CN218387498U - Non-signaling test circuit of low-voltage power line broadband carrier communication unit - Google Patents
Non-signaling test circuit of low-voltage power line broadband carrier communication unit Download PDFInfo
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- CN218387498U CN218387498U CN202221879336.6U CN202221879336U CN218387498U CN 218387498 U CN218387498 U CN 218387498U CN 202221879336 U CN202221879336 U CN 202221879336U CN 218387498 U CN218387498 U CN 218387498U
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Abstract
The utility model provides a non-signaling test circuit of a low-voltage power line broadband carrier communication unit, which comprises a micro-control unit, a unit to be tested, a standard unit, a filter circuit, a resistance attenuation network circuit, a serial port circuit and a coupling circuit; the filter circuit is connected with a power grid; the coupling circuit is respectively connected with the filter circuit, the tested unit and the resistance attenuation network circuit; the resistance attenuation network circuit is connected with the standard unit; the tested unit is connected with the micro-control unit; the serial port circuit is respectively connected with the micro-control unit, the tested unit and the upper computer. Adopt the utility model provides a circuit connection mode, the performance and the function of every product of test that can be accurate can improve the productivity again.
Description
Technical Field
The utility model relates to an electric power field, concretely relates to low pressure power line broadband carrier communication unit's non-signaling test circuit.
Background
With the wider application of the power line carrier communication technology, carrier communication unit products are produced in batches, and meanwhile, the performance and the function of each carrier communication unit can be accurately detected to form pain points of most manufacturers and design parties; and because the conventional circuit connection mode needs to pass a signaling networking test, the test period is long, the efficiency is low, and the delivery requirements of large-batch orders cannot be met.
SUMMERY OF THE UTILITY MODEL
The to-be-solved technical problem of the utility model is that, the circuit connection mode of prior art can not accurate performance, the function that detects every carrier communication unit.
The utility model provides a non-signaling test circuit of a low-voltage power line broadband carrier communication unit, which comprises a micro-control unit, a unit to be tested, a standard unit, a filter circuit, a resistance attenuation network circuit, a serial port circuit and a coupling circuit;
the filter circuit is connected with a power grid;
the coupling circuit is respectively connected with the filter circuit, the tested unit and the resistance attenuation network circuit;
the resistance attenuation network circuit is connected with the standard unit;
the tested unit is connected with the micro-control unit;
the serial port circuit is respectively connected with the micro-control unit, the tested unit and the upper computer.
Further, the filter circuit comprises a 202 nd capacitor, a 200 th transformer, a 204 th capacitor, a 203 nd resistor, a 205 th capacitor, a 201 th transformer and a 206 th capacitor;
the second end of the 202 th capacitor is respectively connected with a live wire of a power grid and the first end of the 200 th transformer;
the first end of a 202 th capacitor is respectively connected with a zero line of a power grid and the first end of a 200 th transformer;
the second end of the 200 th transformer is respectively connected with the second end of the 203 th capacitor, the second end of the 203 th resistor, the second end of the 205 th capacitor and the first end of the 201 th transformer;
the three ends of the 200 th transformer are respectively connected with the first end of the 204 th capacitor, the first end of the 203 th resistor, the first end of the 205 th resistor and the fourth end of the 201 th transformer;
the second end of the 204 th capacitor is connected with the first end of the 203 th capacitor;
the 2 nd end of the 201 st transformer is connected with the second end of the 206 nd capacitor;
the 3 rd end of the 201 st transformer is connected with the first end of the 206 th capacitor;
a second end of the 206 th capacitor is connected with the EP1 port;
a first end of a 206 th capacitor is connected with an EP2 port;
further, the coupling circuit includes a 601 th resistor, a 601 th capacitor, a 601 th inductor, a 602 th resistor, a 602 th capacitor, a 602 th inductor, a 603 th inductor, a 604 th inductor, a 603 th resistor, a 604 th resistor, a 605 th inductor, a 606 th inductor, a 605 th resistor, a 603 th capacitor, and a 600 th transformer;
the second end of the 601 th resistor is connected with the WP1 port, the first end of the 601 th inductor and the first end of the 601 th capacitor respectively;
the first end of the 601 th resistor is connected with the second end of the 601 th capacitor and the sixth section of the 600 th transformer respectively;
the first end of the 602 th resistor is connected with the first end of the 602 th capacitor, the first end of the 603 th inductor and the WP2 port respectively;
the second end of the 602 th resistor is connected with the second end of the 602 th capacitor and the fourth end of the 600 th transformer respectively;
the second end of the 601 th inductor is connected with the first end of the 602 th inductor;
the second end of the 603 th inductor is connected with the first end of the 604 th point rod;
the third end of the 600 th transformer is connected with a CR1 port;
the first end of the 600 th transformer is connected with a CR2 port;
the second end of the 602 th inductor is respectively connected with the first end of the 603 th resistor and the first end of the 605 th inductor;
the second end of the 604 th inductor is respectively connected with the first end of the 604 th resistor and the first end of the 606 th inductor;
the second end of the 603 th resistor is respectively connected with the second end of the 605 th inductor, the first end of the 605 th resistor, the second end of the 603 th capacitor and the EP1 port;
the second end of the 604 resistor is connected with the second end of the 606 inductor, the first end of the 605 resistor, the first end of the 603 resistor and the EP2 port respectively;
furthermore, the standard test unit is provided with a single strong current interface female seat and a single weak current interface female seat;
the standard test unit single-phase strong current interface female seat is provided with a CR1 port and a CR2 port;
the standard test unit CR1 port and the standard test unit CR2 port are connected with the coupling circuit CR1 port and the CR2 port through a resistance attenuation network circuit.
Furthermore, the unit to be tested is provided with a single strong current interface female seat;
the unit to be tested single-phase strong electric interface female seat is provided with an NDUT port and an LDUT port;
the NDUT port of the unit to be tested and the LDUT port of the unit to be tested are connected with the WP1 port and the WP2 port of the coupling circuit through the resistance attenuation network circuit;
the weak current interface female socket is provided with RXDDUT and TXDDUT interfaces
Further, the serial port circuit is provided with a two-gear six-pin fluctuation switch;
when the two-gear six-pin fluctuation switch is in a first gear, the 4 pin is connected with the 5 pin, and the 3 pin is connected with the 2 pin;
when the two-gear six-pin fluctuation switch is in the second gear, the 5 pin is connected with the 6 pin, and the 2 pin is also connected with the 1 pin;
the pin 1 of the two-gear six-pin fluctuation switch is connected with a TXDDDUT interface of the unit to be tested;
the 2 pin of the two-gear six-pin fluctuation switch is connected with a TXD interface of the micro-control unit;
the 3 pins of the two-gear six-pin fluctuation switch are connected with an RXDDDUT interface of the unit to be tested;
the 4 pins of the two-gear six-pin fluctuation switch are connected with a TXDDDUT interface of a unit to be tested and a TXDPLC interface of an upper computer;
the 5 pins of the two-gear six-pin fluctuation switch are connected with an RXD interface of a micro control unit;
and 6 pins of the two-gear six-pin fluctuation switch are connected with an RXDDDUT interface of the unit to be tested.
The utility model has the advantages that: adopt the utility model provides a circuit connection mode, the performance and the function of every product of test that can be accurate can improve the productivity again
Drawings
FIG. 1 is a block diagram of a PT board structure.
Fig. 2 is a flow chart of a non-signaling test.
FIG. 3 is a schematic block diagram of multi-module parallel testing.
FIG. 4 is a circuit diagram of a portion of the micro-control unit circuit.
FIG. 5 is a circuit diagram of a portion of the DUT interface circuit.
Fig. 6 is a serial circuit diagram.
FIG. 7 is a circuit diagram of a serial circuit portion.
FIG. 8 is a circuit diagram of a portion of the coupling circuit.
Fig. 9 is a partial circuit diagram of the attenuator circuit.
Fig. 10 is a partial circuit diagram of a filter circuit.
FIG. 11A is a circuit diagram of a standard cell interface.
FIG. 11B is a schematic diagram of a standard cell dip switch.
Fig. 12A is a standard cell circuit diagram.
FIG. 12B is a standard cell peripheral circuit diagram.
Detailed Description
The utility model discloses an inventive concept is, between general broadband carrier communication unit, in order to ensure communication safety, communication unit slave node (STA) need through the white list authentication with main node (CCO) network deployment, realize the communication; because the communication needs networking, the networking time is influenced by the power grid environment, the time is generally unequal within 1-3min, and the influence on the yield of mass production test is large. The utility model provides a non-signaling test circuit without networking, which reduces networking time; meanwhile, the function and performance test of the product is met.
The utility model provides a non-signaling test circuit of a low-voltage power line broadband carrier communication unit, which comprises a micro control unit, a unit to be tested, a standard unit, a filter circuit, a resistance attenuation network circuit, a serial port circuit and a coupling circuit;
the filter circuit is connected with a power grid;
the coupling circuit is respectively connected with the filter circuit, the tested unit and the resistance attenuation network circuit;
the resistance attenuation network circuit is connected with the standard unit;
the tested unit is connected with the micro-control unit;
the serial port circuit is respectively connected with the micro-control unit, the tested unit and the upper computer.
Further, the filter circuit comprises a 202 nd capacitor, a 200 th transformer, a 204 th capacitor, a 203 nd resistor, a 205 th capacitor, a 201 th transformer and a 206 th capacitor;
the second end of the 202 th capacitor is respectively connected with a live wire of a power grid and the first end of the 200 th transformer;
the first end of a 202 th capacitor is respectively connected with a zero line of a power grid and the first end of a 200 th transformer;
the second end of the 200 th transformer is respectively connected with the second end of the 203 th capacitor, the second end of the 203 th resistor, the second end of the 205 th capacitor and the first end of the 201 th transformer;
the three ends of the 200 th transformer are respectively connected with the first end of the 204 th capacitor, the first end of the 203 th resistor, the first end of the 205 th resistor and the fourth end of the 201 th transformer;
the second end of the 204 th capacitor is connected with the first end of the 203 th capacitor;
the 2 nd end of the 201 st transformer is connected with the second end of the 206 th capacitor;
the 3 rd end of the 201 st transformer is connected with the first end of the 206 th capacitor;
a second end of the 206 th capacitor is connected with an EP1 port;
a first end of a 206 th capacitor is connected with the EP2 port;
further, the coupling circuit includes a 601 th resistor, a 601 th capacitor, a 601 th inductor, a 602 th resistor, a 602 th capacitor, a 602 th inductor, a 603 th inductor, a 604 th inductor, a 603 th resistor, a 604 th resistor, a 605 th inductor, a 606 th inductor, a 605 th resistor, a 603 th capacitor, and a 600 th transformer;
a second end of the 601 th resistor is connected with the WP1 port, a first end of the 601 th inductor and a first end of the 601 th capacitor respectively;
the first end of the 601 th resistor is connected with the second end of the 601 th capacitor and the sixth section of the 600 th transformer respectively;
the first end of the 602 th resistor is connected with the first end of the 602 th capacitor, the first end of the 603 th inductor and the WP2 port respectively;
the second end of the 602 th resistor is connected with the second end of the 602 th capacitor and the fourth end of the 600 th transformer respectively;
the second end of the 601 th inductor is connected with the first end of the 602 th inductor;
the second end of the 603 th inductor is connected with the first end of the 604 th point rod;
the third end of the 600 th transformer is connected with a CR1 port;
the first end of the 600 th transformer is connected with a CR2 port;
the second end of the 602 th inductor is respectively connected with the first end of the 603 th resistor and the first end of the 605 th inductor;
the second end of the 604 th inductor is connected with the first end of the 604 th resistor and the first end of the 606 th inductor respectively;
the second end of the 603 th resistor is respectively connected with the second end of the 605 th inductor, the first end of the 605 th resistor, the second end of the 603 th capacitor and the EP1 port;
the second end of the 604 resistor is connected with the second end of the 606 inductor, the first end of the 605 resistor, the first end of the 603 point and the EP2 port respectively;
furthermore, the standard test unit is provided with a single strong current interface female socket and a single weak current interface female socket;
the standard test unit single-phase strong electric interface female seat is provided with a CR1 port and a CR2 port;
the standard test unit CR1 port and the standard test unit CR2 port are connected with the coupling circuit CR1 port and the CR2 port through a resistance attenuation network circuit.
Furthermore, the unit to be tested is provided with a single strong electric interface female seat;
the unit to be tested is provided with an NDUT port and an LDUT port on a single-phase strong-current interface female seat;
the NDUT port of the unit to be tested and the LDUT port of the unit to be tested are connected with the WP1 port and the WP2 port of the coupling circuit through the resistance attenuation network circuit;
the weak current interface female seat is provided with RXDDDUT and TXDDDUT interfaces
Further, the serial port circuit is provided with a two-gear six-pin fluctuation switch;
when the two-gear six-pin fluctuation switch is in a first gear, the 4 pin is connected with the 5 pin, and the 3 pin is connected with the 2 pin;
when the two-gear six-pin fluctuation switch is in the second gear, the 5 pin is connected with the 6 pin, and the 2 pin is also connected with the 1 pin;
the pin 1 of the two-gear six-pin fluctuation switch is connected with a TXDUT interface of a unit to be tested;
the 2 feet of the two-gear six-foot fluctuation switch are connected with a TXD interface of the micro-control unit;
the 3 pins of the two-gear six-pin fluctuation switch are connected with an RXDDDUT interface of the unit to be tested;
the 4 pins of the two-gear six-pin fluctuation switch are connected with a TXDDDUT interface of the unit to be tested and a TXDDLPC interface of the upper computer;
the 5 pins of the two-gear six-pin fluctuation switch are connected with an RXD interface of the micro control unit;
and 6 pins of the two-gear six-pin fluctuation switch are connected with an RXDDDUT interface of the unit to be tested.
The following description is provided for the specific application process of the present invention
1 Signaling test
The method comprises the steps that an upper computer controls a DUT (device under test) to enter a test mode through a serial port circuit, the DUT sends a loopbank command through a power line after entering the test mode, a Golden (standard unit) module records a specific receiving firmware to access the power line in the same power grid with the DUT, when the Golden module receives the loopbank command sent by the DUT, performance data such as tx _ power, tx _ SNR and tx ppm of an envelope sent by the DUT are collected, collected test information is packaged and returned to the DUT through payload, the DUT is in the receiving mode at the moment, the DUT collects information such as SNR and noisefloor of the returned envelope, and reports the information to the upper computer through the serial port circuit, and the upper computer judges the performance of the DUT through set project thresholds such as tx _ power, tx _ SNR and tx ppm to achieve the test purpose.
NID dial switch for simultaneously testing crosstalk problem by multiple modules in power line
Design of NID dial switch: in order to improve the productivity during production test, a plurality of DUTs need to be tested simultaneously at a time, the DUT terminals are powered on the same power grid, and in order to avoid signal collision, the Golden module is configured with NID passwords to be matched with the upper computer test port, so that the problem of signal interference of simultaneous test of multiple modules is solved. As shown in the figure: for example, when DUT1 and DUT2 are tested simultaneously, because DUT1, DUT2, golden1, and Golden2 are all connected to a common 220V cable through respective PT board filter circuits, golden1 will receive not only the test command from DUT1, but also the test command from DUT2, causing mutual interference of test environments, and failing to meet the requirement of testing multiple products simultaneously, so the design introduces NID passwords, and the NID passwords in the windows of the upper computer test window send the test command, so that Golden1 can only analyze the received password into a data frame in NID format, thereby avoiding data cross, and meeting the requirement that multiple modules and multiple modules can be tested simultaneously.
3PT Board Main Circuit design:
(1) MCU (micro control unit): completing the test by matching with an upper computer;
(2) DUT interface circuitry: due to the fact that the DUT types are more, the single type interface cannot meet the test; therefore, various DUT interfaces are designed compatibly;
(3) a serial port circuit:
a. through the design of an open leakage circuit, the level conflict between serial ports is avoided;
b. designing an online mode and an offline mode to meet different application scenes;
(4) coupling circuit (Coupler) & attenuation circuit
In a PLC communication test environment, a test tool is inconvenient to simulate the attenuation condition of a power line to a carrier signal, so that a hot line signal is coupled to a cold line through a coupling circuit, and an attenuation network circuit is introduced to the cold line, so that the anti-attenuation performance of a DUT is preliminarily detected, and the anti-attenuation performance test before the module leaves a factory is met.
(5) Filter circuit (EMI Filter): and the interference signals in the power grid are isolated, so that the test environment is pure.
(6) Golden module: and the standard module is used for accompanying measurement and calibrating the unit to be measured.
(7) The DUT: tested unit
A circuit diagram of a unit to be tested is consistent with Golden, and Golden distinguishes materials, so that the performance of a Golden module is better.
The utility model relates to a unit that awaits measuring, standard cell, micro-control unit adopt HZ3011 high-speed carrier chip.
The HZ3011 high-speed carrier chip is a high-performance chip specially customized for domestic power environment, which is mainly manufactured by the aerospace middle-electric (Chongqing) microelectronics Limited company.
The utility model discloses produced technical effect is produced by the circuit that this application required protection, the utility model discloses well equal prior art of procedure that adopts, and do not exist the improvement to this procedure in this application, and only use. This application does not seek protection for the program.
The utility model discloses the effectual volume production test of having solved carrier wave class module leads to the problem of inefficiency because of the network deployment, can support the parallel test of a plurality of modules simultaneously, can promote the productivity by a wide margin. Moreover, the invention compatibly relates to an online mode and an offline mode, and a serial port output mode is compatibly related, so that different scenes and different equipment types can be flexibly applied, and the practicability is greatly enhanced; in addition, the design of the scheme comprises a filter circuit, an attenuation circuit and a coupling circuit, so that the test mainboard has complete functions, and can accurately judge the functions and performance of the module, and the test is more stable and reliable.
Claims (6)
1. A non-signaling test circuit of a low-voltage power line broadband carrier communication unit comprises a micro-control unit, a unit to be tested, a standard unit, a filter circuit, a resistance attenuation network circuit, a serial port circuit and a coupling circuit;
the filter circuit is connected with a power grid;
the coupling circuit is respectively connected with the filter circuit, the tested unit and the resistance attenuation network circuit;
the resistance attenuation network circuit is connected with the standard unit;
the tested unit is connected with the micro-control unit;
the serial port circuit is respectively connected with the micro-control unit, the tested unit and the upper computer.
2. A non-signaling test circuit of a low voltage power line broadband carrier communication unit as claimed in claim 1,
the filter circuit comprises a 202 nd capacitor, a 200 th transformer, a 204 th capacitor, a 203 nd resistor, a 205 th capacitor, a 201 th transformer and a 206 th capacitor;
the second end of the 202 th capacitor is respectively connected with a live wire of a power grid and the first end of the 200 th transformer;
the first end of a 202 th capacitor is respectively connected with a zero line of a power grid and the first end of a 200 th transformer;
the second end of the 200 th transformer is respectively connected with the second end of the 203 th capacitor, the second end of the 203 th resistor, the second end of the 205 th capacitor and the first end of the 201 th transformer;
the three ends of the 200 th transformer are respectively connected with the first end of the 204 th capacitor, the first end of the 203 th resistor, the first end of the 205 th resistor and the fourth end of the 201 th transformer;
the second end of the 204 th capacitor is connected with the first end of the 203 th capacitor;
the 2 nd end of the 201 st transformer is connected with the second end of the 206 nd capacitor;
the 3 rd end of the 201 st transformer is connected with the first end of the 206 th capacitor;
a second end of the 206 th capacitor is connected with the EP1 port;
the first end of the 206 th capacitor is connected with the EP2 port.
3. A non-signaling test circuit of a low voltage power line broadband carrier communication unit as claimed in claim 1,
the coupling circuit comprises a 601 th resistor, a 601 th capacitor, a 601 th inductor, a 602 th resistor, a 602 th capacitor, a 602 th inductor, a 603 th inductor, a 604 th inductor, a 603 th resistor, a 604 th resistor, a 605 th inductor, a 606 th inductor, a 605 th resistor, a 603 th capacitor and a 600 th transformer;
a second end of the 601 th resistor is connected with the WP1 port, a first end of the 601 th inductor and a first end of the 601 th capacitor respectively;
the first end of the 601 th resistor is connected with the second end of the 601 th capacitor and the sixth section of the 600 th transformer respectively;
the first end of the 602 th resistor is connected with the first end of the 602 th capacitor, the first end of the 603 th inductor and the WP2 port respectively;
the second end of the 602 th resistor is connected with the second end of the 602 th capacitor and the fourth end of the 600 th transformer respectively;
the second end of the 601 th inductor is connected with the first end of the 602 th inductor;
the second end of the 603 th inductor is connected with the first end of the 604 th point rod;
the third end of the 600 th transformer is connected with a CR1 port;
the first end of the 600 th transformer is connected with a CR2 port;
the second end of the 602 th inductor is connected with the first end of the 603 th resistor and the first end of the 605 th inductor respectively;
the second end of the 604 th inductor is respectively connected with the first end of the 604 th resistor and the first end of the 606 th inductor;
the second end of the 603 th resistor is connected with the second end of the 605 th inductor, the first end of the 605 th resistor, the second end of the 603 th capacitor and the EP1 port respectively;
the second end of the 604 resistor is connected with the second end of the 606 inductor, the first end of the 605 resistor, the first end of the 603 point and the EP2 port respectively.
4. A non-signaling test circuit of a low voltage power line broadband carrier communication unit as claimed in claim 1,
the standard test unit is provided with a single strong current interface female seat and a weak current interface female seat;
the standard test unit single-phase strong electric interface female seat is provided with a CR1 port and a CR2 port;
and the standard test unit CR1 port and the standard test unit CR2 port are connected with the coupling circuit CR1 port and the CR2 port through a resistance attenuation network circuit.
5. A non-signaling test circuit of a low voltage power line broadband carrier communication unit as claimed in claim 1,
the unit to be tested is provided with a single strong current interface female seat;
the unit to be tested single-phase strong electric interface female seat is provided with an NDUT port and an LDUT port;
the NDUT port of the unit to be tested and the LDUT port of the unit to be tested are connected with the WP1 port and the WP2 port of the coupling circuit through the resistance attenuation network circuit;
the weak current interface female seat is provided with RXDDDUT and TXDDDUT interfaces.
6. A non-signaling test circuit of a low voltage power line broadband carrier communication unit as claimed in claim 1,
the serial port circuit is provided with a two-gear six-pin fluctuation switch;
when the two-gear six-pin fluctuation switch is in the first gear, the 4 pin is connected with the 5 pin, and the 3 pin is connected with the 2 pin;
when the two-gear six-pin fluctuation switch is in the second gear, the 5 pin is connected with the 6 pin, and the 2 pin is also connected with the 1 pin;
the pin 1 of the two-gear six-pin fluctuation switch is connected with a TXDUT interface of a unit to be tested;
the 2 pin of the two-gear six-pin fluctuation switch is connected with a TXD interface of the micro-control unit;
the 3 pins of the two-gear six-pin fluctuation switch are connected with an RXDDDUT interface of the unit to be tested;
the 4 pins of the two-gear six-pin fluctuation switch are connected with a TXDDDUT interface of a unit to be tested and a TXDPLC interface of an upper computer;
the 5 pins of the two-gear six-pin fluctuation switch are connected with an RXD interface of the micro-control unit;
and 6 pins of the two-gear six-pin fluctuation switch are connected with an RXDDDUT interface of the unit to be tested.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202221879336.6U CN218387498U (en) | 2022-07-20 | 2022-07-20 | Non-signaling test circuit of low-voltage power line broadband carrier communication unit |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202221879336.6U CN218387498U (en) | 2022-07-20 | 2022-07-20 | Non-signaling test circuit of low-voltage power line broadband carrier communication unit |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN218387498U true CN218387498U (en) | 2023-01-24 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202221879336.6U Active CN218387498U (en) | 2022-07-20 | 2022-07-20 | Non-signaling test circuit of low-voltage power line broadband carrier communication unit |
Country Status (1)
| Country | Link |
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| CN (1) | CN218387498U (en) |
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2022
- 2022-07-20 CN CN202221879336.6U patent/CN218387498U/en active Active
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