CN217562023U - Test platform - Google Patents

Abstract

The application discloses test platform, test platform include main frame and subframe, and the main frame is including buckling the bottom plate, first curb plate and the roof that set up in succession, and the subframe includes first curb plate and the second curb plate that sets up relatively along the first direction to and connect the second end plate of first curb plate and second curb plate. Wherein, the main frame is provided with a plurality of fixed parts respectively along the both sides of first direction, and first curb plate and second curb plate correspond each fixed part and are provided with connecting portion, and first curb plate and second curb plate are fixed in between bottom plate and the roof through connecting portion to make main frame and subframe enclose to close the box structure that forms and have the inner chamber. According to the test platform provided by the embodiment of the application, the structure is simpler, and the test platform can be conveniently disassembled and assembled on the basis of ensuring the reliable connection of the main frame and the auxiliary frame.

Description

Test platform

Technical Field

The application relates to the field of simulation verification of chip design, in particular to a test platform.

Background

In the design of large scale integrated circuits, the task of simulation verification of chips is an indispensable task. Because the logic of the chip is in the hardware accelerator, the PCIE function in the chip can be verified by testing the interface and protocol of the PCIE (peripheral component interconnect express) board portion in the hardware simulation accelerator.

For the test of carrying out the PCIE integrated circuit board, often need to be provided with the test platform that can fix and supply power for the PCIE integrated circuit board, current test platform mainly is the box structure body, adopts fastening modes such as bolted connection to assemble the shaping between its each face, however above-mentioned structure will lead to test platform's dismouting process comparatively loaded down with trivial details, has reduced efficiency of software testing.

Therefore, a new PCIE test platform based on a hardware emulation accelerator is needed.

SUMMERY OF THE UTILITY MODEL

The embodiment of the application provides a test platform, simple structure can realize test platform's convenient dismouting on the basis of guaranteeing that each part reliably connects among the test platform.

An aspect of an embodiment of the present application provides a test platform, including: the main frame comprises a bottom plate, a first end plate and a top plate which are bent successively; the sub-frame comprises a first side plate and a second side plate which are oppositely arranged along a first direction, and a second end plate which is connected with the first side plate and the second side plate; the main frame is provided with a plurality of fixing parts along two sides of the first direction respectively, the first side plate and the second side plate are provided with connecting parts corresponding to the fixing parts, and the first side plate and the second side plate are fixed between the bottom plate and the top plate through the connecting parts, so that the main frame and the subframe are enclosed to form a box body structure with an inner cavity.

According to one aspect of the application, one of the fixing part and the connecting part is provided as a clamping groove, the other one is provided as a projection matched with the clamping groove, and the projection is inserted into the clamping groove.

According to an aspect of the present application, the main frame and/or the sub-frame is provided as an elastic member.

According to an aspect of the present application, the fixing portion is provided on at least two of the bottom plate, the first end plate, and the top plate.

According to an aspect of the present application, the fixing portions located at both sides of the main frame are symmetrically disposed in the first direction.

According to one aspect of the application, still include the installing support, connect in the roof deviates from on the surface of one side of bottom plate, the installing support is used for fixing the piece of waiting to test.

According to one aspect of the application, the top plate includes a first end and a second end that are oppositely disposed, the first end is connected to the first end plate, the second end is connected to the mounting bracket, the main frame and the mounting bracket are integrally formed.

According to an aspect of the application, the mounting bracket includes baffle and mounting panel, the both ends of baffle are connected respectively the roof with the mounting panel, the mounting panel is on a parallel with the roof sets up and towards first end plate direction extends the certain distance.

According to an aspect of the application, the inner cavity is used for internally placing electronic equipment, and an interface is opened on at least one of the first end plate and the second end plate so as to connect the electronic equipment through the interface.

According to one aspect of the application, at least one heat dissipation hole is formed in each of the first end plate and the second end plate.

The test platform of this application embodiment, test platform include main frame and subframe, and the main frame includes bottom plate, first end plate and roof, and the subframe includes by first curb plate, second end plate and second curb plate, through inserting main frame and subframe each other and closes, can form the box structure that has the inner chamber. In order to ensure the reliable connection of the main frame and the subframe, a plurality of fixing parts are respectively arranged on the two sides of the main frame along the first direction, and connecting parts are respectively arranged on the corresponding fixing parts of the first side plate and the second side plate which are oppositely arranged along the first direction, so that the first side plate and the second side plate can be fixed between the bottom plate and the top plate by matching the connecting parts and the fixing parts. For bolted connection's fastening mode among the prior art, test platform's in the embodiment of this application structure is simpler, also can realize test platform's convenient dismouting under the basis of the reliable connection of assurance main frame and subframe simultaneously.

Drawings

In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings required to be used in the embodiments of the present application will be briefly described below, and for those skilled in the art, other drawings may be obtained according to the drawings without creative efforts.

FIG. 1 is a schematic structural view of a main frame and a mounting bracket provided according to an embodiment of the present application;

FIG. 2 is a schematic structural view of a main frame and a mounting bracket with electronic equipment mounted thereon according to an embodiment of the present application;

FIG. 3 is a schematic structural diagram of a test platform provided in accordance with an embodiment of the present application;

fig. 4 to 7 are schematic structural diagrams of steps of mounting a device under test and an auxiliary fitting thereof on a test platform according to an embodiment of the present application.

In the drawings:

100-a test platform; 200-PCIE board card; 300-a power module; 400-heightening columns; 500-a backplane board card; 600-rate adapter;

1-a main frame; 11-a base plate; 12-a first end plate; 13-a top plate; 131-a first end; 132-a second end; 14-a fixed part;

2-a subframe; 21-a first side panel; 22-a second end plate; 23-a connecting part;

3, mounting a bracket; 31-a baffle; 32-a mounting plate;

4-heat dissipation holes;

x-a first direction; y-a second direction; z-height direction.

Detailed Description

Features of various aspects and exemplary embodiments of the present application will be described in detail below, and in order to make objects, technical solutions and advantages of the present application more apparent, the present application will be further described in detail below with reference to the accompanying drawings and specific embodiments. It should be understood that the specific embodiments described herein are intended to be illustrative only and are not intended to be limiting. It will be apparent to one skilled in the art that the present application may be practiced without some of these specific details. The following description of the embodiments is merely intended to provide a better understanding of the present application by illustrating examples thereof.

It should be noted that, in this document, relational terms such as first and second, and the like are used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Also, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrases "comprising 8230; \8230;" comprises 8230; "does not exclude the presence of additional like elements in a process, method, article, or apparatus that comprises the element.

For a better understanding of the present application, the following description is made in detail with reference to fig. 1 to 7 of a test platform 100 according to an embodiment of the present application.

Referring to fig. 1 to 3, an embodiment of the present application provides a testing platform 100, which includes a main frame 1 and a sub-frame 2, wherein the main frame 1 includes a bottom plate 11, a first end plate 12, and a top plate 13, which are sequentially bent, and the sub-frame 2 includes a first side plate 21 and a second side plate, which are oppositely disposed along a first direction X, and a second end plate 22, which connects the first side plate 21 and the second side plate. Wherein, main frame 1 is provided with a plurality of fixed parts 14 respectively along the both sides of first direction X, and first curb plate 21 and second curb plate correspond each fixed part 14 and are provided with connecting portion 23, and first curb plate 21 and second curb plate are fixed in between bottom plate 11 and the roof 13 through connecting portion 23 to make main frame 1 and subframe 2 enclose to close and form the box structure that has the inner chamber.

The test platform 100 in the embodiment of the present application includes a main frame 1 and a subframe 2, the main frame 1 includes a bottom plate 11, a first end plate 12 and a top plate 13, the subframe 2 includes a first side plate 21, a second end plate 22 and a second side plate, and a box-shaped structure with an inner cavity can be formed by inserting the main frame 1 and the subframe 2 into each other. In order to ensure the reliable connection between the main frame 1 and the sub-frame 2, two sides of the main frame 1 along the first direction X are respectively provided with a plurality of fixing portions 14, and the first side plate 21 and the second side plate oppositely arranged along the first direction X are respectively provided with a connecting portion 23 corresponding to the fixing portions 14, so that the first side plate 21 and the second side plate can be fixed between the bottom plate 11 and the top plate 13 by matching the connecting portions 23 with the fixing portions 14. Compared with the fastening mode of bolt connection in the prior art, the structure of the test platform 100 in the embodiment of the application is simpler, and meanwhile, the test platform 100 can be conveniently disassembled and assembled on the basis of ensuring the reliable connection of the main frame 1 and the subframe 2.

It can be understood that, by connecting the main frame 1 and the sub-frame 2, the first side plate 21 and the second side plate oppositely disposed along the first direction X, the first end plate 12 and the second end plate 22 oppositely disposed along the second direction Y, and the bottom plate 11 and the top plate 13 oppositely disposed along the height direction Z can jointly enclose to form a box structure with an inner cavity, and the first direction X, the second direction Y and the height direction Z are two-two perpendicular. The bottom plate 11, the first end plate 12 and the top plate 13 of the main frame 1 can be integrally formed by bending in a sheet metal manner, and the first side plate 21, the second end plate 22 and the second side plate of the subframe 2 can also be integrally formed by bending in a sheet metal manner, so that the number of parts of the test platform 100 is reduced, and the stability of the test platform 100 is improved. The connecting portion 23 may be connected to the fixing portion 14 by magnetic attraction, or may be connected to the fixing portion 14 by insertion interlocking.

Referring to fig. 1 to 3, when the connecting member is connected to the fixing portion 14 in an inserting and interlocking manner, in some optional embodiments, one of the fixing portion 14 and the connecting portion 23 is configured as a slot, and the other is configured as a protrusion matched with the slot, and the protrusion is inserted into the slot. By disposing the projection in the slot, the movement of the projection relative to the slot can be restricted, so as to restrict the movement of the sub-frame 2 relative to the main frame 1. Compare in fixing main frame 1 and subframe 2 through bolted connection mode, cooperate through the lug and the draw-in groove that main frame 1 and subframe 2 self set up, can further reduce test platform 100's spare part quantity, the cooperation mode of lug and draw-in groove is more convenient simultaneously.

Optionally, the clamping groove may be disposed on an outer edge of the main frame 1, so as to facilitate preparation of the clamping groove on the main frame 1, and simultaneously facilitate determination of a connection position between the bump and the clamping groove, and facilitate disassembly and assembly of the testing platform 100. The clamping groove can also be arranged on the surface of the main frame 1, so that the connection reliability of the clamping groove and the bump can be improved, and the bump is prevented from being separated from the clamping groove. That is, the specific opening position and size of the card slot may be adjusted according to the specific structure of the test platform 100, which is not specifically limited in this embodiment of the application.

It can be understood that one of the fixing portion 14 and the connecting portion 23 is set as a clamping groove, and the other is set as a bump, except that the main frame 1 is provided with a clamping groove and the sub-frame 2 is provided with a bump corresponding to each clamping groove, and the main frame 1 is provided with a bump and the sub-frame 2 is provided with a clamping groove corresponding to each bump, the main frame 1 and the sub-frame 2 are both provided with a clamping groove and a bump, and the main frame 1 and the sub-frame 2 are provided with a clamping groove and a bump corresponding to each other. That is, the specific arrangement structure of the fixing portion 14 and the connecting portion 23 on the main frame 1 and the sub-frame 2 can be adjusted according to actual conditions, and this is not particularly limited in the embodiment of the present application. For convenience of description, the main frame 1 is provided with a slot, and the sub-frame 2 is provided with a bump.

In order to insert the protrusion into the slot, in some alternative embodiments, the main frame 1 and/or the sub-frame 2 are provided as elastic members. Through setting up main frame 1 and/or subframe 2 into the elastic component, when main frame 1 and subframe 2 were assembled to needs, can make main frame 1 or subframe 2 take place elastic deformation to be more convenient for insert and locate main frame 1 with subframe 2, correspond with the position of realization lug and draw-in groove, and when main frame 1 or subframe 2 recovered the initial shape, alright make the lug insert and locate in the draw-in groove, and then realize the grafting interlock of main frame 1 and subframe 2.

Specifically, when the main frame 1 is configured as an elastic member, if the test platform 100 needs to be assembled, the main frame 1 can be broken off, so that the distance between the bottom plate 11 and the top plate 13 on the main frame 1 is increased, and a larger space is provided by means of deformation of the main frame 1 so as to facilitate insertion of the sub-frame 2. When the connecting portion 23 to which the sub-frame 2 moves corresponds to the fixing portion 14 of the main frame 1, the main frame 1 is restored to the original shape by releasing the force applied to the main frame 1, and the engaging groove is engaged with the protrusion, so as to fix the main frame 1 and the sub-frame 2. Similarly, when the sub-frame 2 is provided as an elastic member, the assembly of the test platform 100 can also be achieved in the same manner. Alternatively, the main frame 1 and the sub-frame 2 may be made of a deformable metal material, for example, a steel material.

It should be noted that, besides the manner of setting the main frame 1 and the sub-frame 2 as elastic members, in other embodiments, the elastic projection may also be set as an elastic projection, that is, in the process of inserting the main frame 1 and the sub-frame 2, the elastic projection may elastically deform under the abutting action, and when the elastic projection moves to the slot, the elastic projection is no longer sprung out under the abutting action, so as to be engaged with the slot, so as to realize the inserting and interlocking of the main frame 1 and the sub-frame 2.

Referring to fig. 1 to 3, in order to ensure stable connection between the main frame 1 and the sub-frame 2, in some alternative embodiments, at least two of the bottom plate 11, the first end plate 12 and the top plate 13 are provided with fixing portions 14. The main frame 1 and the sub-frame 2 are locked along a plurality of directions by increasing the connecting position of the main frame 1 and the sub-frame 2. In order to prevent relative movement between the main frame 1 and the sub-frame 2 in the height direction Z, the fixing portion 14 is disposed on at least two of the bottom plate 11, the first end plate 12, and the top plate 13. The fixing portion 14 disposed on the first end plate 12 can limit the movement of the connecting portion 23 along the height direction Z through the fixing portion 14 disposed on the first end plate 12, so as to ensure the reliable connection between the main frame 1 and the sub-frame 2, and the fixing portion 14 disposed on the bottom plate 11 and the top plate 13 can limit the movement of the sub-frame 2 along the height direction Z by the bottom plate 11 and the top plate 13 abutting against the two ends of the first side plate 21 and the second side plate along the height direction Z. When the fixing portions 14 are disposed on the bottom plate 11, the first end plate 12 and the top plate 13, the stable connection between the main frame 1 and the sub-frame 2 can be further ensured, and the relative movement between the two can be avoided.

Alternatively, a plurality of fixing portions 14 may be disposed on the bottom plate 11, the first end plate 12 and the top plate 13 of the main frame 1, and the fixing portions 14 on the same plate body are disposed at intervals, so as to further ensure stable connection between the main frame 1 and the sub-frame 2 by increasing the number of the connecting portions 23 and the fixing portions 14.

Since the fixing portions 14 on the main frame 1 need to be connected with the first side plate 21 and the second side plate oppositely arranged along the first direction X, in some alternative embodiments, the fixing portions 14 on both sides of the main frame 1 are symmetrically arranged in the first direction X. By symmetrically arranging the fixing parts 14 on the two sides of the main frame 1, the position of the fixing part 14 on the other side can be confirmed from the fixing part 14 on one side, so that the alignment of the fixing part 14 of the main frame 1 and the connecting part 23 of the subframe 2 is more conveniently realized, and the convenience in assembling and disassembling the test platform 100 is more conveniently improved.

Referring to fig. 1 to 3, in some optional embodiments, the testing platform 100 further includes a mounting bracket 3 connected to a side surface of the top plate 13 away from the bottom plate 11, and the mounting bracket 3 is used to fix the to-be-tested device, so that the to-be-tested device can be mounted on the top plate 13, and the to-be-tested device can be further fixed by additionally providing the mounting bracket 3, so as to avoid the to-be-tested device being connected to the testing platform 100 unstably and affecting the testing result.

In some alternative embodiments, the top plate 13 includes a first end 131 and a second end 132 disposed oppositely, the first end 131 is connected to the first end plate 12, the second end 132 is connected to the mounting bracket 3, and the main frame 1 and the mounting bracket 3 are integrally formed. That is, the mounting bracket 3 is formed by bending the second end 132 of the top plate 13 continuously through a metal plate, after the mounting bracket is bent through the metal plate, the main frame 1 forms the bottom plate 11, the first end plate 12, the top plate 13 and the mounting bracket 3 which are arranged in succession, compared with a connection mode that the mounting bracket 3 needs to be fixed on the first side plate 21 and the second side plate through bolts in the prior art, the test platform 100 in the embodiment of the present application has fewer parts, and is simple in structure and simple and convenient to assemble.

Considering that the test piece to be tested has a certain height, in some alternative embodiments, the mounting bracket 3 includes a baffle plate 31 and a mounting plate 32, both ends of the baffle plate 31 are respectively connected with the top plate 13 and the mounting plate 32, and the mounting plate 32 is disposed parallel to the top plate 13 and extends a certain distance toward the first end plate 12. The mounting bracket 3 is bent to form the baffle 31 and the mounting plate 32 in a sheet metal mode, the baffle 31 can be arranged in an extending mode along the height direction Z, and the size of the baffle 31 is not smaller than that of a piece to be tested along the height direction Z. The mounting panel 32 extends along second direction Y and sets up, and the mounting panel 32 can be provided with the fixed edge of a wing that is used for the overlap joint to treat the test piece, can be provided with the mounting hole on the fixed edge of a wing, can correspond on treating the test piece and be provided with the trompil to wear to establish trompil and mounting hole in proper order through fastening screw, with the fixed test piece of treating that sets up on roof 13.

Referring to fig. 1 to 3, in some alternative embodiments, the inner cavity is used for accommodating the power module 300, and the first end plate 12 and/or the second end plate 22 have an interface for connecting the power module 300 through the interface. The inner cavity of the box structure formed by the main frame 1 and the subframe 2 can be used for accommodating and installing the power module 300, and the power module 300 is used for supplying power to external equipment such as a to-be-tested device and the like by arranging an interface on the first end plate 12 or the second end plate 22.

Optionally, at least one heat dissipation hole 4 is formed on each of the first end plate 12 and the second end plate 22. Namely, the heat dissipation holes 4 are formed in the first end plate 12 and the second end plate 22, and the heat dissipation holes 4 in the first end plate 12 and the heat dissipation holes 4 in the second end plate 22 form a convection air duct, so that the heat dissipation of the power module 300 in the inner cavity is realized, and the normal operation of the power module 300 is ensured.

Referring to fig. 1 to 3, the following describes specific steps of mounting the test platform 100 according to an embodiment of the present application with reference to the drawings. Wherein, the installation steps of the test platform 100 include:

first, the main frame 1 is provided, and the power module 300 is interposed between the bottom plate 11 and the top plate 13 of the main frame 1 along the second direction Y. Secondly, the sub-frame 2 is provided, and the connecting parts 23 on the first side plate 21 and the second side plate of the sub-frame 2 are matched with the fixing part 14 of the main frame 1, so that the main frame 1 and the sub-frame 2 are clamped and fixed.

Compared with the mode of adopting bolt connection in the prior art, the test platform 100 in the embodiment of the application has the advantages of less parts, simple structure and more convenient and faster assembly process.

It can be understood that, when the test platform 100 in the embodiment of the present application is used to test a PCIE function in a chip, a device to be tested may be set as the PCIE board 200 and/or the rate adapter 600, and the rate adapter 600 may specifically use a high-speed and low-speed slew rate bridge of cadence corporation. To link the PCIE board 200 and/or the rate adapter 600, an auxiliary component may be additionally installed on the test platform 100 to assist installation.

Referring to fig. 4 to fig. 7, the following description will use the to-be-tested device as the PCIE board 200 and/or the rate adapter 600 to illustrate the mounting steps of mounting it on the test platform 100, which includes:

first, the height increasing column 400 is installed on the top plate 13 of the main frame 1, and a threaded hole may be provided on a side of the height increasing column 400 facing away from the bottom plate 11. Secondly, install backplate integrated circuit board 500 on increasing post 400, backplate integrated circuit board 500 corresponds each screw hole and has seted up the through-hole, wears to establish the through-hole on the backplate integrated circuit board 500 and the screw hole that increases post 400 with the screw in proper order to realize backplate integrated circuit board 500 fixed. Further, the rate adapter 600 and the PCIE board 200 are sequentially mounted on the backplane board 500, and the rate adapter 600 and the PCIE board 200 are fixed to the fixed flange of the mounting bracket 3.

Specifically, the PCIE test platform based on the hardware simulation accelerator can be formed by installing auxiliary accessories such as the height increasing column 400 and the backplane board 500 on the test platform 100. During testing, the PCIE board 200 and the rate adapter 600 can be linked by mounting and fixing the PCIE board 200 and the rate adapter 600 on the backplane board 500 of the PCIE test platform. The power module 300 arranged in the inner cavity of the PCIE test platform supplies power to the PCIE test platform, so that interface signals of the PCIE board card can be connected to the rate adapter 600 through optical fibers to verify the PCIE functions in the chip.

It can be understood that, because the PCIE test platform includes the test platform in the foregoing embodiments, the PCIE test platform provided in the embodiment of the present application has the technical effect of the technical scheme of the test platform in any one of the foregoing embodiments, and the test is performed through the PCIE test platform, so that the disassembly and assembly efficiency and the test efficiency can be improved, and the accuracy of the test effect can be ensured. In addition, simulation verification of other functions in the chip can also be performed through the test platform in the above embodiment, which is not limited in this application.

Finally, it should be noted that: the above embodiments are only used for illustrating the technical solutions of the present application, and not for limiting the same; although the present application has been described in detail with reference to the foregoing embodiments, it should be understood by those of ordinary skill in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some or all of the technical features may be equivalently replaced; these modifications and substitutions do not depart from the spirit of the embodiments of the present application, and they should be construed as being included in the scope of the claims and description of the present application. In particular, the technical features mentioned in the embodiments can be combined in any way as long as there is no structural conflict. The present application is not intended to be limited to the particular embodiments disclosed herein but is to cover all embodiments that may fall within the scope of the appended claims.

Claims (10)

1. A test platform, comprising:

the main frame (1) comprises a bottom plate (11), a first end plate (12) and a top plate (13) which are sequentially bent;

the auxiliary frame (2) comprises a first side plate (21) and a second side plate which are oppositely arranged along a first direction, and a second end plate (22) which is used for connecting the first side plate (21) and the second side plate;

the main frame (1) is provided with a plurality of fixing portions (14) on two sides in the first direction respectively, the first side plate (21) and the second side plate are provided with connecting portions (23) corresponding to the fixing portions (14), and the first side plate (21) and the second side plate are fixed between the bottom plate (11) and the top plate (13) through the connecting portions (23) so that the main frame (1) and the subframe (2) are enclosed to form a box structure with an inner cavity.

2. The test platform according to claim 1, wherein one of the fixing portion (14) and the connecting portion (23) is provided as a slot, and the other is provided as a projection matched with the slot, and the projection is inserted into the slot.

3. Test platform according to claim 2, characterized in that the main frame (1) and/or the sub-frame (2) are provided as elastic elements.

4. Test platform according to claim 2, characterized in that the fixing parts (14) are provided on at least two of the bottom plate (11), the first end plate (12) and the top plate (13).

5. Test platform according to claim 2, characterized in that the fixing parts (14) on both sides of the main frame (1) are symmetrically arranged in the first direction.

6. The test platform according to claim 1, further comprising a mounting bracket (3) attached to a side surface of the top plate (13) facing away from the bottom plate (11), the mounting bracket (3) being configured to hold a test piece.

7. The test platform according to claim 6, wherein the top plate (13) comprises a first end (131) and a second end (132) which are oppositely arranged, the first end (131) is connected with the first end plate (12), the second end (132) is connected with the mounting bracket (3), and the main frame (1) is integrally bent.

8. Test platform according to claim 6, characterized in that the mounting bracket (3) comprises a baffle plate (31) and a mounting plate (32), the two ends of the baffle plate (31) are connected to the top plate (13) and the mounting plate (32), respectively, and the mounting plate (32) is arranged parallel to the top plate (13) and extends a distance towards the first end plate (12).

9. The test platform of claim 1, wherein the inner cavity is used for internally installing a power module (300), and at least one of the first end plate (12) and the second end plate (22) is provided with an interface for connecting the power module (300) through the interface.

10. The testing platform according to claim 9, characterized in that the first end plate (12) and the second end plate (22) are respectively provided with at least one heat dissipation hole (4).

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