CN218099272U

CN218099272U - Chip testing device for preventing deviation

Info

Publication number: CN218099272U
Application number: CN202221733425.XU
Authority: CN
Inventors: 胥怡心; 刘涛; 郭旭斌; 周霞
Original assignee: Suzhou Saimai Measurement And Control Technology Co ltd
Current assignee: Suzhou Saimai Measurement And Control Technology Co ltd
Priority date: 2022-07-07
Filing date: 2022-07-07
Publication date: 2022-12-20
Anticipated expiration: 2032-07-07

Abstract

The utility model discloses a prevent chip testing arrangement of skew, include: the device comprises an operating platform, an adjusting rod, a second rubber anti-skid pad and a fixing frame, wherein a tester is arranged on the rear side of the operating platform; the adjusting rod is rotatably connected below the operating platform, and a clamping mechanism is arranged on the outer side of the adjusting rod and comprises a supporting plate, a clamping plate, a first rubber anti-skid pad and a connecting block; the second rubber anti-skid pads are symmetrically adhered and connected above the operating platform; the fixed frame is fixed on the rear side above the operating platform, and a blanking mechanism is arranged inside the fixed frame and comprises a connecting rope, a blanking push block and a handheld connecting rod. Spring ropes are installed on the left side and the right side of the tester. This prevent chip testing arrangement of skew can detect a plurality of chips, can carry out the centre gripping to the chip, avoids the crooked skew of chip to influence work efficiency, and conveniently adjusts and operate, can carry out spacing the accomodating to the test pen, can retrieve the chip fast.

Description

Chip testing device for preventing deviation

Technical Field

The utility model relates to a chip testing technical field specifically is a prevent chip testing arrangement of skew.

Background

The chip is a vital part in an electronic product, a microelectronic component is usually electrically welded on a plastic substrate to form an integrated circuit, the chip needs to be tested in order to ensure the normal use of the chip, and chip testing devices on the market are various but still have some defects;

if inconvenient to a plurality of chips detect, the chip skew easily influences work efficiency during the detection, and is inconvenient to carry out spacing the accomodating to the test pen, consequently, we provide a chip testing arrangement who prevents the skew to in solving the problem that proposes in the aforesaid.

SUMMERY OF THE UTILITY MODEL

An object of the utility model is to provide a prevent chip testing arrangement of skew to solve the inconvenient a plurality of chips of present chip testing arrangement that above-mentioned background art provided, the skew easily of chip influences work efficiency during the detection, and inconvenient carries out spacing problem of accomodating to the test pen.

In order to achieve the above purpose, the utility model provides a following technical scheme: an offset prevention chip test apparatus, comprising:

the rear side of the operation table is provided with a tester;

the adjusting rod is rotatably connected below the operating platform, and a clamping mechanism is arranged on the outer side of the adjusting rod and comprises a supporting plate, a clamping plate, a first rubber anti-skid pad and a connecting block;

the second rubber anti-slip mat is symmetrically adhered and connected above the operating platform;

the fixed frame is fixed on the rear side above the operating platform, and a blanking mechanism is arranged inside the fixed frame and comprises a connecting rope, a blanking push block and a handheld connecting rod.

Preferably, the left side and the right side of the tester are both provided with spring ropes, and the front ends of the spring ropes are provided with test pens;

the outside draw-in groove of test pen is connected with the stopper of fixing on the operation panel.

Preferably, the adjusting rod is arranged below the operating platform in a front-back symmetrical mode, the left and right symmetrical outer sides of the adjusting rod are in threaded connection with connecting blocks, and the thread directions of the left end and the right end of the adjusting rod are opposite.

Preferably, the connecting block clamping groove is connected in the operating platform, a supporting plate is welded above the connecting block, a clamping plate is fixed on the inner side of the supporting plate, and a first rubber anti-slip pad is connected to the inner side of the clamping plate in a sticking mode.

Preferably, the winding rollers are symmetrically arranged in the fixed frame from left to right, and are rotatably connected in the fixed frame through return springs;

the outside winding of winding roller has the connection rope, and connects the outer end of rope and be fixed with the unloading ejector pad to the top integration of unloading ejector pad is provided with the handheld connecting rod that the longitudinal section is "n" font structure.

Compared with the prior art, the beneficial effects of the utility model are that: the chip testing device capable of preventing deviation can detect a plurality of chips, can clamp the chips, avoids the influence of the skew deviation of the chips on the working efficiency, is convenient to adjust and operate, can carry out limiting storage on a testing pen, and can quickly recover the chips;

1. the clamping device is provided with a supporting plate, a first rubber anti-slip pad and a second rubber anti-slip pad, a clamping plate is fixed on the inner side of the supporting plate, the supporting plate is arranged in bilateral symmetry, a plurality of chips can be detected and clamped, the second rubber anti-slip pad is fixed on the operating platform in bilateral symmetry, and the influence of the skew and offset of the chips on the working efficiency is avoided;

2. the test pen is provided with a connecting block, an adjusting rod and a limiting block, the connecting block is in threaded connection with the adjusting rod, the thread directions of the outer sides of the adjusting rod are opposite, and the test pen is connected with a limiting block clamping groove, so that the test pen can be conveniently adjusted and operated to be limited and stored;

3. be provided with unloading ejector pad, handheld connecting rod and, rotate through reset spring in the fixed frame and be connected with the winding roller, the winding roller outside winding has the connection rope, connects the welding on the fixed unloading ejector pad in rope outer end and has handheld connecting rod, can retrieve the chip fast.

Drawings

FIG. 1 is a schematic top view of the present invention;

FIG. 2 is a schematic view of the connection structure of the connection block and the adjustment rod of the present invention;

FIG. 3 is a schematic view of the connection structure of the fixing frame and the connecting rope of the present invention;

fig. 4 is the utility model discloses the winding roller is connected overall structure sketch map with the connection rope.

In the figure: 1. an operation table; 2. a tester; 3. a spring cord; 4. a test pen; 5. a limiting block; 6. a support plate; 7. a clamping plate; 8. a first rubber non-slip mat; 9. connecting blocks; 10. adjusting a rod; 11. a second rubber anti-skid pad; 12. a fixing frame; 13. a winding roller; 14. a return spring; 15. connecting ropes; 16. blanking push blocks; 17. a hand-held connecting rod.

Detailed Description

The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.

Referring to fig. 1-4, the present invention provides a technical solution: an offset prevention chip test apparatus, comprising: the device comprises an operating table 1, a tester 2, a spring rope 3, a test pen 4, a limiting block 5, a supporting plate 6, a clamping plate 7, a first rubber anti-skid pad 8, a connecting block 9, an adjusting rod 10, a second rubber anti-skid pad 11, a fixing frame 12, a winding roller 13, a return spring 14, a connecting rope 15, a blanking push block 16 and a handheld connecting rod 17;

firstly, as shown in the attached drawing 1, chips are arranged on a second rubber anti-skid pad 11 one by one, then an adjusting rod 10 is rotated below an operating platform 1, the adjusting rod 10 drives a connecting block 9 in threaded connection with the outer side of the adjusting rod to slide, the connecting block 9 is connected with a clamping groove of the operating platform 1 and can play a limiting role on the connecting block, the connecting block 9 slides in the operating platform 1 and drives a supporting plate 6 fixed above the connecting block to slide, because the thread directions of the left end and the right end of the adjusting rod 10 are opposite, the supporting plates 6 symmetrically arranged on the left side and the right side can move in opposite or opposite directions, the supporting plate 6 drives a clamping plate 7 fixed on the inner side of the supporting plate to move, the inner side of the clamping plate 7 is pasted and connected with a first rubber anti-skid pad 8, the first rubber anti-skid pad 8 is tightly attached to the outer side of the chips, and the supporting plates 6 symmetrically arranged on the left side and the right side can clamp the chips;

as shown in the attached drawing 1, the test pen 4 is pulled upwards, the test pen 4 is taken out from the limiting block 5 connected with the clamping groove of the test pen 4, the test pen 4 is held by two hands, the probe of the test pen 4 is tightly attached to the chip, the upper end of the test pen 4 is fixedly provided with the spring rope 3, the rear end of the spring rope 3 is fixedly arranged on the tester 2, the test pen 4 can be prevented from being lost, the tester 2 displays a detection result, and the tester 2 and the test pen 4 are mature technologies in the market;

as shown in fig. 1, fig. 3 and fig. 4, when the chips need to be recovered, the reverse rotation adjusting rod 10, the connecting block 9 slides to the outside, the supporting plate 6 fixed above the connecting block 9 drives the clamping plate 7 to slide, so that the clamping plate 7 loosens the chips, the first rubber anti-slip pad 8 is separated from the tight fit with the clamping plate 7, then the handheld connecting rod 17 is pulled outwards, the blanking push block 16 fixed below the handheld connecting rod 17 pushes the chips, so that the chips slide on the second rubber anti-slip pad 11, the chips are conveniently concentrated, the connecting rope 15 fixed at the rear side of the blanking push block 16 is pulled out, the connecting rope 15 pulls the winding roller 13 to rotate in the fixed frame 12, the reset spring 14 is compressed, after the chips are collected, the handheld connecting rod 17 is loosened, the elastic action of the reset spring 14 pushes the winding roller 13 to reverse, the connecting rope 15 is wound outside the winding roller 13, and the blanking push block 16 and the handheld connecting rod 17 can be rapidly stored.

The content that does not describe in detail in this specification belongs to the prior art that the professional technical staff of this field is known, the standard part that the utility model used all can purchase from the market, dysmorphism piece can be customized according to the record of description and attached drawing, the concrete connected mode of each part all adopts conventional means such as mature bolt, rivet, welding among the prior art, machinery, part and equipment all adopt among the prior art, conventional model, and circuit connection adopts the conventional connected mode among the prior art, and will not detailed here again.

Although the present invention has been described in detail with reference to the foregoing embodiments, it will be apparent to those skilled in the art that modifications may be made to the embodiments or portions thereof without departing from the spirit and scope of the invention.

Claims

1. An apparatus for testing a chip against displacement, comprising:

the test system comprises an operation table (1), wherein a tester (2) is installed on the rear side of the operation table (1);

the adjusting rod (10) is rotatably connected below the operating platform (1), and a clamping mechanism is arranged on the outer side of the adjusting rod (10) and comprises a supporting plate (6), a clamping plate (7), a first rubber anti-skid pad (8) and a connecting block (9);

the second rubber anti-skid pads (11) are symmetrically adhered and connected above the operating platform (1) from left to right;

the blanking device comprises a fixed frame (12), wherein the fixed frame (12) is fixed on the rear side of the upper part of an operating platform (1), and a blanking mechanism is arranged inside the fixed frame (12) and comprises a connecting rope (15), a blanking push block (16) and a handheld connecting rod (17).

2. The chip testing device for preventing the shift according to claim 1, wherein: the left side and the right side of the tester (2) are both provided with spring ropes (3), and the front ends of the spring ropes (3) are provided with test pens (4);

the outside draw-in groove of test pen (4) is connected with stopper (5) of fixing on operation panel (1).

3. The chip testing device for preventing the shift according to claim 1, wherein: the adjusting rod (10) is arranged below the operating platform (1) in a front-back symmetrical mode, connecting blocks (9) are in threaded connection in a left-right symmetrical mode on the outer side of the adjusting rod (10), and the thread directions of the left end and the right end of the adjusting rod (10) are opposite.

4. The chip testing device for preventing the shift according to claim 3, wherein: the connecting block (9) clamping groove is connected in the operating table (1), the supporting plate (6) is welded above the connecting block (9), the clamping plate (7) is fixed on the inner side of the supporting plate (6), and the first rubber anti-slip pad (8) is connected to the inner side of the clamping plate (7) in a sticking mode.

5. The chip testing device for preventing the shift according to claim 1, wherein: the winding rollers (13) are symmetrically arranged in the left and right of the inner part of the fixed frame (12), and the winding rollers (13) are rotatably connected in the fixed frame (12) through return springs (14);

the outer side of the winding roller (13) is wound with a connecting rope (15), the outer end of the connecting rope (15) is fixed with a blanking push block (16), and a handheld connecting rod (17) with an n-shaped longitudinal section is integrally arranged above the blanking push block (16).