CN217846541U

CN217846541U - Hall integrated circuit on-line high-low temperature test system

Info

Publication number: CN217846541U
Application number: CN202221070892.9U
Authority: CN
Inventors: 陈志伟; 占志敏; 詹雅明
Original assignee: Shenzhen Youlifan Technology Co ltd
Current assignee: Shenzhen Youlifan Technology Co ltd
Priority date: 2022-05-06
Filing date: 2022-05-06
Publication date: 2022-11-18
Anticipated expiration: 2032-05-06

Abstract

The utility model relates to a test system technical field, concretely relates to online high low temperature test system of hall integrated circuit, including the host computer, the host computer electrical connection has the HIL switch board, HIL switch board electrical connection has the integrated circuit frame, HIL switch board electrical connection has circuit environment cabin, circuit environment cabin and the equal electrical connection of HIL switch board have charging device, charging device and integrated circuit frame electrical connection are in the same place, the HIL switch board includes the IO integrated circuit board, the beneficial effects of the utility model are that: the Hall integrated circuit that will detect places the test on the circuit bracket, through high low temperature device and air pressure device's regulation, carries out effectual observation and record to integrated circuit board, tests its under different atmospheric pressure size, the high low temperature detection effect of circuit board to can collect various trouble and contrast and detect convenient and fast.

Description

Hall integrated circuit on-line high-low temperature test system

Technical Field

The utility model relates to a test system technical field, concretely relates to online high low temperature test system of hall integrated circuit.

Background

The Hall integrated circuit is a product integrating Hall element and electronic circuit, and is made up by using Hall element, amplifier, temperature compensation circuit and voltage-stabilizing circuit and utilizing integrated circuit process technology. It can sense all the physical quantity related to magnetism and can output related electric control information, so that the Hall integrated circuit is an integrated circuit, and is a magnetic-sensing sensor, it is generally made up by adopting DIP or flat package, when an electrified semiconductor thin sheet is vertically placed in the magnetic field, the two sides of said thin sheet can produce potential difference, so that said phenomenon is called Hall effect. The potential difference is called Hall potential, the magnitude of the potential E = KIB/d, wherein K is Hall coefficient, d is the thickness of the sheet, I is current, and B is magnetic induction intensity. Principle of the hall effect: in three-dimensional space, the Hall semiconductor flat plate is in an XOY plane, the direction of the Hall semiconductor flat plate is vertical to the direction of a magnetic field, the magnetic field points to the direction of a Y axis, current I is conducted along the direction of an X axis, and due to the interaction of moving charges and the magnetic field, hall potential E is generated in the direction of a Z axis and can reach dozens of millivolts generally. Therefore, the Hall element and the electronic circuit are integrated on a silicon substrate of about 2mm x 2mm, and the Hall integrated circuit with good temperature stability and high reliability is manufactured.

The Hall integrated circuit is an important certification when testing the high and low temperatures, and is very troublesome when testing the Hall integrated circuit every time, the Hall integrated circuit can only be singly tested at the high and low temperatures, and when different air pressures occur, the detection result of data can deviate, so that different results occur, and the problems of test errors and the like are caused.

Therefore, it is necessary to design an online high and low temperature test system for the hall ic.

SUMMERY OF THE UTILITY MODEL

Therefore, the utility model provides an online high low temperature test system of hall integrated circuit, through high low temperature detecting system to solve and hall integrated circuit is a very important authentication carrying out high microthermal test, when testing it at every turn, all very special trouble, can only be single carry out high temperature and microthermal test to integrated circuit, when different atmospheric pressure appears in the side, the deviation will appear in the testing result of data, thereby the different result appears, cause the test to go wrong scheduling problem.

In order to achieve the above object, the present invention provides the following technical solutions: on-line high low temperature test system of hall integrated circuit, including the host computer, the host computer electrical connection has the HIL switch board, HIL switch board electrical connection has the integrated circuit frame, HIL switch board electrical connection has circuit environment cabin, the equal electrical connection of circuit environment cabin and HIL switch board has charging device, charging device and integrated circuit frame electrical connection are in the same place.

Preferably, the HIL control cabinet includes the IO integrated circuit board, IO integrated circuit board electric connection has the fault injection module, fault injection module electric connection has power supply management module, power supply management module electric connection has real-time control module.

Preferably, the circuit environment cabin comprises a high temperature device, the high temperature device is electrically connected with a low temperature device, and the low temperature device is electrically connected with an air pressure adjusting device.

Preferably, the upper computer is electrically connected with upper computer management software, the upper computer management software is electrically connected with test quantity, the test quantity is electrically connected with high and low temperature detection, and the high and low temperature detection is electrically connected with fault analysis.

Preferably, the upper computer management software comprises an integrated circuit board to be tested, the selected integrated circuit board to be tested is electrically connected with an editing fault, and the editing fault is electrically connected with the charging device, the integrated circuit frame and the circuit environment cabin.

Preferably, the high and low temperature detection comprises high and low temperature and air pressure regulation, and the high and low temperature and air pressure regulation are electrically connected with recording process data.

Preferably, the fault analysis includes data analysis, and the data analysis is electrically connected with test result processing.

The utility model has the advantages that: the Hall integrated circuit that will detect places the test on the circuit bracket, through high low temperature device and air pressure device's regulation, carries out effectual observation and record to integrated circuit board, tests its under different atmospheric pressure size, the high low temperature detection effect of circuit board to can collect various trouble and contrast and detect convenient and fast.

Drawings

Fig. 1 is a schematic diagram of a hall ic online high and low temperature test system provided by the present invention;

fig. 2 is an internal diagram of a control cabinet of the hall ic online high and low temperature test system provided by the present invention;

fig. 3 is an internal view of an environmental chamber of the hall ic online high and low temperature testing system provided by the present invention;

FIG. 4 is a flow chart of the working principle of the Hall integrated circuit online high and low temperature test system provided by the present invention;

in the figure: 1. an upper computer; 2. a HIL control cabinet; 201. IO board card; 202. a fault injection module; 203. a power supply management module; 204. a real-time control module; 3. an integrated circuit shelf; 4. a circuit environment compartment; 401. a high temperature device; 402. a cryogenic device; 403. an air pressure adjusting device; 5. a charging device; 6. selecting an integrated circuit board to be tested; 7. editing faults; 8. recording process data; 9. adjusting high and low temperature and air pressure; 10. analyzing data; 11. processing a test result; 12. upper computer management software; 13. testing quantity; 14. detecting high and low temperatures; 15. and (5) fault analysis.

Detailed Description

The preferred embodiments of the present invention will be described in conjunction with the accompanying drawings, and it will be understood that they are presented herein only to illustrate and explain the present invention, and not to limit the present invention.

Referring to the attached drawings 1-4, the hall integrated circuit on-line high and low temperature test system provided by the utility model comprises an upper computer 1, the upper computer 1 can control an HIL control cabinet 2, and observe the real-time state of the HIL control cabinet 2, an integrated circuit frame 3 and a circuit environment cabin 4 through the upper computer 1, and play back the whole process data after the test is finished, analyze the data of high temperature and low temperature detection under different air pressures, and make corresponding judgment, for the prior published patent technology product, the upper computer 1 is electrically connected with the HIL control cabinet 2, the HIL control cabinet 2 can connect lead wires to an IO board card 201, the HIL control cabinet 2 is electrically connected with the integrated circuit frame 3, the upper end of the integrated circuit frame 3 can be placed with hall integrated circuit boards of different quantities, detect, 2 electric connection of HIL switch board has circuit environment cabin 4, different temperature and atmospheric pressure can be changed at the middle part of circuit environment cabin 4, the convenience is observed and analysis testing result to the circuit board, circuit environment cabin 4 and the equal electric connection of HIL switch board 2 have charging device 5, charging device 5 can provide the electric quantity for circuit environment cabin 4 and integrated circuit frame 3, make things convenient for the normal work of circuit environment cabin 4 and integrated circuit frame 3, charging device 5 is in the same place with integrated circuit frame 3 electric connection, HIL switch board 2 includes IO integrated circuit board 201, IO integrated circuit board 201 is the long-range collection control module of industrial grade, provide switching value collection, trail intelligent electrical apparatus output, passive node functions such as high frequency counter. The series of modules can be used for bus networking, so that IO points can be flexibly expanded. The module can be controlled by a remote command, the IO board 201 is electrically connected with a fault injection module 202, the fault injection module 202 can inject different faults, thereby observing the performance condition of the circuit board at each temperature and counting, the fault injection module 202 is electrically connected with a power supply management module 203, the power supply management module 203 can supply power for the real-time control module, the normal operation of the control module 204 is convenient to implement, the power supply management module 203 is electrically connected with a real-time control module 204, the real-time control module 204 can control the whole detection device in real time and is convenient to use, the circuit environment cabin 4 comprises a high-temperature device 401, the high-temperature device 401 can increase the temperature in the circuit environment cabin 4, the high-temperature device 401 is electrically connected with a low-temperature device 402, the low-temperature device 402 can reduce the temperature in the circuit environment cabin 4, the low-temperature device 402 is electrically connected with an air pressure adjusting device 403, the air pressure adjusting device 403 can change the air pressure in the circuit environment cabin 4, the upper computer 1 is electrically connected with upper computer management software 12, the upper computer management software 12 is convenient for managing and controlling the circuit to be detected, the upper computer management software 12 is electrically connected with a test quantity 13, the test quantity 13 is the number of circuit boards to be detected, the test quantity 13 is electrically connected with a high-low temperature detector 14, the high-low temperature detector 14 is used for testing the circuit boards at high temperature and low temperature, the high-low temperature detector 14 is electrically connected with a fault analyzer 15, the fault analyzer 15 is used for analyzing various faults of the circuit boards, the upper computer management software 12 comprises an integrated circuit board 6 to be detected, the integrated circuit board 6 to be detected is selected as a Hall integrated circuit to be detected, the integrated circuit board 6 to be detected is selected to be electrically connected with an editing fault 7, and the editing fault 7 can convey faults to the circuit boards, the working condition of a circuit board is watched, a fault 7 is edited and electrically connected with a charging device 5, an integrated circuit frame 3 and a circuit environment cabin 4 together, a high-low temperature detection 14 comprises a high-low temperature and air pressure regulation 9, the high-low temperature and air pressure regulation 9 can regulate the temperature and the air pressure in the circuit environment cabin 4, the test result can be more accurate, the high-low temperature and air pressure regulation 9 is electrically connected with a recording process data 8, the recording process data 8 can uniformly recover and record the test result, the final data analysis 10 is convenient, the fault analysis 15 comprises a data analysis 10, the data analysis 10 can carry out rational analysis on the test data, the quality of the result is judged, and the data analysis 10 is electrically connected with a test result processing 11;

the utility model discloses a use as follows: the technical personnel in the field firstly prepare different numbers of Hall integrated circuit boards, then close the test power supply, disconnect the voltage storage battery, disconnect the high-voltage connection, install and change different Hall integrated circuit boards according to the test requirement and place on the integrated circuit frame 3 for fixing, and the HIL control cabinet 2 can connect pins and communication pins into the circuit environment cabin 4, then connect the pin wire harness of the electronic appliance on the IO board card 201 of the HIL control cabinet 2, after the wiring connection is finished, connect the low-voltage storage battery, connect the high-voltage power supply, start the host computer 1, the HIL control cabinet 2, the circuit environment cabin 4 and the integrated circuit frame 3, turn on all power supplies, and start the engine, establish the real-time control module 204 between the host computer 1 and the HIL control cabinet 2, then connect, refresh the IO board card 201 drive on the HIL control cabinet 2, then begin to edit the fault 7 and input into the circuit to be tested, then begin to adjust the same kind of air pressure, adjust the high temperature and the low temperature, record the detected result and data, then carry out the analysis and data processing of all the HIL data of the HIL control cabinet, and record the data of the HIL control cabinet 2, and carry out the analysis and the test process, and ensure that all the HIL control cabinet 2 can not play back the data of the HIL 2, and the HIL process after the HIL process is finished.

The above is only a preferred embodiment of the present invention, and any person skilled in the art may modify the present invention or modify it into an equivalent technical solution by using the technical solutions described above. Therefore, any simple modifications or equivalent replacements made according to the technical solution of the present invention belong to the scope of protection claimed by the present invention as far as possible.

Claims

1. Hall integrated circuit online high low temperature test system, including host computer (1), its characterized in that: host computer (1) electric connection has HIL switch board (2), HIL switch board (2) electric connection has integrated circuit frame (3), HIL switch board (2) electric connection has circuit environment cabin (4), the equal electric connection in circuit environment cabin (4) and HIL switch board (2) has charging device (5), charging device (5) are in the same place with integrated circuit frame (3) electric connection.

2. The hall ic on-line high and low temperature test system according to claim 1, wherein: HIL switch board (2) are including IO integrated circuit board (201), IO integrated circuit board (201) electric connection has fault injection module (202), fault injection module (202) electric connection has power supply management module (203), power supply management module (203) electric connection has real-time control module (204).

3. The hall ic on-line high and low temperature test system according to claim 1, wherein: the circuit environment cabin (4) comprises a high-temperature device (401), the high-temperature device (401) is electrically connected with a low-temperature device (402), and the low-temperature device (402) is electrically connected with an air pressure adjusting device (403).

4. The hall ic on-line high and low temperature test system according to claim 1, wherein: the system is characterized in that the upper computer (1) is electrically connected with upper computer management software (12), the upper computer management software (12) is electrically connected with test quantity (13), the test quantity (13) is electrically connected with high and low temperature detection (14), and the high and low temperature detection (14) is electrically connected with fault analysis (15).

5. The Hall integrated circuit on-line high and low temperature test system according to claim 4, wherein: the upper computer management software (12) comprises an integrated circuit board (6) selected to be tested, the selected integrated circuit board (6) to be tested is electrically connected with an editing fault (7), and the editing fault (7) is electrically connected with the charging device (5), the integrated circuit frame (3) and the circuit environment cabin (4).

6. The Hall integrated circuit on-line high and low temperature test system according to claim 5, wherein: the high-low temperature detection (14) comprises a high-low temperature and air pressure regulation (9), and the high-low temperature and air pressure regulation (9) is electrically connected with a recording process data (8).

7. The Hall integrated circuit online high and low temperature test system according to claim 6, wherein: the fault analysis (15) comprises data analysis (10), and the data analysis (10) is electrically connected with test result processing (11).