CN217156364U - Solid state disk reliability test box - Google Patents

Abstract

The application relates to the field of solid state disk tests, in particular to a solid state disk reliability test box, wherein a test box door is connected with a test box body; the fan and the second air duct are positioned on one side of the test space of the test box body, and the first air duct and the hard disk bracket are positioned on the other side of the test space; an air inlet of the fan faces the second air duct, and an air outlet of the fan faces the first air duct; an air inlet of the first air channel is adjacent to the fan, and an air outlet of the first air channel deviates from the fan; an air inlet of the second air duct faces to the area where the hard disk bracket is located, and an air outlet of the second air duct faces to the fan; the air deflector is connected to the area where the hard disk bracket is located from the air outlet of the first air channel, and the air deflector protrudes from two sides to the middle towards the direction far away from the first air channel and the hard disk bracket so as to be arc-shaped; the computer is located in the test space and used for being connected with the solid state disk placed on the hard disk bracket. The cooling air flow with basically the same intensity can be applied to the solid state disk located at different positions.

Description

Solid state disk reliability test box

Technical Field

The application relates to the field of solid state disk tests, in particular to a solid state disk reliability test box.

Background

The enterprise-level solid state disk has higher reliability requirements, and high and low temperature tests are required to verify the working conditions of the solid state disk in different temperature environments.

The high-low temperature test comprises the steps of enabling the solid state disk to continuously work at the environment temperature of 80 ℃, and observing the data error rate and IO processing performance of the solid state disk; for example, under the environment temperature of 20 ℃, the solid state disk is enabled to continuously work, and the data error rate and the IO processing performance of the solid state disk are observed; and continuously changing the environmental temperature to enable the solid state disk to continuously work, and observing the data error rate, IO processing performance and the like.

The solid state disk reliability test box provides a test environment for high and low temperature tests. The solid state disk reliability test box can contain a plurality of solid state disks. The solid state disk reliability test box comprises a computer, and is used for connecting a plurality of solid state disks, enabling the solid state disks to continuously work by submitting IO commands to the solid state disks, and detecting the performance and the data error rate of the solid state disks.

In order to improve the efficiency of the high and low temperature tests, it is desirable to accommodate as many solid state disks as possible in the solid state disk reliability test box, and at the same time, the ambient temperatures of the solid state disks are required to be substantially the same, so that the solid state disks can obtain consistent test conditions.

However, the solid state disk generates heat during operation, which tends to increase the ambient temperature. Therefore, in the reliability test box of the solid state disk, the ambient temperature of the solid state disk is controlled by controlling the intensity of the cooling air flow applied to the solid state disk. However, when a plurality of solid state disks are accommodated in the solid state disk reliability test box, cooling air flows with substantially the same intensity are applied to the solid state disks at different positions, so as to ensure that the solid state disks at different positions can be cooled with the same intensity, and further obtain the same ambient temperature, so as to ensure the performance of high and low temperature tests.

Therefore, how to apply cooling air flows with substantially the same intensity to solid state disks located at different positions is a technical problem to be solved by those skilled in the art.

SUMMERY OF THE UTILITY MODEL

The application provides a solid state hard drives reliability test case can hold polylith solid state hard drives in solid state hard drives reliability test case to can also exert the cooling air current that intensity is the same basically to the solid state hard drives that are located different positions.

In order to solve the technical problem, the application provides the following technical scheme:

a solid state disk reliability test box, comprising: the device comprises a test box body, a test box door, a fan, a first air duct, a second air duct, a hard disk bracket, an air deflector and a computer; the test box body is provided with a box opening, and the test box door is connected with the test box body and can close or open the box opening of the test box body; the fan and the second air duct are positioned on one side of the test space of the test box body, the first air duct and the hard disk bracket for accommodating the solid state disk are positioned on the other side of the test space, the fan and the first air duct are arranged in one row, and the hard disk bracket and the second air duct are arranged in the other row; an air inlet of the fan faces the second air duct, and an air outlet of the fan faces the first air duct; an air inlet of the first air channel is adjacent to the fan, and an air outlet of the first air channel deviates from the fan; an air inlet of the second air duct faces to the area where the hard disk bracket is located, and an air outlet of the second air duct faces to the fan; the air deflector is connected to the area where the hard disk bracket is located from the air outlet of the first air channel, and the air deflector gradually protrudes from two sides to the middle in the direction away from the air outlet of the first air channel and the area where the hard disk bracket is located, so that the air deflector is in a protruding arc shape; the computer is located in the test space and is used for being connected with the solid state disk placed on the hard disk bracket so as to provide power and IO commands for the solid state disk.

The solid state disk reliability test chamber as described above, wherein preferably, an inner door is provided between the hard disk bracket and the test chamber door, and a lower edge of the inner door extends to the bottom of the test chamber body and an upper edge of the inner door extends to the top of the test chamber body, so as to form a first air duct between the inner door and the test chamber door; or an inner door is arranged between the hard disk bracket and the test box door, the lower edge of the inner door extends to the bottom of the test box body, and the upper edge of the inner door extends to the top of the test box body; first wind channel sets up between interior door and test chamber door.

The solid state disk reliability test box as described above, wherein preferably, the hard disk carrier includes a back plate and a plurality of tray assemblies for holding the solid state disks; one side of the back plate faces the first air duct, and the other side of the back plate faces the computer; the tray assemblies are arranged in rows and columns on one side of the back plate facing the first air duct.

The solid state disk reliability test chamber as described above, wherein preferably, the tray assembly includes a tray frame and a plurality of trays; the tray frame is fixed on the back plate, and a part close to the back plate forms a space communicated up and down so as to accommodate a cable for connecting the computer and the solid state disk; the part of the tray frame far away from the back plate comprises a plurality of trays, and the plurality of trays form a plurality of tray spaces from top to bottom.

The solid state disk reliability test box as described above, wherein, preferably, a handle bar protrudes at the edge of the tray far from the backboard.

The solid state disk reliability test chamber as described above, wherein, preferably, a stopper is provided above the handle bar to occupy or fill a space in an upper portion of the handle bar.

The solid state disk reliability test chamber as described above, wherein, preferably, the stopper is fixed on a side of the inner door facing the handle bar, and the stopper is located above the handle bar when the inner door is closed.

In the above test chamber for testing reliability of a solid state disk, preferably, the stopper is inclined to be convex toward the tray from a direction toward the air deflector to a direction away from the air deflector.

The solid state disk reliability test box as described above, preferably, the stopper is a prism whose cross section is a right triangle, and a side surface corresponding to one right-angle side faces the inner door, and a side surface corresponding to one right-angle side is perpendicular to the inner door, and a side surface corresponding to the oblique side gradually inclines to a side facing the tray from a side facing the air deflector to a side far away from the air deflector.

The solid state disk reliability test chamber as described above, wherein preferably, the computer is located on the same side of the test space as the first air duct and the disk tray, and the computer is located away from the first air duct and close to the disk tray.

The solid state disk test box as described above, wherein the stopper is preferably provided only at the handle bar of the tray of the column of tray assemblies adjacent to the air deflector.

The solid state disk reliability test box as described above, wherein, preferably, the wind shield is closed at a portion of the tray frame near the back plate to shield the cable space.

The solid state disk reliability test chamber as described above, wherein the filling layer is preferably provided in the gap between adjacent tray assemblies arranged in a column, and the extending direction of the filling layer is the same as the direction of the lateral arrangement of the tray assemblies.

The solid state disk reliability test chamber as described above, wherein, preferably, a filling layer is provided in a gap between the tray assembly of the uppermost layer and the top of the test chamber, and a filling layer is provided in a gap between the tray assembly of the lowermost layer and the bottom of the test chamber.

The solid state disk reliability test chamber as described above, wherein the filling layer is preferably fixed to the back plate or the inner door of the tray assembly.

The solid state disk reliability test box as described above, preferably, the air deflector has two air deflectors, one side edge of one of the air deflectors is connected to one side of the air outlet of the first air duct, which is close to the test box door, and the other side edge of the air deflector is connected to one side of the area where the hard disk bracket is located, which is far away from the test box door; one side of the other air deflector is connected to the middle of the air outlet of the first air duct, and the edge of the other side of the air deflector is connected to the middle of the area where the hard disk bracket is located.

The solid state disk reliability test box comprises a solid state disk, a hard disk bracket, a fan, a; the position between the two air deflectors and the area joint where the hard disk bracket is located is opposite to the position of the tray on the tray assembly.

The reliability test chamber for the solid state disk as described above, wherein preferably, the air inlet of the second air duct is gradually reduced from the outside to the inside.

The solid state disk reliability test chamber as described above, wherein the flow equalizing plate is preferably arranged downstream of the first air duct.

In the solid state disk reliability test chamber, preferably, the flow equalizing plate is provided with flow equalizing holes facing different directions.

The solid state disk reliability test box as described above, wherein, in each row of flow equalizing holes, two adjacent flow equalizing holes respectively form an included angle with the direction of the cooling air flowing through the first air duct, which is axisymmetric with respect to the air flow direction of the first air duct.

The solid state disk reliability test box as described above, wherein preferably, one side of the test space is provided with a fan frame, and the plurality of fans are vertically arranged on the fan frame and are vertically arranged.

In the solid state disk reliability test chamber, it is preferable that a hard disk tray partition plate having an extending direction identical to a transverse arrangement direction of the tray assembly is provided in an area where the hard disk tray is located, so as to divide the area where the hard disk tray is located into two mutually isolated areas distributed up and down.

In the solid state disk reliability test chamber, preferably, a first air duct partition plate having the same extending direction as the first air duct is provided in the first air duct to divide the first air duct into two mutually isolated regions distributed vertically.

In the solid state disk reliability test box described above, preferably, the fan frame is provided with 4 fans arranged in the vertical direction, the first air duct partition plate divides the first air duct into a first area and a second area which are distributed vertically, the cooling air flow blown by the two fans above in the vertical direction flows only through the first area, and the cooling air flow blown by the two fans above in the vertical direction flows only through the second area.

The reliability test box for solid state disk as described above preferably further comprises: and the heat dissipation device is arranged around the fan and used for transferring heat carried in the airflow flowing back to the fan to the outside of the test box body.

Compared with the background art, the solid state disk reliability test box can contain a plurality of solid state disks in the solid state disk reliability test box, and can apply cooling airflow with basically the same strength to the solid state disks at different positions.

Drawings

In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings needed to be used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments described in the present application, and other drawings can be obtained by those skilled in the art according to the drawings.

FIG. 1 is a front view of a solid state disk reliability test box provided in an embodiment of the present application;

FIG. 2 is a top view of a solid state disk reliability test box provided in an embodiment of the present application;

FIG. 3 is a perspective view of a hard disk tray provided in an embodiment of the present application;

FIG. 4 is a perspective view of a tray assembly provided by embodiments of the present application;

FIG. 5A is a front view of a hard disk carrier provided with a filler layer according to an embodiment of the present disclosure;

FIG. 5B is a perspective view of a hard disk tray provided with a filler layer according to an embodiment of the present disclosure;

FIG. 6A is a left side view of a solid state disk reliability test box provided with a stopper according to an embodiment of the present application;

FIG. 6B is a top view of a solid state disk reliability test box provided with a stopper according to an embodiment of the present application;

FIG. 7 is a top view of a solid state disk reliability test box provided with a plurality of air deflectors according to an embodiment of the present application;

fig. 8A is a top view of a solid state disk reliability test box provided with a current equalizing plate according to an embodiment of the present application;

fig. 8B is a perspective view of a flow equalizing plate provided in the embodiments of the present application;

FIG. 8C is a left side view of a solid state disk reliability test chamber provided with a flow equalization plate according to an embodiment of the present application;

FIG. 9A is a front view of a solid state disk reliability test box provided with a hard disk tray divider according to an embodiment of the present application;

fig. 9B is a left side view of a solid state disk reliability test box provided with a first air duct separation plate according to an embodiment of the present application.

Detailed Description

Reference will now be made in detail to embodiments of the present application, examples of which are illustrated in the accompanying drawings, wherein like or similar reference numerals refer to the same or similar elements or elements having the same or similar function throughout. The embodiments described below with reference to the drawings are exemplary only for the purpose of explaining the present application and are not to be construed as limiting the present application.

Referring to fig. 1 and fig. 2, fig. 1 is a front view of a solid state disk reliability test box provided in an embodiment of the present application, and fig. 2 is a top view of the solid state disk reliability test box provided in the embodiment of the present application.

The application provides a solid state hard drives reliability test case, include: the test box comprises a test box body 110, a test box door 120, a fan 130, a first air duct 140, a second air duct 150, a hard disk bracket 160, an air deflector 170, a computer 180 and a heat dissipation device (not shown in the figure).

The test box 110 has a test space for testing the reliability of the solid state disk, and the test box 110 has a box opening for placing the solid state disk in the test space or taking out the solid state disk from the test space. The test chamber door 120 is connected to the test chamber body 110, and may close a chamber opening of the test chamber body 110 or may open a chamber opening of the test chamber body 110. Therefore, when the solid state disk is subjected to high and low temperature tests, the box opening of the test box body 110 is closed, so that the test space can become a closed space, and before the test starts or after the test finishes, the box opening of the test box body 110 is opened, and the solid state disk is put into the box opening or taken out of the box opening.

As an example, the test chamber 110 is a square or rectangular parallelepiped chamber, and the chamber opening is located on one side wall of the test chamber 110, and the test chamber door 120 is hinged to the test chamber 110 to rotatably open or close the chamber opening of the test chamber 110. As another example, a transparent window is disposed on the test chamber door 120 to facilitate observation of the solid state disk in the high and low temperature test on the hard disk bracket 160.

The fan 130 and the second air duct 150 are located at one side of the test space, the first air duct 140 and the hard disk bracket 160 for accommodating the solid state disk are located at the other side of the test space, and the fan 130 and the first air duct 140 are arranged in one row, and the hard disk bracket 160 and the second air duct 150 are arranged in the other row. Moreover, the air inlet of the fan 130 faces the second air duct 150, and the air outlet of the fan 130 faces the first air duct 140; an air inlet of the first air duct 140 faces the fan 130, and an air outlet of the first air duct 140 faces away from the fan 130; an air inlet of the second air duct 150 faces the area where the hard disk bracket 160 is located, and an air outlet of the second air duct 150 faces the fan 130. Since the first air duct 140 and the hard disk bracket 160 are arranged in different rows, the cooling airflow blown out from the air outlet of the first air duct 140 needs to change the direction (180 degrees) before being blown into the area where the hard disk bracket 160 is located, which causes the cooling airflow turned from the air outlet of the first air duct 140 to provide resistance to the cooling airflow located at the area where the hard disk bracket 160 is located, so that the air deflector 170 is connected to the area where the hard disk bracket 160 is located from the air outlet of the first air duct 140, and the air deflector 170 gradually protrudes from both sides to the middle in the direction away from the air outlet of the first air duct 140 and the area where the hard disk bracket 160 is located, so that the air deflector 170 is in a protruding arc shape, and the arc-shaped air deflector 170 is arranged to guide the cooling airflow to turn, thereby reducing the wind resistance when the cooling airflow turns.

As an example, the test space in the test case 110 of a square or rectangular parallelepiped is divided into four spaces extending in the vertical direction; the fan 130 and the second air duct 150 are positioned in two spaces at one side of the test space, the second air duct 150 is positioned in a space far away from the box opening, and the fan 130 is positioned in a space near the box opening; the first air duct 140 and the hard disk bracket 160 are located in two spaces on the other side of the test space, the hard disk bracket 160 is located in a space far away from the box opening, and the first air duct 140 is located in a space near the box opening.

The computer 180 is located in the test space and is used for being connected with the solid state disk placed on the hard disk bracket 160 to provide power and IO commands for the solid state disk to perform high and low temperature tests. As an example, the computer 180 is located on the same side of the test space as the first air chute 140 and the hard disk tray 160, and the computer 180 is located away from the first air chute 140 and close to the hard disk tray 160. During high and low temperature tests, the solid state disk is horizontally placed on the disk bracket 160 (perpendicular to the plane shown in fig. 1), and the cable connected with the solid state disk is led out from one side of the disk bracket 160 close to the computer 180 and is connected to the computer 180.

The fan 130 blows out the cooling airflow from the air outlet thereof, and flows into the first air duct 140 from the air inlet of the first air duct 140, and then flows out from the air outlet of the first air duct 140, and changes the direction of the cooling airflow through the air deflector 170, so as to guide the cooling airflow to the area where the hard disk bracket 160 is located, the cooling airflow flows through each solid state disk on the hard disk bracket 160, then flows into the second air duct 150 from the air inlet of the second air duct 150, and then flows out from the air outlet of the second air duct 150, and flows back to the fan 130 through the air inlet of the fan 130, thereby forming airflow circulation.

The heat dissipation device is located in the test space and around the fan 130, so as to transfer heat carried in the cooling air flow flowing back to the fan 130 to the outside of the test box body 110, and play a role in cooling the solid state disk located in the test space.

Optionally, a fan frame 190 is disposed at one side of the test space, and the fan 130 is disposed on the fan frame 190 to support the fan 130. As an example, the fan rack 190 may accommodate a plurality of fans 130 in a vertical orientation to provide a more uniform cooling airflow when the test space is large. For example: the blower housing 190 accommodates 4 blowers 130 in the vertical direction. In addition, the rotation speed of the fan 130 is, for example, 800rpm to 1500 rpm. In addition, wind speeds of up to 7-10m/s are expected near hard disk carrier 160 to provide sufficient cooling airflow for solid state disks placed on hard disk carrier 60.

As an alternative, an inner door 210 is provided between the hard disk tray 160 and the test chamber door 120, and a lower edge of the inner door 210 extends to the bottom of the test chamber body 110 and an upper edge of the inner door 210 extends to the top of the test chamber body 110, thereby forming the first air passage 140 between the inner door 210 and the test chamber door 120. As a further alternative, an inner door 210 is provided between the hard disk tray 160 and the test chamber door 120, and a lower edge of the inner door 210 extends to the bottom of the test chamber body 110, and an upper edge of the inner door 210 extends to the top of the test chamber body 110; the first air duct 140 is disposed between the inner door 210 and the test chamber door 120. In this alternative, the first air chute 140 is a separate component.

On the basis, the inner door 210 is tightly attached to the hard disk bracket 160, so as to eliminate the gap between the inner door 210 and the hard disk bracket 160 as much as possible, and avoid the turbulent flow of the cooling air flow in the area where the hard disk bracket 160 is located as much as possible.

In addition, the inner door 210 may be hinged to the inner wall of the test chamber 110 to rotatably open or close the inner door 210, thereby facilitating the insertion or removal of the solid state disk. Through the arrangement of the inner door 210, the cooling air flowing through the first air duct 140 can be prevented from directly entering the area where the hard disk bracket 160 is located through the area where the inner door 210 is located, so that the cooling air flow in the area where the hard disk bracket 160 is located can be prevented from flowing randomly, and the uniformity of the air speed and the direction of the cooling air flow around each solid state disk on the hard disk bracket 160 is ensured.

Optionally, the hard disk tray 160 may accommodate a plurality of solid state disks to improve the efficiency of the solid state disk reliability test box for high and low temperature tests, for example: hard disk carrier 160 may hold 64 solid state disks or 128 solid state disks for simultaneous high and low temperature testing. Each small rectangle within the hard disk carrier 160 as shown in fig. 1 represents a location to accommodate 1 solid state disk.

Referring to fig. 3, fig. 3 is a perspective view of a hard disk tray according to an embodiment of the present disclosure.

The hard disk bracket 160 comprises a back plate 161 and a plurality of tray assemblies 162 for containing solid state disks; one side of the back plate 161 faces the first air duct 140, and the other side of the back plate 161 faces the computer 180; the tray assemblies 162 are arranged in rows and columns on the side of the back plate 161 facing the first air duct 140 to separate the computer 180 from the tray assemblies 162 containing the solid state disks, thereby avoiding the computer from being in a high and low temperature test environment of the solid state disks. In addition, the tray assemblies 162 are arranged in rows and columns on the side of the back plate 161 facing the first air duct 140, so that corresponding trays of adjacent tray assemblies 162 arranged laterally are at the same height, thereby facilitating the flow of cooling air over each solid state disk placed on the tray, and also reducing obstruction to the cooling air flow, thereby reducing the effect of turbulence on the velocity of the cooling air flow. As an example, the hard disk tray 160 has 16 tray assemblies 162, 4 tray assemblies 162 arranged in a row, and 4 tray assemblies 162 arranged in a column. For example: as shown in fig. 1, one of the rows of tray assemblies 162 may form one zone, with four zones from top to bottom.

Referring to fig. 4, fig. 4 is a perspective view of a tray assembly according to an embodiment of the present disclosure.

The tray assembly 162 includes a tray frame 1621 and a plurality of trays 1622; the tray frame 1621 is fixed to the back plate 161, for example: a structure for fixedly mounting the tray frame 1621 is provided on the back plate 161, and the tray frame 1621 is fixed on the back plate 161 by the structure; and a part close to the back plate 161 forms a cable space which is communicated up and down to accommodate a cable for connecting the computer 180 and the solid state disk; and a portion away from the back plate 161 forms a plurality of tray spaces from top to bottom so that one tray space is provided with one tray 1622. Since each tray assembly 162 has one cable space and a plurality of tray spaces, all tray spaces of one tray assembly 162 share one cable space to accommodate cables connecting solid state disks on trays 1622 in the plurality of tray spaces in one cable space. For example: each tray assembly 162 has four trays 1622, the tray frame 1621 of each tray assembly 162 forms four tray spaces from top to bottom, one tray 1622 is disposed in one tray space, and a solid state disk can be placed on each tray 1622. The plurality of tray assemblies 162 of the hard disk tray 160 are disposed to be identical to each other, which facilitates the production of the manufacturing tray assemblies 162.

In addition, the tray 1622 may be fixedly disposed in the tray space, and the tray 1622 may be slidably disposed in the tray space. When the tray 1622 is disposed in the tray space in a push-and-pull manner, a handle bar 1623 may protrude from an edge of the tray 1622 away from the back plate 161, that is, the handle bar 1623 protrudes toward the inner door 210, so as to push or pull the tray 1622 and the solid state disk carried thereby into or out of the tray space.

The thickness of the solid state disk is, for example, 7mm or 15mm, and a sufficient distance (for example, 30mm to 40mm) needs to be reserved between two adjacent trays 1622 arranged in a column, so that after the solid state disk is accommodated, a sufficient gap exists between the upper surface of the solid state disk and the tray 1622 adjacent to the upper surface of the solid state disk to flow through the cooling airflow. In addition, to facilitate cooling airflow across the surface of the solid state disk to enhance heat dissipation from the solid state disk, tray 1622 is, for example, a hollow frame structure (e.g., the middle of the side of tray 1622 carrying the solid state disk is hollow), and the hollow frame structure also facilitates reducing the weight of tray 1622 and tray assembly 162.

Referring to fig. 5A, fig. 5A is a front view of a hard disk tray provided with a filling layer according to an embodiment of the present disclosure.

Due to the spacing between adjacent tray assemblies 162 in the row, the cooling airflow entering the area of the hard disk tray 160 tends to form turbulence as it exits one tray assembly 162 and enters the next tray assembly 162, thereby affecting (reducing) the velocity of the cooling airflow around the tray assembly 162 of the hard disk tray 160 that enters the second air duct 150.

In this regard, the filling layer 220 is disposed in the gaps between the adjacent tray modules 162 arranged in a row, and the filling layer 220 extends in the same direction as the transverse arrangement of the tray modules 162, so that the cooling air flow does not substantially flow through the gaps between the adjacent tray modules 162 arranged in a row. And a filler layer 220 is also provided in the gap between the uppermost tray assembly 162 and the top of the test housing 110, and a filler layer 220 is also provided in the gap between the lowermost tray assembly 162 and the bottom of the test housing 110. The filling layer 220 is, for example, a separator. Moreover, the filling layer in fig. 5A may also be fixed on the back plate 1621 of the tray assembly 162 or on the inner door 210, so that the filling layer 220 is more stable and the position and state of the filling layer are not affected by the cooling airflow.

And the gap between two adjacent tray assemblies 162 in the row arrangement, but keeping the gap between two adjacent tray assemblies 162 in the row arrangement too large (e.g., 10mm or less) reduces the distance over which the cooling air flows and also increases the density of solid state disks within test enclosure 110. In addition, the gap between two adjacent tray assemblies 162 arranged in a row may be maintained only for the purpose of facilitating the installation of the tray assemblies 162.

Referring to fig. 5B, fig. 5B is a perspective view of a hard disk tray provided with a filling layer according to an embodiment of the present disclosure.

To prevent turbulence of the cooling airflow entering the cable space, a wind shield 230 is also closed at a portion of the tray frame 1621 adjacent to the back plate 161 to shield the cooling airflow from entering the cable space. For example: the wind deflectors 230 extend in the same direction as the column arrangement direction of the tray assembly 162, and the wind deflectors 230 are located on both sides of the tray frame 1621.

Referring to fig. 6A, fig. 6A is a left side view of the reliability test box for a solid state disk provided with a stopper according to the embodiment of the present application.

Fluid tests show that the gap between the inner door 210 and the hard disk bracket 160 also generates turbulent flow, and causes the wind speed of cooling air flow passing through part of the solid hard disks to be reduced, and the problem of uneven flow rate of the cooling air flow is caused.

In this regard, the inner door 210 is positioned as close as possible to the hard disk tray 160 when it is closed, to reduce or eliminate the gap between the inner door 210 and the hard disk tray 160. However, since each tray 1622 of the hard disk tray 160 has the protruding handle bar 1623, a space exists in an upper portion of the handle bar 1623 even if the solid state disk is placed on the tray 1622. The presence of this space causes part of the cooling air flow to enter the space, thereby reducing the velocity of the cooling air flow over the surface of the solid state disk and also causing turbulence. Accordingly, a stop 240 is provided above the pull bar 1623 to occupy or fill space above the pull bar 1623 to reduce turbulence and help increase the velocity of the airflow across the surface of the solid state disk.

Alternatively, the stopper 240 is fixed to a side of the inner door 210 facing the handle bar 1623 such that the stopper 240 is positioned just above the handle bar 1623 when the inner door 210 is closed.

Referring to fig. 6B, fig. 6B is a top view of a solid state disk reliability test box with a stopper according to an embodiment of the present application.

The baffle 240 gradually inclines convexly toward the tray 1622 from the direction toward the air deflector 170 to the direction away from the air deflector 170, so that the baffle 240 guides the flow of the cooling air toward the solid state disk in the area where the solid state disk is located toward the tray 1622.

Optionally, the stopper 240 is set to be a prism with a right triangle cross section, and a side surface corresponding to a right-angle side faces the inner door 210, and a side surface corresponding to a hypotenuse inclines gradually to a side facing the tray 1622 from a side facing the air deflector 170 to a side away from the air deflector 170, so that the cooling air flow blows to the stopper 240 from the side of the air deflector 170, and flows through the diversion of the side surface corresponding to the hypotenuse of the stopper 240, so that the cooling air flow flows to the area where the solid-state disk is located.

Still alternatively, the stops 240 are provided only at the handle bars 1623 of the trays 1622 of the column of tray assemblies 162 adjacent to the air deflection plates 170 to reduce the number of stops 240 and cost. Optionally, a stop 240 may also be provided at the handle bar 1623 of each tray 1622.

Referring to fig. 7, fig. 7 is a top view of a solid state disk reliability test box provided with a plurality of air deflectors according to an embodiment of the present application.

The number of the air deflectors 170 connected to the area where the hard disk tray 160 is located through the air outlet of the first air duct 140 may be 1 or more. For example: in fig. 7, the solid line arc 3 is an example of a single wind deflector, the 2 dashed lines (1, 2) are examples of a plurality of wind deflectors, and both the wind deflectors shown in solid and dashed lines may be present.

Preferably, in the case of a single air deflector 170, one side edge of the air deflector 170 is connected to the side of the first air duct 140 close to the test chamber door 120, so as to avoid the occurrence of air flow with different directions in the area where the hard disk tray 160 is located.

Still preferably, in an example of the plurality of air deflectors 170, one side edge of one of the air deflectors 170 is connected to one side of the first air duct 140 close to the test chamber door 120, and the other side edge of the air deflector 170 is connected to one side of the area where the hard disk bracket 160 is located away from the test chamber door 120; one side of the other air deflector 170 is connected to the middle of the first air duct 140, the other side edge of the air deflector 170 is connected to the middle of the region where the hard disk bracket 160 is located, and the distance between the connection positions of the two air deflectors 170 and the region where the hard disk bracket 160 is located is set to be substantially the same as the length of the solid state disk and to be opposite to the long-side region of the solid state disk, so that the cooling air flow integrally passes through the surface of the solid state disk.

In addition, the air inlet of the second air duct 150 is gradually reduced from the outside to the inside thereof, so that the second air duct 150 collects the cooling air flowing out from the region where the hard disk tray 160 is located.

Referring to fig. 8A, fig. 8A is a top view of a solid state disk reliability test box with a current equalizing plate according to an embodiment of the present disclosure.

It was also found from the analysis of the air flow that, since the plurality of fans 130 are present in the test chamber 110, the cooling air flow velocity is large in the area near the outlet of the fan 130 and small in the area far from the outlet of the fan 130, and the uniformity of the cooling air flow blown into the area where the hard disk tray 160 is located is affected.

For this reason, through the experiment of the fluid, a flow equalizing plate 250 is further disposed downstream of the first air duct 140 (rather than at the upstream position adjacent to the air outlet of the first air duct 140), and the flow equalizing plate 250 is perpendicular to the extending direction of the first air duct 140, that is, the flow equalizing plate 230 is perpendicular to the flowing direction of the cooling air entering the first air duct 140, so as to increase the uniformity of the cooling air. Here, the downstream of the first air duct 140 refers to, for example, the middle position or the more right position of the first air duct 140 in the left-right direction in fig. 8A.

Referring to fig. 8B, fig. 8B is a perspective view of a flow equalizing plate according to an embodiment of the present disclosure.

The flow equalizing plate 250 is provided with flow equalizing holes 251 facing different directions, so that resistance in different directions is different through the flow equalizing holes 251 facing different directions, and the purpose of rectification is achieved. Fluid tests on the air flow show that the air flow rate of the cooling air flow in the area of the hard disk bracket 160 close to the second air duct 150 can be remarkably improved by arranging the flow equalizing plate 251.

Optionally, in each row of the flow equalizing holes 251, two adjacent flow equalizing holes 251 respectively form an angle with the direction of the cooling air flow flowing through the first air duct 140, and the angle is axisymmetrical with respect to the direction of the cooling air flow in the first air duct 140. For example: one of the two adjacent uniform flow holes 251 is directed obliquely upward, and the other uniform flow hole 251 is directed obliquely downward. Alternatively, the flow equalization plate 250 may have a thickness of, for example, 20mm, a porosity of, for example, 0.6, an inertial resistance coefficient of 1000, and a viscous resistance coefficient of 100000000.

Referring to fig. 8C, fig. 8C is a left side view of a solid state disk reliability test box with a current equalizing plate according to an embodiment of the present application.

In order to make the flow rate of the cooling air flow in the first air duct 140 uniform as much as possible, optionally, the edge of the flow equalizing plate 250 extends to the inner wall of the first air duct 140, that is, the flow equalizing plate 250 divides the first air duct 140 into two parts.

Referring to fig. 9A, fig. 9A is a front view of a solid state disk reliability test chamber provided with a hard disk tray separator according to an embodiment of the present application.

A hard disk tray partition plate 260 having the same extension direction as the horizontal arrangement direction of the tray units 162 is provided in the region where the hard disk tray 160 is located to partition the region where the hard disk tray is located into two separated regions distributed up and down, so as to enhance the uniformity of the cooling air flow in the region where the hard disk tray 160 is located.

Referring to fig. 9B, fig. 9B is a left side view of the solid state disk reliability test box provided with the first air duct splitter plate according to the embodiment of the present application.

The first air duct 140 is provided with a first air duct partition plate 270 having the same extending direction as the first air duct 140, so as to divide the first air duct 140 into two mutually isolated regions distributed vertically, thereby enhancing the uniformity of the cooling air flow in the first air duct 140.

In the fluid test of the air flow, an attempt was made to provide one first air duct separation plate 270 in the first air duct 140 corresponding to each fan 130 (an independent air duct is provided for each fan 130 through 3 first air duct separation plates 270), and as a result, it was found that, since the air speed at different positions of the air outlet of the fan 130 is significantly different, the scheme of corresponding each fan 130 to an independent air duct maintains the characteristic of the variation of the air speed with the position in the space, which results in extremely poor uniformity of the air speed in the whole air duct area and a reduction of the air speed flowing through the area where the hard disk bracket 160 is located.

Moreover, it is found that the uneven wind speeds of the wind outlets of the 2 fans 130 may cancel each other or affect each other, so that the wind speed uniformity in the wind channel is improved, and further, the wind speed and the wind speed in the area where the hard disk bracket 160 is located are improved, that is, it is advantageous that only one first wind channel partition plate 270 is arranged in the middle of the first wind channel 140, so that only one first wind channel partition plate 270 is arranged in the first wind channel 140 in the present application, and the first wind channel partition plate 270 is located in the middle of the first wind channel 140, so as to separate the cooling airflows of the upper 2 fans 130 from the lower 2 fans 130 by the first wind channel partition plate 270, and the uniformity of the wind speeds at different positions in the wind channel area is significantly improved, so as to further enhance the uniformity of the cooling airflow in the first wind channel 140.

It will be evident to those skilled in the art that the present application is not limited to the details of the foregoing illustrative embodiments, and that the present application may be embodied in other specific forms without departing from the spirit or essential attributes thereof. The present embodiments are therefore to be considered in all respects as illustrative and not restrictive, the scope of the application being indicated by the appended claims rather than by the foregoing description, and all changes which come within the meaning and range of equivalency of the claims are therefore intended to be embraced therein. Any reference sign in a claim should not be construed as limiting the claim concerned.

Furthermore, it should be understood that although the present description refers to embodiments, not every embodiment may contain only a single embodiment, and such description is for clarity only, and those skilled in the art should integrate the description, and the embodiments may be combined as appropriate to form other embodiments understood by those skilled in the art.

Claims (10)

1. The utility model provides a solid state hard drives reliability test case which characterized in that includes: the device comprises a test box body, a test box door, a fan, a first air duct, a second air duct, a hard disk bracket, an air deflector and a computer;

the test box body is provided with a box opening, and the test box door is connected with the test box body and can close or open the box opening of the test box body;

the fan and the second air duct are positioned on one side of the test space of the test box body, the first air duct and the hard disk bracket for accommodating the solid state disk are positioned on the other side of the test space, the fan and the first air duct are arranged in one row, and the hard disk bracket and the second air duct are arranged in the other row;

an air inlet of the fan faces the second air duct, and an air outlet of the fan faces the first air duct; an air inlet of the first air channel is adjacent to the fan, and an air outlet of the first air channel deviates from the fan; an air inlet of the second air duct faces to the area where the hard disk bracket is located, and an air outlet of the second air duct faces to the fan;

the air deflector is connected to the area where the hard disk bracket is located from the air outlet of the first air channel, and the air deflector gradually protrudes from two sides to the middle in the direction away from the air outlet of the first air channel and the area where the hard disk bracket is located, so that the air deflector is in a protruding arc shape;

the computer is located in the test space and is used for being connected with the solid state disk placed on the hard disk bracket so as to provide power and IO commands for the solid state disk.

2. The solid state disk reliability test chamber of claim 1, wherein an inner door is disposed between the hard disk bracket and the test chamber door, and a lower edge of the inner door extends to the bottom of the test chamber body and an upper edge of the inner door extends to the top of the test chamber body to form a first air channel between the inner door and the test chamber door;

or an inner door is arranged between the hard disk bracket and the test box door, the lower edge of the inner door extends to the bottom of the test box body, and the upper edge of the inner door extends to the top of the test box body; first wind channel sets up between interior door and test chamber door.

3. The solid state disk reliability test box of claim 2, wherein the hard disk bracket comprises a back plate and a plurality of tray assemblies for holding the solid state disks;

one side of the back plate faces the first air duct, and the other side of the back plate faces the computer; the tray assemblies are arranged in rows and columns on one side of the back plate facing the first air duct.

4. The solid state disk reliability test chamber of claim 3, wherein the tray assembly comprises a tray frame and a plurality of trays;

the tray frame is fixed on the back plate, and a part close to the back plate forms a space communicated up and down so as to accommodate a cable for connecting the computer and the solid state disk;

the part of the tray frame far away from the back plate comprises a plurality of trays, and the plurality of trays form a plurality of tray spaces from top to bottom.

5. The test chamber for testing the reliability of the solid state disk as claimed in claim 4, wherein a filling layer is disposed in the gap between the adjacent tray assemblies arranged in the column, and the filling layer extends in the same direction as the transverse arrangement direction of the tray assemblies.

6. The solid state disk reliability test chamber according to any one of claims 1 to 5, wherein the number of the air deflectors is two, one side edge of one of the air deflectors is connected to one side of the air outlet of the first air duct, which is close to the test chamber door, and the other side edge of the air deflector is connected to one side, which is far away from the test chamber door, of the area where the hard disk bracket is located; one side of the other air deflector is connected to the middle of the air outlet of the first air duct, and the edge of the other side of the air deflector is connected to the middle of the area where the hard disk bracket is located.

7. The solid state disk reliability test chamber of any one of claims 1 to 5, wherein a flow equalization plate is arranged downstream of the first air duct.

8. The test chamber of claim 7, wherein the flow equalizing plate has flow equalizing holes facing different directions.

9. A test chamber for testing reliability of solid state disk as claimed in any one of claims 3 to 5, wherein a hard disk tray partition plate is provided in the region of the hard disk tray, the extension direction of the hard disk tray partition plate being the same as the transverse arrangement direction of the tray assembly, so as to divide the region of the hard disk tray into two mutually isolated regions distributed up and down.

10. The solid state disk reliability test chamber of any one of claims 1 to 5, wherein a first air duct partition plate extending in the same direction as the first air duct is provided in the first air duct to divide the first air duct into two mutually isolated regions distributed up and down.

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