CN217278766U

CN217278766U - Device for solving problems of illumination and high and low temperatures in TEG test

Info

Publication number: CN217278766U
Application number: CN202220454789.8U
Authority: CN
Inventors: 龙鹏宇; 陈望; 刘福知; 王端生; 邓小均
Original assignee: Truly Renshou High end Display Technology Ltd
Current assignee: Truly Renshou High end Display Technology Ltd
Priority date: 2022-03-01
Filing date: 2022-03-01
Publication date: 2022-08-23
Anticipated expiration: 2032-03-01

Abstract

The application provides a solve TEG test illumination, high microthermal device, including complementary unit, complementary unit includes the workstation, first recess has been seted up at the top of workstation, the second recess has been seted up to the bottom of first recess inner chamber, all be provided with controllable luminance light source on the four walls of second recess, the bottom of second recess inner chamber has set gradually controllable temperature high temperature emergence equipment, insulating board and controllable temperature low temperature emergence equipment, be provided with the sample platform in the first recess, the workstation top is provided with microscope equipment. This application sets up controllable luminance light source and sets up controllable temperature high temperature generating device and controllable temperature low temperature generating device in the bottom of second recess inner chamber through setting up controllable luminance light source on the wall of second recess, illumination and high low temperature condition that need when can realize TFT characteristic test through the control to controllable luminance light source luminance and to controllable temperature high temperature generating device and the control of controllable temperature low temperature generating device temperature, can not satisfy illumination and carry out the problem of high temperature or low temperature demand simultaneously when having solved the TEG test that exists among the prior art.

Description

Device for solving problems of high and low temperature in TEG test illumination

Technical Field

The utility model relates to a TFT tests technical field particularly, relates to a solve TEG test illumination, high microthermal device.

Background

The TFT is an abbreviation of a thin film transistor, and each liquid crystal pixel point on the TFT-type display screen is driven by the thin film transistor integrated behind the pixel point, so the TFT-type display screen is also a kind of active matrix liquid crystal display device, which is one of the best LCD color displays, and the TFT-type display has the advantages of high brightness, for example, the high brightness TFT display provided by the chinese patent CN 201821435917.4;

since testing in production often simulates the electrical characteristics of the TFT device in its operating state, the TEG testing device is required to test the following test functions: dark state TEG, illumination TEG and high and low temperature TEG, but prior art test can't satisfy illumination and carry out the demand of high temperature or low temperature simultaneously. Therefore, the improvement is made, and a device for solving the problems of high and low temperature of TEG test illumination is provided.

Disclosure of Invention

The utility model aims to provide a: aiming at the problem that the existing test can not meet the requirements of illumination and high temperature or low temperature at the same time.

In order to achieve the purpose of the invention, the utility model provides the following technical scheme:

the device for testing illumination and high and low temperatures by TEG is solved to improve the problems.

The present application is specifically such that:

the microscope device comprises an auxiliary mechanism, the auxiliary mechanism comprises a workbench, a first groove is formed in the top of the workbench, a second groove is formed in the bottom of an inner cavity of the first groove, controllable brightness light sources are arranged on four walls of the second groove, a controllable temperature high-temperature generating device, a heat insulation plate and a controllable temperature low-temperature generating device are sequentially arranged at the bottom of the inner cavity of the second groove, a sample platform is arranged in the first groove, and a microscope device is arranged above the workbench.

As the preferred technical scheme of this application, be provided with the supporting mechanism who supports microscope equipment on the workstation, supporting mechanism is including seting up the spout in workstation top one side.

As the preferred technical scheme of this application, be connected with first lead screw through the bearing rotation in the spout, the one end of first lead screw is passed the spout and is extended to outside and the fixedly connected with handle of workstation one side.

As the preferred technical scheme of this application, the surface threaded connection of first lead screw has the slider, the top of slider is connected with the second lead screw through the bearing rotation, the top of second lead screw is fixedly connected with the handle also.

As the preferred technical scheme of this application, the surface threaded connection of second lead screw has the backup pad, the surface cover of backup pad is equipped with the carriage, be provided with fixing bolt on the carriage, fixing bolt's bottom extend to in the carriage and contact with backup pad top.

As the preferred technical scheme of this application, the top fixed mounting of slider has the limiting plate, the backup pad is passed and extends to the backup pad top in the top of limiting plate.

As the preferred technical scheme of this application, carriage one side fixedly connected with connecting rod, the one end that the carriage was kept away from to the connecting rod is connected with microscope equipment.

As the preferred technical scheme of this application, the top of workstation is provided with the protection machanism who is located between sample platform and the spout, protection machanism includes two supporting seats, two the bottom of supporting seat all with the top fixed connection of workstation.

As the preferred technical scheme of this application, two all be connected with the connection pivot through the bearing rotation on the supporting seat, two fixedly connected with protective block between the connection pivot, the protective tank has been seted up to protective block one side.

As the preferred technical scheme of this application, be provided with two stay tubes, two in the one side that the protection tank was seted up to the protection piece the equal alternate rubber piece that is connected with in the stay tube, two the equal fixed mounting in one side of rubber piece has the bracing piece, the one end that the rubber piece was kept away from to the bracing piece passes the stay tube and extends to outside and the fixedly connected with supporting shoe on one side of the stay tube.

Compared with the prior art, the beneficial effects of the utility model are that:

in the scheme of the application:

1. the brightness controllable light sources are arranged on the four walls of the second groove, and the temperature controllable high-temperature generating equipment and the temperature controllable low-temperature generating equipment are arranged at the bottom of the inner cavity of the second groove, so that the illumination and high-low temperature conditions required by TFT characteristic test can be realized by controlling the brightness of the brightness controllable light sources and controlling the temperatures of the temperature controllable high-temperature generating equipment and the temperature controllable low-temperature generating equipment, and the problem that the illumination and high-temperature or low-temperature requirements cannot be met simultaneously during test in the prior art is solved;

2. the supporting mechanism can support the microscope equipment, can adjust the height and the horizontal position of the microscope equipment and is used by workers;

3. through the arranged protection mechanism, the support tube and the support block in the protection mechanism can be used for placing the TFT to be detected, so that a gap is reserved between the TFT and the sample stage, the TFT is convenient to take down, the support block is pulled to adjust the distance between the support block and the support tube, the application range is improved, and the practicability of the device is improved;

4. through the protection machanism who sets up, the protection piece among the protection machanism can rotate, can be through rotating the protection piece and can be so that the protecting groove up, and microscope equipment can insert in the protecting groove, can protect microscope equipment when not using like this, further improves the device's practicality.

Drawings

FIG. 1 is a schematic structural diagram of an apparatus for solving TEG test illumination and high and low temperatures provided by the present application;

fig. 2 is a schematic structural diagram of a microscope apparatus of the device for solving the problems of high and low temperature of TEG test illumination provided by the present application;

FIG. 3 is an enlarged schematic structural view of the part A in FIG. 2 of the device for solving TEG test illumination and high and low temperatures provided by the present application;

FIG. 4 is a schematic structural diagram of a supporting mechanism and a protecting mechanism of the device for solving TEG test illumination and high and low temperature provided by the present application;

FIG. 5 is a schematic structural diagram of a slider of the device for solving TEG test illumination and high and low temperatures provided by the present application;

FIG. 6 is a schematic structural diagram of a protection mechanism of the device for solving TEG test illumination and high and low temperatures provided by the present application;

FIG. 7 is a schematic structural diagram of a connection shaft of the device for solving TEG test illumination and high and low temperatures provided by the present application;

fig. 8 is a schematic cross-sectional structural view of a support tube of the device for solving the problems of TEG test illumination and high and low temperatures provided by the present application.

The following are marked in the figure:

1. an auxiliary mechanism; 101. a work table; 102. a first groove; 103. a controllable brightness light source; 104. a thermal insulation plate; 105. a temperature-controllable high-temperature generating device; 106. a temperature-controllable low-temperature generating device; 107. a sample stage; 108. a second groove; 109. a microscope device;

2. a wheel;

3. a support mechanism; 301. a chute; 302. a first lead screw; 303. a slider; 304. a second lead screw; 305. a support plate; 306. a limiting plate; 307. a support frame; 308. a connecting rod;

4. a protection mechanism; 401. a supporting seat; 402. connecting the rotating shaft; 403. a protection block; 404. a protective bath; 405. supporting a pipe; 406. a rubber block; 407. a support bar; 408. and (6) supporting the block.

Detailed Description

In order to make the objects, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings. It is to be understood that the embodiments described are only some of the embodiments of the present invention, and not all of them.

Thus, the following detailed description of the embodiments of the present invention is not intended to limit the scope of the invention as claimed, but is merely representative of some embodiments of the invention. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.

It should be noted that, in the present invention, the embodiments and the features and technical solutions in the embodiments may be combined with each other without conflict.

It should be noted that: like reference numbers and letters refer to like items in the following figures, and thus, once an item is defined in one figure, it need not be further defined or explained in subsequent figures.

In the description of the present invention, it should be noted that the terms "upper", "lower", and the like indicate orientations or positional relationships based on orientations or positional relationships shown in the drawings, orientations or positional relationships that are usually placed when the product of the present invention is used, or orientations or positional relationships that are usually understood by those skilled in the art, and such terms are only used for convenience of description and simplification of the description, and do not indicate or imply that the device or element indicated must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be construed as limiting the present invention. Furthermore, the terms "first," "second," and the like are used solely to distinguish one from another, and are not to be construed as indicating or implying relative importance.

Example 1:

as shown in fig. 1, fig. 2 and fig. 3, the present embodiment provides a device for solving the illumination and high and low temperatures in the TEG test, which includes an auxiliary mechanism 1, the auxiliary mechanism 1 includes a worktable 101, a first groove 102 is formed at the top of the worktable 101, a second groove 108 is formed at the bottom of the inner cavity of the first groove 102, controllable brightness light sources 103 are disposed on the four walls of the second groove 108, a controllable temperature high temperature generating device 105, a thermal insulation plate 104 and a controllable temperature low temperature generating device 106 are sequentially disposed at the bottom of the inner cavity of the second groove 108, the illumination and high and low temperature conditions required in the TFT characteristic test can be realized by controlling the brightness of the controllable brightness light sources 103 and the temperatures of the controllable temperature high temperature generating device 105 and the controllable temperature low temperature generating device 106 by disposing the controllable brightness light sources 103 on the four walls of the second groove 108 and disposing the controllable temperature high temperature generating device 105 and the controllable temperature low temperature generating device 106 at the bottom of the inner cavity of the second groove 108, the problem of can not satisfy illumination simultaneously and carry out high temperature or low temperature demand during the test that exists among the prior art is solved, be provided with sample platform 107 in the first recess 102, be provided with microscope equipment 109 above workstation 101.

Example 2:

the scheme of example 1 is further described below in conjunction with specific working modes, which are described in detail below:

as shown in fig. 4 and 5, in addition to the above-mentioned embodiment, in a preferred embodiment, a support mechanism 3 for supporting the microscope device 109 is further provided on the table 101, the support mechanism 3 includes a chute 301 provided on one side of the top of the table 101, wheels 2 are mounted on the bottom of the table 101, the wheels 2 are provided to facilitate movement of the table 101, and the wheels 2 are foot brake universal wheels.

As shown in fig. 4 and 5, as a preferred embodiment, in addition to the above manner, further, a first lead screw 302 is rotatably connected to the inside of the chute 301 through a bearing, one end of the first lead screw 302 passes through the chute 301 and extends to the outside of the side of the workbench 101, and a handle is fixedly connected to the first lead screw 302, and the handle is provided to facilitate a worker to rotate the first lead screw 302.

As shown in fig. 4 and 5, as a preferred embodiment, in addition to the above manner, a sliding block 303 is connected to an outer surface of the first lead screw 302 in a threaded manner, the sliding block 303 is connected to an inner wall of the sliding groove 301 in a sliding manner, a second lead screw 304 is connected to a top of the sliding block 303 in a rotating manner through a bearing, a handle is also fixedly connected to a top end of the second lead screw 304, and the handle is convenient for a worker to rotate the second lead screw 304, so that the use is facilitated.

As shown in fig. 4 and 5, as a preferred embodiment, in addition to the above-mentioned mode, a supporting plate 305 is further connected to an outer surface of the second lead screw 304 through a screw thread, the supporting plate 305 can be driven to ascend or descend by rotating the second lead screw 304, a supporting frame 307 is sleeved on an outer surface of the supporting plate 305, a fixing bolt is arranged on the supporting frame 307, a bottom end of the fixing bolt extends into the supporting frame 307 and contacts with a top of the supporting plate 305, the position of the supporting frame 307 can be adjusted by pushing the supporting frame 307 after the fixing bolt is loosened, and the position of the supporting frame 307 can be fixed after the fixing bolt is tightened.

As shown in fig. 4 and 5, as a preferred embodiment, on the basis of the above manner, further, a limiting plate 306 is fixedly mounted on the top of the slider 303, the supporting plate 305 can be limited by the provided limiting plate 306, the supporting plate 305 is prevented from rotating along with the second screw 304, and the top end of the limiting plate 306 penetrates through the supporting plate 305 and extends above the supporting plate 305.

As shown in fig. 4 and 5, in addition to the above-mentioned mode, as a preferred embodiment, a connection rod 308 is further fixedly connected to one side of the support frame 307, the connection rod 308 is provided for connecting the support frame 307 and the microscope device 109, and one end of the connection rod 308 away from the support frame 307 is connected to the microscope device 109.

Example 3:

the schemes of examples 1 and 2 are further described below in conjunction with specific working examples, which are described in detail below:

as shown in fig. 4, 5 and 6, as a preferred embodiment, in addition to the above manner, a protection mechanism 4 located between the sample stage 107 and the chute 301 is further disposed on the top of the working platform 101, the protection mechanism 4 includes two supporting seats 401, the bottoms of the two supporting seats 401 are both fixedly connected with the top of the working platform 101, and the two supporting seats 401 can support the connecting rotating shaft 402.

As shown in fig. 4, fig. 5, fig. 6, and fig. 7, as a preferred embodiment, on the basis of the above manner, further, the two supporting seats 401 are rotatably connected with the connecting rotating shaft 402 through bearings, the two connecting rotating shafts 402 are fixedly connected with the protection block 403, the bearings are arranged so that the connecting rotating shaft 402 can rotate, and the protection block 403 can also rotate, one end of the protection block 403 is arc-shaped, the arc-shaped arrangement is favorable for the rotation of the protection block 403, and the protection groove 404 is formed in one side of the protection block 403.

As shown in fig. 4, 5, 6, 7 and 8, as a preferred embodiment, on the basis of the above-mentioned manner, further, two support pipes 405 are disposed on one side of the protection block 403 where the protection groove 404 is disposed, the rubber blocks 406 are inserted and connected in the two support pipes 405, the position of the support block 408 can be limited by the friction force between the rubber blocks 406 and the inner wall of the support pipes 405, so as to reduce the situation that the support block 408 moves during use, support rods 407 are fixedly mounted on one sides of the two rubber blocks 406, and one ends of the support rods 407 far away from the rubber blocks 406 penetrate through the support pipes 405 and extend to the outside of one side of the support pipes 405 and are fixedly connected with the support blocks 408.

Specifically, this solve TEG test illumination, high microthermal device during operation/use: pulling the supporting block 408, adjusting the distance between the supporting block 408 and the supporting tubes 405 according to actual conditions, placing the TFT to be tested between the tops of the two supporting tubes 405 after adjustment, pricking a probe of the testing device into a channel corresponding to the TFT, starting the controllable brightness light source 103, adjusting the brightness of the controllable brightness light source 103 according to testing requirements, starting the controllable temperature high-temperature generating device 105 or the controllable temperature low-temperature generating device 106, adjusting corresponding temperature according to testing requirements, realizing illumination and high-low temperature conditions required during the characteristic test of the TFT by controlling the brightness of the controllable brightness light source 103 and the temperatures of the controllable temperature high-temperature generating device 105 and the controllable temperature low-temperature generating device 106, loosening the fixing bolts on the supporting frame 307 and pushing the supporting frame 307 to move, screwing the fixing bolts after adjusting the position of the supporting frame 307, then rotating the second screw rod 304, the second screw rod 304 drives the supporting plate 305 to ascend and descend, the height of the microscope device 109 is adjusted according to actual conditions, then the first screw rod 302 is rotated, the first screw rod 302 drives the sliding block 303 to move, the sliding block 303 drives the microscope device 109 to move, the position of the microscope device 109 is adjusted, and therefore test conditions can be observed through the microscope device 109;

when not using, rotate protection piece 403 and make guard slot 404 up, then drive microscope equipment 109 through supporting mechanism 3 and remove to make microscope equipment 109 insert in the guard slot 404, can protect microscope equipment 109 like this when not using, and when using again, drive microscope equipment 109 through supporting mechanism 3 and rise and separate with guard slot 404, then rotate protection piece 403 and make protection piece 403 reset can.

The above embodiments are only used to illustrate the present invention and not to limit the technical solutions described in the present invention, and although the present invention has been described in detail with reference to the above embodiments, the present invention is not limited to the above embodiments, and therefore, any modification or equivalent replacement may be made to the present invention; all such modifications and variations are intended to be included herein within the scope of this disclosure and the present invention and protected by the following claims.

Claims

1. The utility model provides a solve TEG test illumination, high microthermal device, a serial communication port, including complementary unit (1), complementary unit (1) includes workstation (101), first recess (102) have been seted up at the top of workstation (101), second recess (108) have been seted up to the bottom of first recess (102) inner chamber, all be provided with controllable luminance light source (103) on the four walls of second recess (108), the bottom of second recess (108) inner chamber has set gradually controllable temperature high temperature generating equipment (105), insulating plate (104) and controllable temperature low temperature generating equipment (106), be provided with sample platform (107) in first recess (102), workstation (101) top is provided with microscope equipment (109).

2. The device for solving TEG test illumination and high and low temperature according to claim 1, wherein the worktable (101) is provided with a supporting mechanism (3) for supporting the microscope device (109), and the supporting mechanism (3) comprises a chute (301) arranged on one side of the top of the worktable (101).

3. The device for solving TEG test illumination and high and low temperature as claimed in claim 2, wherein the sliding groove (301) is rotatably connected with a first lead screw (302) through a bearing, one end of the first lead screw (302) passes through the sliding groove (301) and extends to the outside of one side of the workbench (101) and is fixedly connected with a handle.

4. The device for solving TEG test illumination and high and low temperature as claimed in claim 3, wherein the outer surface of the first screw rod (302) is connected with a slide block (303) by screw thread, the top of the slide block (303) is connected with a second screw rod (304) by rotation through a bearing, and the top end of the second screw rod (304) is also fixedly connected with a handle.

5. The device for solving TEG test illumination and high and low temperature as claimed in claim 4, wherein the outer surface of the second screw rod (304) is connected with a support plate (305) by screw thread, the outer surface of the support plate (305) is sleeved with a support frame (307), the support frame (307) is provided with a fixing bolt, the bottom end of the fixing bolt extends into the support frame (307) and contacts with the top of the support plate (305).

6. A device for solving TEG test illumination and high and low temperature according to claim 5, wherein the top of the sliding block (303) is fixedly installed with a limiting plate (306), and the top end of the limiting plate (306) passes through the supporting plate (305) and extends above the supporting plate (305).

7. The device for solving TEG test illumination and high and low temperature in accordance with claim 6, wherein a connecting rod (308) is fixedly connected to one side of the supporting frame (307), and one end of the connecting rod (308) far away from the supporting frame (307) is connected to the microscope device (109).

8. The device for solving TEG test illumination and high and low temperature according to claim 7, wherein the top of the working platform (101) is provided with a protection mechanism (4) between the sample platform (107) and the chute (301), the protection mechanism (4) comprises two supporting seats (401), and the bottoms of the two supporting seats (401) are fixedly connected with the top of the working platform (101).

9. The device according to claim 8, wherein the two supporting bases (401) are rotatably connected to a connecting shaft (402) through a bearing, a protection block (403) is fixedly connected between the two connecting shafts (402), and a protection slot (404) is formed on one side of the protection block (403).

10. The device for solving the problems of TEG test illumination and high and low temperature as claimed in claim 9, wherein two supporting tubes (405) are disposed on one side of the protection block (403) where the protection groove (404) is disposed, the two supporting tubes (405) are all inserted and connected with rubber blocks (406), supporting rods (407) are fixedly mounted on one sides of the two rubber blocks (406), and one ends of the supporting rods (407) far away from the rubber blocks (406) penetrate through the supporting tubes (405) and extend to the outside of one side of the supporting tubes (405) and are fixedly connected with supporting blocks (408).