CN217930788U - Integrating hemisphere device, light emission characteristic measuring device, and light emission imaging measuring device - Google Patents

Abstract

The application discloses an integral hemisphere device, a light-emitting characteristic measuring device and a light-emitting imaging measuring device, wherein the integral hemisphere device comprises an integral hemisphere, a exciting light incidence module and a light-emitting light emergence module, wherein the integral hemisphere is arranged along the direction of a light path; the integrating hemisphere is composed of a shell, a hemisphere cavity and a sample cover, the exciting light incidence module is composed of a light inlet hole, a first rotating motor and a first reflector, and the emitted light emergence module is composed of a light outlet hole I, a light outlet hole II, a second rotating motor, a driving gear, a driven gear, a push-pull motor, a second reflector and a polytetrafluoroethylene plate. The device can be used for respectively carrying out spectrum test, luminous quantum efficiency test and luminous imaging on the luminous sample, and can greatly improve the test efficiency of the luminous material. Meanwhile, the luminous sample is blocked outside the integrating sphere by the quartz sample cover, the hemisphere cavity does not need to be opened during sample changing, and the problem of integrating sphere pollution caused by repeated opening of the hemisphere cavity or careless sample loading is avoided.

Description

Integral hemisphere device, luminescence characteristic measuring device and luminescence imaging measuring device

Technical Field

The application belongs to the technical field of optical measurement, and particularly relates to an integral hemisphere device, a light-emitting characteristic measuring device and a light-emitting imaging measuring device.

Background

The characteristics of luminescence spectrum, quantum efficiency, light intensity distribution and the like are key basic indexes for evaluating the performance of luminescent materials and devices. Because the light emitted by the luminescent material and the device has the characteristic of uneven spatial light intensity distribution, an integrating sphere device is generally required to be selected for testing the luminous quantum efficiency of the luminescent material to remove the influence of spatial anisotropy. The integrating hemisphere ingeniously utilizes the equatorial plane mirror symmetry principle, a hemispherical surface and a high reflection plane of one surface form a closed hemispherical space, the size of the integrating hemisphere is reduced by half while the integrating sphere with the same diameter has the same light homogenizing effect, light intensity output which is nearly 2 times can be provided, and the integrating hemisphere can be suitable for more light collecting and light homogenizing scenes with requirements on the size of the device. In addition, the conventional integrating hemisphere device has the problems of simple structure, single function and troublesome sample change, and can not meet the requirements of material researchers on in-situ test and observation of the spectrum, the quantum efficiency and the light intensity distribution of the material.

SUMMERY OF THE UTILITY MODEL

In order to improve the photoluminescence characteristic testing efficiency of the material and perfect the testing function of the luminescent material, the integrating hemisphere device and the testing method for the spectrum and yield test are provided, the spectrum testing, the luminous quantum efficiency testing and the light intensity distribution imaging function of the luminescent material are integrated, the operation can be simplified, the testing efficiency can be improved, and the method has good application prospects.

The utility model provides a spectrum and productivity test are with total mark hemisphere device collects luminescent material's spectral test, quantum efficiency test and formation of image function in an organic whole, can greatly improve the photoluminescence characteristic efficiency of testing of material and device.

In one aspect of the present application, an integrating hemisphere device is provided, which includes an integrating hemisphere, an excitation light incident module, and an emission light exiting module, which are disposed along a light path direction;

the integrating hemisphere comprises a shell 1, a sample cover 3 and a shell 2 with a hemisphere cavity, wherein a round hole is formed in the center of the bottom of the cavity of the shell 2, the sample cover 3 is installed at the round hole, and the shell 1 is installed on the outer side of the shell 2; the shell 2 is also provided with a through hole I-1, a through hole II-1 and a through hole III-1; the shell 1 is provided with a through hole I-2, a through hole II-2 and a through hole III-2 which correspond to the through hole I-1, the through hole II-1 and the through hole III-1 in position; the through hole I-1 is communicated with the through hole I-2, and the through hole II-1 is communicated with the through hole II-2; the through hole III-1 is communicated with the through hole III-2;

the exciting light incidence module comprises a light inlet hole 4 and a rotatable first reflecting mirror 6; the light inlet 4 is communicated with the through hole I-2 and the through hole I-1 to form a light path I, the first reflector 6 is arranged in the hemispherical cavity, and the first reflector 6 and the light inlet 4 are obliquely arranged at an angle of 45 degrees;

the emitted light emitting module comprises a light outlet I7, a light outlet II8 and a second reflector 14 which can telescopically rotate, wherein the light outlet I7 is communicated with the through hole II-2 and the through hole II-1 to form a light path II, the light path II is vertical to the light path I, and the light outlet II8 is communicated with the through hole III-2 and the through hole III-1; the second reflector 14 is installed in the hemispherical cavity and is located at a position opposite to the light inlet 4.

Optionally, the excitation light incidence module further comprises a first rotating electrical machine 5; the first rotating motor 5 is mounted at the top of the housing 1 and close to the light inlet 4;

the rotating shaft of the first rotating motor 5 extends into the hemispherical cavity, and the free end of the rotating shaft is provided with the first reflector 6.

Optionally, the emitted light emitting module further includes a second rotating motor 10, a driving gear 11, a driven gear 12, and a push-pull motor 13;

the second rotating electrical machine 10 is mounted on the housing 1;

the driving gear 11 is mounted on a rotating shaft of the second rotating motor 10, the driving gear is meshed with the driven gear 12, and the driven gear 12 is fixedly connected with the push-pull motor 13;

the back surface of the second reflector 14 is fixedly attached to a polytetrafluoroethylene plate 15;

and a push-pull shaft of the push-pull motor 13 extends into the hemispherical cavity, and the polytetrafluoroethylene plate 15 is mounted at the free end of the push-pull shaft.

Optionally, the through hole I-1 and the through hole II-1 are both formed in the side wall of the housing 2;

the through hole III-1 is formed in the top of the shell 2 and vertically above the round hole.

Optionally, the integrating hemisphere device further includes a closed hole plug 9 for closing the light exit hole I7 and/or the light exit hole II 8.

As a specific embodiment, the integrating hemisphere apparatus includes: the device mainly comprises an integrating hemisphere, an exciting light incidence module and an emitted light emergence module. The integrating hemisphere consists of a shell, a hemisphere cavity and a quartz sample cover, wherein the shell is used for protecting the hemisphere cavity and is provided with the exciting light incidence module and the emitted light emergence module; the center of the bottom of the hemispherical cavity is provided with a round hole, and the quartz sample cover is arranged at the round hole formed in the center of the bottom of the hemispherical cavity. The exciting light incidence module consists of a light inlet hole, a first rotating motor and a first reflector, wherein the light inlet hole is formed in the shell and the side wall of the hemispherical cavity and used for allowing exciting light to enter the hemispherical cavity; first rotating electrical machines install the shell top is close to advance the unthreaded hole side, rotating electrical machines's rotation axis stretches into in the hemisphere cavity, its tip install with advance the unthreaded hole and become 45 slant installation first speculum. The emitted light emitting module comprises a side light emitting hole, an upper light emitting hole, a closed hole plug, a second rotating motor, a driving gear, a driven gear, a push-pull motor, a second reflector and a polytetrafluoroethylene plate, wherein the side light emitting hole is formed in the vertical direction of the side wall of the shell and the hemispherical cavity and the light inlet hole, the upper light emitting hole is formed in the position, opposite to the quartz sample cover, of the top of the shell and the hemispherical cavity, and the closed hole plug is used for selectively closing the side light emitting hole or the upper light emitting hole; the second rotating motor is arranged on the side wall of the shell, which is opposite to the side wall of the light inlet hole, the driving gear is arranged on a rotating shaft of the second rotating motor, and the driven gear is fixedly connected with the body of the push-pull motor and is meshed with the driving gear; the push-pull motor is arranged at the position, opposite to the light inlet hole, of the side wall of the shell, a push-pull shaft of the push-pull motor extends into the hemispherical cavity, and the first reflector and the polytetrafluoroethylene plate which are fixedly attached to the back surfaces of the push-pull shaft are arranged at the end parts of the push-pull motor.

In another aspect of the present application, there is provided a luminescence property measurement apparatus including the integrating hemisphere apparatus, a light source, and a spectrum system;

the light source is used for emitting an excitation light beam to enter the hemispherical cavity through the light inlet hole 4;

the spectrum system is used for receiving exciting light emitted from the light emitting hole I7;

wherein the integrating hemisphere device is selected from the integrating hemisphere devices described above.

In still another aspect of the present application, there is provided a method for spectrum testing of a luminescent material, the method using the above-mentioned luminescence property measurement apparatus;

the method comprises the following steps:

(1) Placing the luminescent material sample to be detected in the sample cover;

(2) Rotating the first reflector through the first rotating motor to enable the reflecting surface of the first reflector to face the light inlet;

(3) Pushing the second reflecting mirror 14 by the push-pull motor above the sample cover; the driving gear is driven to rotate by a rotating shaft of the second rotating motor, the driven gear and the push-pull motor are driven to rotate by the driving gear, and the reflecting surface of the second reflecting mirror and the central line of the light outlet I form an angle of 45 degrees, and the reflecting surface faces downwards;

(4) The light source emits an excitation light beam, the excitation light beam enters the hemispherical cavity through the light inlet, is reflected by the first reflector, irradiates the luminescent material sample to be detected through the sample cover, and the excitation light emitted by the luminescent material sample to be detected is reflected by the second reflector and is emitted through the light outlet I;

(5) And the spectrum system receives the exciting light emitted from the light emitting hole I and performs spectrum test on the luminescent material sample to be tested.

As a specific embodiment, the method of spectral testing comprises:

the integrating hemisphere device can be placed in a sample bin of a conventional spectrum instrument to perform a spectrum testing method of the luminescent sample, and the luminescent sample is placed in the quartz sample cover as shown in FIG. 4; rotating the first reflector through the first rotating motor to enable the reflecting surface of the first reflector to face the light inlet; pushing the second reflecting mirror and the polytetrafluoroethylene plate with the back surfaces fixedly attached to each other to the position above the quartz sample cover through the push-pull motor; and the driving gear is driven to rotate by a rotating shaft of the second rotating motor, the driven gear and the push-pull motor fixedly connected with the driven gear are driven by the driving gear to rotate until the center line of the side light-emitting hole of the reflector forms an angle of 45 degrees and the mirror surface of the side light-emitting hole of the reflector is downward, and the closed hole plug closes the upper light-emitting hole. Exciting light enters the hemispherical cavity through the light inlet, the light emitting sample is irradiated by the light reflected by the first reflector through the quartz sample cover, most of light emitted by the light emitting sample under excitation is reflected by the second reflector and is emitted through the side light outlet, and spectrum test of the light emitting sample is carried out.

In still another aspect of the present application, a method for testing the luminous quantum efficiency of a luminescent material is provided, the method using the above-mentioned luminous characteristic measuring apparatus;

the method comprises the following steps:

(1) Testing the internal environment of the hemispherical cavity to obtain the spectral parameters of the internal environment of the hemispherical cavity;

(2) And (2) testing the spectral parameters of the luminescent material sample to be tested, and calculating the spectral parameters with the internal environment spectral parameters of the hemispherical cavity obtained in the step (1) to obtain the luminescent quantum efficiency of the luminescent material sample to be tested.

Optionally, the step (1) comprises:

s01, rotating the first reflector through the first rotating motor to enable the reflecting surface of the first reflector not to be aligned with the light inlet hole;

s02, the light source emits an excitation light beam, the excitation light beam enters the hemispherical cavity from the light inlet, is reflected by the first reflector and then strikes the inner wall of the hemispherical cavity;

s03, pushing the second reflecting mirror to the position above the sample cover through the push-pull motor; the driving gear is driven to rotate through a rotating shaft of the second rotating motor, and the driven gear and the push-pull motor are driven to rotate by the driving gear, so that the polytetrafluoroethylene plate faces the light outlet I and is perpendicular to the bottom of the hemispherical cavity;

s04, sealing a hole plug to seal a light outlet II, wherein the excitation light beam is emitted out of the light outlet I after being subjected to diffuse reflection in the hemispherical cavity and enters the spectrum system to obtain the internal environment spectrum parameters of the hemispherical cavity;

and the sample cover is not used for placing the luminescent sample to be detected.

Optionally, the step (2) comprises:

m01, placing the luminescent material sample to be detected in the sample cover, and rotating the first reflector through the first rotating motor to enable the reflecting surface of the first reflector to be over against the light inlet;

m02, the light source emits an excitation light beam, the excitation light beam enters the hemispherical cavity from the light inlet, is reflected by the first reflector and irradiates the luminescent material sample to be detected through the sample cover;

m03, pushing the second reflecting mirror to the upper part of the sample cover through the push-pull motor; the driving gear is driven to rotate through a rotating shaft of the second rotating motor, and the driven gear and the push-pull motor are driven to rotate by the driving gear, so that the polytetrafluoroethylene plate faces the light outlet I and is perpendicular to the bottom of the hemispherical cavity;

m04, closing a hole plug to close a light outlet II, wherein the excitation light beam is emitted out through the light outlet I and enters the spectrum system after being subjected to diffuse reflection in the hemispherical cavity, so that the spectrum parameters of the luminescent material light sample to be detected are obtained; and calculating with the spectral parameters of the inner environment of the hemispherical cavity to obtain the luminous quantum efficiency of the luminous sample to be detected.

As a specific embodiment, the method for testing luminous quantum efficiency includes:

the first step, test the internal environment of hemisphere cavity:

as shown in fig. 5, the quartz sample cover does not contain the luminescence sample; rotating the first reflector through the first rotating motor to enable the reflecting surface of the first reflector not to be right opposite to the light inlet, and reflecting the excitation light beam entering the hemispherical cavity from the light inlet on the inner wall of the hemispherical cavity after the excitation light beam is reflected by the first reflector; pushing the second reflecting mirror and the polytetrafluoroethylene plate with the back surfaces fixedly attached to each other to the position above the quartz sample cover through the push-pull motor; and the driving gear is driven to rotate by a rotating shaft of the second rotating motor, and the driven gear and the push-pull motor which is fixedly connected with the driven gear are driven by the driving gear to rotate until the polytetrafluoroethylene plate is perpendicular to the bottom of the hemispherical cavity and faces the position of the side light outlet hole. The closed hole plug closes the upper light outlet. Exciting light enters the hemispherical cavity through the light inlet, is reflected by the first reflector and hits the inner wall of the hemispherical cavity, and is emitted through the side light outlet after being subjected to multiple diffuse reflections in the hemispherical cavity, so that the environmental spectrum parameters in the hemispherical cavity are obtained.

Secondly, testing the luminous quantum efficiency of the luminous sample:

as shown in fig. 6, the luminescent sample is placed in the quartz sample holder; rotating the first reflector through the first rotating motor to enable the reflecting surface of the first reflector to face the light inlet; and the second reflecting mirror and the polytetrafluoroethylene plate which are fixedly attached to the back surfaces are kept above the quartz sample cover, and meanwhile, the position of the polytetrafluoroethylene plate which is perpendicular to the bottom of the hemispherical cavity and faces the side light outlet hole is kept unchanged. The closed hole plug closes the upper light outlet. Exciting light enters the hemispherical cavity through the light inlet, is reflected by the first reflector and penetrates through the quartz sample cover to irradiate the light-emitting sample, light emitted by the light-emitting sample is uniformly emitted through the side light outlet after being subjected to multiple times of diffuse reflection in the hemispherical cavity, spectral parameters of the light-emitting sample influenced by the environment in the hemispherical cavity are obtained, and the spectral parameters are obtained by operation with the environmental spectral parameters in the hemispherical cavity obtained by the first step of test to obtain the luminous quantum efficiency of the light-emitting sample.

In another aspect of the present application, there is provided a luminescence imaging measurement apparatus comprising the integrating hemisphere apparatus, a light source, and an imaging system;

the light source is used for emitting an excitation light beam to enter the hemispherical cavity through the light inlet hole 4;

the imaging system is positioned above the integrating hemispherical device and is used for receiving exciting light emitted from the light emitting hole II 8;

wherein the integrating hemisphere device is selected from the integrating hemisphere devices described above.

In still another aspect of the present application, a method for luminescence imaging of a luminescent material is provided, the method using the above luminescence imaging measurement apparatus;

the method comprises the following steps:

(a) Placing the luminescent material sample to be detected in the sample cover; rotating the first reflector through the first rotating motor to enable the reflecting surface of the first reflector to face the light inlet; drawing the second reflecting mirror to a position far away from the upper part of the sample cover by the push-pull motor;

(b) The closed hole plug closes the light outlet hole I, the light source emits excitation light beams, the excitation light beams enter the hemispherical cavity through the light inlet hole, the excitation light beams are reflected and transmitted by the first reflector to irradiate the luminescent material sample to be detected, and the excitation light emitted by the luminescent material sample to be detected is emitted through the light outlet hole II and enters the imaging system to perform luminescent imaging of the luminescent material sample to be detected.

As a specific embodiment, the method of luminescence imaging comprises:

as shown in fig. 7, the luminescent sample is placed in the quartz sample holder; rotating the first reflector through the first rotating motor to enable the reflecting surface of the first reflector not to be right opposite to the light inlet, wherein the excitation light beam entering the hemispherical cavity from the light inlet is reflected by the first reflector and then strikes the inner wall of the hemispherical cavity; and pulling the second reflector and the polytetrafluoroethylene plate with the back surfaces fixedly attached to the upper part far away from the quartz sample cover through the push-pull motor. The closed hole plug closes the side light outlet hole. Exciting light enters the hemispherical cavity through the light inlet, penetrates through the quartz sample cover through reflection of the first reflector, irradiates the inner wall of the hemispherical cavity, irradiates the luminescent sample through multiple diffuse reflections in the hemispherical cavity, and emits light emitted by the luminescent sample through the upper light outlet to perform luminescent imaging of the luminescent sample.

The beneficial effects that this application can produce include:

the integrating hemisphere device for the spectrum and yield test can achieve the functions of spectrum and luminous quantum efficiency test and imaging of a luminous sample, and can improve the test efficiency of a luminous material; meanwhile, the light-emitting sample is blocked outside the integrating sphere by the quartz sample cover, and the hemispherical cavity does not need to be opened during sample changing, so that the problem of integrating sphere pollution caused by repeatedly opening the hemispherical cavity or carelessly loading the sample is avoided.

Drawings

FIG. 1 is a schematic external view of an integrating hemisphere device in an embodiment of the present application;

FIG. 2 is a schematic half-section view of an integrated hemisphere device in an embodiment of the present application;

FIG. 3 is a schematic diagram of the second rotary motor and the push-pull motor of the integrating hemisphere device in an embodiment of the present application;

FIG. 4 is a schematic diagram of a spectrum test of an integrating hemispherical device in example 1 of the present application;

FIG. 5 is a diagram illustrating a first step of a luminescence quantum efficiency test of the integrating hemisphere device in example 2 of the present application;

FIG. 6 is a second step of the luminescence quantum efficiency test of the integrating hemispherical device in example 2 of the present application;

fig. 7 is a schematic diagram of luminescence imaging of the integrating hemisphere device in embodiment 3 of the present application.

Wherein:

1. the luminous sample cover comprises a shell, 2 parts of a hemispherical cavity, 3 parts of a quartz sample cover, 4 parts of a light inlet hole, 5 parts of a first rotating motor, 6 parts of a first reflector, 7 parts of a side light outlet hole, 8 parts of an upper light outlet hole, 9 parts of a closed hole plug, 10 parts of a second rotating motor, 11 parts of a driving gear, 12 parts of a driven gear, 13 parts of a push-pull motor, 14 parts of a second reflector, 15 parts of a polytetrafluoroethylene plate, 16 parts of a luminous sample

Detailed Description

The present application will be described in detail with reference to examples, but the present application is not limited to these examples.

The application provides a spectrum and productivity test are with integral hemisphere device collects the spectral test of luminescent material and device, luminous quantum efficiency test and imaging function in an organic whole, can greatly improve material photoluminescence characteristic test efficiency.

The application provides an integrating hemisphere device for spectrum and yield test, as shown in fig. 1 to 3, which mainly comprises an integrating hemisphere, an exciting light incidence module and an emitted light emergence module. The integrating hemisphere consists of a shell 1, a hemisphere cavity 2 and a quartz sample cover 3, wherein the shell 1 is used for protecting the hemisphere cavity 2 and is provided with parts of an exciting light incidence module and a transmitting light emergence module; the center of the bottom of the hemispherical cavity 2 is provided with a round hole, and the quartz sample cover 3 is arranged at the round hole arranged at the center of the bottom of the hemispherical cavity 2. The exciting light incidence module consists of a light inlet hole 4, a first rotating motor 5 and a first reflector 6, wherein the light inlet hole 4 is formed in the side walls of the shell 1 and the hemispherical cavity 2 and used for allowing exciting light to enter the hemispherical cavity 2; the first rotating motor 5 is installed at the top of the shell 1 and close to the side of the light inlet hole 4, the rotating shaft of the rotating motor extends into the hemispherical cavity 2, and the end part of the rotating motor is provided with a first reflector 6 which is obliquely installed at an angle of 45 degrees with the light inlet hole 4. The emitted light emitting module comprises a side light outlet 7, an upper light outlet 8, a second rotating motor 10, a driving gear 11, a driven gear 12, a push-pull motor 13, a second reflector 14 and a polytetrafluoroethylene plate 15, wherein the side light outlet 7 is arranged on the side walls of the shell 1 and the hemispherical cavity 2 in the vertical direction with the light inlet 4, and the upper light outlet 8 is arranged at the top of the shell 1 and the hemispherical cavity 2 and is opposite to the quartz sample cover 3; the second rotating motor 10 is arranged on the side wall of the shell 1 opposite to the side wall of the light inlet hole 4, a driving gear 11 is arranged on a rotating shaft of the second rotating motor, and a driven gear 12 is fixedly connected with the body of a push-pull motor 13 and meshed with the driving gear 11; the push-pull motor 13 is arranged on the side wall of the shell 1 and is opposite to the light inlet hole 4, a push-pull shaft of the push-pull motor 13 extends into the hemispherical cavity 2, and the end part of the push-pull shaft is provided with the first reflector 6 and the polytetrafluoroethylene plate 15, the back surfaces of which are fixedly attached.

The following describes a method for testing an integrating hemisphere device for spectrum and yield testing according to the present invention, which can respectively perform a spectrum test, a luminescence quantum efficiency test and a luminescence imaging method for a luminescence sample 16.

Example 1

The integrating hemisphere device for spectrum and yield test can be placed in a sample bin of a conventional spectrum instrument to carry out a spectrum test method of a luminescent sample 16, and as shown in fig. 4, the luminescent sample 16 is placed in a quartz sample cover 3; firstly, starting a first rotating motor 5, driving a first reflector 6 on the first rotating motor 5 to rotate by a rotating shaft of the first rotating motor 5, and stopping when a reflecting surface of the first reflector 6 is opposite to a light inlet hole 4; then starting a push-pull motor 13 to push a second reflecting mirror 14 and a polytetrafluoroethylene plate 15 with fixed back surfaces to be attached to the upper part of the quartz sample cover 3, and stopping; finally, the rotating shaft of the second rotating motor 10 is started to drive the driving gear 11 thereon to rotate, the driving gear 11 is meshed with the driven gear 12, and the driven gear 12 and the push-pull motor 13 fixedly connected with the driven gear can be driven to rotate until the second reflector 14 and the central line of the side light-emitting hole 7 form an angle of 45 degrees and the reflecting surface of the second reflector 14 faces downwards. The upper light outlet 8 is closed by a closed hole plug 9. Excitation light beams emitted by a light source enter the hemispherical cavity 2 through the light inlet 4, are reflected by the first reflector 6 and penetrate through the quartz sample cover 3 to irradiate the luminescent sample 16, most of light emitted by the luminescent sample 16 after excitation is reflected by the second reflector 14 and exits through the side light outlet 7 to enter the spectrum system, and spectrum test of the luminescent sample 16 is carried out.

Example 2

The method for testing the luminous quantum efficiency of the luminous sample by the integrating hemisphere device for spectrum and yield test,

step one, testing the environment in the hemispherical cavity 2:

as shown in fig. 5, the luminescent sample 16 is not placed in the quartz sample cover 3; firstly, a first rotating motor 5 is started to rotate a first reflector 6, so that the reflecting surface of the first reflector 6 is not aligned to a light inlet 4, and an excitation light beam entering a hemispherical cavity 2 from the light inlet 4 is reflected by the first reflector 6 and then is irradiated on the inner wall of the hemispherical cavity 2; then starting a push-pull motor 13 to push a second reflecting mirror 14 and a polytetrafluoroethylene plate 15 which are fixedly attached to the back surfaces to the upper part of the quartz sample cover 3; and finally, a rotating shaft of the second rotating motor 10 is started to drive the driving gear 11 on the second rotating motor to rotate, the driving gear 11 is meshed with the driven gear 12, and the driven gear 12 and the push-pull motor 13 which is fixedly connected with the driven gear can be driven to rotate to the position where the polytetrafluoroethylene plate 15 is perpendicular to the bottom of the hemispherical cavity 2 and faces the side light-emitting hole 7. The upper light outlet 8 is sealed by a sealed hole plug 9, and a high-reflection-efficiency cavity is arranged in the semi-integral sphere at the moment. Excitation light beams emitted by the light source enter the hemispherical cavity 2 through the light inlet hole 4, are reflected by the first reflector 6 to hit the inner wall of the hemispherical cavity 2, are subjected to multiple times of diffuse reflection in the hemispherical cavity 2, and then are uniformly emitted through the side light outlet hole 7 to enter the spectrum system, so that the environmental spectrum parameters in the hemispherical cavity 2 are obtained.

Second, the luminescence quantum efficiency of the luminescent sample 16 is tested:

as shown in fig. 6, the luminescent test piece 16 is placed in the quartz sample cover 3; the first rotating motor 5 is started again to rotate the first reflector 6, so that the reflecting surface of the first reflector 6 is opposite to the light inlet 4; the second reflector 14 and the polytetrafluoroethylene plate 15 with the back surfaces fixedly attached are kept above the quartz sample cover 3, and meanwhile the position of the polytetrafluoroethylene plate 15, which is perpendicular to the bottom of the hemispherical cavity 2 and faces the side light outlet 7, is kept unchanged. The upper light outlet 8 is sealed by a sealing hole plug 9. Excitation light beams emitted by a light source enter the hemispherical cavity 2 through the light inlet 4, are reflected by the first reflector 6 and penetrate through the quartz sample cover 3 to irradiate the light-emitting sample 16, light emitted by the light-emitting sample 16 after being excited is subjected to multiple diffuse reflections in the integrating sphere and then is uniformly emitted into the light spectrum system through the side light outlet 7, spectral parameters of the light-emitting sample 16 with environmental influence in the hemispherical cavity 2 are obtained, and the light-emitting quantum efficiency of the light-emitting sample 16 is obtained through operation with the spectral parameters of the environment in the hemispherical cavity 2 obtained through the first-step test.

Example 3

In the luminescence imaging method for the luminescence sample by using the integrating hemisphere device for spectrum and yield test, as shown in fig. 7, a whole set of integrating hemisphere device is arranged right below an imaging system; placing a luminescent sample 16 in a quartz sample cover 3; firstly, a first rotating motor 5 is started to rotate a first reflector 6, so that the reflecting surface of the first reflector 6 is not aligned to a light inlet 4, and an excitation light beam entering a hemispherical cavity 2 from the light inlet 4 is reflected by the first reflector 6 and then is irradiated on the inner wall of the hemispherical cavity 2; then the push-pull motor 13 is started to pull the second reflector 14 and the teflon plate 15 with the back surface fixedly attached to the upper position far away from the quartz sample cover 3. The closed hole plug 9 closes the side light outlet 7. Excitation light beams emitted by a light source enter the hemispherical cavity 2 through the light inlet hole 4, are reflected by the first reflector 6, penetrate through the quartz sample cover 3 and irradiate the inner wall of the hemispherical cavity 2, and are subjected to multiple diffuse reflections in the hemispherical cavity 2 to irradiate the light-emitting sample 16, and light emitted by the light-emitting sample 16 after being excited exits through the light outlet hole 8 right above and enters the imaging system, so that light-emitting imaging of the light-emitting sample 16 is realized.

Although the present invention has been described with reference to a few preferred embodiments, it should be understood that various changes and modifications can be made without departing from the spirit and scope of the invention as defined by the appended claims.

Claims (7)

1. An integrating hemisphere device, characterized in that,

the integrating hemisphere device mainly comprises an integrating hemisphere, an exciting light incidence module and a transmitting light emergence module, wherein the integrating hemisphere, the exciting light incidence module and the transmitting light emergence module are arranged along the direction of a light path;

the integrating hemisphere comprises a shell (1), a sample cover (3) and a shell (2) with a hemispherical cavity, wherein a round hole is formed in the center of the bottom of the cavity of the shell (2), the sample cover (3) is installed in the round hole, and the shell (1) is installed on the outer side of the shell (2); the shell (2) is also provided with a through hole I-1, a through hole II-1 and a through hole III-1; the shell (1) is provided with a through hole I-2, a through hole II-2 and a through hole III-2 which correspond to the through hole I-1, the through hole II-1 and the through hole III-1 in position; the through hole I-1 is communicated with the through hole I-2, and the through hole II-1 is communicated with the through hole II-2; the through hole III-1 is communicated with the through hole III-2;

the excitation light incidence module comprises a light inlet hole (4) and a rotatable first reflector (6); the light inlet hole (4) is communicated with the through hole I-2 and the through hole I-1 to form a light path I, the first reflector (6) is arranged in the hemispherical cavity, and the first reflector (6) and the light inlet hole (4) are obliquely arranged at an angle of 45 degrees;

the emitted light emergent module comprises a light emergent hole I (7), a light emergent hole II (8) and a second reflector (14) capable of telescopically rotating, wherein the light emergent hole I (7) is communicated with the through hole II-2 and the through hole II-1 to form a light path II, the light path II is vertical to the light path I, and the light emergent hole II (8) is communicated with the through hole III-2 and the through hole III-1; the second reflector (14) is arranged in the hemispherical cavity and is positioned at the position opposite to the light inlet (4).

2. An integrating hemisphere apparatus as recited in claim 1,

the excitation light incidence module further comprises a first rotating electrical machine (5); the first rotating motor (5) is arranged at the top of the shell (1) and close to the side of the light inlet hole (4);

the rotating shaft of the first rotating motor (5) extends into the hemispherical cavity, and the free end of the rotating shaft is provided with the first reflector (6).

3. An integrating hemisphere apparatus as recited in claim 1,

the emitted light emitting module further comprises a second rotating motor (10), a driving gear (11), a driven gear (12) and a push-pull motor (13);

the second rotating electrical machine (10) is mounted on the housing (1);

the driving gear (11) is mounted on a rotating shaft of the second rotating motor (10), the driving gear (11) is meshed with the driven gear (12), and the driven gear (12) is fixedly connected with the push-pull motor (13);

the back surface of the second reflector (14) is fixedly attached to a polytetrafluoroethylene plate (15);

and a push-pull shaft of the push-pull motor (13) extends into the hemispherical cavity, and the polytetrafluoroethylene plate (15) is arranged at the free end of the push-pull shaft.

4. An integrating hemisphere apparatus as recited in claim 1,

the through hole I-1 and the through hole II-1 are both arranged on the side wall of the shell (2);

the through hole III-1 is formed in the top of the shell (2) and vertically above the round hole.

5. An integrating hemisphere apparatus as recited in claim 1,

the integrating hemisphere device further comprises a closed hole plug (9) for closing the light outlet I (7) and/or the light outlet II (8).

6. A light emission characteristic measuring apparatus is characterized in that,

the luminescence characteristic measuring device comprises the integrating hemisphere device, a light source and a spectrum system;

the light source is used for emitting an excitation light beam to enter the hemispherical cavity through the light inlet hole (4);

the spectrum system is used for receiving exciting light emitted from the light emitting hole I (7);

wherein the integrating hemisphere device is selected from the integrating hemisphere devices of any one of claims 1 to 5.

7. A luminescence imaging measurement apparatus, characterized in that,

the luminescence imaging measurement device comprises the integrating hemisphere device, a light source and an imaging system;

the light source is used for emitting an excitation light beam to enter the hemispherical cavity through the light inlet hole (4);

the imaging system is positioned above the integrating hemispherical device and is used for receiving exciting light emitted from the light outlet II (8);

wherein the integrating hemisphere device is selected from the integrating hemisphere devices of any one of claims 1 to 5.

Images