CN217332734U - Detection device is used in electronic chip processing with positioning mechanism - Google Patents
Detection device is used in electronic chip processing with positioning mechanism Download PDFInfo
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- CN217332734U CN217332734U CN202221082971.1U CN202221082971U CN217332734U CN 217332734 U CN217332734 U CN 217332734U CN 202221082971 U CN202221082971 U CN 202221082971U CN 217332734 U CN217332734 U CN 217332734U
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Abstract
本实用新型公开了一种带有定位机构的电子芯片加工用检测装置,包括工作台,所述工作台上表面两侧固定安装有立板,所述立板呈对称设置有两组,两组所述立板顶面共同连接有顶板,所述顶板底面固定安装有电动滑台,所述电动滑台的滑动平台上固定连接有支架,所述支架内部固定安装有电动推杆,所述电动推杆的输出端固定连接有支撑板,所述支撑板底面等距设置有测试探头,所述支撑板上表面与支架底面之间设置有支撑组件,通过工作台对需要检测的芯片进行放置,工作台上方位置滑动设置有测试探头,通过测试探头下压与芯片表面贴合进行测试,提高芯片的检测效率,设置有测试探头匹配的支撑组件,提高了芯片检测的效果。
The utility model discloses an electronic chip processing detection device with a positioning mechanism, which comprises a worktable, vertical plates are fixedly installed on both sides of the upper surface of the worktable, and two sets of the vertical plates are symmetrically arranged. The top surface of the vertical plate is jointly connected with a top plate, the bottom surface of the top plate is fixedly installed with an electric sliding table, a bracket is fixedly connected to the sliding platform of the electric sliding table, and an electric push rod is fixedly installed inside the bracket, and the electric sliding table is fixedly installed inside the bracket. The output end of the push rod is fixedly connected with a support plate, the bottom surface of the support plate is provided with test probes at equal distances, and a support assembly is arranged between the upper surface of the support plate and the bottom surface of the bracket, and the chips to be tested are placed on the workbench, A test probe is slidably arranged on the upper part of the worktable. The test probe is pressed down and attached to the surface of the chip for testing, which improves the detection efficiency of the chip. A supporting component matching the test probe is provided to improve the effect of chip detection.
Description
技术领域technical field
本实用新型涉及芯片加工设备技术领域,具体为一种带有定位机构的电子芯片加工用检测装置。The utility model relates to the technical field of chip processing equipment, in particular to a detection device for electronic chip processing with a positioning mechanism.
背景技术Background technique
芯片是一种集成电路,由大量的晶体管构成,不同的芯片有不同的集成规模,大到几亿;小到几十、几百个晶体管,晶体管有两种状态,开和关,多个晶体管产生的多个信号,这些信号被设定成特定的功能,来表示或处理字母、数字、颜色和图形等,芯片加电以后,首先产生一个启动指令,来启动芯片,以后就不断接受新指令和数据来完成功能,集成电路可以把模拟和数字电路集成在一个单芯片上,以做出如模拟数字转换器等器件;A chip is an integrated circuit composed of a large number of transistors. Different chips have different integration scales, ranging from hundreds of millions; as small as tens or hundreds of transistors, transistors have two states, on and off, and multiple transistors Generated multiple signals, these signals are set to specific functions to represent or process letters, numbers, colors and graphics, etc. After the chip is powered on, a startup command is first generated to start the chip, and then new commands are continuously accepted. and data to complete the function, the integrated circuit can integrate analog and digital circuits on a single chip to make devices such as analog-to-digital converters;
芯片在生产加工过程中需要对其进行性能检测等步骤,现有的检测步骤需要人工手持检测器具与芯片表面贴合进行测试,人工测试长时间操作可能会出现疲劳,容易出现漏检与错检的情况,降低芯片的检测效率,且现有的检测器具在与芯片表面贴合检测时,大多没有设置匹配的支撑结构,使得检测探头与芯片表面的触点贴合时性能不够稳定,降低了芯片检测的效果。During the production and processing of the chip, it needs to perform performance testing and other steps. The existing testing steps require manual hand-held testing tools to be attached to the chip surface for testing. Manual testing for a long time may cause fatigue, and it is prone to missed detection and false detection. In this case, the detection efficiency of the chip is reduced, and most of the existing detection instruments are not equipped with a matching support structure when they are attached to the surface of the chip. The effect of chip detection.
实用新型内容Utility model content
本实用新型的目的在于提供一种锂电子电池固定夹具,通过工作台对需要检测的芯片进行放置,工作台上方位置滑动设置有检测探头,通过检测探头下压与芯片表面贴合进行测试,不易产生人工测试操作因为疲劳而出现漏检与错检的情况,提高芯片的检测效率,设置有检测探头匹配的支撑组件,使得检测探头下压与芯片表面的触点贴合时性能较为稳定,提高了芯片检测的效果,以解决上述背景技术中提出的问题。The purpose of the utility model is to provide a lithium electronic battery fixing fixture, the chip to be detected is placed through a worktable, a detection probe is slidably arranged on the upper part of the worktable, and the detection probe is pressed down and attached to the surface of the chip for testing, and it is not easy to The manual test operation is prone to missed detection and false detection due to fatigue, which improves the detection efficiency of the chip. A support component matching the detection probe is provided, so that the performance of the detection probe is relatively stable when the detection probe is pressed down and the contacts on the surface of the chip are attached. The effect of chip detection is improved, so as to solve the problems raised in the above-mentioned background art.
为实现上述目的,本实用新型提供如下技术方案:一种带有定位机构的电子芯片加工用检测装置,包括工作台,所述工作台上表面两侧固定安装有立板,所述立板呈对称设置有两组,两组所述立板顶面共同连接有顶板,所述顶板底面固定安装有电动滑台,所述电动滑台的滑动平台上固定连接有支架,所述支架内部固定安装有电动推杆,所述电动推杆的输出端固定连接有支撑板,所述支撑板底面等距设置有测试探头,所述支撑板上表面与支架底面之间设置有支撑组件,所述工作台上表面对称设置有两组夹板,两组对称设置的夹板之间设置有托盘。In order to achieve the above purpose, the present utility model provides the following technical solutions: a detection device for electronic chip processing with a positioning mechanism, comprising a workbench, and vertical plates are fixedly installed on both sides of the upper surface of the workbench, and the vertical plates are Two groups are symmetrically arranged, the top surfaces of the two vertical plates are jointly connected with a top plate, an electric sliding table is fixedly installed on the bottom surface of the top plate, and a bracket is fixedly connected to the sliding platform of the electric sliding table, and the bracket is fixedly installed inside. There is an electric push rod, the output end of the electric push rod is fixedly connected with a support plate, the bottom surface of the support plate is equidistantly provided with test probes, and a support assembly is arranged between the upper surface of the support plate and the bottom surface of the bracket, and the working Two sets of splints are symmetrically arranged on the upper surface of the table, and a tray is arranged between the two sets of symmetrically arranged splints.
优选的,所述测试探头与托盘匹配设置,所述测试探头设置于托盘上方位置,所述托盘上内部开设有放置槽。Preferably, the test probe is arranged in a matching manner with the tray, the test probe is arranged above the tray, and a placement groove is opened inside the tray.
优选的,所述支撑组件包括底杆和支杆,所述支杆顶端滑动连接于底杆内部,所述支杆顶端与底杆内部之间固定连接有弹簧。Preferably, the support assembly includes a bottom rod and a support rod, the top end of the support rod is slidably connected to the inside of the bottom rod, and a spring is fixedly connected between the top end of the support rod and the inside of the bottom rod.
优选的,所述弹簧设置为压缩弹簧,所述底杆顶端固定连接于支架底面,所述支杆底端与支撑板上表面固定连接。Preferably, the spring is configured as a compression spring, the top end of the bottom rod is fixedly connected to the bottom surface of the bracket, and the bottom end of the support rod is fixedly connected to the top surface of the support plate.
优选的,所述底杆内壁对称开设有第一滑槽,所述支杆顶端固定安装有第一滑块,所述第一滑块与第一滑槽滑动间隙配合。Preferably, a first sliding groove is symmetrically opened on the inner wall of the bottom rod, a first sliding block is fixedly installed on the top end of the support rod, and the first sliding block is in sliding clearance fit with the first sliding groove.
优选的,所述工作台上两侧对称开设有第二滑槽,所述夹板底面固定安装有第二滑块,所述第二滑块与第二滑槽滑动间隙配合。Preferably, second sliding grooves are symmetrically opened on both sides of the worktable, a second sliding block is fixedly installed on the bottom surface of the splint, and the second sliding block and the second sliding groove are in sliding clearance fit.
优选的,所述工作台上两侧对称螺纹连接有螺杆,所述螺杆一端贯穿延伸至第二滑槽内部与第二滑块一侧转动连接,所述螺杆一端固定连接有手轮。Preferably, two sides of the worktable are symmetrically threadedly connected with a screw, one end of the screw extends through the inside of the second chute and is rotatably connected to one side of the second slider, and one end of the screw is fixedly connected with a hand wheel.
与现有技术相比,本实用新型的有益效果是:Compared with the prior art, the beneficial effects of the present utility model are:
1、本实用新型通过工作台对需要检测的芯片进行放置,工作台上方位置滑动设置有测试探头,测试探头滑动连接于顶板底面的滑动平台上,通过电动推杆带动测试探头下压与芯片表面贴合进行测试,不易产生人工测试操作因为疲劳而出现漏检与错检的情况,提高芯片的检测效率;1. The utility model places the chip to be detected through the worktable, and a test probe is slidably arranged on the upper part of the worktable. Fitting for testing, it is not easy to cause missed detection and false detection due to fatigue in manual testing operations, and improve the detection efficiency of chips;
2、通过支架底面与支撑板之间设置的支撑组件对测试探头形成支撑力,支撑组件与测试探头匹配设置,电动推杆带动测试探头下压的时候不易产生晃动,使得测试探头与芯片表面的触点贴合时性能较为稳定,检测数据更加准确,提高了芯片检测的效果。2. A support force is formed on the test probe through the support assembly arranged between the bottom surface of the bracket and the support plate. The support assembly is matched with the test probe. When the contacts are attached, the performance is relatively stable, the detection data is more accurate, and the effect of chip detection is improved.
附图说明Description of drawings
图1为本实用新型的主视结构示意图;Fig. 1 is the front view structure schematic diagram of the utility model;
图2为本实用新型的工作台部分侧视结构剖视示意图;Figure 2 is a schematic cross-sectional view of the workbench part of the utility model side structure;
图3为本实用新型的支撑板部分立体结构示意图;3 is a schematic diagram of the three-dimensional structure of the supporting plate part of the present invention;
图4为本实用新型的支撑组件部分剖视结构示意图;FIG. 4 is a partial cross-sectional structural schematic diagram of a support assembly of the present invention;
图5为本实用新型的托盘部分立体结构示意图。FIG. 5 is a schematic diagram of the three-dimensional structure of the tray part of the present invention.
图中:1、工作台;2、立板;3、顶板;4、电动滑台;5、支架;6、电动推杆;7、支撑板;8、测试探头;9、支撑组件;901、底杆;902、支杆;10、夹板;11、托盘;12、放置槽;13、弹簧;14、第一滑槽;15、第一滑块;16、第二滑槽;17、第二滑块;18、螺杆;19、手轮。In the picture: 1. Workbench; 2. Vertical plate; 3. Top plate; 4. Electric sliding table; 5. Bracket; 6. Electric push rod; 7. Support plate; 8. Test probe; 9. Support assembly; 901, Bottom rod; 902, support rod; 10, splint; 11, tray; 12, placement slot; 13, spring; 14, first chute; 15, first slider; 16, second chute; 17, second Slider; 18. Screw; 19. Handwheel.
具体实施方式Detailed ways
下面将结合本实用新型实施例中的附图,对本实用新型实施例中的技术方案进行清楚、完整地描述,显然,所描述的实施例仅仅是本实用新型一部分实施例,而不是全部的实施例。基于本实用新型中的实施例,本领域普通技术人员在没有做出创造性劳动前提下所获得的所有其他实施例,都属于本实用新型保护的范围。The technical solutions in the embodiments of the present utility model will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present utility model. Obviously, the described embodiments are only a part of the embodiments of the present utility model, rather than all the implementations. example. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative work fall within the protection scope of the present invention.
请参阅图1-5,本实用新型提供一种技术方案:一种带有定位机构的电子芯片加工用检测装置,包括工作台1,工作台1上表面两侧固定安装有立板2,立板2呈对称设置有两组,两组立板2顶面共同连接有顶板3,顶板3底面固定安装有电动滑台4,电动滑台4的滑动平台上固定连接有支架5,支架5内部固定安装有电动推杆6,电动推杆6的输出端固定连接有支撑板7,支撑板7底面等距设置有测试探头8;1-5, the present utility model provides a technical solution: an electronic chip processing detection device with a positioning mechanism, comprising a
支撑板7上表面与支架5底面之间设置有支撑组件9,支撑组件9包括底杆901和支杆902,支杆902顶端滑动连接于底杆901内部,支杆902顶端与底杆901内部之间固定连接有弹簧13,弹簧13设置为压缩弹簧,底杆901顶端固定连接于支架5底面,支杆902底端与支撑板7上表面固定连接,底杆901内壁对称开设有第一滑槽14,支杆902顶端固定安装有第一滑块15,第一滑块15与第一滑槽14滑动间隙配合;A
通过支架5底面与支撑板7之间设置的支撑组件9对测试探头8形成支撑力,支撑组件9与测试探头8匹配设置,电动推杆6带动测试探头8下压的时候不易产生晃动,使得测试探头8与芯片表面的触点贴合时性能较为稳定,检测数据更加准确,提高了芯片检测的效果;The
工作台1上表面对称设置有两组夹板10,工作台1上两侧对称开设有第二滑槽16,夹板10底面固定安装有第二滑块17,第二滑块17与第二滑槽16滑动间隙配合,工作台1上两侧对称螺纹连接有螺杆18,螺杆18一端贯穿延伸至第二滑槽16内部与第二滑块17一侧转动连接;Two sets of
螺杆18一端固定连接有手轮19,两组对称设置的夹板10之间设置有托盘11,通过工作台1对需要检测的芯片进行放置,工作台1上方位置滑动设置有测试探头8,测试探头8滑动连接于顶板3底面电动滑台4的滑动平台上,通过电动推杆6带动测试探头8下压与芯片表面贴合进行测试,不易产生人工测试操作因为疲劳而出现漏检与错检的情况,提高芯片的检测效率;One end of the
测试探头8与托盘11匹配设置,测试探头8设置于托盘11上方位置,托盘11上内部开设有放置槽12,通过放置槽12对需要检测的芯片进行放置。The
尽管已经示出和描述了本实用新型的实施例,对于本领域的普通技术人员而言,可以理解在不脱离本实用新型的原理和精神的情况下可以对这些实施例进行多种变化、修改、替换和变型,本实用新型的范围由所附权利要求及其等同物限定。Although the embodiments of the present invention have been shown and described, it will be understood by those skilled in the art that various changes and modifications can be made to these embodiments without departing from the principles and spirit of the present invention , alternatives and modifications, the scope of the present invention is defined by the appended claims and their equivalents.
Claims (7)
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