CN217639375U - Test box capable of automatically switching test point positions - Google Patents
Test box capable of automatically switching test point positions Download PDFInfo
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- CN217639375U CN217639375U CN202221217472.9U CN202221217472U CN217639375U CN 217639375 U CN217639375 U CN 217639375U CN 202221217472 U CN202221217472 U CN 202221217472U CN 217639375 U CN217639375 U CN 217639375U
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Abstract
The utility model discloses a test box, in particular to automatic change test box who switches test point location, include: the box body, it has the lid to articulate on the box body, be provided with the probe on the lid, the through-hole has been seted up to the box body bottom, be provided with the heat conduction piece in the through-hole, heat conduction piece below is provided with the semiconductor refrigeration piece. Traditional test box needs the manual toggle switch that goes to realize the test, and efficiency of software testing is low, and wastes time and energy, and the test box of this application can realize the automatic test point that switches, realizes automatic test function, has improved efficiency of software testing, has greatly practiced thrift the human cost.
Description
Technical Field
The utility model relates to a semiconductor test equipment technical field, in particular to automatic change test box who switches test point location.
Background
Along with the development of the industry, the traditional mechanical switch test box can not meet the development of science and technology, and in order to develop technological innovation, the traditional test box is replaced by a test box which is automatically switched into test point positions.
SUMMERY OF THE UTILITY MODEL
The utility model discloses a solve existing problem among the above-mentioned prior art, provide an automatic change test box who switches test position to solve present technical problem.
The utility model provides a technical scheme that its technical problem adopted is:
the utility model provides an automatic change test box that switches test point location, include: the box body, it has the lid to articulate on the box body, be provided with the probe on the lid, the through-hole has been seted up to the box body bottom, be provided with the heat conduction piece in the through-hole, heat conduction piece below is provided with the semiconductor refrigeration piece.
Preferably, the lower surface of the heat conducting block is tightly attached to the upper surface of the semiconductor refrigerating sheet.
Preferably, the box body is arranged on a PCB, and a connector used for supplying power to the test box is arranged on the PCB.
Preferably, the connector is connected with a power supply, and a relay for controlling the on-off of each test point of the test box is connected between the power supply and the connector.
Preferably, the relay is connected with an upper computer. And the box cover is provided with a plurality of silicon photodiodes.
The utility model has the advantages that: traditional test box needs to go toggle switch manually and realizes the test, and efficiency of software testing is low, and wastes time and energy, and the test box of this application can realize automatic switching test point, realizes automatic test function, has improved efficiency of software testing, has greatly practiced thrift the human cost.
Drawings
The foregoing aspects and advantages of the invention will become apparent and more readily appreciated from the following description of the embodiments, taken in conjunction with the accompanying drawings of which:
fig. 1 is a schematic structural diagram of a test box for automatically switching test sites according to an embodiment of the present invention;
fig. 2 is a schematic structural diagram of a test box for automatically switching test sites according to an embodiment of the present invention;
fig. 3 is a control block diagram of the test box for automatically switching test point locations according to the embodiment of the present invention.
Description of reference numerals:
in fig. 1-3, a PCB board 1; a box body 2; a heat conducting block 3; a box cover 4; a probe 5; a silicon photodiode 6; and a connector 7.
Detailed Description
The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.
The utility model provides an automatic change test box that switches test point location, include: box body 2, box body 2 go up to articulate there is lid 4, is provided with probe 5 on the lid 4, and the through-hole has been seted up to 2 bottoms of box body, is provided with heat conduction piece 3 in the through-hole, and 3 below of heat conduction piece are provided with the semiconductor refrigeration piece. Box body 2 and lid 4 all are the aluminum alloy material, and heat conduction piece 3 is a copper billet for the heat that produces during the test of conduction semiconductor, the semiconductor refrigeration piece sets up between PCB board 1 and box body 2.
The lower surface of the heat conducting block 3 is tightly attached to the upper surface of the semiconductor refrigerating sheet. The box body 2 is arranged on the PCB board 1, and the PCB board 1 is provided with a connector 7 for supplying power to the test box.
The connector 7 is connected with a power supply, and a relay for controlling the on-off of each test point of the test box is connected between the power supply and the connector 7.
The relay is connected with the upper computer. The box cover 4 is provided with a plurality of silicon photodiodes 6, the relay and the upper computer adopt the conventional technology in the field, and the structure of the relay and the upper computer is not innovated in the application.
During the use, place the device to be tested on the inside heat conduction piece 3 of test box, through opening and closing of the different switches of host computer control relay, give different test points break-make to light the device of test box the inside, realize the automatic test function, the time and the order of concrete break-make electricity can according to the test requirement setting of the semiconductor that awaits measuring.
Traditional test box needs to go toggle switch manually and realizes the test, and efficiency of software testing is low, and wastes time and energy, and the test box of this application can realize automatic switching test point, realizes automatic test function, has improved efficiency of software testing, has greatly practiced thrift the human cost.
Finally, it should be noted that: although the present invention has been described in detail with reference to the foregoing embodiments, it will be apparent to those skilled in the art that modifications and variations can be made in the embodiments or in part of the technical features of the embodiments without departing from the spirit and the scope of the invention.
Claims (6)
1. A test box for automatically switching test point positions comprises: the box body, its characterized in that: the box body is hinged to the box cover, a probe is arranged on the box cover, a through hole is formed in the bottom of the box body, a heat conduction block is arranged in the through hole, and a semiconductor refrigerating piece is arranged below the heat conduction block.
2. The automatic test box of switching test point position of claim 1, characterized in that: the lower surface of the heat conduction block is tightly attached to the upper surface of the semiconductor refrigerating sheet.
3. The test box for automatically switching test sites according to claim 1, wherein: the box body sets up on the PCB board, be provided with the connector that is used for the test box power supply on the PCB board.
4. The test box of claim 3, wherein the test box comprises: the connector is connected with a power supply, and a relay for controlling the on-off of each test point of the test box is connected between the power supply and the connector.
5. The test box of claim 4, wherein the test box comprises: the relay is connected with the upper computer.
6. The test box of claim 4, wherein the test box comprises: and the box cover is provided with a plurality of silicon photodiodes.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202221217472.9U CN217639375U (en) | 2022-05-20 | 2022-05-20 | Test box capable of automatically switching test point positions |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202221217472.9U CN217639375U (en) | 2022-05-20 | 2022-05-20 | Test box capable of automatically switching test point positions |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN217639375U true CN217639375U (en) | 2022-10-21 |
Family
ID=83654541
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202221217472.9U Active CN217639375U (en) | 2022-05-20 | 2022-05-20 | Test box capable of automatically switching test point positions |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN217639375U (en) |
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2022
- 2022-05-20 CN CN202221217472.9U patent/CN217639375U/en active Active
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