CN217931846U

CN217931846U - Power supply transformer high-voltage test device

Info

Publication number: CN217931846U
Application number: CN202221585253.6U
Authority: CN
Inventors: 田晓戈; 王孔超; 王亚男
Original assignee: Individual
Current assignee: Individual
Priority date: 2022-06-23
Filing date: 2022-06-23
Publication date: 2022-11-29
Anticipated expiration: 2032-06-23

Abstract

The utility model discloses a power supply transformer high-voltage test device belongs to the electric power field, power supply transformer high-voltage test device include MCU module, data acquisition circuit, communication interface circuit, test control circuit, liquid crystal display circuit, MCU module input be connected with data acquisition circuit output, MCU module output is connected with communication interface circuit input earlier, MCU module output is connected with liquid crystal display circuit, test control circuit be connected with data acquisition circuit's control end, the utility model discloses can realize the automatic test of no-load test and load test, improve efficiency, avoid human error, possess and look over test result, compare historical data, data teletransmission and control, parameter setting and function such as printing. The device adopts a modular design method, and has strong expandability and flexibility.

Description

Power supply transformer high-voltage test device

Technical Field

The utility model belongs to the electric power field, more specifically the utility model relates to a power supply transformer high-voltage testing device that says so.

Background

The power supply transformer must be tested before leaving the factory and during maintenance in operation. The traditional test method is generally carried out by adopting instruments (a voltmeter, an ammeter and a power meter), the current gear switching, the voltage boosting and reducing operation and the manual meter reading are controlled manually, so that manual errors such as tedious control, reading errors and the like are inevitable, and the difficulties such as complex wiring, difficult reading, inconvenient recording and the like of the instruments exist. Certainly, the computer aided test system can also be used to solve the above problems, but the computer aided test system is not favorable for field test, and has higher cost and huge volume.

Disclosure of Invention

The utility model discloses use AVR singlechip ATmega128 as the core, adopt fast-speed AD conversion chip MAX1320, realize having improved efficiency to power transformer no-load test and load test's automatic test, satisfy the field test, avoided human error, have advantages such as small, with low costs.

In order to achieve the above purpose, the utility model is realized by adopting the following technical scheme: the high-voltage test device for the power supply transformer comprises an MCU module 1, a data acquisition circuit 2, a communication interface circuit 3, a test control circuit 4 and a liquid crystal display circuit 5, wherein the input end of the MCU module 1 is connected with the output end of the data acquisition circuit 2, the output end of the MCU module 1 is connected with the input ends of the communication interface circuit 3, the test control circuit 4 and the liquid crystal display circuit 5, and the test control circuit 4 is connected with the control end of the data acquisition circuit 2.

Preferably, the data acquisition circuit 2 comprises a voltage transformer 6, a current transformer 7, an analog signal conditioning circuit 8, a frequency acquisition circuit 9 and an AD converter 10; the voltage transformer 6 and the current transformer 7 are arranged on a coil to be tested of the tested transformer; the output end of the voltage transformer 6 is connected with the input end of the frequency acquisition circuit 9, and the output end of the frequency acquisition circuit 9 is connected with the input port of the MCU module 1; the output end of the current transformer 7 is connected with the input port of the analog signal conditioning circuit 8, the output end of the analog signal conditioning circuit 8 is connected with the input port of the AD converter 10, and the output port of the AD converter 10 is connected with the input port of the MCU module 1.

Preferably, the test control circuit 4 comprises a CT gear switching circuit 11, a power amplifier 12, a parallel IO interface 13 and an automatic voltage regulator 14, the output end of the MCU module 1 is connected to the input end of the power amplifier 12 through the parallel IO interface 13, and the output end of the power amplifier is connected to the CT gear switching circuit 11 and the input end of the automatic voltage regulator 14; the output end of the CT gear switching circuit 11 is connected with the gear control port of the current transformer 7, and the automatic voltage regulator 14 is connected with the voltage regulating port of the tested transformer.

Preferably, the communication interface circuit 3 is connected with the PC 15 and the micro printer 16 by RS-232 interfaces.

Preferably, the high-voltage testing device further comprises a memory 17, and the data output end of the MCU module 1 is connected with the memory 17.

The utility model discloses beneficial effect:

the utility model discloses can realize empty test and load test's automatic test, improve efficiency, avoid human error, possess the test result of looking over, compare historical data, data teletransmission and control, parameter setting and function such as printing. The device adopts a modularized design method, and has strong expandability and flexibility.

The automatic testing device takes an AVR singlechip ATmega128 as a core, adopts a high-speed A/D conversion chip MAX1320, realizes automatic testing of a no-load test and a load test of the power transformer, improves efficiency, meets field tests, avoids human errors, and has the advantages of small volume, low cost and the like.

Drawings

Fig. 1 is a system block diagram of an embodiment of the present invention;

FIG. 2 is a circuit diagram of the MCU module of the present invention;

FIG. 3 is a schematic diagram of the data acquisition circuit of the present invention;

fig. 4 is a schematic diagram of the test control circuit of the present invention.

In the figure, 1-MCU module, 2-data acquisition circuit, 3-communication interface circuit, 4-test control circuit, 5-liquid crystal display circuit, 6-voltage transformer, 7-current transformer, 8-analog signal conditioning circuit, 9-frequency acquisition circuit, 10-AD converter, 11-CT gear switching circuit, 12-power amplifier, 13-parallel IO interface 13, 14-automatic voltage regulator, 15-PC, 16-micro printer and 17-memory.

Detailed Description

The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.

As shown in fig. 1-4, the power supply transformer high voltage test device includes an MCU module 1, a data acquisition circuit 2, a communication interface circuit 3, a test control circuit 4, and a liquid crystal display circuit 5, wherein an input terminal of the MCU module 1 is connected to an output terminal of the data acquisition circuit 2, an output terminal of the MCU module 1 is connected to an input terminal of the communication interface circuit 3, the test control circuit 4, and the liquid crystal display circuit 5, and the test control circuit 4 is connected to a control terminal of the data acquisition circuit 2. The MCU adopts ATmega128 as a core, and the AD converter 10 adopts a MAX1320 chip. The parallel IO interface 13 employs an 8255A chip.

The function menu of the liquid crystal display circuit 5 and the data obtained by the test can realize the setting function of each parameter, and a TG320240B06T liquid crystal display module is selected as a display circuit in the device.

The data acquisition circuit 2 comprises a voltage transformer 6, a current transformer 7, an analog signal conditioning circuit 8, a frequency acquisition circuit 9 and an AD converter 10; the voltage transformer 6 and the current transformer 7 are arranged on a coil to be tested of the tested transformer; the output end of the voltage transformer 6 is connected with the input end of the frequency acquisition circuit 9, and the output end of the frequency acquisition circuit 9 is connected with the input port of the MCU module 1; the output end of the current transformer 7 is connected with the input port of the analog signal conditioning circuit 8, the output end of the analog signal conditioning circuit 8 is connected with the input port of the AD converter 10, and the output port of the AD converter 10 is connected with the input port of the MCU module 1. According to the functional requirements of the automatic testing device for the transformer test, the data acquisition circuit is mainly used for acquiring the three-phase voltage and the three-phase current of the power transformer. The circuit mainly comprises a current transformer 7 (CT), a voltage transformer 6 (PT), an analog signal shaping circuit, an A/D conversion chip, a frequency acquisition circuit 9 and the like.

The test control circuit 4 comprises a CT gear switching circuit 11, a power amplifier 12, a parallel IO interface 13 and an automatic voltage regulator 14, wherein the output end of the MCU module 1 is connected with the input end of the power amplifier 12 through the parallel IO interface 13, and the output end of the power amplifier is connected with the CT gear switching circuit 11 and the input end of the automatic voltage regulator 14; the output end of the CT gear switching circuit 11 is connected with the gear control port of the current transformer 7, and the automatic voltage regulator 14 is connected with the voltage regulating port of the tested transformer. The test control circuit 4 can automatically perform the no-load test and the load test of the transformer so as to realize the functions of boosting and reducing voltage, automatic switching of each gear and the like in the test process.

The communication interface circuit 3 is connected with a PC 15 and a micro printer 16 by adopting RS-232 interfaces. The device has designed communication interface circuit 3, through communication interface circuit 3, can realize the printing and the teletransmission of data, can upload the data to the far-end PC on, realize that experimental data and historical data pass through the PC and show, make things convenient for comparison and the fault diagnosis of data.

The high-voltage test device further comprises a memory 17, and the data output end of the MCU module 1 is connected with the memory 17 and used for storing data.

The utility model discloses the theory of operation:

voltage transformer 6, current transformer 7 gather the voltage and the current signal of the transformer of being surveyed, and voltage signal carries out voltage sampling through frequency acquisition circuit 9, sends into MCU module 1 with the data after the sampling, and the current signal line carries out signal conditioning through analog signal conditioning circuit 8, sends into AD converter 10 and converts analog signal into digital signal, sends into current digital signal MCU module 1 again and handles. MCU module 1 can also be through 8255 parallel IO serial ports chip, output control data, and control data partly sends into CT gear switch after enlargiing through power amplifier 12, and CT gear switch carries out the gear at control current transformer 7 and switches, just can test the electric current of various motionless current grades. The other part regulates the voltage of the transformer to be tested through the automatic voltage regulator 14, and can test the voltage change condition of the transformer to be tested under different voltage levels. The MCU module 1 sends the data acquired by testing to the PC 15 through the communication circuit for displaying, and can also be sent to a printer for printing. And may store the data in the memory 17. The liquid crystal display module is a touch display screen, and various setting parameters of the MCU can be adjusted through the touch display screen.

It is noted that, herein, relational terms such as first and second, and the like may be used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Also, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. The term "comprising", without further limitation, means that the element so defined is not excluded from the group consisting of additional identical elements in the process, method, article, or apparatus that comprises the element.

Claims

1. The utility model provides a power supply transformer high-voltage testing device which characterized in that: the high-voltage test device for the power supply transformer comprises an MCU module (1), a data acquisition circuit (2), a communication interface circuit (3), a test control circuit (4) and a liquid crystal display circuit (5), wherein the input end of the MCU module (1) is connected with the output end of the data acquisition circuit (2), the output end of the MCU module (1) is connected with the input ends of the communication interface circuit (3), the test control circuit (4) and the liquid crystal display circuit (5), and the test control circuit (4) is connected with the control end of the data acquisition circuit (2).

2. The high-voltage test device for the power supply transformer of claim 1, wherein: the data acquisition circuit (2) comprises a voltage transformer (6), a current transformer (7), an analog signal conditioning circuit (8), a frequency acquisition circuit (9) and an AD converter (10); the voltage transformer (6) and the current transformer (7) are arranged on a coil to be tested of the tested transformer; the output end of the voltage transformer (6) is connected with the input end of the frequency acquisition circuit (9), and the output end of the frequency acquisition circuit (9) is connected with the input port of the MCU module (1); the output end of the current transformer (7) is connected with the input port of the analog signal conditioning circuit (8), the output end of the analog signal conditioning circuit (8) is connected with the input port of the AD converter (10), and the output port of the AD converter (10) is connected with the input port of the MCU module (1).

3. The high-voltage test device for the power supply transformer of claim 1, wherein: the test control circuit (4) comprises a CT gear switching circuit (11), a power amplifier (12), a parallel IO interface (13) and an automatic voltage regulator (14), wherein the output end of the MCU module (1) is connected with the input end of the power amplifier (12) through the parallel IO interface (13), and the output end of the power amplifier is connected with the input ends of the CT gear switching circuit (11) and the automatic voltage regulator (14); the output end of the CT gear switching circuit (11) is connected with a gear control port of the current transformer (7), and the automatic voltage regulator (14) is connected with a voltage regulating port of the tested transformer.

4. The high-voltage test device for the power supply transformer of claim 1, wherein: the communication interface circuit (3) is connected with a PC (15) and a micro printer (16) by adopting an RS- (232) interface.

5. The high-voltage test device for the power supply transformer of claim 1, wherein: the high-voltage test device further comprises a memory (17), and the data output end of the MCU module (1) is connected with the memory (17).