CN217332525U - Circuit board inspection clamp - Google Patents
Circuit board inspection clamp Download PDFInfo
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- CN217332525U CN217332525U CN202123417238.9U CN202123417238U CN217332525U CN 217332525 U CN217332525 U CN 217332525U CN 202123417238 U CN202123417238 U CN 202123417238U CN 217332525 U CN217332525 U CN 217332525U
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- plate
- hole
- diameter portion
- inspection
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Abstract
A circuit board inspection clamp is helpful to avoid the influence of probe clamping and bending on inspection operation. The utility model discloses a circuit board inspection clamp, which comprises an inspection side supporting body, a plurality of inspection side supporting bodies and a plurality of inspection side supporting bodies, wherein the inspection side supporting body is provided with a bearing surface for bearing an inspection object and a plurality of boards which are stacked in a manner that the board thickness direction is vertical to the bearing surface; and a probe which has flexibility and protrudes from the receiving surface by sequentially passing through holes provided in the plurality of plates and overlapping in a plate thickness direction from a side opposite to the receiving surface, wherein the plurality of plates include a first plate, a second plate, and an intermediate plate, the first plate and the second plate are respectively in contact with the intermediate plate from both sides in the plate thickness direction, a hole diameter of a portion of each of the through holes of the first plate and the second plate on the intermediate plate side is larger than a hole diameter of a portion of each of the through holes of the first plate and the second plate on the intermediate plate side, and a minimum hole diameter of the through holes of the intermediate plate is smaller than a hole diameter of a portion of each of the through holes of the first plate and the second plate on the intermediate plate side.
Description
Technical Field
The present invention relates to a circuit board inspection jig, and more particularly to a circuit board inspection jig for electrically inspecting an inspection object such as a circuit board.
Background
Conventionally, when an inspection object such as a circuit board is subjected to an electrical inspection such as a short circuit or a disconnection, a circuit board inspection jig having a plurality of linear probes is often used in an inspection apparatus.
The circuit board inspection jig generally includes an inspection side support body having a receiving surface for receiving an inspection object and having a plurality of boards stacked so that a board thickness direction is perpendicular to the receiving surface; and a flexible probe that protrudes from the receiving surface through-holes provided in the plurality of plates, the through-holes penetrating in the plate thickness direction and overlapping, in this order from the side opposite to the receiving surface (see, for example, patent document 1).
Patent document 1: chinese publication No. CN109613307A
In addition, in the above-mentioned circuit board inspection jig, the following structure is also adopted: the plurality of plates of the inspection side support body include a first plate and a second plate that is farther from the receiving surface than the first plate, and the through hole of the first plate has a larger hole diameter at a portion closer to the second plate than at a portion farther from the second plate, and the through hole of the second plate has a larger hole diameter at a portion closer to the first plate than at a portion farther from the first plate, thereby contributing to ensuring the accuracy of contact between the tip of the probe and the inspection point of the inspection target.
However, when the circuit board inspection jig is used for inspection, the probe pins are sometimes stuck or bent, which affects the inspection operation.
SUMMERY OF THE UTILITY MODEL
The utility model relates to a accomplish in view of above-mentioned problem, its aim at provides circuit board inspection anchor clamps, helps avoiding influencing the inspection operation because of card needle, looper appear in the probe.
In order to achieve the above object, the present invention provides a circuit board inspection jig, comprising an inspection side support body having a receiving surface for receiving an inspection object and having a plurality of plates stacked in such a manner that a plate thickness direction is perpendicular to the receiving surface; and a probe that has flexibility and protrudes from the receiving surface from a side opposite to the receiving surface by sequentially passing through holes that are provided in the plurality of plates and that penetrate and overlap in the plate thickness direction, wherein the plurality of plates include a first plate, a second plate, and an intermediate plate, the first plate and the second plate are respectively in contact with the intermediate plate from both sides in the plate thickness direction, a hole diameter of a portion of each of the through holes of the first plate and the second plate that is closer to the intermediate plate side is larger than a hole diameter of a portion of each of the through holes of the first plate and the second plate that is farther from the intermediate plate side, and a minimum hole diameter of the through holes of the intermediate plate is smaller than a hole diameter of a portion of each of the through holes of the first plate and the second plate that is closer to the intermediate plate side.
According to the present invention, since the circuit board inspection jig of the present invention is a circuit board inspection jig in which a plurality of boards include a first board, a second board and an intermediate board, the first board and the second board are respectively abutted against the intermediate board from both sides in the board thickness direction, the hole diameter of the portion of each through-hole of the first board and the second board close to the intermediate board is larger than the hole diameter of the portion of each through-hole of the intermediate board far from the intermediate board, and the minimum hole diameter of the through-hole of the intermediate board is smaller than the hole diameter of the portion of each through-hole of the first board and the second board close to the intermediate board, the probe can smoothly slide in each through-hole of the plurality of boards including the first board and the second board in the inspection work when the end portion of the probe protruding from the receiving surface is brought into contact with the inspection point of the inspection object, as compared with the conventional circuit board inspection jig not having the intermediate board, and it is helpful to suppress the probe from being in contact with the portion of the first board in which the hole of the first board is larger in the hole and the second board The needle clamping and the needle bending are caused by the action in a larger space, which is beneficial to inhibiting the influence of the needle clamping and the needle bending on the inspection operation.
In the circuit board inspection jig of the present invention, it is preferable that the first plate has the receiving surface.
Further, in the board inspection jig of the present invention, it is preferable that the minimum hole diameter of the through hole of the intermediate plate is equal to or larger than the minimum hole diameter of the through hole of each of the first plate and the second plate.
According to the utility model discloses a circuit board inspection anchor clamps, the minimum aperture of the through-hole of intermediate lamella is more than the minimum aperture of the respective through-hole of first board and second board, consequently, helps avoiding influencing the motion of probe when the pressurized in the inspection operation because of the aperture undersize of the through-hole of intermediate lamella.
Furthermore, in the circuit board inspection jig of the present invention, it is preferable that the through hole of the first plate is constituted by a first small diameter portion and an aperture ratio the first small diameter portion is larger and smaller than the first small diameter portion is away from the first large diameter portion of the receiving surface, and the through hole of the second plate is constituted by a second small diameter portion and an aperture ratio the second small diameter portion is larger and smaller than the second small diameter portion is close to the second large diameter portion of the receiving surface.
In the circuit board inspection jig of the present invention, it is preferable that the first small diameter portion, the first large diameter portion, the second small diameter portion, and the second large diameter portion are circular holes each having a constant diameter in the board thickness direction.
Further, in the circuit board inspection jig of the present invention, it is preferable that the through hole of the intermediate plate has a diameter corresponding to a diameter of the first small diameter portion or the second small diameter portion.
According to the utility model discloses a circuit board inspection anchor clamps, the aperture of the through-hole of intermediate plate is unanimous with the aperture of first minor diameter portion or second minor diameter portion, consequently, helps avoiding more reliably influencing the inspection operation because of card needle, looper appear in the probe, and avoids influencing the motion of probe when the pressurized in the inspection operation because of the aperture undersize of the through-hole of intermediate plate.
Further, in the circuit board inspection jig of the present invention, it is preferable that the first small diameter portion has a diameter corresponding to a diameter of the second small diameter portion, and the first large diameter portion has a diameter corresponding to a diameter of the second large diameter portion.
In the board inspection jig of the present invention, it is preferable that the thickness of the intermediate plate is smaller than the thickness of the first plate and smaller than the thickness of the second plate. For example, the thickness of the intermediate plate is 1/5 or less of the thickness of the first plate or the second plate.
According to the utility model discloses a circuit board inspection jig, the thick board of intermediate plate is less than the respective thick board of first board and second board, therefore, helps guaranteeing the motion range of control probe, and is difficult for influencing the volume that the probe is outstanding from accepting the face.
In the circuit board inspection jig of the present invention, it is preferable that the through hole of the intermediate plate has a constant diameter in the plate thickness direction.
Furthermore, the utility model discloses an among the circuit board inspection jig, preferably still include: an electrode side support body provided on a side of the inspection side support body opposite to the receiving surface and spaced apart from the inspection side support body in the plate thickness direction; and a connecting member that connects the inspection side support and the electrode side support, the probe extending from the electrode side support to the inspection side support.
(effects of utility model)
According to the present invention, since the plurality of plates include the first plate, the second plate, and the intermediate plate, the first plate and the second plate are respectively abutted against the intermediate plate from both sides in the plate thickness direction, the hole diameter of the portion of the through-hole of each of the first plate and the second plate close to the intermediate plate is larger than the hole diameter of the portion of the through-hole of each of the first plate and the second plate close to the intermediate plate, and the minimum hole diameter of the through-hole of the intermediate plate is smaller than the hole diameter of the portion of the through-hole of each of the first plate and the second plate close to the intermediate plate, the probe can smoothly slide in each of the through-holes of the plurality of plates including the second plate of the first plate in the inspection work, and when the end portion of the probe protruding from the receiving surface is brought into contact with the inspection point of the inspection object by using the receiving surface of the support body of the inspection side, as compared with a conventional board inspection jig not having the intermediate plate, the probe can be suppressed from operating in a large space formed by the portion of the large hole diameter of the through-hole of the first plate and the large diameter portion of the through-hole of the second plate The occurrence of needle blocking and needle bending is helpful to inhibit the influence of the needle blocking and the needle bending on the inspection operation.
Drawings
Fig. 1 is a schematic diagram showing an overall configuration of an inspection apparatus including a board inspection jig according to an embodiment of the present invention.
Fig. 2 is a diagram schematically showing a circuit board inspection jig according to an embodiment of the present invention.
Fig. 3 is a partially enlarged view of fig. 2.
(symbol description)
1 inspection device
100 circuit board inspection clamp
10 inspection side support
11 first plate
111 first small diameter part
112 first large diameter part
12 second plate
121 second minor diameter portion
122 second large diameter part
13 middle plate
20 electrode side supporter
30 connecting member
40 Probe
50 electrode mounting part
200 moving mechanism
201 clamp mounting part
300 clamping mechanism
400 control part
500 display part
RP receiving surface
PL plate
TH through hole
OB object of examination
Detailed Description
Next, an inspection device having a circuit board inspection jig according to an embodiment of the present invention will be described with reference to fig. 1 to 3, in which fig. 1 is a schematic overall view of the inspection device having the circuit board inspection jig according to the embodiment of the present invention, fig. 2 is a schematic view of the circuit board inspection jig according to the embodiment of the present invention, and fig. 3 is a partial enlarged view of fig. 2.
(Overall Structure of inspection apparatus)
As shown in fig. 1, the inspection apparatus 1 includes: a circuit board inspection jig 100; a moving mechanism 200 for moving the circuit board inspection jig 100, the moving mechanism 200 having a jig mounting portion 201, the jig mounting portion 201 being used for mounting the circuit board inspection jig 100 (specifically, supporting the electrode mounting portion 50 of the circuit board inspection jig 100 described below); a conveying mechanism (not shown) for conveying an inspection object OB such as a circuit board; a clamping mechanism 300 that clamps the object OB to be inspected so that the object OB can be inspected; a control unit 400, the control unit 400 controlling the moving mechanism 200, the conveying mechanism, and the gripping mechanism 300; and a display unit 500, the display unit 500 displaying the result of the examination object OB.
Here, as shown in fig. 1, the board inspection jig 100 and the moving mechanism 200 are provided in a pair in the vertical direction, but the present invention is not limited to this, and one board inspection jig 100 and one moving mechanism 200 may be provided.
(Structure of Wiring Board inspection jig)
As shown in fig. 2 and 3, the wiring board inspection jig 100 includes an inspection side support body 10, the inspection side support body 10 having a receiving surface RP for receiving an inspection object OB and having a plurality of plates PL stacked so as to be perpendicular to the receiving surface in a plate thickness direction (coinciding with the vertical direction in fig. 2); and a probe pin 40 (only one is schematically shown in the drawing, but a plurality of probe pins are actually present), the probe pin 40 having flexibility and protruding from the receiving surface RP sequentially through holes TH provided in the plurality of plates PL and penetrating and overlapping in the plate thickness direction from the side (lower side in fig. 2) opposite to the receiving surface RP. As shown in fig. 2 and 3, the plurality of plates PL include a first plate 11, a second plate 12, and an intermediate plate 13, the first plate 11 and the second plate 12 are respectively in contact with the intermediate plate 13 from both sides in the plate thickness direction, the hole diameter of the through hole TH of each of the first plate 11 and the second plate 12 on the side close to the intermediate plate 13 is larger than the hole diameter of the through hole TH of the other of the first plate 11 and the second plate 12 on the side far from the intermediate plate 13, and the minimum hole diameter of the through hole TH of the intermediate plate 13 is smaller than the hole diameter of the through hole TH of each of the first plate 11 and the second plate 12 on the side close to the intermediate plate 13.
Here, as shown in fig. 2 and 3, the plurality of plates PL includes only the first plate 11, the second plate 12, and the intermediate plate 13. The first plate 11 has a receiving surface RP, and the second plate 12 is disposed on the opposite side of the first plate 11 from the receiving surface RP. The first plate 11, the second plate 12, and the intermediate plate 13 are formed in a rectangular shape having the same outer shape when viewed in the thickness direction thereof.
As shown in fig. 2 and 3, the through hole TH of the first plate 11 is composed of a first small diameter portion 111 and a first large diameter portion 112 having a larger diameter than the first small diameter portion 111 and being farther from the receiving surface RP than the first small diameter portion 111, and the through hole TH of the second plate 12 is composed of a second small diameter portion 121 and a second large diameter portion 122 having a larger diameter than the second small diameter portion 121 and being closer to the receiving surface RP than the second small diameter portion 121. The first small diameter portion 111, the first large diameter portion 112, the second small diameter portion 121, and the second large diameter portion 122 are circular holes each having a constant diameter in the plate thickness direction. As shown in fig. 2 and 3, the diameter of the first small diameter portion 111 coincides with the diameter of the second small diameter portion 121, and the diameter of the first large diameter portion 112 coincides with the diameter of the second large diameter portion 122.
Further, as shown in fig. 2 and 3, the hole diameter of the through hole TH of the intermediate plate 13 is constant in the plate thickness direction. As shown in fig. 2 and 3, the hole diameter of the through hole TH of the intermediate plate 13 coincides with the hole diameter of the first small diameter portion 111 and the hole diameter of the second small diameter portion 121. As shown in fig. 2 and 3, the thickness of the intermediate plate 13 is smaller than the thicknesses of the first plate 11 and the second plate 12. For example, the plate thickness of the intermediate plate 13 is 1/5 or less of the plate thickness of each of the first plate 11 and the second plate 12.
Further, as shown in fig. 2 and 3, the board inspection jig 100 further includes: an electrode side support body 20, which is provided on the side of the inspection side support body 10 opposite to the receiving surface RP, and which is spaced from the inspection side support body 20 in the plate thickness direction; and a connecting member 30, wherein the connecting member 30 connects the inspection side support 10 and the electrode side support 20, and the probe 40 extends from the electrode side support 20 to the inspection side support 10.
As shown in fig. 2 and 3, the electrode-side support 20 also includes a plurality of plates stacked so that the plate thickness direction is perpendicular to the support surface RP, and each plate has a through hole through which the probe pin 40 passes.
As shown in fig. 2 and 3, two connecting members 30 are provided at intervals in a direction perpendicular to the plate thickness direction (the left-right direction in fig. 2), and the connecting members 30 may be formed in a plate shape, a columnar shape, or the like, and are preferably provided in the vicinity of the edge of the inspection side support 10 as viewed in the plate thickness direction.
As shown in fig. 2 and 3, one end (lower end in fig. 2) of the probe 40 is connected to an electrode (not shown), and the other end (upper end in fig. 2) of the probe 40 is used to contact a check point of the inspection object OB.
As shown in fig. 2 and 3, the board inspection jig 100 is connected to the jig mounting portion 201 of the inspection apparatus 1 via the electrode mounting portion 50 provided on the side of the electrode side support body 20 opposite to the receiving surface RP.
(main technical effects of the present embodiment)
According to the inspection apparatus 1 of the present embodiment, in the inspection side support body 10 of the board inspection jig 100, the plurality of boards PL includes the first board 11, the second board 12, and the intermediate board 13, the first board 11 and the second board 12 are respectively in contact with the intermediate board 13 from both sides in the board thickness direction, the hole diameter of the portion of the through hole TH of each of the first board 11 and the second board 12 close to the intermediate board 13 is larger than the hole diameter of the portion far from the intermediate board 13, and the minimum hole diameter of the through hole TH of the intermediate board 13 is smaller than the hole diameter of the portion of the through hole TH of each of the first board 11 and the second board 12 close to the intermediate board 13, so that the probe pin 40 can receive the inspection object OB by the receiving surface RP of the inspection side support body 10 during the inspection work and can make the end portion of the probe pin 40 protruding from the receiving surface RP contact the inspection point of the inspection object OB, in comparison with the conventional board inspection jig without the intermediate board 13, the probe pin 40 can receive the inspection object OB by the receiving surface of the receiving surface RP of the first board 10 including the second board 12 of the first board 11 The smooth sliding of the probe pins helps to prevent the probe pins 40 from being stuck or bent in a large space formed by a portion of the first plate 11 where the through holes TH have a large diameter and a portion of the second plate 12 where the through holes TH have a large diameter, and helps to prevent the sticking or bending from affecting the inspection operation.
The present invention has been described above by way of example with reference to the accompanying drawings, and it is to be understood that the specific implementations of the present invention are not limited to the above-described embodiments.
For example, in the above embodiment, the plurality of plates PL includes only the first plate 11, the second plate 12, and the intermediate plate 13, but is not limited thereto, and the plurality of plates PL may include other plates.
In the above embodiment, the through hole TH of the first plate 11 is formed by the first small diameter portion 111 and the first large diameter portion 112, the through hole TH of the second plate 12 is formed by the second small diameter portion 121 and the second large diameter portion 122, and the diameters of the first small diameter portion 111, the first large diameter portion 112, the second small diameter portion 121, and the second large diameter portion 122 are constant in the plate thickness direction, the diameter of the first small diameter portion 111 is equal to the diameter of the second small diameter portion 121, and the diameter of the first large diameter portion 112 is equal to the diameter of the second large diameter portion 122, but the invention is not limited thereto, and the diameters of the first small diameter portion 111, the first large diameter portion 112, the second small diameter portion 121, and the second large diameter portion 122 may be changed in the plate thickness direction, the diameter of the first small diameter portion 111 may be different from the diameter of the second small diameter portion 121, and the diameter of the first large diameter portion 112 may be different from the diameter of the second large diameter portion 122.
In the above embodiment, the hole diameter of the through hole TH of the intermediate plate 13 is constant in the plate thickness direction, and the hole diameter of the through hole TH of the intermediate plate 13 is equal to the hole diameter of the first small diameter portion 111 and equal to the hole diameter of the second small diameter portion 121, but the present invention is not limited thereto, and the hole diameter of the through hole TH of the intermediate plate 13 may be changed in the plate thickness direction, and the hole diameter of the through hole TH of the intermediate plate 13 may be different from the hole diameters of the first small diameter portion 111 and the second small diameter portion 121.
In the above embodiment, the shapes of the through holes TH of the first plate 11, the second plate 12, and the intermediate plate 13 when viewed in the plate thickness direction may be changed as necessary.
In the above embodiment, the first plate 11, the second plate 12, and the intermediate plate 13 are each rectangular when viewed in the plate thickness direction, but the present invention is not limited thereto, and may be formed in other shapes.
In the above embodiment, the first plate 11, the second plate 12, and the intermediate plate 13 have the same outer dimensions when viewed in the plate thickness direction, but the present invention is not limited thereto, and the first plate 11, the second plate 12, and the intermediate plate 13 may have different outer dimensions when viewed in the plate thickness direction.
In the above embodiment, the material of the intermediate plate 13 is not particularly limited, but is preferably a flexible material.
In the above embodiment, the thickness of the intermediate plate 13 is not particularly limited, but is preferably much smaller than the thicknesses of the first plate 11 and the second plate 12.
In the above embodiment, the electrode side support 20 is spaced apart from the inspection side support 20 in the plate thickness direction, but the present invention is not limited to this, and the electrode side support 20 may abut against the inspection side support 20 in the plate thickness direction.
It should be understood that the present invention can freely combine the respective components of the embodiments or appropriately modify and omit the respective components of the embodiments within the scope thereof.
Claims (10)
1. A circuit board inspection jig includes an inspection side support body having a receiving surface for receiving an inspection object and having a plurality of plates stacked so that a plate thickness direction is perpendicular to the receiving surface; and a probe which has flexibility and protrudes from the receiving surface through-holes provided in the plurality of plates and penetrating and overlapping in the plate thickness direction in order from a side opposite to the receiving surface,
the plurality of plates includes a first plate, a second plate and an intermediate plate,
the first plate and the second plate are respectively abutted against the intermediate plate from both sides in the plate thickness direction,
the aperture of a portion of the through-hole of each of the first plate and the second plate on the side closer to the intermediate plate is larger than the aperture of a portion on the side farther from the intermediate plate,
the minimum aperture of the through hole of the intermediate plate is smaller than the aperture of a portion of the through hole of each of the first plate and the second plate on the side closer to the intermediate plate.
2. The board inspection jig according to claim 1,
the first plate has the receiving surface.
3. The board inspection jig according to claim 1,
the minimum aperture of the through-hole of the intermediate plate is equal to or larger than the minimum aperture of the through-hole of each of the first plate and the second plate.
4. The board inspection jig according to claim 1,
the through hole of the first plate is composed of a first small diameter part and a first large diameter part which is larger than the first small diameter part and is far away from the bearing surface than the first small diameter part,
the through hole of the second plate is composed of a second small diameter portion and a second large diameter portion which is larger than the second small diameter portion and is closer to the bearing surface than the second small diameter portion.
5. The board inspection jig according to claim 4,
the first small diameter portion, the first large diameter portion, the second small diameter portion, and the second large diameter portion are circular holes each having a constant diameter in the plate thickness direction.
6. The board inspection jig according to claim 5,
the first small diameter portion has a diameter corresponding to the diameter of the second small diameter portion,
the first large diameter portion has a diameter that is the same as the diameter of the second large diameter portion,
the aperture of the through hole of the intermediate plate is consistent with the apertures of the first small diameter portion and the second small diameter portion.
7. The board inspection jig according to claim 1,
the intermediate plate has a plate thickness smaller than that of the first plate and smaller than that of the second plate.
8. The board inspection jig according to claim 7,
the intermediate plate has a plate thickness of 1/5 or less of the plate thickness of the first plate or the second plate.
9. The board inspection jig according to claim 1,
the hole diameter of the through hole of the intermediate plate is constant in the plate thickness direction.
10. The board inspection jig of claim 1, further comprising:
an electrode side support body provided on a side of the inspection side support body opposite to the receiving surface and spaced apart from the inspection side support body in the plate thickness direction; and
a connecting member connecting the inspection side support and the electrode side support,
the probe extends from the electrode side support to the inspection side support.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202123417238.9U CN217332525U (en) | 2021-12-31 | 2021-12-31 | Circuit board inspection clamp |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202123417238.9U CN217332525U (en) | 2021-12-31 | 2021-12-31 | Circuit board inspection clamp |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN217332525U true CN217332525U (en) | 2022-08-30 |
Family
ID=82990638
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202123417238.9U Active CN217332525U (en) | 2021-12-31 | 2021-12-31 | Circuit board inspection clamp |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN217332525U (en) |
-
2021
- 2021-12-31 CN CN202123417238.9U patent/CN217332525U/en active Active
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| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CP01 | Change in the name or title of a patent holder |
Address after: 314200 west side of Building 1, No. 550, Fanrong Road, Pinghu Economic Development Zone, Jiaxing City, Zhejiang Province Patentee after: NEDECO Precision Testing Equipment (Zhejiang) Co.,Ltd. Address before: 314200 west side of Building 1, No. 550, Fanrong Road, Pinghu Economic Development Zone, Jiaxing City, Zhejiang Province Patentee before: NIDEC-READ MACHINE APPARATUS (ZHEJIANG) CO.,LTD. |
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| CP01 | Change in the name or title of a patent holder |