CN217739389U

CN217739389U - Test needle die device for circuit detection

Info

Publication number: CN217739389U
Application number: CN202220990206.3U
Authority: CN
Inventors: 王华荣
Original assignee: Kunshan Jiashikai Electronics Co ltd
Current assignee: Kunshan Jiashikai Electronics Co ltd
Priority date: 2022-04-26
Filing date: 2022-04-26
Publication date: 2022-11-04
Anticipated expiration: 2032-04-26

Abstract

The utility model provides a test needle die device for circuit detection, which comprises an upper panel, a lower bottom plate and test probes, wherein the lower bottom plate is provided with a plurality of support columns for supporting and connecting the upper panel, and the test probes are arranged on the upper panel and the lower bottom plate and penetrate through the upper panel and the lower bottom plate along the vertical direction; a plurality of guide plates are arranged between the upper panel and the lower bottom plate and used for guiding the test probes, and are sleeved on the support columns and uniformly distributed in a space area between the upper panel and the lower bottom plate along the vertical direction; the test probe penetrates through the guide plates. The utility model discloses simple structure, through the metalwork contact of test probe and product to the circuit condition of detection department product, work efficiency is high, reduces the defective percentage, and is efficient, long service life.

Description

Test needle die device for circuit detection

Technical Field

The utility model relates to a test needle mould technical field especially relates to a test needle mould device that circuit detected usefulness.

Background

After the electronic component product is produced and assembled, the product can be subjected to open-short circuit detection according to the use environment and requirements, and whether the circuit of the product meets the design requirements is verified.

When the existing product is tested, the product is pressed on a test needle die, circuit detection is carried out after pressing, and the test needle die used in the prior art can test a small number of products, and after a certain number of products are tested, the needles of the products fall off, so that the test is poor, and the efficiency is greatly reduced.

SUMMERY OF THE UTILITY MODEL

The utility model provides a technical problem provide a simple structure, long service life, efficient circuit detection uses test needle mould device.

In order to solve the technical problem, the utility model provides a test needle die device for circuit detection, which comprises an upper panel, a lower bottom plate and test probes, wherein the lower bottom plate is provided with a plurality of supporting columns for supporting and connecting the upper panel, the test probes are arranged on the upper panel and the lower bottom plate and penetrate through the upper panel and the lower bottom plate along the vertical direction;

a plurality of guide plates are arranged between the upper panel and the lower bottom plate and used for guiding the test probes, and are sleeved on the support columns and uniformly distributed in a space area between the upper panel and the lower bottom plate along the vertical direction;

the test probe penetrates through the guide plates.

Furthermore, the support column is provided with layering columns for the guide plates to be arranged at intervals, and the layering columns are located between every two adjacent guide plates and sleeved on the support column.

Furthermore, a glue surface layer used for fixing the test probe is arranged on the lower bottom plate.

Furthermore, at least one guide plate is provided with a piece of labyringe cloth used for fixing the test probe.

Furthermore, the lower bottom plate is further provided with a positioning column extending to the upper panel, the positioning column extends to the upper side of the upper panel, and the part of the positioning column above the upper panel is conical.

Furthermore, the positioning columns are provided with four parts which are distributed at four corners of the test needle mold device.

Further, the supporting column is located in a space region between the upper panel and the lower bottom plate and does not extend out of the upper panel and the lower bottom plate.

Further, the support columns are distributed at intervals along the circumferential direction of the lower bottom plate.

Compared with the prior art, the utility model discloses following beneficial effect has:

the utility model provides a pair of test needle mould device that circuit detected usefulness, simple structure for the test of the open short circuit condition of product, the product is placed on the top panel, through the metalwork contact of test probe with the product, thereby surveys the circuit condition of department product, and work efficiency is high, reduces the defective percentage.

The test probe is supported at intervals by the multiple layers of guide plates, the adhesive surface layer and the zipper cloth are added at the same time to serve as two layers of needle control cotton, the needle falling phenomenon cannot occur after the test probe is used for multiple times, the stability is good, and the service life is long.

In order to make the aforementioned and other objects, features and advantages of the invention comprehensible, preferred embodiments accompanied with figures are described in detail below.

Drawings

In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the description below are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to the drawings without creative efforts.

FIG. 1 is a schematic view of a preferred embodiment of the present invention;

FIG. 2 is a schematic view of a front view of a preferred embodiment of the present invention;

fig. 3 is a schematic view of a partially enlarged structure of a supporting pillar mounting layered plate according to a preferred embodiment of the present invention.

Reference numbers in the figures:

1. an upper panel; 2. a lower base plate; 3. testing the probe; 4. a support pillar; 5. a guide plate; 6. a stratified column; 7. a rubber surface layer; 8. pulling card cloth; 9. a positioning column; 10. perforating; 11. and a through hole.

Detailed Description

The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.

In the description of the present invention, it should be noted that the terms "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer", and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, and are only for convenience of description and simplification of description, but do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and thus, should not be construed as limiting the present invention. Furthermore, the terms "first," "second," and "third" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance.

In the description of the present invention, it is to be noted that, unless otherwise explicitly specified or limited, the terms "mounted," "connected," and "connected" are to be construed broadly, and may be, for example, fixedly connected, detachably connected, or integrally connected; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The specific meaning of the above terms in the present invention can be understood as a specific case by those skilled in the art.

Referring to fig. 1, 2 and 3, a testing pin die device for circuit testing includes an upper panel 1, a lower plate 2 and testing probes 3, wherein the lower plate 2 is provided with a plurality of supporting posts 4 for supporting and connecting the upper panel 1, and the testing probes 3 are mounted on the upper panel 1 and the lower plate 2 and penetrate through the upper panel 1 and the lower plate 2 along a vertical direction;

a plurality of guide plates 5 are arranged between the upper panel 1 and the lower bottom plate 2 and used for guiding the test probes 3, and the plurality of guide plates 5 are sleeved on the support columns 4 and are uniformly distributed in a space area between the upper panel 1 and the lower bottom plate 2 along the vertical direction;

the test probes 3 penetrate through the guide plates 5, and due to the fact that the test probes 3 have certain flexibility, after penetrating through the guide plates 5, the test probes 3 can be supported and guided through the guide plates 5, and then extend out of the upper end of the upper panel 1 and the lower end of the lower bottom plate 2, and circuit detection of the test probes 3 on products is facilitated.

The product to be detected can be placed on the upper panel 1, and after the product is pressed through an upper die (not shown in the figure), the metal part of the product is in contact with a test probe extending out of the upper end of the upper panel 1, and the lower end of the test probe 3 extends to the outer side of the lower bottom plate 2 and is connected with an external detection machine (not shown in the figure), so that the open-short circuit detection of the product to be detected is realized.

The supporting columns 4 are arranged in a plurality, and the supporting columns 4 are distributed at intervals along the circumferential direction of the lower bottom plate 2, so that the installation stability of the upper panel 1 and the plurality of guide plates 5 is improved. Meanwhile, in order to facilitate the installation of the guide plates 5 at intervals, each support column 4 is provided with a layering column 6 for the guide plates 5 at intervals, the layering columns 6 are located between every two adjacent guide plates 5 and sleeved on the support columns 4, each layering column 6 is of a hollow structure, and the inner diameter of each layering column is larger than the diameter of each support column 4. Each guide plate 5 is sleeved on the support column 4, and the guide plates 5 are spaced by the layering columns 6 sleeved on the support columns 4, so that the guide plates 5 are mounted at intervals, and the test probes 3 are conveniently guided.

In this embodiment, be equipped with on lower plate 2 and be used for fixing test probe 3's gluey surface course 7, at least one be equipped with on the deflector 5 and be used for fixing test probe 3's the card cloth 8 of drawing, it is preferred, set up the card cloth 8 of drawing on the deflector 5 of the intermediate position among a plurality of deflectors 5, as two-layer accuse needle cotton through drawing card cloth 8 and gluey surface course 7, increase test probe 3's stability, avoid droing, after using many times, the needle phenomenon can not appear falling, improves life.

In addition, in order to position and place a product on the upper panel 1, a positioning column 9 extending to the upper panel 1 is further arranged on the lower bottom plate 2, the positioning column 9 extends to the upper side of the upper panel 1, and the portion of the positioning column 9 located above the upper panel 1 is conical. The four positioning columns 9 are arranged and distributed at four corners of the test needle mold device. The lower bottom plate 2, the upper panel 1 and the plurality of guide plates 5 are further connected through the positioning columns 9, the stability of the test pin die device is improved, and meanwhile the top ends of the positioning columns 9 extend to the upper portion of the upper panel 1 and are used for clamping and embedding corresponding products.

The upper panel 1 is provided with a plurality of through holes 10 used for connecting and installing the positioning columns 9, so that the positioning columns 9 can be conveniently installed at different positions of the test needle die device, and the positions of the positioning columns 9 on the test needle die device can be adjusted to position products corresponding to different products to be tested. Each guide plate 5 is provided with a through hole 11 corresponding to the through hole 10 of the upper panel 1.

In the present embodiment, the supporting pillars 4 are located in the space region between the upper panel 1 and the lower plate 2, and do not extend outside the upper panel 1 and the lower plate 2. Make things convenient for the product to install on the surface of top panel 1 to fix a position the product through reference column 9, avoid supporting the location influence to the product.

The above is only the embodiment of the present invention, not limiting the scope of the present invention, all the equivalent structures or equivalent processes of the present invention can be used in other related technical fields, directly or indirectly, or in the same way as the present invention.

Claims

1. A test needle die device for circuit detection is characterized by comprising an upper panel, a lower bottom plate and test probes, wherein a plurality of support columns for supporting and connecting the upper panel are arranged on the lower bottom plate;

the test probe penetrates through the guide plates.

2. The apparatus according to claim 1, wherein the supporting columns are provided with layered columns for the guiding plates to be spaced apart from each other, and the layered columns are located between two adjacent guiding plates and are sleeved on the supporting columns.

3. The test pin die apparatus of claim 1, wherein the lower plate is provided with a glue surface layer for fixing the test probe.

4. The test pin die apparatus of claim 1, wherein at least one of the guide plates is provided with a labyrinthine cloth for fixing the test probe.

5. The pin die testing device as claimed in claim 1, wherein the bottom plate further has positioning posts extending to the top plate, the positioning posts extending above the top plate, and a portion of the positioning posts above the top plate is tapered.

6. The apparatus as claimed in claim 5, wherein the positioning posts are provided with four corners and are divided into four parts.

7. The apparatus of claim 1, wherein the support posts are located in a spatial region between the top plate and the bottom plate and do not extend outside the top plate and the bottom plate.

8. The apparatus of claim 1, wherein the support posts are spaced apart along a circumference of the lower plate.