CN217276512U

CN217276512U - Multi-station shared spectrometer system for optical device power test

Info

Publication number: CN217276512U
Application number: CN202221194446.9U
Authority: CN
Inventors: 张林波; 张强; 许远忠
Original assignee: Chengdu Eugenlight Technologies Co ltd
Current assignee: Chengdu Eugenlight Technologies Co ltd
Priority date: 2022-05-18
Filing date: 2022-05-18
Publication date: 2022-08-23
Anticipated expiration: 2032-05-18

Abstract

The utility model relates to an optical device tests technical field, discloses a be used for optical device power test multistation sharing spectrum appearance system, including the test element of service computer, spectrum appearance and a plurality of optical device, every test element all includes test computer, coupling power supply and spectrometer, and is a plurality of test element's spectrometer passes through at least one photoswitch and spectrum appearance formation test access. The utility model discloses an optical switch is added in a plurality of optical device power test systems for switching the light entering the spectrometer from the multi-station test unit, thereby realizing the sharing of the spectrometer; particularly, when the yield of a factory is increased and test stations need to be added, a spectrometer can be shared by a plurality of stations without using an optical coupler, the cost for adding the test stations can be reduced, the production expansion cost can be saved, and the use efficiency of valuable equipment is improved.

Description

Multi-station shared spectrometer system for optical device power test

Technical Field

The utility model relates to an optical device tests technical field, concretely relates to be used for optical device power test multistation sharing spectrum appearance system.

Background

In a power test system of an optical device, a PIV intelligent coupling power supply (coupling power supply for short) is generally required for powering up the optical device and testing some parameters. The spectrometer is used for testing spectral parameters of the optical device. At present, the method is adopted as shown in figure 1, each station is provided with a spectrometer independently occupied by the station, and the method is suitable for building a single-station test system.

The existing optical device testing equipment cannot realize multi-station sharing of the spectrometer, and when the yield of optical devices in a factory is increased and testing stations are required to be added, the cost is greatly increased due to the fact that the purchase price of the spectrometer is higher, and the using efficiency of the equipment is low.

SUMMERY OF THE UTILITY MODEL

Based on the above problems, the utility model provides a be used for optical device power test multistation sharing spectrum appearance system, through increasing an photoswitch in a plurality of optical device power test systems, be used for switching the light that multistation test element got into the spectrum appearance, realize spectrum appearance sharing; particularly, when the yield of a factory is increased and test stations need to be added, a spectrometer can be shared by a plurality of stations without using an optical coupler, the cost for adding the test stations can be reduced, the production expansion cost can be saved, and the use efficiency of valuable equipment is improved.

In order to solve the technical problem, the utility model discloses the technical scheme who adopts is:

a multi-station shared spectrometer system for power testing of optical devices comprises a service computer, a spectrometer and a plurality of test units of optical devices, wherein each test unit comprises a test computer, a coupling power supply and an optical splitter, and the optical splitters of the test units and the spectrometer form a test path through at least one optical switch.

Further, the testing computer and the service computer are connected in a TCP protocol communication mode.

Further, the service computer is one of the test computers of the plurality of test units.

Further, the coupling power supply is a PIV intelligent coupling power supply.

Compared with the prior art, the beneficial effects of the utility model are that: the utility model discloses an optical switch is added in a plurality of optical device power test systems for switching the light that the multistation test unit enters the spectrum appearance, realize the spectrum appearance sharing; particularly, when the yield of a factory is increased and test stations need to be added, a spectrometer can be shared by a plurality of stations without using an optical coupler, the cost for adding the test stations can be reduced, the production expansion cost can be saved, and the use efficiency of valuable equipment is improved.

Drawings

FIG. 1 is a single-station testing system for testing spectral parameters of an optical device;

FIG. 2 is a schematic diagram of a multi-station shared spectrometer system for power testing of optical devices in embodiment 1;

fig. 3 is a schematic structural diagram of a multi-station shared spectrometer system for power testing of optical devices in embodiment 2;

FIG. 4 is a flow chart of the testing of the multi-station shared spectrometer system for power testing of optical devices in example 2;

wherein: 1. a service computer; 2. a spectrometer; 3. testing the computer; 4. coupling a power supply; 5. a light splitter; 6. an optical switch.

Detailed Description

To make the objects, technical solutions and advantages of the present invention more apparent, the present invention is further described in detail below with reference to the following examples and drawings, and the exemplary embodiments and descriptions thereof of the present invention are only used for explaining the present invention, and are not intended as limitations of the present invention.

Example 1:

referring to fig. 2, a multistation shared spectrometer system for power testing of optical devices includes a service computer 1, a spectrometer 2, and a plurality of test units of optical devices, each test unit includes a test computer 3, a coupling power supply 4, and an optical splitter 5, the optical splitter 5 of the plurality of test units forms a test optical path with the spectrometer 2 through at least one optical switch 6;

the test computer 3 is used for inputting the test parameters of the optical device, controlling the power-up of the coupling power supply 4 according to the test parameters and initiating a test request to the service computer 1;

the coupling power supply 4 is used for electrifying the optical device to be tested in the power test process of the optical device;

the optical splitter 5 is used for splitting a part of the light to the optical switch 6;

the service computer 1 is used for receiving the request of the testing computer 3, controlling the optical switch 6 to direct a certain path of light transmitted by the multi-path optical splitter 5 to be connected to the spectrometer 2, and sending a testing instruction to the spectrometer 2;

the spectrometer 2 is used for testing spectral parameters of the optical device and feeding back test data to the corresponding test computer 3 through the service computer 1.

In actual use, each test unit is placed on a station, after the optical device is installed at a test position, corresponding test parameters are input on the test computer 3, a click test is performed, the coupling power supply 4 is controlled to electrify the optical device, the optical device converts an electric signal into an optical signal, and a part of light is split to the optical switch 6 through the optical splitter 5; meanwhile, the test computer 3 sends a test request to the service computer 1, the service computer 1 controls the optical switch 6 to direct the light transmitted from the optical splitter 5 to be connected to the spectrometer 2 and sends a test instruction to the spectrometer 2, the spectrometer 2 starts to test the optical device spectral parameters transmitted from the optical splitter 5, and test data are fed back to the corresponding test computer 3 through the service computer 1 to display results. In the embodiment, an optical switch 6 is added to a plurality of optical device power test systems and used for switching light entering the spectrometer 2 from a multi-station test unit to realize sharing of the spectrometer 2; especially, when the output of a factory needs to be increased and test stations need to be added, the spectrometer 2 can be shared by a plurality of stations without using an optical coupler, the cost for adding the test stations can be reduced, the production expansion cost can be saved, and the use efficiency of valuable equipment is improved.

Example 2

Referring to fig. 3 and 4, a multi-station shared spectrometer system for power testing of optical devices includes a service computer 1, a spectrometer 2, and a plurality of test units of optical devices, each test unit includes a test computer 3, a coupling power supply 4, and an optical splitter 5, and the optical splitters 5 of the plurality of test units form a test path with the spectrometer 2 through at least one optical switch 6.

The embodiment is described by using four stations of optical device power test units: in the four stations, a part of light is split to an optical switch 6 by using a light splitter 5, and a service computer 1 sends commands to control the operation of the optical switch 6 and the spectrometer 2. The service computer 1 controls the optical switch 6 to direct one of the four paths of light to access the spectrometer 2, and the test flow is shown in fig. 3.

The service computer 1 is also provided with a thread management module, and the thread management module is used for managing threads and distributing test tasks of the spectrometer 2. The thread management module in the embodiment belongs to the prior art and realizes the allocation of a plurality of station testing tasks through the functions of threads and thread locks.

The test computer 3 and the service computer 1 in this embodiment communicate with each other using the TCP protocol. The service computer 1 in this embodiment is doubled by a test computer 3 at four stations in the figure. The coupling power supply 4 in this embodiment is a PIV intelligent coupling power supply 4, and can realize the drive power supply and online monitoring of the optical device coupling.

The embodiment of the present invention is the above. The specific parameters in the above embodiments and examples are only for the purpose of clearly showing the verification process of the present invention, and are not used to limit the protection scope of the present invention, which is still subject to the claims, and all the equivalent structural changes made by using the contents of the specification and drawings of the present invention should be included in the protection scope of the present invention.

Claims

1. A multi-station shared spectrometer system for optical device power test is characterized in that: the testing unit comprises a service computer (1), a spectrometer (2) and a plurality of optical devices, each testing unit comprises a testing computer (3), a coupling power supply (4) and an optical splitter (5), and the optical splitters (5) of the testing units form a testing path with the spectrometer (2) through at least one optical switch (6).

2. The multi-station shared spectrometer system for power test of optical devices according to claim 1, wherein: the test computer (3) and the service computer (1) are in communication connection by adopting a TCP protocol.

3. The multi-station shared spectrometer system for optical device power test according to claim 1, wherein: the service computer (1) is one of the test computers (3) of the plurality of test units.

4. The multi-station shared spectrometer system for power test of optical devices according to any one of claims 1-3, wherein: the coupling power supply (4) is a PIV intelligent coupling power supply (4).