CN217846419U

CN217846419U - Test needle group and test needle seat

Info

Publication number: CN217846419U
Application number: CN202221092241.XU
Authority: CN
Inventors: 邓光耀; 邓带弟
Original assignee: Shenzhen Jingang Technology Co ltd
Current assignee: Shenzhen Jingang Technology Co ltd
Priority date: 2022-05-09
Filing date: 2022-05-09
Publication date: 2022-11-18
Anticipated expiration: 2032-05-09

Abstract

The utility model discloses a test needle group and test needle file, test needle group include a plurality of spacers and a plurality of test needle, and are a plurality of the test needle distributes between adjacent spacer to be formed with the collection end and lead electrical terminal, be equipped with the conducting strip between the side of leading electrical terminal and the spacer, the conducting strip is connected with leading electrical terminal electricity. The utility model provides a test needle group to be applicable to the heavy current test scene.

Description

Test needle group and test needle seat

Technical Field

The utility model relates to a test assembly and equipment technical field, specifically speaking relates to a test needle group.

Background

The test socket is used for testing a chip or a connector. The chinese patent document discloses a test needle seat, which includes a fixing seat, a positioning seat floatingly disposed on the fixing seat, and a test needle set. The test pin group comprises a plurality of test pins for electrical connection.

In the prior art, the test pin is required to contact with the device to be tested during testing, so the test pin usually has certain elasticity, and therefore the test pin needs to be thinner and lighter, but the current conducting capability of the test pin is poor.

SUMMERY OF THE UTILITY MODEL

An object of the utility model is to provide a test needle group and test needle file to be applicable to the heavy current test scene.

The utility model discloses a technical scheme that test needle group adopted is:

the utility model provides a test needle group, includes a plurality of septa and a plurality of test needle, and is a plurality of the test needle distributes between adjacent septa to be formed with collection end and electrically conductive end, be equipped with the conducting strip between the side of electrically conductive end and the septa, the conducting strip is connected with electrically conductive end electricity.

Preferably, the conducting strip is provided with a hollow groove.

As the preferred scheme, the position of the hollowed-out groove corresponds to the position of the deformable part of the test needle.

Preferably, the shape of the conducting strip is consistent with that of the test needle, and two ends of the conducting strip are respectively shorter than two ends of the test needle.

Preferably, both ends of the conductive sheet are flush with both ends of the spacer, respectively.

As a preferred scheme, conducting strips are arranged on two sides of the conducting end, and the conducting end is clamped by the two conducting strips.

This scheme still provides a test needle file, includes the fixing base, floats locating the positioning seat of fixing base and foretell test needle group of locating.

The utility model discloses an embodiment beneficial effect is: the conducting strips are additionally arranged on the side edges of the conducting ends to increase the over-current capacity of the conducting ends, so that the testing needle set is suitable for a large-current testing scene.

Drawings

Fig. 1 is a schematic structural diagram of the test pin set of the present invention.

Fig. 2 is another schematic structural diagram of the test pin set of the present invention.

Detailed Description

The invention will be further elucidated and described with reference to the following embodiments and drawings in which:

referring to fig. 1 and 2, the test pin set includes a plurality of partitions 10 and a plurality of test pins 20, and the plurality of test pins 20 are disposed between adjacent partitions 10 and are formed with a collection terminal 24 and a conductive terminal 22. And a conducting strip 30 is arranged between the side edge of the conducting end 22 and the spacer 10, and the conducting strip 30 is electrically connected with the conducting end 22.

By adding the conducting strip 30 at the side of the conducting terminal 22, the overcurrent capability of the conducting terminal 22 is increased, so that the testing needle set is suitable for a high-current testing scene.

In this embodiment, when a single test pin 20 is disposed adjacent to a septum 10, a collection end 24 is formed for data collection, and when a plurality of test pins 20 are disposed adjacent to a septum 10, for example, three test pins 20, a conductive end 22 is formed for excessive current. The conductive sheet 30 is made of a conductive material, such as copper, and can be electrically connected to the conductive terminal 22 to increase the over-current capability of the conductive terminal 22, so that the testing probe set is suitable for a high-current testing scenario.

In this embodiment, the conductive sheet 30 is provided with a hollow groove 32. Specifically, when the conductive terminal 22 contacts with the device to be tested, a certain deformation is generated, so that sliding friction is generated between the conductive terminal 22 and the conductive sheet 30, and after the hollow groove 32 is formed in the conductive sheet 30, on one hand, the friction area between the conductive sheet and the conductive terminal 22 can be reduced, so that loss is reduced, and on the other hand, the hollow groove 32 can be used for heat dissipation of the conductive terminal 22 and the conductive sheet 30.

Further, the position of the hollow-out groove 32 corresponds to the position of the deformable part of the test pin 20. Specifically, both ends of the test pin 20 need to be in contact with the outside, respectively, and thus the middle portion thereof is a portion that can be deformed in the vertical direction.

In this embodiment, the conductive sheet 30 and the test pin 20 have the same shape, and two ends of the conductive sheet 30 are respectively shorter than two ends of the test pin 20. Specifically, when the shapes of the conductive sheet 30 and the test needle 20 are the same, it is ensured that no gap is generated when the conductive sheet 30 and the test needle 20 are clamped by the spacer 10. The two ends of the conductive plate 30 are respectively shorter than the two ends of the test pin 20, so that the conductive plate 30 is prevented from contacting the outside when the test pin 20 deforms.

In this embodiment, the two ends of the conductive sheet 30 are flush with the two ends of the spacer 10, respectively. Specifically, two ends of the testing needle 20 are respectively exposed out of the spacer 10, and two ends of the conductive sheet 30 are respectively flush with two ends of the spacer 10.

In this embodiment, the two sides of the conductive end 22 are both provided with conductive sheets 30, and the two conductive sheets 30 clamp the conductive end 22. Specifically, the two conductive sheets 30 are respectively disposed on two sides of the conductive terminal 22, so that the overall structure is stable. And can provide a certain direction to the deformation direction of the conductive terminal 22.

The embodiment further provides a testing needle 20 seat, which comprises a fixed seat, a floating positioning seat arranged on the fixed seat and the testing needle set. By adding the conductive sheet 30 to the side of the conductive terminal 22, the overcurrent capability of the conductive terminal 22 is increased, so that the testing pin 20 is suitable for a high-current testing scenario.

It should be finally noted that the above embodiments are only intended to illustrate the technical solutions of the present invention, and not to limit the scope of the present invention, and although the present invention has been described in detail with reference to the preferred embodiments, it should be understood by those skilled in the art that the technical solutions of the present invention can be modified or replaced with equivalents without departing from the spirit and scope of the technical solutions of the present invention.

Claims

1. The utility model provides a test needle group, includes a plurality of septa and a plurality of test needle, and is a plurality of the test needle distributes between adjacent septa to be formed with collection end and electrically conductive end, its characterized in that, be equipped with the conducting strip between electrically conductive end's side and the septa, the conducting strip is connected with electrically conductive end electricity.

2. The test pin set of claim 1, wherein the conductive strip defines a hollowed-out slot.

3. The test pin set of claim 2, wherein the hollowed-out groove is located at a position corresponding to a position of the deformable portion of the test pin.

4. The test pin set of claim 1, wherein the conductive strip conforms to the shape of the test pin and the ends of the conductive strip are shorter than the ends of the test pin, respectively.

5. The test pin set of claim 1 wherein the conductive strips are each flush with the respective ends of the spacer.

6. The test pin set as in any one of claims 1-5, wherein said conductive terminals are provided with conductive tabs on both sides thereof, said conductive tabs sandwiching said conductive terminals.

7. A test needle holder, which is characterized by comprising a fixed seat, a positioning seat arranged on the fixed seat in a floating way, and a test needle group according to any one of claims 1 to 6.