CN217212217U - Sample table of Fourier infrared spectrometer with precisely adjustable angle - Google Patents
Sample table of Fourier infrared spectrometer with precisely adjustable angle Download PDFInfo
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- CN217212217U CN217212217U CN202220333320.9U CN202220333320U CN217212217U CN 217212217 U CN217212217 U CN 217212217U CN 202220333320 U CN202220333320 U CN 202220333320U CN 217212217 U CN217212217 U CN 217212217U
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- infrared light
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Abstract
A Fourier infrared spectrometer sample table with an adjustable angle relates to the technical field of Fourier infrared spectrometers. The problem that the multi-angle infrared light transmittance change test of materials cannot be achieved by an existing sample table is solved. The utility model discloses a fixed end plate, rotatory end plate, location adjusting screw, a supporting bench and regulation dog, it has the infrared light to pass through the hole to open on the fixed end plate, it has infrared light to pass through hole and regulation through-hole to open on the rotatory end plate, a supporting bench sets up in the below that the second infrared light passes through the hole, it has the screw hole to open on the regulation dog, screw hole on the regulation dog and the coaxial setting of regulation through-hole on the rotatory end plate, the threaded hole on the regulation dog of one end spiro union of location adjusting screw to pass the regulation through-hole butt on the rotatory end plate on the inner panel of fixed end plate; one end of the fixed end plate is hinged with one end of the rotating end plate, and the other end of the fixed end plate is arranged at the bottom of the sample bin of the infrared spectrometer. The utility model discloses mainly used bears the sample.
Description
Technical Field
The utility model relates to a Fourier infrared spectroscopy technical field especially relates to an accurate adjustable type Fourier infrared spectroscopy sample platform of angle.
Background
Infrared spectroscopy belongs to molecular spectroscopy and is an advantageous tool for determining molecular composition and structure. According to the intensity, the position and the shape of an absorption peak in the infrared spectrum of the unknown object, the unknown object molecule can be determined to contain any group, and therefore the structure of the unknown object can be deduced. The Fourier infrared spectrometer has the advantages of high sensitivity, accurate wave number, good repeatability and the like. The method can be used for analyzing samples such as blocks, films, powder, liquid and the like, and is widely applied to departments in the fields of materials, chemical industry, medicine, environment, traffic, agriculture, gem identification, cultural relics, public inspection and the like.
The infrared transmittance is one of important characteristics of the optical performance of the material. When the transmissivity of a solid sample is tested, the sample table is required to be used for supporting the sample, the sample table in the existing instrument only comprises a supporting back plate and a supporting table, infrared light can only be used for measuring the infrared transmissivity of the material under the vertical incidence angle when the infrared light vertically irradiates to the sample chamber, but some materials need to have a certain included angle with incident light in the practical application process, and the existing sample table cannot realize the multi-angle infrared light transmissivity change test of the sample.
SUMMERY OF THE UTILITY MODEL
The utility model discloses the technical problem that needs to solve is: the existing sample table cannot realize multi-angle infrared light transmittance change test of materials; further provides a Fourier infrared spectrometer sample table with an adjustable angle.
The utility model discloses a solve the technical scheme that above-mentioned technical problem adopted and be:
a Fourier infrared spectrometer sample platform with an accurately adjustable angle comprises a fixed end plate, a rotating end plate, a positioning adjusting screw, a supporting table and an adjusting stop block, wherein a first infrared light transmission hole is formed in the fixed end plate, a second infrared light transmission hole and an adjusting through hole are longitudinally and sequentially formed in the rotating end plate, the supporting table and the adjusting stop block are sequentially and longitudinally and fixedly arranged on the outer plate surface of the rotating end plate, the supporting table is located below the second infrared light transmission hole, a threaded hole is formed in the adjusting stop block, the threaded hole in the adjusting stop block and the adjusting through hole in the rotating end plate are coaxially arranged, one end of the positioning adjusting screw is screwed in the threaded hole in the adjusting stop block and penetrates through the adjusting through hole in the rotating end plate to abut against the inner plate surface of the fixed end plate;
one end of the fixed end plate is hinged with one end of the rotating end plate, and the other end of the fixed end plate is arranged at the bottom of the sample bin of the infrared spectrometer.
Furthermore, one end of the fixed end plate is hinged with one end of the rotating end plate through a hinge.
Furthermore, the bin bottom of the infrared spectrometer sample bin is provided with a sample rack, the sample rack is provided with a slot matched with the fixed end plate, and the fixed end plate is inserted into the slot on the sample rack.
Further, the table top of the supporting table is of an arc-shaped structure, and the arc-shaped table top of the supporting table and the second infrared light transmission hole are coaxially arranged.
Further, the inner diameter of the first infrared light transmitting hole and the inner diameter of the second infrared light transmitting hole are 19 mm.
Furthermore, the fixed end plate and the rotating end plate are made of stainless steel.
Compared with the prior art, the utility model the beneficial effect who produces is:
1. the sample in the utility model is placed on the support table, and can rotate in the plane perpendicular to the incident light through the rotating end plate, the rotating range is 0-20 degrees, the included angle between the sample and the incident light is 70-90 degrees, the precision is +/-0.2 degrees, and the infrared light transmittance test under the sample multi-angle is realized by adjusting the angle between the sample and the incident light;
2. the utility model has the advantages of simple integral structure and convenient operation, the adjustment time of rotating the angle of the included angle of the end plate at every turn is not more than 1 minute.
Drawings
The accompanying drawings, which are incorporated in and constitute a part of this application, illustrate embodiments of the invention and, together with the description, serve to explain the invention without limitation.
FIG. 1 is a schematic view of the overall structure of the present invention;
FIG. 2 is a schematic diagram of the placement area and the infrared light direction of a sample stage in the whole set of infrared spectroscopy system equipment;
FIG. 3 shows the IR transmittance at different incident angles between the Ca fluoride window and the IR light, using the Ca fluoride window as a sample;
fig. 4 shows the infrared transmittance at different incident angles between the potassium bromide window and the infrared light, using the potassium bromide window as a sample.
In the figure: 1. fixing the end plate; 1-1, a first infrared light transmitting hole; 2. rotating the end plate; 2-1, passing the second infrared light through the hole; 3. positioning an adjusting screw rod; 4. a hinge; 5. a support table; 6. adjusting the stop block; 7. a sample bin of an infrared spectrometer; 8. a sample stage.
Detailed Description
To make the objects, technical solutions and advantages of the embodiments of the present invention clearer, the drawings in the embodiments of the present invention are combined below to clearly and completely describe the technical solutions in the embodiments, and the following embodiments are used for illustrating the present invention, but do not limit the scope of the present invention.
In the description of the present invention, it should be noted that the terms "upper", "lower", "inner", "outer", and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, and are only for convenience of description and simplification of description, but do not indicate or imply that the device or element referred to must have a specific orientation, be constructed in a specific orientation, and be operated, and thus should not be construed as limiting the present invention.
In the description of the present invention, it should be noted that, unless otherwise explicitly specified or limited, the terms "mounted" and "connected" are to be interpreted broadly, and may be, for example, fixedly connected, detachably connected, or integrally connected; can be mechanically or electrically connected; may be directly connected or indirectly connected through an intermediate. The specific meaning of the above terms in the present invention can be understood in specific cases to those skilled in the art.
Referring to fig. 1 and 2, the embodiment of the application provides a sample stage of a fourier infrared spectrometer with an adjustable angle, which includes a fixed end plate 1, a rotating end plate 2, a positioning adjusting screw 3, a support table 5 and an adjusting stopper 6, wherein the fixed end plate 1 is a rectangular plate, a first infrared light transmitting hole 1-1 is formed in the rectangular plate, the rotating end plate 2 is a rectangular plate, a second infrared light transmitting hole 2-1 and an adjusting through hole are longitudinally and sequentially formed in the rectangular plate, the support table 5 and the adjusting stopper 6 are sequentially and longitudinally and fixedly arranged on an outer plate surface of the rotating end plate 2, the support table 5 is positioned below the second infrared light transmitting hole 2-1, the support table 5 plays a role in supporting a sample, a threaded hole is formed in the adjusting stopper 6, and the threaded hole in the adjusting stopper 6 is coaxially arranged with the adjusting through hole in the rotating end plate 2, one end of the positioning adjusting screw rod 3 is screwed in a threaded hole on the adjusting stop block 6 and passes through an adjusting through hole on the rotating end plate 2 to abut against the inner plate surface of the fixed end plate 1; the adjusting stop block 6 is used for adjusting the length of the positioning adjusting screw rod 3 between the fixed end plate 1 and the rotating end plate 2;
one end of the fixed end plate 1 is hinged with one end of the rotating end plate 2, and the other end of the fixed end plate 1 is arranged at the bottom of the sample bin 7 of the infrared spectrometer.
In the embodiment, the length of the positioning adjusting screw 3 between the fixed end plate 1 and the rotating end plate 2 is adjusted, so that the included angle between the rotating end plate 2 and the fixed end plate 1 is adjusted; when the positioning adjusting screw rod 3 is screwed outwards, the length of the positioning adjusting screw rod 3 between the rotating end plate 2 and the fixed end plate 1 is reduced, the rotating end plate 2 rotates towards the fixed end plate 1 by taking a hinged point of the fixed end plate 1 and the rotating end plate 2 as an axis, and the included angle between the rotating end plate 2 and the fixed end plate 1 is reduced; when the positioning adjusting screw rod 3 is rotated inwards, the length of the positioning adjusting screw rod 3 between the rotating end plate 2 and the fixed end plate 1 is increased, the rotating end plate 2 rotates away from the fixed end plate 1 by taking a hinged point of the fixed end plate 1 and the rotating end plate 2 as an axis, and the included angle between the rotating end plate 2 and the fixed end plate 1 is increased; the included angle between the rotating end plate 2 and the fixed end plate 1 is adjusted according to the requirement.
In this embodiment, the included angle between the fixed end plate 1 and the rotating end plate 2 is accurately read by using an inclinometer, wherein the rotating range of the rotating end plate 2 is 0 to 20 °.
In a possible embodiment, one end of the fixed end plate 1 is hinged to one end of the rotating end plate 2 by a hinge 4.
In this embodiment, when the angle between the fixed end plate 1 and the rotating end plate 2 is adjusted, the rotating end plate 2 rotates about the pin shaft of the hinge 4.
In a possible embodiment, a sample rack 8 is arranged at the bottom of the infrared spectrometer sample chamber 7, a slot matched with the fixed end plate 1 is formed in the sample rack 8, and the fixed end plate 1 is inserted into the slot in the sample rack 8.
The mode of pegging graft is set to fixed end plate 1 and sample rack 8, when the contained angle between fixed end plate 1 and the rotating end plate 2 needs to be adjusted at every turn, conveniently takes out fixed end plate 1 from sample storehouse 7, conveniently inserts the measurement of carrying out sample infrared light luminousness on sample rack 8 after adjusting contained angle, has saved the measuring time of whole process.
In a possible embodiment, the top of the supporting platform 5 is a circular arc structure, and the circular arc top of the supporting platform 5 is coaxially arranged with the second infrared light transmitting hole 2-1.
In a possible embodiment, the inner diameter of the first infrared light transmitting hole 1-1 and the second infrared light transmitting hole 2-1 is 19 mm.
In a possible embodiment, the fixed end plate 1 and the rotating end plate 2 are made of stainless steel.
In this embodiment, set up fixed end plate 1 and rotating end plate 2 into stainless steel, can guarantee the stability and the life of sample platform, simple manufacture can also guarantee the simplicity and convenience of using simultaneously.
The utility model discloses a theory of operation: the utility model discloses an internal rotation or external rotation location adjusting screw 3, adjust the length of location adjusting screw 3 between fixed end plate 1 and the rotatory end plate 2, thereby adjust the contained angle between fixed end plate 1 and the rotatory end plate 2, when contained angle between fixed end plate 1 and the rotatory end plate 2 was adjusted and was finished and place in the sample storehouse of infrared spectrometer, place circular sample on convex brace table 5, open the infrared spectrometer, the infrared light sees through the sample on the rotatory end plate 2 in proper order, second infrared light on the rotatory end plate 2 passes through hole 2-1 and the first infrared light on the fixed end plate 1 and passes through hole 1-1 and reachs the left detector in sample storehouse 7, thereby measure the infrared transmittance under the sample multi-angle.
As can be seen from fig. 3 and 4, the utility model discloses can be directed against different materials, for example calcium fluoride window and potassium bromide window, accurately measure its infrared light luminousness under the condition of different infrared light incident angles (70.2 °, 80 °, 90 °).
The sample table is convenient, quick and flexible to mount in a sample bin, is widely applied, is not limited to mounting modes and positions listed in specific implementation modes, is not limited to an infrared transmission sample table, and is also suitable for other systems needing multi-angle rotation positioning. The detailed description is only for explanation and illustration of the technical solution of the present invention, and the scope of the claims should not be limited thereby. All changes which come within the meaning and range of equivalency of the claims are to be embraced within their scope.
Claims (6)
1. The utility model provides a precision adjustable type Fourier infrared spectroscopy sample platform of angle which characterized in that: comprises a fixed end plate (1), a rotating end plate (2), a positioning adjusting screw (3), a support table (5) and an adjusting stop block (6), a first infrared light transmission hole (1-1) is formed on the fixed end plate (1), a second infrared light transmission hole (2-1) and an adjusting through hole are longitudinally and sequentially formed on the rotating end plate (2), the supporting platform (5) and the adjusting stop block (6) are sequentially and longitudinally fixed on the outer plate surface of the rotating end plate (2), the supporting platform (5) is positioned below the second infrared light transmitting hole (2-1), a threaded hole is formed in the adjusting stop block (6), the threaded hole in the adjusting stop block (6) is coaxially arranged with the adjusting through hole in the rotating end plate (2), one end of the positioning adjusting screw rod (3) is screwed in a threaded hole on the adjusting stop block (6), and the adjusting through hole penetrates through the rotating end plate (2) to be abutted against the inner plate surface of the fixed end plate (1);
one end of the fixed end plate (1) is hinged with one end of the rotating end plate (2), and the other end of the fixed end plate (1) is arranged at the bin bottom of the infrared spectrometer sample bin (7).
2. The sample stage of the fourier infrared spectrometer with the precisely adjustable angle as claimed in claim 1, wherein: one end of the fixed end plate (1) is hinged with one end of the rotating end plate (2) through a hinge (4).
3. The sample stage of the fourier infrared spectrometer with the precisely adjustable angle as claimed in claim 2, wherein: the infrared spectrometer sample bin is characterized in that a sample rack (8) is arranged at the bin bottom of the infrared spectrometer sample bin (7), a slot matched with the fixed end plate (1) is formed in the sample rack (8), and the fixed end plate (1) is inserted into the slot in the sample rack (8).
4. The sample stage of the Fourier infrared spectrometer with the precisely adjustable angle of claim 3, wherein: the table top of the supporting table (5) is of an arc-shaped structure, and the arc-shaped table top of the supporting table (5) and the second infrared light transmission hole (2-1) are coaxially arranged.
5. The sample stage of the Fourier infrared spectrometer with the precisely adjustable angle as claimed in claim 4, wherein: the inner diameters of the first infrared light transmission hole (1-1) and the second infrared light transmission hole (2-1) are 19 mm.
6. The sample stage of the Fourier infrared spectrometer with the precisely adjustable angle as claimed in claim 5, wherein: the fixed end plate (1) and the rotating end plate (2) are made of stainless steel.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202220333320.9U CN217212217U (en) | 2022-02-18 | 2022-02-18 | Sample table of Fourier infrared spectrometer with precisely adjustable angle |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202220333320.9U CN217212217U (en) | 2022-02-18 | 2022-02-18 | Sample table of Fourier infrared spectrometer with precisely adjustable angle |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN217212217U true CN217212217U (en) | 2022-08-16 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202220333320.9U Active CN217212217U (en) | 2022-02-18 | 2022-02-18 | Sample table of Fourier infrared spectrometer with precisely adjustable angle |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN217212217U (en) |
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2022
- 2022-02-18 CN CN202220333320.9U patent/CN217212217U/en active Active
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