CN218240313U - Flash memory chip high efficiency test board - Google Patents
Flash memory chip high efficiency test board Download PDFInfo
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- CN218240313U CN218240313U CN202222435821.0U CN202222435821U CN218240313U CN 218240313 U CN218240313 U CN 218240313U CN 202222435821 U CN202222435821 U CN 202222435821U CN 218240313 U CN218240313 U CN 218240313U
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- memory chip
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- 238000012360 testing method Methods 0.000 title claims abstract description 117
- 239000000758 substrate Substances 0.000 claims abstract description 12
- 230000007246 mechanism Effects 0.000 claims abstract description 11
- 238000009434 installation Methods 0.000 claims description 16
- 238000005452 bending Methods 0.000 claims description 9
- 230000008878 coupling Effects 0.000 claims description 6
- 238000010168 coupling process Methods 0.000 claims description 6
- 238000005859 coupling reaction Methods 0.000 claims description 6
- 239000011324 bead Substances 0.000 claims 1
- 238000004519 manufacturing process Methods 0.000 abstract description 7
- 238000013522 software testing Methods 0.000 abstract description 5
- 230000005611 electricity Effects 0.000 abstract 1
- 238000003780 insertion Methods 0.000 description 14
- 230000037431 insertion Effects 0.000 description 14
- 238000000034 method Methods 0.000 description 3
- 239000012634 fragment Substances 0.000 description 2
- 230000008569 process Effects 0.000 description 2
- 230000009467 reduction Effects 0.000 description 2
- 238000003466 welding Methods 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000006870 function Effects 0.000 description 1
- 238000011990 functional testing Methods 0.000 description 1
- 238000012797 qualification Methods 0.000 description 1
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Abstract
The utility model discloses a high-efficient survey test panel of flash memory chip, which comprises a substrate, be equipped with the chip mounting position on the base plate, the electricity is connected with the test base on the chip mounting position, the up end of test base is equipped with the pin mounting groove with the pin one-to-one of flash memory chip, the side of test base is equipped with jumper connection mechanism, jumper connection mechanism is including setting firmly the connecting rod on the test base side, it has cup jointed a plurality of pin connecting blocks to rotate on the connecting rod, the pin one-to-one joint cooperation of test base on pin connecting block and the chip mounting position, electric connection between connecting block and the connecting rod, the utility model discloses the high-efficient survey test panel of flash memory chip, through the swift grafting test of accomplishing the flash memory chip of same model or different models of test base can be swift, through jumper connection mechanism's cooperation, can be swift accomplish the jumper test of flash memory chip to further improve efficiency of software testing, make the test more nimble simultaneously, improved the production reliability and the production efficiency of flash memory chip.
Description
Technical Field
The utility model relates to a chip test technical field specifically is a flash memory chip high efficiency test panel.
Background
In the production of flash memory chip, the flash memory chip makes the back, need carry out the qualification test in order to guarantee the yields of dispatching from the factory, in the test of current flash memory chip, need pass through paster welded mode, with flash memory chip welding in order to carry out functional test on the chip mounting position on the base plate, after flash memory chip paster welding on the chip mounting position, because the pin welded fastening of flash memory chip, the wire jumper test of its pin is inconvenient, and because chip mounting position pin is fixed, lead to the installation function of chip mounting position comparatively single, can not adapt to the test of the flash memory chip of multiple specification and use.
Therefore, in order to improve the efficiency of the flash memory chip in the testing process, the jumper test of the flash memory chip needs to be simplified, and meanwhile, the universality of the chip mounting position needs to be considered, so that the testing of the flash memory chip is more efficient and practical.
SUMMERY OF THE UTILITY MODEL
The utility model discloses an it is not enough to overcome above-mentioned condition, aims at providing the technical scheme that can solve above-mentioned problem.
In order to achieve the above object, the utility model provides a following technical scheme:
a high-efficiency test board for flash memory chips comprises a substrate, wherein a chip mounting position is arranged on the substrate, a test base is electrically connected to the chip mounting position, pin mounting grooves which are in one-to-one correspondence with pins of flash memory chips are formed in the upper end surface of the test base, two rows of the pin mounting grooves are arranged in parallel along the length direction of the test base, a plurality of the pin mounting grooves are uniformly arranged along the length direction of the test base, pin insertion pieces which are in insertion fit with the pins of the flash memory chips are arranged in the pin mounting grooves, and the pin insertion pieces are in one-to-one correspondence electrical connection fit with the pins of the test base on the chip mounting position;
the side of test base is equipped with wire jumper coupling mechanism, and wire jumper coupling mechanism rotates on the connecting rod including setting firmly the connecting rod on the test base side and has cup jointed a plurality of pin connecting blocks on the connecting rod, and the pin one-to-one joint cooperation of test base on pin connecting block and the chip mounting position, electric connection between connecting block and the connecting rod.
As a further aspect of the present invention: the side of test base is equipped with the guide way, is equipped with on the test base and supports tight piece, supports to be equipped with the sliding tray on the tight piece, and the test base cup joints the cooperation in the sliding tray, and the side sliding connection of sliding tray is in the guide way, and the interior bottom surface of sliding tray is equipped with the mounting groove, is equipped with the ripples pearl screw in the mounting groove.
As a further aspect of the utility model: set up on the pin connecting block with the pin joint complex pin joint groove of test base, set firmly the joint shell fragment on the inner wall in pin joint groove.
As a further aspect of the present invention: the pin insertion pieces are correspondingly arranged in the pin installation grooves, the end parts of the pin insertion pieces are provided with elastic bending parts, and the elastic bending parts on the paired pin insertion pieces are in insertion fit with pins of the flash memory chip.
As a further aspect of the utility model: an installation space for installing the flash memory chip is reserved between the inner bottom surface of the sliding groove and the upper end surface of the test base.
As a further aspect of the present invention: and two ends of the test base are respectively provided with a limiting block for stopping the abutting block.
As a further aspect of the present invention: a rotating space is reserved between the side wall of the abutting block and the pin connecting block.
Compared with the prior art, the beneficial effects of the utility model are as follows:
the utility model discloses flash memory chip high efficiency is surveyed test panel, through the swift grafting test of the flash memory chip of completion same model or different models that the test base can be swift, for pin welded mode among the prior art the utility model discloses flash memory chip high efficiency is surveyed test panel efficiency of software testing is higher, through jumper connection mechanism's cooperation, can be swift completion flash memory chip's jumper test to further improve efficiency of software testing, make the test more nimble simultaneously, improved flash memory chip's production reliability and production efficiency, also effectual reduction simultaneously is because of the output of the problem base plate that flash memory chip's quality problem leads to.
Drawings
Fig. 1 is a perspective view of the present invention mounted on a base plate;
FIG. 2 is a perspective view of the present invention;
fig. 3 is a right side view of the present invention;
fig. 4 is a schematic structural view of the pin engaging groove of the present invention;
fig. 5 is a schematic structural view of the pin mounting groove of the present invention;
the reference numerals and names in the figures are as follows:
the test device comprises a substrate-1, a chip mounting position-2, a test base-3, a pin mounting groove-31, a pin plug-in sheet-311, a jumper wire connecting mechanism-32, a connecting rod-321, a pin connecting block-322, a guide groove-33, a propping block-34, a sliding groove-341, a ball screw-342, a pin clamping groove-323, a clamping elastic sheet-324, an elastic bending part-312, a mounting space-4, a limiting block-5 and a rotating space-6.
Detailed Description
The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.
Referring to fig. 1-5, a flash memory chip high-efficiency test board comprises a substrate 1, a chip mounting position 2 is arranged on the substrate 1, the chip mounting position 2 is electrically connected with a test base 3, pin mounting grooves 31 corresponding to pins of a flash memory chip one by one are arranged on the upper end surface of the test base 3, two rows of the pin mounting grooves 31 are arranged in parallel along the length direction of the test base 3, a plurality of the pin mounting grooves 31 are uniformly arranged along the length direction of the test base 3, pin insertion pieces 311 matched with the pins of the flash memory chip in an insertion manner are arranged in the pin mounting grooves 31, and the pin insertion pieces 311 are in one-to-one corresponding electrical connection with the pins of the test base 3 on the chip mounting position 2;
the side of test base 3 is equipped with wire jumper coupling mechanism 32, and wire jumper coupling mechanism 32 rotates on connecting rod 321 including setting firmly connecting rod 321 on the side of test base 3 and having cup jointed a plurality of pin connecting blocks 322 on the connecting rod 321, and pin connecting block 322 cooperates with the pin one-to-one joint of test base 3 on the chip mounting position 2, electric connection between connecting block and the connecting rod 321.
During the test operation of the flash memory chip, the flash memory chip is inserted and installed on the test base 3, so that pins of the flash memory chip are electrically connected and matched with the pin inserting pieces 311, the pin inserting pieces 311 are electrically connected and matched with pins of the test base 3 on the chip installation position 2 in a one-to-one correspondence manner, the pins of the flash memory chip are electrically connected with the installation hole positions on the chip installation position 2 in a corresponding manner, and the flash memory chip is electrically connected and matched with the substrate 1;
after the flash memory chip is electrically connected with the substrate 1, chip testing can be carried out, when jumper testing is required, the pin connecting block 322 is clamped on the pins of the testing base 3 on the chip mounting position 2 by rotating the pin connecting block 322, the pin connecting block 322 is electrically connected with the pins of the testing base 3, the connecting block is electrically connected with the connecting rod 321, different pins on the testing base 3 are short-circuited by replacing different pin connecting blocks 322 and pins of the testing base 3, jumper operation is finished, and after the test is finished, the flash memory chip is pulled down to carry out the plug-in test of the next flash memory chip;
in the test of chips of the same model, the specified pin connecting block 322 is continuously clamped and matched with the pins of the test base 3, so that the batch jumper test operation of the chips can be quickly carried out;
in the test of chips with different models, the pins of the test base 3 are correspondingly installed with the chip installation positions 2 by replacing different test bases 3, the pin installation grooves 31 on the test bases 3 are in one-to-one correspondence with the pins of the flash memory chips, so that the switching between the flash memory chips and the chip installation positions 2 is completed, the test of chips with different models in different batches can be completed by replacing different test bases 3, and the cost is saved;
the utility model discloses flash memory chip high efficiency surveys test panel, through the swift grafting test of the flash memory chip of the same model of completion that test base 3 can be swift or different models, for pin welded mode among the prior art the utility model discloses flash memory chip high efficiency surveys test panel efficiency of software testing higher, through jumper connection mechanism 32's cooperation, can be swift accomplish the jumper test of flash memory chip to further improve efficiency of software testing, make the test more nimble simultaneously, improved flash memory chip's production reliability and production efficiency, also effectual reduction simultaneously is because of the output of the problem base plate 1 that flash memory chip's quality problem leads to.
The embodiment of the utility model provides an in, the side of test base 3 is equipped with guide way 33, is equipped with on the test base 3 and supports tight piece 34, supports to be equipped with the sliding tray 341 on the tight piece 34, and test base 3 cup joints the cooperation in sliding tray 341, and the side sliding connection of sliding tray 341 is in guide way 33, and the interior bottom surface of sliding tray 341 is equipped with the mounting groove, is equipped with ripples pearl screw 342 in the mounting groove.
Through setting up the butt piece, during the installation flash memory chip, slide certain one end of test base 3 with the butt piece, peg graft the flash memory chip back on test base 3, with butt piece sliding fit in guide way 33, make the better butt cooperation of ripples pearl screw 342 and flash memory chip, make the better installation of flash memory chip fixed on test base 3.
In the embodiment of the present invention, the pin connecting block 322 is provided with a pin engaging groove 323 engaged with the pin of the test base 3, and the inner wall of the pin engaging groove 323 is fixedly provided with an engaging elastic sheet 324;
through setting up joint shell fragment 324, make pin connecting block 322 and the better joint cooperation of test base 3's pin, make the two joint be convenient for pull out when firm, when making pulling out of pin connecting block 322 insert stability better, efficiency is higher.
In the embodiment of the present invention, the pin insertion sheet 311 is correspondingly disposed in the pin installation slot 31, the end of the pin insertion sheet 311 is provided with an elastic bending portion 312, and the elastic bending portion 312 on the paired pin insertion sheets 311 is in insertion fit with the pins of the flash memory chip;
the pin inserting sheet 311 is correspondingly arranged, and the elastic bending part 312 is arranged at the end part of the pin inserting sheet 311, so that the pins of the flash memory chip are inserted and matched between the elastic bending parts 312, the stability of the flash memory chip on the test base 3 is improved, and meanwhile, the flash memory chip is convenient to rapidly insert and remove.
In the embodiment of the present invention, an installation space 4 for installing a flash memory chip is reserved between the inner bottom surface of the sliding groove 341 and the upper end surface of the test base 3;
the installation of the flash memory chip of being convenient for avoids between supporting tight piece 34 and the test base 3 too closely, leads to the flash memory chip to take place the damage in supporting tight cooperation in-process of supporting tight piece 34.
In the embodiment of the present invention, two ends of the testing base 3 are respectively provided with a limiting block 5 for stopping the abutting block 34;
the abutting block 34 is prevented from being separated from the guide groove 33 in the process of sliding in the guide groove 33;
in one embodiment, the width of the limiting block 5 is larger than the width of the test base 3, and the height of the limiting block is lower than the height of the test base 3, so that the flash memory chip can be conveniently inserted into the test base 3.
In the embodiment of the present invention, a rotation space 6 is reserved between the sidewall of the abutting block and the pin connecting block 322;
avoiding interference between the pin connection block 322 and the side walls of the abutment block during rotation.
It is obvious to a person skilled in the art that the invention is not restricted to details of the above-described exemplary embodiments, but that it can be implemented in other specific forms without departing from the spirit or essential characteristics of the invention. The present embodiments are therefore to be considered in all respects as illustrative and not restrictive, the scope of the invention being indicated by the appended claims rather than by the foregoing description, and all changes which come within the meaning and range of equivalency of the claims are therefore intended to be embraced therein. Any reference sign in a claim should not be construed as limiting the claim concerned.
Claims (7)
1. A flash memory chip high-efficiency test board comprises a substrate (1) and is characterized in that a chip mounting position (2) is arranged on the substrate (1), the chip mounting position (2) is electrically connected with a test base (3), the upper end face of the test base (3) is provided with pin mounting grooves (31) which are in one-to-one correspondence with pins of a flash memory chip, the pin mounting grooves (31) are arranged in two rows in parallel along the length direction of the test base (3), the pin mounting grooves (31) are uniformly provided with a plurality of pin inserting pieces (311) which are inserted and matched with the pins of the flash memory chip, and the pin inserting pieces (311) are electrically connected and matched with the pins of the test base (3) on the chip mounting position (2) in one-to-one correspondence;
the side of test base (3) is equipped with wire jumper coupling mechanism (32), and wire jumper coupling mechanism (32) is including setting firmly connecting rod (321) on test base (3) side, and a plurality of pin connecting blocks (322) have been cup jointed in rotation on connecting rod (321), and the pin one-to-one joint cooperation of test base (3) on pin connecting block (322) and chip mounting position (2), electric connection between connecting block and connecting rod (321).
2. The testing board for testing flash memory chips according to claim 1, wherein the testing substrate (3) has a guiding groove (33) on the side, the testing substrate (3) has a pressing block (34), the pressing block (34) has a sliding groove (341), the testing substrate (3) fits inside the sliding groove (341) in a sliding manner, the side of the sliding groove (341) is slidably connected inside the guiding groove (33), the sliding groove (341) has an installation groove on the inner bottom surface, and the installation groove has a bead screw (342).
3. The test board as claimed in claim 2, wherein the pin connection block (322) has a pin engaging groove (323) engaged with the pins of the test base (3), and the inner wall of the pin engaging groove (323) has an engaging spring (324).
4. The flash memory chip high efficiency test board according to claim 3, wherein the pin-in-socket pads (311) are correspondingly disposed in the pin-in-socket slots (31), the ends of the pin-in-socket pads (311) are provided with elastic bending portions (312), and the elastic bending portions (312) of the paired pin-in-socket pads (311) are in plugging fit with the pins of the flash memory chip.
5. The flash memory chip high efficiency test board according to claim 4, wherein a mounting space (4) for mounting the flash memory chip is reserved between the inner bottom surface of the sliding groove (341) and the upper end surface of the test base (3).
6. The testing board for testing the flash memory chips according to any of the claims 1-5, wherein the two ends of the testing base (3) are respectively provided with a stopper (5) for stopping the abutting block (34).
7. The flash memory chip high efficiency test board according to any one of claims 2-5, wherein a rotation space (6) is reserved between the sidewall of the abutting block and the pin connection block (322).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202222435821.0U CN218240313U (en) | 2022-09-14 | 2022-09-14 | Flash memory chip high efficiency test board |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202222435821.0U CN218240313U (en) | 2022-09-14 | 2022-09-14 | Flash memory chip high efficiency test board |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN218240313U true CN218240313U (en) | 2023-01-06 |
Family
ID=84663628
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202222435821.0U Active CN218240313U (en) | 2022-09-14 | 2022-09-14 | Flash memory chip high efficiency test board |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN218240313U (en) |
-
2022
- 2022-09-14 CN CN202222435821.0U patent/CN218240313U/en active Active
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CP03 | Change of name, title or address |
Address after: Room 501, Building 4, No. 3 Yongtai Road, Tangxia Town, Dongguan City, Guangdong Province, 523000 Patentee after: Huiju Storage Technology (Dongguan) Co.,Ltd. Country or region after: China Address before: 523000 Building 1, No. 7, Keyuan fifth road, Tangxia Town, Dongguan City, Guangdong Province Patentee before: Huiju Electric Technology (Dongguan) Industrial Co.,Ltd. Country or region before: China |
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| CP03 | Change of name, title or address |