CN217385601U

CN217385601U - Adjustable module test probe plate structure

Info

Publication number: CN217385601U
Application number: CN202220411983.8U
Authority: CN
Inventors: 艾团发; 任卫东
Original assignee: Shanghai Yubin Intelligent Technology Co ltd
Current assignee: Shanghai Yubin Intelligent Technology Co ltd
Priority date: 2022-02-28
Filing date: 2022-02-28
Publication date: 2022-09-06
Anticipated expiration: 2032-02-28

Abstract

The utility model discloses an adjustable module test probe card structure, which comprises a bracket, wherein the bottom of the bracket is connected with an installation mainboard through a probe height adjusting part; the outer wall of the top of the installation main board is provided with a slide rail, the inner wall of the slide rail is connected with two C-shaped boards with opposite directions in a sliding mode through a slide block, and one side faces of the two C-shaped boards are provided with probe displacement adjusting parts I with the same structure; two ends of the two C-shaped plates are provided with a second probe displacement adjusting part with the same structure; the probe height adjusting part comprises a top support piece fixedly arranged on the outer wall of the top of the bracket, a guide post arranged at the top end of the bracket and an anti-collision block bonded on the outer wall of the bottom of the bracket, and the bottom end of the guide post and the extending end of the top support piece are both fixed on the outer wall of the top of the mounting mainboard; the probe displacement adjusting part comprises a sliding groove arranged on one side surface of the C-shaped plate. The utility model discloses be convenient for control test probe about, about and around the arbitrary regulation of position, it is convenient to use.

Description

Adjustable module test probe plate structure

Technical Field

The utility model relates to a probe card technical field especially relates to a module test probe plate structure with adjustable.

Background

The module test probe board is used as a device for testing module OCV and EOL in the production line process of the new energy power battery module. Module test probe board can play the effect of contact module electricity core utmost point post and connection test instrument and industrial computer in process of production, and the numerical value is more true in the test acquisition in process of production. Currently, in testing, in order to ensure that the probe makes good contact with the pad or bump on the chip, the probe is usually calibrated, and the longitudinal and transverse positions of the probe and the height of the probe are adjusted.

Through the retrieval, chinese patent application number is CN 201920949625.0's patent, discloses a module test probe card adjusting device, which comprises a frame, the connecting pipe has all been run through to the left and right sides of frame, and the bottom fixedly connected with module roof of connecting pipe, the equal fixedly connected with curb plate in the left and right sides of module roof bottom, two fixedly connected with transverse guide between the curb plate, transverse guide's surperficial sliding connection has the sliding block, and passes through jackscrew fixed connection between sliding block and the transverse guide, screw fixedly connected with probe card is passed through to one side of sliding block. The module test probe card adjustable device in the above patent has the following disadvantages: can only carry out the fixed regulation of left and right sides direction, can't adjust front and back position, it is comparatively inconvenient to use.

SUMMERY OF THE UTILITY MODEL

The utility model aims at solving the shortcoming that exists among the prior art, and the module test probe plate structure with adjustable provide.

In order to achieve the above purpose, the utility model adopts the following technical scheme:

an adjustable module test probe card structure comprises a support, wherein the bottom of the support is connected with an installation main board through a probe height adjusting part; the outer wall of the top of the installation main board is provided with a slide rail, the inner wall of the slide rail is connected with two C-shaped boards with opposite directions in a sliding mode through a slide block, and one side faces of the two C-shaped boards are provided with probe displacement adjusting parts I with the same structure; and two ends of the two C-shaped plates are provided with probe displacement adjusting parts II with the same structure.

As a further aspect of the present invention: the probe height adjusting part comprises a top support piece fixedly installed on the outer wall of the top of the support, a guide column arranged on the top end of the support and an anti-collision block bonded on the outer wall of the bottom of the support, and the bottom end of the guide column and the extending end of the top support piece are fixed on the outer wall of the top of the installation mainboard.

As the utility model discloses further scheme again: the probe displacement adjusting part comprises a sliding groove arranged on one side face of the C-shaped plate, an adjusting column rotationally connected to one side face of the C-shaped plate, and a connecting block arranged on the outer wall of the adjusting column, wherein the outer wall of one side of the connecting block is connected to the inner wall of the sliding groove through a sliding block in a sliding mode.

As a further aspect of the present invention: the two probe displacement adjusting parts comprise racks fixedly connected to the outer wall of the bottom of the C-shaped plate, more than two gears rotatably connected to the inner wall of one side of the installation main plate and a motor fixedly connected to the inner wall of the bottom of the installation main plate;

the outer walls of more than two gears are meshed with each other, and the outer wall of one gear positioned at the most edge is meshed with the outer wall of the rack;

the number of the gears is even;

the output end of the motor is connected with the input end of one gear through a coupler.

As a further aspect of the present invention: the bottom outer wall fixedly connected with side of connecting block is the mounting panel of "protruding" shape, and the bottom demountable installation of mounting panel has the probe.

As a further aspect of the present invention: the both sides of mounting panel all are provided with the probe quantity increase and decrease portion that the structure is the same, and probe quantity increase and decrease portion includes through adding the extension board of establishing the subassembly and being fixed in a mounting panel side, adds to establish the subassembly by setting up in the draw-in groove of mounting panel and extension board one side outer wall, be fixed in the fixture block of extension board one side outer wall and constitute, and fixture block and draw-in groove phase-match.

As a further aspect of the present invention: the both sides of mounting panel all are provided with spacing rail, and the inner wall of spacing rail has the clamp plate through slider sliding connection.

As the utility model discloses further scheme again: and two C-shaped plates are fixedly connected with collision sensors on the outer wall of the opposite side.

Compared with the prior art, the utility model provides a module test probe plate structure with adjustable possesses following beneficial effect:

1. this module test probe plate structure with adjustable through being provided with probe height adjustment portion, probe displacement adjustment portion one, probe displacement adjustment portion two, is convenient for control test probe and carries out the arbitrary regulation of upper and lower, left and right sides and front and back position, and is convenient to use.

2. According to the adjustable module test probe plate structure, the probe displacement adjusting part II is arranged, the motor drives the gears which are even in number to rotate, and the C-shaped plate is driven by the rack to move outwards or inwards in the sliding rail front and back simultaneously.

3. According to the adjustable module test probe plate structure, the probe quantity increasing and decreasing part is arranged, and the extending plate is inserted into the clamping groove on the mounting plate through the clamping block on the extending plate, so that the number of probes is increased; otherwise, the reduction of the used probe can be completed by pulling out the extension plate, the operation is convenient, and the increase, the decrease and the replacement are both convenient.

Drawings

Fig. 1 is a schematic view of an overall structure of an adjustable module test probe plate structure according to the present invention;

fig. 2 is a schematic top view of an installation motherboard of an adjustable module test probe plate structure according to the present invention;

fig. 3 is a schematic side view of a cross-sectional structure of an installation motherboard of an adjustable module test probe plate structure according to the present invention;

fig. 4 is a schematic diagram of an explosion structure of a probe board and an extension board of an adjustable module test probe board structure according to the present invention;

fig. 5 is a schematic view of a gear trend of the adjustable module test probe plate structure provided by the present invention.

In the figure: the anti-collision device comprises a support 1, a mounting main board 2, an anti-collision block 3, a guide post 4, a top support 5, a C-shaped board 6, an adjusting post 7, a mounting board 8, a collision sensor 9, a sliding rail 10, a sliding chute 11, a pressing plate 12, a rack 13, a gear 14, a motor 15, a clamping groove 16, a clamping block 17, an extension plate 18 and a limit rail 19.

Detailed Description

The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments.

In the description of the present invention, it is to be understood that the terms "upper", "lower", "front", "rear", "left", "right", "top", "bottom", "inner", "outer", and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, and are only for convenience of description and simplicity of description, and do not indicate or imply that the device or element being referred to must have a particular orientation, be constructed and operated in a particular orientation, and therefore, should not be construed as limiting the present invention.

Example 1

The utility model provides a module test probe plate structure with adjustable, as shown in fig. 1-5, including support 1, the bottom of support 1 is connected with installation mainboard 2 through probe height adjustment portion, probe height adjustment portion includes fixed mounting in the top of support 1 outer wall of strut 5, peg graft in guide post 4 on support 1 top, bond in the anticollision piece 3 of support 1 bottom outer wall, and the bottom of guide post 4 and the extension end of strut 5 all are fixed in the top outer wall of installation mainboard 2, during the use, it makes installation mainboard 2 spacing through guide post 4 to start strut 5, do the oscilaltion, and then height when being convenient for adjust the probe and using.

In order to control the probes to move left and right, a sliding rail 10 is arranged on the outer wall of the top of the installation main board 2, the inner wall of the sliding rail 10 is connected with two C-shaped boards 6 which face away from each other in a sliding mode through a sliding block, and a first probe displacement adjusting part with the same structure is arranged on one side face of each of the two C-shaped boards 6;

preferably, the probe displacement adjusting part comprises a sliding chute 11 arranged on one side surface of the C-shaped plate 6, an adjusting column 7 rotationally connected to one side surface of the C-shaped plate 6, and a connecting block connected to the outer wall of the adjusting column 7 through threads, and the outer wall of one side of the connecting block is connected to the inner wall of the sliding chute 11 in a sliding mode through a sliding block; during the use, rotate and adjust post 7 and make the connecting block remove about in spout 11, and then be convenient for control probe carries out the reciprocating displacement of left and right directions.

Preferably, the bottom outer wall fixedly connected with side of connecting block is the mounting panel 8 that is used for installing the probe of "protruding" shape, and the bottom demountable installation of mounting panel 8 has a plurality of probe.

In order to control the probes to move back and forth, two ends of each of the two C-shaped plates 6 are provided with a probe displacement adjusting part II with the same structure, and each probe displacement adjusting part II comprises a rack 13 fixed on the outer wall of the bottom of each C-shaped plate 6 through bolts, a plurality of gears 14 rotatably connected to the inner wall of one side of the installation mainboard 2, and a motor 15 fixed on the inner wall of the bottom of the installation mainboard 2 through bolts;

preferably, the outer walls of a plurality of the gears 14 are meshed with each other, the outer wall of one of the gears 14 located at the most edge is meshed with the outer wall of the rack 13, the number of the gears 14 is even, as shown in fig. 5, so as to control the two C-shaped plates 6 to move synchronously to move outwards or inwards simultaneously, the output end of the motor 15 is connected with the input end of one of the gears 14 through a coupler, and the switch control end of the motor 15 is electrically connected with the control module; the starting motor 15 drives the gear 14 to rotate, and the C-shaped plate 6 is driven by the rack 13 to move back and forth in the slide rail 10, so that the structure is stable.

Preferably, the outer wall of one side of each of the two C-shaped plates 6 opposite to each other is fixed with a collision sensor 9 through a bolt, the type of the collision sensor 9 is DFROBOT, the signal output end of the collision sensor 9 is electrically connected with the control module, when the front and back displacement occurs, the collision sensor 9 is in contact with the top support piece 5 and sends a signal to the control module, the electrical connection of the collision sensor is used for controlling the motor 15 to be closed, and the equipment is prevented from doing useless work.

The working principle is as follows: when in use, the top support piece 5 can be started to enable the installation main board 2 to be limited by the guide post 4 and to be lifted up and down; the adjusting column 7 can be rotated to enable the connecting block to move left and right in the sliding groove 11; the motor 15 can also be started to drive the gear 14 to rotate, and the C-shaped plate 6 is driven by the rack 13 to move back and forth in the slide rail 10, so that the adjustment can be flexibly carried out according to the operation requirement. When the collision sensor 9 is contacted with the top support 5 during the front-back displacement, a signal is sent to the control module, and the control module is electrically connected with the control motor 15 to be closed, so that the equipment is prevented from doing useless work.

Example 2

An adjustable probe board structure for testing module is disclosed, as shown in FIG. 4, in order to increase, decrease and replace the probe; the present embodiment is modified from embodiment 1 as follows: the two sides of the mounting plate 8 are provided with probe quantity increasing and decreasing parts with the same structure, each probe quantity increasing and decreasing part comprises an extension plate 18 fixed on one side surface of the mounting plate 8 through an additional assembly, each additional assembly comprises a clamping groove 16 formed in the outer wall of one side of the mounting plate 8/the extension plate 18 and a clamping block 17 fixed on the outer wall of one side of the extension plate 18, and the clamping blocks 17 are matched with the clamping grooves 16; a plurality of extension plates 18 on which probes are installed in advance can be clamped into the clamping grooves 16 on the adjacent extension plates 18 through the clamping blocks 17, and then the clamping blocks 17 on the extension plates 18 at the edge are inserted into the clamping grooves 16 on the mounting plate 8, so that the number of the probes is increased; otherwise, the reduction of the used probes can be finished by pulling out the extension plate 18, the operation is convenient, and the increase, the decrease and the replacement are both convenient.

In order to ensure the butt joint firmness of the probe quantity increasing and decreasing part and the test component, two sides of the mounting plate 8 are both provided with limiting rails 19, and the inner walls of the limiting rails 19 are connected with a pressing plate 12 in a sliding manner through sliding blocks; when the probe is additionally arranged for use, the pressure plate 12 is pushed leftwards and rightwards in the limit rail 19, so that the bottom surface of the pressure plate is positioned above the additionally arranged extension plate 18, and the use stability of the probe during testing is further improved.

The working principle is as follows: according to the operation requirement, a plurality of extension plates 18 on which probes are installed in advance can be clamped into the clamping grooves 16 on the adjacent extension plates 18 through the clamping blocks 17, and then the clamping blocks 17 on the extension plates 18 at the edge are inserted into the clamping grooves 16 on the mounting plate 8, so that the increase of the number of the used probes is completed; conversely, by removing the extension plate 18, a reduction in the amount of probe used can be accomplished. When the probe is additionally arranged for use, the pressure plate 12 is pushed leftwards and rightwards in the limit rail 19, so that the bottom surface of the pressure plate is positioned above the additionally arranged extension plate 18, and the use stability of the probe during testing is further improved.

The above, only be the concrete implementation of the preferred embodiment of the present invention, but the protection scope of the present invention is not limited thereto, and any person skilled in the art is in the technical scope of the present invention, according to the technical solution of the present invention and the utility model, the concept of which is equivalent to replace or change, should be covered within the protection scope of the present invention.

Claims

1. An adjustable module test probe plate structure comprises a support (1) and is characterized in that the bottom of the support (1) is connected with a mounting main plate (2) through a probe height adjusting part; the outer wall of the top of the installation main board (2) is provided with a sliding rail (10), the inner wall of the sliding rail (10) is connected with two C-shaped boards (6) which face away from each other in a sliding mode through a sliding block, and one side faces of the two C-shaped boards (6) are provided with probe displacement adjusting parts I which are identical in structure; and two ends of the two C-shaped plates (6) are provided with probe displacement adjusting parts II with the same structure.

2. The adjustable module test probe plate structure as claimed in claim 1, wherein the probe height adjusting portion comprises a top support member (5) fixedly mounted on the top outer wall of the bracket (1), a guide post (4) disposed at the top end of the bracket (1), and an anti-collision block (3) adhered to the bottom outer wall of the bracket (1), and the bottom end of the guide post (4) and the extending end of the top support member (5) are both fixed on the top outer wall of the mounting main plate (2).

3. The adjustable module test probe plate structure as claimed in claim 1, wherein the probe displacement adjusting portion comprises a sliding groove (11) formed in one side of the C-shaped plate (6), an adjusting column (7) rotatably connected to one side of the C-shaped plate (6), and a connecting block arranged on the outer wall of the adjusting column (7), and the outer wall of one side of the connecting block is slidably connected to the inner wall of the sliding groove (11) through a sliding block.

4. The adjustable module test probe card structure as claimed in claim 2, wherein the probe displacement adjusting part two comprises a rack (13) fixedly connected to the outer wall of the bottom of the C-shaped board (6), more than two gears (14) rotatably connected to the inner wall of one side of the installation main board (2), and a motor (15) fixedly connected to the inner wall of the bottom of the installation main board (2);

the outer walls of more than two gears (14) are meshed with each other, and the outer wall of one gear (14) positioned at the most edge is meshed with the outer wall of the rack (13);

the number of the gears (14) is even;

the output end of the motor (15) is connected with the input end of one gear (14) through a coupler.

5. The adjustable module test probe card structure as claimed in claim 3, wherein the outer wall of the bottom of the connecting block is fixedly connected with a mounting plate (8) with a convex side, and the bottom end of the mounting plate (8) is detachably mounted with a probe.

6. The adjustable module test probe plate structure as claimed in claim 5, wherein the two sides of the mounting plate (8) are provided with probe number increasing and decreasing portions with the same structure, the probe number increasing and decreasing portions comprise extension plates (18) fixed on one side of the mounting plate (8) by adding and setting components, the adding and setting components comprise clamping grooves (16) arranged on the outer walls of one sides of the mounting plate (8) and the extension plates (18) and clamping blocks (17) fixed on the outer walls of one sides of the extension plates (18), and the clamping blocks (17) are matched with the clamping grooves (16).

7. The adjustable module test probe plate structure as claimed in claim 6, wherein both sides of the mounting plate (8) are provided with limit rails (19), and the inner walls of the limit rails (19) are slidably connected with the pressure plate (12) through sliding blocks.

8. The adjustable modular test probe card structure as claimed in claim 4, wherein the outer wall of one side opposite to the C-shaped board (6) is fixedly connected with a collision sensor (9).