CN217359963U

CN217359963U - Test box for semiconductor standard device

Info

Publication number: CN217359963U
Application number: CN202122695432.7U
Authority: CN
Inventors: 金玄
Original assignee: Suzhou Jinfengming Electronic Technology Co ltd
Current assignee: Suzhou Jinfengming Electronic Technology Co ltd
Priority date: 2021-11-05
Filing date: 2021-11-05
Publication date: 2022-09-02
Anticipated expiration: 2031-11-05

Abstract

The utility model discloses a test box for semiconductor standard device, in particular to the semiconductor field, which comprises a test box body and a limit connecting plate, wherein the limit connecting plate is movably arranged at one side of the test box body; the fixed symmetry in one side that the test box body is close to spacing connecting plate is equipped with first backup pad, and two first backup pads set up respectively at the both ends that first led to the groove, and the one end fixed connection of test box is kept away from with two first backup pads respectively in the both ends of spacing connecting plate, and one of them first backup pad is kept away from one side that first logical groove and is fixed and be equipped with first motor, and the tip activity of first motor output shaft runs through first backup pad. The utility model discloses in through being equipped with the slide bar to reach and prevent second slider pivoted purpose.

Description

Test box for semiconductor standard device

Technical Field

The utility model relates to the field of semiconductor technology, specifically be a test box for semiconductor standard device.

Background

The semiconductor refers to a material having a conductivity between a conductor and an insulator at normal temperature. Semiconductors are used in the fields of integrated circuits, consumer electronics, communication systems, photovoltaic power generation, lighting, high-power conversion, etc., for example, diodes are devices fabricated using semiconductors.

1. When the semiconductor standard component is tested, the semiconductor standard component generates heat, but the data distortion is caused by overhigh temperature, so that the test result is deviated;

2. when testing semiconductor standard components, short circuit is easy to occur, and the short circuit easily causes line fire, which may threaten the periphery.

SUMMERY OF THE UTILITY MODEL

The technical insufficiency to the existence of the utility model aims at providing a test box for semiconductor standard device to solve the problem that proposes in the above-mentioned background art.

In order to solve the technical problem, the utility model adopts the following technical scheme: the utility model provides a test box for semiconductor standard device, including test box body and spacing connecting plate, the activity of spacing connecting plate sets up in one side of test box body, one side that the test box body is close to spacing connecting plate has seted up first logical groove, the inside activity card of first logical groove is equipped with radiator fan, one side that the test box body is close to spacing connecting plate has seted up the second logical groove;

the testing box comprises a testing box body, wherein first supporting plates are fixedly and symmetrically arranged on one side, close to a limiting connecting plate, of the testing box body, the two first supporting plates are respectively arranged at two ends of a first through groove, two ends of the limiting connecting plate are respectively fixedly connected with one ends, far away from the testing box, of the two first supporting plates, a first motor is fixedly arranged on one side, far away from the first through groove, of one first supporting plate, the end part of an output shaft of the first motor movably penetrates through the first supporting plates, a first threaded rod is fixedly arranged on the end part of the output shaft of the first motor, one end, far away from the first motor, of the first threaded rod is rotatably inserted into one side of the first supporting plate, a first sliding block is sleeved on the first threaded rod in a threaded manner, one end of the first sliding block is attached to one side, close to the testing box body, of the limiting connecting plate,

preferably, one side of the test box body, which is close to the limiting connection plate, is symmetrically and fixedly provided with a second support plate, one side of the second support plate, which is close to the first motor, is fixedly provided with a second motor, the end part of the output shaft of the second motor movably penetrates through the second support plate, the end part of the output shaft of the second motor is fixedly provided with a second threaded rod, one end of the second threaded rod is rotatably inserted into one side of the other second support plate, a second slider is sleeved on the second threaded rod, a support tube is fixedly arranged on one side, which is far away from the test box body, of the second slider, and a sand tank is fixedly arranged at one end of the support tube.

Preferably, the first slider is close to one side symmetry fixed connection of test box body and is equipped with the connecting rod, two the one end of connecting rod respectively with radiator fan's both ends fixed connection.

Preferably, a sliding rod movably penetrates through one end of the second sliding block, and two ends of the sliding rod are fixedly connected with one sides of the two second supporting plates respectively.

Preferably, one end of the supporting tube movably penetrates through the second sliding block, one end of the supporting tube is fixedly provided with an injection tube, and one end of the injection tube is inserted into the second through groove.

Preferably, the length of the second through groove is greater than the length of the second threaded rod.

Compared with the prior art, the beneficial effects of the utility model reside in that:

1. through the arrangement of the heat dissipation fan, when the heat dissipation fan is started, the fan blades of the heat dissipation fan rotate at a high speed to discharge hot air in the test box body, then the end part of the output shaft of the first motor is started to drive the first threaded rod to rotate, meanwhile, the first threaded rod drives the first sliding block to move, the first sliding block drives the connecting rod to move, and the connecting rod drives the heat dissipation fan to move, so that heat can be dissipated at different positions of the test box body, and the overhigh temperature in the test box body is avoided;

2. through being equipped with the sand jar, through the valve of opening the sand jar, the husky entering stay tube of fire control in the sand jar, and get into the inside of test box body through the ascending pipe, start the second motor simultaneously, the tip of second motor output shaft drives the second threaded rod and rotates, the second threaded rod drives the second slider removal simultaneously, the second slider drives and drives the sand jar removal, the second slider drives the ascending pipe and removes in the second through-slot simultaneously, just so avoid the condition that the grow appears in the test box body intensity of a fire, thereby will reduce the purpose of loss.

Drawings

In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to these drawings without creative efforts.

Fig. 1 is a schematic structural diagram of the present invention.

Fig. 2 is the schematic diagram of the sand tank structure of the present invention.

Fig. 3 is a schematic view of the structure of the connecting rod of the present invention.

Description of reference numerals: 1. a test box body; 2. a limiting connecting plate; 3. a first through groove; 4. a first support plate; 5. a first motor; 6. a first threaded rod; 7. a first slider; 8. a heat radiation fan; 9. a second support plate; 10. a second motor; 11. a second threaded rod; 12. a second slider; 13. supporting a tube; 14. a sand tank; 15. a connecting rod; 16. a slide bar; 17. an injection pipe; 18. a second through slot.

Detailed Description

The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.

Example (b): as shown in fig. 1-3, the utility model provides a test box for semiconductor standard device, which comprises a test box body 1 and a limit connecting plate 2, wherein the limit connecting plate 2 is movably arranged at one side of the test box body 1, a first through groove 3 is arranged at one side of the test box body 1 close to the limit connecting plate 2, a cooling fan 8 is movably clamped inside the first through groove 3, and a second through groove 18 is arranged at one side of the test box body 1 close to the limit connecting plate 2;

one side of the test box body 1 close to the limit connecting plate 2 is fixedly and symmetrically provided with first supporting plates 4, the two first supporting plates 4 are respectively arranged at two ends of the first through groove 3, two ends of the limit connecting plate 2 are respectively and fixedly connected with one ends of the two first supporting plates 4 far away from the test box, one side of one first supporting plate 4 far away from the first through groove 3 is fixedly provided with a first motor 5, the end part of an output shaft of the first motor 5 movably penetrates through the first supporting plates 4, the end part of an output shaft of the first motor 5 is fixedly provided with a first threaded rod 6, one end of the first threaded rod 6 far away from the first motor 5 is rotatably inserted at one side of the first supporting plate 4, a first sliding block 7 is sleeved on the first threaded rod 6 in a threaded manner, one end of the first sliding block 7 is attached to one side of the limit connecting plate 2 close to the test box body 1, one side of the first sliding block 7 close to the test box body 1 is symmetrically and fixedly provided with a connecting rod 15, one end of two connecting rods 15 respectively with radiator fan 8's both ends fixed connection, through starting radiator fan 8, radiator fan 8's flabellum rotates at a high speed and discharges the interior steam of test box body 1, the tip that starts first motor 5 output shaft after that drives first threaded rod 6 and rotates, first threaded rod 6 drives first slider 7 and removes simultaneously, first slider 7 drives connecting rod 15 and removes, connecting rod 15 drives radiator fan 8 and removes, just so can dispel the heat to the different positions of test box body 1, thereby avoid the high temperature in the test box body 1.

Furthermore, one side of the test box body 1 close to the limiting connecting plate 2 is symmetrically and fixedly provided with second supporting plates 9, one side of one of the second supporting plates 9 close to the first motor 5 is fixedly provided with a second motor 10, the end part of the output shaft of the second motor 10 movably penetrates through the second supporting plate 9, the end part of the output shaft of the second motor 10 is fixedly provided with a second threaded rod 11, one end of the second threaded rod 11 is rotatably inserted at one side of the other second supporting plate 9, a second slider 12 is sleeved on the second threaded rod 11 in a threaded manner, one side of the second slider 12 far away from the test box body 1 is fixedly provided with a supporting tube 13, one end of the supporting tube 13 is fixedly provided with a sand tank 14, one end of the supporting tube 13 movably penetrates through the second slider 12, one end of the supporting tube 13 is fixedly provided with an injection tube 17, one end of the injection tube 17 is inserted in the second through groove 18, one end of the second slider 12 is movably penetrated with a sliding rod 16, slide bar 16's both ends respectively with one side fixed connection of two second backup pads 9, the length that the second led to groove 18 is greater than the length of second threaded rod 11, through the valve of opening sand jar 14, the fire control sand in the sand jar 14 gets into stay tube 13, and get into the inside of test box body 1 through injection pipe 17, start second motor 10 simultaneously, the tip of second motor 10 output shaft drives second threaded rod 11 and rotates, second threaded rod 11 drives second slider 12 and removes simultaneously, second slider 12 drives and drives sand jar 14 and remove, second slider 12 drives injection pipe 17 and removes in the logical groove 18 of second simultaneously, just so avoid the condition that the grow appears in the intensity of a fire of test box body 1, thereby will reduce the mesh of loss.

Working principle; firstly, the test box body 1 is started, the test box body 1 works to generate heat, then, the heat dissipation fan 8 is started, the heat dissipation fan 8 is preferably 28080HA2 type, the heat dissipation fan 8 starts to work, the blades of the heat dissipation fan 8 rotate at high speed to discharge hot air in the test box body 1, then the first motor 5 is started, the first motor 5 is preferably YE2132M-4 type, the first motor 5 starts to work, the end part of the output shaft of the first motor 5 drives the first threaded rod 6 to rotate, meanwhile, the first threaded rod 6 drives the first sliding block 7 to move, the first sliding block 7 drives the connecting rod 15 to move, the connecting rod 15 drives the heat dissipation fan 8 to move, thus, heat dissipation can be carried out on different positions of the test box body 1, the temperature in the test box body 1 is prevented from being overhigh, when the internal short circuit of the test box body 1 fires, a valve of the sand tank 14 is opened, fire fighting sand in the sand tank 14 enters the supporting tube 13, and get into the inside of test box body 1 through injection pipe 17, start second motor 10 simultaneously, second motor 10 is preferred to be type YE2132M-4, make second motor 10 begin work, the tip of second motor 10 output shaft drives second threaded rod 11 and rotates, second threaded rod 11 drives second slider 12 and removes simultaneously, second slider 12 drives and drives sand jar 14 and remove, second slider 12 drives injection pipe 17 and removes in second logical groove 18 simultaneously, just so avoid the condition that the grow appears in test box body 1 intensity of a fire, thereby will reduce the purpose of loss, finally, restore test box body 1 can.

It will be apparent to those skilled in the art that various changes and modifications may be made without departing from the spirit and scope of the invention. Thus, if such modifications and variations of the present invention fall within the scope of the claims and their equivalents, the present invention is also intended to include such modifications and variations.

Claims

1. A test box for a semiconductor standard device comprises a test box body (1) and a limiting connecting plate (2), and is characterized in that the limiting connecting plate (2) is movably arranged on one side of the test box body (1), a first through groove (3) is formed in one side, close to the limiting connecting plate (2), of the test box body (1), a cooling fan (8) is movably clamped in the first through groove (3), and a second through groove (18) is formed in one side, close to the limiting connecting plate (2), of the test box body (1);

the testing box comprises a testing box body (1), wherein first supporting plates (4) are fixedly and symmetrically arranged on one side, close to a limiting connecting plate (2), of the testing box body, the two first supporting plates (4) are respectively arranged at two ends of a first through groove (3), two ends of the limiting connecting plate (2) are respectively fixedly connected with one ends, far away from the testing box, of the two first supporting plates (4), one side, far away from the first through groove (3), of one first supporting plate (4) is fixedly provided with a first motor (5), the end part of an output shaft of the first motor (5) movably penetrates through the first supporting plates (4), the end part of the output shaft of the first motor (5) is fixedly provided with a first threaded rod (6), one end, far away from the first motor (5), of the first threaded rod (6) is rotatably inserted into one side of the first supporting plates (4), and a first sliding block (7) is sleeved on the first threaded rod (6), one end of the first sliding block (7) is attached to one side, close to the test box body (1), of the limiting connecting plate (2).

2. The test box for semiconductor standard device according to claim 1, a second supporting plate (9) is symmetrically and fixedly arranged on one side of the test box body (1) close to the limiting connecting plate (2), one side of one of the second supporting plates (9) close to the first motor (5) is fixedly provided with a second motor (10), the end part of the output shaft of the second motor (10) movably penetrates through the second support plate (9), a second threaded rod (11) is fixedly arranged at the end part of the output shaft of the second motor (10), one end of the second threaded rod (11) is rotatably inserted at one side of the other second supporting plate (9), the threaded sleeve is equipped with second slider (12) on second threaded rod (11), one side that test box body (1) was kept away from in second slider (12) is fixed to be equipped with stay tube (13), the fixed sand jar (14) that are equipped with of one end of stay tube (13).

3. The test box for the semiconductor standard device according to claim 1, wherein the first slider (7) is symmetrically and fixedly provided with connecting rods (15) at one side close to the test box body (1), and one ends of the two connecting rods (15) are respectively and fixedly connected with two ends of the heat dissipation fan (8).

4. The testing box for the semiconductor standard device according to claim 2, wherein a sliding rod (16) is movably penetrated through one end of the second sliding block (12), and two ends of the sliding rod (16) are respectively fixedly connected with one side of the two second supporting plates (9).

5. The testing box for the semiconductor standard device according to claim 2, wherein one end of the supporting tube (13) movably penetrates through the second sliding block (12), one end of the supporting tube (13) is fixedly provided with an injection tube (17), and one end of the injection tube (17) is inserted into the second through groove (18).

6. A test box for semiconductor standard devices according to claim 1, characterized in that the length of the second through slot (18) is greater than the length of the second threaded rod (11).