CN218298373U

CN218298373U - Circuit system for measuring working current

Info

Publication number: CN218298373U
Application number: CN202222583652.5U
Authority: CN
Inventors: 古振刚
Original assignee: Shanghai Xinpu Technology Co ltd
Current assignee: Shanghai Xinpu Technology Co ltd
Priority date: 2022-09-28
Filing date: 2022-09-28
Publication date: 2023-01-13
Anticipated expiration: 2032-09-28

Abstract

The utility model discloses a circuit system for surveying operating current, including sampling module, switch module, microprocessor and display module, microprocessor includes calculation module, storage module and contrast module, and switch module one end is connected with mains operated circuit and microprocessor, and the other end is connected with surveyed chip or circuit system, and sampling circuit establishes ties with being surveyed chip or circuit system, and the other end inserts microprocessor, and microprocessor's the other end inserts switch circuit.

Description

Circuit system for measuring working current

Technical Field

The utility model relates to an electronic test technical field, concretely relates to circuit system for surveying operating current.

Background

At present, a method of connecting a voltage-stabilizing power supply, a digital multimeter or an ammeter into a circuit in series is adopted no matter in a laboratory or on a production line when working current of a chip or a circuit system is tested, but when certain high-voltage power supplies and large-current power supplies are used, the method is used or equipment with a large measuring range has to be used, the problem of inaccurate measured data caused by interference of measuring equipment also exists, meanwhile, on-off of the power supply cannot be controlled in time, and the equipment is easily damaged.

SUMMERY OF THE UTILITY MODEL

The utility model discloses the technical problem that will solve is: under the condition of large current and high voltage power supply, the purposes of conveniently testing electrical parameters, monitoring and controlling can be achieved by using a simpler and practical circuit.

For solving the technical problem, the utility model provides a circuit system for surveying operating current, including sampling module, switch module, microprocessor and display module, microprocessor includes calculation module, storage module and contrast module, and switch module one end is connected with power supply circuit and microprocessor, and the other end is connected with being surveyed chip or circuit system, and sampling circuit establishes ties with being surveyed chip or circuit system, and the other end inserts microprocessor, and microprocessor's the other end inserts switch circuit.

Preferably: the sampling module is provided with a polar capacitor C1, the anode of the polar capacitor C1 is connected with the input end of the chip or the circuit system to be tested, and the cathode of the polar capacitor C1 is grounded.

Preferably: the sampling module is also provided with a non-polar capacitor C2, one end of the non-polar capacitor C2 is grounded, and the other end of the non-polar capacitor C2 is connected with the polar capacitor C1 and the input end of the chip or the circuit system to be tested.

Preferably: the sampling module is also provided with a polar capacitor C3, the anode of the polar capacitor C3 is connected with the output end of the chip or the circuit system to be tested, and the cathode of the polar capacitor C3 is grounded.

Preferably: the sampling module is also provided with a resistor R4, one end of the resistor R4 is connected with a chip or a circuit system to be tested, and the other end of the resistor R4 is grounded.

Preferably: the power switch module is provided with a PMOS (P-channel metal oxide semiconductor) tube and a resistor R1, the source of the PMOS tube is connected with the power supply circuit and the resistor R1, the drain of the PMOS tube is connected with a chip or a circuit system to be tested, and the grid of the PMOS tube is connected with the resistor R1.

Preferably: the power switch module is also provided with an NMOS tube, a resistor R2 and a resistor R3, the drain electrode of the NMOS tube is connected with the resistor R3 and the ground, the grid electrode of the NMOS tube is connected with the resistor R2, and the source electrode of the NMOS tube is connected with the grid electrode of the PMOS tube.

Preferably, the following components: the microprocessor is provided with an I/O interface connected with the resistor R2 and the resistor R3.

Preferably: the microprocessor is also provided with an ADC module which is connected with a resistor R4 of the sampling module and a chip or a circuit system to be tested.

Preferably: the display module comprises a display screen, the input end of the display module is connected with the output end of the microprocessor, and the output end of the display module is connected with the display screen.

The utility model discloses a technological effect and advantage:

the device circuit does not need to be connected in series for measurement, real-time current and voltage data can be collected, and a power supply is turned off at any time when data are found to be abnormal, so that a chip and a circuit system are protected.

Drawings

Fig. 1 is a schematic structural diagram of a circuit system for measuring an operating current according to an embodiment of the present disclosure;

fig. 2 is a circuit connection diagram of a circuit system for measuring an operating current according to an embodiment of the present application.

Detailed Description

The present invention will be described in further detail with reference to the accompanying drawings and specific embodiments. The embodiments of the present invention have been presented for purposes of illustration and description, and are not intended to be exhaustive or limited to the invention in the form disclosed. Many modifications and variations will be apparent to practitioners skilled in this art. The embodiment was chosen and described in order to best explain the principles of the invention and the practical application, and to enable others of ordinary skill in the art to understand the invention for various embodiments with various modifications as are suited to the particular use contemplated.

As shown in fig. 1-2, in this embodiment, a circuit system for measuring a working current is provided, which includes a sampling module, a power switch module, a microprocessor and a display module, where one end of the power switch module is connected to a power supply circuit and the microprocessor, the other end of the power switch module is connected to a chip or a circuit system to be measured, one end of the sampling circuit is connected to the chip or the circuit system to be measured in series, the other end of the sampling circuit is connected to the microprocessor, and the other end of the microprocessor is connected to the power switch circuit; the sampling module is provided with a capacitor and a resistor and used for filtering and voltage reduction, the parameters of a polar capacitor C1 and a polar capacitor C3 provided in the embodiment are 60uf and used for filtering low-frequency waves, the cathode of the polar capacitor C1 is grounded, the anode is connected with the input end of a chip or a circuit system to be tested, the cathode of the polar capacitor C3 is grounded, and the anode is connected with the output end of the chip or the circuit system to be tested; the other non-polar capacitor C2 has the parameter of 1uf and is used for filtering high-frequency waves, one end of the non-polar capacitor C2 is grounded, the other end of the non-polar capacitor C2 is connected with the polar capacitor C1 and the input end of the chip or the circuit system to be tested, the resistor R4 is a sampling resistor with high accuracy and milliohm resistance and is connected with the grounding end of the chip or the circuit system to be tested, and therefore the working current of the chip or the circuit system to be tested is detected under the condition that the influence on the system to be tested can be ignored;

the power switch module is provided with an MOS switch circuit with very stable switching performance, and comprises a PMOS (P-channel metal oxide semiconductor) tube, an NMOS (N-channel metal oxide semiconductor) tube, a resistor R1, a resistor R2 and a resistor R3; the source electrode of the PMOS tube is connected with a power supply circuit and a resistor R1, the drain electrode of the PMOS tube is connected with a chip or a circuit system to be tested, the grid electrode of the PMOS tube is connected with the drain electrode of the NMOS tube and the resistor R1, the source electrode of the NMOS tube is connected with a resistor R3 and the ground, and the grid electrode of the NMOS tube is connected with a resistor R2; the PMOS tube is conducted with the grid at low level and disconnected with the high level for controlling the conduction with the power supply, and the NMOS tube is conducted with the grid at high level and disconnected with the low level for controlling the conduction with the ground.

The microprocessor comprises an I/O interface, an ADC module, a calculation module, a storage module and a comparison module, wherein the I/O interface is connected with the resistor R2 and the resistor R3; the ADC module is connected with a resistor R4 of the sampling module and a chip or a circuit system to be tested and is used for converting an analog voltage signal obtained by sampling into a digital voltage signal; the calculating module is used for calculating a current value according to the voltage value; the storage module is used for storing a preset theoretical current value range, an obtained voltage value and a calculated current value, wherein the preset theoretical current value is set in advance according to the range of working current of a chip or a circuit system to be tested under normal work; the comparison module is used for comparing the calculated current value with a preset theoretical current value range and obtaining the working state of the tested chip or circuit system.

The display module comprises a display screen, the input end of the display module is connected with the output end of the microprocessor, and the output end of the display module is connected with the display screen.

The specific working process is as follows:

when the power supply circuit starts to work, a positive voltage is applied to the chip or the circuit system to be tested through the PMOS tube of the power switch module, and the working current of the chip or the circuit system to be tested returns to the negative electrode of the power supply circuit through the sampling module and the microprocessor, so that a closed working current loop is formed; in the process, a polar capacitor C1 and a polar capacitor C3 of the sampling circuit filter low-frequency waves, and a non-polar capacitor C2 filters high-frequency waves;

the sampling module transmits the acquired analog voltage signal to an ADC module of the microprocessor; the ADC module converts the sampled analog voltage signal into a digital voltage signal and transmits the digital voltage signal to the calculation module; the calculation module calculates a current value according to the acquired voltage value; the storage module stores the voltage value and the current value; meanwhile, the comparison module compares the calculated current value with a preset theoretical current value range and obtains the working state of the chip or the circuit system to be tested, the abnormal working is performed under the condition that the calculated current value is not within the preset theoretical current value range, and the normal working is performed under the condition that the calculated current value is within the preset theoretical current value range, and the comparison module sends the working state of the chip or the circuit system to be tested to the storage module and the display module; the storage module stores the working state of the chip or the circuit system to be tested, and the display module is used for displaying the voltage value and the current value on the display screen so as to be convenient for observing data; meanwhile, the NMOS is conducted at a high grid level, the NMOS is disconnected at a low grid level, the PMOS is conducted at a low grid level, and the PMOS is disconnected at a high grid level, so that power supply can be quickly disconnected under abnormal conditions, and the function of protecting a chip or a circuit system to be tested is achieved.

It is obvious that the described embodiments are only some of the embodiments of the present invention, and not all of them. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art and related fields without creative efforts shall fall within the protection scope of the present invention. Structures, devices and methods of operation not specifically described or illustrated in the present application are not specifically illustrated or described, but are generally practiced in the art without limitation.

Claims

1. The utility model provides a circuit system for surveying operating current, includes sampling module, switch module, microprocessor and display module, and microprocessor includes calculation module, storage module and contrast module, its characterized in that, switch module one end is connected with power supply circuit and microprocessor, and the other end is connected with chip or circuit system under test, and sampling circuit establishes ties with chip or circuit system under test, and microprocessor is inserted to the other end, and microprocessor's the other end inserts switch circuit.

2. The circuit system for measuring the operating current according to claim 1, wherein the sampling module is provided with a polar capacitor C1, the positive electrode of the polar capacitor C1 is connected to the input end of the chip or the circuit system to be measured, and the negative electrode of the polar capacitor C1 is grounded.

3. The circuit system for measuring operating current according to claim 2, wherein the sampling module further comprises a non-polar capacitor C2, one end of the non-polar capacitor C2 is grounded, and the other end of the non-polar capacitor C2 is connected to the polar capacitor C1 and the input end of the chip or the circuit system to be measured.

4. The circuit system for measuring operating current according to claim 3, wherein the sampling module is further provided with a polar capacitor C3, the positive electrode of the polar capacitor C3 is connected to the output end of the chip or the circuit system to be measured, and the negative electrode of the polar capacitor C3 is grounded.

5. The circuit system for measuring the operating current according to claim 4, wherein the sampling module is further provided with a resistor R4, one end of the resistor R4 is connected with the chip or the circuit system to be measured, and the other end is grounded.

6. The circuit system for measuring the operating current according to claim 1, wherein the power switch module is provided with a PMOS transistor and a resistor R1, a source of the PMOS transistor is connected with the power supply circuit and the resistor R1, a drain of the PMOS transistor is connected with the chip or the circuit system to be measured, and a gate of the PMOS transistor is connected with the resistor R1.

7. The circuit system for measuring the operating current according to claim 6, wherein the power switch module is further provided with an NMOS transistor, a resistor R2 and a resistor R3, a drain electrode of the NMOS transistor is connected with the resistor R3 and the ground, a gate electrode of the NMOS transistor is connected with the resistor R2, and a source electrode of the NMOS transistor is connected with a gate electrode of the PMOS transistor.

8. The circuit system for measuring an operating current according to claim 1, wherein the microprocessor is provided with an I/O interface connected to the resistor R2 and the resistor R3.

9. The circuit system for measuring the operating current according to claim 8, wherein the microprocessor is further provided with an ADC module connected with the resistor R4 of the sampling module and the chip or the circuit system to be measured.

10. The circuit system according to claim 1, wherein the display module comprises a display screen, an input terminal of the display module is connected to an output terminal of the microprocessor, and an output terminal of the display module is connected to the display screen.