CN217332563U

CN217332563U - Hardening treatment jig for wafer test needle

Info

Publication number: CN217332563U
Application number: CN202220626581.XU
Authority: CN
Inventors: 罗强
Original assignee: Hubei Xizhiyi Electronic Technology Co ltd
Current assignee: Hubei Xizhiyi Electronic Technology Co ltd
Priority date: 2022-03-22
Filing date: 2022-03-22
Publication date: 2022-08-30
Anticipated expiration: 2032-03-22

Abstract

The utility model provides a hardening treatment jig for wafer test needles, which comprises an upper clamping plate, a lower clamping plate, fixing pieces and fastening pieces, wherein a plurality of fixing pieces are arranged between the upper clamping plate and the lower clamping plate, the fastening pieces are used for fixing the positions between the upper clamping plate, the fixing pieces and the lower clamping plate, before hardening treatment is carried out on the wafer test needles, the lower clamping plate is placed on an operation table, the fixing pieces are placed on the surface of the lower clamping plate, the wafer test needles are sequentially placed in the fixing pieces, a plurality of fixing pieces full of the wafer test needles are sequentially stacked, the upper clamping plate is covered, the positions of the upper clamping plate, a plurality of fixing pieces and the lower clamping plate are sequentially fixed by the fastening pieces, thereby limiting the positions of the wafer test needles, the utility model is placed in the hardening treatment device, the air in the utility model is evacuated through an exhaust groove, and then the wafer test needles can be hardened, in the hardening treatment process, the deformation occurrence rate of the wafer test needle can be greatly reduced, and the qualification rate of the wafer test needle can be effectively improved.

Description

Hardening treatment jig for wafer test needle

Technical Field

The utility model relates to a sclerosis treatment tool technical field particularly, relates to a wafer test needle is with sclerosis treatment tool.

Background

At present, when an existing wafer test needle is processed, beryllium copper is adopted as a raw material for prolonging the service life of the wafer test needle, but the beryllium copper is adopted as the raw material, and the problem that hardening treatment needs to be carried out on the beryllium copper in the processing process is that the conventional hardening treatment mode is as follows: the wafer test needles are directly placed into the hardening treatment device for hardening treatment, and when the method is adopted for treatment, the wafer test needles are easy to deform, so that the qualification rate of the wafer test needles is reduced.

SUMMERY OF THE UTILITY MODEL

In order to compensate above not enough, the utility model provides a wafer test is hardening treatment tool for needle aims at solving among the prior art when hardening treatment is carried out wafer test needle and takes place deformation easily to lead to the problem that wafer test needle qualification rate is low.

In order to realize the technical scheme, the utility model discloses a realize like this:

the utility model provides a wafer test needle is with sclerosis treatment tool, includes punch holder, lower plate, mounting and fastener, the punch holder with be provided with a plurality ofly between the lower plate the mounting, the fastener is used for fixing the punch holder the mounting with position between the lower plate.

The utility model discloses an in one embodiment, the mounting includes the fixed block, the mounting groove has been seted up to surface one side of fixed block, the bottom of mounting groove is provided with the stopper that the equidistance distributes, arbitrary adjacent two form a standing groove that is used for placing the wafer test needle between the stopper.

In an embodiment of the present invention, an exhaust groove is formed on one side of the fixing block.

In an embodiment of the present invention, the height of the surface of the limiting block is equal to the height of the surface of the fixing block.

In an embodiment of the present invention, the fastening member includes a bolt and a nut, and one end of the bolt sequentially penetrates through the upper plate, the fixing member and the lower plate and the nut are connected by screw thread.

In an embodiment of the present invention, the upper plate, the fixing member and the lower plate have a through groove formed on the surface thereof, and the through groove is adapted to the bolt.

In an embodiment of the present invention, the fixing member and the wafer testing pin are made of the same material.

The utility model has the advantages that: before carrying out the sclerosis to wafer test needle, place the lower plate on the operation panel, put the surface at the lower plate with the mounting, put into the standing groove with wafer test needle in proper order inside, stack a plurality of mountings of putting full wafer test needle in proper order, cover the punch holder, adopt the bolt to loop through the punch holder, the logical groove on a plurality of mountings and lower plate surface, the punch holder is fixed to the rethread nut, the position of a plurality of mountings and lower plate, will the utility model discloses inside putting into the sclerosis processing apparatus, will through the air discharge duct the utility model discloses inside air is managed to find time, can carry out the sclerosis to wafer test needle afterwards, and in the sclerosis processing process, the deformation incidence of wafer test needle can be reduced greatly, can effectively improve the qualification rate of wafer test needle.

Drawings

In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings that are required to be used in the embodiments will be briefly described below, it should be understood that the following drawings only illustrate some embodiments of the present invention, and therefore should not be considered as limiting the scope, and for those skilled in the art, other related drawings can be obtained according to the drawings without inventive efforts.

Fig. 1 is a schematic structural view of a hardening jig for a wafer test pin according to an embodiment of the present invention;

fig. 2 is a front cross-sectional view of a hardening jig for a wafer test pin according to an embodiment of the present invention;

fig. 3 is an exploded view of a hardening jig for a wafer test pin according to an embodiment of the present invention;

fig. 4 is a schematic structural diagram of a fixing member according to an embodiment of the present invention;

fig. 5 is a schematic diagram illustrating placement of a wafer test pin during hardening treatment according to an embodiment of the present invention.

In the figure: 1-upper splint; 2-lower splint; 3-a fixing piece; 301-fixing block; 302-a mounting groove; 303-a limiting block; 304-placing a groove; 305-an exhaust tank; 4-a fastener; 401-bolt; 402-nut.

Detailed Description

The following detailed description of the embodiments of the present invention, presented in the accompanying drawings, is not intended to limit the scope of the invention, as claimed, but is merely representative of selected embodiments of the invention. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.

Examples

Referring to fig. 1-5, the present invention provides a technical solution:

the utility model provides a wafer test needle is with sclerosis treatment tool, includes punch holder 1, lower plate 2, mounting 3 and fastener 4, is provided with a plurality of mountings 3 between punch holder 1 and the lower plate 2, and fastener 4 is used for the position between fixed punch holder 1, mounting 3 and the lower plate 2.

Specifically, punch holder 1 and lower plate 2 are used for restricting the position of mounting 3, and mounting 3 is used for placing the wafer test needle, and the quantity of mounting 3 can set up according to actual conditions, the utility model discloses the quantity of the mounting 3 who adopts is 100, and wherein, the thickness of arbitrary mounting 3 is 1mm, and punch holder 1, lower plate 2 and mounting 3's shape is the ring shape, and the external diameter size of punch holder 1, lower plate 2 and mounting 3 all equals, and fastener 4 is used for fixed punch holder 1, lower plate 2 and a plurality of mounting 3's position.

In this embodiment, the fixing member 3 includes a fixing block 301, a mounting groove 302 is formed on one side of the surface of the fixing block 301, the bottom of the mounting groove 302 is provided with limiting blocks 303 distributed at equal intervals, and a placing groove 304 for placing a wafer test pin is formed between any two adjacent limiting blocks 303.

Specifically, the mounting groove 302 is used for mounting the limiting blocks 303, in this embodiment, the limiting blocks 303 are isosceles trapezoids in shape, and a plurality of wafer test pins can be placed in the placing groove 304 formed between any two adjacent limiting blocks 303.

In this embodiment, an air discharge groove 305 is formed on one side of the fixing block 301.

Specifically, at the in-process that carries out the sclerosis to wafer test needle, need keep the inside vacuum state that is of sclerosis processing apparatus, exhaust duct 305 is used for managing to find time the inside air of mounting groove 302, avoids carrying out the in-process that hardens to wafer test needle, the utility model discloses inside still remains there is the air, influences the sclerosis and handles the effect.

In this embodiment, the height of the surface of the limiting block 303 is equal to the height of the surface of the fixing block 301.

Specifically, the height of the surface of the limiting block 303 is equal to the height of the surface of the fixing block 301, so that the fixing blocks 301 can be stacked.

In this embodiment, the fastening member 4 includes a bolt 401 and a nut 402, and one end of the bolt 401 penetrates through the upper clamping plate 1, the fixing member 3 and the lower clamping plate 2 in sequence to be in threaded connection with the nut 402.

Specifically, through adjusting nut 402 in the position on bolt 401 surface, can fix the mounting 3 of different quantity, easy operation is convenient for the utility model discloses an installation and dismantlement.

In this embodiment, the surface of punch holder 1, mounting 3 and lower plate 2 all offers the logical groove with bolt 401 looks adaptation.

In the present embodiment, the fixing member 3 and the wafer test pin are made of the same material.

Specifically, in the actual operation process, the upper clamp plate 1, the fixing piece 3, the lower clamp plate 2 and the wafer test needles are all made of the same material, so that the phenomenon that the wafer test needles are locally discolored in the hardening treatment process of the wafer test needles is avoided.

Specifically, this wafer test needle is with theory of operation of sclerosis treatment tool: when using this device, place lower plate 2 on the operation panel, put mounting 3 on the surface of lower plate 2, put into placing groove 304 with the wafer test needle in proper order inside, stack a plurality of mounting 3 of putting the wafer test needle full in proper order, cover punch holder 1, adopt bolt 401 to loop through punch holder 1, the logical groove on a plurality of mountings 3 and lower plate 2 surfaces, the fixed punch holder 1 of rethread nut 402, the position of a plurality of mountings 3 and lower plate 2, will the utility model discloses inside putting into the sclerosis treatment device, will through exhaust duct 305 the utility model discloses inside air is managed to find time, can carry out sclerosis treatment to the wafer test needle afterwards can.

The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention, and various modifications and changes may be made by those skilled in the art. Any modification, equivalent replacement, or improvement made within the spirit and principle of the present invention should be included in the protection scope of the present invention.

Claims

1. The utility model provides a wafer test needle is with sclerosis treatment tool, includes punch holder (1), lower plate (2), mounting (3) and fastener (4), its characterized in that: the clamp is characterized in that a plurality of fixing pieces (3) are arranged between the upper clamp plate (1) and the lower clamp plate (2), and the fastening pieces (4) are used for fixing the positions between the upper clamp plate (1), the fixing pieces (3) and the lower clamp plate (2).

2. The hardening jig for the wafer test pin according to claim 1, wherein: fixing piece (3) include fixed block (301), mounting groove (302) have been seted up to surface one side of fixed block (301), the bottom of mounting groove (302) is provided with stopper (303) that the equidistance distributes, arbitrary adjacent two form a standing groove (304) that are used for placing the wafer test needle between stopper (303).

3. The hardening jig for the wafer test pin according to claim 2, wherein: an exhaust groove (305) is formed in one side of the fixing block (301).

4. The hardening jig for the wafer test pin according to claim 2, wherein: the height of the surface of the limiting block (303) is equal to the height of the surface of the fixed block (301).

5. The hardening jig for the wafer test pin according to claim 1, wherein: the fastener (4) comprises a bolt (401) and a nut (402), and one end of the bolt (401) penetrates through the upper clamping plate (1), the fixing piece (3) and the lower clamping plate (2) in sequence and is in threaded connection with the nut (402).

6. The hardening jig for the wafer test pin according to claim 5, wherein: the upper clamp plate (1), the fixing piece (3) and the lower clamp plate (2) are all provided with through grooves matched with the bolts (401).

7. The hardening jig for the wafer test pin according to claim 1, wherein: the fixing piece (3) and the wafer test needle are made of the same material.