CN218331939U - Sensor electrical property test fixture - Google Patents

Abstract

The application is suitable for the technical field of test instruments, and provides a sensor electrical property test fixture. The sensor electrical property test fixture is used for testing a sensor to be tested, and the sensor to be tested comprises a sensor body and a first pin; the sensor electrical property test fixture comprises an insulating base, a test power supply part and a pressing part, wherein the test power supply part is arranged on the insulating base; the pressing part is arranged on the insulating base and comprises a pressing body and a first insulating pressing piece, and the first insulating pressing piece is arranged on the pressing body; the sensor to be tested is placed on the test power supply part and is abutted against the test power supply part through the first pin, and the first insulation pressing piece is pressed on the first pin. The design of this application has improved the area of contact of each first pin and test power supply portion, has reduced the contact resistance between each first pin and the test power supply portion, has avoided the sensor that awaits measuring to test under the condition of heavy current as far as possible and has caused the emergence of this kind of problems such as anchor clamps or product burnout.

Description

Sensor electrical property test fixture

Technical Field

The application belongs to the technical field of test instruments, and more specifically relates to a sensor electrical property test fixture.

Background

A chip type Hall current sensor (Hall current sensor for short) is a sensor based on Hall effect and prepared and molded on silicon substrate by semiconductor process, and is mainly used for converting the measured current signal into an electric signal meeting certain standard requirements or a signal in other required forms according to a certain rule.

At present, the largest measured current of a Hall current sensor with an SOP-8 type packaging mode is 50A, an output voltage signal is 4.5V, the appearance of a product is too small, the size of the Hall current sensor is 5.0mm multiplied by 6.0mm multiplied by 1.75mm, the current resistance of a traditional sensor electrical property test clamp is not enough, under the condition of large current, a large amount of heat can be generated after the leading-out end of the Hall current sensor is contacted with the test clamp, and the clamp or the product is easy to burn.

SUMMERY OF THE UTILITY MODEL

An object of the embodiment of the application is to provide a sensor electrical property test fixture, which aims to solve the technical problem that in the prior art, the test of a sensor under a high-current condition easily causes the fixture or a product to be burnt.

In order to achieve the above object, according to one aspect of the present application, there is provided a sensor electrical performance testing fixture for testing a sensor to be tested, the sensor to be tested including a sensor body and a first pin, the first pin being disposed on the sensor body and electrically connected to the sensor body; the sensor electrical property test fixture comprises an insulating base, a test power supply part and a pressing part, wherein the test power supply part is arranged on the insulating base and used for providing test current for a sensor to be tested; the pressing part is arranged on the insulating base and comprises a pressing body and a first insulating pressing piece, the first insulating pressing piece is arranged on the pressing body, and the pressing body is arranged on one side, away from the insulating base, of the test power supply part; the sensor to be tested is placed on the test power supply part, abuts against the test power supply part through the first pin and is electrically connected with the test power supply part, and the first insulation pressing piece is pressed on the first pin.

Optionally, the test power supply portion is arranged on the insulating base, the sensor electrical property test fixture further comprises a cover arranging portion, the cover arranging portion is arranged in a hollow mode, the cover arranging portion is arranged on the test power supply portion in a hollow mode, and the side wall of the cover arranging portion is provided with a plurality of first heat dissipation holes.

Optionally, the radiating groove has been seted up to insulating base's upper surface, and test power supply portion corresponds the setting with the radiating groove, and insulating base is inside hollow setting, and a plurality of second louvres have all been seted up to lateral wall and diapire.

Optionally, the pressing portion further comprises a pressing component, the pressing component is rotatably arranged on the insulating base, and an output end of the pressing component is provided with an initial position and a pressing position for pressing the pressing body towards the direction of the test power supply portion.

Optionally, the pressing assembly includes a bearing seat, a transmission structure and a pressing member, the bearing seat is disposed on the insulating base, the transmission structure is rotatably disposed on the bearing seat, the pressing member is in driving connection with an output end of the transmission structure, the pressing member is a pressing post, and the pressing post forms an output end of the pressing assembly.

Optionally, the pressing assembly further comprises an adjusting screw and an adjusting nut, a first end of the adjusting screw is fixedly connected with the pressing column, the adjusting nut is fixedly connected to the output end of the transmission structure, and a second end of the adjusting screw is in threaded connection with the adjusting nut.

Optionally, the sensor to be tested further comprises a second pin, and the second pin is arranged on the sensor body and electrically connected with the sensor body; the sensor electrical property test fixture further comprises a signal output assembly, the signal output assembly comprises a PCB, a first binding post, a second binding post, a third binding post and a fourth binding post, and the PCB is arranged on one side of the test power supply part and is used for being electrically connected with a second pin of a sensor to be tested; the first binding post is electrically connected with the PCB and is used for being electrically connected with the positive electrode of an external voltage source; the second binding post is electrically connected with the PCB and is used for being electrically connected with the input end of the detection equipment; the third binding post is electrically connected with the PCB and is used for being electrically connected with the input end of the filtering equipment; and the fourth binding post is electrically connected with the PCB and is used for being electrically connected with the negative electrode of an external voltage source, the output end of the detection equipment and the output end of the filtering equipment.

Optionally, the test power supply portion includes a first power supply body, a second power supply body and a third power supply body which are sequentially arranged at intervals, the number of the pressing portions is two, one of the two pressing portions is arranged corresponding to the first power supply body and the second power supply body, and the other pressing portion is arranged corresponding to the second power supply body and the third power supply body; the electric performance test fixture for the sensor further comprises three fifth binding posts, and one of the three fifth binding posts is electrically connected with the first power supply body, the second power supply body and the third power supply body respectively.

Optionally, the sensor electrical performance test fixture further comprises a limiting part, the limiting part is arranged on the covering part, a first placing groove for placing the pressing body is formed in the limiting part, a limiting through groove for limiting the first pin and the second pin and a second placing groove for placing the sensor body are formed in the bottom of the first placing groove, the first pin can be placed in the limiting through groove and abutted against the test power supply part, and the second pin can be placed in the limiting through groove and abutted against the PCB; the sensor electrical property test fixture further comprises a support column, the support column is arranged in the covering portion, and an isolation layer used for isolating an electromagnetic field is arranged on the end face, far away from the insulation base, of the support column.

Optionally, the sensor electrical property test fixture further comprises an adjusting assembly, the adjusting assembly is arranged on the pressing column, the adjusting assembly comprises a rack, a gear, a driving rod, a ratchet wheel, a pawl and a driving hand wheel, the rack is slidably arranged on the pressing column along the length direction of the pressing column, a sliding groove for the rack to slide is formed in the pressing column, a first end of the rack is arranged inside the pressing column, and a second end of the rack is arranged outside the pressing column and detachably connected with the pressing body; the gear is rotatably arranged in the pressing column and is meshed with the rack; the first end of the driving rod is fixedly connected with the gear, and the second end of the driving rod is arranged outside the pressing column; the ratchet wheel is arranged outside the pressing column, is sleeved on the periphery of the driving rod and is fixedly connected with the driving rod; the pawl is rotatably arranged on the outer wall of the pressing column, and the driving rod keeps static through the matching of the ratchet wheel and the pawl; the driving hand wheel is sleeved at the second end of the driving rod and is fixedly connected with the second end of the driving rod;

the sensor electrical property test fixture further comprises a fixing assembly, the fixing assembly comprises a fixing rod, a reset spring and a traction rope, an accommodating groove for accommodating the second end of the rack is formed in the pressing body, an installing groove is formed in the groove wall of the accommodating groove, the fixing rod is arranged in the installing groove, the length direction of the fixing rod is perpendicular to the length direction of the rack, a fixing groove for inserting the fixing rod is formed in the outer wall of the second end of the rack, and the rack is connected with the pressing body through the matching of the fixing rod and the fixing groove; the reset spring is arranged between the fixed rod and the bottom of the mounting groove, the first end of the reset spring is fixedly connected with the fixed rod, and the second end of the reset spring is fixedly connected with the bottom of the mounting groove; the first end of haulage rope is close to reset spring's one end fixed connection with the dead lever, presses and sets up the hole of wearing to establish that supplies the haulage rope to wear out on the body, and the second end of haulage rope reachs the outside of pressing the body through wearing to establish the hole.

The application provides a sensor electrical property test fixture's beneficial effect lies in: compared with the prior art, under the condition of the sensor to be tested test, first insulation pressing piece and first pin one-to-one set up, make every first pin homoenergetic receive the pressing force that the first insulation pressing piece that corresponds applyed, thereby make every first pin homoenergetic realize good contact with test power supply portion, this kind of design of this application has improved the area of contact of each first pin and test power supply portion, the contact resistance between each first pin and the test power supply portion has been reduced, the heat that sensor to be tested and test power supply portion produced under the condition that switches on test current has been reduced, the sensor to be tested has been avoided as far as possible to test under the condition of heavy current and has caused the emergence of this kind of problems such as anchor clamps or product burnout.

Drawings

In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings required to be used in the embodiments or the prior art description will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present application, and for those skilled in the art, other drawings may be obtained according to these drawings without inventive labor.

Fig. 1 is a schematic structural diagram of a fixture for testing electrical properties of a sensor provided in an embodiment of the present application at a viewing angle;

FIG. 2 is a schematic structural diagram of a fixture for testing electrical properties of a sensor according to an embodiment of the present disclosure from another perspective;

FIG. 3 is a schematic structural diagram of a pressing assembly provided in an embodiment of the present application;

FIG. 4 is an elevational view, partially in section, of a sensor electrical performance test fixture provided in an embodiment of the present application;

FIG. 5 is an enlarged schematic view at A in FIG. 4;

fig. 6 is a schematic structural diagram of a pressing body, a first insulating pressing member, and a second insulating pressing member according to an embodiment of the present disclosure;

fig. 7 is a schematic position diagram of a test power supply portion, a first insulation pressing member, a PCB and a sensor to be tested according to an embodiment of the present disclosure;

FIG. 8 is a schematic structural diagram of an adjusting assembly and a fixing assembly provided in an embodiment of the present application;

fig. 9 is an enlarged schematic view at B in fig. 8.

Reference numerals referred to in the above figures are detailed below:

100. an insulating base; 110. a second heat dissipation hole; 200. a covering part; 210. a first heat dissipation hole; 300. a test power supply unit; 310. a first power supply body; 320. a second power supply body; 330. a third power supply body; 400. a pressing part; 410. pressing the body; 420. a first insulating pressing member; 430. a compression assembly; 431. a bearing seat; 432. a first rotating member; 433. pressing the column; 434. a second rotating member; 435. a connecting member; 436. a limiting member; 437. adjusting the screw rod; 438. adjusting the screw cap; 500. a signal output component; 510. a PCB; 520. a first terminal post; 530. a second terminal; 540. a third terminal; 550. a fourth terminal; 600. a fifth binding post; 700. a limiting part; 800. a support pillar; 900. an adjustment assembly; 910. a rack; 920. a gear; 930. a drive rod; 940. a ratchet wheel; 950. a pawl; 960. driving a hand wheel; 1000. a fixing component; 1010. fixing the rod; 1020. a return spring; 1030. a hauling rope; 1100. a sensor to be tested; 1110. a sensor body; 1120. a first pin.

Detailed Description

In order to make the technical problems, technical solutions and advantageous effects to be solved by the present application clearer, the present application is further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the present application and are not intended to limit the present application.

It will be understood that when an element is referred to as being "secured to" or "disposed on" another element, it can be directly on the other element or be indirectly on the other element. When an element is referred to as being "connected to" another element, it can be directly connected to the other element or be indirectly connected to the other element. The embodiments and features of the embodiments in the present application may be combined with each other without conflict. The present application will be described in detail below with reference to the accompanying drawings in conjunction with embodiments.

It will be understood that the terms "length," "width," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," and the like, as used herein, refer to an orientation or positional relationship indicated in the drawings that is solely for the purpose of facilitating the description and simplifying the description, and do not indicate or imply that the device or element being referred to must have a particular orientation, be constructed and operated in a particular orientation, and thus should not be considered as limiting the present application.

Furthermore, the terms "first", "second" and "first" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or to implicitly indicate the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of the present application, "a plurality" means two or more unless specifically limited otherwise.

As described in the background art, currently, the largest measured current of a hall current sensor with an SOP-8 type packaging mode is 50A, an output voltage signal is 4.5V, and meanwhile, the appearance of a product is too small, the size of the hall current sensor is 5.0mm x 6.0mm x 1.75mm, the current resistance of a traditional sensor electrical performance test clamp is not enough, and under the condition of large current, a large amount of heat can be generated after the leading-out end of the hall current sensor is contacted with the test clamp, so that the clamp or the product is easily burnt.

Referring to fig. 1 to 7, in order to solve the above-mentioned problems, according to an aspect of the present application, an embodiment of the present application provides a sensor electrical performance testing jig for testing a sensor 1100 to be tested, where the sensor 1100 to be tested includes a sensor body 1110 and a first pin 1120, and the first pin 1120 is disposed on the sensor body 1110 and electrically connected to the sensor body 1110. The sensor electrical property test fixture comprises an insulating base 100, a test power supply part 300 and a pressing part 400, wherein the test power supply part 300 is arranged on the insulating base 100 and used for providing test current for a sensor 1100 to be tested; the pressing portion 400 is disposed on the insulating base 100, the pressing portion 400 includes a pressing body 410 and a first insulating pressing member 420, the first insulating pressing member 420 is disposed on the pressing body 410, and the pressing body 410 is disposed on a side of the testing power supply portion 300 away from the insulating base 100. During testing, the sensor 1100 to be tested is disposed on the test power supply unit 300, abuts against the test power supply unit 300 through the first pins 1120, and is electrically connected to the test power supply unit 300, and the first insulation pressing member 420 presses against the first pins 1120.

In the embodiment of the present application, the insulating base 100 is made of bakelite, and the testing power supply part 300 is made of conductive material, in the present application, brass; the number of the first pins 1120 is four, but in other examples, the number of the first pins 1120 may also be two, three or other numbers; the first insulation pressing pieces 420 are made of an insulation material, and are made of a rubber material, and the number of the first insulation pressing pieces 420 is the same as that of the first pins 1120.

In specific application, under the condition that the sensor 1100 to be tested is tested, the first insulation pressing pieces 420 and the first pins 1120 are arranged in a one-to-one correspondence manner, so that each first pin 1120 can receive the pressing force applied by the corresponding first insulation pressing piece 420, and each first pin 1120 can be in good contact with the test power supply part 300.

Referring to fig. 1, 2 and 4, in the present embodiment, the test power supply portion 300 is disposed on the insulating base 100, the sensor electrical performance test fixture further includes a covering portion 200, the covering portion 200 is disposed in a hollow manner and covers the test power supply portion 300, and a plurality of first heat dissipation holes 210 are formed in a side wall of the covering portion 200.

In this application embodiment, test power supply portion 300 sets up in insulating base 100's upper surface, the piece is established for the cover to cover portion 200 is established to the cover, it adopts the bakelite material to make, test power supply portion 300 is located the cover and establishes portion 200 inside, under the condition of the sensor 1100 test of awaiting measuring, the heat that produces between the first pin 1120 of the sensor 1100 of awaiting measuring and the test power supply portion 300 can outwards be discharged through first louvre 210, thereby accelerate thermal giving off, sensor electrical property test fixture's heat dispersion has been promoted greatly, the portion 200 has played the guard action to test power supply portion 300 to the cover that sets up simultaneously. The covering portion 200 is fixedly connected to the insulating base 100.

Referring to fig. 1, as an optional mode in the embodiment of the present application, a heat dissipation groove is formed on an upper surface of the insulating base 100, the test power supply portion 300 is disposed corresponding to the heat dissipation groove, the insulating base 100 is disposed in a hollow manner, and the second heat dissipation hole 110 is formed on both the side wall and the bottom wall of the insulating base 100.

In this alternative, the test power supply unit 300 is connected to the housing unit 200 by a bolt, and a part of the test power supply unit 300 is located above the heat sink and another part is located above the insulating base 100. Under the condition of testing the sensor 1100 to be tested, the heat generated between the first pin 1120 and the test power supply part 300 of the sensor 1100 to be tested can be discharged outwards through the heat dissipation groove and the second heat dissipation hole 110, and in addition, because the test power supply part 300 is positioned above the insulating base 100, a larger height difference exists between the test power supply part 300 and the second heat dissipation hole 110, and the heat dissipation is more convenient due to the height difference.

As another optional way in the embodiment of the present application, the test power supply part 300 is wrapped by a gold layer, so that the contact resistance between the first pin 1120 and the test power supply part 300 can be further reduced, and further, the heat generated by the sensor 1100 to be tested and the test power supply part 300 under the condition of conducting the test current is reduced.

Referring to fig. 6, a placing space is opened on a side surface of the pressing body 410 close to the insulating base 100, and the sensor body 1110 is located in the placing space when the first insulating pressing piece 420 is pressed against the first pin 1120.

Referring to fig. 1 to 4, the pressing portion 400 of the present embodiment further includes a pressing member 430, the pressing member 430 is rotatably disposed on the insulating base 100, and an output end of the pressing member 430 has an initial position and a pressing position for pressing the pressing body 410 toward the test power supply portion 300.

In this embodiment, compress tightly subassembly 430 including bearing seat, transmission structure and pressing member, bear seat 431 and set up on insulating base 100, transmission structure rotationally sets up on bearing seat 431, and the pressing member is connected with transmission structure's output drive, and the pressing member is for pressing post 433, presses post 433 to form the output that compresses tightly subassembly 430.

The transmission structure includes a first rotating member 432, a second rotating member 434 and a connecting member 435, wherein a first end of the first rotating member 432 is rotatably disposed on the bearing seat 431; the pressing posts 433 are disposed at the second end of the first rotating member 432, the pressing posts 433 can press the pressing body 410 toward the test power supply unit 300, and the pressing posts 433 may be disposed separately from the pressing body 410 or may be connected to each other. The first end of the second rotating member 434 is rotatably disposed on the bearing seat 431; the connecting element 435 is disposed between the first rotating element 432 and the second rotating element 434, a first end of the connecting element 435 is rotatably disposed on the first rotating element 432, and a second end of the connecting element 435 is rotatably disposed on the second rotating element 434. In the case where the pressing post 433 is in the pressing position, the first rotating member 432 is horizontally disposed, the second rotating member 434 is vertically disposed, the connecting member 435 is vertically disposed, and the pressing post 433 is vertically disposed, and is used to press on the pressing body 410.

In this embodiment, the first rotating members 432 are two first rotating plates, the two first rotating plates are rotatably disposed on the bearing base 431 through connecting pins, specifically, the two first rotating plates are disposed between the bearing bases 431, the connecting pins sequentially pass through a first end surface of the bearing base 431, the two first rotating plates and a second end surface of the bearing base 431, the first end surface and the second end surface are disposed opposite to each other, the connecting pins are fixedly connected to the two first rotating plates, and two ends of the connecting pins are respectively rotatably connected to the bearing base 431. The first rotating member 432 is formed as an output end of the transmission structure.

The second rotating member 434 is two second rotating plates, the two second rotating plates are rotatably arranged on the bearing seat 431 through a connecting pin and a bearing seat, concretely, the two second rotating plates are arranged on two sides of the bearing seat 431, the bearing seat is arranged between the bearing seats 431 and fixedly connected with the bearing seat 431, the connecting pin sequentially penetrates through one second rotating plate, the first end face of the bearing seat 431, the bearing seat, the second end face of the bearing seat 431 and the other second rotating plate, the first end face and the second end face are oppositely arranged, the connecting pin is fixedly connected with the two second rotating plates, and the connecting pin is rotatably arranged in the bearing seat 431 and the bearing seat.

The pressing post 433 has a diameter gradually increasing in a direction from a distance to the first rotating member 432. The connecting members 435 are two connecting plates, which are rotatably disposed on the first rotating member 432 and the second rotating member 434 through two connecting pins, specifically, the two connecting plates are respectively disposed on two sides of the two first rotating plates, and are disposed between the two second rotating plates, and one connecting pin sequentially passes through one connecting plate, the two first rotating plates and the other connecting plate, wherein the connecting pin is rotatably disposed on the two connecting plates, and is fixedly connected to the two first rotating plates, and the other connecting pin sequentially passes through one second rotating plate, the two connecting plates and the other second rotating plate, wherein the connecting pin is rotatably disposed on the two connecting plates, and is fixedly connected to the two second rotating plates.

By adopting the above design, when the pressing column 433 is in the pressing position, the first rotating member 432 is horizontally arranged, the second rotating member 434, the connecting member 435 and the pressing column 433 are vertically arranged, and the pressing column 433 is pressed on the pressing body 410 at the same time, in this case, the pressing assembly 430 can apply a pressing force along the vertical direction to the pressing body 410 and the first insulating pressing member 420, so that the contact area between the first pin 1120 and the test power supply part 300 is further increased, the contact resistance between the first pin 1120 and the test power supply part 300 is reduced, and the heat generated by the sensor 1100 to be tested and the test power supply part 300 under the condition of conducting the test current is reduced.

Referring to fig. 1, as an optional manner in the embodiment of the present application, the transmission structure further includes a limiting member 436, the limiting member 436 is fixedly connected to one side of the connecting member 435 close to the pressing column 433, and a length direction of the limiting member 436 is parallel to a length direction of the connecting member 435; when the pressing post 433 is in the pressing position, the stopper 436 is close to the end surface of the first rotating member 432 for abutting against the first rotating member 432.

In this optional manner, the limiting member 436 is a limiting plate, and the limiting member 436 and the connecting member 435 are integrally formed. Under the condition that the pressing column 433 is in the pressing position, the first rotating member 432 is in the horizontal state, the second rotating member 434 and the connecting member 435 are both in the vertical state, at this time, under the action of the connecting member 435, the limiting member 436 is also in the vertical state, and the end surface of the limiting member 436 close to the first rotating member 432 is also abutted against the first rotating member 432, in this case, the second rotating member 434 cannot continue to rotate in the direction close to the pressing column 433, and meanwhile, the operator is reminded that the operator does not need to continue to drive the second rotating member 434 to rotate.

Referring to fig. 2 and 7, the sensor 1100 in this embodiment further includes four second pins, the second pins are disposed on the sensor body 1110 and electrically connected to the sensor body 1110, and the first pins 1120 are disposed opposite to the second pins.

The sensor electrical property test fixture further comprises a signal output assembly 500, the signal output assembly 500 comprises a PCB510 (Printed Circuit Board), wherein the PCB510 is named as a Printed Circuit Board, a first binding post 520, a second binding post 530, a third binding post 540 and a fourth binding post 550, and the PCB510 is arranged on one side of the test power supply part 300 and is used for being electrically connected with a second pin of the sensor 1100 to be tested; the first terminal 520 is electrically connected with the PCB510 for electrically connecting with the positive electrode of an external voltage source; the second terminal 530 is electrically connected with the PCB510, and is used for being electrically connected with an input end of the detection device; the third terminal 540 is electrically connected to the PCB510 for electrically connecting to an input terminal of the filter device, and the fourth terminal 550 is electrically connected to the PCB510 for electrically connecting to a negative electrode of an external voltage source, an output terminal of the detection device, and an output terminal of the filter device.

In the embodiment of the application, the PCB510 is provided with the connecting sheet, the connecting sheet is electrically connected with the PCB510, the second pin can be abutted against the connecting sheet, the second pin is electrically connected with the PCB510 at the moment, the flame resistance grade of the PCB510 is FR-4, the detection equipment adopts a digital multimeter, and the filter equipment adopts a filter capacitor.

In the concrete application, first terminal 520 is connected with the positive pole of external voltage source, second terminal 530 is connected with digital multimeter's input electricity, third terminal 540 is connected with filter capacitor's input electricity, fourth terminal 550 not only is connected with external voltage source's negative pole electricity, in order to form a closed circuit, still be connected with digital multimeter's output and filter capacitor's output electricity simultaneously, thereby make digital multimeter and filter capacitor establish ties in closed circuit, the filter capacitor who sets up is used for carrying out filtering process to output signal, so that obtain a relatively accurate signal of telecommunication. Under the condition of testing the sensor 1100 to be tested, the test power supply part 300 provides test current for the sensor 1100 to be tested, the PCB510 provides working voltage for the sensor 1100 to be tested, and the first pin 1120 judges whether the sensor 1100 to be tested is qualified or not and judges whether the contact between the first pin 1120 and the test power supply part 300 is good or not according to the data on the digital multimeter.

Referring to fig. 7, as an optional manner in the embodiment of the present application, the pressing portion 400 further includes a second insulation pressing member, the second insulation pressing member is fixedly connected to the pressing body 410, the second insulation pressing member is disposed corresponding to the first insulation pressing member 420, the second insulation pressing member and the first insulation pressing member 420 have the same shape and size, and the second insulation pressing member is disposed in four numbers and is disposed in one-to-one correspondence with the second pins respectively. The provision of the second insulation pressing member not only facilitates good contact of the second pin with the PCB510, but also enables the first insulation pressing member 420 to apply a good pressing force in case the first insulation pressing member 420 presses the first pin 1120, thereby avoiding the possibility of the first insulation pressing member 420 tilting as much as possible.

Referring to fig. 2 and 3, the pressing assembly 430 in this embodiment further includes an adjusting screw 437 and an adjusting nut 438, the adjusting nut 438 is fixedly connected to the output end of the transmission structure, and a second end of the adjusting screw 437 is threadedly connected to the adjusting nut 438.

In this embodiment, the number of the adjusting nuts 438 is two, the two adjusting nuts 438 are respectively disposed on two sides of the transmission structure, the adjusting screw 437 is respectively in threaded connection with the two adjusting nuts 438, wherein the adjusting nut 438 that is far away from the pressing column 433 is fixedly connected with the transmission structure, the adjusting nut 438 that is close to the pressing column 433 is not connected with the transmission structure, and is only in threaded connection with the adjusting screw 437, and at this time, the adjusting screw 437 penetrates through the output end of the transmission structure, that is, the first rotating member 432.

In the embodiment of the present application, a length direction of the adjusting screw 437 is perpendicular to a length direction of the first rotating member 432, two adjusting nuts 438 are respectively and fixedly connected to two opposite side surfaces of the second end of the first rotating member 432, and a first end of the adjusting screw 437 sequentially passes through one adjusting nut 438, the second end of the first rotating member 432, and the other adjusting nut 438.

In the embodiment of the present application, a penetration space through which the adjustment screw 437 penetrates is formed between the two first rotation plates. After the sensor 1100 to be tested is connected with an external voltage source, if the numerical value displayed by the digital multimeter is not a standard numerical value, it is determined that the first pin 1120 is not in good contact with the test power supply part 300, at this time, the adjusting nut 438 arranged close to the pressing column 433 is rotated, so that the first end of the adjusting screw 437 can move towards the test power supply part 300, and the pressing column 433 can also move towards the test power supply part 300, thereby enhancing the contact between the first pin 1120 and the test power supply part 300, increasing the contact area between the first pin 1120 and the test power supply part 300, and reducing the contact resistance between the first pin 1120 and the test power supply part 300 until the numerical value displayed by the digital multimeter is approximately the same as the standard numerical value. The adjustment screw 437 and the adjustment nut 438 are provided to make the first pin 1120 and the test power supply unit 300 contact well.

In addition, in the embodiment of the present application, two connecting plates are disposed between the two adjusting nuts 438, one of the connecting plates is disposed between the first rotating member 432 and the adjusting nut 438 disposed away from the pressing column 433 and is fixedly connected to the first rotating member 432 and the adjusting nut 438, respectively, and the other connecting plate is disposed between the first rotating member 432 and the adjusting nut 438 disposed near the pressing column 433 and is fixedly connected to the first rotating member 432.

Of course, in other embodiments, two adjusting nuts 438 may be fixedly connected to both sides of the first rotating member 432, and two connecting plates are fixedly connected to the adjusting nuts 438. After the sensor 1100 to be tested is connected with an external voltage source, if the numerical value displayed by the digital multimeter is not a standard numerical value, the adjusting screw 437 is rotated to drive the pressing column 433 to move towards the direction of the test power supply part 300.

Referring to fig. 8, as an alternative manner in the embodiment of the present application, the sensor electrical performance testing fixture further includes an adjusting assembly 900, the adjusting assembly 900 is disposed on the pressing post 433, the adjusting assembly 900 includes a rack 910, a gear 920, a driving rod 930, a ratchet 940, a pawl 950, and a driving handwheel 960, wherein the rack 910 is slidably disposed on the pressing post 433 along a length direction of the pressing post 433, a sliding groove for the rack 910 to slide is formed in the pressing post 433, a first end of the rack 910 is disposed inside the pressing post 433, and a second end of the rack 910 is disposed outside the pressing post 433 and detachably connected to the pressing body 410; the gear 920 is rotatably arranged in the pressing column 433 and meshed with the rack 910, and a rotating space for the gear 920 to rotate is formed in the pressing column 433; the first end of the driving rod 930 is fixedly connected with the gear 920, the second end of the driving rod 930 is arranged outside the pressing column 433, and an extending groove for the driving rod 930 to extend outwards is formed in the pressing column 433; the ratchet wheel 940 is arranged outside the pressing column 433, and the ratchet wheel 940 is sleeved on the periphery of the driving rod 930 and is fixedly connected with the driving rod 930; the pawl 950 is rotatably arranged on the outer wall of the pressing column 433, and the driving rod 930 is kept still through the matching of the ratchet wheel 940 and the pawl 950; the driving handwheel 960 is sleeved on the second end of the driving rod 930 and is fixedly connected with the second end of the driving rod 930.

In this alternative, the pressing post 433 is a rectangular parallelepiped, but in other examples, the pressing post 433 may have other shapes, the longitudinal direction of the rack 910 is parallel to the longitudinal direction of the pressing post 433, and the longitudinal direction of the driving rod 930 is perpendicular to the longitudinal direction of the rack 910. In specific application, when the first pin 1120 is not in good contact with the test power supply part 300, firstly, the adjusting screw 437 is rotated to realize approximate adjustment, the contact between the first pin 1120 and the test power supply part 300 is strengthened, when the numerical value displayed by the digital multimeter is close to a standard value, the driving rod 930 is rotated to drive the gear 920 to rotate, the gear 920 drives the rack 910 to move towards the test power supply part 300 until the numerical value displayed by the digital multimeter is approximately the same as the standard value, and at this time, the driving rod 930 is kept still by using the ratchet wheel 940 and the pawl 950. The adjusting assembly 900 plays a fine adjustment role, the contact between the first pin 1120 and the test power supply part 300 is further enhanced, the contact area between the first pin 1120 and the test power supply part 300 is increased, the contact resistance between the first pin 1120 and the test power supply part 300 is reduced, and the accuracy of the test operation of the sensor electrical property test fixture is improved.

Referring to fig. 9, in addition, the fixture for testing electrical performance of a sensor further includes a fixing assembly 1000, the fixing assembly 1000 includes a fixing rod 1010, a return spring 1020 and a pulling rope 1030, an accommodating groove for accommodating the second end of the rack 910 is formed on the pressing body 410, an accommodating groove is formed on a groove wall of the accommodating groove, the fixing rod 1010 is disposed in the accommodating groove, a length direction of the fixing rod 1010 is perpendicular to a length direction of the rack 910, a fixing groove for inserting the fixing rod 1010 is formed on an outer wall of the second end of the rack 910, and the rack 910 is connected to the pressing body 410 through the fixing rod 1010 and the fixing groove in a matching manner; the reset spring 1020 is arranged between the fixed rod 1010 and the bottom of the mounting groove, the first end of the reset spring 1020 is fixedly connected with the fixed rod 1010, and the second end of the reset spring 1020 is fixedly connected with the bottom of the mounting groove; the first end of haulage rope 1030 is close to reset spring 1020's one end fixed connection with dead lever 1010, presses and sets up the wear-to-establish hole that supplies haulage rope 1030 to wear out on the body 410, and the second end of haulage rope 1030 reachs the outside of pressing body 410 through wear-to-establish hole.

Specifically, when the rack 910 needs to be connected to the pressing body 410, the pulling rope 1030 is pulled to move in a direction away from the pressing body 410, so that one end of the fixing rod 1010, which is away from the return spring 1020, moves into the mounting groove, the second end of the rack 910 is placed in the mounting groove, the pulling rope 1030 is loosened, and the fixing rod 1010 is directly inserted into the fixing groove under the action of the return spring 1020, so that the rack 910 is connected to the pressing body 410. The fixing assembly 1000 is provided to detachably connect the rack 910 with the pressing body 410, which facilitates the independent use of the pressing body 410 and the common use with the adjusting assembly 900.

In this alternative, two sets of fixing assemblies 1000 are provided, and the two sets of fixing assemblies 1000 are oppositely disposed on the pressing body 410.

Referring to fig. 4, as an alternative manner in the embodiment of the present application, the test power supply portion 300 includes a first power supply body 310, a second power supply body 320, and a third power supply body 330, which are sequentially disposed at intervals, two pressing portions 400 are provided, one pressing portion 400 of the two pressing portions 400 is disposed corresponding to the first power supply body 310 and the second power supply body 320, and the other pressing portion 400 is disposed corresponding to the second power supply body 320 and the third power supply body 330. The sensor electrical property test fixture further comprises a fifth binding post 600, the number of the fifth binding posts 600 is three, the three fifth binding posts 600 are respectively electrically connected with the first power supply body 310, the second power supply body 320 and the third power supply body 330, and meanwhile, two external ports are arranged on each fifth binding post 600.

In this alternative, two cover portions 200 are provided and provided corresponding to the pressing portions 400. Two signal output assemblies 500 are also provided and are provided corresponding to the pressing part 400. The first power supply body 310, the second power supply body 320 and the third power supply body 330 are all made of brass, wherein the first power supply body 310 and the second power supply body 320 are the same in size, and the size of the second power supply body 320 is twice that of the first power supply body 310. This design of the subject application facilitates testing both two sensors 1100 under test simultaneously and testing a single sensor 1100 under test separately.

Referring to fig. 4 and 5, as an optional manner in the embodiment of the present application, the sensor electrical performance testing fixture further includes a limiting portion 700, the limiting portion 700 is disposed on the covering portion 200, a first placing groove for placing the pressing body 410 is formed in the limiting portion 700, a limiting through groove for limiting the first pin 1120 and the second pin and a second placing groove for placing the sensor body 1110 are formed at the bottom of the first placing groove, the first pin 1120 can be placed in the limiting through groove and abutted to the testing power supply portion 300, and the second pin can be placed in the limiting through groove and abutted to the PCB 510.

Referring to fig. 7, the fixture for testing electrical performance of a sensor further includes a supporting pillar 800, the supporting pillar 800 is disposed in the covering portion 200, and an isolation layer for isolating an electromagnetic field is disposed on an end surface of the supporting pillar 800 away from the insulating base 100; under the test of the sensor 1100 to be tested, the sensor body 1110 abuts against the end surface of the supporting column 800 away from the insulating base 100.

In this optional manner, eight limiting through grooves are formed, four of the limiting through grooves formed in the same side extend to the upper surface of the test power supply portion 300, and the other four limiting through grooves formed in the same side extend to the connecting piece of the PCB 510. The limiting through groove arranged has a limiting effect on the sensor 1100 to be tested, the possibility that the sensor 1100 to be tested deviates in the test process is avoided, and the accuracy of the test result is improved. The isolation layer is made of one of tin foil paper, copper foil paper or aluminum foil paper, so that the influence of an electromagnetic field generated by other external objects on the sensor under test is reduced as much as possible, and the sensor can normally run under the test condition.

In summary, the fixture for testing the electrical performance of the sensor provided by the embodiment at least has the following beneficial technical effects: under the condition of testing of the sensor 1100 to be tested, the first insulation pressing pieces 420 and the first pins 1120 are arranged in a one-to-one correspondence manner, so that each first pin 1120 can receive the pressing force applied by the corresponding first insulation pressing piece 420, and each first pin 1120 can be in good contact with the test power supply part 300.

The present invention is not intended to be limited to the particular embodiments shown and described, but is to be accorded the widest scope consistent with the principles and novel features herein disclosed.

Claims (10)

1. A sensor electrical performance test fixture for testing a sensor under test (1100), the sensor under test (1100) including a sensor body (1110) and a first pin (1120), the first pin (1120) disposed on the sensor body (1110) and electrically connected to the sensor body (1110), the sensor electrical performance test fixture comprising:

an insulating base (100);

the test power supply part (300), the test power supply part (300) is arranged on the insulating base (100) and is used for providing test current for the sensor (1100) to be tested; and (c) a second step of,

the pressing part (400), the pressing part (400) is arranged on the insulating base (100), the pressing part (400) comprises a pressing body (410) and a first insulating pressing piece (420), the first insulating pressing piece (420) is arranged on the pressing body (410), and the pressing body (410) is arranged on one side, away from the insulating base (100), of the test power supply part (300);

the sensor (1100) to be tested is placed on the test power supply part (300), abuts against the test power supply part (300) through the first pin (1120), and is electrically connected with the test power supply part (300), and the first insulation pressing piece (420) presses the first pin (1120).

2. The fixture for testing the electrical performance of the sensor according to claim 1, wherein the testing power supply portion (300) is disposed on the insulating base (100), the fixture for testing the electrical performance of the sensor further comprises a covering portion (200), the covering portion (200) is hollow inside and covers the testing power supply portion (300), and a plurality of first heat dissipation holes (210) are formed in a side wall of the covering portion (200).

3. The fixture for testing electrical properties of sensors according to claim 1, wherein the insulating base (100) has a heat sink formed on an upper surface thereof, the testing power supply unit (300) is disposed corresponding to the heat sink, the insulating base (100) is hollow, and the sidewalls and the bottom wall of the insulating base are formed with a plurality of second heat dissipation holes (110).

4. The fixture for testing electrical performance of a sensor according to claim 2, wherein the pressing portion (400) further comprises a pressing member (430), the pressing member (430) is rotatably disposed on the insulating base (100), and an output end of the pressing member (430) has an initial position and a pressing position for pressing the pressing body (410) toward the testing power supply portion (300).

5. The fixture for testing electrical performance of a sensor according to claim 4, wherein the pressing assembly (430) includes a bearing seat (431), a transmission structure, and a pressing element, the bearing seat (431) is disposed on the insulation base (100), the transmission structure is rotatably disposed on the bearing seat (431), the pressing element is in driving connection with an output end of the transmission structure, the pressing element is a pressing post (433), and the pressing post (433) forms an output end of the pressing assembly (430).

6. The fixture for testing electrical performance of sensors according to claim 5, wherein the pressing assembly (430) further comprises an adjusting screw (437) and an adjusting nut (438), a first end of the adjusting screw (437) is fixedly connected with the pressing column (433), the adjusting nut (438) is fixedly connected on the output end of the transmission structure, and a second end of the adjusting screw (437) is in threaded connection with the adjusting nut (438).

7. The sensor electrical performance test fixture of any one of claims 2, 4, 5 and 6, wherein the sensor under test (1100) further comprises a second pin disposed on the sensor body (1110) and electrically connected to the sensor body (1110);

the sensor electrical performance test fixture further includes a signal output assembly (500), the signal output assembly (500) including:

the PCB (510), the PCB (510) is arranged at one side of the test power supply part (300) and is used for electrically connecting with the second pin of the sensor to be tested (1100);

a first terminal post (520), wherein the first terminal post (520) is electrically connected with the PCB (510) and is used for being electrically connected with a positive electrode of an external voltage source;

a second terminal post (530), the second terminal post (530) being electrically connected to the PCB (510) for electrical connection to an input of a detection device;

a third terminal post (540), the third terminal post (540) being electrically connected with the PCB (510) for electrical connection with an input terminal of a filtering device;

a fourth terminal (550), wherein the fourth terminal (550) is electrically connected with the PCB (510) and is used for being electrically connected with the negative electrode of the external voltage source, the output end of the detection device and the output end of the filter device.

8. The fixture for testing electrical performance of a sensor according to any one of claims 1 to 6, wherein the testing power supply portion (300) comprises a first power supply body (310), a second power supply body (320) and a third power supply body (330) which are arranged at intervals in sequence, the number of the pressing portions (400) is two, one pressing portion (400) of the two pressing portions (400) is arranged corresponding to the first power supply body (310) and the second power supply body (320), and the other pressing portion (400) is arranged corresponding to the second power supply body (320) and the third power supply body (330);

the sensor electrical property test fixture further comprises a fifth binding post (600), the number of the fifth binding posts (600) is three, and the fifth binding posts are respectively electrically connected with the first power supply body (310), the second power supply body (320) and the third power supply body (330).

9. The sensor electrical performance test fixture according to claim 7, further comprising a limiting portion (700), wherein the limiting portion (700) is disposed on the covering portion (200), a first placing groove for placing the pressing body (410) is formed in the limiting portion (700), a limiting through groove for limiting the first pin (1120) and the second pin is formed at a bottom of the first placing groove, and a second placing groove for placing the sensor body (1110) is formed at a bottom of the first placing groove, the first pin (1120) can be placed in the limiting through groove and abuts against the test power supply portion (300), and the second pin can be placed in the limiting through groove and abuts against the PCB (510);

the sensor electrical property test fixture further comprises a supporting column (800), the supporting column (800) is arranged in the cover arranging portion (200), and an isolating layer used for isolating an electromagnetic field is arranged on the end face, far away from the insulating base (100), of the supporting column (800).

10. The sensor electrical performance test fixture of any one of claims 5 or 6, further comprising an adjustment assembly (900), the adjustment assembly (900) being disposed on the pressing post (433), the adjustment assembly (900) comprising:

the rack (910) is slidably arranged on the pressing column (433) along the length direction of the pressing column (433), a sliding groove for the rack (910) to slide is formed in the pressing column (433), a first end of the rack (910) is arranged inside the pressing column (433), and a second end of the rack (910) is arranged outside the pressing column (433) and is detachably connected with the pressing body (410);

the gear (920), the gear (920) is rotatably arranged in the pressing column (433) and is meshed with the rack (910);

a first end of the driving rod (930) is fixedly connected with the gear (920), and a second end of the driving rod (930) is arranged outside the pressing column (433);

the ratchet wheel (940) is arranged outside the pressing column (433), and the ratchet wheel (940) is sleeved on the periphery of the driving rod (930) and is fixedly connected with the driving rod (930);

a pawl (950), the pawl (950) being rotatably disposed on an outer wall of the pressing post (433), the driving lever (930) being held stationary by the engagement of the ratchet (940) and the pawl (950);

the driving hand wheel (960) is sleeved at the second end of the driving rod (930) and is fixedly connected with the second end of the driving rod (930);

the sensor electrical property test fixture further comprises a fixing assembly (1000), the fixing assembly (1000) comprises a fixing rod (1010), a reset spring (1020) and a traction rope (1030), a containing groove used for containing the second end of the rack (910) is formed in the pressing body (410), a mounting groove is formed in the wall of the containing groove, the fixing rod (1010) is arranged in the mounting groove, the length direction of the fixing rod (1010) is perpendicular to the length direction of the rack (910), a fixing groove for inserting the fixing rod (1010) is formed in the outer wall of the second end of the rack (910), and the rack (910) is connected with the pressing body (410) through the matching of the fixing rod (1010) and the fixing groove;

the reset spring (1020) is arranged between the fixed rod (1010) and the bottom of the mounting groove, the first end of the reset spring (1020) is fixedly connected with the fixed rod (1010), and the second end of the reset spring (1020) is fixedly connected with the bottom of the mounting groove;

the first end of haulage rope (1030) with dead lever (1010) are close to reset spring (1020) one end fixed connection, press and offer on body (410) and supply haulage rope (1030) the wear hole that outwards worn out, the second end of haulage rope (1030) passes through the wear hole reachs press the outside of body (410).

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