CN217332533U

CN217332533U - Multifunctional self-adaptive chip test fixture

Info

Publication number: CN217332533U
Application number: CN202220279387.9U
Authority: CN
Inventors: 王旭梅; 廉龙飞; 张璐; 张天明; 刘思江; 韩薇
Original assignee: Xi'an Peri Power Semiconductor Converting Technology Co ltd
Current assignee: Xi'an Peri Power Semiconductor Converting Technology Co ltd
Priority date: 2022-02-11
Filing date: 2022-02-11
Publication date: 2022-08-30
Anticipated expiration: 2032-02-11

Abstract

The utility model relates to a multi-functional self-adaptation chip test fixture, including following partial structure: the sliding rod is provided with a spring, the bottom of the sliding rod is inserted into the upper side of the insulating fixing block, 4 position marking lines are arranged on the side face of the insulating fixing block, a gate pole test pen penetrates through the lower end of the position marking line on the rightmost side of the insulating fixing block and is connected with a gate pole lead-out wire, a telescopic cathode test pen penetrates through the lower end of the position marking line on the leftmost side of the insulating fixing block and is connected with a cathode lead-out wire, the anode test board and the anode insulating bottom block are sequentially arranged between the bottom boards below the chips, and the anode lead-out wire is led out from the side face of the anode insulating bottom block. The utility model discloses the test pen is the integral type with the foundation block, and the back is looked for to the position, just can let anchor clamps fix the test pen, just so can guarantee the continuity of test. A large number of qualified chips can be rapidly screened, and the accuracy is improved due to the fact that the test points are fixed.

Description

Multifunctional self-adaptive chip test fixture

Technical Field

The utility model belongs to minority carrier lifetime test field relates to multi-functional self-adaptation chip test fixture, in particular to take test fixture of base.

Background

In the original test, the mode that the test pen is separated from the base is adopted, after the position is found in the operation process, the test pen needs to be fixed by hands, the test is interrupted due to the fact that the hands move occasionally, and the displayed numerical value is not the required test value.

SUMMERY OF THE UTILITY MODEL

In order to overcome the defect of the prior art, the utility model provides a multi-functional self-adaptation chip test fixture.

The technical solution of the utility model is that: a multifunctional self-adaptive chip test fixture comprises a bottom block, a clamping block, a stand column, a transverse column, a holding head, a sliding rod, a spring, a force adjusting stop block, an insulating fixing block, a position marking, a gate pole test pen, a gate pole lead-out wire, a cathode lead-out wire, a telescopic cathode test pen, an anode test board, an anode insulating bottom block and an anode lead-out wire, wherein the bottom block and the stand column are fixed through the clamping block, the transverse column is arranged at the top of the stand column, the sliding rod is arranged at one end of the transverse column, the holding head is arranged at the top end of the sliding rod, the spring is arranged on the sliding rod, the force adjusting stop block is arranged on the sliding rod at the bottom of the spring, the bottom of the sliding rod is inserted into the upper side of the insulating fixing block, 4 position markings are arranged on the side face of the insulating fixing block, the gate pole test pen penetrates through the lower end of the position marking at the rightmost side of the insulating fixing block, the gate pole lead-out wire is connected with the gate pole lead-out wire, the telescopic cathode test pen penetrates through the lower end of the position marking at the leftmost side of the insulating fixing block, the anode test board and the anode insulation bottom block are sequentially arranged between the bottom plates below the chips, and the anode lead-out wire is led out from the side face of the anode insulation bottom block.

The beneficial effects of the utility model are that: the utility model discloses the test pen is the integral type with the foundation block, and the back is looked for to the position, just can let anchor clamps fix the test pen, just so can guarantee the continuity of test. A large number of qualified chips can be rapidly screened, and the accuracy is improved due to the fact that the test points are fixed.

The utility model discloses the spring can strengthen the fixed of test pen.

Drawings

Fig. 1 is a schematic structural diagram of the present invention.

The notations in the figures are as follows:

1: a base; 2: a clamping block; 3: a nut; 4: a screw; 5: a nut; 6: a screw; 7: a column; 8: a nut; 9: a screw; 10: a cross post; 11: holding the head; 12: a slide bar; 13: a spring; 14: a force adjusting stop block; 15: fixing a nut; 16: insulating fixed blocks; 17: position marking; 18: a gate test pen; 19: a gate lead-out wire; 20: a cathode lead-out wire; 21: a retractable cathode test pen; 22: an anode test board; 23: an anode insulating bottom block; 24: and an anode lead-out wire.

Detailed Description

In order to more clearly illustrate the technical solution of the present invention, the present invention will be further described in detail with reference to the accompanying drawings. It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention.

The utility model provides a multi-functional self-adaptation chip test fixture, its structure is as shown in figure 1. The bottom block 1 and the upright post 7 are fixed by the clamp block 2, and the nut 3 and the screw rod 4 in the horizontal direction, and the nut 5 and the screw rod 6 in the vertical direction are arranged on the clamp block 2. And a nut 8 and a screw 9 are arranged above the joint of the cross column 10 and the upright column 7. The grip 11 is located at the top end of the slide rod 12. The spring 13 is sleeved on the sliding rod 12, the spring 13 is clamped by using a force adjusting stop 14, and the lower end position of the spring is fixed by using a fixing nut 15. The sliding rod 12 is inserted into the upper side of the insulation fixed block 16, and 4 position marked lines 17 are marked on the side surface of the insulation fixed block 16. The gate test pen 18 is penetrated through the lower end of the position marking line 17 on the rightmost side of the insulating fixed block 16, and a gate lead-out wire 19 is connected to the gate test pen. The telescopic cathode test pen 21 penetrates through the lower end of the leftmost position marking 17 of the insulating fixing block 16, and the cathode lead-out wire 20 is connected to the telescopic cathode test pen. The two-position reticle 17 can be adjusted according to the positions of the gate and the cathode of the chip. Through holes matched with the diameter of the test pen are formed in the position marked lines on the insulating fixing block 16 from top to bottom, the gate test pen 18 and the telescopic cathode test pen 21 can be combined at will, and the through holes or the two adjacent holes are inserted into two holes with larger intervals according to the size of a chip. An anode test board 22 and an anode insulating bottom block 23 are sequentially arranged below the chip and between the bottom boards. An anode lead wire 24 is led out from the side of the anode insulating bottom block.

The utility model discloses test fixture's concrete working process: according to the size of a chip, a gate pole test pen 18 and a telescopic cathode test pen 21 are inserted into two upper and lower through holes in an insulating fixed block 16, the distance between the gate pole test pen 18 and the telescopic cathode test pen 21 is within the distance between the edges of a gate pole and a cathode face, a holding head 11 is lifted, the chip is placed on an anode test board 22, in the process of lowering the holding head 11, the chip is moved to enable the pen point of the gate pole test pen 18 to be in contact with the gate pole of the chip, the pen point of the telescopic cathode test pen 21 is in contact with the cathode face, a test button is pressed, the holding head 11 is lifted after a result is obtained, the chip is taken out, the next chip is placed in, and the process is repeated until the test is finished.

Conclusion

According to actual assembly and test experiments, aiming at the multifunctional self-adaptive chip test fixture, the test method is reasonable and reliable, qualified products can be stably screened from a large number of chips, the multifunctional self-adaptive chip test fixture which is applied to the power semiconductor current transformation technology of the Sian Pi Rui company can quickly test and download the chips in the aspect of minority carrier lifetime, and a good effect is achieved.

Claims

1. Multi-functional self-adaptation chip test fixture, including end piece (1), clamp splice (2), stand (7), spreader (10), hold head (11), slide bar (12), spring (13), dynamics regulation dog (14), insulating fixed block (16), position marking (17), gate pole test pen (18), gate pole lead-out wire (19), cathode lead-out wire (20), scalable cathode test pen (21), positive pole test panel (22), positive pole insulating end piece (23), positive pole lead-out wire (24), its characterized in that: the bottom block (1) and the upright column (7) are fixed through the clamping block (2), the top of the upright column (7) is provided with a transverse column (10), one end of the transverse column (10) is provided with a sliding rod (12), the top end of the sliding rod (12) is provided with a holding head (11), the sliding rod (12) is provided with a spring (13), the bottom of the spring (13) is provided with a force adjusting stop block (14) on the sliding rod (12), the bottom of the sliding rod (12) is inserted into the upper side of an insulating fixed block (16), the side surface of the insulating fixed block (16) is provided with 4 position mark lines (17), a gate pole test pen (18) penetrates through the lower end of the rightmost position mark line (17) of the insulating fixed block (16), the gate pole lead-out wire (19) is connected to the gate pole test pen (21), the lower end of the leftmost position mark line (17) of the insulating fixed block (16) penetrates through the gate pole test pen, the gate pole lead-out wire (20) is connected to the gate pole test pen, and an anode test board (22), The anode insulating bottom blocks (23) are sequentially arranged between the bottom plates below the chips, and anode lead wires (24) are led out from the side faces of the anode insulating bottom blocks.