CN217467092U

CN217467092U - Micro-needle testing device for SMT

Info

Publication number: CN217467092U
Application number: CN202221417822.6U
Authority: CN
Inventors: 郭国强
Original assignee: Zhuhai Jingyi Technology Co ltd
Current assignee: Zhuhai Jingyi Technology Co ltd
Priority date: 2022-06-08
Filing date: 2022-06-08
Publication date: 2022-09-20
Anticipated expiration: 2032-06-08

Abstract

The utility model discloses a micropin testing arrangement for SMT relates to SMT test technical field, the on-line screen storage device comprises a base, the riser is all installed to the both sides on base top, and one side of riser installs the fixed plate, the mount is installed to the one end of fixed plate, and the inner wall of mount passes through the articulated elements and installs rotatory piece, the handle is installed to the one end of rotatory piece, and the bottom of rotatory piece both sides all installs the connecting strip through the articulated elements, the dead lever is installed through the articulated elements in the bottom of connecting strip one side, the roof is installed to the bottom of dead lever, and the bottom of roof installs a plurality of connecting rods. The utility model discloses a with the help of the solder joint on the probe direct contact PCB board to utilize the detector to detect, thereby can accomplish the detection fast, no longer use the mode of traditional public female seat lock, avoided because of the test error that the connecting seat wearing and tearing lead to.

Description

Micro-needle testing device for SMT

Technical Field

The utility model relates to a SMT detects technical field, specifically is SMT uses micropin testing arrangement.

Background

SMT is an abbreviation of Surface Mounted Technology, and is the most popular Technology and process in the electronic assembly industry, and a circuit assembly Technology of mounting a leadless or short-lead Surface-Mounted device on a Surface of a printed circuit board or other substrates, and performing soldering assembly by reflow soldering or dip soldering, etc. has the advantages of high assembly density, small volume and light weight of electronic products.

SUMMERY OF THE UTILITY MODEL

An object of the utility model is to provide a micro needle testing arrangement for SMT to solve the problem that erroneous judgement appears because of test connector wearing and tearing easily in the PCB board testing process who provides among the above-mentioned background art.

In order to achieve the above object, the utility model provides a following technical scheme: a microneedle testing device for SMT comprises a base, wherein vertical plates are installed on two sides of the top end of the base, a fixed plate is installed on one side of each vertical plate, a fixed frame is installed at one end of each fixed plate, a rotating block is installed on the inner wall of the fixed frame through an articulated element, a handle is installed at one end of each rotating block, connecting strips are installed at the bottoms of two sides of each rotating block through articulated elements, a fixed rod is installed at the bottom of one side of each connecting strip through the articulated elements, a top plate is installed at the bottom end of each fixed rod, a plurality of connecting rods are installed at the bottom end of each connecting rod, a base plate is installed at the top end of each base plate, a mounting seat is installed at the top end of each base plate, a plurality of probes penetrate through the inside of each mounting seat, the bottom ends of the probes extend to the lower part of the base plate, a circuit board is installed at the top end of each probe, a detector is installed at the bottom end of the top plate, and the bottom end of the detector is connected with the circuit board through a wire, and a stop plate is arranged at one end of the top end of the base.

Preferably, a plurality of fixed barrels are installed on the top of the base, two spring damping rods are installed at the bottom end inside the fixed barrels, the baffle is installed at the top end of each spring damping rod, and a plurality of fixed blocks are installed at the bottom end of the bottom plate.

Preferably, the number of the fixing blocks and the number of the fixing cylinders are four, and the centers of each group of the fixing blocks and the centers of each group of the fixing cylinders are located on the same vertical line.

Preferably, the shapes of the inside of the fixed cylinder and the fixed block are regular pentagons, and the cross sections of the inside of the fixed cylinder and the fixed block are the same in size.

Preferably, the guide bar is installed to the bottom of fixed plate, and the bottom of guide bar leads to and is connected with the top of base, the outer wall of guide bar all overlaps and is equipped with two lantern rings, and one side of the lantern ring is connected with one side of bottom plate and roof respectively.

Preferably, the rotating block is connected with the fixed frame in a rotating mode, and the rotating range of the rotating block is 0-90 degrees.

Preferably, the horizontal height of the bottom end of the fixed block is higher than that of the bottom end of the probe, and the horizontal height of the top end of the fixed cylinder is higher than that of the top end of the stop plate.

Compared with the prior art, the beneficial effects of the utility model are that:

drive rotatory piece rotation downwards through the handle for rotatory piece exerts thrust through the fixed plate to the dead lever, causes roof and bottom plate to move down through the sliding fit orientation between the lantern ring and the guide bar, thereby makes the solder joint on the probe contact PCB board, and utilizes the detector to detect, thereby can accomplish the detection fast, no longer uses the mode of traditional public female seat lock, has avoided the testing error because of the connecting seat wearing and tearing lead to.

Drawings

Fig. 1 is a schematic front view of a cross-sectional structure of the present invention;

fig. 2 is a schematic top view of the present invention;

FIG. 3 is a schematic view of the side view of the present invention;

fig. 4 is an enlarged schematic structural view of a point a in fig. 1 according to the present invention;

fig. 5 is an enlarged schematic structural diagram of the position B in fig. 1 according to the present invention.

In the figure: 1. a fixed mount; 2. rotating the block; 3. a handle; 4. a fixing plate; 5. a guide bar; 6. a top plate; 7. a vertical plate; 8. a probe; 9. a mounting seat; 10. a stop plate; 11. a fixed block; 12. a connecting rod; 13. fixing the rod; 14. a connecting strip; 15. a base; 16. a collar; 17. a fixed cylinder; 18. a base plate; 19. a circuit board; 20. a detector; 21. a baffle plate; 22. a spring damping rod.

Detailed Description

The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.

Example (b): referring to fig. 1-5, a microneedle testing device for SMT includes a base 15, vertical plates 7 are mounted on both sides of the top end of the base 15, a fixing plate 4 is mounted on one side of each vertical plate 7, a fixing frame 1 is mounted at one end of each fixing plate 4, and a rotating block 2 is mounted on the inner wall of each fixing frame 1 through a hinge;

the rotating block 2 is connected with the fixed frame 1 in a rotating way, and the rotating range of the rotating block 2 is 0-90 degrees;

specifically, as shown in fig. 1 and 2, the handle 3 is held, the rotating block 2 is driven to rotate by the handle 3, so that the rotating block 2 applies force to the fixing rod 13 through the fixing plate 4, thereby completing the upward and downward movement of the probe 8.

The handle 3 is installed at one end of the rotating block 2, the bottom ends of two sides of the rotating block 2 are all provided with connecting strips 14 through hinge parts, the bottom end of one side of each connecting strip 14 is provided with a fixing rod 13 through a hinge part, the bottom end of each fixing rod 13 is provided with a top plate 6, the bottom end of each top plate 6 is provided with a plurality of connecting rods 12, and the bottom ends of the connecting rods 12 are provided with bottom plates 18;

the bottom end of the fixed plate 4 is provided with a guide rod 5, the bottom end of the guide rod 5 is connected with the top end of a base 15, two lantern rings 16 are sleeved on the outer wall of the guide rod 5, and one sides of the lantern rings 16 are respectively connected with one sides of a bottom plate 18 and a top plate 6;

specifically, as shown in fig. 1 and 3, the movement of the top plate 6 and the bottom plate 18 can be guided using a sliding fit between the collar 16 and the guide bar 5, thereby ensuring that the probes 8 can make contact with the weld points.

The top end of the bottom plate 18 is provided with a mounting seat 9, a plurality of probes 8 penetrate through the mounting seat 9, the bottom ends of the probes 8 extend to the lower part of the bottom plate 18, the top end of each probe 8 is provided with a circuit board 19, the bottom end of the top plate 6 is provided with a detector 20, and the bottom end of the detector 20 is connected with the circuit board 19 through a lead;

specifically, as shown in fig. 1, 3 and 5, the probe 8 contacts a solder joint on the PCB and is detected by the detector 20, so that the detection can be completed quickly, and the conventional manner of fastening the male and female sockets is not needed, thereby avoiding the test error caused by the abrasion of the connecting socket.

One end of the top end of the base 15 is provided with a stop plate 10;

the top end of the base 15 is provided with a plurality of fixed cylinders 17, the bottom ends of the inner parts of the fixed cylinders 17 are provided with two spring damping rods 22, the top ends of the spring damping rods 22 are provided with baffle plates 21, and the bottom end of the bottom plate 18 is provided with a plurality of fixed blocks 11;

the number of the fixed blocks 11 and the number of the fixed cylinders 17 are four, and the centers of each group of the fixed blocks 11 and the fixed cylinders 17 are positioned on the same vertical line;

the shapes of the inside of the fixed cylinder 17 and the fixed block 11 are regular pentagons, and the cross sections of the inside of the fixed cylinder 17 and the fixed block 11 are the same in size;

the horizontal height of the bottom end of the fixed block 11 is higher than that of the bottom end of the probe 8, and the horizontal height of the top end of the fixed cylinder 17 is higher than that of the top end of the stop plate 10;

specifically, as shown in fig. 1, 3 and 4, when the bottom plate 18 of the device moves downward and the probe 8 does not contact the welding point, the fixing block 11 is inserted into the fixing cylinder 17, and the spring damping rod 22 pushes the baffle plate 21 to stop the fixing block 11, so that a user can feel a certain resistance, and therefore the device operates slowly, damage to the probe 8 caused by over-violent operation is avoided, and if the bottom plate 18 of the device deviates by a small amount, the fixing cylinder 17 abuts against the fixing block 11 to stop the downward movement of the fixing cylinder, and damage to the probe 8 is avoided.

The working principle is as follows: when the device is used, firstly, a PCB (printed Circuit Board) to be detected is placed above the base 15, the edge of the fixing cylinder 17 is enabled to limit the two sides of a board to be detected, then the PCB is pushed, one end of the PCB is enabled to abut against the stop plate 10, the PCB is quickly positioned, then the handle 3 is held, the handle 3 drives the rotating block 2 to rotate downwards, the rotating block 2 applies thrust to the fixing rod 13 through the fixing plate 4, the top plate 6 and the bottom plate 18 are enabled to move downwards directionally through the sliding fit between the lantern ring 16 and the guide rod 5, the probe 8 is enabled to contact welding spots on the PCB, and the detector 20 is utilized to detect, so that the detection can be quickly completed.

It is obvious to a person skilled in the art that the invention is not restricted to details of the above-described exemplary embodiments, but that it can be implemented in other specific forms without departing from the spirit or essential characteristics of the invention. The present embodiments are therefore to be considered in all respects as illustrative and not restrictive, the scope of the invention being indicated by the appended claims rather than by the foregoing description, and all changes which come within the meaning and range of equivalency of the claims are therefore intended to be embraced therein. Any reference sign in a claim should not be construed as limiting the claim concerned.

Claims

1. A microneedle testing device for SMT, includes base (15), its characterized in that: the improved multifunctional electric tool is characterized in that the two sides of the top end of the base (15) are provided with vertical plates (7), one side of each vertical plate (7) is provided with a fixed plate (4), one end of each fixed plate (4) is provided with a fixed frame (1), the inner wall of each fixed frame (1) is provided with a rotating block (2) through an articulated element, one end of each rotating block (2) is provided with a handle (3), the bottoms of the two sides of each rotating block (2) are provided with connecting bars (14) through articulated elements, the bottom end of one side of each connecting bar (14) is provided with a fixed bar (13) through an articulated element, the bottom end of each fixed bar (13) is provided with a top plate (6), the bottom end of each top plate (6) is provided with a plurality of connecting rods (12), the bottom ends of the connecting rods (12) are provided with bottom plates (18), the top ends of the bottom plates (18) are provided with mounting seats (9), and the inside of the mounting seats (9) are provided with a plurality of probes (8), the bottom end of the probe (8) extends to the lower portion of the bottom plate (18), the top end of the probe (8) is provided with a circuit board (19), the bottom end of the top plate (6) is provided with a detector (20), the bottom end of the detector (20) is connected with the circuit board (19) through a wire, and one end of the top end of the base (15) is provided with a stop plate (10).

2. A microneedle testing apparatus for SMT according to claim 1, wherein: a plurality of fixed barrels (17) are installed on the top of the base (15), two spring damping rods (22) are installed at the bottom end of the interior of each fixed barrel (17), a baffle (21) is installed at the top end of each spring damping rod (22), and a plurality of fixed blocks (11) are installed at the bottom end of the bottom plate (18).

3. A microneedle testing apparatus for SMT according to claim 2, wherein: the four fixing blocks (11) and the four fixing cylinders (17) are arranged, and the centers of each group of fixing blocks (11) and each group of fixing cylinders (17) are located on the same vertical line.

4. A microneedle testing apparatus for SMT according to claim 2, wherein: the shapes of the inside of the fixed cylinder (17) and the fixed block (11) are regular pentagons, and the cross section sizes of the inside of the fixed cylinder (17) and the fixed block (11) are the same.

5. A microneedle testing apparatus for SMT according to claim 1, wherein: guide bar (5) are installed to the bottom of fixed plate (4), and the bottom of guide bar (5) leads to and is connected with the top of base (15), the outer wall of guide bar (5) all overlaps and is equipped with two lantern rings (16), and one side of the lantern ring (16) is connected with one side of bottom plate (18) and roof (6) respectively.

6. A microneedle test apparatus according to claim 1, wherein: the rotating block (2) is connected with the fixed frame (1) in a rotating mode, and the rotating range of the rotating block (2) is 0-90 degrees.

7. A microneedle testing apparatus for SMT according to claim 2, wherein: the horizontal height of the bottom end of the fixing block (11) is higher than that of the bottom end of the probe (8), and the horizontal height of the top end of the fixing barrel (17) is higher than that of the top end of the stop plate (10).