CN218445204U - Connector terminal contact inspection device - Google Patents

Connector terminal contact inspection device Download PDF

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Publication number
CN218445204U
CN218445204U CN202222157224.6U CN202222157224U CN218445204U CN 218445204 U CN218445204 U CN 218445204U CN 202222157224 U CN202222157224 U CN 202222157224U CN 218445204 U CN218445204 U CN 218445204U
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China
Prior art keywords
digital microscope
definition digital
microscope probe
connector terminal
terminal contact
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CN202222157224.6U
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Chinese (zh)
Inventor
安光旭
米峥嵘
尹生生
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Beijing Nittan Electronics Co ltd
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Beijing Nittan Electronics Co ltd
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Priority to CN202222157224.6U priority Critical patent/CN218445204U/en
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Abstract

The utility model relates to a connector terminal contact inspection device belongs to pencil production field, including fixing base, high definition digital microscope probe and display, high definition digital microscope probe passes through the support mounting and is in the top of fixing base, high definition digital microscope probe passing signal line with the display links to each other, the display is used for showing the picture that high definition digital microscope probe shot in real time. The connector terminal contact inspection device has the effect of facilitating quality inspection personnel to inspect the connector terminal contact.

Description

Connector terminal contact inspection device
Technical Field
The present invention relates to the field of wire harness production, and more particularly, to a connector terminal contact inspection device.
Background
Before the wire harness leaves the factory after production, in order to ensure the quality of products, the terminal contact of the connector on the wire harness needs to be checked, and whether the elastic sheet at the terminal contact is deformed or crushed or not is checked. However, it is often difficult to inspect the terminals of the connector because the terminals are hidden inside the insertion holes of the connector.
SUMMERY OF THE UTILITY MODEL
The application provides a connector terminal contact inspection device for facilitating the inspection of a connector terminal contact by a quality inspector.
The connector terminal contact inspection device provided by the application adopts the following technical scheme:
the connector terminal contact inspection device comprises a fixed seat, a high-definition digital microscope probe and a display, wherein the high-definition digital microscope probe is installed at the top end of the fixed seat through a support, the high-definition digital microscope probe is connected with the display through a signal line, and the display is used for displaying a picture shot by the high-definition digital microscope probe in real time.
By adopting the technical scheme, when the connector terminal joint is checked, the terminal joint of the connector is opposite to the high-definition digital microscope probe, so that the high-definition digital microscope probe shoots the terminal joint of the connector and displays the terminal joint in real time through the display, and quality inspectors can check the condition of the connector terminal joint through the display, so as to judge whether the connector terminal joint is qualified.
Optionally, the support is fixed including the centre gripping clamping frame and support column on the fixing base, support column one end is passed through the damping pivot and is rotated the connection and be in on the clamping frame, the other end of support column is the free end, high definition digital microscope probe is installed the free end of support column.
By adopting the technical scheme, the support column rotates on the support frame through the damping rotating shaft, so that the position of the high-definition digital microscope can be adjusted, and when the connector terminal joint is inspected, the position of the high-definition digital microscope probe can be adjusted, so that the connector terminal joint can be shot more accurately by the high-definition digital microscope probe.
Optionally, the top surface of the fixing base is provided with a plurality of transversely arranged clamping ribs, the top surface of the fixing base is further provided with detection tables corresponding to the clamping ribs one to one, and the clamping frames are clamped and fixed on the clamping ribs.
By adopting the technical scheme, the clamping frame is clamped on different clamping ribs, so that the position of the high-definition digital microscope probe is adjusted.
Optionally, the lateral wall of one side of the detection platform back to the clamping rib is a detection inclined plane which is obliquely arranged, and an included angle between the surface of the detection inclined plane and the shaft of the high-definition digital microscope probe is 10 degrees.
By adopting the technical scheme, the high-definition digital microscope probe can better shoot the terminal point position of the connector, and quality testing personnel can check the terminal point position better.
Optionally, the clamping frame is including the body of rod and fix the grip slipper in body of rod one end, the grip slipper dorsad one side of the body of rod is provided with the draw-in groove, the draw-in groove internalization is provided with the holding piece, the outside lateral wall of grip slipper is provided with the first screw hole that is linked together with the draw-in groove, first screw hole female connection has clamping screw, clamping screw one end is located the outside of grip slipper, clamping screw's the other end stretch into in the draw-in groove and with the holding piece is fixed.
Through adopting above-mentioned technical scheme, when fixing the holding frame centre gripping on the fixing base, rotate in first screw hole through control centre gripping screw rod, make the holding piece with the fixing base centre gripping in the draw-in groove to fix the holding frame.
Optionally, the high-definition digital microscope probe is detachably connected to the support column.
Through adopting above-mentioned technical scheme, can change high definition digital microscope probe as required.
Optionally, a through hole penetrating through the support column is formed in the side wall of the free end of the support column, the high-definition digital microscope probe can penetrate through the through hole, a second threaded hole communicated with the through hole is formed in the end face of the free end of the support column, and a jackscrew is connected to the second threaded hole in a threaded manner.
Through adopting above-mentioned technical scheme, can be quick install high definition digital microscope probe on the support column.
Optionally, a radiation lamp is further mounted on the side wall of the free end of the support column, and the radiation lamp is rotatably connected to the support column through a damping rotating shaft.
Through adopting above-mentioned technical scheme, when checking the terminal contact of connector, the lamp can throw light on the terminal contact of connector, makes quality testing personnel can more clear check the terminal contact.
In summary, the present application includes at least one of the following beneficial technical effects:
1. when the connector terminal joint is inspected, the terminal joint of the connector is opposite to the high-definition digital microscope probe, so that the high-definition digital microscope probe shoots the terminal joint of the connector and displays the terminal joint in real time through the display, and a quality inspector can check the condition of the terminal joint of the connector through the display so as to judge whether the terminal joint of the connector is qualified or not;
2. the support column rotates on the support frame through the damping rotating shaft, so that the position of the high-definition digital microscope can be adjusted, and when the connector terminal joint is inspected, the position of the high-definition digital microscope probe can be adjusted, so that the connector terminal joint can be shot more accurately by the high-definition digital microscope probe;
3. the irradiation lamp can illuminate the terminal joint of the connector, so that quality inspection personnel can more clearly inspect the terminal joint.
Drawings
Fig. 1 is a schematic structural view of a connector terminal contact inspection apparatus according to an embodiment of the present disclosure;
fig. 2 is a side view of a connection structure between a high definition digital microscope probe and a fixing base according to an embodiment of the present application;
fig. 3 is a schematic structural diagram of a connection structure between a high-definition digital microscope probe and a fixing base according to an embodiment of the application;
FIG. 4 is an exploded view of the holder of the cradle of an embodiment of the present application;
fig. 5 is an exploded view of a connection structure between a support column of a stent and a high definition digital microscope probe according to an embodiment of the present application.
Description of the reference numerals: 1. a fixed seat; 11. a clamping rib; 12. a detection table; 121. detecting an inclined plane; 2. a support; 21. a clamping frame; 211. a rod body; 212. a clamping seat; 2121. a card slot; 2122. a clamping sheet; 2123. a first threaded hole; 2124. clamping the screw rod; 22. a support column; 221. a through hole; 222. a second threaded hole; 223. carrying out top thread; 3. a high definition digital microscope probe; 4. a display; 5. a signal line; 6. and irradiating a lamp.
Detailed Description
The present application is described in further detail below with reference to figures 1-5.
The embodiment of the application discloses a connector terminal contact inspection device.
Referring to fig. 1, the connector terminal contact inspection apparatus includes a fixing base 1, a high-definition digital microscope probe 3 mounted on the fixing base 1 through a bracket 2, and a display 4. The high-definition digital microscope probe 3 is connected with the display 4 through the signal wire 5, so that the display 4 can display the scene shot by the high-definition digital microscope probe 3 in real time.
The top end surface of the fixed seat 1 is provided with a plurality of clamping ribs 11 which are arranged at intervals in the transverse direction, and the clamping ribs 11 and the fixed seat 1 are integrally formed. The top end surface of the fixed seat 1 is also provided with a detection table 12 which is arranged opposite to the clamping ribs 11 one by one, and the detection table 12 and the corresponding clamping ribs 11 are arranged oppositely in the front and back direction. The side wall surface of the detection table 12 facing away from the clamping rib 11 is a detection inclined surface 121 which is obliquely arranged.
Referring to fig. 1 and 2, the bracket 2 is clamped and fixed on the clamping rib 11, and when the bracket 2 is clamped and fixed on the clamping rib 11, the high-definition digital microscope probe 3 is positioned on the corresponding detection table 12. The included angle between the surface of the detection inclined plane 121 and the axis of the high-definition digital microscope probe 3 is 10 degrees. When inspecting the connector terminal contact, the connector terminal contact is attached to the detection slope 121. The high-definition digital microscope probe 3 can photograph the connector terminal attached to the detection slope 121, and finally display the image in real time through the display 4.
Referring to fig. 3 and 4, the bracket 2 includes a clamping frame 21 and a supporting column 22, one end of the supporting column 22 is rotatably connected to the clamping frame 21 through a damping rotating shaft, and the other end of the supporting column 22 is a free end of the supporting column 22. The high-definition digital microscope probe 3 is arranged at the free end of the supporting column 22.
The clamping frame 21 includes a rod 211 and a clamping seat 212, and the clamping seat 212 is fixed at one end of the rod 211. The clamping base 212 is used for clamping and fixing the clamping frame 21 on the clamping rib 11.
A clamping groove 2121 is arranged on an end surface of the clamping seat 212, which faces away from the rod body 211, and a clamping sheet 2122 is movably arranged in the clamping groove 2121. A first threaded hole 2123 communicated with the clamping groove 2121 is formed in the outer side surface of the clamping seat 212, a clamping screw 2124 is connected to the inner portion of the first threaded hole 2123 in a threaded manner, one end of the clamping screw 2124 is located on the outer side of the clamping seat 212, and the other end of the clamping screw 2124 extends into the clamping groove 2121 and is fixedly connected with the clamping piece 2122.
When the holder 212 is coupled to the clamp rib 11, the clamp rib 11 is snapped into the card slot 2121, and the clamp screw 2124 is controlled to move, so that the clamp piece 2122 presses the clamp rib 11 into the card slot 2121.
Referring to fig. 5, at the free end of the supporting column 22, a through hole 221 penetrating through the supporting column 22 is formed in the side wall of the supporting column 22, and the high definition digital microscope probe 3 can pass through the through hole 221. A second screw hole 222 communicating with the through hole 221 is provided in an end surface of the free end of the support column 22, and a jack screw 223 is screwed into the second screw hole 222. After the high-definition digital microscope probe 3 is inserted through the through-hole 221, the high-definition digital microscope probe 3 can be fixed in the through-hole 221 by the jackscrew 223.
When the high-definition digital microscope probe 3 needs to be detached from the supporting column 22, the high-definition digital microscope probe 3 can be detached from the supporting column 22 by loosening the jackscrew 223.
Referring to fig. 1, a lamp 6 is further mounted on a side wall of a free end of the support pole 22, and the lamp 6 is rotatably connected to the support pole 22 through a damping rotating shaft. When the connector terminal contact is inspected by the irradiation lamp 6, the irradiation angle of the irradiation lamp 6 is adjusted so that the irradiation lamp 6 provides illumination for the contact position of the connector terminal, thereby facilitating the inspection by a quality inspector.
The connector terminal contact inspection device of the embodiment of the application is used in a mode that: when the contact of the connector terminal is inspected, the contact of the connector terminal is directed upward and the connector terminal is engaged with the detection slope 121. In this case, the high-definition digital microscope probe 3 can photograph the connection point of the connector terminal and display the image on the display 4, so that the quality inspector can more easily see the connection point position of the connector terminal.
The above embodiments are preferred embodiments of the present application, and the protection scope of the present application is not limited by the above embodiments, so: equivalent changes in structure, shape and principle of the present application shall be covered by the protection scope of the present application.

Claims (8)

1. A connector terminal contact inspection device, characterized in that: including fixing base (1), high definition digital microscope probe (3) and display (4), high definition digital microscope probe (3) are installed through support (2) the top of fixing base (1), high definition digital microscope probe (3) pass through signal line (5) with display (4) link to each other, display (4) are used for showing the picture that high definition digital microscope probe (3) shot in real time.
2. A connector terminal contact inspection device as claimed in claim 1, wherein: support (2) are fixed including the centre gripping clamping frame (21) and support column (22) on fixing base (1), support column (22) one end is passed through the damping pivot and is rotated the connection and be in on clamping frame (21), the other end of support column (22) is the free end, high definition digital microscope probe (3) are installed the free end of support column (22).
3. A connector terminal contact inspection device as claimed in claim 2, wherein: the top surface of fixing base (1) is provided with clamping rib (11) that a plurality of transverse arrangement set up, the top surface of fixing base (1) still is provided with the test table (12) with clamping rib (11) one-to-one, clamping frame (21) centre gripping is fixed on clamping rib (11).
4. A connector terminal contact inspection device as claimed in claim 3, wherein: the side wall of one side of the detection table (12) back to the clamping rib (11) is a detection inclined plane (121) which is obliquely arranged, and an included angle between the surface of the detection inclined plane (121) and the axis of the high-definition digital microscope probe (3) is 10 degrees.
5. A connector terminal contact inspection device according to claim 2, wherein: the clamping frame (21) is including the body of rod (211) and fix at the grip slipper (212) of the body of rod (211) one end, grip slipper (212) dorsad one side of the body of rod (211) is provided with draw-in groove (2121), draw-in groove (2121) internalization is provided with holding piece (2122), the outside lateral wall of grip slipper (212) is provided with first screw hole (2123) that are linked together with draw-in groove (2121), first screw hole (2123) female connection has clamping screw (2124), clamping screw (2124) one end is located the outside of grip slipper (212), the other end of clamping screw (2124) stretch into in draw-in groove (2121) and with holding piece (2122) are fixed.
6. A connector terminal contact inspection device according to claim 2, wherein: the high-definition digital microscope probe (3) is detachably connected to the support column (22).
7. A connector terminal contact inspection device according to claim 6, wherein: the high-definition digital microscope probe is characterized in that a through hole (221) penetrating through the supporting column (22) is formed in the side wall of the free end of the supporting column (22), the through hole (221) enables the high-definition digital microscope probe (3) to penetrate through, a second threaded hole (222) communicated with the through hole (221) is formed in the end face of the free end of the supporting column (22), and a jackscrew (223) is connected to the second threaded hole (222) in an internal thread mode.
8. A connector terminal contact inspection device according to claim 2, wherein: and the side wall of the free end of the supporting column (22) is also provided with a lamp (6), and the lamp (6) is rotatably connected to the supporting column (22) through a damping rotating shaft.
CN202222157224.6U 2022-08-16 2022-08-16 Connector terminal contact inspection device Active CN218445204U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202222157224.6U CN218445204U (en) 2022-08-16 2022-08-16 Connector terminal contact inspection device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202222157224.6U CN218445204U (en) 2022-08-16 2022-08-16 Connector terminal contact inspection device

Publications (1)

Publication Number Publication Date
CN218445204U true CN218445204U (en) 2023-02-03

Family

ID=85094630

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202222157224.6U Active CN218445204U (en) 2022-08-16 2022-08-16 Connector terminal contact inspection device

Country Status (1)

Country Link
CN (1) CN218445204U (en)

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