CN217768281U - Ion source filament mounting tool - Google Patents
Ion source filament mounting tool Download PDFInfo
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- CN217768281U CN217768281U CN202221985891.7U CN202221985891U CN217768281U CN 217768281 U CN217768281 U CN 217768281U CN 202221985891 U CN202221985891 U CN 202221985891U CN 217768281 U CN217768281 U CN 217768281U
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- ion source
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- source filament
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Abstract
The utility model relates to an ion source filament mounting tool, ion source filament mounting tool includes: the measuring tool comprises a connecting piece and a measuring piece, wherein the connecting piece is connected with the measuring piece in an included angle, and the thickness d1 of the measuring piece ranges from 0.5mm to 0.7mm. When installing at ion source filament and reflecting plate, assemble the ion source filament on the reflecting plate in advance earlier, stretch into the gap between reflecting plate and the filament with the measuring part, adjust the ion source filament, make reflecting plate and ion source filament contradict respectively in the relative both sides of measuring part, because the thickness range of measuring part is fixed, thus, under this fixed thickness, can install according to suitable installation clearance fast between filament and the reflecting plate, need not to adjust repeatedly, be favorable to improving the installation effectiveness, reduce artifical intensity of labour, and under this clearance, filament and reflecting plate contact lead to the condition emergence that the ion source opened circuit when can avoiding installing, be favorable to improving the productivity, increase the life of ion source.
Description
Technical Field
The utility model relates to a mass spectrograph equipment technical field especially relates to an ion source filament mounting tool.
Background
With the development of mass spectrometry, mass spectrometers, also called mass spectrometers, have emerged, which are instruments for separating and detecting different isotopes. That is, based on the principle that charged particles can deflect in an electromagnetic field, the instrument separates and detects the composition of substances according to the mass difference of substance atoms, molecules or molecular fragments. Mass spectrometers are centered around an ion source, a mass analyzer and an ion detector. The ion source is a device that ionizes sample molecules under high vacuum conditions. The ionized molecules are further fragmented into a plurality of fragment ions and neutral particles of smaller mass due to the excessive energy received. They gain average kinetic energy with the same energy under the action of the accelerating electric field and enter the mass analyzer. A mass analyzer is a device that separates ions of different masses that enter it simultaneously by their mass-to-charge ratio m/e. The separated ions enter an ion detector in sequence, and amplified ion signals are collected and processed by a computer to be drawn into a mass spectrogram.
In the conventional technology, when the filament of the ion source is installed on the front reflection plate, the installation distance between the filament and the front reflection plate is determined by the distance between two slots on the front reflection plate. After the installation is completed, whether the distance between the filament and the front reflection plate is proper or not cannot be determined, however, if the distance between the filament and the front reflection plate is too close or too far or askew, a short circuit may be formed, so that the ion source fails, and the service life of the ion source is affected.
SUMMERY OF THE UTILITY MODEL
Therefore, there is a need for an ion source filament installation tool, which can effectively improve the installation efficiency of the ion source filament and the front reflection plate, avoid the formation of short circuit, and improve the service life of the ion source.
The technical scheme is as follows: an ion source filament installation tool, comprising: the measuring tool comprises a connecting piece and a measuring piece, wherein the connecting piece and the measuring piece are connected in an included angle, and the thickness d1 of the measuring piece ranges from 0.5mm to 0.7mm.
Above-mentioned ion source filament mounting tool, when ion source filament and reflecting plate are installed, assemble the ion source filament on the reflecting plate in advance earlier, then, stretch into the gap between reflecting plate and the filament with the measuring part, continue to adjust the ion source filament, make reflecting plate and ion source filament contradict respectively in the relative both sides of measuring part, because the thickness range of measuring part is 0.5mm ~ 0.7mm, so, under this fixed thickness, can install according to suitable installation clearance fast between filament and the reflecting plate, need not to adjust repeatedly, be favorable to improving the installation effectiveness, reduce artifical intensity of labour, and under this clearance, filament and reflecting plate contact lead to the condition emergence that the ion source opened circuit when can avoiding installing, be favorable to improving the productivity, increase the life of ion source.
In one embodiment, the measuring member is perpendicularly connected to one end of the connecting member, and the included angle between the connecting member and the measuring member is 90 °.
In one embodiment, the thickness d1=0.6mm of the measuring piece, and the thickness of each position of the measuring piece is uniformly set.
In one embodiment, the thickness d2 of the connecting member ranges from 0.5mm to 0.7mm.
In one embodiment, the connecting member and the measuring member are integrally formed.
In one embodiment, the length L1 of the measuring member ranges from 2.3mm to 2.7mm.
In one embodiment, the length L2 of the connector is in the range of 40mm to 60mm.
In one embodiment, the ion source filament installation tool further comprises a handle connected to an end of the connecting member remote from the measuring member.
In one embodiment, the handle is provided with a mounting hole, and the handle is detachably connected with one end of the connecting piece far away from the measuring piece through the mounting hole.
In one embodiment, the outer contour of the handle is oval, the handle is provided with placing planes, and the placing planes and the mounting holes are oppositely arranged at two opposite ends of the handle along the length direction of the handle.
Drawings
The accompanying drawings, which are incorporated in and constitute a part of this application, are included to provide a further understanding of the invention, and are incorporated in and constitute a part of this specification.
In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the drawings needed to be used in the description of the embodiments will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art to obtain other drawings without creative efforts.
FIG. 1 is a schematic diagram showing the overall structure of an ion source filament installation tool according to an embodiment;
FIG. 2 is a schematic diagram of the overall structure of an ion source filament installation tool according to an embodiment;
FIG. 3 is a schematic diagram of a gauge according to an embodiment;
fig. 4 is a schematic structural view of the handle in one embodiment.
Description of reference numerals:
100. an ion source filament installation tool; 110. a measuring tool; 111. a measuring member; 112. a connecting member; 120. a handle; 121. mounting holes; 122. and placing a plane.
Detailed Description
In order to make the above objects, features and advantages of the present invention more comprehensible, embodiments of the present invention are described in detail below with reference to the accompanying drawings. In the following description, numerous specific details are set forth in order to provide a thorough understanding of the present invention. The present invention may, however, be embodied in many different forms and should not be construed as limited to the embodiments set forth herein, as those skilled in the art will be able to make similar modifications without departing from the spirit and scope of the present invention.
In the description of the present invention, it is to be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", "axial", "radial", "circumferential", and the like, indicate the orientation or positional relationship based on the orientation or positional relationship shown in the drawings, and are only for convenience of description and simplicity of description, and do not indicate or imply that the device or element referred to must have a particular orientation, be constructed and operated in a particular orientation, and therefore, should not be construed as limiting the present invention.
Furthermore, the terms "first", "second" and "first" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one such feature. In the description of the present invention, "a plurality" means at least two, e.g., two, three, etc., unless specifically limited otherwise.
In the present invention, unless otherwise expressly stated or limited, the terms "mounted," "connected," and "fixed" are to be construed broadly and may, for example, be fixedly connected, detachably connected, or integrally formed; can be mechanically or electrically connected; they may be directly connected or indirectly connected through intervening media, or they may be interconnected within two elements or in a relationship where two elements interact with each other unless otherwise specifically limited. The specific meaning of the above terms in the present invention can be understood according to specific situations by those skilled in the art.
In the present application, unless expressly stated or limited otherwise, a first feature "on" or "under" a second feature may be directly contacting the second feature or the first and second features may be indirectly contacting the second feature through intervening media. Also, a first feature "on," "over," and "above" a second feature may be directly or diagonally above the second feature, or may simply indicate that the first feature is at a higher level than the second feature. A first feature being "under," "below," and "beneath" a second feature may be directly under or obliquely under the first feature, or may simply mean that the first feature is at a lesser elevation than the second feature.
It will be understood that when an element is referred to as being "secured to" or "disposed on" another element, it can be directly on the other element or intervening elements may also be present. When an element is referred to as being "connected" to another element, it can be directly connected to the other element or intervening elements may also be present. As used herein, the terms "vertical", "horizontal"
The terms "upper", "lower", "left", "right" and the like are for illustrative purposes only and do not mean a unique embodiment.
Referring to fig. 1, 2 and 3, fig. 1 is a schematic diagram illustrating an overall structure of an ion source filament installation tool 100 according to an embodiment of the present invention; fig. 2 is a schematic diagram illustrating an overall structure of an ion source filament installation tool 100 according to an embodiment of the present invention; fig. 3 shows a schematic structural diagram of the measuring tool 110 according to an embodiment of the present invention, which provides an ion source filament installation tool 100, where the ion source filament installation tool 100 includes: a gauge 110, the gauge 110 comprising a connecting member 112 and a measuring member 111. The connecting piece 112 is connected with the measuring piece 111 in an included angle, and the thickness d1 of the measuring piece 111 ranges from 0.5mm to 0.7mm.
Above-mentioned ion source filament mounting tool 100, when ion source filament and reflecting plate are installed, assemble the ion source filament on the reflecting plate in advance earlier, then, stretch into the gap between reflecting plate and the filament with measuring piece 111, continue to adjust the ion source filament, make reflecting plate and ion source filament contradict respectively in the relative both sides of measuring piece 111, because the thickness range of measuring piece 111 is 0.5mm ~ 0.7mm, so, under this fixed thickness, can install according to suitable installation clearance fast between filament and the reflecting plate, need not to adjust repeatedly, be favorable to improving the installation effectiveness, reduce artifical intensity of labour, and under this clearance, filament and reflecting plate contact lead to the condition emergence that the ion source opens circuit when can avoiding installing, be favorable to improving the productivity, increase the life of ion source.
Optionally, the angle between the measuring member 111 and the connecting member 112 is in the range of 80 ° to 100 °.
Specifically, referring to fig. 1, 2 and 3, the measuring part 111 is vertically connected to one end of the connecting part 112, and an included angle between the connecting part 112 and the measuring part 111 is 90 °. So, conveniently stretch into the inslot of reflecting plate to be convenient for place measuring piece 111 on the reflecting plate diapire, improve the installation effectiveness.
Specifically, referring to fig. 2, the thickness d1=0.6mm of the measuring part 111, and the thickness of each position of the measuring part 111 is uniformly set. Therefore, the ion source filament and the reflecting plate can reach the optimal distance at the installation interval, the ion source filament and the reflecting plate can be prevented from contacting, and better working efficiency can be guaranteed.
In one embodiment, referring to FIG. 2, the thickness d2 of the connecting member 112 ranges from 0.5mm to 0.7mm.
Specifically, referring to fig. 2, the thickness d2=0.6mm of the connecting member 112. Further, the thickness of each position of the connecting member 112 is uniformly set. Thus, the structural stability of the connecting member 112 and the overall structural strength of the measuring tool 110 are ensured.
Alternatively, the connection manner of the connecting element 112 and the measuring element 111 may be an insertion connection, a snap connection, a mortise and tenon connection, a pin connection, a threaded connection, an adhesive connection, a welding connection, a pin connection, or other connection manners, or alternatively, the connecting element 112 and the measuring element 111 are integrally formed.
In one embodiment, referring to fig. 1, fig. 2 and fig. 3, the connecting member 112 and the measuring member 111 are integrally formed. Therefore, the production and processing are convenient, the reliability is high, the structure is stable, and the service life of the ion source filament installation tool 100 is prolonged. The present embodiment provides only a specific connection manner between the connecting member 112 and the measuring member 111, but not limited thereto.
Alternatively, the material of the gauge 110 may be plastic, gold, silver, iron, stainless steel, aluminum alloy, copper alloy, glass, quartz, wood, composite material, or other material.
Specifically, the gauge 110 is made of a stainless steel plate. Therefore, the measuring tool 110 made of the stainless steel plate has a smooth surface, high plasticity, toughness and mechanical strength, and is resistant to corrosion of acid, alkaline gas, solution and other media, thereby being beneficial to improving the use quality and prolonging the service life of the measuring tool 110. The present embodiment provides only one material choice for the gauge 110, but not limited thereto.
In one embodiment, referring to fig. 3, the length L1 of the measuring part 111 ranges from 2.3mm to 2.7mm. Specifically, the length L1=2.3mm of the measuring piece 111. Therefore, the measuring tool can conveniently extend into the groove of the reflecting plate and can conveniently extend out, is suitable for ion source filaments of different models, and is favorable for improving the use convenience of the measuring tool 110.
In one embodiment, referring to fig. 3, the length L2 of the connecting member 112 ranges from 40mm to 60mm. Specifically, the length L2=45mm of the connecting member 112. Therefore, under the length range, the use of workers can be facilitated, and the use quality is improved.
In other embodiments, the connecting member 112 may also have a circular arc shape, a curved shape, a wavy shape, a zigzag shape, or other shapes.
Referring to fig. 1, 2 and 4, fig. 4 is a schematic structural diagram of a handle 120 according to an embodiment of the present invention, and in an embodiment, the ion source filament installation tool 100 further includes a handle 120, and the handle 120 is connected to an end of the connecting member 112 away from the measuring member 111. Thus, the operation of the gauge 110 by grasping the handle 120 is advantageous for improving the convenience of operation, and thus the quality of use of the ion source filament installation tool 100.
Alternatively, the handle 120 and the connecting member 112 may be connected by inserting, bonding, welding, magnetic attraction, snap-fit, bolt, screw, pin, rivet, or other connection methods, or a combination of two or more connection methods.
Specifically, referring to fig. 4, the handle 120 is provided with a mounting hole 121, and the handle 120 is detachably connected to an end of the connecting member 112 away from the measuring member 111 through the mounting hole 121. Further, one end of the connector 112 is inserted into the mounting hole 121 and bonded by glue. Thus, the assembly is convenient, the connection stability is strong, and the connection stability between the gauge 110 and the handle 120 is improved, so that the overall quality of the ion source filament installation tool 100 is improved. The present embodiment provides only a specific connection manner between the handle 120 and the gauge 110, but not limited thereto.
Alternatively, the handle 120 may be made of wood, plastic, gold, silver, iron, stainless steel, aluminum alloy, copper alloy, glass, quartz, composite material, or other materials.
Specifically, referring to fig. 3 and 4, the handle 120 is made of wood. Therefore, the processing of the mounting hole 120 is convenient, the material structure is stable, the cost is low, and the production cost of the handle 120 is reduced. The present embodiment provides only one specific material selection for the handle 120, but not limited thereto.
Further, referring to fig. 4, the depth of the mounting hole 120 is 10mm. Thus, the portion of the connecting member 120 extending into the mounting hole 120 is 10mm, which is beneficial to further improving the connection stability of the connecting member 112 and the handle 120.
In one embodiment, referring to fig. 4, the outer contour of the handle 120 is an ellipse, and the handle 120 is provided with a placing plane 122, and the placing plane 122 and the mounting hole 121 are oppositely arranged at two opposite ends of the handle 120 along the length direction of the handle 120. Thus, the oval outer contour is favorable for improving the holding experience, the placing plane 122 can facilitate the vertical placing of the ion source filament installation tool 100, the deformation of the measuring part 111 on the measuring tool 110 is avoided, and the service life of the ion source filament installation tool 100 is favorably prolonged.
In other embodiments, the outer contour of the handle 120 may also be square, circular, rectangular, polygonal, or other irregular shapes, and is not limited herein.
Wherein, to furtherTo understand and explain the longitudinal direction of the handle 120, taking fig. 4 as an example, the longitudinal direction of the handle 120 is the straight line S in fig. 4 1 In the direction indicated by any of the above arrows.
The technical features of the embodiments described above may be arbitrarily combined, and for the sake of brevity, all possible combinations of the technical features in the embodiments described above are not described, but should be considered as being within the scope of the present specification as long as there is no contradiction between the combinations of the technical features.
The above-mentioned embodiments only represent some embodiments of the present invention, and the description thereof is specific and detailed, but not to be construed as limiting the scope of the present invention. It should be noted that, for those skilled in the art, without departing from the spirit of the present invention, several variations and modifications can be made, which are within the scope of the present invention. Therefore, the protection scope of the present invention should be subject to the appended claims.
Claims (10)
1. An ion source filament installation tool, comprising:
the measuring tool comprises a connecting piece and a measuring piece, wherein the connecting piece and the measuring piece are connected in an included angle, and the thickness d1 of the measuring piece ranges from 0.5mm to 0.7mm.
2. The ion source filament installation tool of claim 1, wherein the measuring member is perpendicularly connected to one end of the connecting member, and the included angle between the connecting member and the measuring member is 90 °.
3. The ion source filament installation tool of claim 1, wherein the thickness d1=0.6mm of the measuring piece, and the thickness of each position of the measuring piece is uniformly set.
4. The ion source filament mounting tool of claim 1, wherein the thickness d2 of the connector ranges from 0.5mm to 0.7mm.
5. The ion source filament installation tool of claim 1, wherein the connecting member is an integrally formed structure with the measuring member.
6. The ion source filament installation tool of claim 1, wherein the length L1 of the measurement member is in the range of 2.3mm to 2.7mm.
7. The ion source filament installation tool of claim 1, wherein the length L2 of the connector is in the range of 40mm to 60mm.
8. The ion source filament installation tool of any one of claims 1 to 5, further comprising a handle connected to an end of the connecting member remote from the measurement member.
9. The ion source filament mounting tool of claim 8, wherein the handle is provided with a mounting hole, and the handle is detachably connected with one end of the connecting member away from the measuring member through the mounting hole.
10. The ion source filament mounting tool of claim 8, wherein the outer profile of the handle is oval and the handle is provided with a placement plane, the placement plane and the mounting hole being disposed at opposite ends of the handle opposite to each other along the length of the handle.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202221985891.7U CN217768281U (en) | 2022-07-29 | 2022-07-29 | Ion source filament mounting tool |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202221985891.7U CN217768281U (en) | 2022-07-29 | 2022-07-29 | Ion source filament mounting tool |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN217768281U true CN217768281U (en) | 2022-11-08 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202221985891.7U Active CN217768281U (en) | 2022-07-29 | 2022-07-29 | Ion source filament mounting tool |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN217768281U (en) |
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2022
- 2022-07-29 CN CN202221985891.7U patent/CN217768281U/en active Active
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Address after: 510700 No. 28, Fenghuang fifth road, Huangpu District, Guangzhou, Guangdong Patentee after: Yuexin Semiconductor Technology Co.,Ltd. Address before: 510700 No. 28, Fenghuang fifth road, Huangpu District, Guangzhou, Guangdong Patentee before: Guangzhou Yuexin Semiconductor Technology Co.,Ltd. |