CN217689266U - High-precision automatic temperature coefficient testing device for voltage reference diode - Google Patents
High-precision automatic temperature coefficient testing device for voltage reference diode Download PDFInfo
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- CN217689266U CN217689266U CN202122055429.9U CN202122055429U CN217689266U CN 217689266 U CN217689266 U CN 217689266U CN 202122055429 U CN202122055429 U CN 202122055429U CN 217689266 U CN217689266 U CN 217689266U
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Abstract
A high accuracy voltage reference diode temperature coefficient automatic testing arrangement includes: the device comprises a computer, a local database, a display operation device, a constant current source, a test module device, a temperature test box, a piece to be tested, a test fixture device, a temperature control system, a test control system, a motor servo system, a motor positioning system, an electrode alignment contact device, a parameter test device, a data acquisition system and a test cable; the computer is connected with the local database, the display operation device, the data acquisition system and the test control system; the parameter testing device is connected with the data acquisition system and the electrode alignment contact device; the test module device is connected with the constant current source and the test fixture device; the temperature test box is connected with the test control system; two ends of the motor positioning device are respectively connected with the motor servo system and the electrode alignment contact device; the electrode alignment contact device is connected with the test fixture device. The method solves the problems from manual testing to automatic testing, and is widely applied to testing of the temperature coefficient of the diode.
Description
Technical Field
The utility model relates to a diode test technical field particularly, relates to an automatic testing arrangement of voltage reference diode temperature coefficient.
Background
The temperature coefficient is an important parameter of the high-precision voltage reference diode, and the test method comprises the following steps: under a certain ambient temperature (usually 75 ℃), a certain current I is reversely applied to the diode by the constant current source Z1 And testing the voltage value V at two ends by a high-precision digital multimeter after keeping for 30 minutes Z1 (ii) a Then a certain current I is applied in reverse at another ambient temperature (usually 25 ℃ C.) Z2 Keeping the voltage value V at the two ends after 30 minutes Z2 The voltage value remains at least the decimal point 5 th bit. Temperature coefficient alpha thereof VZ The calculation formula of (c) is as follows. Calculating alpha VZ After the value is obtained, the grade is matched according to the corresponding product specification requirement, and qualified products are selected.
In the formula: v Z1 At a temperature T A1 A measured voltage reference;
V Z2 at a temperature T A2 The measured voltage reference is taken.
Calculating alpha VZ After the value is obtained, the grade is matched according to the corresponding product specification requirement, and qualified products are selected. The testing method has high requirement on precision of various parameters, the existing equipment is a single component of an instrument and a meter and is matched for test verification, the whole testing process is manually tested, whether a testing result is qualified or not is manually calculated, and the testing method is poor in precision, consistency and repeatability and is not suitable for batch screening testing.
In view of this, the present invention is especially provided.
Disclosure of Invention
The utility model discloses aim at solving current test system and be artifical manual test and manual calculation, the precision is poor, the uniformity is poor, repeatability is poor, is not suitable for the problem of batchization screening test.
The utility model discloses test system's design concept is based on current high accuracy universal instrument, design new product test seat, it establishes ties a plurality of examination products that await measuring, then draw forth the corresponding polarity of product and make into and survey the board, drive the test contact through the motor and carry out automatic test after that, utilize when testing and begin test signal for computer input, computer programming control universal meter reads data, treat that two temperature point tests are accomplished after, will test data import procedure and require to calculate product alpha according to formula 1 VZ And finally, automatic testing is realized.
Therefore, the utility model provides a high accuracy voltage reference diode temperature coefficient automatic testing arrangement, the functional block diagram schematic diagram is shown in FIG. 1. The method comprises the following steps: the device comprises a computer, a local database, a display operation device, a constant current source, a test module device, a temperature test box, a piece to be tested, a test fixture device, a temperature control system, a test control system, a motor servo system, a motor positioning system, an electrode alignment contact device, a parameter test device, a data acquisition system, a test cable and the like;
the computer is provided with a control system program module, a test data calculation program module and a data acquisition program module, and a calculation host comprises at least 2 Local Area Network (LAN) ports and mainly has the functions of providing operation processing and data storage and exchanging or controlling the data acquisition system and the test control system;
the local database is in data connection with the computer through a data line, and data backup, storage and exchange are carried out;
the test control system mainly comprises a test control system program module, an instrument control module, a test setting module, a data reading module, a data fitting module, a curve display module, a data processing module, a data storage module and other functional modules;
the parameter testing device is connected with a computer LAN port through an LAN line and a data acquisition system and is connected with the electrode alignment contact device through a testing line;
the test module device consists of a related test circuit, is connected with a constant current source through a power line and is connected with the test fixture device through a high-temperature test line, and the test fixture device consists of a to-be-tested piece fixture and a related auxiliary piece;
the temperature test box comprises a temperature control system which is in data connection with a temperature control port of the test control system, and the test control system is connected with a computer LAN port through an LAN line;
a servo control port of the test control system is connected with one end of a motor servo system, the other end of the motor servo system is connected with one end of a motor positioning device, the other end of the motor positioning device is connected with an electrode alignment contact device, and accurate alignment and contact control are carried out on a test electrode contact head and a test probe;
the electrode alignment contact device is connected with the test fixture device through a test wire;
the test fixture device and the piece to be tested are arranged in a constant temperature area of the temperature test box;
the display operation device is connected with the computer through a data line;
the test cable is a LAN port connecting line and a test signal transmission line.
Has the advantages that:
1. the automatic data acquisition of the temperature coefficient of the voltage reference diode can be realized.
2. The temperature coefficient calculation grading can be realized.
3. And automatic generation of data reports after grading can be realized.
4. Automatic test improves production efficiency, reduce cost.
The utility model is suitable for a high accuracy voltage reference diode temperature coefficient test of a plurality of models, encapsulation.
Drawings
FIG. 1 is a schematic diagram of a test principle.
Detailed Description
Referring to fig. 1, a specific embodiment of an automatic temperature coefficient testing device for a high-precision voltage reference diode is as follows:
the parameter testing device is a high-precision testing device which is at least accurate to the 5 th bit of the decimal point. Preferably, a high precision digital multimeter.
The constant current source is a high-precision constant current source.
The test fixture device comprises a product test seat, products to be tested can be conveniently placed in batches, the products to be tested are connected in series and are connected with a constant current power supply through corresponding ports, and therefore the purpose of supplying power to the products is achieved. Preferably 120 products are in series.
The electrode alignment contact device comprises a pair of test electrode contact heads and a test probe, wherein the contact heads are led out from test pins of products to be tested, one end of each contact head is connected with a digital multimeter to collect a voltage value, the other end of each contact head is connected with a product leading-out end, and the contact head of the leading-out end of each product is connected with the test probe through the rotation of a motor, so that the purpose of voltage test of each product is achieved.
The test control system controls the start and stop of the motor on one hand, and achieves the purpose of rotating 3 degrees and staying for 3 seconds; and on the other hand, recording the current test value of the digital multimeter for the computer test signal before rotation.
The data acquisition system is used for controlling the constant current source and the universal meter to work, acquiring corresponding test data and calculating the test data according to a formula 1. The test data report finally generated after data calculation is displayed by the display operation device, and the report file can be exported by a computer.
The specific circuits capable of realizing the functions of the block diagram in the figure 1 are many, and the purpose of constant power aging of the output end of the optical coupler can be realized as long as the idea of the circuit block diagram in the figure 1 is met.
Finally, it should be noted that: the above embodiments are merely examples for clarity of illustration, and the present invention includes but is not limited to the above embodiments, which need not be exhaustive of all embodiments. Other variations and modifications will be apparent to persons skilled in the art in light of the above description. All the embodiments meeting the requirements of the utility model belong to the protection scope of the utility model.
Claims (9)
1. The utility model provides a high accuracy voltage reference diode temperature coefficient automatic testing arrangement which characterized in that includes: the device comprises a computer, a local database, a display operation device, a constant current source, a test module device, a temperature test box, a piece to be tested, a test fixture device, a temperature control system, a test control system, a motor servo system, a motor positioning system, an electrode alignment contact device, a parameter test device, a data acquisition system and a test cable;
the computer comprises at least 2 Local Area Network (LAN) ports;
the local database is in data connection with the computer through a data line;
the test control system comprises a control instrument and an interface component;
the parameter testing device is connected with a computer LAN port through an LAN line and a data acquisition system and is connected with the electrode alignment contact device through a testing line;
the test module device comprises a test board which is connected with a constant current source through a power line and is connected with the test fixture device through a high-temperature test line, the test fixture device comprises a product test seat, and a plurality of products to be tested are connected in series through the product test seat and are connected with the constant current source through corresponding ports;
the temperature test box comprises a temperature control system which is in data connection with a temperature control port of the test control system, and the test control system is connected with a computer LAN port through an LAN line;
a servo control port of the test control system is connected with one end of a motor servo system, the other end of the motor servo system is connected with one end of a motor positioning device, the other end of the motor positioning device is connected with an electrode alignment contact device, and accurate alignment and contact control are carried out on a test electrode contact head and a test probe;
the electrode alignment contact device is connected with the test fixture device through a test wire;
the test fixture device and the piece to be tested are arranged in a constant temperature area of the temperature test box;
the display operation device is connected with the computer through a data line.
2. The apparatus as claimed in claim 1, wherein the test cables are LAN port connection lines and test signal transmission lines.
3. The apparatus according to claim 1, wherein the parametric test device is a high precision test device, at least as accurate as decimal point 5 th bit.
4. The automatic temperature coefficient testing device for the high-precision voltage reference diode as claimed in claim 3, wherein the high-precision testing device is a high-precision digital multimeter.
5. The automatic temperature coefficient testing device for high-precision voltage reference diodes according to claim 1, wherein the constant current source is a high-precision constant current source.
6. The apparatus according to claim 1, wherein the number of products to be tested is 120.
7. The automatic testing device for the temperature coefficient of the high-precision voltage reference diode according to claim 1, wherein the electrode alignment contact device comprises a test electrode contact head and a testing probe, the contact head is led out from a testing pin of a product to be tested, one end of the contact head is connected with a digital multimeter to collect a voltage value, the other end of the contact head is connected with a product leading-out end, and the contact head of the leading-out end of each product is connected with the testing probe through rotation of a motor.
8. The automatic testing device for the temperature coefficient of the high-precision voltage reference diode as claimed in claim 1, wherein the testing control system controls the start and stop of the motor to rotate for 3 degrees and stay for 3 seconds; on one hand, a test signal is sent to the computer before rotation, and the current test value of the digital multimeter is recorded.
9. The apparatus as claimed in claim 1, wherein the data collection system is used to control the constant current source and the multimeter to collect the corresponding test data, and to perform the test data according to the temperature coefficient α VZ The test data report finally generated after data calculation is displayed by the display operation device, or the report file can be exported by a computer.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202122055429.9U CN217689266U (en) | 2021-08-30 | 2021-08-30 | High-precision automatic temperature coefficient testing device for voltage reference diode |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202122055429.9U CN217689266U (en) | 2021-08-30 | 2021-08-30 | High-precision automatic temperature coefficient testing device for voltage reference diode |
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| Publication Number | Publication Date |
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| CN217689266U true CN217689266U (en) | 2022-10-28 |
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| CN202122055429.9U Active CN217689266U (en) | 2021-08-30 | 2021-08-30 | High-precision automatic temperature coefficient testing device for voltage reference diode |
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2021
- 2021-08-30 CN CN202122055429.9U patent/CN217689266U/en active Active
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