CN218446473U - Automobile domain controller test system - Google Patents
Automobile domain controller test system Download PDFInfo
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- CN218446473U CN218446473U CN202222502621.2U CN202222502621U CN218446473U CN 218446473 U CN218446473 U CN 218446473U CN 202222502621 U CN202222502621 U CN 202222502621U CN 218446473 U CN218446473 U CN 218446473U
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Abstract
The utility model provides a car domain controller test system, include: the temperature control box is internally provided with a temperature sensor, a heating element and a fan, and the domain controller to be tested is placed in the temperature control box; the upper computer is provided with a single chip microcomputer and a display module; the control signal output element is connected with the upper computer; the test signal transmission element is respectively connected with the domain controller and the control signal output element; a test element connected to the test signal transmission element; wherein, the singlechip is connected with display module, temperature sensor, heating element and fan respectively. The utility model discloses can carry out the control simulation test under the operational environment temperature, through heating element and fan moreover, can regulate and control the required ambient temperature of simulation test well.
Description
Technical Field
The utility model belongs to the technical field of the automotive test technique and specifically relates to a car territory controller test system is related to.
Background
With the improvement of the computing power of the automobile chip, the domain controller gradually becomes a research hotspot in the automobile electronic industry. Compared with a distributed architecture, namely different electronic and electrical functions are placed on different electric control systems, the domain controller is more concentrated on system schemes and software integrated control, and the defects of inconsistent interaction and redundancy between embedded software and bottom layer drivers in the distributed architecture are effectively overcome. The automobile domain controller integrates all basic drives of automobile electronics, integrates functions of electric control systems such as keys, lamps, automobile doors and automobile windows, and avoids risks caused by inconsistent communication among controllers.
In the whole vehicle research and development or manufacturing stage or the pre-factory stage of the automobile, a domain controller generally needs to be subjected to comprehensive function test and verification, but a few control simulation test schemes exist, and even a control simulation test scheme at the working environment temperature is lacked.
SUMMERY OF THE UTILITY MODEL
The utility model provides a car domain controller test system to a control simulation test scheme under the operational environment temperature is provided, a profitable selection is provided at least.
In order to achieve the above purpose, the utility model adopts the following technical proposal:
a car domain controller test system comprising: the temperature control box is internally provided with a temperature sensor, a heating element and a fan, and the domain controller to be tested is placed in the temperature control box; the upper computer is provided with a singlechip and a display module; the control signal output element is connected with the upper computer; the test signal transmission element is respectively connected with the domain controller and the control signal output element; a test element connected to the test signal transmission element; the single chip microcomputer is respectively connected with the display module, the temperature sensor, the heating element and the fan.
The utility model discloses an embodiment, the singlechip, temperature sensor, heating element and fan constitute temperature controller, temperature controller's circuit includes temperature sensor chip U1, singlechip chip U2, fan motor M, heating load F1, resistance R2, resistance R3, resistance R4, triode Q1, triode Q2, relay, power P2 and voltage end VCC; a pin 2 of the temperature sensor chip U1 is connected to one end of the resistor R1 and a pin 7 of the single chip microcomputer chip U2, a pin 3 of the temperature sensor chip U1 is connected to the voltage terminal VCC and the other end of the resistor R1, a pin 2 of the single chip microcomputer chip U2 is connected to the coil KM1 of the relay, a pin 1 of the single chip microcomputer chip U2 is connected to one end of the resistor R2, the other end of the resistor R2 is connected to a base of the triode Q1, a collector of the triode Q1 is connected to one end of the resistor R3 and one end of the resistor R4, the other end of the resistor R3 is connected to the voltage terminal VCC and an emitter of the triode Q2, the other end of the resistor R4 is connected to a base of the triode Q2, a collector of the triode Q2 is connected to one end of the fan motor M, and an emitter of the triode Q1 is connected to the other end of the fan motor M and then grounded; the power supply P2, the normally open contact KM11 of the relay and the heating load F1 are connected in series to form a loop.
In an embodiment of the present invention, the circuit of the temperature controller further includes a resistor R5, a crystal oscillator X1, a capacitor C2, and a capacitor C3; the one end of electric capacity C1 with voltage end VCC connects, the other end of electric capacity C1 with the one end of resistance R5 with singlechip chip U2's pin 9 is connected, the other end of resistance R5 with the one end of electric capacity C2, the one end of electric capacity C3 and singlechip chip U2's pin 20 connect back ground connection, electric capacity C2's the other end with crystal oscillator X1's pin 2 with singlechip chip U2's pin 18 is connected, electric capacity C3's the other end with crystal oscillator X1's pin 1 with singlechip chip U2's pin 19 is connected.
The utility model discloses an embodiment, temperature controller's circuit still includes power P1 and self-locking switch SZ, power P1's pin 1 with self-locking switch SZ's pin 1 is connected, self-locking switch SZ's pin 3 does voltage end VCC.
The utility model discloses an embodiment, temperature controller's circuit still includes button K1, button K2 and button K3, button K1, button K2 and button K3 respectively with singlechip chip U2's pin 15, pin 16 and pin 17 one-to-one are connected.
In one embodiment of the present disclosure, the display module includes a resistor J1, a latch U3 and a digital tube U4; a pin 40 of the single chip U2 is connected to the voltage terminal VCC, a pin 1 of the exclusion J1, and a pin 11 of the latch U3, and a pin 39, a pin 38, a pin 37, a pin 36, a pin 35, a pin 34, a pin 33, and a pin 32 of the single chip U2 are respectively connected to a pin 2, a pin 3, a pin 4, a pin 5, a pin 6, a pin 7, a pin 8, and a pin 9 of the latch U3 through a pin 2, a pin 3, a pin 4, a pin 5, a pin 6, a pin 7, a pin 8, and a pin 9 of the latch J1 in a one-to-one correspondence manner; the pin 19, the pin 18, the pin 17, the pin 16, the pin 15, the pin 14, the pin 13 and the pin 12 of the latch U3 are respectively connected with the pin 11, the pin 7, the pin 4, the pin 2, the pin 1, the pin 10, the pin 5 and the pin 3 of the nixie tube U4 in a one-to-one correspondence manner; and the pin 28, the pin 27, the pin 26 and the pin 25 of the singlechip chip U2 are respectively connected with the pin 6, the pin 8, the pin 9 and the pin 12 of the nixie tube U4 in a one-to-one correspondence manner.
The utility model discloses an in the embodiment, the inside humidity transducer that is equipped with of temperature control box, humidity transducer with the singlechip is connected.
The utility model discloses an embodiment, the test element includes battery emulation test element, temperature simulation test element, relay drive test element, becomes soon and decodes test element and communication test element.
The utility model discloses an embodiment, the test signal transmission component includes digital signal transmission unit, analog signal transmission unit, bus signal transmission unit, power signal transmission unit and frequency signal transmission unit.
To sum up, the utility model discloses following beneficial effect has at least: the utility model discloses an inside temperature control box that is equipped with temperature sensor, heating element and fan can carry out the control simulation test under the operational environment temperature, passes through heating element and fan moreover, can regulate and control the required ambient temperature of simulation test well.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings used in the description of the embodiments will be briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art that other drawings can be obtained according to these drawings without creative efforts.
Fig. 1 is a schematic structural diagram of a car domain controller test system according to some embodiments of the present invention.
Fig. 2 and 3 are schematic circuit diagrams of a car domain controller test system according to some embodiments of the present invention.
Detailed Description
In the following, only certain exemplary embodiments are briefly described. As those skilled in the art will recognize, the described embodiments may be modified in various different ways, all without departing from the spirit or scope of the embodiments of the present invention. Accordingly, the drawings and description are to be regarded as illustrative in nature, and not as restrictive.
In the description of the embodiments of the present invention, it should be understood that the terms "length," "vertical," "horizontal," "top," "bottom," and the like refer to an orientation or positional relationship based on that shown in the drawings, which is only for convenience of description and simplicity of description, and does not indicate or imply that the device or element so referred to must have a particular orientation, be constructed and operated in a particular orientation, and thus, should not be taken as limiting the embodiments of the present invention.
Furthermore, the terms "first", "second" and "first" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of the embodiments of the present invention, "a plurality" means two or more unless specifically limited otherwise.
In the embodiments of the present invention, unless otherwise explicitly specified or limited, the terms "mounted," "connected," "fixed," and the like are to be construed broadly, and may be, for example, fixedly connected, detachably connected, or integrated; the connection can be mechanical connection, electrical connection or communication; either directly or indirectly through intervening media, either internally or in any other relationship. The specific meaning of the above terms in the embodiments of the present invention can be understood by those skilled in the art according to specific situations.
In embodiments of the invention, unless expressly stated or limited otherwise, the first feature "on" or "under" the second feature may comprise direct contact between the first and second features, or may comprise contact between the first and second features through another feature not in direct contact. Also, the first feature being "on," "above" and "over" the second feature includes the first feature being directly on and obliquely above the second feature, or merely indicating that the first feature is at a higher level than the second feature. A first feature being "under," "below," and "beneath" a second feature includes the first feature being directly under and obliquely below the second feature, or simply meaning that the first feature is at a lesser elevation than the second feature.
The following disclosure provides many different embodiments or examples for implementing different configurations of embodiments of the invention. In order to simplify the disclosure of embodiments of the present invention, the components and arrangements of specific examples are described below. Of course, they are merely examples and are not intended to limit embodiments of the present invention. Furthermore, embodiments of the present invention may repeat reference numerals and/or reference letters in the various examples for purposes of simplicity and clarity and do not in themselves dictate a relationship between the various embodiments and/or arrangements discussed.
Embodiments of the present invention will be described in detail below with reference to the accompanying drawings.
As shown in fig. 1, the present embodiment provides a testing system for a car domain controller, including: the temperature control box is internally provided with a temperature sensor, a heating element and a fan, and the domain controller to be tested is placed in the temperature control box; the upper computer is provided with a single chip microcomputer and a display module; the control signal output element is connected with the upper computer; the test signal transmission element is respectively connected with the domain controller and the control signal output element; a test element connected to the test signal transmission element; wherein, the singlechip is connected with display module, temperature sensor, heating element and fan respectively.
In some embodiments, the single chip microcomputer, the temperature sensor, the heating element and the fan form a temperature controller, as shown in fig. 2 and 3, a circuit of the temperature controller includes a temperature sensor chip U1, a single chip microcomputer chip U2, a fan motor M, a heating load F1, a resistor R2, a resistor R3, a resistor R4, a transistor Q1, a transistor Q2, a relay, a power supply P2 and a voltage terminal VCC; a pin 2 of a temperature sensor chip U1 is connected with one end of a resistor R1 and a pin 7 of a single chip microcomputer chip U2, a pin 3 of the temperature sensor chip U1 is connected with a voltage end VCC and the other end of the resistor R1, a pin 2 of the single chip microcomputer chip U2 is connected with a coil KM1 of a relay, a pin 1 of the single chip microcomputer chip U2 is connected with one end of the resistor R2, the other end of the resistor R2 is connected with a base electrode of a triode Q1, a collector electrode of the triode Q1 is connected with one end of the resistor R3 and one end of a resistor R4, the other end of the resistor R3 is connected with a voltage end VCC and an emitter electrode of the triode Q2, the other end of the resistor R4 is connected with a base electrode of the triode Q2, a collector electrode of the triode Q2 is connected with one end of a fan motor M, and an emitter electrode of the triode Q1 is connected with the other end of the fan motor M and then grounded; the power supply P2, the normally open contact KM11 of the relay and the heating load F1 are connected in series to form a loop.
In some embodiments, as shown in fig. 2, the circuit of the temperature controller further includes a resistor R5, a crystal oscillator X1, a capacitor C2, and a capacitor C3; one end and the voltage end VCC of electric capacity C1 are connected, the other end and the one end of resistance R5 of electric capacity C1 and singlechip chip U2's pin 9 are connected, resistance R5's the other end and electric capacity C2's one end, electric capacity C3's one end and singlechip chip U2's pin 20 are connected the back ground connection, electric capacity C2's the other end and crystal oscillator X1's pin 2 and singlechip chip U2's pin 18 are connected, electric capacity C3's the other end and crystal oscillator X1's pin 1 and singlechip chip U2's pin 19 are connected.
In some embodiments, as shown in fig. 2, the circuit of the temperature controller further includes a power supply P1 and a latching switch SZ, pin 1 of the power supply P1 is connected to pin 1 of the latching switch SZ, and pin 3 of the latching switch SZ serves as a voltage terminal VCC.
In some embodiments, as shown in fig. 2, the circuit of the temperature controller further includes a key K1, a key K2, and a key K3, and the key K1, the key K2, and the key K3 are respectively connected to the pins 15, 16, and 17 of the single chip U2 in a one-to-one correspondence manner.
In some embodiments, as shown in fig. 2, the display module includes a resistor J1, a latch U3, and a digital tube U4; a pin 40 of the single chip microcomputer chip U2 is connected with a voltage terminal VCC, a pin 1 of the exclusion J1 and a pin 11 of the latch U3, and a pin 39, a pin 38, a pin 37, a pin 36, a pin 35, a pin 34, a pin 33 and a pin 32 of the single chip microcomputer chip U2 are correspondingly connected with a pin 2, a pin 3, a pin 4, a pin 5, a pin 6, a pin 7, a pin 8 and a pin 9 of the latch U3 through a pin 2, a pin 3, a pin 4, a pin 5, a pin 6, a pin 7, a pin 8 and a pin 9 of the exclusion J1; pin 19, pin 18, pin 17, pin 16, pin 15, pin 14, pin 13 and pin 12 of the latch U3 are respectively connected with pin 11, pin 7, pin 4, pin 2, pin 1, pin 10, pin 5 and pin 3 of the nixie tube U4 in a one-to-one correspondence manner; and the pin 28, the pin 27, the pin 26 and the pin 25 of the singlechip chip U2 are respectively connected with the pin 6, the pin 8, the pin 9 and the pin 12 of the nixie tube U4 in a one-to-one correspondence manner.
In some embodiments, a humidity sensor is arranged in the temperature control box and connected with the single chip microcomputer.
In some embodiments, the temperature sensor is connected with the single chip microcomputer through a first switch, and the humidity sensor is connected with the single chip microcomputer through a second switch. Through first switch and second switch, can the selective use temperature sensor and humidity transducer, carry out temperature simulation test or humidity simulation test or humiture simulation test, can simulate domain controller's operational environment well.
In summary, the key K1 is a temperature setting key, the key K2 is a temperature adding key, and the key K3 is a temperature subtracting key, and the upper limit temperature of the environmental temperature in the temperature control box can be set by pressing the key K1 first and then by using the key K2 and the key K3; and then the key K1 is pressed, the lower limit temperature of the environmental temperature in the temperature control box can be set through the key K2 and the key K3, and then the key K1 is pressed for storage setting.
When the temperature sensor chip U1 detects that the ambient temperature is lower than the lower limit temperature, the single chip U2 outputs voltage to the coil KM1 of the relay, the coil KM1 is electrified, the normally open contact KM11 is closed, the power supply P2 supplies power to the heating load F1, the heating load F1 works, and the ambient temperature in the temperature control box rises.
When the temperature sensor chip U1 detects that the ambient temperature is higher than the upper limit temperature, the single chip U2 stops outputting voltage to the coil KM1 of the relay, the coil KM1 loses power, the normally open contact KM11 is disconnected, the power supply P2 stops supplying power to the heating load F1, the heating load F1 stops working, meanwhile, the single chip U2 outputs voltage to the triode Q1 through the resistor R2, the triode Q1 is conducted, the triode Q2 is conducted, the fan motor M starts working after being electrified, and the ambient temperature in the temperature control box is reduced.
Thereby controlling the environmental temperature in the temperature control box within the set upper and lower limit temperature ranges; the temperature can be displayed through the latch U3 and the digital tube U4.
Similarly, in practical application, the humidity sensor can be provided with a set of new single chip microcomputer, a display module, a heating element and a fan to form a humidity controller, the humidity simulation process of the humidity controller refers to the temperature simulation process, if the humidity can be reduced through heating, the humidity can be reduced by taking away the moisture through the fan, and the like, and the humidity controller is not repeated.
It is clear that the temperature sensor chip U1 is represented by a temperature sensor in a circuit, the single chip microcomputer chip U2 is represented by a single chip microcomputer in a circuit, the fan motor M is represented by a fan in a circuit, the heating load F1 is represented by a heating element in a circuit, and the heating element may be an electric heating tube or other existing heating equipment; the connection relationship of the devices, and the parameter settings and models of the devices are shown in fig. 2 and fig. 3, which are not described again.
In some embodiments, the test elements include a battery emulation test element, a temperature simulation test element, a relay drive test element, a resolver decoding test element, and a communication test element, all of which are connected to the test signal transmission element.
In some embodiments, the test signal transmission element includes a digital signal transmission unit for acquiring or outputting a digital signal, an analog signal transmission unit for acquiring or outputting an analog signal, a bus signal transmission unit for acquiring or outputting a bus signal, a power signal transmission unit for acquiring or outputting a power signal, and a frequency signal transmission unit for acquiring or outputting a frequency signal, and the control signal output element is connected to the domain controller through the digital signal transmission unit, the analog signal transmission unit, the bus signal transmission unit, the power signal transmission unit, and the frequency signal transmission unit, respectively.
It should be noted that the upper computer, the control signal output element, the test element and the test signal transmission element are all existing devices, that is, the test scheme is an existing scheme, and can perform comprehensive function test and verification on the domain controller, and a specific test process is not described here, and a simple description of a test principle is as follows:
test signal transmission element and test element do the utility model discloses car domain controller test system's the execution unit, test signal transmission element are used for gathering or the output carries out the required various electrical signal of test.
Control signal output element does the utility model discloses car domain controller test system's the control unit, through control signal output element and test signal transmission element, the host computer is controlled and is measured control signal output element, realizes automatic test.
To sum up, the utility model discloses technical scheme's focus lies in: the control simulation test under the working environment temperature is carried out on the domain controller to be tested through the single chip microcomputer, the display module, the temperature sensor, the heating element and the fan as well as the existing upper computer, the control signal output element, the test element and the test signal transmission element.
While the foregoing embodiments have described a number of specific embodiments of the present invention, it will be appreciated by those skilled in the art that changes and modifications may be made thereto without departing from the principles and spirit of the invention, and it is intended to cover all such changes and modifications as fall within the scope of the invention.
Claims (9)
1. A car domain controller test system, comprising:
the temperature control box is internally provided with a temperature sensor, a heating element and a fan, and the domain controller to be tested is placed in the temperature control box;
the upper computer is provided with a singlechip and a display module;
the control signal output element is connected with the upper computer;
the test signal transmission element is respectively connected with the domain controller and the control signal output element;
a test element connected to the test signal transmission element;
the single chip microcomputer is respectively connected with the display module, the temperature sensor, the heating element and the fan.
2. The auto domain controller testing system of claim 1, wherein the single chip microcomputer, the temperature sensor, the heating element and the fan constitute a temperature controller, and a circuit of the temperature controller includes a temperature sensor chip U1, a single chip microcomputer chip U2, a fan motor M, a heating load F1, a resistor R2, a resistor R3, a resistor R4, a triode Q1, a triode Q2, a relay, a power supply P2 and a voltage terminal VCC;
a pin 2 of the temperature sensor chip U1 is connected to one end of the resistor R1 and a pin 7 of the single chip microcomputer chip U2, a pin 3 of the temperature sensor chip U1 is connected to the voltage terminal VCC and the other end of the resistor R1, a pin 2 of the single chip microcomputer chip U2 is connected to the coil KM1 of the relay, a pin 1 of the single chip microcomputer chip U2 is connected to one end of the resistor R2, the other end of the resistor R2 is connected to a base of the triode Q1, a collector of the triode Q1 is connected to one end of the resistor R3 and one end of the resistor R4, the other end of the resistor R3 is connected to the voltage terminal VCC and an emitter of the triode Q2, the other end of the resistor R4 is connected to a base of the triode Q2, a collector of the triode Q2 is connected to one end of the fan motor M, and an emitter of the triode Q1 is connected to the other end of the fan motor M and then grounded;
the power supply P2, the normally open contact KM11 of the relay and the heating load F1 are connected in series to form a loop.
3. The auto domain controller testing system of claim 2, wherein the circuit of the temperature controller further comprises a resistor R5, a crystal oscillator X1, a capacitor C2 and a capacitor C3;
the one end of electric capacity C1 with voltage end VCC connects, the other end of electric capacity C1 with the one end of resistance R5 with singlechip chip U2's pin 9 is connected, the other end of resistance R5 with the one end of electric capacity C2, the one end of electric capacity C3 and singlechip chip U2's pin 20 connect back ground connection, electric capacity C2's the other end with crystal oscillator X1's pin 2 with singlechip chip U2's pin 18 is connected, electric capacity C3's the other end with crystal oscillator X1's pin 1 with singlechip chip U2's pin 19 is connected.
4. The auto domain controller testing system of claim 2, wherein the circuit of the temperature controller further comprises a power supply P1 and a self-locking switch SZ, pin 1 of the power supply P1 is connected with pin 1 of the self-locking switch SZ, and pin 3 of the self-locking switch SZ serves as the voltage terminal VCC.
5. The auto domain controller testing system of claim 2, wherein the circuit of the temperature controller further comprises a key K1, a key K2, and a key K3, and the key K1, the key K2, and the key K3 are respectively connected to the pins 15, 16, and 17 of the monolithic chip U2 in a one-to-one correspondence.
6. The auto domain controller testing system of claim 2, wherein the display module comprises a bank J1, a latch U3 and a digital tube U4;
a pin 40 of the single chip U2 is connected to the voltage terminal VCC, a pin 1 of the exclusion J1, and a pin 11 of the latch U3, and a pin 39, a pin 38, a pin 37, a pin 36, a pin 35, a pin 34, a pin 33, and a pin 32 of the single chip U2 are respectively connected to a pin 2, a pin 3, a pin 4, a pin 5, a pin 6, a pin 7, a pin 8, and a pin 9 of the latch U3 through a pin 2, a pin 3, a pin 4, a pin 5, a pin 6, a pin 7, a pin 8, and a pin 9 of the latch J1 in a one-to-one correspondence manner;
the pin 19, the pin 18, the pin 17, the pin 16, the pin 15, the pin 14, the pin 13 and the pin 12 of the latch U3 are respectively connected with the pin 11, the pin 7, the pin 4, the pin 2, the pin 1, the pin 10, the pin 5 and the pin 3 of the nixie tube U4 in a one-to-one correspondence manner;
and the pin 28, the pin 27, the pin 26 and the pin 25 of the singlechip chip U2 are respectively connected with the pin 6, the pin 8, the pin 9 and the pin 12 of the nixie tube U4 in a one-to-one correspondence manner.
7. The auto domain controller testing system of claim 1, wherein a humidity sensor is disposed inside the temperature control box, and the humidity sensor is connected to the single chip microcomputer.
8. The auto domain controller test system of claim 1, wherein the test elements include a battery emulation test element, a temperature simulation test element, a relay drive test element, a resolver decode test element, and a communications test element.
9. The auto domain controller test system of claim 1, wherein the test signal transmission element includes a digital signal transmission unit, an analog signal transmission unit, a bus signal transmission unit, a power signal transmission unit, and a frequency signal transmission unit.
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| CN202222502621.2U CN218446473U (en) | 2022-09-21 | 2022-09-21 | Automobile domain controller test system |
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| CN202222502621.2U CN218446473U (en) | 2022-09-21 | 2022-09-21 | Automobile domain controller test system |
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