CN218445754U - Electronic product testing device - Google Patents
Electronic product testing device Download PDFInfo
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- CN218445754U CN218445754U CN202222417181.0U CN202222417181U CN218445754U CN 218445754 U CN218445754 U CN 218445754U CN 202222417181 U CN202222417181 U CN 202222417181U CN 218445754 U CN218445754 U CN 218445754U
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Abstract
The utility model discloses an electronic product testing device for lower test probe among the solution current electronic product testing device does not obtain effective protection, leads to lower test probe to appear receiving the technical problem that the collision warp easily. The lower fixing plate of the utility model is fixed on the frame, the lower fixing plate is provided with a mounting seat, the mounting seat is provided with a lower test probe which is arranged on the floating plate in a penetrating way, the floating plate is provided with a protective cover which covers the lower test probe, the protective cover is provided with a first through hole, the top surface of the jig block is provided with a bearing cavity, and the bearing cavity corresponds to the protective cover; the driving assembly is arranged on the rack and connected with the upper testing assembly; when the upper test assembly is driven to press down to the top surface of the jig block, the floating plate descends relative to the lower fixing plate, and the lower test probe penetrates through the first through hole to be electrically connected with an electronic product in the bearing cavity.
Description
Technical Field
The utility model relates to an automatic test technical field especially relates to an electronic product testing arrangement.
Background
The existing electronic product needs to test various functions of the electronic product before leaving a factory, for example, the charging function test of the electronic product is performed, in the charging function test of the electronic product, the electronic product is generally tested through a testing device, firstly, an operator installs a positioning jig which accords with the appearance shape of the electronic product in the testing device, then the electronic product is placed on the positioning jig, then the testing device is started, an upper testing probe and a lower testing probe in the testing device respectively contact terminals of the electronic product to be tested, and finally, whether the electronic product is qualified is automatically judged through the testing device.
In the testing device, the lower testing probe is completely exposed and is not effectively protected, when an operator installs a positioning jig or carries out maintenance and the like, the lower testing probe can be easily collided, and because the lower testing probe is of a slender structure, the lower testing probe is extremely easy to deform and break when being collided.
Therefore, it is an important subject of research by those skilled in the art to find an electronic product testing device capable of solving the above technical problems.
SUMMERY OF THE UTILITY MODEL
The embodiment of the utility model discloses electronic product testing arrangement for lower test probe among the solution current electronic product testing arrangement does not obtain effective protection, leads to test probe to appear receiving the technical problem that the collision warp easily down.
The embodiment of the utility model provides an electronic product testing device, which comprises a frame, a driving component, an upper testing component and a lower testing component;
the lower testing assembly comprises a lower fixed plate, a floating plate arranged on the lower fixed plate in a liftable manner and a jig block arranged on the floating plate;
the lower fixing plate is fixed on the rack, a mounting seat is arranged on the lower fixing plate, a lower test probe is arranged on the mounting seat and penetrates through the floating plate, a protective cover is arranged on the floating plate and covers the lower test probe, a first through hole for the lower test probe to pass through is formed in the protective cover, a bearing cavity for placing an electronic product is arranged on the top surface of the jig block, and the bearing cavity is located above the protective cover and corresponds to the protective cover;
the driving assembly is arranged on the rack and is connected with the upper testing assembly;
when the upper test assembly is driven to be pressed down to the top surface of the jig block, the floating plate descends relative to the lower fixing plate, and the lower test probe penetrates through the first through hole to be electrically connected with an electronic product in the bearing cavity.
Optionally, a switch probe is further mounted on the mounting base, the switch probe penetrates through the floating plate, the protective cover covers the switch probe, and a second through hole for the switch probe to pass through is formed in the protective cover;
the upper test component is driven to be pressed down to the top surface of the jig block, and when the floating plate descends relative to the lower fixing plate, the switch probe penetrates through the second through hole to enter the bearing cavity so as to detect whether an electronic product exists in the bearing cavity.
Optionally, a plurality of elastic resetting pieces are arranged between the lower fixed plate and the floating plate, the top ends of the elastic resetting pieces are connected with the floating plate, and the bottom ends of the elastic resetting pieces are connected with the lower fixed plate;
the lower fixed plate is provided with a plurality of guide through holes, and the floating plate is provided with a plurality of guide posts; or a plurality of guide through holes are formed in the floating plate, a plurality of guide columns are arranged on the lower fixing plate, and the guide through holes are connected with the guide columns in a sliding mode.
Optionally, the upper test assembly comprises an upper mounting plate, a needle base plate and an upper test probe;
the upper mounting plate is connected with the driving assembly, the needle seat plate is fixedly connected to the bottom surface of the upper mounting plate, and the upper test probe is fixed on the needle seat plate;
when the driving component drives the upper mounting plate to move downwards, the needle seat plate moves downwards to abut against the top surface of the jig block, and the lower test probe is electrically connected with the electronic product in the bearing cavity.
Optionally, an elastic buffer column is further mounted on the needle seat plate;
the elastic buffer column contracts and deforms when the needle seat plate is abutted to the top surface of the jig block.
Optionally, a lifting guide pillar is arranged on the frame, and a lifting guide hole is formed in the upper mounting plate;
the lifting guide pillar is connected with the lifting guide hole in a sliding mode.
Optionally, an attraction assembly for attracting the electronic product is arranged in the bearing cavity.
Optionally, the attraction component is a magnetic attraction member.
Optionally, the suction assembly includes a vacuum suction hole, a pipe and a vacuum generator;
the vacuum adsorption hole is formed in the bearing cavity, the pipeline is connected with the vacuum adsorption hole, and the vacuum generator is connected with the pipeline.
Optionally, a product carrier is detachably mounted on the top surface of the jig block, and the bearing cavity is arranged on the product carrier.
According to the technical solution provided by the utility model, the embodiment of the utility model has the following advantage:
in this embodiment, before the electronic product testing device does not begin to operate, the lower test probe is located in the protection casing on the floating plate, and the protection casing can protect the lower test probe effectively, avoids operating personnel or other article to collide the lower test probe and make it warp.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings needed to be used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to the drawings without inventive exercise.
Fig. 1 is a schematic structural diagram of an electronic product testing apparatus provided in an embodiment of the present invention;
fig. 2 is a schematic structural diagram of a lower testing component in an electronic product testing apparatus according to an embodiment of the present invention;
fig. 3 is an exploded view of a lower testing assembly in an electronic product testing apparatus according to an embodiment of the present invention;
fig. 4 is a schematic structural view of the electronic product testing apparatus according to an embodiment of the present invention, after the fixture block is removed from the lower testing assembly;
fig. 5 is a schematic structural diagram of a mounting seat of a lower testing component in an electronic product testing apparatus according to an embodiment of the present invention;
fig. 6 is a schematic structural diagram of an upper testing assembly in an electronic product testing apparatus according to an embodiment of the present invention;
illustration of the drawings: a frame 1; a lower test assembly 2; a lower fixing plate 201; a floating plate 202; a jig block 203; an elastic return member 204; a guide post 205; a shield 206; a first via 2061; a second through hole 2062; a mount 207; a lower test probe 208; a switch probe 209; an avoidance through-groove 210; a product carrier 211; a load-bearing chamber 212; an upper test assembly 3; an upper mounting plate 301; a needle plate 302; a lower test probe 303; a resilient bumper post 304; a grating sensor 4; and an electronic product 5.
Detailed Description
The embodiment of the utility model discloses electronic product testing arrangement for lower test probe among the solution current electronic product testing arrangement does not obtain effective protection, leads to lower test probe to appear receiving the technical problem that the collision warp easily.
In order to make the technical field better understand the solution of the present invention, the following detailed description is given with reference to the accompanying drawings and the detailed description. It is to be understood that the disclosed embodiments are merely exemplary of the invention, and are not intended to limit the invention to the precise embodiments disclosed. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.
Referring to fig. 1 to 6, an embodiment of the present invention provides an electronic product testing apparatus, including:
the device comprises a rack 1, a driving assembly, an upper testing assembly 3 and a lower testing assembly 2;
the lower testing component 2 comprises a lower fixing plate 201, a floating plate 202 arranged on the lower fixing plate 201 in a lifting way, and a jig block 203 arranged on the floating plate 202;
the lower fixing plate 201 is fixed on the rack 1, the lower fixing plate 201 is provided with a mounting seat 207, the mounting seat 207 is provided with a lower test probe 208, the lower test probe 208 penetrates through the floating plate 202, the floating plate 202 is provided with a protective cover 206, the protective cover 206 covers the lower test probe 208, the protective cover 206 is provided with a first through hole 2061 for the lower test probe 208 to pass through, the top surface of the jig block 203 is provided with a bearing cavity 212 for placing an electronic product, and the bearing cavity 212 is located above the protective cover 206 and corresponds to the protective cover 206;
the driving assembly is arranged on the rack 1 and is connected with the upper testing assembly 3;
when the upper testing component 3 is not driven to press down to the top surface of the fixture block 203, the lower testing probe 208 is in the protective cover 206; when the upper testing assembly 3 is driven to press down to the top surface of the fixture block 203, the floating plate 202 descends relative to the lower fixing plate 201, and the lower testing probes 208 pass through the first through holes 2061 to be electrically connected with the electronic product located in the carrying cavity 212.
It should be noted that the protection mask 206 in this embodiment is similar to a rectangular parallelepiped structure, wherein the first through hole 2061 is specifically disposed on the top surface of the protection mask 206, and through the above design, the impact of the downward test probe 208 can be effectively blocked.
In this embodiment, before the electronic product testing apparatus starts to operate, the lower test probe 208 is located in the protective cover 206 on the floating plate 202, and the protective cover 206 can effectively protect the lower test probe 208 to prevent an operator or other objects from colliding with the lower test probe 208 and deforming the lower test probe 208.
Further, a switch probe 209 is further mounted on the mounting base 207, the switch probe 209 is inserted through the floating plate 202, the protective cover 206 covers the switch probe 209, and a second through hole 2062 for the switch probe 209 to pass through is formed in the protective cover 206;
it should be noted that, when the upper testing component 3 is not driven to be pressed down to the top surface of the fixture block 203, the switch probe 209 is located in the protective cover 206.
When the upper test assembly 3 is driven to press down to the top surface of the fixture block 203, and the floating plate 202 is lowered relative to the lower fixing plate 201, the switch probe 209 passes through the second through hole 2062 and enters the carrying cavity 212 to detect whether an electronic product exists in the carrying cavity 212.
Specifically, when an electronic product exists in the bearing cavity 212, the switch probe 209 will contact the electronic product in the bearing cavity 212 and be in a closed state, thereby indicating that the electronic product exists in the bearing cavity 212. Conversely, when the electronic product is not in the carrier chamber 212, the switch probe 209 is not in contact with the electronic product, and therefore, the switch probe 209 is in an open state, thereby indicating that no electronic product is in the carrier chamber 212.
Furthermore, in the embodiment, the floating plate 202 is provided with an avoidance through groove 210 corresponding to the position of the mounting seat 207, the lower test probe 208 and the switch probe 209 are both inserted into the floating plate 202 through the avoidance through groove 210, and the shield 206 is located above the avoidance through groove 210.
In addition, it can be understood that the loading cavity 212 in this embodiment is preset with a preset through hole (not shown in the drawings) for the lower test probe 208 and the switch probe 209 to pass through, when the floating plate is pressed to move downward, the lower test probe 208 passes through the first through hole 2061, then passes through the preset through hole on the loading cavity 212, and then contacts with the electronic product to realize electrical connection, and at the same time, the switch probe 209 passes through the second through hole 2062, then passes through the preset through hole on the loading cavity 212, and then detects whether the electronic product exists in the loading cavity 212.
Further, a grating sensor 4 is further mounted on the frame 1 in the embodiment, and the grating sensor 4 is used for sensing the hand of an operator during operation so as to ensure the operation safety; when the grating sensor 4 senses a hand, the driving assembly cannot be started, and after the hand is not sensed any more, the driving assembly can be started to drive the upper testing assembly 3 to implement the pressing action.
Further, in the present embodiment, a plurality of elastic restoring members 204 are disposed between the lower fixed plate 201 and the floating plate 202, a top end of each elastic restoring member 204 is connected to the floating plate 202, and a bottom end of each elastic restoring member 204 is connected to the lower fixed plate 201;
a plurality of guide through holes are formed in the lower fixing plate 201, and a plurality of guide posts 205 are formed in the floating plate 202; alternatively, the floating plate 202 is provided with a plurality of guide through holes, the lower fixing plate 201 is provided with a plurality of guide posts 205, and the guide through holes are slidably connected with the guide posts 205.
It should be noted that, by providing a plurality of elastic restoring members 204 between the lower fixing plate 201 and the floating plate 202, the floating plate 202 can be restored to the initial position after being pressed down. In addition, the floating plate 202 can be more stable during the lifting process by slidably coupling the guide posts 205 with the guide through holes.
Further, the upper testing component 3 in this embodiment includes an upper mounting plate 301, a needle base plate 302, and an upper testing probe 303;
the upper mounting plate 301 is connected to the driving assembly, the needle plate 302 is fixedly connected to the bottom surface of the upper mounting plate 301, and the upper test probe 303 is fixed to the needle plate 302.
It should be noted that, when the driving assembly drives the upper mounting plate 301 to move downward, the needle plate 302 moves downward to abut against the top surface of the jig block 203, and the lower test probe 208 is electrically connected to the electronic product in the carrying cavity 212.
Further, the needle seat plate 302 in this embodiment is further provided with an elastic buffer column 304;
the elastic buffer column 304 contracts and deforms when the needle plate 302 abuts against the top surface of the jig block 203.
It should be noted that, by installing the elastic buffer column 304 on the pin pad 302, the pressure when the pin pad 302 abuts against the top surface of the fixture block 203 can be buffered, so as to prevent the upper test probe 303 from being broken off in the contact process between the upper test probe 303 and the electronic product due to the excessive pressure of the pin pad 302, or prevent the upper test probe 303 from damaging the electronic product.
Further, a lifting guide post is arranged on the frame 1 in this embodiment, and a lifting guide hole is formed on the upper mounting plate 301;
the lifting guide pillar is connected with the lifting guide hole in a sliding mode.
It should be noted that, through the above design, the upper mounting plate 301 can be more stable in the lifting process.
Further, in order to enable the electronic product to be better fixed in the bearing cavity 212, an attraction component for attracting the electronic product is arranged in the bearing cavity 212.
One of the attraction components can be a magnetic attraction component.
It should be noted that, because the electronic product has a metal material, the electronic product can be effectively adsorbed and fixed by disposing the magnetic element in the carrying cavity 212.
The other suction assembly specifically comprises a vacuum adsorption hole, a pipeline and a vacuum generator;
the vacuum absorption hole is arranged on the bearing cavity 212, the pipeline is connected with the vacuum absorption hole, and the vacuum generator is connected with the pipeline.
It should be noted that the electronic product can be better fixed in the carrying cavity 212 by means of vacuum absorption.
Further, the driving assembly in this embodiment is a cylinder.
It should be noted that the driving assembly in this embodiment may also adopt a driving form in which a servo motor is matched with a lead screw, and a skilled person may select an appropriate driving assembly according to actual situations.
Further, the carrying cavity 212 in this embodiment can be directly formed on the top surface of the fixture block 203;
or, in another embodiment, the product carrier 211 is detachably mounted on the top surface of the fixture block 203, and the carrying cavity 212 may be disposed on the product carrier 211, and through the above design, an operator may first place a product on the product carrier 211, and then mount the product carrier 211 on the fixture block 203, wherein the product carrier 211 may have a plurality of carrying cavities 212 for placing a plurality of products, thereby implementing simultaneous detection of a plurality of products.
It is right above the utility model provides an electronic product testing arrangement has carried out detailed introduction, to the general technical personnel in this field, according to the utility model discloses the thought of embodiment all has the change part on concrete implementation and application scope, to sum up, this specification content should not be understood as the restriction of the utility model.
Claims (10)
1. An electronic product testing device is characterized by comprising a rack, a driving assembly, an upper testing assembly and a lower testing assembly;
the lower testing assembly comprises a lower fixed plate, a floating plate arranged on the lower fixed plate in a liftable manner and a jig block arranged on the floating plate;
the lower fixing plate is fixed on the rack, a mounting seat is arranged on the lower fixing plate, a lower test probe is arranged on the mounting seat and penetrates through the floating plate, a protective cover is arranged on the floating plate and covers the lower test probe, a first through hole for the lower test probe to pass through is formed in the protective cover, a bearing cavity for placing an electronic product is formed in the top surface of the jig block, and the bearing cavity is located above the protective cover and corresponds to the protective cover;
the driving assembly is arranged on the rack and is connected with the upper testing assembly;
when the upper test assembly is driven to be pressed down to the top surface of the jig block, the floating plate descends relative to the lower fixing plate, and the lower test probe penetrates through the first through hole to be electrically connected with an electronic product in the bearing cavity.
2. The electronic product testing device of claim 1, wherein a switch probe is further mounted on the mounting base, the switch probe is disposed on the floating plate in a penetrating manner, the protective cover covers the switch probe, and a second through hole for the switch probe to pass through is formed in the protective cover;
the upper test component is driven to be pressed down to the top surface of the jig block, and when the floating plate descends relative to the lower fixing plate, the switch probe penetrates through the second through hole to enter the bearing cavity so as to detect whether an electronic product exists in the bearing cavity.
3. The device for testing electronic products according to claim 1, wherein a plurality of elastic reset members are disposed between the lower fixed plate and the floating plate, top ends of the elastic reset members are connected to the floating plate, and bottom ends of the elastic reset members are connected to the lower fixed plate;
the lower fixed plate is provided with a plurality of guide through holes, and the floating plate is provided with a plurality of guide columns; or a plurality of guide through holes are formed in the floating plate, a plurality of guide columns are arranged on the lower fixing plate, and the guide through holes are connected with the guide columns in a sliding mode.
4. The electronic product testing device of claim 1, wherein the upper testing assembly includes an upper mounting plate, a pin base plate, and an upper testing probe;
the upper mounting plate is connected with the driving assembly, the needle seat plate is fixedly connected to the bottom surface of the upper mounting plate, and the upper test probe is fixed on the needle seat plate;
when the driving component drives the upper mounting plate to move downwards, the needle seat plate moves downwards to abut against the top surface of the jig block, and the lower test probe is electrically connected with the electronic product in the bearing cavity.
5. The device for testing electronic products of claim 4, wherein an elastic buffer column is further installed on the needle board;
the elastic buffer column contracts and deforms when the needle seat plate is abutted to the top surface of the jig block.
6. The device for testing electronic products of claim 4, wherein the frame is provided with a lifting guide post, and the upper mounting plate is provided with a lifting guide hole;
the lifting guide pillar is connected with the lifting guide hole in a sliding mode.
7. The electronic product testing device of claim 1, wherein an engaging component for engaging with an electronic product is disposed in the cavity.
8. The electronic product testing device of claim 7, wherein the engaging member is a magnetic member.
9. The electronic product testing device of claim 7, wherein the engaging assembly comprises a vacuum suction hole, a pipe, and a vacuum generator;
the vacuum adsorption hole is formed in the bearing cavity, the pipeline is connected with the vacuum adsorption hole, and the vacuum generator is connected with the pipeline.
10. The device as claimed in claim 1, wherein a product carrier is detachably mounted on a top surface of the fixture block, and the carrying cavity is disposed on the product carrier.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202222417181.0U CN218445754U (en) | 2022-09-13 | 2022-09-13 | Electronic product testing device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202222417181.0U CN218445754U (en) | 2022-09-13 | 2022-09-13 | Electronic product testing device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN218445754U true CN218445754U (en) | 2023-02-03 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202222417181.0U Active CN218445754U (en) | 2022-09-13 | 2022-09-13 | Electronic product testing device |
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| CN (1) | CN218445754U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117169623A (en) * | 2023-08-18 | 2023-12-05 | 浙江普可医疗科技有限公司 | Testing device for detecting wearable flexible electrocardiograph monitoring |
-
2022
- 2022-09-13 CN CN202222417181.0U patent/CN218445754U/en active Active
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117169623A (en) * | 2023-08-18 | 2023-12-05 | 浙江普可医疗科技有限公司 | Testing device for detecting wearable flexible electrocardiograph monitoring |
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