CN218331748U

CN218331748U - Resistance testing device for data connecting line

Info

Publication number: CN218331748U
Application number: CN202222164132.0U
Authority: CN
Inventors: 管章术; 马龙; 马振亮; 马林娜
Original assignee: Tancheng Hongrui Electronics Co ltd
Current assignee: Tancheng Hongrui Electronics Co ltd
Priority date: 2022-08-17
Filing date: 2022-08-17
Publication date: 2023-01-17
Anticipated expiration: 2032-08-17

Abstract

The utility model discloses a resistance testing device for data connecting lines, which comprises a testing instrument, a switch and a screen, wherein the testing instrument is provided with a testing component; the testing assembly comprises a first binding post, a joint, a second binding post, a first interface, a second interface and a third interface; the first binding post and the second binding post are respectively arranged on the testing instrument, a joint is arranged on the first binding post, a first interface, a second interface and a third interface are respectively arranged on the second binding post, the first interface is an existing Huaqi interface, the second interface is an existing android interface, and the third interface is an existing apple interface; and a positive electrode and a negative electrode are respectively arranged above the test instrument. This device uses through the cooperation between test instrument, switch, screen and the test component, can carry out the test of resistance for data line, tall and erect data line of ann and apple data line to hua simultaneously, and the function is reasonable, and has realized carrying out the resistance test to the data line of different models.

Description

Resistance testing device for data connecting line

Technical Field

The utility model relates to a resistance test device field for data connection line, specific resistance test device for data connection line that says so.

Background

The data line is the necessary subassembly of connecting hard disk and mainboard, can attach when buying the mainboard and send usually, and every data line can only connect two IDE devices (for example optical drive, hard disk, CD writer etc.), and the data line needs to test its resistance before dispatching from the factory, and the resistance testing arrangement who is used for the data connecting wire at present, the function is single, can not carry out resistance test to the data line of different models.

SUMMERY OF THE UTILITY MODEL

The utility model aims at providing a resistance test device for data link to prior art not enough.

The utility model provides a technical scheme that its technical problem adopted is: a resistance testing device for a data connecting line comprises a testing instrument, a switch and a screen, wherein a testing assembly is arranged on the testing instrument; the testing component comprises a first wiring terminal, a joint, a second wiring terminal, a first interface, a second interface and a third interface;

the first binding post and the second binding post are respectively arranged on a test instrument, a joint is arranged on the first binding post, a first interface, a second interface and a third interface are respectively arranged on the second binding post, the first interface is an existing Huawei interface, the second interface is an existing android interface, and the third interface is an existing apple interface;

and a positive electrode and a negative electrode are respectively arranged above the test instrument.

Further, the positive electrode and the negative electrode are connected with a fixing assembly, and the fixing assembly comprises a lead and a wire head;

the wire is connected with a wire head;

the quantity of the conducting wires and the thread ends is two, one conducting wire is connected to the first binding post, the other conducting wire is connected to the second binding post, one thread end is connected to the positive electrode, and the other thread end is connected to the negative electrode.

Furthermore, the fixing component also comprises a U-shaped plate and a clamping groove;

the lower part of the U-shaped plate is clamped in a clamping groove, and the clamping groove is formed in the test instrument;

the number of U-shaped board and draw-in groove is two, and every U-shaped board parcel a wire.

Further, a cavity is formed in the testing instrument, a screen is installed on the inner side of the cavity, a protection assembly is installed on the outer side of the cavity and comprises a cover and a handle, the cover extends into the cavity, and the handle is installed on the cover.

Further, the protection assembly further comprises a ball, a spring and a circular groove, the spring is mounted on the cover, the ball is mounted on the spring and clamped in the circular groove, and the circular groove is formed in the inner side wall of the cavity.

Furthermore, the number of the round balls, the springs and the round grooves is four.

The utility model has the advantages that:

this device uses through the cooperation between test instrument, switch, screen and the test subassembly, can carry out the test of resistance for data line, tall and erect data line of ann and apple data line to china simultaneously, and the function is reasonable, and has realized carrying out resistance test to the data line of different models.

Drawings

Fig. 1 is a schematic structural diagram of the present invention.

Fig. 2 is a schematic structural view of the protection assembly of the present invention.

Fig. 3 is a schematic structural diagram of the present invention a.

Fig. 4 is a schematic structural diagram of the present invention B.

Description of reference numerals: 1 test instrument, 2 switches, 3 screens, 4 test components, 401 first binding post, 402 connectors, 403 second binding post, 404 first interface, 405 second interface, 406 third interface, 5 fixing components, 501 conducting wire, 502 wire head, 503U-shaped plate, 504 clamping groove, 6 protection components, 601 cover, 602 handle, 603 ball, 604 spring and 605 circular groove.

Detailed Description

The invention will be further described with reference to specific examples, which are intended to illustrate the invention and not to limit the scope of the invention. Furthermore, it should be understood that various changes and modifications can be made by those skilled in the art after reading the teachings of the present invention, and these equivalents also fall within the scope of the appended claims.

Referring to fig. 1-4, the structure of the present invention is a schematic diagram, a resistance testing device for data connection line, including a testing instrument 1, a switch 2 and a screen 3, the model of the testing instrument 1 is TD2516A, a testing component 4 is installed on the testing instrument 1; the test assembly 4 comprises a first terminal 401, a connector 402, a second terminal 403, a first interface 404, a second interface 405 and a third interface 406;

the first binding post 401 and the second binding post 403 are respectively installed on the testing instrument 1, the first binding post 401 is provided with a connector 402, the second binding post 403 is respectively provided with a first interface 404, a second interface 405 and a third interface 406, the first interface 404 is an existing Huawei interface, the second interface 405 is an existing android interface, and the third interface 406 is an existing apple interface, when the first binding post 403 is a Huawei data line, a big head of the data line is connected to the connector 402 on the first binding post 401, a small head is connected to the first interface 404 on the second binding post 403, the switch 2 is turned on, the testing instrument 1 automatically tests the resistance of the Huawei data line, when the data line is an android data line, the big head of the data line is connected to the connector 402 on the first binding post 401, the small head is connected to the second interface 405 on the second binding post 403, the switch 2 is turned on, the testing instrument 1 automatically tests the resistance of the android data line, when the data line is an apple data line 406, the big head of the data line is connected to the connector 402 on the first binding post 401, the small head is connected to the second binding post 403, the third interface 405 is turned on, the resistance of the testing instrument 1 is automatically tested, and the testing instrument 406;

an anode and a cathode are respectively arranged above the test instrument 1, the anode and the cathode are connected with a fixed assembly 5, and the fixed assembly 5 comprises a lead 501 and a wire head 502;

a wire head 502 is connected to the wire 501;

the number of the conducting wires 501 and the wire heads 502 is two, one conducting wire 501 is connected to the first binding post 401, the other conducting wire 501 is connected to the second binding post 403, one wire head 502 is connected to the positive pole, the other wire head 502 is connected to the negative pole, the first binding post 401 is connected to the positive pole of the test instrument 1 through the wire head 502 on one conducting wire 501, the second binding post 403 is connected to the negative pole of the test instrument 1 through the wire head 502 on the other conducting wire 501, and the fixing assembly further comprises a U-shaped plate 503 and a clamping groove 504;

the lower part of the U-shaped plate 503 is clamped in the clamping groove 504, and the clamping groove 504 is arranged on the test instrument 1;

the number of the U-shaped plates 503 and the number of the card slots 504 are two, each U-shaped plate 503 wraps one wire 501, the two U-shaped plates 503 are respectively clamped in the card slots 504 on the test instrument 1, and the two wires 501 are respectively fixed by the U-shaped plates 503.

The testing instrument 1 is internally provided with a cavity, the inner side of the cavity is provided with a screen 3, the outer side of the cavity is provided with a protective component 6, the protective component 6 comprises a cover 601 and a handle 602, the cover 601 extends into the cavity, the handle 602 is arranged on the cover 601, the cover 601 extends into the inner outline of the screen 3 by moving the handle 602 to protect the screen 3, the protective component 6 further comprises round balls 603, springs 604 and circular grooves 605, the number of the round balls 603, the number of the springs 604 and the number of the circular grooves 605 are four, the cover 601 is provided with the springs 604, the round balls 603 are arranged on the springs 604, the round balls (603) are clamped in the circular grooves (605), the circular grooves (605) are arranged on the inner side wall of the cavity, the cover 601 drives the round balls 603 to move towards the screen 3, when the round balls 603 are in contact with the cavity, the round balls 603 press the springs 604 against the cover 601 to compress, otherwise, the round balls 603 are reset through the elasticity of the springs 604, and the round balls 603 are clamped in the clamping grooves 605 on the cavity.

The utility model discloses the during operation, make first terminal 401 be connected through the end of a thread 502 on a wire 501 and the positive pole on the testing instrument 1, then second terminal 403 is connected with the negative pole on the testing instrument 1 through the end of a thread 502 on another wire 501, when being hua be the data line, then the big head of data line is connected on the joint 402 on first terminal 401, then the microcephaly is connected on the first interface 404 on second terminal 403, open switch 2, then testing instrument 1 automatic test hua is the resistance of data line, when being ann tall and erect data line, then the big head of data line is connected on the joint 402 on first terminal 401, then the microcephaly is connected on the second interface 405 on second terminal 403, open switch 2, then testing instrument 1 automatic test ann tall and erect the resistance of data line, when being apple data line, then the big head of data line is connected on the joint 402 on first terminal 401, then the microcephaly is connected on the third interface 406 on second terminal 403, open switch 2, then testing instrument 1 automatic test the resistance of data line, its data display is on the screen 3.

Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that various changes, modifications, substitutions and alterations can be made in these embodiments without departing from the principles and spirit of the invention, the scope of which is defined in the appended claims and their equivalents.

Claims

1. The utility model provides a resistance test device for data connecting line, includes test instrument (1), switch (2) and screen (3), its characterized in that: a test assembly (4) is arranged on the test instrument (1); the test assembly (4) comprises a first terminal (401), a connector (402), a second terminal (403), a first interface (404), a second interface (405) and a third interface (406);

the testing device comprises a testing instrument (1), a first binding post (401) and a second binding post (403), wherein the first binding post (401) is respectively installed on the testing instrument (1), a connector (402) is installed on the first binding post (401), a first interface (404), a second interface (405) and a third interface (406) are respectively installed on the second binding post (403), the first interface (404) is an existing Huazhan interface, the second interface (405) is an existing android interface, and the third interface (406) is an existing apple interface;

and a positive electrode and a negative electrode are respectively arranged above the testing instrument (1).

2. The resistance test device for the data link line according to claim 1, wherein: the positive electrode and the negative electrode are connected with a fixing assembly (5), and the fixing assembly (5) comprises a lead (501) and a wire head (502);

a wire head (502) is connected to the lead (501);

the number of the conducting wires (501) and the number of the wire heads (502) are two, one conducting wire (501) is connected to the first binding post (401), the other conducting wire (501) is connected to the second binding post (403), one wire head (502) is connected to the positive pole, and the other wire head (502) is connected to the negative pole.

3. The resistance test device for the data link line according to claim 2, wherein: the fixing component also comprises a U-shaped plate (503) and a clamping groove (504);

the lower part of the U-shaped plate (503) is clamped in a clamping groove (504), and the clamping groove (504) is formed in the test instrument (1);

the number of the U-shaped plates (503) and the number of the clamping grooves (504) are two, and each U-shaped plate (503) wraps one wire (501).

4. The resistance test device for the data link line according to claim 1, wherein: be provided with the die cavity in test instrument (1), screen (3) are installed to the die cavity inboard, protection component (6) are installed in the die cavity outside, protection component (6) include lid (601) and handle (602), lid (601) stretch into the die cavity, install handle (602) on lid (601).

5. The resistance test device for the data connection line according to claim 4, wherein: the protective assembly (6) further comprises a round ball (603), a spring (604) and a circular groove (605), the spring (604) is mounted on the cover (601), the round ball (603) is mounted on the spring (604), the round ball (603) is clamped in the circular groove (605), and the circular groove (605) is formed in the inner side wall of the cavity.

6. The resistance test device for the data link line according to claim 5, wherein: the number of the round balls (603), the number of the springs (604) and the number of the round grooves (605) are four.