CN218445140U

CN218445140U - Atomic fluorescence photometer

Info

Publication number: CN218445140U
Application number: CN202221875003.6U
Authority: CN
Inventors: 杨梅
Original assignee: Boqiao Chongqing Heavy Metal Science And Technology Research Institute Co ltd
Current assignee: Boqiao Chongqing Heavy Metal Science And Technology Research Institute Co ltd
Priority date: 2022-07-20
Filing date: 2022-07-20
Publication date: 2023-02-03
Anticipated expiration: 2032-07-20

Abstract

The application belongs to the technical field of analytical instruments, and particularly relates to an atomic fluorescence spectrophotometer. The atomic fluorescence photometer comprises an optical ring, an atomizer arranged in the optical ring, a detector, at least one excitation light source and a reflecting plate; the excitation light source and the detector are directed towards an excitation area above the atomizer; a notch is formed in the side wall of the optical ring; the reflecting plate is arranged on one side of the optical ring, provided with the notch, and forms a certain angle with the exit port of the excitation light source so as to reflect the modulated light passing through the notch to the bottom of the instrument. The side wall of the optical ring is provided with the notch, so that the heat dissipation of the optical ring is facilitated, the influence of temperature change on fluorescence inside the optical ring can be reduced, and the detection accuracy is improved. In this embodiment, the reflective plate is disposed on one side of the optical ring where the notch is formed, so that the modulated light passing through the notch from the inside of the optical ring is reflected to the bottom of the apparatus, thereby reducing the influence of the modulated light on the detector.

Description

Atomic fluorescence photometer

Technical Field

The application belongs to the technical field of analytical instruments, and particularly relates to an atomic fluorescence spectrophotometer.

Background

The atomic fluorescence photometer is a chemical analyzer for measuring trace-level content in a sample, and utilizes a chemical method to make a detected element undergo a chemical reaction to generate hydride, the hydride is ignited through an atomizer outlet to form flame, an excitation light source is utilized to excite the flame containing the detected element, the detected element obtains energy transition to generate atomic fluorescence, and the content of the detected element is obtained through measurement of the intensity of the atomic fluorescence and analysis and calculation.

The atomic fluorescence photometer mainly comprises an excitation light source, an atomizer, an optical ring, a detector and the like, wherein the excitation light source and the detector are arranged on the side wall of the optical ring, the atomizer is arranged inside the optical ring, flame is ignited above the atomizer to form an excitation area, and the excitation light source and the detector face the excitation area.

Due to the fact that the flame generated by the atomizer can cause the temperature inside the optical ring to rise, temperature changes are generated inside the optical ring, and therefore detection accuracy is affected. Therefore, in the prior art, a notch is formed on a side wall of the optical ring to form an open optical ring, and a reflector is arranged outside the optical ring to reflect light into the instrument. The open type optical ring can quickly dissipate heat, so that the internal and external environments of the optical ring quickly reach thermal balance, and the detection accuracy is improved. However, the modulated light emitted from the excitation light source is easily reflected by the reflecting plate into the detector, and affects the detection.

SUMMERY OF THE UTILITY MODEL

For reducing the influence of modulation light to the detector, this application provides an atomic fluorescence spectrophotometer, its one side through seting up the breach at the optics circle sets up the reflecting plate for modulation light through the breach is reflected to the instrument bottom by the reflecting plate, with the risk that reduces modulation light entering detector, and then improves the accuracy that detects.

An embodiment of the application provides an atomic fluorescence photometer, which comprises an optical ring, an atomizer arranged in the optical ring, a detector arranged on the side wall of the optical ring and at least one excitation light source; the excitation light source and the detector are directed towards an excitation area above the atomizer; a notch is formed in the side wall of the optical ring;

the reflection plate is arranged on one side of the optical ring, provided with the notch, and forms a certain angle with the exit port of the excitation light source, so that the modulated light passing through the notch is reflected to the bottom of the atomic fluorescence photometer.

Further, the excitation light source and the detector are located on the same side of the optical ring, and the notch is formed in a side wall portion, far away from the detector and the excitation light source, of the optical ring.

Furthermore, an exit port of the excitation light source and an exit port of the detector are arranged on the same horizontal plane; the reflecting plate is obliquely arranged, so that the light generated by the excitation light source cannot be reflected to the detector by the reflecting plate.

Further, the top of the reflection plate is inclined at an angle toward the inside of the optical ring.

Further, the included angle between the reflecting plate and the horizontal plane is 40-50 degrees.

Preferably, the included angle between the reflecting plate and the horizontal plane is 45 degrees.

Further, the reflecting plate has light reflecting performance, and the surface of the reflecting plate facing the inside of the optical ring is a light reflecting layer.

Furthermore, the inner wall of the optical ring is provided with a light absorption layer, and the light absorption layer is formed by coating a black light absorption material.

Furthermore, the excitation light source comprises a lamp barrel, a hollow cathode lamp arranged in the lamp barrel and a focusing lens arranged on the light emitting side of the hollow cathode lamp, and the focusing lens enables the light of the hollow cathode lamp to be focused on the excitation area above the atomizer.

Preferably, the focusing lens is a short focal length lens.

This application sets up the reflecting plate in the one side that the breach was seted up to the optical circle to be certain angle with excitation light source's exit port, the reflecting plate will pass the light reflection of breach to atomic fluorescence photometer's bottom, make the modulated light of excitation light source transmission can not be by the reflection in advancing the detection, thereby reduce the interference of modulated light to the detector, with the accuracy that improves the detection.

Drawings

Fig. 1 is a schematic structural view in a top view direction of an atomic fluorescence spectrophotometer according to this embodiment;

fig. 2 is a schematic cross-sectional structure diagram of the excitation light source, the optical ring and the light shielding plate.

In the figure, an optical ring 1, a notch 11, an atomizer 2, an excitation area 21, a detector 3, an excitation light source 4, a lamp tube 41, a hollow cathode lamp 42, a focusing lens 43 and a reflecting plate 5.

Detailed Description

In order to make the objects, technical solutions and advantages of the present application more apparent, the present application is described in further detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the present application and are not intended to limit the present application.

It should be noted that the illustration provided in the present embodiment is only for schematically illustrating the basic idea of the present invention.

The structure, proportion, size and the like shown in the drawings attached to the present specification are only used for matching with the content disclosed in the specification, so as to be understood and read by those skilled in the art, and are not used for limiting the limit conditions of the present invention, and any structural modification, proportion relation change or size adjustment should still fall within the scope of the technical content disclosed in the present invention without affecting the function and the achievable purpose of the present invention.

References in this specification to orientations or positional relationships such as "upper," "lower," "left," "right," "middle," "longitudinal," "lateral," "horizontal," "inner," "outer," "radial," "circumferential," and the like are based on the orientations or positional relationships illustrated in the drawings and are intended to simplify the description, rather than to indicate or imply that the referenced devices or elements must have a particular orientation, be constructed and operated in a particular orientation, and are not to be construed as limiting the invention. Furthermore, the terms "first" and "second" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance.

As shown in fig. 1 and fig. 2, the present embodiment provides an atomic fluorescence photometer, which includes an optical ring 1, an atomizer 2 disposed in the optical ring 1, a detector 3 disposed on a sidewall of the optical ring 1, and at least one excitation light source 4. The excitation light source 4 and the detector 3 are directed towards an excitation area 21 above the atomizer 2. The side wall of the optical ring 1 is provided with a notch 11. In this embodiment, the atomic fluorescence spectrophotometer further includes a reflection plate 5, and the reflection plate 5 is located on one side of the optical ring 1, where the notch 11 is formed, and forms a certain angle with an exit port of the excitation light source 4, so as to reflect the modulated light passing through the notch 11 to the bottom of the atomic fluorescence spectrophotometer.

In this embodiment, the excitation light emitted from the excitation light source 4 forms an excitation region 21 above the atomizer 2, the excited atoms radiate fluorescence around the excitation region 21 as a center, and the fluorescence is collected and analyzed by the detector 3 to realize trace detection of elements. The notch 11 is formed in the side wall of the optical ring 1, so that the inside of the optical ring 1 is communicated with the external environment, the heat dissipation of the optical ring 1 is facilitated, the heat balance between the inside of the optical ring 1 and the external environment is rapidly achieved, the influence of the temperature change on the measurement in the optical ring 1 can be reduced, and the detection accuracy is improved.

In this embodiment, the reflecting plate 5 is disposed on one side of the optical ring 1, where the notch 11 is formed, and forms a certain angle with the exit port of the excitation light source 4, and the reflecting plate 5 reflects the light passing through the notch 11 to the bottom of the atomic fluorescence spectrophotometer, so that the modulated light emitted by the excitation light source 4 is not reflected into the detector 3 by the reflecting plate 5, thereby reducing the influence of the modulated light on the detector and further improving the accuracy of detection.

In the present embodiment, the excitation light source 4 and the detector 3 are located on the same side of the optical ring 1, and the notch 11 is opened on a side wall portion of the optical ring 1 far from the detector 3 and the excitation light source 4. Because the light generated by the excitation light source 4 irradiates the side wall part of the optical ring 1 far away from the excitation light source 4, the gap 11 is formed in the part irradiated by the light generated by the excitation light source 4, so that the light generated by the excitation light source 4 can be prevented from being directly reflected to the detector 3 by the side wall of the optical ring 1, and the interference of the light generated by the excitation light source 4 to the detector 3 can be weakened.

In the present embodiment, the exit port of the excitation light source 4 and the exit port of the detector 3 are disposed on the same horizontal plane, so that the excitation light source 4 and the detector 3 are both vertically distributed with respect to the atomizer 2. The reflecting plate 5 of this embodiment is obliquely arranged, so that the reflecting plate 5 is not perpendicular to the excitation light source 4 and the detector 3, light generated by the excitation light source 4 cannot be reflected to the detector 3 by the reflecting plate 5, the risk that light generated by the excitation light source 4 enters the detector 3 is reduced, and the accuracy of detection is further ensured.

In the present embodiment, the top of the reflection plate 5 is preferably inclined toward the inside of the optic ring 1 so that the light rays reflected by the reflection plate 5 are all directed toward the lower portion of the optic ring 1. Specifically, the angle between the reflecting plate 5 and the horizontal plane is preferably 40 ° to 50 °, and particularly when the angle between the reflecting plate 5 and the horizontal plane is 45 °, the light generated by the excitation light source 4 is reflected by the reflecting plate 5 to the lower portion of the optical ring 1 in the vertical direction, so that the light reflected by the reflecting plate 5 can be prevented from being diffused on the inner wall of the optical ring 1 again.

In some embodiments, the excitation light source 4 and/or the detector 3 may be selectively angled with respect to the horizontal plane, and the angle of the reflector 5 may be adjusted according to the distribution of the excitation light source 4 and the detector 3, so that the light generated by the excitation light source 4 is not reflected by the reflector 5 to the detector 3.

As shown in fig. 1, the number of the excitation light sources 4 is two, and the detector 3 is located between the two excitation light sources 4. It should be noted that the number of the excitation light sources 4 can be selected according to actual requirements, such as conventional single-channel, double-channel, three-channel, and four-channel simultaneous measurement atomic fluorescence photometers.

In the present embodiment, the excitation light source 4 includes a lamp barrel 41, a hollow cathode lamp 42 disposed in the lamp barrel 41, and a focusing lens 43 disposed on the light emitting side of the hollow cathode lamp 42, and the focusing lens 43 focuses light on the excitation region 21 above the atomizer 2. The focusing lens 43 is preferably a short focal length lens, which helps to improve the sensitivity of the atomic fluorescence spectrometer.

In the present embodiment, the reflective plate 5 has light reflection property, and the surface facing the inside of the optical ring 1 is a light reflection layer. The reflecting layer of the reflecting plate 5 is used for reflecting light rays towards the inside of the optical ring 1, and the light transmission of the reflecting plate 5 is convenient for an operator to observe the flame condition inside the optical ring 1.

In this embodiment, the inner wall of the optical ring 1 is provided with a light absorbing layer, and the light absorbing layer is preferably formed by coating a black light absorbing material, so as to reduce the diffuse reflection of light on the inner wall of the optical ring 1, and further improve the detection accuracy.

The technical features of the above embodiments can be arbitrarily combined, and for the sake of brevity, all possible combinations of the technical features in the above embodiments are not described, but should be considered as the scope of the present specification as long as there is no contradiction between the combinations of the technical features.

The above-mentioned embodiments only express several embodiments of the present application, and the description thereof is specific and detailed, but not to be construed as limiting the scope of the utility model. It should be noted that, for a person skilled in the art, several variations and modifications can be made without departing from the concept of the present application, which falls within the scope of protection of the present application. Therefore, the protection scope of the present patent shall be subject to the appended claims.

Claims

1. An atomic fluorescence photometer comprises an optical ring (1), an atomizer (2) arranged in the optical ring (1), a detector (3) arranged on the side wall of the optical ring (1) and at least one excitation light source (4); the excitation light source (4) and the detector (3) are directed towards an excitation area (21) above the atomizer (2); a notch (11) is formed in the side wall of the optical ring (1);

the method is characterized in that:

the atomic fluorescence spectrophotometer further comprises a reflecting plate (5), wherein the reflecting plate (5) is arranged on one side of the notch (11) formed in the optical ring (1) and forms a certain angle with an emergent port of the excitation light source (4), so that modulated light passing through the notch (11) is reflected to the bottom of the atomic fluorescence spectrophotometer.

2. The atomic fluorescence spectrophotometer of claim 1, wherein: the excitation light source (4) and the detector (3) are positioned on the same side of the optical ring (1), and the notch (11) is formed in the side wall portion, far away from the detector (3) and the excitation light source (4), of the optical ring (1).

3. The atomic fluorescence spectrophotometer of claim 2, wherein: the exit port of the excitation light source (4) and the exit port of the detector (3) are arranged on the same horizontal plane; the reflecting plate (5) is obliquely arranged, so that light rays generated by the excitation light source (4) cannot be reflected to the detector (3) by the reflecting plate (5).

4. The atomic fluorescence spectrophotometer of claim 3, wherein: the top of the reflecting plate (5) inclines towards the inner part of the optical ring (1) by a certain angle.

5. The atomic fluorescence spectrophotometer of claim 4, wherein: the included angle between the reflecting plate (5) and the horizontal plane is 40-50 degrees.

6. The atomic fluorescence spectrophotometer of claim 5, wherein: the included angle between the reflecting plate (5) and the horizontal plane is 45 degrees.

7. The atomic fluorescence photometer of any one of claims 1 to 6, wherein: the reflecting plate (5) has reflectivity, and the surface of the reflecting plate facing the inside of the optical ring (1) is a reflecting layer.

8. The atomic fluorescence spectrophotometer of claim 7, wherein: the inner wall of the optical ring (1) is provided with a light absorption layer, and the light absorption layer is formed by coating black light absorption materials.

9. The atomic fluorescence spectrophotometer of claim 7, wherein: the excitation light source (4) comprises a lamp barrel (41), a hollow cathode lamp (42) arranged in the lamp barrel (41) and a focusing lens (43) arranged on the light emitting side of the hollow cathode lamp (42), and the focusing lens (43) enables the light of the hollow cathode lamp (42) to be focused on the excitation area (21) above the atomizer (2).

10. The atomic fluorescence spectrophotometer of claim 9, wherein: the focusing lens (43) is a short focal length lens.