CN217590807U - High-speed optical wavelength resolving device - Google Patents
High-speed optical wavelength resolving device Download PDFInfo
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- CN217590807U CN217590807U CN202221322116.3U CN202221322116U CN217590807U CN 217590807 U CN217590807 U CN 217590807U CN 202221322116 U CN202221322116 U CN 202221322116U CN 217590807 U CN217590807 U CN 217590807U
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Abstract
The utility model provides a high-speed optical wavelength resolving device belongs to electronic equipment technical field. The utility model discloses a first optical divider, the second optical divider, first power measurement module, second power measurement module, MCU processing module, display element and signal output interface, the input termination high-speed optical wavelength signal source of first optical divider, the output and second optical divider, the signal output interface links to each other, the output and the first power measurement module of second optical divider, second power measurement module links to each other, first power measurement module's output, second power measurement module's output all links to each other with MCU processing module's input, MCU processing module links to each other with the display element, be equipped with first high-speed light detector in the first power measurement module, be equipped with second high-speed light detector and F-P interferometer in the second power measurement module. The utility model has the advantages that: the accuracy, the stability and the measuring range of the analysis device are improved, and the optical power loss is reduced.
Description
Technical Field
The utility model relates to an electronic equipment technical field, concretely relates to high-speed optical wavelength analytical equipment.
Background
An optical system and dense wavelength division multiplexing are the basis of a large-capacity transmission network, and with the application of fifth generation mobile communication (5G) and the overall promotion of national energy conservation and emission reduction strategies, optical switching is gradually started due to extremely low energy consumption, smaller time delay and larger switching bandwidth. The dense wavelength division multiplexing related devices have high requirements for the test accuracy of related indexes such as wavelength, bandwidth and the like, and the number of ports of the optical switching device is gradually increased, which brings great challenges for the test of optical devices in the next generation optical communication network industry and requires the accurate test of faster speed and more ports. At present, an optical wavelength scanning system becomes a preferred scheme for production test of passive devices due to high test wavelength precision (reaching pm level), multiple test ports, high measurement speed and the like.
The scanning speed of the current optical wavelength scanning test system reaches 40 nm/s-100 nm/s, and evolves to 400 nm/s. The improvement of the scanning speed can increase the wavelength dispersion corresponding to each time slice, and finally the accuracy of index tests such as wavelength and the like is influenced. Therefore, it is the most urgent task to improve the wavelength accuracy of the high-speed optical wavelength scanning system. The traditional method has the following defects that (1) the traditional wavelength calibration method cannot achieve pm-level precision at such a high wavelength scanning rate; (2) Because the performance of different scanning light sources is different, the traditional wavelength calibration mode cannot adapt to the characteristics of different light sources, so that the wavelength calibration fails; (3) The traditional wavelength calibration mode is realized based on some discrete wavelength points, but cannot completely cover the complete wavelength slice of the scanning light source, and the reliability of wavelength calibration has a problem; (4) The traditional wavelength calibration mode needs more light splitting energy, so that the light power loss of a main path of a scanning light source is larger, and the dynamic range of system measurement is reduced.
SUMMERY OF THE UTILITY MODEL
In order to solve the problems in the prior art, the utility model provides a high-speed optical wavelength analysis device, through set up 2 optical divider, first high-speed light detector, second high-speed light detector, F-P interferometer and MCU processing module mutually supporting in analysis device, can realize under the high-speed scanning state of scanning light source speed at 40nm/s-400nm/s, wavelength analysis result only has the time delay of several microseconds, reach pm level analysis precision, improve the accuracy of analysis device by a wide margin; meanwhile, the scanning light sources with different performances can be processed by adopting F-P interferometers with different specifications, so that the stability and the measurement range of the resolving device are greatly improved; the wavelength calibration of a high-precision and high-speed scanning light source can be realized only by using 2% of energy of the main path light by the analysis device, so that the loss of light power is greatly reduced; the problems that the traditional method cannot achieve pm-level precision, wavelength calibration cannot be adapted to different light sources, accuracy is low, and optical power loss is large are solved.
The utility model provides a pair of high-speed optical wavelength resolving device, including first optical divider, second optical divider, first power measurement module, second power measurement module, MCU processing module, display element and signal output interface, the input termination high-speed optical wavelength signal source of first optical divider, the output of first optical divider with the input of second optical divider the signal output interface links to each other, the output of second optical divider respectively with the input of first power measurement module the input of second power measurement module links to each other, the output of first power measurement module the output of second power measurement module all with the input of MCU processing module links to each other, the output of MCU processing module with the input of display element links to each other, be equipped with first high-speed optical detector in the first power measurement module, be equipped with second high-speed optical detector and F-P interferometer in the second power measurement module, the power measurement of signal of first power measurement module can accomplish the power measurement of the same kind of signal and the filtering processing to the scanning light source of different specifications, the power measurement module can accomplish the real two-dimensional light wavelength signal processing to the power measurement module and the real time signal processing module that can obtain the two-dimensional light wavelength synchronous processing of MCU.
The utility model discloses make further improvement, first power measurement module still includes first signal amplification unit and the synchronous collection unit of first signal, first high-speed light detector's input with the output of second optical divider links to each other, first high-speed light detector's output with the input of first signal amplification unit links to each other, the output of first signal amplification unit with the input of the synchronous collection unit of first signal links to each other, the output of the synchronous collection unit of first signal with MCU processing module's input links to each other.
The utility model discloses make further improvement, second power measurement module still includes second signal amplification unit and the synchronous collection unit of second signal, the input of F-P interferometer with the output of second optical divider links to each other, the output of F-P interferometer with the input of the high-speed light detector of second links to each other, the output of the high-speed light detector of second with the input of second signal amplification unit links to each other, the output of second signal amplification unit with the input of the synchronous collection unit of second signal links to each other, the output of the synchronous collection unit of second signal with the input of MCU processing module links to each other.
The utility model discloses make further improvement, MCU processing module includes two-dimentional synchronous unit, wavelength correction unit and wavelength continuity processing unit, the input of two-dimentional synchronous unit with the output of first signal synchronous acquisition unit the output of the synchronous acquisition unit of second signal links to each other, the output of two-dimentional synchronous unit with the input of wavelength correction unit links to each other, the output of wavelength correction unit with the input of wavelength continuity processing unit links to each other, the output termination of wavelength continuity processing unit the display element.
The utility model discloses make further improvement, first optical divider is 98 optical divider, and 2% is divided and is connect the input of second optical divider, and 98% is divided and is connected signal output interface.
The utility model discloses make further improvement, the second optical divider is 50 optical dividers.
Compared with the prior art, the beneficial effects of the utility model are that: the utility model provides a high-speed optical wavelength analytical equipment, through set up 2 optical divider, first high-speed light detector, second high-speed light detector, F-P interferometer and MCU processing module mutually supporting in analytical equipment, can realize under the high-speed scanning state of scanning light source speed at 40nm/s-400nm/s, wavelength analysis result only has the time delay of several microseconds, reaches pm level analytic precision, improves the accuracy of analytical equipment by a wide margin; meanwhile, the scanning light sources with different performances can be processed by adopting F-P interferometers with different specifications, so that the stability and the measurement range of the resolving device are greatly improved; the wavelength calibration of a high-precision and high-speed scanning light source can be realized only by using 2% of energy of the main path light by the analysis device, so that the loss of light power is greatly reduced; the problems that the traditional method cannot achieve pm-level precision, wavelength calibration cannot be adapted to different light sources, accuracy is low, and optical power loss is large are solved.
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In order to illustrate the present application or prior art more clearly, a brief description of the drawings needed for the description of the embodiments or prior art will be given below, it being clear that the drawings in the following description are some embodiments of the present application and that other drawings can be derived from them by a person skilled in the art without inventive effort.
Fig. 1 is a schematic diagram of the high-speed optical wavelength analyzer of the present invention;
fig. 2 is a correction diagram of the real-time wavelength of the F-P interferometer of the high-speed optical wavelength analyzer of the present invention.
In the figure, a first optical splitter 1-1, a second optical splitter 1-2, a first high-speed optical detector 1-3, a first signal amplification unit 1-4, a first signal synchronous acquisition unit 1-5, a first F-P interferometer 1-7, a second high-speed optical detector 1-8, a second signal amplification unit 1-9 and a MCU processing module 1-10.
Detailed Description
Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs; the terminology used in the description of the application herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the application; the terms "including" and "having," and any variations thereof, in the description and claims of this application and the description of the above figures are intended to cover non-exclusive inclusions.
Reference herein to "an embodiment" means that a particular feature, structure, or characteristic described in connection with the embodiment can be included in at least one embodiment of the application. The appearances of the phrase in various places in the specification are not necessarily all referring to the same embodiment, nor are separate or alternative embodiments mutually exclusive of other embodiments. It is explicitly and implicitly understood by one skilled in the art that the embodiments described herein can be combined with other embodiments.
In order to make the technical solutions better understood by those skilled in the art, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the accompanying drawings.
As shown in fig. 1 and fig. 2, the utility model provides a high-speed optical wavelength analysis device, including first optical divider, second optical divider, first power measurement module, second power measurement module, MCU processing module, display element and signal output interface, the input termination high-speed optical wavelength signal source of first optical divider, the output of first optical divider with the input of second optical divider, the signal output interface links to each other, the output of second optical divider respectively with the input of first power measurement module, the input of second power measurement module links to each other, the output of first power measurement module, the output of second power measurement module all with the input of MCU processing module links to each other, the output of MCU processing module with the input of display element links to each other, be equipped with first high-speed optical detector in the first power measurement module, be equipped with second high-speed optical detector and F-P interferometer in the second power measurement module, first power measurement module can accomplish the power measurement of signal of the same kind and handle the processing to the filtration of the scanning light source of different specifications, the second power measurement module can accomplish the filtration of the power measurement and the real two-dimensional light wavelength signal processing module, and the real two-dimensional light wavelength signal processing module that can obtain the real two-dimensional light wavelength signal processing. The F-p interferometer, i.e. fabry-perot interferometer, is a high resolution spectrometer made by applying the principle of multi-beam interference, and has high resolution and light collection power, so it is commonly used for analyzing the hyperfine structure of spectrum, researching the zeeman effect of light and the stimulated brillouin scattering of substance, accurately measuring the wavelength and wavelength difference of light wave, and selecting mode of laser, etc. in this embodiment, it is used for adapting to scanning light sources with different performances.
As shown in fig. 1 and 2, the first power measurement module further includes a first signal amplification unit and a first signal synchronous acquisition unit, an input end of the first high-speed optical detector is connected to an output end of the second optical splitter, an output end of the first high-speed optical detector is connected to an input end of the first signal amplification unit, an output end of the first signal amplification unit is connected to an input end of the first signal synchronous acquisition unit, and an output end of the first signal synchronous acquisition unit is connected to an input end of the MCU processing module.
As shown in fig. 1 and fig. 2, the second power measurement module further includes a second signal amplification unit and a second signal synchronous acquisition unit, an input end of the F-P interferometer is connected to an output end of the second optical splitter, an output end of the F-P interferometer is connected to an input end of the second high-speed photodetector, an output end of the second high-speed photodetector is connected to an input end of the second signal amplification unit, an output end of the second signal amplification unit is connected to an input end of the second signal synchronous acquisition unit, and an output end of the second signal synchronous acquisition unit is connected to an input end of the MCU processing module.
As shown in fig. 1 and fig. 2, the MCU processing module includes a two-dimensional synchronization unit, a wavelength correction unit, and a wavelength continuity processing unit, wherein an input end of the two-dimensional synchronization unit is connected to an output end of the first signal synchronization acquisition unit and an output end of the second signal synchronization acquisition unit, an output end of the two-dimensional synchronization unit is connected to an input end of the wavelength correction unit, an output end of the wavelength correction unit is connected to an input end of the wavelength continuity processing unit, and an output end of the wavelength continuity processing unit is connected to the display unit.
As shown in fig. 1 and 2, the first optical splitter is 98 optical splitters, 2% of the splitters are connected to the input end of the second optical splitter, and 98% of the splitters are connected to the signal output interface.
As shown in fig. 1 and 2, the second optical splitter is a 50.
The working principle is as follows: as shown in fig. 1 and 2, the output optical signal of the high-speed scanning light source enters the first optical splitter (1-1), one path of 98% split of the output optical signal is sent to the signal output interface, only 0.4dB of energy is lost, and the other path of 2% split of the output optical signal is used for wavelength analysis. After the 2% branched optical signal passes through a second optical branching device (1-2), the energy is basically equally divided, wherein one path of light is sent to a first high-speed optical detector (1-3) and is used as the input of a first signal amplification unit (1-4) after photoelectric conversion, the first signal amplification unit (1-4) amplifies the optical signal with proper gain and then sends the amplified optical signal to a first synchronous acquisition circuit (1-5), and the first synchronous acquisition circuit (1-5) outputs the acquired signal to an MCU processing module (1-10); the other path of light is sent to an F-P interferometer (1-6) to complete signal shunting and interference, then is output to a second high-speed optical detector (1-7) to complete photoelectric conversion and then is sent to a second signal amplification unit (1-8), the second signal amplification unit (1-8) amplifies the optical signal with proper gain and then sends the amplified optical signal to a second synchronous acquisition circuit (1-9), and the second synchronous acquisition circuit (1-9) outputs the acquired signal to an MCU processing module (1-10). The two paths of signals are respectively sent to a two-dimensional synchronization unit to complete two-dimensional synchronization in the time direction and the optical power direction so as to obtain the semaphore at the same time and generate F-P filter insertion loss data in a scanning state, because the insertion loss data of the F-P filter maintains good characteristics in the wavelength direction and the power direction, the scanning data and static data of the F-P filter are subjected to difference processing based on time slicing to complete the correction of real-time wavelength (the effect is shown in figure 2), after the wavelength correction is completed by the wavelength correction unit, the data are sent to a wavelength continuity processing unit, the wavelength data are generated according to an expected interval configured by a user and are finally sent to a display module to obtain the wavelength information of a real scanning process.
According to the above, the utility model provides a high-speed optical wavelength analysis device, through set up 2 optical divider, first high-speed light detector, second high-speed light detector, F-P interferometer and MCU processing module mutually supporting in analysis device, can realize that under the high-speed scanning state of scanning light source speed at 40nm/s-400nm/s, wavelength analysis result only has the time delay of several microseconds, reaches pm level analysis precision, improves the accuracy of analysis device by a wide margin; meanwhile, the scanning light sources with different performances can be processed by adopting F-P interferometers with different specifications, so that the stability and the measurement range of the resolving device are greatly improved; the wavelength calibration of a high-precision and high-speed scanning light source can be realized only by using 2% of energy of the main path light by the analysis device, so that the loss of light power is greatly reduced; the problems that the traditional method cannot achieve pm-level precision, wavelength calibration cannot be adapted to different light sources, accuracy is low, and optical power loss is large are solved.
The above-mentioned embodiments are the preferred embodiments of the present invention, and the scope of the present invention is not limited to the above-mentioned embodiments, and the scope of the present invention includes and is not limited to the above-mentioned embodiments, and all equivalent changes made according to the present invention are within the protection scope of the present invention.
Claims (6)
1. A high-speed optical wavelength analysis device is characterized in that: the optical fiber power measurement device comprises a first optical splitter, a second optical splitter, a first power measurement module, a second power measurement module, an MCU processing module, a display unit and a signal output interface, wherein the input end of the first optical splitter is connected with a high-speed optical wavelength signal source, the output end of the first optical splitter is connected with the input end of the second optical splitter and the signal output interface, the output end of the second optical splitter is respectively connected with the input end of the first power measurement module and the input end of the second power measurement module, the output end of the first power measurement module and the output end of the second power measurement module are both connected with the input end of the MCU processing module, the output end of the MCU processing module is connected with the input end of the display unit, a first high-speed optical detector is arranged in the first power measurement module, a second high-speed optical detector and an F-P interferometer are arranged in the second power measurement module, the first power measurement module can complete power measurement of one path of signals and filtering processing of scanning light sources with different specifications, the second power measurement module can complete power measurement of the other path of signals and filtering processing of the F-P interferometers with different specifications, and can complete two-way optical wavelength signal processing direction synchronization, and obtain real two-path of optical wavelength information of the MCU processing module.
2. The high-speed optical wavelength analyzer according to claim 1, wherein: the first power measurement module further comprises a first signal amplification unit and a first signal synchronous acquisition unit, the input end of the first high-speed optical detector is connected with the output end of the second optical splitter, the output end of the first high-speed optical detector is connected with the input end of the first signal amplification unit, the output end of the first signal amplification unit is connected with the input end of the first signal synchronous acquisition unit, and the output end of the first signal synchronous acquisition unit is connected with the input end of the MCU processing module.
3. The high-speed optical wavelength resolution device according to claim 2, wherein: the second power measurement module further comprises a second signal amplification unit and a second signal synchronous acquisition unit, wherein the input end of the F-P interferometer is connected with the output end of the second optical splitter, the output end of the F-P interferometer is connected with the input end of the second high-speed optical detector, the output end of the second high-speed optical detector is connected with the input end of the second signal amplification unit, the output end of the second signal amplification unit is connected with the input end of the second signal synchronous acquisition unit, and the output end of the second signal synchronous acquisition unit is connected with the input end of the MCU processing module.
4. The high-speed optical wavelength resolution device according to claim 3, wherein: the MCU processing module comprises a two-dimensional synchronization unit, a wavelength correction unit and a wavelength continuity processing unit, wherein the input end of the two-dimensional synchronization unit is connected with the output end of the first signal synchronization acquisition unit and the output end of the second signal synchronization acquisition unit, the output end of the two-dimensional synchronization unit is connected with the input end of the wavelength correction unit, the output end of the wavelength correction unit is connected with the input end of the wavelength continuity processing unit, and the output end of the wavelength continuity processing unit is connected with the display unit.
5. The high-speed optical wavelength resolution device according to claim 4, wherein: the first optical splitter is a 98% optical splitter, 2% of the splits are connected with the input end of the second optical splitter, and 98% of the splits are connected with the signal output interface.
6. The high-speed optical wavelength resolution device according to claim 5, wherein: the second optical splitter is a 50.
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