CN217824909U - Adjustable device of matching circuit and test system - Google Patents

Abstract

The application relates to a matching circuit adjustable device and a testing system, a plurality of matching circuits and a selection circuit which are in one-to-one correspondence with a plurality of different frequency bands are arranged in the matching circuit adjustable device, wherein each matching circuit is in a mismatch state on the corresponding frequency band, when any frequency band to be tested of a target device to be tested is tested, the target matching circuit corresponding to the frequency band to be tested can be controlled to be connected with a second radio frequency port through the selection circuit to form a testing access, and therefore a signal testing device can test the working performance of a power amplifier in the target device on the frequency band to be tested. Therefore, compared with the traditional test process, the test operation of the adjustable device of the matching circuit provided by the embodiment of the application is simpler during the test, and therefore, the test efficiency is higher.

Description

Adjustable device of matching circuit and test system

Technical Field

The present application relates to the field of communications technologies, and in particular, to an adjustable matching circuit device and a test system.

Background

With the development of radio frequency front end module technology, power Amplifiers (PAs), filters and RF switches are separately designed to the Power Amplifier Module (PAMID) of the current integrated duplexer integrating the PAs, filters and RF switches, for device developers, no matter the PA or PAMID is independent, certain limitations are required for the input and amplification capabilities of the PAs, so that the device can perform power amplification within the allowable range of bearing capacity, and the use safety of the device can be ensured.

In general, the bearing capacity corresponding to each frequency band bandwidth supported by PA or PAMID is different, and the bearing capacity corresponding to each frequency band bandwidth needs to be tested. In the traditional test process, before testing the bearing capacity corresponding to each frequency band bandwidth, a load displacement regulator needs to be connected to a network analyzer, a matching network of the load displacement regulator reaches a certain mismatch state by adjusting two adjusting buttons of the load displacement regulator, then a prototype to be tested is connected to the adjusted load displacement regulator, and the load displacement regulator is connected to a communication tester to start testing.

In the traditional test process, before testing the bearing capacity corresponding to one frequency band bandwidth of a prototype to be tested, a load displacement regulator is connected to a network analyzer for regulation, and then the regulated load displacement regulator is respectively connected with the prototype to be tested and a communication tester for testing, so that the test operation in the traditional technology is complex, and the test efficiency is low.

SUMMERY OF THE UTILITY MODEL

In view of the above, it is desirable to provide a matching circuit tunable device and a testing system with simple testing operation and high testing efficiency.

In a first aspect, the present application provides an apparatus with adjustable matching circuit, the apparatus comprising: the device comprises a first radio frequency port, a second radio frequency port, a plurality of matching circuits and a selection circuit, wherein the matching circuits correspond to a plurality of different frequency bands one to one; the matching circuits are in a mismatched state on corresponding frequency bands, the first radio frequency port is connected with the first end of each matching circuit, one of the first radio frequency port and the second radio frequency port is used for being connected with signal testing equipment, and the other one of the first radio frequency port and the second radio frequency port is used for being connected with target equipment to be tested;

the selection circuit is used for controlling a target matching circuit corresponding to a frequency band to be tested to be connected with the second radio frequency port so as to form a test access, and the test access is used for the signal test equipment to test the working performance of a power amplifier in the target equipment on the frequency band to be tested.

In a second aspect, the present application further provides a test system, the system comprising: the matching circuit tunable device, the signal testing apparatus and the target apparatus to be tested according to the first aspect; one of a first radio frequency port and a second radio frequency port of the matching circuit adjustable device is used for being connected with the signal testing equipment, and the other one of the first radio frequency port and the second radio frequency port of the matching circuit adjustable device is used for being connected with the target equipment;

the selection circuit of the matching circuit adjustable device is used for controlling a target matching circuit corresponding to a frequency band to be tested to be connected with the second radio frequency port so as to form a test access;

the signal testing device is used for testing the working performance of the power amplifier in the target device on the frequency band to be tested through the testing path.

According to the matching circuit adjustable device and the testing system, the matching circuit adjustable device is provided with the plurality of matching circuits and the selection circuits which are in one-to-one correspondence with the plurality of different frequency bands, wherein each matching circuit is in a mismatch state on the corresponding frequency band, when any frequency band to be tested of a target device to be tested is tested, the selection circuit can control the target matching circuit corresponding to the frequency band to be tested to be connected with the second radio frequency port to form a testing access, so that the signal testing device can test the working performance of the power amplifier in the target device on the frequency band to be tested. Therefore, compared with the traditional test process, the test operation is simpler when the adjustable device of the matching circuit is used for testing, and therefore the test efficiency is higher.

Drawings

FIG. 1 is a schematic diagram of the path from a transceiver to a PA output port in a prototype under test in the related art;

fig. 2 is a schematic structural diagram of an adjustable matching circuit device according to an embodiment of the present disclosure;

fig. 3 is a schematic structural diagram of an adjustable matching circuit device according to another embodiment of the present disclosure;

fig. 4 is a schematic structural diagram of an adjustable matching circuit device according to another embodiment of the present disclosure;

fig. 5 is a schematic structural diagram of an adjustable matching circuit device according to another embodiment of the present disclosure;

fig. 6 is a schematic structural diagram of an adjustable matching circuit device according to another embodiment of the present disclosure;

fig. 7 is a schematic structural diagram of an adjustable matching circuit device according to another embodiment of the present disclosure;

fig. 8 is a schematic structural diagram of an adjustable matching circuit device according to another embodiment of the present disclosure;

FIG. 9 is a schematic structural diagram of a test system according to an embodiment of the present application;

FIG. 10 is a schematic structural diagram of a test system according to another embodiment of the present application;

fig. 11 is a schematic structural diagram of a test system according to another embodiment of the present application.

Detailed Description

In order to make the objects, technical solutions and advantages of the present application more clearly understood, the present application is further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of and not restrictive on the broad application.

Fig. 1 is a schematic diagram of a path from a transceiver to a PA output port (PAout) in a prototype to be tested in the related art, as shown in fig. 1, a high frequency output port of the transceiver is connected to a High Band (HB) PA, and a medium frequency output port of the transceiver is connected to a mid-band (MB) PA. When the input power of the PA input port (e.g., HB PAin or MB PAin) is too high, or the output power of the PA output port is too high, which exceeds the endurance of the PA, the PA may be burned. Therefore, it is very important to test the endurance of the PA, so that the calibration parameters of the PA can be limited according to the endurance during subsequent production of the device, so that the input power of the PA input port or the output power of the PA output port is within the range of the endurance of the PA, thereby ensuring the normal operation of the PA. Exemplary calibration parameters may include, but are not limited to: a radio frequency gain index (RGI) calibration parameter and/or a maximum voltage calibration parameter.

In general, the bearing capacity corresponding to each frequency band bandwidth supported by PA or PAMID is different, and the bearing capacity corresponding to each frequency band bandwidth needs to be tested. In the traditional test process, before testing the bearing capacity corresponding to each frequency band bandwidth, a load displacement regulator needs to be connected to a network analyzer, the matching network of the load displacement regulator is enabled to reach a certain mismatch state by adjusting two adjusting buttons of the load displacement regulator, then a prototype to be tested is connected to the adjusted load displacement regulator, and the load displacement regulator is connected to a communication tester for testing. Therefore, in the traditional test process, before testing the bearing capacity corresponding to one frequency band bandwidth of a prototype to be tested, the load displacement regulator needs to be connected to the network analyzer for regulation, and then the regulated load displacement regulator is respectively connected with the prototype to be tested and the communication tester for testing, so that the test operation in the traditional technology is more complicated, and the test efficiency is lower.

In the matching circuit adjustable device and the testing system provided in the embodiments of the present application, a plurality of matching circuits and a selection circuit that are in one-to-one correspondence with a plurality of different frequency bands are arranged in the matching circuit adjustable device, where each matching circuit is in a mismatch state in a corresponding frequency band, and when any frequency band to be tested of a target device to be tested is tested, the selection circuit can control the target matching circuit corresponding to the frequency band to be tested to be connected to a second radio frequency port to form a testing path, so that a signal testing device can test the working performance of a power amplifier in the target device on the frequency band to be tested. Therefore, compared with the traditional test process, the test operation of the adjustable device of the matching circuit provided by the embodiment of the application is simpler during the test, and therefore, the test efficiency is higher.

The target device to be tested in the embodiment of the present application may include, but is not limited to, a smartphone or a tablet computer.

The signal testing device referred to in the embodiments of the present application may be a communication tester (Call box). Illustratively, the signal testing device may include, but is not limited to: a radio communication analyzer or a wireless connectivity tester.

The antenna parameter S11 referred to in the embodiment of the present application is one of the antenna parameters S, and is used to indicate return loss characteristics, generally, a dB value of return loss and impedance characteristics thereof seen by a network analyzer. The S11 parameter may also be used to indicate the transmission efficiency of the antenna, and the larger the value of the S11 parameter, the larger the energy reflected by the antenna itself is, i.e. the worse the antenna efficiency is.

In an embodiment, fig. 2 is a schematic structural diagram of a matching circuit tunable apparatus according to an embodiment of the present application, and as shown in fig. 2, the matching circuit tunable apparatus according to the embodiment of the present application may include: the radio frequency device comprises a first radio frequency port 10, a second radio frequency port 11, a plurality of matching circuits 12 corresponding to a plurality of different frequency bands one by one, and a selection circuit 13. The frequency bands corresponding to different matching circuits 12 are different, and each matching circuit is in a mismatch state on the corresponding frequency band, so that the return loss is relatively large, and the circuit is used for simulating a severe use environment of a target device to be tested, so as to test the bearing capacity of a power amplifier in the target device on the corresponding frequency band.

Illustratively, any matching circuit related in the embodiment of the present application may be in a preset mismatch state in a corresponding frequency band, where the preset mismatch state may include, but is not limited to: the antenna parameter S11 of the matching circuit is greater than or equal to a corresponding preset threshold.

Illustratively, any matching circuit referred to in embodiments of the present application may include, but is not limited to: a T-type matching circuit, a pi-type matching circuit, or at least one L-type matching circuit.

Illustratively, any rf port (e.g., the first rf port 10 or the second rf port 11) referred to in the embodiments of the present application may include, but is not limited to: subminiature version a connector (SMA) interface.

In the embodiment of the present application, the first rf port 10 is connected to the first end 12A of each matching circuit 12, one of the first rf port 10 and the second rf port 11 is used to connect to a signal testing device (not shown in fig. 2), and the other of the first rf port 10 and the second rf port 11 is used to connect to a target device to be tested (not shown in fig. 2).

In a possible implementation, if the first rf port 10 is used to connect with a signal testing device, the second rf port 11 is used to connect with a target device to be tested. In another possible implementation, if the second rf port 11 is used to connect with a signal testing device, the first rf port 10 is used to connect with a target device to be tested.

The selection circuit in this embodiment of the application is configured to control a target matching circuit 120 corresponding to a frequency band to be tested to be connected to the second radio frequency port 11, so as to form a test path corresponding to the frequency band to be tested, where the test path is used for a signal test device to test a working performance of a power amplifier in a target device on the frequency band to be tested. It should be understood that the target matching circuit 120 in the embodiment of the present application may be a matching circuit corresponding to the frequency band to be tested in the plurality of matching circuits 12.

In this embodiment, when testing any frequency band to be tested of the target device, the selection circuit 13 may control the second end of the target matching circuit 120 corresponding to the frequency band to be tested to be connected to the second rf port 11 to form a test path, so that the signal testing device may test the working performance of the power amplifier in the target device on the frequency band to be tested, so as to determine whether the power amplifier in the target device can bear the current test transmit power (hereinafter, also referred to as target power) corresponding to the frequency band to be tested. It should be understood that the current test transmit power referred to in the embodiments of the present application is generally the maximum transmit power of the target device in the frequency band to be tested.

Further, if it is determined that the power amplifier in the target device cannot bear the current test transmit power corresponding to the frequency band to be tested, the input power of the PA input port or the output power of the PA output port can be within the PA bearing capacity range by limiting the calibration parameters of the device during subsequent production of the device, which is beneficial to ensuring the normal operation of the PA.

To sum up, in the embodiment of the present application, by setting a plurality of matching circuits and a selection circuit in one-to-one correspondence with a plurality of different frequency bands in a matching circuit adjustable device, where each matching circuit is in a mismatch state in a corresponding frequency band, when testing any frequency band to be tested of a target device to be tested, the selection circuit can control the target matching circuit corresponding to the frequency band to be tested to be connected with a second radio frequency port to form a test path, so that a signal testing device can test the working performance of a power amplifier in the target device on the frequency band to be tested. Therefore, compared with the traditional test process, the test operation of the adjustable device of the matching circuit provided by the embodiment of the application is simpler during the test, and therefore, the test efficiency is higher.

In an embodiment, fig. 3 is a schematic structural diagram of an adjustable matching circuit device according to another embodiment of the present application, and based on the above embodiment, an implementation manner of the second rf port and the selection circuit in the automatic test mode is described in this embodiment of the present application. As shown in fig. 3, the second rf port 11 in the embodiment of the present application may include: the automatic test port 110, selection circuit 13 may include: a controller 130 and a selection component 131 communicatively coupled to the controller 130, wherein a first end 131A of the selection component 131 is coupled to the automatic test port 110. The controller 130 is configured to control the second terminal 131B of the selecting component 131 to be connected to the second terminal 12B of the target matching circuit 120. Illustratively, the controller may include, but is not limited to, a micro-mainframe.

In this embodiment of the application, when testing any frequency band to be tested of the target device, the controller 130 may control the second end 131B of the selection component 131 to be connected to the second end 12B of the target matching circuit 120 corresponding to the frequency band to be tested, so as to form a test path corresponding to the frequency band to be tested, so that the signal testing device may test the working performance of the power amplifier in the target device on the frequency band to be tested.

For example, when testing the frequency band 1 to be tested of the target device, the controller 130 may control the second end 131B of the selection component 131 to be connected to the second end 12B of the matching circuit corresponding to the frequency band 1 to be tested, so as to form a test path corresponding to the frequency band 1 to be tested, so that the signal testing device may test the operating performance of the power amplifier in the target device on the frequency band 1 to be tested. For another example, when the frequency band 2 to be tested of the target device is tested, the controller 130 may control the second end 131B of the selection component 131 to be connected to the second end 12B of the matching circuit corresponding to the frequency band 2 to be tested, so as to form a test path corresponding to the frequency band 2 to be tested, so that the signal testing device may test the operating performance of the power amplifier in the target device on the frequency band 2 to be tested. It should be understood that, in fig. 3, the matching circuit corresponding to the frequency band 1 to be tested or the matching circuit corresponding to the frequency band 2 to be tested is referred to as a target matching circuit 120.

Illustratively, the above-mentioned selection components referred to in the embodiments of the present application may include a single-pole multi-throw switch, an electromagnetic switch, or a logic switch; other controllable switches may be included, and are not limited in the embodiments of the present application. It should be understood that if the selection component includes a single-pole multi-throw switch or a logic switch, the selection component and the controller may be connected by a wire; if the selection component comprises a wireless controllable switch such as an electromagnetic switch, the selection component and the controller can be connected in a wireless mode.

To sum up, in the embodiment of the present application, a first end of a selection component in a selection circuit is connected to an automatic test port in a second radio frequency port, and a controller in the selection circuit controls a second end of the selection component to be connected to a second end of a target matching circuit corresponding to a frequency band to be tested to form a test path, so that a signal test device can test the working performance of a power amplifier in the target device on the frequency band to be tested. Therefore, the matching circuit adjustable device provided by the embodiment of the application can automatically select the target matching circuit corresponding to the frequency band to be tested, the test operation is simpler, and the test efficiency is further improved.

In an embodiment, fig. 4 is a schematic structural diagram of a matching circuit tunable device according to another embodiment of the present application, and based on the foregoing embodiment, the structure of the matching circuit tunable device is described in the embodiment of the present application by taking the foregoing selecting component 131 as an example and including a single-pole multi-throw switch. As shown in fig. 4, the selection component 131 is a single-pole multi-throw switch, the first end 131A of the selection component 131 is a fixed end of the single-pole multi-throw switch for connecting with the automatic test port 110, and the second end 131B of the selection component 131 is an active end of the single-pole multi-throw switch, it should be understood that the single-pole multi-throw switch shown in the figure is a simplified schematic diagram, and the third end of the single-pole multi-throw switch may be connected with the controller 130 (not shown), so that the controller 130 controls the active end of the single-pole multi-throw switch to be connected to the second end 12B of any matching circuit 12. For example, when any frequency band to be tested of the target device is tested, the controller 130 may be configured to control the active end 131B of the single-pole-multiple-throw switch to be connected to the second end 12B of the target matching circuit 120 corresponding to the frequency band to be tested, so as to form a test path corresponding to the frequency band to be tested, so that the signal testing device may test the operating performance of the power amplifier in the target device on the frequency band to be tested.

In an embodiment, fig. 5 is a schematic structural diagram of a matching circuit tunable device according to another embodiment of the present application, and based on the above embodiment, the structure of the matching circuit tunable device corresponding to the single-pole multi-throw switch being in the initial state is described in the embodiment of the present application. As shown in fig. 5, in the embodiment of the present application, the second terminal 131B (i.e., the active terminal of the single-pole-multiple-throw switch) of the selecting component 131 can be connected to the default matching circuit 121 of the plurality of matching circuits 12 in the initial state to form a test indication path. For example, the default matching circuit 121 may be a matching circuit corresponding to any one of the plurality of matching circuits 12 corresponding to the plurality of different frequency bands, or may be a matching circuit corresponding to the lowest frequency band of the plurality of different frequency bands.

The test indication path related in the embodiment of the application is used for the signal test equipment to send first test indication information to the target equipment, where the first test indication information is used for indicating the target equipment to send a test signal at a target power on the frequency band to be tested through the power amplifier, so that the signal test equipment can test the working performance of the power amplifier in the target equipment on the frequency band to be tested. Exemplarily, if the target device is preset to transmit the test signal at the corresponding target power on any frequency band to be tested, the first test indication information may include, but is not limited to, identification information of the frequency band to be tested; otherwise, the first test indication information may further include identification information of a target power corresponding to the frequency band to be tested, so that the target device sends the test signal at the target power on the frequency band to be tested through the power amplifier.

For example, the target power corresponding to the frequency band to be tested may be a maximum transmission power of the target device on the frequency band to be tested, so as to determine a bearing capacity of a power amplifier in the target device corresponding to the frequency band to be tested.

Illustratively, the first test instruction information may be sent by the signal testing device to the target device after receiving a first detection instruction sent by the intelligent terminal, where the first detection instruction may include, but is not limited to, identification information of the frequency band to be tested and/or identification information of the target power, or may be sent by the signal testing device to the target device after receiving a second detection instruction input by a user; of course, the first test indication information may also be sent by the signal testing device to the target device in other situations, which is not limited in this embodiment of the application.

Optionally, as shown in fig. 5, the matching circuit tunable device in this embodiment may further include a data port 14, and the data port 14 in this embodiment may include, but is not limited to, a dual Type C port. The data port 14 is configured to connect with a target device, so that the target device transmits second test indication information for indicating the frequency band to be tested to the controller 130, for example, the second test indication information may include, but is not limited to, identification information of the frequency band to be tested, so that the controller 130 may control the second end 131B of the selection component 131 (i.e., the active end of the single-pole-multiple-throw switch) to be connected with the second end 12B of the target matching circuit 120 according to the second test indication information, as shown in fig. 4.

Illustratively, as shown in fig. 4 and fig. 5, the controller 130 in this embodiment of the application is configured to control the second end 131B (i.e., the active end of the single-pole-multiple-throw switch) of the selection component 131 to switch from the second end 12B of the default matching circuit 121 to the second end 12B of the target matching circuit 120 according to the second test indication information, so as to form a test path corresponding to the frequency band to be tested.

For example, the target device may send the second test instruction information to the controller 130 after receiving the first test instruction information; of course, the target device may also send the second test indication information to the controller 130 in other cases, which is not limited in this embodiment of the application.

It should be understood that the test path corresponding to the current test frequency band referred in this embodiment may be a test indication path corresponding to a next frequency band to be tested, and is used for the signal test device to send first test indication information corresponding to the next frequency band to be tested to the target device, where the first test indication information corresponding to the next frequency band to be tested is used to indicate that the target device sends a test signal at a target power corresponding to a next frequency band to be tested on the next frequency band to be tested through the power amplifier, so that the signal test device can test the working performance of the power amplifier in the target device on the next frequency band to be tested.

Correspondingly, in this embodiment of the application, the target device may send, to the controller 130 through the data port 14, second test indication information for indicating a next frequency band to be tested, so that the controller 130 controls the second end 131B (i.e., the active end of the single-pole-multiple-throw switch) of the selection component 131 to switch from the second end 12B of the current target matching circuit 120 to the second end of the target matching circuit corresponding to the next frequency band to be tested according to the second test indication information corresponding to the next frequency band to be tested, so as to form a test path corresponding to the next frequency band to be tested.

In summary, the matching circuit adjustable device provided in this embodiment of the application can automatically switch the second end of the selection component 131 to the target matching circuit corresponding to the frequency band to be tested according to the second test indication information corresponding to the frequency band to be tested, so as to form a test path corresponding to the frequency band to be tested, thereby further improving the test efficiency.

In an embodiment, fig. 6 is a schematic structural diagram of an adjustable matching circuit device according to another embodiment of the present application, and based on the above embodiment, an implementation manner of the second rf port and the selection circuit in the non-automatic mode is described in this embodiment of the present application. As shown in fig. 6, the second rf port 11 in the embodiment of the present application may further include a manual test port 111, and the selection circuit 13 may further include a movable assembly 132, for example, the movable assembly 132 may include, but is not limited to, a slidable assembly.

Alternatively, the manual test port 111 may be located above the movable assembly 132 so as to bring the manual test port 111 to move to the second end 12B of any matching circuit 12. For example, when testing any frequency band to be tested of the target device, the movable component 132 may be configured to move to the second end 12B of the target matching circuit 120 corresponding to the frequency band to be tested, so that the manual testing port 111 is connected to the second end 12B of the target matching circuit 120 to form a testing path corresponding to the frequency band to be tested, so that the signal testing device may test the operating performance of the power amplifier in the target device on the frequency band to be tested.

It should be understood that, in the embodiment of the present application, when a non-automatic mode (alternatively referred to as a manual mode) of the matching circuit tunable apparatus is used to test any frequency band to be tested, the movable component 132 is moved to the second end 12B of the target matching circuit 120 corresponding to the frequency band to be tested, so that the manual test port 132 is connected to the second end 12B of the target matching circuit 120 to form a test path corresponding to the frequency band to be tested, that is, the second end 131B of the selection component 131 of the matching circuit tunable apparatus in the automatic mode does not need to be connected to the second end 12B of the target matching circuit 120. When an automatic mode of the adjustable matching circuit device is used to test any frequency band to be tested, the controller 130 can control the second end 131B of the selection component 131 to be connected to the second end 12B of the target matching circuit 120 corresponding to the frequency band to be tested, so as to form a test path corresponding to the frequency band to be tested, that is, the movable component 132 of the adjustable matching circuit device in the non-automatic mode does not need to move to the second end 12B of the target matching circuit 120 corresponding to the frequency band to be tested, and does not need to connect the manual test port 132 to the second end 12B of the target matching circuit 120.

It should be noted that, when a non-automatic mode of the matching circuit adjustable device is used to test any frequency band to be tested, the manual test port in the second radio frequency port is used to connect with the signal test device or the target device; when the automatic mode of the matching circuit adjustable device is used for testing any frequency band to be tested, the automatic test port in the second radio frequency port is used for being connected with the signal test equipment or the target equipment.

In an embodiment, fig. 7 is a schematic structural diagram of an adjustable matching circuit device according to another embodiment of the present application, and based on the foregoing embodiment, an implementation manner of the foregoing selection circuit in the automatic mode is described in this embodiment of the present application. As shown in fig. 7, the selection circuit 13 in the embodiment of the present application may further include an automatic test indication component 133, the movable component 132 slides to the automatic test indication component 133, the automatic test indication component 133 makes one end (e.g., a ground end) thereof grounded (not shown) under the action of the movable component 132, and the other end of the automatic test indication component 133 is connected to the controller 130. It should be understood that after the movable assembly 132 slides away from the automatic test indication assembly 133, the grounding end of the automatic test indication assembly 133 is no longer grounded, i.e. the grounding end of the automatic test indication assembly 133 is away from the predetermined grounding point.

Optionally, the controller 130 in this embodiment of the application is configured to control the second end 131B of the selecting component 131 to be connected to the second end 12B of the target matching circuit 120 corresponding to the frequency band to be tested after detecting the ground signal of the automatic test instructing component 133, so as to test the frequency band to be tested in an automatic mode. Illustratively, the controller 130 is further configured to control the second end 131B of the selecting component 131 to be connected to a default matching circuit or stop switching the connection position of the second end 131B of the selecting component 131 after the ground signal of the automatic test indication component 133 is not detected.

In an embodiment, fig. 8 is a schematic structural diagram of a matching circuit tunable device according to another embodiment of the present application, and based on the foregoing embodiment, the structure of the matching circuit tunable device according to the present application is described in combination with an implementable manner of the foregoing second rf port and the foregoing selection circuit. As shown in fig. 8, the second rf port in the embodiment of the present application may include an automatic test port 110 and a manual test port 111, and the selection circuit may include a controller 130, a selection component 131 communicatively connected to the controller, a movable component 132, and an automatic test indication component 133, wherein the selection component 131 is illustrated as a single-pole multi-throw switch in fig. 8, and a second end 131B of the single-pole multi-throw switch 131 may be connected to a default matching circuit 121 in the plurality of matching circuits in an initial state.

In one possible implementation, when the movable component 132 slides to the automatic test indication component 133, the automatic test indication component 133 makes one end (e.g. a ground end) of the movable component 132 grounded (not shown in the figure), and the controller 130 can start to test the frequency band to be tested in the automatic mode after detecting the ground signal of the automatic test indication component 133, where the automatic test port 110 is used for connecting to a signal test device or a target device. For example, the controller 130 may control the second end 131B of the single-pole multi-throw switch 131 to be connected to the second end of the target matching circuit corresponding to the frequency band to be tested according to the second test indication information (used for indicating the frequency band to be tested) received by the data interface 14, so as to form a test path corresponding to the frequency band to be tested.

In another possible implementation manner, when a non-automatic mode is used to test any frequency band to be tested of the target device, the movable component 132 may be configured to slide to the second end 12B of the target matching circuit corresponding to the frequency band to be tested, so that the manual test port 111 is connected to the second end 12B of the target matching circuit, so as to form a test path corresponding to the frequency band to be tested. It should be noted that, when the test is performed in the non-automatic mode, the manual test port 111 is used to connect to a signal test device or a target device.

To sum up, the adjustable device of the matching circuit provided in the embodiment of the present application can realize an automatic test mode and a non-automatic test mode, so that a user can select a suitable test mode according to a test requirement.

In an embodiment, fig. 9 is a schematic structural diagram of a test system provided in an embodiment of the present application, and as shown in fig. 9, the test system of the embodiment of the present application may include: a matching circuit tunable device 901, a signal testing apparatus 902, and a target apparatus 903 to be tested. One of the first rf port 901A and the second rf port 901B of the matching circuit tunable device 901 is used for connecting with the signal testing apparatus 902, and the other one is used for connecting with the target apparatus 903. It should be noted that, for convenience of drawing, fig. 9 illustrates that the first rf port 901A of the matching circuit tunable device 901 is connected to the signal testing apparatus 902, and the second rf port 901B of the matching circuit tunable device 901 is connected to the target apparatus 903.

In this embodiment, the selection circuit of the matching circuit adjustable device 901 is configured to control a target matching circuit corresponding to a frequency band to be tested to be connected to the second radio frequency port 901B, so as to form a test path. It should be understood that the structure and implementation principle of the matching circuit tunable apparatus 901 can refer to the related contents in the above embodiments of the present application, and are not described herein again.

In this embodiment, the signal testing device 902 is configured to test the working performance of the power amplifier in the target device 903 on the frequency band to be tested through the test path.

In summary, when the test system of the embodiment of the present application is used to test any frequency band to be tested of a target device to be tested, the selection circuit of the matching circuit adjustable apparatus may control the target matching circuit corresponding to the frequency band to be tested to connect with the second radio frequency port to form a test path, so that the signal test device can test the working performance of the power amplifier in the target device on the frequency band to be tested. Therefore, compared with the traditional test system, the test system provided by the embodiment of the application has the advantages that the test operation is simpler when the test system is used for testing, and therefore, the test efficiency is higher.

In an embodiment, fig. 10 is a schematic structural diagram of a test system according to another embodiment of the present application, and based on the above embodiment, as shown in fig. 10, the test system according to the embodiment of the present application may further include an intelligent terminal 904 connected to the signal testing device 902. Illustratively, the intelligent terminal 904 and the signal testing device 902 may be connected by a General Purpose Interface Bus (GPIB); of course, the two can also be connected by other ways, which are not limited in the embodiments of the present application.

In this embodiment, the intelligent terminal 904 is configured to send third test instruction information to the signal testing device 902 according to a preset test instruction. Exemplarily, the preset test instruction may include identification information of at least one frequency band to be tested; of course, other information may also be included, for example, identification information of the target power, and the like, which is not limited in the embodiment of the present application. Exemplarily, the third test instruction information is used to instruct the target device 903 to send a test signal with a target power on the frequency band to be tested through the power amplifier, and the selection circuit of the matching circuit adjustable device 901 may control the target matching circuit corresponding to the frequency band to be tested to be connected with the second radio frequency port to form a test path, so that the signal test device 902 tests the working performance of the power amplifier in the target device on the frequency band to be tested through the test path corresponding to the frequency band to be tested, thereby implementing an automatic test process.

Illustratively, the preset test instruction may be an instruction input into the intelligent terminal 904 by a user through an input device, an instruction set into the intelligent terminal 904 by the user through other manners, or an instruction sent by another terminal may be received by the intelligent terminal 904; certainly, the preset test instruction may also be an instruction obtained by the intelligent terminal 904 in another manner, which is not limited in this embodiment of the application.

It should be understood that the intelligent terminal 904 may send the third test indication information to the signal testing device 902 by carrying the third test indication information in the first detection instruction; of course, the intelligent terminal 904 may also send the third test indication information to the signal testing device 902 by other manners, which is not limited in this embodiment of the application.

In an embodiment, fig. 11 is a schematic structural diagram of a test system according to another embodiment of the present application, and as shown in fig. 11, on the basis of the foregoing embodiment, a process of performing a test in an automatic mode using a matching circuit tunable device is described in this embodiment of the present application. It should be noted that fig. 11 illustrates a structure of the matching circuit adjustable device corresponding to the initial state in which the selection component 131 includes a single-pole multi-throw switch.

S1, a connection setting process:

illustratively, the data interface of the target device to be tested is connected with the data interface 14 of the matching circuit tunable device, the radio frequency interface of the target device is connected with the automatic test port 110 in the second radio frequency port of the matching circuit tunable device, the first radio frequency port 10 of the matching circuit tunable device is connected with the signal test device, and the signal test device is connected with the intelligent terminal.

S2, an automatic mode setting process:

illustratively, the movable component 132 in the selection circuit of the matching circuit adjustable device slides to the automatic test indication component 133, one end (e.g., ground) of the automatic test indication component 133 is grounded (not shown), and the other end of the automatic test indication component 133 is connected to the controller 130.

S3, a test instruction setting process:

illustratively, the intelligent terminal may scan the signal testing device and establish a connection; further, the intelligent device receives a test instruction input by a user, wherein the test instruction may include but is not limited to: the identification information of at least one frequency band to be tested, the identification information of the target power corresponding to each frequency band to be tested, and preset test time information or target test parameter information. For example, the target test parameter information may include, but is not limited to, at least one of: maximum output power parameter information, maximum power back-off parameter information, adjacent Channel Leakage Ratio (ACLR), or spectral emission template (SEM).

Illustratively, the intelligent terminal can receive the test instruction input by a user through an automatic test software interface; of course, the intelligent terminal may also receive the test instruction in other manners, which is not limited in this embodiment of the application.

S4, a testing process:

exemplarily, if the test instruction includes preset test time information, the intelligent terminal may send third test instruction information to the signal testing device according to the test instruction when detecting that the preset test time arrives, where the third test instruction information may include, but is not limited to, at least one of the following: identification information of a first frequency band to be tested, identification information of target power corresponding to the first frequency band to be tested or target test parameter information.

Further, the signal testing device may send first test indication information to the target device, where the first test indication information may include, but is not limited to, identification information of the first frequency band to be tested and/or identification information of the target power. Further, the target device may send second test indication information to the controller of the matching circuit adjustable apparatus through the data interface, where the second test indication information may include, but is not limited to, identification information of the first frequency band to be tested, so that the controller may control the second end 131B of the selection component 131 to be connected to the second end of the target matching circuit corresponding to the first frequency band to be tested according to the second test indication information, so as to form a test path corresponding to the first frequency band to be tested.

Further, the target device sends a test signal with a target power on the first frequency band to be tested through the power amplifier, so that the signal test device can test the working performance of the power amplifier in the target device on the first frequency band to be tested. It should be understood that, if the third test indication information carries target test parameter information, the signal test device may measure the target test parameter of the target device; if the third test indication information does not carry the target test parameter information, the signal test equipment may measure a preset target test parameter of the target equipment.

Further, the signal testing device may send a measurement result of the working performance corresponding to the first frequency band to be tested to the intelligent terminal. Further, after receiving the measurement result of the working performance corresponding to the first frequency band to be tested, the intelligent terminal may send third test instruction information to the signal testing device again according to the test instruction, where the third test instruction information may include, but is not limited to, at least one of the following: and the identification information of the second frequency band to be tested, the identification information of the target power or the target test parameter information corresponding to the second frequency band to be tested, … …, and so on, until the signal test equipment sends the measurement results of the working performance corresponding to all the frequency bands to be tested to the intelligent terminal.

It should be understood that the third test indication information that the intelligent terminal may send to the signal testing device according to the test instruction may include, but is not limited to, at least one of the following: identification information of all frequency bands to be tested, identification information of target power corresponding to all frequency bands to be tested or target test parameter information. Correspondingly, after the signal testing device sends the measurement result of the working performance corresponding to any current testing frequency band to the intelligent terminal, the signal testing device may send the first test indication information to the target device again, where the first test indication information may include, but is not limited to, identification information of a next frequency band to be tested of the current testing frequency band and/or identification information of target power … …, and so on, until the signal testing device sends the measurement results of the working performance corresponding to all frequency bands to be tested to the intelligent terminal.

To sum up, the test system provided by the embodiment of the present application can realize an automatic test process for the working performance of the power amplifier in the target device on all frequency bands to be tested, and is not only simple in test operation, but also high in test efficiency.

The above-mentioned embodiments only express several embodiments of the present application, and the description thereof is more specific and detailed, but not construed as limiting the scope of the present application. It should be noted that, for a person skilled in the art, several variations and modifications can be made without departing from the concept of the present application, which falls within the scope of protection of the present application. Therefore, the protection scope of the present application shall be subject to the appended claims.

Claims (10)

1. An apparatus with adjustable matching circuit, the apparatus comprising: the device comprises a first radio frequency port, a second radio frequency port, a plurality of matching circuits and a selection circuit, wherein the matching circuits correspond to a plurality of different frequency bands one to one; the matching circuits are in a mismatched state on corresponding frequency bands, the first radio frequency port is connected with the first end of each matching circuit, one of the first radio frequency port and the second radio frequency port is used for being connected with signal testing equipment, and the other one of the first radio frequency port and the second radio frequency port is used for being connected with target equipment to be tested;

the selection circuit is used for controlling a target matching circuit corresponding to a frequency band to be tested to be connected with the second radio frequency port so as to form a test access, and the test access is used for the signal test equipment to test the working performance of a power amplifier in the target equipment on the frequency band to be tested.

2. The apparatus of claim 1, wherein the second radio frequency port comprises an automatic test port, wherein the selection circuit comprises a controller and a selection component communicatively coupled to the controller, wherein a first end of the selection component is coupled to the automatic test port;

the controller is used for controlling the second end of the selection component to be connected with the second end of the target matching circuit.

3. The apparatus of claim 2, wherein the selection component is a single-pole-multiple-throw switch, wherein the first end of the selection component is a fixed end of the single-pole-multiple-throw switch, and wherein the second end of the selection component is a movable end of the single-pole-multiple-throw switch.

4. The apparatus of claim 3, wherein the second terminal of the selection component is connected to a default matching circuit of the plurality of matching circuits in an initial state to form a test indication path, the test indication path is used for the signal testing device to transmit first test indication information to the target device, and the first test indication information is used for instructing the target device to transmit a test signal at a target power over the frequency band to be tested through the power amplifier.

5. The apparatus of claim 4, wherein the target power is a maximum transmit power of the target device.

6. The apparatus of claim 4, further comprising a data port for connecting with the target device; the data port is used for the target device to transmit second test indication information to the controller;

and the controller is used for controlling the second end of the selection component to be connected with the second end of the target matching circuit according to the second test indication information.

7. The apparatus of any of claims 2 to 6, wherein the second radio frequency port further comprises a manual test port, the selection circuitry comprising a movable component, the manual test port being located above the movable component;

the movable component is used for moving to the second end of the target matching circuit, so that the manual test port is connected with the second end.

8. The apparatus of claim 7, wherein the selection circuit further comprises an automatic test indication component, the movable component slides to the automatic test indication component, one end of the test indication component is grounded, and the other end of the automatic test indication component is connected to the controller;

and the controller is used for controlling the second end of the selection component to be connected with the second end of the target matching circuit after the ground signal of the automatic test indication component is detected.

9. A test system, the system comprising: the matching circuit tunable device, the signal testing apparatus and the target apparatus to be tested according to any one of claims 1 to 8; one of a first radio frequency port and a second radio frequency port of the matching circuit adjustable device is used for being connected with the signal testing equipment, and the other one of the first radio frequency port and the second radio frequency port of the matching circuit adjustable device is used for being connected with the target equipment;

the selection circuit of the matching circuit adjustable device is used for controlling a target matching circuit corresponding to a frequency band to be tested to be connected with the second radio frequency port so as to form a test access;

the signal testing device is used for testing the working performance of the power amplifier in the target device on the frequency band to be tested through the testing path.

10. The system of claim 9, further comprising: the intelligent terminal is connected with the signal testing equipment and used for sending third testing indication information to the signal testing equipment according to a preset testing instruction, wherein the third testing indication information is used for indicating the target equipment to send a testing signal on the frequency band to be tested through the power amplifier at a target power, and the selection circuit controls a target matching circuit corresponding to the frequency band to be tested to be connected with the second radio frequency port; the preset test instruction comprises the following steps: and at least one identification information of the frequency band to be tested.

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