CN217305247U - Chip testing device with limiting structure - Google Patents

Chip testing device with limiting structure Download PDF

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Publication number
CN217305247U
CN217305247U CN202220352532.1U CN202220352532U CN217305247U CN 217305247 U CN217305247 U CN 217305247U CN 202220352532 U CN202220352532 U CN 202220352532U CN 217305247 U CN217305247 U CN 217305247U
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China
Prior art keywords
fixedly connected
lateral wall
gear
chip
threaded rod
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Active
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CN202220352532.1U
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Chinese (zh)
Inventor
陈宗廷
陈建光
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Shenzhen Yaoxing Microelectronics Co ltd
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Shenzhen Yaoxing Microelectronics Co ltd
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Abstract

The utility model discloses a take limit structure's chip testing arrangement, comprising a base plate, two backup pads of lateral wall fixedly connected with on the bottom plate, be equipped with two movable plates on the bottom plate, be equipped with fixture on the bottom plate, fixture includes the diaphragm, lateral wall fixedly connected with motor on the diaphragm, the output shaft fixedly connected with bull stick of motor, the first gear of bull stick right-hand member fixedly connected with is located left the backup pad lateral wall rotates and is connected with double threaded rod, double threaded rod lateral wall fixedly connected with second gear, two the movable plate all with double threaded rod lateral wall threaded connection. The utility model discloses the realization is to chip centre gripping and fixed, prevents that the chip from taking place to remove when testing the chip, can also make the speed that two movable plates are close to each other slower, makes the staff slowly adjust the distance between two movable plates according to the size of chip, can also avoid the movable plate to press from both sides the chip bad because of moving too fast.

Description

Chip testing device with limiting structure
Technical Field
The utility model relates to a chip testing technical field especially relates to a take limit structure's chip testing arrangement.
Background
The chip test is a test after a wafer is cut and thinned to form an independent wafer, and generally, the chip is placed on a test platform, a probe is used for probing a predetermined test point in the chip, and the probe can pass through direct current and alternating current signals to test various electrical parameters of the chip.
The existing chip testing device is not fixed, so that the chip can deviate due to the touch of the probe in the testing process, a worker needs to always pay attention to the position of the chip, the workload of the worker is increased, and the chip testing device with the limiting structure needs to be designed in order to solve the problems.
SUMMERY OF THE UTILITY MODEL
The utility model aims at solving the shortcoming that exists among the prior art, and the chip testing device who provides takes limit structure.
In order to achieve the above purpose, the utility model adopts the following technical scheme:
the utility model provides a take limit structure's chip testing arrangement, includes the bottom plate, two backup pads of lateral wall fixedly connected with on the bottom plate, be equipped with two movable plates on the bottom plate, be equipped with fixture on the bottom plate, fixture includes the diaphragm, lateral wall fixedly connected with motor on the diaphragm, the output shaft fixedly connected with bull stick of motor, the first gear of bull stick right-hand member fixedly connected with is located left the backup pad lateral wall rotates and is connected with double threaded rod, double threaded rod lateral wall fixedly connected with second gear, two the movable plate all with double threaded rod lateral wall threaded connection.
Preferably, the opposite side walls of the two support plates are fixedly connected with a limiting rod together, and the limiting rod penetrates through the side walls of the two moving plates.
Preferably, the opposite side walls of the two moving plates are provided with grooves, and the two grooves are both arc-shaped structures.
Preferably, the two groove side walls are fixedly connected with cushion pads, and the two cushion pads are made of rubber.
Preferably, the double-end threaded rod penetrates through the side wall of the support plate on the left side, and the penetrating position of the double-end threaded rod and the support plate is rotatably connected through a bearing.
Preferably, the first gear is meshed with the second gear, and the diameter of the first gear is smaller than that of the second gear.
The utility model discloses following beneficial effect has:
1. the utility model drives the first gear to rotate through the motor, thereby driving the second gear to rotate, thereby driving the double-threaded rod to rotate, thereby driving the two movable plates to be close to each other, realizing the clamping and fixing of the chip, and preventing the chip from moving when testing the chip;
2. the utility model discloses in, because the diameter of first gear is far less than the diameter of second gear for second gear rotational speed is slower, thereby makes the speed that two movable plates are close to each other slower, and the staff can slowly adjust the distance between two movable plates according to the size of chip, can also avoid the movable plate to press from both sides the chip bad because of moving too fast.
Drawings
Fig. 1 is a schematic structural diagram of a chip testing device with a limiting structure according to the present invention;
fig. 2 is a sectional view of the utility model provides a take limit structure's chip testing arrangement a-a.
In the figure: 1 bottom plate, 2 backup pads, 3 diaphragm, 4 motors, 5 bull sticks, 6 first gear, 7 second gear, 8 double threaded rods, 9 movable plates, 10 recesses, 11 blotters, 12 gag lever posts.
Detailed Description
The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments.
Referring to fig. 1-2, a chip testing device with a limiting structure comprises a bottom plate 1, wherein two supporting plates 2 are fixedly connected to the side wall of the bottom plate 1, two moving plates 9 are arranged on the bottom plate 1, grooves 10 are formed in opposite side walls of the two moving plates 9, the two grooves 10 are of arc-shaped structures, cushion pads 11 are fixedly connected to the side walls of the two grooves 10, and the two cushion pads 11 are made of rubber to prevent a chip from being damaged by the moving plates 9.
The bottom plate 1 is provided with a clamping mechanism, the clamping mechanism comprises a transverse plate 3, the transverse plate 3 is fixedly connected with the side wall of the right supporting plate 2, the side wall of the transverse plate 3 is fixedly connected with a motor 4, an output shaft of the motor 4 is fixedly connected with a rotating rod 5, the right end of the rotating rod 5 is fixedly connected with a first gear 6, the side wall of the left supporting plate 2 is rotatably connected with a double-threaded rod 8, the double-threaded rod 8 penetrates through the side wall of the left supporting plate 2, the penetrating part of the double-threaded rod 8 and the supporting plate 2 is rotatably connected through a bearing, the side wall of the double-threaded rod 8 is fixedly connected with a second gear 7, the first gear 6 is meshed with the second gear 7, the diameter of the first gear 6 is smaller than that of the second gear 7, the first gear 6 can drive the second gear 7 to rotate for a circle after rotating for several circles, the two moving plates 9 are both in threaded connection with the side wall of the double-threaded rod 8, and the opposite side walls of the two supporting plates 2 are fixedly connected with a limiting rod 12 together, the limiting rod 12 penetrates through the side walls of the two moving plates 9 to ensure that the two moving plates 9 can only move.
The utility model discloses its functional principle is explained to following mode of operation of accessible: during the use, starter motor 4, motor 4 drives bull stick 5 and rotates, thereby drive first gear 6 and rotate, thereby drive second gear 7 and rotate, thereby drive double threaded rod 8 and rotate, thereby drive two movable plates 9 and be close to each other, can realize the centre gripping and fixing to the chip, and, because first gear 6 diameter is less than the diameter of second gear 7, make second gear 7 slew velocity slower, thereby make double threaded rod 8's rotational speed slower, the speed that two movable plates 9 are close to each other is also slower, the staff can adjust the distance between two movable plates 9 according to the size of chip, can also prevent that movable plate 9 from moving fast will press from both sides badly.
The above, only be the preferred embodiment of the present invention, but the protection scope of the present invention is not limited thereto, and any technical solution and the utility model thereof should be covered within the protection scope of the present invention.

Claims (6)

1. The utility model provides a take limit structure's chip testing arrangement, includes bottom plate (1), its characterized in that: two backup pads (2) of lateral wall fixedly connected with on bottom plate (1), be equipped with two movable plates (9) on bottom plate (1), be equipped with fixture on bottom plate (1), fixture includes diaphragm (3), lateral wall fixedly connected with motor (4) on diaphragm (3), output shaft fixedly connected with bull stick (5) of motor (4), bull stick (5) right-hand member fixedly connected with first gear (6) is located left backup pad (2) lateral wall rotates and is connected with double threaded rod (8), double threaded rod (8) lateral wall fixedly connected with second gear (7), two movable plate (9) all with double threaded rod (8) lateral wall threaded connection.
2. The chip testing device with the limiting structure as claimed in claim 1, wherein: two the relative lateral wall of backup pad (2) is fixed connection with gag lever post (12) jointly, gag lever post (12) run through two movable plate (9) lateral walls.
3. The chip testing device with the limiting structure as claimed in claim 2, wherein: the opposite side walls of the two moving plates (9) are provided with grooves (10), and the two grooves (10) are of arc structures.
4. The chip testing device with the limiting structure as recited in claim 3, wherein: the side walls of the two grooves (10) are fixedly connected with cushion pads (11), and the two cushion pads (11) are made of rubber.
5. The chip testing device with the limiting structure as claimed in claim 2, wherein: double-end threaded rod (8) run through and are located left backup pad (2) lateral wall, double-end threaded rod (8) are connected through the bearing rotation with the department of running through of backup pad (2).
6. The chip testing device with the limiting structure as claimed in claim 1, wherein: the first gear (6) is meshed with the second gear (7), and the diameter of the first gear (6) is smaller than that of the second gear (7).
CN202220352532.1U 2022-02-22 2022-02-22 Chip testing device with limiting structure Active CN217305247U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202220352532.1U CN217305247U (en) 2022-02-22 2022-02-22 Chip testing device with limiting structure

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202220352532.1U CN217305247U (en) 2022-02-22 2022-02-22 Chip testing device with limiting structure

Publications (1)

Publication Number Publication Date
CN217305247U true CN217305247U (en) 2022-08-26

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ID=82929641

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202220352532.1U Active CN217305247U (en) 2022-02-22 2022-02-22 Chip testing device with limiting structure

Country Status (1)

Country Link
CN (1) CN217305247U (en)

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