent all transmit extremely through the TE signal line 3 that corresponds TE signal identification module 4 and by TE signal identification module 4 receives, TFT drive test panel 1 still include with alarm device 5 that TE signal identification module 4 connects, TE signal identification module 4 is used for surveying whether TFT drive test panel machine 1 is crashed according to the frequency according to the TE pulse signal received is unusual to judge through alarm device 5 to crash.

In the downtime identification device of the TFT driving test board in the structure of fig. 1, a driving chip in the TFT display module 2 sends a TE pulse signal with a certain frequency to the TE signal identification module 4 in the TFT driving test board 1, the frequency of the TE pulse signal is synchronous with the screen display frame rate of the TFT display module 2, the screen display frame rate of the TFT display module 2 is a normal frame rate value when the screen is normally lit, and the screen display frame rate of the TFT display module 2 is an abnormal frame rate value when the screen is turned off; because the frequency of the TE pulse signal is synchronous with the screen display frame rate of the TFT display module 2, once the screen of the TFT display module 2 is extinguished, the TE signal identification module 4 may be abnormal according to the frequency of the received TE pulse signal, once the frequency abnormality is identified, it may be determined that the TFT driving test board 1 is down, and once the TFT driving test board is down, an alarm device 5 may give an alarm; this TFT drive test panel 1 recognition device that crashes simple structure, convenient operation need not the manpower and confirms whether the TFT drive test panel 1 crashes, compares with original technique, and the device can in time confirm whether the TFT drive test panel 1 crashes, can not be owing to for a long time unable learn the TFT drive test panel 1 crashes and lead to the condition of extravagant test resource to this method has improved the reliability test efficiency of TFT display module assembly 2.

The TE signal identification modules 4 comprise single-chip microcomputers, each TFT display module 2 is connected with the single-chip microcomputers through corresponding TE signal lines 3, the single-chip microcomputers are used for judging whether the TFT driving test board 1 is down according to whether the frequency of the received TE pulse signals is abnormal or not and giving an alarm through the alarm device 5, and the single-chip microcomputers are STM32F103 in model.

The STM32F103 singlechip is used, the external crystal oscillator of the singlechip is 8HZ, the highest frequency value of 72MHZ of internal clock frequency multiplication is recorded, and the frequency measuring method comprises the following steps: as shown in fig. 2, a fixed period of a natural clock signal of the single chip microcomputer is denoted as Tc1, a corresponding frequency is denoted as fc, the single chip microcomputer counts the received TE pulse signal, a period of the TE pulse signal is Tx1, and a count value obtained by counting the received TE pulse signal by the single chip microcomputer is denoted as N1 when a screen of the TFT display module 2 is normally lit, so that a standard frequency fx of the TE pulse signal received by the single chip microcomputer is: fx = N1 × fc; the standard frequency fx is the display frame rate of the TFT display module 2; once the screen of the TFT display module 2 is extinguished, the number of the TE pulse signals received by the single-chip microcomputer is reduced, and then the frequency of the TE pulse signals received by the single-chip microcomputer is not equal to the standard frequency fx, so that the abnormal frequency of the TE pulse signals received by the single-chip microcomputer can be known, once the abnormal frequency is identified, the screen of the TFT display module 2 is extinguished, the TFT driving test board 1 is crashed at this time, and once the crashed occurs, an alarm is given through the alarm device 5.

As shown in fig. 1, the alarm device 5 adopts a buzzer, and with the structure, when the TFT driving test board 1 is identified to be down, the buzzer gives an alarm, and the structure is simple and low in cost.

In practical application, still be provided with main control chip on TFT drive test panel 1, its chip model is SMT32, and main control chip is connected with the singlechip, in case the singlechip discerns TFT drive test panel 1 and takes place to shut down, then main control chip will carry out automatic power-off protection to TFT drive test panel 1 immediately to avoid haring TFT display module assembly 2.

Claims (4)

1. The utility model provides a TFT drive test panel machine recognition device that crashes which characterized in that: the device comprises a TFT driving test board (1) and a plurality of TFT display modules (2) which are respectively connected with the TFT driving test board (1), wherein each TFT display module (2) comprises a driving chip used for sending a TE pulse signal, the frequency of the TE pulse signal is synchronous with the screen display frame rate of the TFT display module (2), the TFT driving test board (1) comprises a TE signal identification module (4) and a plurality of TE signal lines (3), each TFT display module (2) is connected with the TE signal identification module (4) through the corresponding TE signal line (3), each TE pulse signal sent by the driving chip of the TFT display module (2) is transmitted to the TE signal identification module (4) through the corresponding TE signal line (3), the TE signal identification module (4) is received by the TE signal identification module (4), the TFT driving test board (1) further comprises an alarm device (5) connected with the TE signal identification module (4), the TE signal identification module (4) is used for judging whether the TFT driving test board (1) is abnormal according to the TE pulse signal frequency, and the TFT display module (2) alarms through the alarm device (5).

2. The device for identifying the downtime of the TFT driving test board according to claim 1, wherein: the TE signal identification modules (4) comprise single-chip microcomputers, each TFT display module (2) is connected with the single-chip microcomputers through corresponding TE signal lines (3), and the single-chip microcomputers are used for judging whether the TFT driving test boards (1) are down or not according to whether the frequency of the received TE pulse signals is abnormal or not and giving an alarm through the alarm devices (5).

3. The device for identifying the downtime of the TFT-driven test board according to claim 2, wherein the type of the single chip microcomputer is STM32F103.

4. The device for identifying the downtime of the TFT-driven test board according to claim 1, wherein: the alarm device (5) is a buzzer.

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