CN217305412U

CN217305412U - LD laser chip test equipment

Info

Publication number: CN217305412U
Application number: CN202123451862.0U
Authority: CN
Inventors: 蔡志宏; 张文; 杨劲华
Original assignee: Wuhan Xinquantong Technology Co ltd
Current assignee: Wuhan Xinquantong Technology Co ltd
Priority date: 2021-12-31
Filing date: 2021-12-31
Publication date: 2022-08-26
Anticipated expiration: 2031-12-31

Abstract

The utility model discloses a LD laser chip test equipment, include bottom plate, carousel, support and install accredited testing organization on the support, the carousel passes through the transmission shaft and installs on the bottom plate, be equipped with drive carousel pivoted driving piece on the bottom plate, the recess has on the carousel, be connected with the depression bar through the free bearing on the carousel, logical groove has on the depression bar, be equipped with on the carousel and act on logical groove, make depression bar pivoted power spare. In this application, the groove is arranged in to the chip, promotes the in-process that the go-between moved in vertical direction at electric putter, and the removal round pin slides logical inslot portion, and the depression bar drives the briquetting and compresses tightly fixedly to the chip, at driving piece drive carousel pivoted in-process, and accredited testing organization detects the chip, compares the testing arrangement among the prior art, can avoid taking place the drunkenness among the chip test procedure, and stability is higher.

Description

LD laser chip test equipment

Technical Field

The utility model relates to a chip test technical field especially relates to a LD laser chip test equipment.

Background

For the test in the chip of being convenient for, the semiconductor laser chip testing arrangement of application number 202120395929.4 has been disclosed among the prior art, through adding at the lower extreme of tester and establishing telescopic cylinder, telescopic link and test wheel isotructure for when testing the chip, can make and to omit the telescoping device through the slip between chip and the test wheel, thereby can reduce the time that the flexible process is wasted, improve efficiency of software testing.

However, the testing device is lack of a tool for fixing the chip, and when the chip is in contact with the testing wheel, the chip moves and is poor in stability, so that the testing device for the semiconductor laser chip is provided.

SUMMERY OF THE UTILITY MODEL

The utility model aims to provide a: in order to solve the above problems, an LD laser chip testing apparatus is proposed.

In order to achieve the above purpose, the utility model adopts the following technical scheme:

the utility model provides a LD laser chip test equipment, includes bottom plate, carousel, support and installs accredited testing organization on the support, the carousel passes through the transmission shaft and installs on the bottom plate, be equipped with drive turntable pivoted driving piece on the bottom plate, the recess has on the carousel, be connected with the depression bar through the free bearing on the carousel, logical groove has on the depression bar, be equipped with on the carousel and act on logical groove, make depression bar pivoted power spare.

Preferably, the driving part comprises a first belt pulley installed at the bottom of the transmission shaft, the bottom plate is provided with a motor, a second belt pulley is installed at the output end of the motor, and the first belt pulley and the second belt pulley are connected through a transmission belt.

Preferably, the power part comprises a moving rod penetrating through the rotary table, a moving pin penetrating through the through groove is formed on the moving rod, the moving rods are fixed through a connecting ring, and an electric push rod connected with the connecting ring is mounted on the rotary table.

Preferably, a pressing block is fixed at the end part of the pressing rod.

Preferably, the pressing block is made of rubber.

To sum up, owing to adopted above-mentioned technical scheme, the beneficial effects of the utility model are that:

in this application, the groove is arranged in to the chip, promotes the in-process that the go-between moved in vertical direction at electric putter, and the removal round pin slides logical inslot portion, and the depression bar drives the briquetting and compresses tightly fixedly to the chip, at driving piece drive carousel pivoted in-process, and accredited testing organization detects the chip, compares the testing arrangement among the prior art, can avoid taking place the drunkenness among the chip test procedure, and stability is higher.

Drawings

Fig. 1 shows a schematic structural diagram of a testing apparatus provided according to an embodiment of the present invention;

fig. 2 is a schematic bottom view of a bottom plate according to an embodiment of the present invention;

fig. 3 is a schematic view illustrating a bottom view of a turntable according to an embodiment of the present invention;

fig. 4 shows a schematic diagram of a partially enlarged structure of a in fig. 1 according to an embodiment of the present invention.

Illustration of the drawings:

1. a base plate; 2. a turntable; 3. a testing mechanism; 4. a support; 5. a groove; 6. a motor; 7. a drive shaft; 8. a first belt pulley; 9. a second belt pulley; 10. a drive belt; 11. a travel bar; 12. a connecting ring; 13. an electric push rod; 14. a pressure lever; 15. a through groove; 16. a moving pin; 17. and (7) briquetting.

Detailed Description

The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by a person of ordinary skill in the art without creative efforts belong to the protection scope of the present invention.

Referring to fig. 1-4, the present invention provides a technical solution:

the utility model provides a LD laser chip test equipment, comprising a base plate 1, carousel 2, support 4 and install accredited testing organization 3 on support 4, support 4 fixes the one side at bottom plate 1, accredited testing organization 3 has been disclosed in the comparison document, this application does not describe here any more, carousel 2 installs on bottom plate 1 through transmission shaft 7, transmission shaft 7 and 2 fixed connection of carousel, transmission shaft 7 passes through the bearing with bottom plate 1 and rotates and be connected, be equipped with drive carousel 2 pivoted driving piece on the bottom plate 1, recess 5 has on the carousel 2, recess 5 is used for placing the chip, be connected with depression bar 14 through the free bearing on the carousel 2, depression bar 14 rotates with the free bearing and is connected, the free bearing is fixed at the last table wall of carousel 2, it leads to groove 15 to have on the depression bar 14, be equipped with on the carousel 2 and act on leading to groove 15, make depression bar 14 pivoted power spare, it is the rectangular form setting of transverse distribution to lead to groove 15.

Specifically, as shown in fig. 2, the driving member includes a first belt pulley 8 installed at the bottom of the transmission shaft 7, the bottom plate 1 is provided with a motor 6, a second belt pulley 9 is installed at the output end of the motor 6, the first belt pulley 8 and the second belt pulley 9 are connected through a transmission belt 10, the motor 6 drives the second belt pulley 9 to rotate, and under the action of the transmission belt 10, the first belt pulley 8 can drive the transmission shaft 7 to rotate.

Specifically, as shown in fig. 3 and 4, the power component includes a moving rod 11 penetrating through the turntable 2, the moving rod 11 is vertically disposed, the moving rod 11 is in sliding fit with the turntable 2, a moving pin 16 penetrating through a through groove 15 is formed on the moving rod 11, the moving pin 16 is in sliding fit with the through groove 15, the moving pin 16 moves in the through groove 15, the pressing rod 14 rotates around the hinge seat, the moving rod 11 is fixed through a connecting ring 12, an electric push rod 13 connected with the connecting ring 12 is installed on the turntable 2, and the electric push rod 13 can drive the moving rod 11 and the moving pin 15 to move in the vertical direction through the connecting ring 12.

Specifically, as shown in fig. 4, a pressing block 17 is fixed at the end of the pressing rod 14, the pressing block 17 is made of rubber, so that rigid contact between the pressing rod 14 and the chip is avoided, and meanwhile, the friction coefficient of the rubber is large, so that the chip can be better fixed.

In summary, in the chip testing provided by the embodiment, the chip is placed inside the groove 5, the electric push rod 13 is turned on, the electric push rod 13 pushes the connecting ring 12 to move, the moving pin 16 on the moving rod 11 moves inside the through groove 16 in the process that the moving rod 11 moves along with the connecting ring 12, and the pressing rod 14 drives the pressing block 17 to press and fix the chip;

the motor 6 is started, the transmission shaft 7 drives the rotary table 2 to rotate under the action of the first belt pulley 8, the second belt pulley 9 and the transmission belt 10, the chip can be tested by the testing mechanism 3 in the rotating process, and compared with a testing device in the prior art, the chip testing process can be prevented from generating play.

The previous description of the embodiments is provided to enable any person skilled in the art to make or use the present invention. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the generic principles defined herein may be applied to other embodiments without departing from the spirit or scope of the invention. Thus, the present invention is not intended to be limited to the embodiments shown herein but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.

Claims

1. The utility model provides a LD laser chip test equipment, includes bottom plate (1), carousel (2), support (4) and installs accredited testing organization (3) on support (4), its characterized in that, install on bottom plate (1) through transmission shaft (7) carousel (2), be equipped with drive turntable (2) pivoted driving piece on bottom plate (1), recess (5) have on carousel (2), be connected with depression bar (14) through the free bearing on carousel (2), logical groove (15) have on depression bar (14), be equipped with on carousel (2) and act on logical groove (15), make depression bar (14) pivoted power spare.

2. The LD laser chip testing device according to claim 1, wherein the driving member comprises a first belt pulley (8) installed at the bottom of the transmission shaft (7), the bottom plate (1) is provided with a motor (6), a second belt pulley (9) is installed at the output end of the motor (6), and the first belt pulley (8) and the second belt pulley (9) are connected through a transmission belt (10).

3. The LD laser chip testing device according to claim 2, wherein the power member comprises a moving rod (11) penetrating through the turntable (2), the moving rod (11) is formed with a moving pin (16) penetrating through a through groove (15), the moving rods (11) are fixed through a connecting ring (12), and the turntable (2) is provided with an electric push rod (13) connected with the connecting ring (12).

4. The LD laser chip testing apparatus according to claim 3, characterized in that a pressing block (17) is fixed at the end of the pressing rod (14).

5. The LD laser chip testing apparatus according to claim 4, characterized in that the pressing block (17) is made of rubber.