CN217982410U

CN217982410U - Control circuit, layout structure and flip chip

Info

Publication number: CN217982410U
Application number: CN202222171195.9U
Authority: CN
Inventors: 贾健豪; 李业; 李松
Original assignee: Origin Quantum Computing Technology Co Ltd
Current assignee: Origin Quantum Computing Technology Co Ltd
Priority date: 2022-08-17
Filing date: 2022-08-17
Publication date: 2022-12-06
Anticipated expiration: 2032-08-17

Abstract

The application discloses control line, domain structure and flip chip belongs to quantum chip and observes and controls the field. The control circuit includes a flux control line having a plurality of coupling sections; the flux control line is configured in a non-interrupted manner such that the plurality of coupling portions are conductive to each other. The plurality of coupling portions are configured to couple in a one-to-one correspondence equal to a number of qubits in a subset of bits, and the subset of bits is defined by a portion of the plurality of qubits and has at least two qubits. The control circuit can construct the magnetic flux control lines of a plurality of qubits in a lumped circuit mode, so that the chip test structure is simplified, and the test efficiency is improved.

Description

Control circuit, layout structure and flip chip

Technical Field

The application belongs to the field of quantum chip measurement and control, and particularly relates to a control circuit, a layout structure and a flip chip.

Background

During performance testing of superconducting qubits, it is necessary to inject control signals over the XY control line to excite bit transitions and the Z control line to control the frequency of the bit.

Based on the requirement of superconducting environment, the testing environment of superconducting qubits is provided by a dilution refrigerator. And the ambient temperature needs to be lowered to millikelvin (mK) levels to fully superconduct the lines on the chip and induce the josephson effect to test the performance of each bit.

In practice, the number of rf signal lines that can be introduced in the dilution refrigerator is limited. Therefore, each time a qubit is tested, certain testing resources are occupied. When the number of samples to be tested is large, the test cannot be performed orderly and normally under the condition of limited refrigeration resources, thereby causing the development cycle to be greatly increased.

SUMMERY OF THE UTILITY MODEL

In view of the above, the present application discloses a control circuit, a layout structure and a flip chip. The scheme can be used for carrying out performance test on the quantum bit in the quantum chip under the condition of less line access requirements.

The scheme exemplified in the present application is implemented as follows.

In a first aspect, examples of the present application propose a control circuit applied to a quantum chip having a plurality of qubits. The control circuit includes:

a magnetic flux control line having a plurality of coupling portions, and configured in a non-interrupted manner such that the plurality of coupling portions are electrically conductive with each other;

the plurality of coupling portions are configured to couple in an equal and one-to-one correspondence with a number of qubits in a subset of bits defined by some or all of the foregoing plurality of qubits and having at least two qubits.

In the above control circuit, the flux control line is configured to be coupled with a plurality of qubits in the quantum chip, so as to provide a scheme of controlling the plurality of qubits by one flux control line. Qubits need to be frequency modulated by a dc signal in a low temperature environment such as that provided by dilute refrigerants, i.e., operated at low temperatures by a flux control line. Therefore, when one flux control line is provided for each bit, a large number of access lines for the refrigerator are required to be connected to the respective flux control lines. The access lines that the refrigerator can provide are limited. Providing a separate flux control line for each bit would heavily occupy the limited circuitry of the refrigerator. In view of the above, the scheme of the present application is configured by integrating and merging the magnetic flux control lines corresponding to a plurality of bits, so that the frequency of the plurality of bits can be controlled in the refrigerator with less requirement of the access line.

According to some examples of the application, the coupling portion is a ring-shaped structure.

According to some examples of the application, the ring-shaped structure has a gap.

According to some examples of the application, the indentations have a predetermined orientation and/or the ring-shaped structure has a smooth trajectory.

According to some examples of the application, the flux control lines extend in a straight line shape, and the notches of each ring structure in the same one of the flux control lines are oriented in the same direction.

According to some examples of the application, the ring-shaped structure defines an enclosed region, and the enclosed region has a predetermined area.

According to some examples of the application, the control line further comprises at least one microwave control line coupled to each of the plurality of qubits.

According to some examples of the present application, the number of the microwave control lines is equal to the number of the magnetic flux control lines; each microwave control line is uninterrupted and coupled to at least two qubits.

According to some examples of the application, the microwave control line and the magnetic flux control line each have a one-dimensional linear extension.

In a second aspect, examples of the present application propose a layout structure; which includes the control circuit.

According to some examples of the present application, a layout is defined with a first line layer and a second line layer, the layout further including a plurality of qubits; the plurality of qubits are configured in the first circuit layer, and the control circuit is configured in the second circuit layer.

In a third aspect, examples of the present application propose a flip chip; the control circuit is provided with the control circuit or is manufactured by adopting the layout structure.

In a fourth aspect, examples of the present application propose a flip chip comprising:

the first chip is provided with a one-dimensional bit chain formed by coupling a plurality of quantum bits pairwise in sequence;

a second chip facing the first chip, having a magnetic flux control line extending continuously and having a plurality of coupling parts, the magnetic flux control line being coupled with the qubit through the coupling parts;

the coupling parts have the same quantity with the quantum bits and are in one-to-one position correspondence;

in the direction opposite to the first chip, the projection of the outline of the coupling part on the first chip forms a surrounding area;

the superconducting quantum interferometer in the qubit defines a coupling region, and the coupling region is located within the surrounding region.

According to some examples of the application, the coupling portion is formed by a flux control line by bending; and/or the flip chip further comprises at least one microwave control line coupled to at least part of the plurality of qubits, and each microwave control line is coupled to at least two qubits.

According to some examples of the application, the coupling portion is a ring having a notch.

According to some examples of the application, the qubit further has a superconducting quantum interferometer and a cross-capacitance connected thereto.

According to some examples of the present application, the flip chip further comprises at least one microwave control line; wherein each microwave control line crosses the capacitive arms of at least two cross capacitors to thereby couple with at least two qubits, respectively.

Has the beneficial effects that:

compared with the prior art, the magnetic flux control line in the control circuit realizes the aggregation of the magnetic flux control lines of a plurality of quantum bits in the quantum chip. Compared with the method that independent flux control lines are correspondingly configured for each qubit, the scheme of the example of the application adopts relatively concentrated flux control lines to control each qubit. Therefore, the access lines required to be configured for the magnetic flux control line in the example of the application can be obviously reduced, and correspondingly, the resource occupation of the line during the test of a single chip is also reduced, so that more bits or chips can be tested by using one dilution refrigerator, the efficiency of testing the performance of the chip can be improved, and the utilization rate of the dilution refrigerator can be improved.

Drawings

In order to more clearly illustrate the technical solutions in the embodiments or the prior art of the present application, the drawings used in the description of the embodiments or the prior art will be briefly described below.

FIG. 1 is a schematic circuit diagram of a typical quantum chip with two qubits;

fig. 2A is a schematic structural diagram of a first magnetic flux control line according to an embodiment of the present application;

fig. 2B is a schematic structural diagram of a second magnetic flux control line according to an embodiment of the present disclosure;

fig. 2C is a schematic structural diagram of a third flux control line according to an embodiment of the present disclosure;

fig. 2D is a schematic structural diagram of a fourth flux control line provided in an embodiment of the present application;

FIG. 3 is a schematic circuit diagram of a flip-chip quantum chip (with six qubits) with the flux control line of FIG. 2A according to an embodiment of the present disclosure;

fig. 4 shows a schematic structural diagram of a stereoscopic view of the flip quantum chip of fig. 3;

FIG. 5 shows a schematic circuit diagram of a single qubit in the flip-chip of FIG. 3 (two orientations of the coupling portion are depicted separately);

fig. 6 is a schematic diagram illustrating a relative positional relationship between the flux control line and the qubit in the flip-chip of fig. 3.

An icon: 10-a quantum chip; 100-a read bus; 101-a resonator; 102-a coupler; 103-qubits; 104-dc bias line; 105-XY control line; 200-flux control line; 201-a coupling part; 202-notch; 203-air bridge; 300-read line; 301-microwave control line; 302-a resonant cavity; 303-qubits; 304-a cross capacitor; 305-a first chip; 306-a second chip; 307-superconducting quantum interference.

Detailed Description

Fig. 1 discloses a schematic circuit diagram of a quantum chip 10 with two qubits 103 coupled to one another. As can be seen from fig. 1, it comprises two qubits 103 coupled to each other by a coupler 102. Each qubit 103 is coupled with its corresponding and independently configured resonator 101. The resonators 101 of the two qubits 103 are also each coupled to a commonly utilized read bus 100. A read signal can be input to the sub-bits 103 via the resonator 101 using the read bus 100. As a line for controlling the frequency of the qubits 103, one dc bias line 104 (having a substantially T-shaped configuration) is provided independently for each qubit 103. Meanwhile, as a line for controlling the state of the qubit 103, one XY control line 105 is provided independently for each qubit 103.

The various lines in the quantum chip 10 can be designed and fabricated in a planar layout (i.e., the various lines are disposed on the surface of the same wafer substrate or on the surface of a dielectric layer, a metal layer, etc.) and thus can be conveniently fabricated. However, as the number of qubits 103 increases, the difficulty in laying out the various circuitry and components therein increases significantly and cannot even be easily achieved. Therefore, when developing the quantum chip 10 based on this scheme, experiments and verifications, i.e., testing of the chip, are frequently required. The test important includes the control (state and frequency) of qubit 103, which can be accomplished via the aforementioned dc bias line 104 and XY control line 105.

However, the number of signal lines that need to be accessed when testing the above chip or its extended qubit 103 number chip will be very large. Thus, it can be appreciated that considerable testing resources are required in conducting the test. When resources are limited, a large amount of test requirements can be generated in a short time due to rapid development requirements, so that the test is limited, the development progress is influenced, and product updating and iteration are not facilitated. In the face of such embarrassment, adjustments are necessary.

The inventor considers one possible improvement of the above scheme to be the arrangement of the control lines therein. Specifically, to the knowledge of the inventor, the current configuration manner of the control circuit in the quantum chip is basically the scheme as shown in fig. 1: the Z control line and the XY control line are individually provided for each qubit 103. Therefore, when the number of qubits 103 increases, the Z control line and the XY control line also increase proportionally, resulting in a significant increase in the number of lines that need to be accessed.

In order to overcome or improve the above problems, the inventor proposes to consider that, in the chip testing process, the purpose of reducing the resource occupation of a single chip is achieved by reducing the use of control lines, so as to improve the chip testing efficiency as a whole. Therefore, the control lines in the chip can be selected to be designed in lump; i.e., the individually configured homogeneous control lines of each qubit 103 are combined into one or more to reduce the number of actual control lines.

And it can be known that, since the above-mentioned scheme of lumped design of the control lines exemplified in the present application has adjusted the way of constructing the control lines in the quantum chip, this may have uncontrollable or hardly known effects on the quantum chip. Therefore, the scheme of the example of the present application can be easily applied to a chip which does not pay attention to the control line and has little influence on the test result. That is, the scheme is well suited for structural validation of new qubits 103 and for improvement of the coupling mode of the resonant cavity 302.

Next, referring to fig. 2 to 6 together, the inventor will disclose the exemplary scheme of the present application in detail.

As an example, the present application proposes a control line that can be used for a quantum chip. In the example shown, a flux control line 200 that can control the frequency of a superconducting qubit, such as in a superconducting quantum chip. In the actual manipulation of the qubit, the flux control line 200 is fed with a direct current signal, so that the superconducting qubit is acted upon and influenced by the magnetic field energy generated by it.

And based on the foregoing description, a quantum chip has a plurality of qubits, e.g., at least two, which can be three, four, five, six, etc., in various selected numbers. Accordingly, the control line in the example includes a flux control line 200, and the flux control line 200 has a plurality of coupling portions 201. The number of the coupling parts 201 may be at least two. And the coupling parts 201 are electrically conductive. That is, the flux control lines 200 are continuously distributed, rather than being discontinuous; which is a complete line, e.g. a coplanar waveguide line or the like, in the form of various suitably selected transmission lines.

As an understanding of the flux control line 200 set forth in the present example, the following explanation may be made. In fig. 1, a qubit 103 is coupled to a dc bias line 104 (for controlling the magnetic flux and thus the frequency of the bit). A dc bias line 104 has a coupled to bit configuration. Therefore, when frequency control is required for a plurality of bits, a plurality of independently configured dc bias lines 104 and a plurality of coupling structures that are electrically non-conductive and independent from each other are correspondingly provided.

In contrast to the above, in the solution illustrated in the present application, one flux control line 200 has a plurality of coupling portions 201 (4 coupling portions are exemplarily shown in fig. 2A), and these coupling portions 201 are communicated with each other (physically located on the same line, and thus each electrically conducted). Therefore, when a direct current is applied to the flux control line 200, each coupling portion 201 on the line can generate a magnetic field energy corresponding to the control bit, so that one flux control line 200 can control a plurality of qubits 103.

It should be noted that the flux control line 200 in the exemplary control circuit may be one or more, i.e., the flux control line 200 is at least one. And the number of flux control lines 200 is adaptively selected according to the number of bits in the quantum chip 10. In some cases, all bits are controlled by one flux control line 200; or, all bits are controlled by two flux control lines 200, and each flux control line 200 correspondingly controls at least two bits; alternatively, all bits are controlled by at least two flux control lines 200, and some of the flux control lines 200 control at least two bits, while the remaining flux control lines 200 control one bit each.

In other words, the lines that control the bit frequency among the control lines in the example may all be the flux control lines 200 (having the plurality of coupling sections 201); or a portion of the wiring may be in the form of flux control lines 200 while the remaining portion of the wiring may be in the form of dc bias lines 104 as previously described. This scheme is contemplated, for example, when the qubits are arranged in a two-bit array.

It can be seen that the plurality of coupling portions 201 of the flux control line 200 in the example can be used to selectively couple a plurality of qubits 103 of the chip. When the line for controlling the bit frequency is the flux control line 200 and the number is one, the plurality of coupling portions 201 are coupled to all bits in a one-to-one correspondence. When the line for controlling the bit frequency includes the magnetic flux control line 200 and the aforementioned dc bias line 104, the plurality of coupling portions 201 of the magnetic flux control line 200 are coupled to a part of all bits (i.e., a subset of all qubits 103) in a one-to-one correspondence.

Briefly, the aforementioned fig. 1 discloses a first type of frequency control line, the dc bias line 104, for coupling with a single bit to control the frequency of the single bit. In the present application, the inventor proposes a new frequency control line, flux control line 200, which is different from the first type described above. And one of the main differences between the two categories of frequency control lines is the number of structures a control line contains for coupling with a bit.

Further, since the flux control line 200 in the present example needs to be coupled with a plurality of bits, the dc bias line 104 is coupled with only one bit, and the configuration of the plurality of bits occupies a certain spatial position, it can be known that the length of the flux control line 200 is generally greater than the length of the dc bias line 104.

In view of the foregoing, reference may also be made to fig. 2B, 2C and 2D for an alternative exemplary flux control line 200 of the present application. Referring again to fig. 2A, it can be seen from these figures that the flux control line 200 in the present application is a continuous wire having a continuously extending trace. And the coupling part 201 is formed at different positions of its track.

In fig. 2A to 2C, a ring structure having a notch 202 formed by bulging in a vertical direction with respect to a horizontal direction; can be an elliptical ring, a circular ring, a polygon (such as a rectangular ring) and the like.

In which the coupling portions 201 in fig. 2A have smooth transition traces (circular arcs in the figure) at the bending positions, and the notches 202 of the respective coupling portions 201 face the same direction, for example, vertically downward.

The coupling parts 201 in fig. 2B have a non-smooth transition locus (right angle in the figure) at the top of the ridge, and the notches 202 of the respective coupling parts 201 all face in the same direction, for example vertically downward.

The coupling parts 201 in fig. 2C have a smooth transition track at the top of the elevations and the indentations 202 of the respective coupling parts 201 have a freely chosen orientation, e.g. partly vertically upwards and partly vertically downwards; or alternately have different orientations.

The coupling portion 201 in fig. 2D is bulged in the vertical direction to form a closed, i.e. non-notched, ring-shaped structure 202. Wherein each coupling portion 201 is located on the same side in the horizontal direction. In other examples, the coupling portions 201 may be located at two sides in the horizontal direction. In this example, since a closed loop structure is formed, the flux control lines 200 have crossing positions, and in order to avoid undesired or adverse effects on the crossing positions, air bridges 203 (only one is exemplarily shown in fig. 2D) may be optionally used as a bridging structure, thereby avoiding direct cross contact of the lines.

Further, in fig. 2A to 2D described above, the magnetic flux control line 200 extends substantially in a straight line along the horizontal direction, except for the coupling portion 201. It should be appreciated that in other examples, the flux control lines 200 may also be routed in a non-linear fashion in order to correlate qubits 103 in a variety of different ways. Accordingly, the coupling portion 201 on the flux control line 200 may have various suitable orientations, placement, layout positions, and postures, and is not limited to the illustration.

It is considered that the energy of the magnetic field generated by the coupling portion 201 is limited and it needs to act on or substantially affect the qubit in order to be frequency controlled. Therefore, these coupling parts 201 can be appropriately matched with the ratio according to the condition of the magnetic field actually generated by the coupling parts 201. For example, coupling 201 may be brought into proximity to qubit 103, but not in contact. Wherein the proximity may be selected to be in-plane adjacent in the same plane; alternatively, the approach may be relative in different planes-either directly or approximately opposed but with some deviation from the facing direction.

It should be noted that, if the flux control line 200 having the coupling portion 201 in the present example is disposed on the same surface as the bits, when the number of bits is large, the distribution manner of the bits and the peripheral lines thereof may affect the layout of the flux control line 200, for example, the bits may intersect with other lines, thereby increasing the routing difficulty of the flux control line 200. Therefore, as a wiring scheme for simplifying the magnetic flux control line 200, it is selected to arrange it on the opposite side to the bit.

For example, in a flip chip application, the flux control line 200 may be located in one layer of the chip and the qubit 103 may be located in another layer of the chip; the two layers of chips may be directly facing or adjacent. Moreover, such a solution may also bring the advantage of weakening the potential impact of the process. I.e. the control lines are not coplanar with the bits, but the same plane is an alternative.

In the above example, the control circuit configuration having the magnetic flux control line 200 is described. Further, a microwave control line 301 may also be configured in the control line based on the need for bit state control. Which is used to transmit microwave signals to control qubit 1.

The microwave control line 301 can adopt the same design concept as the XY control line described above, i.e., one XY control line controls one qubit 103. Therefore, in the case of multiple qubits 103, there may be, for example, a plurality of microwave control lines 301 as many as it is.

Alternatively, the microwave control line 301 may adopt the same design principle as the magnetic flux control line 200, that is, a plurality of control lines are combined into one or more (the number of control lines is less than 1 to 1), so that one microwave control line 301 controls the states of all or more bits. It can be seen that one microwave control line 301 capable of controlling more than two bits is also discontinuous, i.e., continuous.

Then, based on the foregoing, in the control circuit, the number of the flux control lines 200 and the microwave control lines 301 may be equal, or one may be more and the other may be less. And, in terms of shape, the microwave control line 301 may be configured in a linear structure, which extends straight. Or it is selectively bent according to the arrangement of bits, etc.

Thus, the control circuit of the example is fully disclosed, and it can be seen that the scheme of the example of the present application enables control of qubits with relatively fewer control lines for the same number of qubits. Therefore, the scheme of this application example adopts and carries out lumped design thinking to the control line for the quantity of control line reduces, thereby the required test resource can be still less when observing and controling the chip based on this design, improves efficiency of software testing.

In addition, as can be seen from the foregoing description, the lumped design of the control lines in the example is a scheme that can be implemented on chip. That is, the aggregation of the control lines can be implemented on the quantum chip, rather than in an off-chip test system; in other words, the present exemplary scheme is on-chip aggregation of control lines or described as on-chip synthesis. Therefore, such a lumped scheme of control lines also contributes to downsizing of a test system of a chip.

As an application example of the above control circuit, a corresponding layout structure may be designed for manufacturing a quantum chip. The layout structure thus has the aforementioned control lines. And further, when the layout structure is used for manufacturing a flip chip, the layout structure can provide a first circuit layer and a second circuit layer and a plurality of qubits. The plurality of qubits are configured in the first circuit layer, and the control circuit is configured in the second circuit layer. That is, the qubits and the control lines are distributed out-of-plane and configured for a different layer chip.

It should be reminded that, as in the foregoing solution exemplified by the present application, the control line and the qubit may also be selected to be configured in a coplanar manner or in a same-layer chip, but this may increase the layout difficulty of other lines or components, and may also cause manufacturing process difficulties of other components besides the control line — for example, line crossing, large area occupation, and the like. Therefore, it would be advantageous to apply the control lines in a flip chip, and to configure the qubits and the control lines out-of-plane/out-of-layer chip; of course, in these examples, the control lines are correspondingly coupled to the qubits in an out-of-plane manner.

Thus, a quantum chip (e.g. a superconducting quantum chip, which may have phase qubits, flux qubits or charge qubits, etc.; in particular a gmon qubit, a Transmon qubit, etc.) manufactured on the basis of the aforementioned control lines or on the basis of the aforementioned layout structure is also proposed in the examples.

Alternatively, a Flip chip as shown in fig. 3, 4, and 5 includes a first chip 305 (which may be abbreviated as Base) and a second chip 306 (which may be abbreviated as Flip). The two layers of chips are connected by a flip-chip interconnect structure (not shown), wherein the flip-chip interconnect structure can be a bump, a stud or a bump; such as indium columns in superconducting quantum chips.

The two layers of chips have surfaces facing each other, i.e. functional surfaces; by way of distinction, the first chip 305 has a first functional side and the second chip 306 has a second functional side. The two chips are respectively connected with the flip-chip interconnection structure through the first functional surface and the second functional surface, so that the relative positions of the two layers of chips are supported and maintained, or further, the two layers of chips can be used for carrying out signal connection on lines distributed on the two chips.

The two functional surfaces can provide possibility for the control line of the chip and the different surface distribution of the quantum bit, and can also avoid the conflict between the magnetic flux control line 200 and the microwave control line 301.

In the present example, a first common plane of the first chip 305 is configured with a plurality (6 in fig. 3) of qubits/qubits 303; for example, the qubit 303 has a cross capacitor 304 and a Superconducting Quantum Interference Device (SQUID) connected to each other as shown in fig. 6. The qubits are arranged in a one-dimensional chain, and the qubits 103 are coupled two by two in sequence, thereby forming a one-dimensional chain-in the figure, a linear one-dimensional chain.

On the second functional surface of the second chip 306, the flux control lines 200 (1 in fig. 3) are arranged. The flux control line 200 is continuously extended, and a plurality of (6 in fig. 3) coupling portions 201 are distributed at intervals. The coupling portion 201 may be formed by combining three lines (which are part of the flux control line 200). If the flux control lines 200 are defined to extend horizontally, a first one of the lines extends perpendicular to the horizontal direction, then a second one of the lines extends horizontally, continuing with a third one of the lines extending perpendicular to the horizontal direction. In short, the coupling portion 201 may be formed by the magnetic flux control line 200 by being locally bent.

In fig. 3, the number of the coupling parts 201 is equal to the number of the qubits 103, and the positions correspond to one another; that is, any one of the coupling portions 201 of the flux control line 200 is coupled to a corresponding one of the qubits 103 at a corresponding position. In this example, the respective positions are, for example, substantially the same projection areas or ranges of the first chip 305 and the second chip 306 in the vertical planes of the opposite directions.

As shown in fig. 4, 5, and 6, the coupling part 201 may be configured to face upward in the vertical direction, or the coupling part 201 may also be configured to face downward in the vertical direction. In other examples, the plurality of coupling portions 201 may also face partially upward and partially downward.

Referring to fig. 4, 5 and 6 again, the coupling portion 201 in a ring structure may define a surrounding area on the second chip 306, and of course, has a certain area. The area can be controlled according to the degree of coupling with the qubit 303 in order to achieve better manipulation of the qubit 303. The area of the enclosing region is therefore generally freely chosen according to the actual requirements. Or, in some alternative examples, according to the conventional size and specification of a general quantum chip, the region defined by the coupling portion 201 may be defined as a certain pre-designed area, i.e. a preset area; and are taken into account in the fabrication of the chip on the basis thereof. For example, taking the superconducting quantum interferometer of a dual josephson junction as an example, the predetermined area of the enclosure region may be larger than the area of the minimum rectangular region based on the minimum rectangular region capable of accommodating the superconducting quantum interferometer.

As an example, for a flip chip composed of a first chip 305 and a second chip 306, in a direction facing the first chip 305, a projection of a profile of a coupling portion 201 of a flux control line 200 located on the second chip 306 onto the first chip 305 forms a surrounding region, and at the same time, a superconducting quantum interferometer 307 in a qubit defines a coupling region. The coupling portion 201 and the qubit 303 are then mated in such a way that, for example, the coupling region is located within the surrounding region (shown as region a in fig. 6).

Since the flux control line 200 forms a U-shaped envelope in the SQUID region (the area of the flux control line 200 is larger than that of the SQUID region), the mutual inductance generated in the SQUID region and the distance of the lines forming the U-shape are substantially in a negative correlation relationship (the smaller the distance, the larger the mutual inductance), so that the signal of the flux control line 200 can generate an appropriate mutual inductance strength in the SQUID region.

The chip has, in addition to the flux control line 200, a microwave control line 301, see fig. 3. In the example, the chip has a cross capacitor 304 and a qubit 303 of the SQUID as an example. Taking this as an example, in the opposite direction of the two chips, the coupling portion 201 faces the SQUID as shown in fig. 6.

Accordingly, the flux control line 200 has the same extension direction as two of the capacitive arms of the cross capacitor 304 of each qubit 303; the microwave control line 301 crosses over one capacitor arm of the cross capacitor 304 of each qubit 303, i.e. the microwave control line 301 is perpendicular to the one capacitor arm; please refer to fig. 4. Since the microwave control line 301 is different from the bit plane, the coupling capacitance of the two is associated with the area right opposite to the two, and the coupling capacitance can be ensured to meet the requirement by controlling the area.

It is noted that in the chip structure shown in fig. 3, the flux control line 200 and the microwave control line 301 of the last bit (located at the rightmost side in the direction shown in fig. 3) extend a certain distance in addition to the capacitively coupled portion of the bit to ensure that the other bits can maintain the coupling strength as equal as required.

In addition, by selecting the control lines and bits arranged in different planes and adjusting the lengths of the coupling portions 201 of the magnetic flux control lines 200 and the control lines, the influence of the alignment accuracy of flip chip bonding on the chip parameters can be reduced, and the flip chip bonding distance becomes a factor that affects the design parameters. This can be conveniently controlled by controlling the length of the weld column, the time and magnitude of the crimping force, and the like.

Further, lines other than control lines, such as a common read line 300, may be provided on the chip. Each of the six qubits 303 is coupled to a read line 300 with its own corresponding one of the read resonators 302. Thus, 6 bits in the chip are excited using the same microwave control line 301 and frequency modulated using the same flux control line 200.

Then the chip described above would use 3 coaxial lines and 1 dc line when performing control related tests. Two cables (coaxial lines) are disposed on one read line 300, one cable (coaxial line) is disposed on the microwave control line 301, and one cable (direct current line) is disposed on the magnetic flux control line 200. Bit control can be performed based on the line configuration, so that the effect of greatly reducing the consumption of test resources is achieved.

Whereas if one XY control line 105 and one Z control line/dc bias line 104 are provided independently for each bit in the manner of fig. 1, 8 coaxial lines and 6 dc lines are required for a 6-bit chip. Two cables (coaxial lines) are arranged for one reading line 300, one cable (coaxial line) is arranged for each XY control line 105, and one cable (dc line) is arranged for each Z control line.

The inventors have thus far conducted a thorough discussion of the solution of the present example and have achieved the effect of achieving a reduction in the amount of demand for chip-controlled test line resources through on-chip aggregation of control lines.

The embodiments described hereinbefore by reference to the drawings are illustrative only for the purpose of explaining the present application and are not to be construed as limiting the present application. In order to make the objects, technical solutions and advantages of the embodiments of the present application clearer, the foregoing description explains the embodiments of the present application in detail with reference to the drawings. However, it will be appreciated by those of ordinary skill in the art that in the examples of the present application, numerous technical details are set forth in order to provide a better understanding of the present application. However, the technical solutions claimed in the present application can be implemented without these technical details and various changes and modifications based on the following embodiments. The division of the examples is for convenience of description, and should not constitute any limitation to the specific implementation manner of the present application, and the embodiments may be mutually incorporated and referred to each other without contradiction.

It should be noted that the terms "first," "second," and the like in the description and claims of this application and in the drawings described above are used for distinguishing between similar elements and not necessarily for describing a particular sequential or chronological order. It should be understood that the data so used may be interchanged under appropriate circumstances such that embodiments of the application described herein may be implemented in sequences other than those illustrated or described herein.

Furthermore, the terms "comprises," "comprising," and "having," and any variations thereof, are intended to cover a non-exclusive inclusion, such that a process, method, system, article, or apparatus that comprises a list of steps or elements is not necessarily limited to those steps or elements expressly listed, but may include other steps or elements not expressly listed or inherent to such process, method, article, or apparatus.

The construction, features and functions of the present application are described in detail in the embodiments illustrated in the drawings, which are only preferred embodiments of the present application, but the present application is not limited by the drawings, and all equivalent embodiments that can be modified or changed according to the idea of the present application are within the scope of the present application without departing from the spirit of the present application.

Claims

1. A control circuit for a quantum chip having a plurality of qubits, the control circuit comprising:

a flux control line having a plurality of coupling portions, the flux control line configured in a non-interrupted manner such that the plurality of coupling portions are electrically conductive with each other;

the plurality of couplings are configured to couple in an equal and one-to-one correspondence with a number of qubits in a subset of bits defined by some or all of the plurality of qubits and having at least two qubits.

2. The control circuitry of claim 1 wherein the coupling is an annular structure.

3. The control line of claim 2, wherein the ring structure has a gap; and/or the annular structure has a smooth trajectory.

4. The control line of claim 3, wherein the notch has a predetermined orientation.

5. The control circuit of claim 4, wherein the flux control lines extend in a straight line and the notches of each loop configuration in a common flux control line are oriented in a same direction.

6. The control circuit of any one of claims 2 to 5, wherein the annular structure defines an enclosed region, and the enclosed region has a predetermined area.

7. The control line of claim 1, further comprising at least one microwave control line coupled to each of the plurality of qubits.

8. The control circuit of claim 7, wherein the number of microwave control lines is equal to the number of flux control lines;

each microwave control line is uninterrupted and coupled to at least two qubits.

9. The control circuit according to claim 7 or 8, wherein the microwave control line and the magnetic flux control line each have a one-dimensional linear extension.

10. A layout structure, characterized in that it comprises a control circuit according to any one of claims 1 to 9.

11. The layout structure according to claim 10, wherein the layout is defined with a first line layer and a second line layer, wherein the layout further comprises a plurality of qubits; the plurality of qubits are configured in a first circuit layer, and the control circuit is configured in a second circuit layer.

12. A flip chip having a control circuit according to any one of claims 1 to 9 or fabricated using a layout structure according to claim 10 or 11.

13. A flip chip, comprising:

a second chip facing the first chip, and configured with a magnetic flux control line extending continuously and having a plurality of coupling portions, the magnetic flux control line being coupled to the plurality of qubits through the plurality of coupling portions;

a superconducting quantum interferometer in the qubit defines a coupling region, and the coupling region is located within the surrounding region.

14. The flip chip of claim 13, wherein the coupling portion is formed by a flux control line by bending;

and/or the flip chip further comprises at least one microwave control line coupled to at least a portion of the plurality of qubits, and at least two qubits are coupled per microwave control line.

15. The flip chip of claim 14, wherein the coupling portion is a ring having a notch.

16. The flip chip of claim 13, wherein the qubit further comprises a superconducting quantum interferometer and a cross capacitor connected thereto.

17. The flip chip of claim 16, further comprising at least one microwave control line;

each microwave control line crosses over the capacitive arms of at least two cross capacitors to thereby couple with at least two qubits, respectively.