CN218455765U

CN218455765U - Portable semiconductor VC tester

Info

Publication number: CN218455765U
Application number: CN202222477781.6U
Authority: CN
Inventors: 高建明; 李伟
Original assignee: Nanjing Chuangrui Semiconductor Co ltd
Current assignee: Nanjing Chuangrui Semiconductor Co ltd
Priority date: 2022-09-19
Filing date: 2022-09-19
Publication date: 2023-02-07
Anticipated expiration: 2032-09-19

Abstract

The utility model relates to a semiconductor VC tester field specifically is a portable semiconductor VC tester, include: the side surface of the VC tester body is provided with a side surface mounting plate, the surface of the side surface mounting plate is provided with a storage groove, and the inner wall of the storage groove is provided with a connecting rod groove; the handle is arranged inside the accommodating groove, and the surface of the handle is provided with a connecting block; the movable connecting rod is arranged in the connecting rod groove, the surface of the movable connecting rod is provided with a connecting groove, and the side surface of the movable connecting rod is provided with a sliding block; the beneficial effects are that: when moving the VC tester body, drive movable connecting rod through the pulling handle and slide to the outside in connecting rod groove, the slider removes in the inside of spout, makes movable connecting rod and handle form the triangle and is connected, can mention the VC tester body through the middle part of handle this moment and remove, has realized that the one hand carries of VC tester body carries.

Description

Portable semiconductor VC tester

Technical Field

The utility model relates to a semiconductor VC tester field specifically is a portable semiconductor VC tester.

Background

The semiconductor refers to a material with electric conductivity between a conductor and an insulator at normal temperature, and has application in the fields of integrated circuits, consumer electronics, communication systems, photovoltaic power generation, illumination, high-power conversion and the like, for example, the diode is a device made of the semiconductor, and a VC tester is required to be used for carrying out a current impact test on the diode in the production of the diode so as to test the tolerable high-energy impact range of the diode;

when the existing semiconductor VC tester is used, the tester is prevented from being placed on an experiment desktop and a power supply is connected, then a pin of a diode to be tested is connected with a test point corresponding to a test device to test the performance of the diode, and test data is read through a display;

however, when the existing semiconductor VC tester is moved, an operator needs to hold the VC tester from both sides of the VC tester with both hands to move the VC tester, which is difficult to carry the VC tester with one hand, and is inconvenient for carrying the VC tester.

SUMMERY OF THE UTILITY MODEL

An object of the utility model is to provide a portable semiconductor VC tester to solve the problem that proposes in the above-mentioned background art.

In order to achieve the above purpose, the utility model provides a following technical scheme:

a portable semiconductor VC tester, the portable semiconductor VC tester comprising:

the VC tester comprises a VC tester body, wherein a side mounting plate is arranged on the side surface of the VC tester body, a containing groove is formed in the surface of the side mounting plate, and a connecting rod groove is formed in the inner wall of the containing groove;

the lifting handle is arranged inside the accommodating groove, and a connecting block is arranged on the surface of the lifting handle;

the movable connecting rod is arranged in the connecting rod groove, the connecting groove is formed in the surface of the movable connecting rod, and the sliding block is arranged on the side face of the movable connecting rod.

Preferably, a power interface is arranged at the back of the VC tester body, and a control button, a display and a semiconductor test connection point are arranged in front of the VC tester body.

Preferably, the side mounting plates are of a square plate-shaped structure, the side mounting plates are provided with two groups, and the two groups of side mounting plates are symmetrically and fixedly mounted on two sides of the VC tester body.

Preferably, hinge holes are symmetrically formed in the side wall of the accommodating groove, and positioning grooves are formed in the side wall of one side, away from the VC tester body, of each hinge hole.

Preferably, the side wall of the connecting rod groove is symmetrically provided with sliding grooves, and the inner wall of one side of the connecting rod groove, which is close to the hinge hole, is provided with an inclined surface.

Preferably, the handle is of a '21274', four groups of hinged rods are fixedly arranged on the surface of the handle, the four groups of hinged rods are symmetrically arranged at the end parts of two sides of the handle, the hinged rods are rotatably arranged in the hinged holes, elastic positioning balls are symmetrically arranged at two sides of the handle, the positions of the elastic positioning balls correspond to the positions of the positioning grooves, and the handle and the inner wall of the accommodating groove are arranged in a sliding manner.

Preferably, the connecting block is provided with two sets ofly, and two sets of connecting block symmetries set up in the handle and are close to the both sides of the one side in connecting rod groove, and a connecting hole has been seted up on the surface of connecting block, and a connecting hole runs through the both sides of connecting block.

Preferably, the movable connecting rod is square column structure, the movable connecting rod slides with the inner wall in connecting rod groove and sets up, the spread groove is seted up and is close to the surface of the one end of handle with the movable connecting rod, no. two connecting holes have been seted up to the both sides lateral wall symmetry of spread groove, no. two connecting holes run through the inner wall of spread groove and the surface of movable connecting rod, the inner wall and the connecting block of spread groove slide to set up, the inside grafting of No. two connecting holes has the pivot, the pivot runs through a connecting hole, the pivot rotates with the inner wall of No. two connecting holes and sets up, and the pivot rotates with the inner wall of a connecting hole and sets up.

Preferably, the sliding blocks are fixedly connected with the movable connecting rods, two groups of sliding blocks are fixedly arranged on the surface of each group of movable connecting rods, and the sliding blocks are arranged inside the sliding grooves in a sliding mode.

Compared with the prior art, the beneficial effects of the utility model are that:

the utility model provides a portable semiconductor VC tester, when removing the VC tester body, it slides to the outside in connecting rod groove to drive movable connecting rod through the pulling handle, the slider removes in the inside of spout, make movable connecting rod and handle formation triangle connection, can mention the VC tester body through the middle part of handle this moment and remove, the one hand of having realized carrying to the VC tester body is carried, current semiconductor VC tester when removing has been solved, it holds up the VC tester from the both sides of VC tester and removes to need the operating personnel both hands, it carries the carrying to it to be difficult to the one hand, be not convenient for the problem of carrying of VC tester.

Drawings

FIG. 1 is a schematic view of the present invention;

FIG. 2 is a schematic view of the side mounting plate of the present invention;

FIG. 3 is a schematic view of the handle structure of the present invention;

FIG. 4 is a schematic view of the structure of the movable connecting rod of the present invention;

fig. 5 is a schematic sectional view of the present invention.

In the figure: VC tester body 1, side mounting panel 2, accomodate groove 21, connecting rod groove 22, spout 23, hinge hole 24, constant head tank 25, handle 3, connecting block 31, a connecting hole 311, hinge bar 32, elastic locating ball 33, activity connecting rod 4, connecting groove 41, no. two connecting holes 411, pivot 412, slider 42.

Detailed Description

In order to make the objects, technical solutions and advantages of the present invention clear and fully described, embodiments of the present invention are further described in detail below with reference to the accompanying drawings. It is to be understood that the specific embodiments described herein are merely illustrative of some embodiments of the invention and are not limiting of the invention, and that all other embodiments obtained by those of ordinary skill in the art without the exercise of inventive faculty are within the scope of the invention.

Example one

Referring to fig. 1-5, the present invention provides a technical solution:

a portable semiconductor VC tester, the portable semiconductor VC tester comprising: the VC tester body 1 is provided with a side mounting plate 2 on the side, a storage groove 21 is arranged on the surface of the side mounting plate 2, and a connecting rod groove 22 is arranged on the inner wall of the storage groove 21; the handle 3 is arranged inside the accommodating groove 21, and a connecting block 31 is arranged on the surface of the handle 3; the movable connecting rod 4 is arranged in the connecting rod groove 22, the connecting groove 41 is formed in the surface of the movable connecting rod 4, and the sliding block 42 is arranged on the side surface of the movable connecting rod 4; the back of the VC tester body 1 is provided with a power interface, and the front of the VC tester body 1 is provided with a control button, a display and a semiconductor test connection point; when the VC tester body 1 is moved, the movable connecting rod 4 is driven to be drawn out from the inside of the connecting rod groove 22 by pulling the lifting handle 3, so that the movable connecting rod 4 and the lifting handle 3 form triangular connection, and the VC tester body 1 can be lifted up through the middle part of the lifting handle 3 at the moment.

Example two

On the basis of the first embodiment, in order to realize the rotation and the positioning of the lifting handle 3, the side mounting plates 2 are in a square plate-shaped structure, two groups of side mounting plates 2 are arranged, and the two groups of side mounting plates 2 are symmetrically and fixedly arranged on two sides of the VC tester body 1; hinge holes 24 are symmetrically formed in the side wall of the accommodating groove 21, and a positioning groove 25 is formed in the side wall of one side, away from the VC tester body 1, of each hinge hole 24; the handle 3 is in a '21274', four groups of hinged rods 32 are fixedly arranged on the surface of the handle 3, the four groups of hinged rods 32 are symmetrically arranged at the end parts of two sides of the handle 3, the hinged rods 32 are rotatably arranged in the hinged holes 24, elastic positioning balls 33 are symmetrically arranged at two sides of the handle 3, the positions of the elastic positioning balls 33 correspond to the positions of the positioning grooves 25, and the handle 3 and the inner wall of the accommodating groove 21 are arranged in a sliding manner; two groups of connecting blocks 31 are arranged, the two groups of connecting blocks 31 are symmetrically arranged on two sides of one surface of the handle 3 close to the connecting bar groove 22, a first connecting hole 311 is formed in the surface of each connecting block 31, and the first connecting hole 311 penetrates through two sides of each connecting block 31; handle 3 rotates through hinge bar 32 and hinge hole 24 and sets up in the inside of accomodating groove 21, top through pulling handle 3, drive handle 3 and use hinge bar 32 to rotate as the axle, handle 3 is when accomodating the inside rotation of groove 21, elastic positioning ball 33 receives the extrusion production elastic deformation who accomodates the groove 21 lateral wall, when elastic positioning ball 33 aligns with constant head tank 25, elastic positioning ball 33 resilience card goes into the inside of constant head tank 25, the realization is to the location of constant head tank 25.

EXAMPLE III

On the basis of the second embodiment, in order to realize the movement of the movable connecting rod 4 in the connecting rod groove 22, the side wall of the connecting rod groove 22 is symmetrically provided with sliding grooves 23, and the inner wall of one side of the connecting rod groove 22, which is close to the hinge hole 24, is provided with an inclined surface; the movable connecting rod 4 is of a square column structure, the movable connecting rod 4 and the inner wall of the connecting rod groove 22 are arranged in a sliding mode, the connecting groove 41 is provided with a surface close to one end of the movable connecting rod 4 close to the handle 3, the side walls of the two sides of the connecting groove 41 are symmetrically provided with a second connecting hole 411, the second connecting hole 411 penetrates through the inner wall of the connecting groove 41 and the surface of the movable connecting rod 4, the inner wall of the connecting groove 41 and the connecting block 31 are arranged in a sliding mode, a rotating shaft 412 is inserted into the second connecting hole 411 in a penetrating mode, the rotating shaft 412 penetrates through the first connecting hole 311, the rotating shaft 412 and the inner wall of the second connecting hole 411 are arranged in a rotating mode, and the rotating shaft 412 and the inner wall of the first connecting hole 311 are arranged in a rotating mode; the sliding blocks 42 are fixedly connected with the movable connecting rods 4, two groups of sliding blocks 42 are fixedly arranged on the surface of each group of movable connecting rods 4, and the sliding blocks 42 are arranged inside the sliding groove 23 in a sliding manner; activity connecting rod 4 slides through slider 42 and spout 23 and sets up in the inside of connecting rod groove 22, the one end that activity connecting rod 4 is close to handle 3 rotates with handle 3 to be connected, when pulling handle 3, handle 3 passes through connecting block 31 pulling activity connecting rod 4 and slides to the outside of connecting rod groove 22, slider 42 moves in the inside of spout 23, pivot 412 and connecting block 31 rotation are passed through to the one end of activity connecting rod 4, the other end of activity connecting rod 4 passes through slider 42 and spout 23 rotates, because one side inner wall that connecting rod groove 22 is close to hinge hole 24 sets up to the inclined plane, so can not block activity connecting rod 4's rotation, realized driving activity connecting rod 4 through pulling handle 3 and at the inside removal of connecting rod groove 22.

During the in-service use, when removing VC tester body 1, drive the inside of elastically positioned ball 33 follow constant head tank 25 through pulling handle 3 and break away from, because handle 3 rotates through hinge bar 32 and hinge hole 24 and sets up in the inside of accomodating groove 21, handle 3 uses hinge bar 32 to rotate as the axle when pulling the top of handle 3, it slides to the outside of connecting rod groove 22 to drive movable connecting rod 4 through connecting block 31 simultaneously, slider 42 removes in the inside of spout 23, movable connecting rod 4's one end is rotated through pivot 412 and connecting block 31, movable connecting rod 4's the other end passes through slider 42 and spout 23 rotates, because connecting rod groove 22 is close to one side inner wall of hinge hole 24 and sets up to the inclined plane, so can not block movable connecting rod 4's rotation, realized taking out from the inside of connecting rod groove 22 through pulling handle 3 drive movable connecting rod 4, make movable connecting rod 4 and handle 3 form the triangular connection, can mention VC tester body 1 through the middle part of handle 3 this moment and move.

Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that changes, modifications, substitutions and alterations can be made in these embodiments without departing from the principles and spirit of the invention, the scope of which is defined in the appended claims and their equivalents.

Claims

1. A portable semiconductor VC tester is characterized in that: the portable semiconductor VC tester comprises:

the VC tester comprises a VC tester body (1), wherein a side mounting plate (2) is arranged on the side surface of the VC tester body (1), a storage groove (21) is formed in the surface of the side mounting plate (2), and a connecting rod groove (22) is formed in the inner wall of the storage groove (21);

the lifting handle (3) is arranged inside the accommodating groove (21), and a connecting block (31) is arranged on the surface of the lifting handle (3);

the movable connecting rod (4) is arranged in the connecting rod groove (22), the connecting groove (41) is formed in the surface of the movable connecting rod (4), and the sliding block (42) is arranged on the side face of the movable connecting rod (4).

2. A portable semiconductor VC tester as recited in claim 1, wherein: the back of the VC tester body (1) is provided with a power interface, and the front of the VC tester body (1) is provided with a control button, a display and a semiconductor test connection point.

3. A portable semiconductor VC tester as recited in claim 2, wherein: the side mounting plates (2) are of square plate structures, the side mounting plates (2) are arranged in two groups, and the two groups of side mounting plates (2) are symmetrically and fixedly mounted on two sides of the VC tester body (1).

4. A portable semiconductor VC tester as recited in claim 3, wherein: hinge holes (24) are symmetrically formed in the side wall of the accommodating groove (21), and positioning grooves (25) are formed in the side wall, far away from the VC tester body (1), of one side of each hinge hole (24).

5. A portable semiconductor VC tester as claimed in claim 4, wherein: the side wall of the connecting rod groove (22) is symmetrically provided with sliding grooves (23), and the inner wall of one side of the connecting rod groove (22) close to the hinge hole (24) is an inclined surface.

6. A portable semiconductor VC tester as claimed in claim 5, wherein: the lifting handle (3) is of a '21274', four groups of hinged rods (32) are fixedly arranged on the surface of the lifting handle (3), the four groups of hinged rods (32) are symmetrically arranged at the end parts of two sides of the lifting handle (3), the hinged rods (32) are rotatably arranged in the hinged holes (24), elastic positioning balls (33) are symmetrically arranged at two sides of the lifting handle (3), the positions of the elastic positioning balls (33) correspond to the positions of the positioning grooves (25), and the lifting handle (3) and the inner wall of the accommodating groove (21) are arranged in a sliding mode.

7. A portable semiconductor VC tester as recited in claim 6, wherein: connecting block (31) are provided with two sets ofly, and two sets of connecting block (31) symmetry sets up in handle (3) and is close to the both sides of the one side of connecting rod groove (22), and a connecting hole (311) has been seted up on the surface of connecting block (31), and the both sides of connecting block (31) are run through to a connecting hole (311).

8. A portable semiconductor VC tester as recited in claim 7, wherein: activity connecting rod (4) are square column structure, the inner wall of activity connecting rod (4) and connecting rod groove (22) slides and sets up, connecting groove (41) are seted up and are close to the surface of the one end of handle (3) with activity connecting rod (4), no. two connecting holes (411) have been seted up to the both sides lateral wall symmetry of connecting groove (41), no. two connecting hole (411) run through the inner wall of connecting groove (41) and the surface of activity connecting rod (4), the inner wall and the connecting block (31) of connecting groove (41) slide and set up, the inside of No. two connecting hole (411) is pegged graft and is had pivot (412), pivot (412) run through connecting hole (311), pivot (412) rotate with the inner wall of No. two connecting hole (411) and set up, and pivot (412) rotate with the inner wall of connecting hole (311) and set up.

9. A portable semiconductor VC tester as recited in claim 8, wherein: the sliding blocks (42) are fixedly connected with the movable connecting rods (4), two groups of sliding blocks (42) are fixedly arranged on the surface of each group of movable connecting rods (4), and the sliding blocks (42) are arranged inside the sliding grooves (23) in a sliding mode.