CN218472002U

CN218472002U - Electric pile device

Info

Publication number: CN218472002U
Application number: CN202222860010.5U
Authority: CN
Inventors: 二见谕; 代少飞; 龚正伟; 陈雪松
Original assignee: Weishi Energy Technology Co Ltd
Current assignee: Weishi Energy Technology Co Ltd
Priority date: 2022-10-28
Filing date: 2022-10-28
Publication date: 2023-02-10
Anticipated expiration: 2032-10-28

Abstract

The utility model discloses a galvanic pile device, this galvanic pile device include polar plate structure, membrane electrode and test contact pin, and the structural contact pin groove that is equipped with of polar plate, membrane electrode laminating are structural seals the contact pin groove with the direction of depth at the contact pin groove at the polar plate, and the test contact pin is pegged graft at the contact pin inslot, and the one end that the test contact pin stretches out the contact pin groove is used for drawing forth the structure with the outside and links to each other. The test contact pin is provided with a bulge part which is used for clamping the test contact pin in the contact pin groove. The electric pile device can be well suitable for repeated plugging and unplugging of the test contact pin, the probability of damage is low, and the use reliability is good.

Description

Electric pile device

Technical Field

The utility model relates to a Proton Exchange Membrane Fuel Cell (Proton Exchange Membrane Fuel Cell, PEMFC) field especially relates to a galvanic pile device.

Background

In a traditional polar plate structure, inserting half holes for voltage detection are respectively processed on the cooling side of an anode plate and the cooling side of a cathode plate, then the anode plate and the cathode plate are combined into a bipolar plate through bonding, two inserting half holes are combined to form a pin hole of the bipolar plate, and then after a leading-out structure is connected to a pin, the pin is inserted into the pin hole to monitor the voltage of a battery.

The thickness of each bipolar plate is about 2mm-3mm, the thickness of a processed pin hole is about 1mm-2mm, and in order to guarantee real-time monitoring of accurate voltage and reduce or eliminate contact resistance at the pin hole, the pin and the pin hole are mainly matched in an interference fit mode, and repeated insertion and extraction of the pin are prone to damage a jack, so that repeated use is affected. Furthermore, if the pin holes are damaged by the operation error of the engineer, the bipolar plate will be scrapped.

SUMMERY OF THE UTILITY MODEL

An object of the utility model is to provide a galvanic pile device, this galvanic pile device can adapt to the plug repeatedly many times of test contact pin better, and impaired probability is lower, uses the reliability better.

For realizing the technical effect, the technical scheme of the utility model as follows:

the utility model discloses a galvanic pile device, include: the polar plate structure is provided with a pin slot; the membrane electrode is attached to the polar plate structure so as to seal the pin slot in the depth direction of the pin slot; the test pin is inserted in the pin groove, one end of the test pin extending out of the pin groove is used for being connected with an external leading-out structure, a protruding portion is arranged on the test pin, and the protruding portion is used for clamping the test pin in the pin groove.

In some embodiments, the length direction of the pin slot forms an included angle with the length direction of the plate structure.

In some embodiments, the test pin comprises an integrally formed insertion part and a lead-out part, the insertion part is fitted in the pin slot, a protruding part is arranged on the insertion part, and the lead-out part is used for being connected with the external lead-out structure.

In some specific embodiments, an extending direction of the insertion part and an extending direction of the leading-out part form an included angle, and one end of the insertion part, which is far away from the leading-out part, is wedge-shaped.

In some specific embodiments, the protrusion is any one of an H-shaped protrusion, a T-shaped protrusion, a cross-shaped protrusion, and an O-shaped protrusion.

In some specific embodiments, the thickness of the protrusion is 0.5mm to 1mm.

In some specific embodiments, the lead-out portion is provided with a lead-out hole penetrating through the lead-out portion in a thickness direction.

In some specific embodiments, the thickness of the leading-out portion is greater than that of the inserting portion, and a wire clamping groove penetrating along the length direction of the leading-out portion is formed in the leading-out portion.

In some embodiments, the pole plate structure comprises an anode plate and a cathode plate, the anode plate and the cathode plate are attached to each other, and the side of the anode plate, which faces away from the cathode plate, and/or the side of the cathode plate, which faces away from the anode plate, are provided with the pin grooves.

In some embodiments, the sides of the cathode plate and the anode plate facing each other are each provided with an auxiliary half-groove, both of which form auxiliary sockets that mate with the test pins.

In some embodiments, the length direction of the auxiliary half-tank forms an included angle with the length direction of the anode plate and the cathode plate.

The utility model discloses a galvanic pile device's beneficial effect: because the test contact pin is inserted between the membrane electrode and the polar plate structure, and the test contact pin is provided with the bulge which is used for clamping the test contact pin in the contact pin groove, compared with the technical scheme that the contact pin is directly in interference fit with the contact pin hole in the prior art, the technical scheme reduces the damage probability of the anode plate and the cathode plate on the premise of ensuring the connection stability of the test contact pin and the contact pin groove, better adapts to repeated insertion and extraction of the test contact pin, and has better use reliability.

Additional aspects and advantages of the invention will be set forth in part in the description which follows and, in part, will be obvious from the description, or may be learned by practice of the invention.

Drawings

Fig. 1 is a schematic structural view of a galvanic pile device with test pins removed according to an embodiment of the present invention;

fig. 2 is a schematic structural diagram of a plate structure of a stack device according to an embodiment of the present invention;

fig. 3 is a schematic structural diagram of a test pin of the galvanic pile device according to an embodiment of the present invention;

FIG. 4 is a schematic diagram of another test pin for a galvanic pile device according to an embodiment of the present invention; reference numerals are as follows:

1. a pole plate structure; 11. an anode plate; 12. a cathode plate; 101. a pin slot; 102. an auxiliary jack; 2. a membrane electrode; 3. testing a contact pin; 31. a plug-in part; 311. a boss portion; 32. a lead-out section; 321. an exit aperture; 322. wire clamping grooves.

Detailed Description

In order to make the technical problem solved by the present invention, the technical solution adopted by the present invention and the technical effect achieved by the present invention clearer, the technical solution of the present invention will be further explained by combining the drawings and by means of the specific implementation manner.

In the description of the present invention, it is to be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", "axial", "radial", "circumferential", and the like, indicate the orientation or positional relationship based on the orientation or positional relationship shown in the drawings, and are only for convenience of description and simplicity of description, and do not indicate or imply that the device or element referred to must have a particular orientation, be constructed and operated in a particular orientation, and therefore, should not be construed as limiting the present invention.

Furthermore, features defined as "first" and "second" may explicitly or implicitly include one or more of the features for distinguishing between descriptive features, non-sequential, non-trivial and non-trivial. In the description of the present invention, "a plurality" means two or more unless otherwise specified.

In the description of the present invention, it is to be noted that, unless otherwise explicitly specified or limited, the terms "mounted," "connected," and "connected" are to be construed broadly, and may be, for example, fixedly connected, detachably connected, or integrally connected; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The specific meaning of the above terms in the present invention can be understood as a specific case by those skilled in the art.

The specific structure of the stack device according to the embodiment of the present invention will be described below with reference to fig. 1 to 4.

The utility model discloses a galvanic pile device, as shown in fig. 1-fig. 2, the galvanic pile device of this embodiment includes polar plate structure 1, membrane electrode 2 and test contact pin 3, is equipped with contact pin groove 101 on the polar plate structure 1, and membrane electrode 2 is used for sealing contact pin groove 101 at the depth direction of contact pin groove 101, and test contact pin 3 pegs graft in contact pin groove 101, and test contact pin 3 stretches out the one end and the outside structure of drawing forth of contact pin groove 101 and links to each other. The test pin 3 is provided with a convex portion 311, and the convex portion 311 is used for clamping the test pin 3 in the pin slot 101.

First, in practice, the stack device is formed by stacking a plurality of plate structures 1 and membrane electrodes 2, and the plate structures 1 of the present embodiment may be graphite plates or metal conductive plates.

It can be understood that, in actual work, membrane electrode 2 compressive capacity is better, test contact pin 3 is located between membrane electrode 2 and polar plate structure 1, and be equipped with bellying 311 on the test contact pin 3, bellying 311 is used for testing contact pin 3 joint in contact pin groove 101, compare in prior art, the contact pin is direct at contact pin hole interference fit's technical scheme, under the prerequisite of guaranteeing test contact pin 3 and contact pin groove 101 connection stability, the probability of damage of anode plate 11 and negative plate 12 has been reduced, better adaptation test contact pin 3's the repeated plug of many times, use the reliability better.

In some embodiments, as shown in fig. 2, the length direction of the pin slot 101 is disposed at an angle to the length direction of the plate structure 1. It can be understood that the length of the pin slot 101 directly determines the contact length of the test pin 3 with the anode plate 11 and the cathode plate 12, and if the contact length is too short, the test pin 3 and the plate structure 1 are prone to poor contact, thereby causing large test errors. In this embodiment, the length direction of the pin slot 101 and the length direction of the pole plate structure 1 form an included angle, so that the contact length between the test pin 3 and the pole plate structure 1 is increased, the contact stability between the test pin 3 and the pole plate structure 1 is ensured, the probability of poor contact between the test pin 3 and the pole plate structure 1 is reduced, and the accuracy of test data is ensured.

Preferably, the included angle between the length direction of the pin inserting groove 101 and the length direction of the pole plate structure 1 is 45-60 degrees. Of course, in the embodiment of the present invention, the included angle between the length direction of the pin inserting groove 101 and the length direction of the pole plate structure 1 may be selected according to actual needs, and is not limited to the above limitation.

In some embodiments, as shown in fig. 3-4, the test pin 3 includes an integrally formed mating part 31 and a lead-out part 32, the mating part 31 fits into the pin slot 101, the mating part 31 is provided with a protrusion 311, and the lead-out part 32 is used to connect with an external lead-out structure. It can be understood that, test contact pin 3 formula structure as an organic whole, convenient manufacturing, be equipped with bellying 311 on grafting portion 31, can make test contact pin 3 and contact pin groove 101 realize interference fit, ensured that test contact pin 3 can with polar plate structure 1's stable contact, thereby ensure that the test is stable goes on, on the other hand, be equipped with bellying 311 on grafting portion 31 and can reduce the area of contact of grafting portion 31 and contact pin groove 101's lateral wall, reduce the probability of destroying electrode structure when inserting and pulling test contact pin 3 when ensuring interference fit.

In some specific embodiments, as shown in fig. 3 to 4, an extending direction of the insertion portion 31 is disposed at an angle to an extending direction of the leading portion 32, and an end of the insertion portion 31 away from the leading portion 32 is wedge-shaped. It can be understood that the wedge-shaped end of the plugging portion 31 away from the leading-out portion 32 can facilitate the whole test pin 3 to be inserted into the pin slot 101, thereby reducing the probability of damaging the pole plate structure 1 when the plugging test pin 3 is inserted into the pin slot 101 and improving the reliability of the whole electric pile device.

In some specific embodiments, the protrusion 311 is any one of an H-shaped protrusion, a T-shaped protrusion, a cross-shaped protrusion, and an O-shaped protrusion. Therefore, the boss 311 can be stably clamped into the pin slot 101, the boss 311 can be conveniently processed, and the manufacturing cost of the test pin 3 is reduced.

In some specific embodiments, the thickness of the boss 311 is 0.5mm to 1mm. It can be understood that the too large thickness of the protruding portion 311 may promote the extrusion to the membrane electrode 2 or the polar plate structure 1, and the too small thickness may reduce the installation stability of the whole test pin 3, in this embodiment, the thickness of the protruding portion 311 is controlled to be 0.5mm to 1mm, which can reduce the extrusion to the membrane electrode 2 or the polar plate structure 1, promote the protection to the membrane electrode 2 and the polar plate structure 1, and promote the installation stability of the test pin 3.

In some specific embodiments, the lead-out portion 32 is provided with a lead-out hole 321 penetrating the lead-out portion 32 in the thickness direction. Thus, the external lead structure can be connected to the lead hole 321, and the connection stability between the lead portion 32 and the external lead structure can be ensured.

In some specific embodiments, the thickness of the leading portion 32 is greater than that of the insertion portion 31, and the leading portion 32 is provided with a wire-locking groove 322 penetrating along the length direction thereof. Therefore, the connection with the external lead-out structure can be realized through the wire clamping groove 322, and the connection stability of the lead-out part 32 and the external lead-out structure is ensured.

In some embodiments, the plate structure 1 includes an anode plate 11 and a cathode plate 12, the anode plate 11 and the cathode plate 12 are attached to each other, and a pin slot 101 is disposed on a side of the anode plate 11 facing away from the cathode plate 12 and/or a side of the cathode plate 12 facing away from the anode plate 11. It will be appreciated that in some embodiments, the pin grooves 101 are provided only on the side of the anode plate 11 facing away from the cathode plate 12; in some embodiments, the pin grooves 101 are only disposed on the side of the cathode plate 12 facing away from the anode plate 11; in some embodiments, pin slots 101 are disposed on both a side of anode plate 11 facing away from cathode plate 12 and a side of cathode plate 12 facing away from anode plate 11.

In some specific embodiments, the sides of the cathode plate 12 and the anode plate 11 facing each other are each provided with an auxiliary half-groove, which form an auxiliary receptacle 102 for mating with the test pin 3. It can be understood that, although the position of the pin slot 101 of the present embodiment can prolong the service life of the whole pile device, the pin slot can still be damaged after being used for a long time, and the damage means that the whole pile device is scrapped, in the present embodiment, the additional auxiliary jack 102 can also be operated for a while for emergency after the pole plate structure 1 at the position of the pin slot 101 is damaged, so as to further prolong the service life of the whole pile device.

In some embodiments, the length direction of the auxiliary half-slots is disposed at an angle to the length direction of the anode plate 11 and the cathode plate 12. It can be understood that the length of the auxiliary half-groove directly determines the contact length of the test pin 3 with the anode plate 11 and the cathode plate 12, and if the contact length is too short, the test pin 3 is likely to have poor contact with the anode plate 11 and the cathode plate 12, thereby causing a large test error. In this embodiment, the length direction of the auxiliary half-slot and the length direction of the anode plate 11 and the cathode plate 12 are arranged at an included angle, so that the contact length between the test pin 3 and the anode plate 11 and the cathode plate 12 is increased, the contact stability between the test pin 3 and the anode plate 11 and the cathode plate 12 is ensured, the probability of poor contact between the test pin 3 and the anode plate 11 and the cathode plate 12 is reduced, and the accuracy of test data is ensured. The utility model discloses an in the embodiment, the selection can be made according to actual need to the length direction of supplementary half groove and the length direction's of anode plate 11 and negative plate 12 contained angle, does not make the line and prescribes a limit to the length direction of supplementary half groove and the length direction's of anode plate 11 and negative plate 12 contained angle here.

Example (b):

as shown in fig. 1-2, the galvanic pile device of the present embodiment includes a polar plate structure 1, a membrane electrode 2, and test pins 3, the polar plate structure 1 includes an anode plate 11 and a cathode plate 12, the anode plate 11 and the cathode plate 12 are graphite polar plates, the anode plate 11 and the cathode plate 12 are attached to each other, one side of the anode plate 11 away from the cathode plate 12 is provided with a pin slot 101, and a length direction of the pin slot 101 and a length direction of the anode plate 11 form an included angle. The membrane electrode 2 is attached to a side of the anode plate 11 facing away from the cathode plate 12 and a side of the cathode plate 12 facing away from the anode plate 11 to close the pin groove 101 in the depth direction of the pin groove 101. The sides of the cathode plate 12 and the anode plate 11 facing each other are each provided with an auxiliary half-groove, which form an auxiliary socket 102 for cooperation with the test pin 3.

The test pin 3 of the present embodiment has two structures, the first one is as shown in fig. 3, the test pin 3 includes an integrally formed inserting portion 31 and a leading portion 32, the inserting portion 31 is fitted in the pin slot 101, a protruding portion 311 is provided on the inserting portion 31, the protruding portion 311 is an H-shaped protrusion, and the thickness of the protruding portion 311 is 0.5mm to 1mm. The lead portion 32 is provided with a lead hole 321 penetrating the lead portion 32 in the thickness direction. Secondly, as shown in fig. 4, the test pin 3 includes an integrally formed inserting portion 31 and a leading portion 32, the leading portion 32 has a thickness larger than that of the inserting portion 31, and the leading portion 32 is provided with a wire-clipping groove 322 penetrating along the length direction thereof.

In the description herein, references to the description of "some embodiments," "other embodiments," etc., mean that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the invention. In this specification, the schematic representations of the terms used above do not necessarily refer to the same embodiment or example. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples.

The above description is only for the preferred embodiment of the present invention, and for those skilled in the art, there are variations on the detailed description and the application scope according to the idea of the present invention, and the content of the description should not be construed as a limitation to the present invention.

Claims

1. A stack apparatus, comprising:

the polar plate structure (1), the polar plate structure (1) is provided with a pin slot (101);

the membrane electrode (2) is attached to the polar plate structure (1) so as to seal the pin grooves (101) in the depth direction of the pin grooves (101);

the test pin (3) is inserted into the pin groove (101), one end, extending out of the pin groove (101), of the test pin (3) is used for being connected with an external leading-out structure, a protruding portion (311) is arranged on the test pin (3), and the protruding portion (311) is used for clamping the test pin (3) into the pin groove (101).

2. The galvanic pile device according to claim 1, characterized in that the test pin (3) comprises an integrally formed plug-in part (31) and a lead-out part (32), the plug-in part (31) fits into the pin slot (101), and the plug-in part (31) is provided with the protrusion (311), and the lead-out part (32) is used for connecting with the external lead-out structure.

3. The galvanic pile device according to claim 2, characterized in that the extension direction of the plug part (31) is arranged at an angle to the extension direction of the lead part (32), and the end of the plug part (31) away from the lead part (32) is wedge-shaped.

4. The stack device according to claim 3, wherein the protrusion (311) is any one of an H-shaped protrusion, a T-shaped protrusion, a cross-shaped protrusion, and an O-shaped protrusion.

5. The galvanic pile device according to claim 3, characterized in that the thickness of the protrusion (311) is 0.5mm-1mm.

6. The stack device according to claim 3, wherein the lead-out portion (32) is provided with a lead-out hole (321) penetrating the lead-out portion (32) in a thickness direction.

7. The galvanic pile device according to claim 3, wherein the thickness of the lead-out portion (32) is greater than the thickness of the insertion portion (31), and the lead-out portion (32) is provided with a wire-locking groove (322) penetrating along the length direction thereof.

8. The galvanic pile device according to any one of claims 1-7, characterized in that the pole plate structure (1) comprises an anode plate (11) and a cathode plate (12), the anode plate (11) and the cathode plate (12) are arranged in a joint manner, and the side of the anode plate (11) facing away from the cathode plate (12) and/or the side of the cathode plate (12) facing away from the anode plate (11) is provided with the pin slot (101).

9. The galvanic pile device according to claim 8, characterized in that the sides of the cathode plate (12) and the anode plate (11) facing each other are provided with auxiliary half-slots, both of which combine with auxiliary sockets (102) that mate with the test pins (3).

10. The galvanic pile device according to claim 9, characterized in that the length direction of the auxiliary half-cell is arranged at an angle to the length direction of the anode plate (11) and the cathode plate (12).