CN217879519U - Automatic test circuit and electronic equipment - Google Patents

Abstract

The utility model discloses an automatic test circuit and electronic equipment, automatic test circuit includes controller, mode switching circuit, short circuit test circuit and voltage test circuit, and the controller is used for exporting short circuit test mode signal to make mode switching circuit export first test voltage to equipment under test through short circuit test circuit; the short circuit test circuit collects the voltage of a test point of the tested equipment and outputs a first voltage collection signal to the controller; when the controller detects that the tested equipment is not short-circuited according to the voltage of the test point, a voltage test mode signal is output to the mode switching circuit, so that the mode switching circuit outputs a second test voltage to a power supply end of the tested equipment; the voltage test circuit collects the voltage of the test point of the tested equipment and outputs a corresponding second voltage collection signal to the controller, and the controller outputs a voltage test result signal according to the second voltage collection signal. The utility model provides a can't carry out the problem of power short circuit test and output voltage test at a gear.

Description

Automatic test circuit and electronic equipment

Technical Field

The utility model relates to a circuit test field, in particular to automatic test circuit and electronic equipment.

Background

At present, a PCBA test system is divided into an ICT test, an FCT test, an aging test, a fatigue test and a severe environment test, and the ICT test is used as a first-step test of the PCBA, so how to quickly and efficiently test the PCBA is a key factor influencing subsequent tests of the PCBA and is a premise for ensuring quality. The existing test scheme is that a universal meter is firstly utilized to test whether the total power supply of the PCBA is short-circuited or not, after the test short circuit is completed, the output value of each test point voltage is tested correctly or not by manually adjusting the gear of the universal meter to the gear of the test voltage, the whole test process is complicated, time and labor are wasted, and the efficiency is low.

SUMMERY OF THE UTILITY MODEL

The utility model aims at providing an automatic test circuit and electronic equipment aims at solving the problem that can't carry out power short circuit test and output voltage test at a gear.

In order to achieve the above object, the utility model provides an automatic test circuit includes controller, mode switching circuit, short circuit test circuit and voltage test circuit, the controller respectively with the controlled end of mode switching circuit, the first output of short circuit test circuit and the output of voltage test circuit are connected, the first output of mode switching circuit with the input of short circuit test circuit is connected, the second output of short circuit test circuit is connected with the test point of equipment under test, the second output of mode switching circuit with the power end of equipment under test is connected; the acquisition end of the short circuit test circuit and the acquisition end of the voltage test circuit are respectively connected with the test point of the tested equipment; wherein,

the controller is used for outputting a short circuit test mode signal;

the mode switching circuit is used for outputting a first test voltage to the tested device through the short-circuit test circuit when the short-circuit test mode signal is received;

the short circuit test circuit is used for collecting the test point voltage of the tested equipment and outputting a first voltage collecting signal to the controller;

the controller is also used for outputting a voltage test mode signal to the mode switching circuit when the tested device is detected not to be short-circuited according to the test point voltage;

the mode switching circuit is further used for outputting a second test voltage to the power supply end of the tested device when receiving the voltage test mode signal;

the voltage test circuit is used for collecting the test point voltage of the tested equipment and outputting a corresponding second voltage collecting signal to the controller, so that the controller outputs a voltage test result signal to external equipment according to the second voltage collecting signal.

Optionally, the controller controls the mode switching circuit to stop working when detecting the short circuit of the device under test according to the test point voltage.

Optionally, the mode switching circuit includes a first resistor, a first triode, and a first relay, a first end of the first resistor is a controlled end of the mode switching circuit, a second end of the first resistor is connected to a base of the first triode, an emitter of the first triode is grounded, a collector of the first triode is connected to a coil output end of the first relay, a coil input end of the first relay is connected to a dc power supply, a first contact of the first relay is a first output end of the mode switching circuit, a second contact of the first relay is a second output end of the mode switching circuit, a third contact of the relay is used to access a first working voltage, so that the mode switching circuit outputs the first test voltage through the first contact of the first relay when receiving the short circuit test mode signal, and a fourth contact of the relay is used to access a second working voltage, so that the second contact of the first relay outputs the second test voltage when receiving the voltage test mode signal.

Optionally, the short circuit test circuit includes a second resistor and a third resistor, a first end of the second resistor is the input end of the short circuit test circuit, a second end of the second resistor is the acquisition end of the short circuit test circuit and is connected to a first end of the third resistor, and a second end of the third resistor is the output end of the short circuit test circuit.

Optionally, the voltage test circuit includes a fourth resistor and a fifth resistor, a first end of the fourth resistor is the input end of the voltage test circuit, a second end of the fourth resistor is the acquisition end of the voltage test circuit and is connected to the first end of the fifth resistor, and a second end of the fifth resistor is grounded.

Optionally, the number of the short circuit test circuits is multiple, and the acquisition end of each short circuit test circuit is connected with a test point of the device under test;

the number of the voltage test circuits is multiple, and the acquisition end of each voltage test circuit is connected with one test point of the tested equipment;

the automatic test circuit further comprises:

a plurality of input ends of the first analog switch chip are connected with the output ends of the short circuit test circuits in a one-to-one correspondence manner, a controlled end of the first analog switch chip is connected with the output end of the controller, and the output end of the first analog switch chip is connected with the first input end of the controller;

a plurality of input ends of the second analog switch chip are connected with the output ends of the plurality of voltage test circuits in a one-to-one correspondence manner, a controlled end of the second analog switch chip is connected with the output end of the controller, and the output end of the second analog switch chip is connected with a second input end of the controller;

the controller is also used for outputting a channel selection signal when receiving a channel selection trigger signal;

the first analog switch chip is used for controlling the conduction of one input end and the output end of the first analog switch chip according to the channel selection signal;

the second analog switch chip is used for controlling the conduction of an input end and an output end of the second analog switch chip according to the channel selection signal.

Optionally, the controller further comprises:

and the output end of the power supply circuit is connected with the input end of the mode switching circuit, and the power supply circuit is used for providing a first working voltage for the mode switching circuit so that the mode switching circuit outputs the first test voltage when receiving the short-circuit test mode signal.

Optionally, the automatic test circuit further comprises:

the isolation circuit is arranged between the short-circuit test circuit and the voltage test circuit in series and is used for carrying out signal isolation on the short-circuit test circuit and the voltage test circuit.

The utility model also provides an electronic equipment, electronic equipment includes as above automatic test circuit.

The utility model discloses technical scheme passes through controller output short circuit test mode signal to mode switching circuit, and mode switching circuit exports first test voltage to short circuit test circuit when receiving short circuit test mode signal, and short circuit test circuit gathers the voltage between the test point of equipment under test to ground when receiving short circuit test signal, exports corresponding first voltage acquisition signal to the controller; when the controller detects that the tested equipment is not short-circuited according to the voltage of the test point, a voltage test mode signal is output to the mode switching circuit; the mode switching circuit outputs a second test voltage to the tested equipment when receiving the voltage test mode signal; then, the voltage test circuit collects the test point voltage of the tested equipment and outputs a corresponding second voltage collection signal to the controller; the controller outputs a voltage test result signal to the external device according to the second voltage acquisition signal. When the automatic test circuit detects that the tested equipment is not short-circuited, the automatic test circuit can automatically switch to a voltage test mode to test whether the output voltage of the tested equipment is normal or not, and two gears are not needed to separately test whether the tested equipment is short-circuited or not and whether the output voltage of the tested equipment is normal or not. The utility model provides a can't carry out the problem of power short circuit test and output voltage test at a gear.

Drawings

In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings needed to be used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to the structures shown in the drawings without creative efforts.

Fig. 1 is a schematic diagram of a functional module according to an embodiment of the present invention;

fig. 2 is a circuit diagram of an embodiment of a mode switching circuit in the automatic test circuit of the present invention;

FIG. 3 is a circuit diagram of an embodiment of a short circuit test circuit in an automatic test circuit according to the present invention;

fig. 4 is a circuit structure diagram of an embodiment of the voltage testing circuit in the automatic testing circuit of the present invention.

The reference numbers illustrate:

reference numerals	Name (R)	Reference numerals	Name (R)
				10	Controller for controlling a motor	100	Automatic test circuit
20	Mode switching circuit	R1～R5	First to fifth resistors
				30	Short circuit test circuit	Q1	A first triode
40	Voltage test circuit	J1	First relay
				V1	First operating voltage	V2	Second operating voltage

The realization, the functional characteristics and the advantages of the utility model are further explained by combining the embodiment and referring to the attached drawings.

Detailed Description

The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by a person skilled in the art without making creative efforts belong to the protection scope of the present invention.

It should be noted that, if directional indications (such as up, down, left, right, front, back, 8230; \8230;) are provided in the embodiments of the present invention, the directional indications are only used to explain the relative position relationship between the components, the motion situation, etc. in a specific posture (as shown in the attached drawings), and if the specific posture is changed, the directional indications are correspondingly changed.

In addition, if there is a description relating to "first", "second", etc. in the embodiments of the present invention, the description of "first", "second", etc. is for descriptive purposes only and is not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one such feature. In addition, the technical solutions in the embodiments may be combined with each other, but it must be based on the realization of those skilled in the art, and when the technical solutions are contradictory to each other or cannot be realized, such a combination should not be considered to exist, and is not within the protection scope of the present invention.

At present, a PCBA test system is divided into an ICT test, an FCT test, an aging test, a fatigue test and a severe environment test, and the ICT test is used as a first-step test of the PCBA, so how to quickly and efficiently test the PCBA is a key factor influencing subsequent tests of the PCBA and is a premise for ensuring quality. The existing scheme tests only whether the total power supply of the PCBA is short-circuited or not, and after the short circuit is tested, the output value of the voltage of each test point after power-on is tested whether to be correct or not, and the two steps cannot share one test gear for testing.

The utility model provides an automatic test circuit 100.

Referring to fig. 1 to 4, in an embodiment of the present invention, the automatic test circuit 100 includes a controller 10, a mode switching circuit 20, a short-circuit test circuit 30 and a voltage test circuit 40, the controller 10 is respectively connected to the controlled terminal of the mode switching circuit 20, the first output terminal of the short-circuit test circuit 30 and the output terminal of the voltage test circuit 40, the first output terminal of the mode switching circuit 20 is connected to the input terminal of the short-circuit test circuit 30, the second output terminal of the short-circuit test circuit 30 is connected to the test point of the device under test, and the second output terminal of the mode switching circuit 20 is connected to the power source terminal of the device under test; the acquisition end of the short circuit test circuit 30 and the acquisition end of the voltage test circuit 40 are respectively connected with the test point of the tested device; wherein,

the controller 10 is configured to output a short circuit test mode signal;

the mode switching circuit 20 is configured to output a first test voltage to the device under test through the short-circuit test circuit 30 when receiving the short-circuit test mode signal;

the short circuit test circuit 30 is configured to collect a test point voltage of the device under test, and output a first voltage collection signal to the controller 10;

the controller 10 is further configured to output a voltage test mode signal to the mode switching circuit 20 when it is detected that the device under test is not short-circuited according to the test point voltage;

the mode switching circuit 20 is further configured to output a second test voltage to the power supply terminal of the device under test when receiving the voltage test mode signal;

the voltage test circuit 40 is configured to collect a test point voltage of the device under test, and output a corresponding second voltage collection signal to the controller 10, so that the controller 10 outputs a voltage test result signal to an external device according to the second voltage collection signal.

In this embodiment, when a user wants to test a device under test, the short-circuit test trigger signal may be output to the controller 10 through an external device, so that the controller 10 outputs a short-circuit test mode signal to the mode switching circuit 20; the controller 10 may be a Digital Signal Processor (DSP), a Programmable Logic Device (PLD), a Field Programmable Gate Array (FPGA), a microprocessor, an MCU, or other electronic components. The mode switching circuit 20 changes to the short-circuit test mode after receiving the short-circuit test mode signal, and outputs a first test voltage to the device under test through the short-circuit test circuit 30, where the voltage value of the first voltage signal may be a smaller voltage value, such as 0.8V, and may not reach the working voltage of the device under test, so that the device under test may not be driven to work, and the specific voltage value may be set according to the user requirement and the actual situation; the first voltage signal is output to the test point of the device under test through the short-circuit test circuit 30, the short-circuit test circuit 30 can collect the voltage between the test point of the device under test and the ground through the collection end, it can be understood that the second output end and the collection end of the short-circuit test circuit 30 are the same port, the short-circuit test circuit 30 outputs the voltage to the test point of the device under test through the second output end, collects the voltage of the second output end, that is, the test point, and then outputs the corresponding first voltage collection signal to the controller 10, and the controller 10 outputs the voltage test mode signal to the mode switching circuit 20 when detecting that the device under test is not short-circuited according to the voltage of the test point; for example, a first preset voltage value may be set in the controller 10, and when the voltage value of the first voltage acquisition signal is greater than the first preset voltage value, it represents that there is no short circuit between the test point of the device under test and the ground, the voltage test may be continued, and the controller 10 may output a voltage test mode signal to the mode switching circuit 20; the mode switching circuit 20 changes to the voltage test mode after receiving the voltage test mode signal, at this time, the mode switching circuit 20 outputs a second test voltage to the device under test, the second test voltage is a working voltage required by the device under test when the device under test normally works, the voltage test circuit 40 collects the output voltage of the test point of the device under test at this time, and outputs a corresponding second voltage collection signal to the controller 10; the controller 10 outputs a voltage test result signal to the external device according to the second voltage acquisition signal; for example, a second preset voltage value of 3V is set in the controller 10, and when the voltage value of the second voltage acquisition signal is within 0.3V compared with the fluctuation of the second preset voltage value, that is, the voltage value of the second voltage acquisition signal is within 2.7V to 3.3V, it represents that the output voltage of the device to be tested is normal, and the device to be tested works normally; if the output voltage is not within the range, the output voltage of the tested device is abnormal, and the tested device has a fault; the specific corresponding relation between the second preset voltage value and the voltage value of the second voltage acquisition signal can be set according to the actual condition of the equipment to be tested. The specific voltage condition can be output to an external device or a terminal server through the controller 10, so that a user can conveniently inquire through a mobile phone or a bluetooth device and the like.

The utility model discloses technical scheme passes through controller 10 output short circuit test mode signal to mode switching circuit 20, and mode switching circuit 20 exports first test voltage to short circuit test circuit 30 when receiving short circuit test mode signal, and short circuit test circuit 30 gathers the voltage between the test point of equipment under test to ground when receiving short circuit test signal, exports corresponding first voltage acquisition signal to controller 10; when detecting that the device under test is not short-circuited according to the test point voltage, the controller 10 outputs a voltage test mode signal to the mode switching circuit 20; the mode switching circuit 20 outputs a second test voltage to the device under test when receiving the voltage test mode signal; then, the voltage test circuit 40 collects the voltage of the test point of the tested device and outputs a corresponding second voltage collection signal to the controller 10; the controller 10 outputs a voltage test result signal to the external device according to the second voltage collecting signal. When the automatic test circuit 100 detects that the device to be tested is not short-circuited, the automatic test circuit can automatically switch to the voltage test mode to test whether the output voltage of the device to be tested is normal or not, and two gears are not needed to separately test whether the device to be tested is short-circuited and whether the output voltage of the device to be tested is normal or not. The utility model provides a can't carry out the problem of power short circuit test and output voltage test at a gear.

In an embodiment, the controller 10 controls the mode switching circuit 20 to stop operating when detecting the short circuit of the device under test according to the test point voltage.

In this embodiment, when the controller 10 detects that the device under test is short-circuited according to the voltage of the test point, the mode switching circuit 20 is controlled to stop working, for example, when the first voltage acquisition signal is less than or equal to the first preset voltage value, it represents that a short circuit occurs between a power supply of the device under test and the ground, and at this time, the controller 10 controls the power supply to be powered off, so that the mode switching circuit 20 stops working; before the controller 10 controls the power supply to be powered off, an alarm prompt signal can be output to prompt a user that the tested equipment is short-circuited, and specifically, the user can be prompted in a buzzing or lighting mode. In this embodiment, when the first voltage collecting signal is smaller than or equal to the first preset voltage value, the controller 10 continuously outputs the short-circuit test mode signal to the mode switching circuit 20, so that the automatic test circuit 100 can be always kept in the short-circuit test mode.

Referring to fig. 2, in an embodiment, the mode switching circuit 20 includes a first resistor R1, a first transistor Q1, and a first relay J1, a first end of the first resistor R1 is a controlled end of the mode switching circuit 20, a second end of the first resistor R1 is connected to a base of the first transistor Q1, an emitter of the first transistor Q1 is grounded, a collector of the first transistor Q1 is connected to a coil output end of the first relay J1, a coil input end of the first relay J1 is connected to a dc power supply, a first contact of the first relay J1 is a first output end of the mode switching circuit 20, a second contact of the first relay J1 is a second output end of the mode switching circuit 20, a third contact of the relay is configured to connect to a first operating voltage V1, so that the mode switching circuit 20 outputs the first test voltage through the first contact of the first relay J1 when receiving the short-circuit test mode signal, and a fourth contact of the relay is configured to connect to a second operating voltage V2, so that the second relay J1 outputs the second test voltage when receiving the short-circuit test signal.

In this embodiment, the first resistor R1 may function as a current-limiting resistor, so as to prevent the component in the circuit from being damaged by an excessive current; when receiving the short circuit test mode signal, the mode switching circuit 20 outputs a corresponding first test voltage and a corresponding second test voltage, for example, when receiving the short circuit test mode signal, a signal received by a base of the first transistor Q1 is a low level, the first transistor Q1 is not turned on, so that a dc power received by a coil input terminal of the first relay J1 cannot be output through the coil output terminal, at this time, the first contact and the third contact of the relay are turned on, the first working voltage V1 may be output to the short circuit test circuit 30 through the relay, that is, the mode switching circuit 20 may output the first test voltage, when receiving the voltage test mode signal, a signal received by the base of the first transistor Q1 is a high level, the first transistor Q1 is turned on, so that the dc power received by the coil input terminal of the first relay J1 may be output through the coil output terminal, at this time, the second working voltage V2 may be output to the voltage test circuit 40 through the relay, that the mode switching circuit 20 may output the second test voltage, because the first working voltage required for the short circuit may be directly switched to the relay 10, and the external test voltage may be provided, and the external test device may provide the test voltage, when the test voltage required to be provided by the external test voltage, the external test device 10. In this embodiment, the mode switching circuit 20 formed by the first resistor R1, the first transistor Q1 and the first relay J1 may output the corresponding first test voltage and the second test voltage when receiving the short-circuit test mode signal and the voltage test mode signal.

Referring to fig. 3, in an embodiment, the short circuit test circuit 30 includes a second resistor R2 and a third resistor R3, a first end of the second resistor R2 is an input end of the short circuit test circuit 30, a second end of the second resistor R2 is a collecting end of the short circuit test circuit 30 and is connected to a first end of the third resistor R3, and a second end of the third resistor R3 is an output end of the short circuit test circuit 30.

In this embodiment, the second resistor R2 functions as a voltage dividing resistor to divide voltage with a load resistor of the device under test, and the third resistor R3 may function as a current limiting resistor to prevent damage to components in the circuit due to excessive current; the collecting terminal of the short circuit test circuit 30 collects the voltage between the test point of the device under test and the ground, that is, the voltage across the load resistor of the device under test, and outputs a corresponding first voltage collecting signal to the controller 10. In this embodiment, the short circuit test circuit 30 formed by the second resistor R2 and the third resistor R3 may collect a voltage between a test point of the device under test and ground, and output a first voltage collection signal to the controller 10.

Referring to fig. 4, in an embodiment, the voltage testing circuit 40 includes a fourth resistor R4 and a fifth resistor R5, a first end of the fourth resistor R4 is an input end of the voltage testing circuit 40, a second end of the fourth resistor R4 is a collecting end of the voltage testing circuit 40 and is connected to a first end of the fifth resistor R5, and a second end of the fifth resistor R5 is grounded.

In this embodiment, the fourth resistor R4 and the fifth resistor R5 play a role of a divider resistor, the voltage test circuit 40 collects the voltage of the test point through the collection end, and the voltage collected by the collection end of the voltage test circuit 40 is divided through the fourth resistor R4 and the fifth resistor R5 to obtain a second voltage collection signal, which is then output to the controller 10 through the output end. In this embodiment, the voltage test circuit 40 formed by the fourth resistor R4 and the fifth resistor R5 may collect the test point voltage of the device under test, divide the collected voltage, and output a second voltage collection signal to the controller 10.

In an embodiment, the number of the short circuit test circuits 30 is multiple, and the acquisition end of each short circuit test circuit 30 is connected to a test point of the device under test;

the number of the voltage test circuits 40 is multiple, and the acquisition end of each voltage test circuit 40 is connected with a test point of the tested device;

the automatic test circuit 100 further comprises:

a plurality of input ends of the first analog switch chip are connected with the output ends of the plurality of short circuit test circuits 30 in a one-to-one correspondence manner, a controlled end of the first analog switch chip is connected with the output end of the controller 10, and the output end of the first analog switch chip is connected with a first input end of the controller 10;

a plurality of input ends of the second analog switch chip are connected with the output ends of the plurality of voltage test circuits 40 in a one-to-one correspondence manner, a controlled end of the second analog switch chip is connected with the output end of the controller 10, and the output end of the second analog switch chip is connected with a second input end of the controller 10;

the controller 10 is further configured to output a channel selection signal when receiving a channel selection trigger signal;

the first analog switch chip is used for controlling the conduction of one input end and the output end of the first analog switch chip according to the channel selection signal;

the second analog switch chip is used for controlling the conduction of an input end and an output end of the second analog switch chip according to the channel selection signal.

In this embodiment, the device under test usually has a plurality of test points to be tested, so the automatic test circuit 100 may be provided with a plurality of short circuit test circuits 30 and a plurality of voltage test circuits 40, and the acquisition end of each short circuit test circuit 30 and the input end of each voltage test circuit 40 are correspondingly connected to one test point of the device under test; the first analog switch chip and the second analog switch chip can adopt analog switch chips of BL1551 and other models; the first analog switch chip is arranged between the controller 10 and the plurality of short circuit test circuits 30 and can control whether any one short circuit test circuit 30 is conducted with the controller 10, and the second analog switch chip is similar to the first analog switch chip; when a test point is desired to be tested, a user can selectively trigger the test point to the controller 10 through an output channel of the external device, and the controller 10 outputs a channel selection signal to control the first analog switch chip and the second analog switch chip, so that the short circuit test circuit 30 and the voltage test circuit 40 connected to the test point are conducted with the controller 10, and the controller 10 can read a first voltage acquisition signal and a second voltage acquisition signal of the test point. The controller 10 may also control each short-circuit test circuit 30 and each voltage test circuit 40 to be conducted with the controller 10 in sequence through a preset program, so as to read the first voltage acquisition signal and the second voltage acquisition signal of each test point in sequence, thereby obtaining the specific condition of each test point. In this embodiment, the first analog switch chip and the second analog switch chip can control the short circuit test circuit 30 and the voltage test circuit 40 connected to any one test point to be conducted with the controller 10, so as to read the first voltage acquisition signal and the second voltage acquisition signal of the test point.

In one embodiment, the controller 10 further comprises:

and the output end of the power supply circuit is connected with the input end of the mode switching circuit 20, and the power supply circuit is used for providing a first working voltage V1 for the mode switching circuit 20, so that the mode switching circuit 20 outputs the first test voltage when receiving the short-circuit test mode signal.

In this embodiment, the power supply circuit may include a plurality of resistors and a plurality of amplifiers, and the power supply circuit outputs a smaller test voltage to the mode switching circuit 20 after replacing the operating voltage of the controller 10, so that the mode switching circuit 20 outputs a first test voltage when receiving the short-circuit test mode signal, the test voltage may be set to about 0.8V, and the specific voltage value may be set according to the actual condition of the device under test. The present embodiment can supply the first test voltage that needs to be output at the time of the short circuit test to the mode switching circuit 20 through the power supply circuit.

Referring to fig. 3, in an embodiment, the automatic test circuit 100 further includes:

and the isolation circuit is arranged between the short-circuit test circuit 30 and the voltage test circuit 40 in series and is used for carrying out signal isolation on the short-circuit test circuit 30 and the voltage test circuit 40.

In this embodiment, the isolation circuit may be implemented by a diode, such as a schottky diode, because the diode has a characteristic of unidirectional conduction, and the schottky diode bears high withstand voltage and has a small forward voltage drop, which is a better choice, a cathode of the diode is connected to the output terminal of the short circuit test circuit 30, and an anode of the diode is connected to the input terminal of the voltage test circuit 40; when a power supply short circuit test is carried out, the voltage value output by the mode switching circuit 20 is small, the voltage output to the voltage test circuit 40 by the short circuit test circuit 30 is also small, and the circuit cannot be influenced; when the output voltage is tested, the voltage value output by the mode switching circuit 20 is large, the voltage collected by the voltage testing circuit 40 is also large, and the diode can prevent the large voltage from being output to the short-circuit testing circuit 30 through the voltage testing circuit 40, so that components in the short-circuit testing circuit 30 are damaged. In the embodiment, the short circuit test circuit 30 is isolated from the voltage test circuit 40 through the isolation circuit, so that the situation that when the output voltage is tested, the large voltage collected by the voltage test circuit 40 is output to the short circuit test circuit 30 to cause damage to components in the short circuit test circuit 30 can be prevented.

The utility model also provides an electronic equipment.

In an embodiment, the electronic device includes the automatic test circuit 100 as described above. The specific structure of the automatic test circuit 100 refers to the above embodiments, and since the electronic device adopts all technical solutions of all the above embodiments, at least all the beneficial effects brought by the technical solutions of the above embodiments are achieved, and details are not repeated herein.

The above is only the optional embodiment of the present invention, and not therefore the limit to the patent scope of the present invention, all the technical ideas of the present invention are utilized, the equivalent structure transformation made by the contents of the specification and the drawings, or the direct/indirect application in other related technical fields are included in the patent protection scope of the present invention.

Claims (9)

1. An automatic test circuit is characterized by comprising a controller, a mode switching circuit, a short circuit test circuit and a voltage test circuit, wherein the controller is respectively connected with a controlled end of the mode switching circuit, a first output end of the short circuit test circuit and an output end of the voltage test circuit; the acquisition end of the short circuit test circuit and the acquisition end of the voltage test circuit are respectively connected with the test point of the tested equipment; wherein,

the controller is used for outputting a short circuit test mode signal;

the mode switching circuit is used for outputting a first test voltage to the tested device through the short-circuit test circuit when the short-circuit test mode signal is received;

the short circuit test circuit is used for collecting the voltage of the test point of the tested equipment and outputting a first voltage collecting signal to the controller;

the controller is also used for outputting a voltage test mode signal to the mode switching circuit when the tested device is detected not to be short-circuited according to the test point voltage;

the mode switching circuit is further used for outputting a second test voltage to the power supply end of the tested device when receiving the voltage test mode signal;

the voltage test circuit is used for collecting the test point voltage of the tested equipment and outputting a corresponding second voltage collecting signal to the controller, so that the controller outputs a voltage test result signal to external equipment according to the second voltage collecting signal.

2. The automatic test circuit of claim 1 wherein the controller is further configured to control the mode switching circuit to cease operation upon detection of a short circuit of the device under test based on the test point voltage.

3. The automatic test circuit according to claim 1, wherein the mode switching circuit comprises a first resistor, a first transistor, and a first relay, a first end of the first resistor is a controlled end of the mode switching circuit, a second end of the first resistor is connected to a base of the first transistor, an emitter of the first transistor is grounded, a collector of the first transistor is connected to a coil output end of the first relay, a coil input end of the first relay is connected to a dc power supply, a first contact of the first relay is a first output end of the mode switching circuit, a second contact of the first relay is a second output end of the mode switching circuit, a third contact of the relay is used for connecting in a first operating voltage, so that the mode switching circuit outputs the first test voltage through the first contact of the first relay when receiving the short circuit test mode signal, and a fourth contact of the relay is used for connecting in a second operating voltage, so that the mode switching circuit outputs the second test voltage through the second contact of the first relay when receiving the voltage test mode signal.

4. The automatic test circuit of claim 1, wherein the short circuit test circuit comprises a second resistor and a third resistor, a first end of the second resistor being an input end of the short circuit test circuit, a second end of the second resistor being a collection end of the short circuit test circuit and being connected to a first end of the third resistor, and a second end of the third resistor being an output end of the short circuit test circuit.

5. The automatic test circuit of claim 1, wherein the voltage test circuit comprises a fourth resistor and a fifth resistor, a first terminal of the fourth resistor is an input terminal of the voltage test circuit, a second terminal of the fourth resistor is a collection terminal of the voltage test circuit and is connected to a first terminal of the fifth resistor, and a second terminal of the fifth resistor is connected to ground.

6. The automatic test circuit of claim 1, wherein the number of the short circuit test circuits is plural, and the collection end of each short circuit test circuit is connected to a test point of the device under test;

the number of the voltage test circuits is multiple, and the acquisition end of each voltage test circuit is connected with one test point of the tested equipment;

the automatic test circuit further comprises:

a plurality of input ends of the first analog switch chip are connected with the output ends of the short circuit test circuits in a one-to-one correspondence manner, a controlled end of the first analog switch chip is connected with the output end of the controller, and the output end of the first analog switch chip is connected with the first input end of the controller;

a plurality of input ends of the second analog switch chip are connected with the output ends of the plurality of voltage test circuits in a one-to-one correspondence manner, a controlled end of the second analog switch chip is connected with the output end of the controller, and the output end of the second analog switch chip is connected with a second input end of the controller;

the controller is also used for outputting a channel selection signal when receiving a channel selection trigger signal;

the first analog switch chip is used for controlling the conduction of one input end and the output end of the first analog switch chip according to the channel selection signal;

the second analog switch chip is used for controlling the conduction of one input end and the output end of the second analog switch chip according to the channel selection signal.

7. The automatic test circuit of claim 1, wherein the controller further comprises:

and the output end of the power supply circuit is connected with the input end of the mode switching circuit, and the power supply circuit is used for providing a first working voltage for the mode switching circuit so that the mode switching circuit outputs the first test voltage when receiving the short circuit test mode signal.

8. The automatic test circuit of claim 1, wherein the automatic test circuit further comprises:

the isolation circuit is arranged between the short-circuit test circuit and the voltage test circuit in series and is used for carrying out signal isolation on the short-circuit test circuit and the voltage test circuit.

9. An electronic device, characterized in that the electronic device comprises an automatic test circuit according to any of claims 1-8.

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