CN217060354U - Chip antenna test system - Google Patents
Chip antenna test system Download PDFInfo
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- CN217060354U CN217060354U CN202123379390.2U CN202123379390U CN217060354U CN 217060354 U CN217060354 U CN 217060354U CN 202123379390 U CN202123379390 U CN 202123379390U CN 217060354 U CN217060354 U CN 217060354U
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- probe
- rotating arm
- chip antenna
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- driving device
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Abstract
The utility model discloses a chip antenna test system, including embracing pole, test probe, probe holder, probe motion, probe drive arrangement, radio frequency unit, measuring apparatu and control system, embrace pole and probe holder interval fixed position, embrace fixedly being equipped with on the pole and can with the chip antenna electric connection feed electric connecting piece, the motion end of probe motion can drive test probe and move on the 3D sphere face with the chip antenna of being tested as the center, probe drive arrangement drive the motion end action of probe motion, test probe is just right with the chip antenna of being tested on embracing the pole all the time, measuring apparatu communicates with electric connecting piece and test probe respectively through the radio frequency unit, control system control the work of measuring apparatu and probe drive arrangement, the utility model discloses a chip antenna high accuracy test, test data are accurate, the end part of the cantilever of the holding pole forms a horizontal tip, so that the test blind area is greatly reduced, and the test precision is further improved.
Description
Technical Field
The utility model relates to an electromagnetic performance test equipment especially indicates a chip antenna test system.
Background
Because the chip antenna has small and exquisite volume, advantages such as signal transmission performance is good, chip antenna is extensively used in electronic product at present, how to test the chip antenna puzzles persons in the industry always, common antenna test system holds pole rotation fit test probe and removes and form spherical test point position in the antenna periphery, test, and chip antenna is because special structure, it is not permitted to hold the pole to rotate in the test procedure, therefore traditional antenna test system can't be used and chip antenna test, and because chip antenna special structure, hold the pole and can lead to the fact the shelter from to the chip antenna in the chip antenna test procedure, consequently can't be comprehensive detect the chip antenna, can have the detection blind area of considerable region.
SUMMERY OF THE UTILITY MODEL
In order to overcome the defects, the utility model provides a chip antenna test system, this chip antenna test system chip antenna remain stable state throughout in the test procedure, have realized the accurate test of chip antenna.
The utility model discloses a solve the technical scheme that its technical problem adopted: a chip antenna test system comprises a holding pole, a test probe, a probe bracket, a probe motion mechanism, a probe driving device, a radio frequency unit, a measuring instrument and a control system, wherein the holding pole and the probe bracket are fixedly positioned at intervals, an electric connecting piece is fixedly arranged on the holding pole, the electric connecting piece can be electrically connected with a tested chip antenna for feeding, the probe moving mechanism is arranged on the probe bracket, the test probe is fixedly arranged on the moving end of the probe moving mechanism, the moving end of the probe moving mechanism can move to any point on a 3D spherical surface taking the tested chip antenna as the center, the probe driving device drives the moving end of the probe moving mechanism to move, the test probe is always opposite to the tested chip antenna on the holding pole, the measuring instrument is respectively communicated with the electric connecting piece and the test probe through the radio frequency unit, and the control system controls the measuring instrument and the probe driving device to work.
As a further improvement, the probe motion mechanism comprises a first rotating arm and a second rotating arm, the probe driving device comprises a first rotary driving device and a second rotary driving device, the first rotating arm can rotate around the horizontal rotating shaft and is installed on the probe bracket, the second rotating arm can rotate around the vertical rotating shaft vertical to the horizontal rotating shaft and is installed on the first rotating arm, the test probe is fixedly installed on the second rotating arm, the intersection point of the extension lines of the horizontal rotating shaft and the vertical rotating shaft is located on the tested chip antenna, the first rotary driving device and the second rotary driving device drive the first rotating arm and the second rotating arm to rotate in a distributed mode, and the control system controls the first rotary driving device and the second rotary driving device to start and stop.
As a further improvement, the first rotating arm and the second rotating arm both form an L-shaped structure, the horizontal rotating shaft is installed on one side wall of the L-shaped structure of the first rotating arm, the vertical rotating shaft is installed on the other side wall of the L-shaped structure of the first rotating arm and the other side wall of the L-shaped structure of the second rotating arm, and the test probe is fixedly installed on the other side wall of the L-shaped structure of the second rotating arm.
As a further improvement of the utility model, first swinging boom and second swinging boom are nonmetal swinging boom or metal swinging boom respectively, and when first swinging boom and second swinging boom were the metal swinging boom, first swinging boom and second swinging boom had the absorbing material layer towards fixed cover in chip antenna one side.
As the utility model discloses a further improvement still is equipped with fixed baseplate and shock-proof base, fixed baseplate and shock-proof base respectively can fixed mounting subaerial, and probe holder fixed mounting is on fixed baseplate, embraces pole fixed mounting on shock-proof base.
As a further improvement, the pole includes vertical extension and horizontal extension, horizontal extension extends from vertical extension upper end at the horizontal direction to probe holder direction and forms cantilever structure, vertical extension upwards from bottom to top and horizontal extension be the mode that the size reduces gradually from the root to cantilever tip direction and extend, the cantilever tip of horizontal extension forms horizontally most advanced, is equipped with the probe platform on this level most advanced, electrical connecting piece fixed mounting in probe bench.
As a further improvement, the vertical extension part and the horizontal extension part of the holding rod are connected through an arc to form an integral bending cantilever structure which is gradually reduced from the fixed end to the size of the cantilever end.
As the utility model discloses a further improvement still is equipped with polarization pivot and polarization axle rotary drive device, polarization axle can the pivoted install on probe motion mechanism's motion is served, and test probe fixed mounting is in polarization pivot, and polarization axle rotary drive device drives polarization axle rotation and changes test probe's polarization direction.
As the utility model discloses a further improvement, the test probe is dual polarization probe or single polarization probe, and when the test probe was single polarization probe, the polarization pivot was held through the rotatory pole changing device that can 90 degrees rotations in the motion of probe motion.
As a further improvement of the present invention, the electrical connector is a probe.
The beneficial effects of the utility model are that: the utility model discloses a crooked pole fixed position chip antenna of embracing is through probe and chip antenna contact feed on embracing the pole, and it is motionless to embrace pole and chip antenna steady state in the testing process, has guaranteed the chip antenna environmental stability that is surveyed, and probe motion's motion end area test probe scans in the peripheral 3D sphere within range of chip antenna, the utility model discloses a chip antenna high accuracy test, test data is accurate, and the cantilever tip of embracing the pole forms horizontal tip, has reduced the test blind area greatly, has further improved the measuring accuracy.
Drawings
FIG. 1 is a block diagram of the system of the present invention;
fig. 2 is a perspective view of the first testing state of the present invention;
fig. 3 is a front view of the first testing state of the present invention;
fig. 4 is a left side view of the first test state of the present invention;
fig. 5 is a top view of a first test state of the present invention;
fig. 6 is a perspective view of the second testing state of the present invention;
fig. 7 is a front view of a second testing state of the present invention;
fig. 8 is a left side view of a second test state of the present invention;
fig. 9 is a second test state plan view of the present invention.
Detailed Description
Example (b): a chip antenna test system comprises a holding pole 1, a test probe 2, a probe bracket 3, a probe motion mechanism, a probe driving device, a radio frequency unit 4, a measuring instrument 5 and a control system, wherein the holding pole 1 and the probe bracket 3 are fixedly positioned at intervals, an electric connecting piece is fixedly arranged on the holding pole 1 and can be electrically connected with a tested chip antenna 19 for feeding, the probe motion mechanism is arranged on the probe bracket 3, the test probe 2 is fixedly arranged on a motion end of the probe motion mechanism, the motion end of the probe motion mechanism can move to any point position on a 3D spherical surface with the tested chip antenna 19 as the center, the probe driving device drives the motion end of the probe motion mechanism to move, the test probe 2 is always just opposite to the tested chip antenna 19 on the holding pole 1, the measuring instrument 5 is respectively communicated with the electric connecting piece and the test probe 2 through the radio frequency unit 4, and the control system controls the measuring instrument 5 and the probe driving device to work.
The test instrument comprises a network analyzer, an oscilloscope, a frequency spectrograph, a vector signal generator and a vector signal analyzer, the control system comprises a computer 6, a controller unit 7 for controlling the probe driving device, a radio frequency amplifier, an instrument switching unit and the like, a display unit 8 for displaying test results can be further arranged, and the test unit can be a display screen of the computer.
The probe motion mechanism comprises a first rotating arm 9 and a second rotating arm 10, the probe driving device comprises a first rotary driving device 11 and a second rotary driving device 12, the first rotating arm 9 can rotate around a horizontal rotating shaft and is installed on the probe support 3, the second rotating arm 10 can rotate around a vertical rotating shaft vertical to the horizontal rotating shaft and is installed on the first rotating arm 9, the test probe 2 is fixedly installed on the second rotating arm 10, the intersection point of the extension lines of the horizontal rotating shaft and the vertical rotating shaft is located on a tested chip antenna 19, the first rotary driving device 11 and the second rotary driving device 12 drive the first rotating arm 9 and the second rotating arm 10 to rotate in a distributed mode, and the control system controls the first rotary driving device 11 and the second rotary driving device 12 to start and stop. In a standard (r, θ, Φ) coordinate system, the first rotating arm 9 rotates 0 degree around the horizontal rotating shaft, the second rotating arm 10 rotates 360 degrees around the vertical rotating shaft, so that electromagnetic radiation data on the plane where phi of the tested chip antenna phi is 0 can be obtained, and the electromagnetic radiation data of a complete 3D spherical surface can be obtained by matching the rotation of the first rotating arm 9 around the horizontal rotating shaft for 360 degrees, so that a complete 3D directional diagram of the tested chip antenna 19 is obtained, and the test is completed. The first rotation driving device 11 and the second rotation driving device 12 may be servo motors, or may be other rotation driving devices, such as a rotation cylinder, etc., and the control system may be implemented by a computer and a control device such as a motor driver, etc., to control the servo motors.
The first rotating arm 9 and the second rotating arm 10 both form an "L" shaped structure, the horizontal rotating shaft is installed on one side wall of the L shaped structure of the first rotating arm 9, the vertical rotating shaft is installed on the other side wall of the L shaped structure of the first rotating arm 9 and one side wall of the L shaped structure of the second rotating arm 10, and the test probe is fixedly installed on the other side wall of the L shaped structure of the second rotating arm 10. In order to improve the rotation stability of the first rotating arm 9, a rotating disc part with an outward expanded size is preferably formed at a position, where one side wall of the L-shaped structure of the first rotating arm 9 is located at the horizontal rotating shaft, and the horizontal shaft is preferably located at the middle part of one side wall of the L-shaped structure of the first rotating arm 9, a counterweight structure which is balanced with the other side wall is formed at the end part of one side wall of the L-shaped structure of the first rotating arm 9 to ensure that the first rotating arm 9 rotates stably around the horizontal rotating shaft, the first rotating arm 9 and the second rotating arm 10 are both designed into the L-shaped structure, the length of one side wall of the second rotating arm 10 is less than that of the other side wall of the first rotating arm 9, so that the second rotating arm 10 is always positioned inside the L-shaped structure of the first rotating arm 9 when rotating around the vertical rotating shaft, thereby avoiding interference, meanwhile, the first rotating arm 9 and the second rotating arm 10 can realize 3D spherical motion in a larger range in a limited space.
The first rotating arm 9 and the second rotating arm 10 are respectively a non-metal rotating arm or a metal rotating arm, and when the first rotating arm 9 and the second rotating arm 10 are metal rotating arms, the first rotating arm 9 and the second rotating arm 10 are fixedly covered with a wave-absorbing material layer 13 towards one side of the chip antenna 19. First swinging boom 9 and second swinging boom 10 adopt the metal material, can improve its support strength, avoid shaking and warping rotating the in-process, guarantee that test probe 2 is just right with chip antenna 19 all the time when testing chip antenna 19, cover one deck absorbing material on first swinging boom 9 and second swinging boom 10 of metal material, guarantee to be surveyed the uniformity of antenna background environment in the test procedure, avoid the signal to be reflected by the metal material.
The multifunctional measuring instrument is further provided with a fixed base 14 and a shockproof base 15, the fixed base 14 and the shockproof base 15 can be fixedly installed on the ground respectively, the probe support 3 is fixedly installed on the fixed base 14, and the holding pole 1 is fixedly installed on the shockproof base 15. The fixed base 14 provides support and shockproof effects for the probe support 3, the optimal weight of the fixed base 14 is large, rollover of the first rotating arm 9 and the second rotating arm 10 in the rotating process is prevented, the shockproof base 15 provides support and shockproof effects for the holding pole 1, stability of the chip antenna 19 is guaranteed, and testing accuracy is improved.
The vertical extending part and the horizontal extending part of the holding pole 1 are connected through arcs to form an integrated bending cantilever structure with the size gradually reduced from the fixed end to the cantilever end. The structure has accurate and stable positioning to the chip antenna 19 and beautiful appearance.
The test probe is characterized by further comprising a polarization rotating shaft 17 and a polarization shaft rotation driving device 18, wherein the polarization shaft can be rotatably arranged at the moving end of the probe moving mechanism, the test probe 2 is fixedly arranged on the polarization rotating shaft 17, and the polarization shaft rotation driving device 18 drives the polarization shaft to rotate so as to change the polarization direction of the test probe 2. The polarization rotating shaft 17 rotates to enable the polarization direction of the test probe 2 to be matched with the polarization direction of the tested chip antenna 19, the polarization shaft rotation driving device 18 can be a motor or other rotation driving devices, and a control system can realize control over a servo motor through a computer, a motor driver and other control devices.
The test probe 2 is a dual-polarized probe or a single-polarized probe, and when the test probe 2 is a single-polarized probe, the polarization rotating shaft 17 is mounted on the moving end of the probe moving mechanism through a rotary pole-changing device capable of rotating 90 degrees. The test probe 2 can adopt a single-polarization probe, a rotating pole-changing device which can rotate by 90 degrees is required to be added on the motion end of the probe motion mechanism to convert polarization, a dual-polarization probe can also be adopted, and the dual-polarization probe does not need to adopt the rotating pole-changing device.
The electrical connections are probes that can be used to feed the small chip antenna 19 with rf signals, although rf connectors may also be used.
Adopt the utility model discloses when testing chip antenna 19, test equipment can place in the microwave dark room that contains absorbing material, then will be surveyed chip antenna 19 and place on probe platform 16, the electric contact feed on probe platform 16 and the antenna, polarization pivot 17 is rotatory to make the polarization direction of test probe 2 and the polarization direction phase-match of being surveyed chip antenna 19, computer sending control command through control system gives measuring instrument 5, probe drive's controller and being surveyed chip antenna 19, the motion end action through probe drive probe motion, make test probe 2 move on the 3D sphere, finally obtain the electromagnetic radiation data of complete 3D sphere, thereby obtain the 3D directional diagram of being surveyed chip antenna 19, accomplish the test.
The above description is only exemplary of the present invention and should not be taken as limiting the scope of the present invention, as any modifications, equivalents, improvements and the like made within the spirit and principles of the present invention are intended to be included within the scope of the present invention.
Claims (10)
1. A chip antenna test system is characterized in that: comprises a holding pole (1), a test probe (2), a probe bracket (3), a probe moving mechanism, a probe driving device, a radio frequency unit (4), a measuring instrument (5) and a control system, wherein the holding pole and the probe bracket are fixedly positioned at intervals, an electric connecting piece is fixedly arranged on the holding pole and can be electrically connected with a measured chip antenna (19) for feeding, the probe moving mechanism is arranged on the probe bracket, the test probe is fixedly arranged on a moving end of the probe moving mechanism, the moving end of the probe moving mechanism can move to any point position on a 3D spherical surface taking the measured chip antenna as the center, the probe driving device drives the moving end of the probe moving mechanism to move, the test probe is always right opposite to the measured chip antenna on the holding pole, and the measuring instrument is respectively communicated with the electric connecting piece and the test probe through the radio frequency unit, and the control system controls the measuring instrument and the probe driving device to work.
2. The chip antenna test system of claim 1, wherein: the probe movement mechanism comprises a first rotating arm (9) and a second rotating arm (10), the probe driving device comprises a first rotary driving device (11) and a second rotary driving device (12), the first rotating arm can rotate around a horizontal rotating shaft and is installed on a probe support, the second rotating arm can rotate around a vertical rotating shaft vertical to the horizontal rotating shaft and is installed on the first rotating arm, a test probe is fixedly installed on the second rotating arm, the intersection point of the extension lines of the horizontal rotating shaft and the vertical rotating shaft is located on a tested chip antenna, the first rotary driving device and the second rotary driving device drive the first rotating arm and the second rotating arm to rotate in a distributed mode, and a control system controls the first rotary driving device and the second rotary driving device to start and stop.
3. The chip antenna test system of claim 2, wherein: the testing device comprises a first rotating arm, a second rotating arm, a horizontal rotating shaft, a vertical rotating shaft and a test probe, wherein the first rotating arm and the second rotating arm both form an L-shaped structure, the horizontal rotating shaft is installed on one side wall of the L-shaped structure of the first rotating arm, the vertical rotating shaft is installed on the other side wall of the L-shaped structure of the first rotating arm and one side wall of the L-shaped structure of the second rotating arm, and the test probe is fixedly installed on the other side wall of the L-shaped structure of the second rotating arm.
4. The chip antenna test system of claim 2, wherein: the first rotating arm and the second rotating arm are respectively a non-metal rotating arm or a metal rotating arm, and when the first rotating arm and the second rotating arm are metal rotating arms, a wave absorbing material layer (13) is fixedly covered on one side of the first rotating arm and the second rotating arm, which faces to the chip antenna.
5. The chip antenna test system of claim 1, wherein: the anti-vibration device is characterized by further comprising a fixed base (14) and an anti-vibration base (15), wherein the fixed base and the anti-vibration base can be fixedly installed on the ground respectively, the probe support is fixedly installed on the fixed base, and the holding pole is fixedly installed on the anti-vibration base.
6. The chip antenna test system of claim 1, wherein: embrace the pole and include vertical extension and horizontal extension, horizontal extension extends from vertical extension upper end at the horizontal direction to probe support direction and forms cantilever structure, vertical extension upwards from bottom to top and horizontal extension are the mode that the size reduces gradually from the root to cantilever tip direction and extend, the cantilever tip of horizontal extension forms horizontally most advanced, is equipped with probe platform (16) on this level most advanced, electrical connecting piece fixed mounting in probe bench.
7. The chip antenna test system of claim 6, wherein: the vertical extending part and the transverse extending part of the holding rod are connected through circular arcs to form an integral bent cantilever structure with the size gradually reduced from the fixed end to the cantilever end.
8. The chip antenna test system according to claim 1 or 2, wherein: the test device is characterized by further comprising a polarization rotating shaft (17) and a polarization shaft rotation driving device (18), wherein the polarization shaft can be rotatably installed on the moving end of the probe moving mechanism, the test probe is fixedly installed on the polarization rotating shaft, and the polarization shaft rotation driving device drives the polarization shaft to rotate to change the polarization direction of the test probe.
9. The chip antenna test system of claim 8, wherein: the test probe is a dual-polarization probe or a single-polarization probe, and when the test probe is a single-polarization probe, the polarization rotating shaft is arranged on the moving end of the probe moving mechanism through a rotary pole changing device capable of rotating 90 degrees.
10. The chip antenna test system of claim 1, wherein: the electrical connector is a probe.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202123379390.2U CN217060354U (en) | 2021-12-29 | 2021-12-29 | Chip antenna test system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202123379390.2U CN217060354U (en) | 2021-12-29 | 2021-12-29 | Chip antenna test system |
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| Publication Number | Publication Date |
|---|---|
| CN217060354U true CN217060354U (en) | 2022-07-26 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202123379390.2U Active CN217060354U (en) | 2021-12-29 | 2021-12-29 | Chip antenna test system |
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| CN (1) | CN217060354U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116930665A (en) * | 2023-09-13 | 2023-10-24 | 合肥航太电物理技术有限公司 | Airplane electrostatic discharge radio frequency noise testing equipment and method |
-
2021
- 2021-12-29 CN CN202123379390.2U patent/CN217060354U/en active Active
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116930665A (en) * | 2023-09-13 | 2023-10-24 | 合肥航太电物理技术有限公司 | Airplane electrostatic discharge radio frequency noise testing equipment and method |
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