CN217690055U

CN217690055U - Intelligent test equipment of memory chip

Info

Publication number: CN217690055U
Application number: CN202221139140.3U
Authority: CN
Inventors: 阮健军
Original assignee: China Semiconductor Shenzhen Co ltd
Current assignee: China Semiconductor Shenzhen Co ltd
Priority date: 2022-05-12
Filing date: 2022-05-12
Publication date: 2022-10-28
Anticipated expiration: 2032-05-12

Abstract

The utility model relates to a chip testing technical field specifically is an intelligent test equipment of memory chip, comprising a base plate, fixed establishment is installed to the intermediate position of bottom plate top outer wall, fixed establishment includes the driving piece, the backup pad is installed at the top of driving piece, fixed mounting has the fixing base on the top outer wall of backup pad, open at the fixing base top has the rectangle mouth, fixed mounting has the rubber pad on the inner wall all around of rectangle mouth, be equipped with buffer gear on the bottom inner wall of rectangle mouth, install the test groove on the inner wall of rubber pad, the equal vertical riser of installing in both sides of bottom plate top outer wall, the utility model discloses utilize trimmer motor fine setting to examine the angle of putting of groove, be convenient for being fit for the inserting of memory chip memory, play the effect of buffering through the rubber pad, through damping buffer cylinder, damping buffer beam and spring, turn into damping force and slow down the vibration with elastic potential energy for the device supports stably.

Description

Intelligent test equipment of memory chip

Technical Field

The utility model relates to a chip test technical field specifically is an intelligent test equipment of memory chip.

Background

The chip is formed by placing a large number of integrated circuits formed by microelectronic components on a plastic substrate, the chip, a circuit board and a golden finger form a memory bank, and when the memory chip is intelligently tested, the memory bank of the chip can be tested, so that intelligent test equipment of the memory chip is required.

In the prior art, there are some problems, such as: the memory chip is not easy to be tested, so that the chip is not easy to be fixed and stable, the test result is easy to be influenced, and the accuracy of data obtained is influenced, so that the problem needs to be solved by an intelligent test device of the memory chip urgently.

SUMMERY OF THE UTILITY MODEL

An object of the utility model is to provide an intelligent test equipment of memory chip to solve the problem that proposes in the above-mentioned background art.

The technical scheme of the utility model is that: the utility model provides an intelligent test equipment of memory chip, includes the bottom plate, fixed establishment is installed to the intermediate position of bottom plate top outer wall, fixed establishment includes the driving piece, the backup pad is installed at the top of driving piece, fixed mounting has the fixing base on the top outer wall of backup pad, open at the fixing base top has the rectangle mouth, fixed mounting has the rubber pad on the inner wall all around of rectangle mouth, be equipped with buffer gear on the bottom inner wall of rectangle mouth, install the test groove on the inner wall of rubber pad, the equal vertical riser of installing in both sides of bottom plate top outer wall, two the relative one side outer wall of riser is close to the fixed position at top and has the diaphragm, the intermediate position of diaphragm bottom outer wall is equipped with adjustment mechanism.

Preferably, the driving part comprises a case, the case is fixedly mounted at the middle position of the outer wall of the top of the bottom plate, a fine adjustment motor is fixedly mounted on the inner wall of the bottom of the case, a one-end key of an output shaft of the fine adjustment motor is connected with a transmission shaft, the fine adjustment motor is started to drive the transmission shaft to rotate, and then the placing angle of the test slots is conveniently fine adjusted.

Preferably, the one end of transmission shaft is located the top of quick-witted case, the bearing frame has been cup jointed to the one end of transmission shaft, the top fixed mounting of bearing frame is on the bottom outer wall of backup pad, and the transmission shaft drives bearing frame and backup pad and rotates, and then changes the angle of test groove, is convenient for cooperate the DRAM.

Preferably, buffer gear includes a plurality of damping buffer barrels, damping buffer barrel fixed mounting is on the bottom inner wall of rectangle mouth, equal activity grafting has the damping cushion pole on the top inner wall of damping buffer barrel, the equal fixed connection in top of damping cushion pole is on the bottom outer wall of test groove, and when the device pushed down, the damping cushion pole impressed the damping buffer barrel and forms the damping force to cushion, guarantee the stability of device.

Preferably, the spring has been cup jointed on the circumference outer wall of damping buffer cylinder and damping buffer pole, utilizes the compression of spring to cushion, cooperatees with damping buffer pole and damping buffer cylinder for the amplitude attenuates fast.

Preferably, adjustment mechanism includes electric telescopic handle, electric telescopic handle passes through the bolt fastening at the intermediate position of diaphragm bottom outer wall, the one end of electric telescopic handle extension rod has the roof through the bolt fastening, the equal fixed mounting in both sides of roof bottom outer wall has the arm lock, utilizes the inboard chip memory strip of arm lock centre gripping, then utilizes electric telescopic handle to adjust its upper and lower position.

Preferably, one side of the outer wall of the bottom of the top plate is fixedly provided with a connecting plate through a bolt, the outer wall of one side of the connecting plate is fixedly provided with a fan, the fan is started to blow the memory bank, impurities attached to the surface of the memory bank are blown away, and the influence on the test is avoided.

The utility model discloses an improve and provide an intelligent test equipment of memory chip here, compare with prior art, have following improvement and advantage:

one is as follows: the utility model discloses a set up fine setting motor, rubber pad, damping cushion cylinder, damping buffer rod and spring, utilize the fine setting motor to finely tune the angle of putting of test groove, be convenient for be fit for the inserting of memory chip memory strip, play the effect of buffering through the rubber pad, through damping cushion cylinder, damping buffer rod and spring, turn into the damping force with elastic potential energy and slow down the vibration for the device supports stably;

the second step is as follows: the utility model discloses a set up electric telescopic handle, arm lock and fan, the fixed memory chip memory strip of centre gripping of being convenient for to and reciprocate, blow off the debris on memory strip surface through the fan, avoid influencing the test.

Drawings

The invention is further explained below with reference to the figures and examples:

FIG. 1 is a schematic sectional view of the whole structure of the present invention;

fig. 2 is a schematic perspective view of the fixing mechanism of the present invention;

FIG. 3 is an enlarged schematic view of FIG. 1 at A;

fig. 4 is an enlarged schematic view of fig. 1 at B.

Description of reference numerals:

1. a base plate; 2. a chassis; 3. a vertical plate; 4. fine tuning a motor; 5. a drive shaft; 6. a support plate; 7. a fixed seat; 8. a rubber pad; 9. a transverse plate; 10. an electric telescopic rod; 11. a top plate; 12. a test slot; 13. a bearing seat; 14. a fan; 15. a connecting plate; 16. clamping arms; 17. a damping buffer cylinder; 18. a spring; 19. damping buffer rod.

Detailed Description

The present invention will be described in detail below, and it is apparent that the technical solutions in the embodiments of the present invention are described clearly and completely. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.

The utility model discloses an improve and provide an intelligent test equipment of memory chip here, the technical scheme of the utility model is:

as shown in fig. 1-4, an intelligent test equipment of memory chip, including bottom plate 1, fixed establishment is installed to the intermediate position of bottom plate 1 top outer wall, fixed establishment includes the driving piece, backup pad 6 is installed at the top of driving piece, fixed mounting has fixing base 7 on the top outer wall of backup pad 6, it has the rectangle mouth to open at fixing base 7 top, fixed mounting has rubber pad 8 on the inner wall all around of rectangle mouth, be equipped with buffer gear on the bottom inner wall of rectangle mouth, install test groove 12 on the inner wall of rubber pad 8, the equal vertical riser 3 of installing in both sides of bottom plate 1 top outer wall, the fixed position that one side outer wall that two risers 3 are relative is close to the top has diaphragm 9, the intermediate position of diaphragm 9 bottom outer wall is equipped with adjustment mechanism.

By means of the structure, the inner-side chip memory bank is fixed by the adjusting mechanism, then the memory bank is placed above the test slot 12, the placing angle of the test slot 12 is finely adjusted by the driving piece, and then the memory bank is placed inside the test slot to start testing.

Further, the driving piece comprises a case 2, the case 2 is fixedly installed in the middle of the outer wall of the top of the bottom plate 1, a fine adjustment motor 4 is fixedly installed on the inner wall of the bottom of the case 2, and a transmission shaft 5 is connected with a one-end key of an output shaft of the fine adjustment motor 4.

By means of the structure, the fine tuning motor 4 is started to drive the transmission shaft 5 to rotate, and then the placing angle of the test slot 12 is conveniently fine tuned.

Furthermore, one end of the transmission shaft 5 is located above the case 2, a bearing seat 13 is sleeved at one end of the transmission shaft 5, and the top end of the bearing seat 13 is fixedly installed on the outer wall of the bottom of the supporting plate 6.

By means of the structure, the transmission shaft 5 drives the bearing seat 13 and the support plate 6 to rotate, so that the angle of the test slot 12 is changed, and the memory bank is convenient to match.

Further, buffer gear includes a plurality of damping buffer barrels 17, and damping buffer barrels 17 fixed mounting has damping buffer rod 19 on the bottom inner wall of rectangle mouth, the equal activity grafting in top inner wall of damping buffer barrel 17, and the equal fixed connection in top of damping buffer rod 19 is on the bottom outer wall of testing groove 12.

By means of the structure, when the device is pressed downwards, the damping buffer rod 19 is pressed into the damping buffer cylinder 17 to form damping force, so that buffering is performed, and the stability of the device is guaranteed.

Further, springs 18 are sleeved on the circumferential outer walls of the damping buffer cylinder 17 and the damping buffer rod 19.

By the structure, the compression of the spring 18 is utilized for buffering, and the damping buffering rod 19 and the damping buffering cylinder 17 are matched, so that the amplitude is quickly attenuated.

Further, adjustment mechanism includes electric telescopic handle 10, and electric telescopic handle 10 passes through the bolt fastening at the intermediate position of diaphragm 9 bottom outer wall, and the one end of electric telescopic handle 10 extension rod has roof 11 through the bolt fastening, and the equal fixed mounting in both sides of roof 11 bottom outer wall has arm lock 16.

With the above structure, the internal memory chip strip is clamped by the clamping arm 16, and then the electric telescopic rod 10 is used to adjust the vertical position.

Further, a connecting plate 15 is fixed on one side of the outer wall of the bottom of the top plate 11 through bolts, and a fan 14 is fixedly mounted on the outer wall of one side of the connecting plate 15.

By means of the structure, the fan 14 is started to blow the memory bank, so that sundries attached to the surface of the memory bank are blown away, and the test is prevented from being influenced.

The working principle is as follows: during the use, arrange the memory chip memory stick in the below of roof 11, utilize arm lock 16 centre gripping both ends of its top, then start fan 14, blow off its surperficial debris, utilize electric telescopic handle 10 to drive it and move down to the surface of test groove 12, start fine setting motor 4 and drive test groove 12 and rotate to suitable angle, be convenient for cooperate the insertion of memory stick, insert the memory chip memory stick and begin the test promptly after testing groove 12, play the effect of buffering through rubber pad 8, through damping buffer cylinder 17, damping buffer lever 19 and spring 18, turn into the damping force with elastic potential energy and slow down the vibration, make the device support stable, it tests to be convenient for it.

Claims

1. The utility model provides an intelligent test equipment of memory chip, includes bottom plate (1), its characterized in that: fixing mechanism is installed to the intermediate position of bottom plate (1) top outer wall, fixing mechanism includes the driving piece, backup pad (6) are installed at the top of driving piece, fixed mounting has fixing base (7) on the top outer wall of backup pad (6), open at fixing base (7) top has the rectangle mouth, fixed mounting has rubber pad (8) on the inner wall all around of rectangle mouth, be equipped with buffer gear on the bottom inner wall of rectangle mouth, install on the inner wall of rubber pad (8) test groove (12), the equal vertical riser (3) of installing in both sides of bottom plate (1) top outer wall, two the fixed position that one side outer wall that riser (3) are relative is close to the top has diaphragm (9), the intermediate position of diaphragm (9) bottom outer wall is equipped with adjustment mechanism.

2. The intelligent test equipment of memory chips of claim 1, characterized in that: the driving piece comprises a case (2), the case (2) is fixedly installed in the middle of the outer wall of the top of the bottom plate (1), a fine adjustment motor (4) is fixedly installed on the inner wall of the bottom of the case (2), and a one-end key of an output shaft of the fine adjustment motor (4) is connected with a transmission shaft (5).

3. The intelligent test equipment of memory chips of claim 2, characterized in that: one end of the transmission shaft (5) is located above the case (2), a bearing seat (13) is sleeved at one end of the transmission shaft (5), and the top end of the bearing seat (13) is fixedly installed on the outer wall of the bottom of the supporting plate (6).

4. The intelligent test equipment of memory chips of claim 1, characterized in that: buffer gear includes a plurality of damping buffer barrels (17), damping buffer barrel (17) fixed mounting is on the bottom inner wall of rectangle mouth, equal activity grafting has damping buffering pole (19) on the top inner wall of damping buffer barrel (17), the equal fixed connection in top of damping buffering pole (19) is on the bottom outer wall of test groove (12).

5. The intelligent test equipment of memory chips of claim 4, characterized in that: and springs (18) are sleeved on the circumferential outer walls of the damping buffer cylinder (17) and the damping buffer rod (19).

6. The intelligent test equipment of memory chips of claim 1, characterized in that: the adjusting mechanism comprises an electric telescopic rod (10), the electric telescopic rod (10) is fixed at the middle position of the outer wall of the bottom of the transverse plate (9) through bolts, a top plate (11) is fixed at one end of an extension rod of the electric telescopic rod (10) through bolts, and clamping arms (16) are fixedly mounted on the two sides of the outer wall of the bottom of the top plate (11).

7. The intelligent test equipment of memory chips of claim 6, characterized in that: one side of the outer wall of the bottom of the top plate (11) is fixedly provided with a connecting plate (15) through a bolt, and the outer wall of one side of the connecting plate (15) is fixedly provided with a fan (14).