CN217034220U

CN217034220U - Testing device

Info

Publication number: CN217034220U
Application number: CN202122828242.8U
Authority: CN
Inventors: 周雨
Original assignee: Shenzhen Sunway Communication Co Ltd
Current assignee: Shenzhen Sunway Communication Co Ltd
Priority date: 2021-11-17
Filing date: 2021-11-17
Publication date: 2022-07-22
Anticipated expiration: 2031-11-17

Abstract

The utility model discloses a testing device, which comprises a testing instrument and a workbench, wherein an upper die and a lower die which are matched with each other are arranged on the workbench, the upper die is arranged on the workbench in a lifting manner along the vertical direction, the lower die comprises a fixed seat fixed on the workbench, a PCB electrically connected with the testing instrument is arranged on one surface of the fixed seat close to the upper die, a first testing circuit, a second testing circuit and a dial switch are arranged on the PCB, the dial switch is used for controlling the connection and disconnection of the first testing circuit and the second testing circuit, the first testing circuit comprises a spring needle, the second testing circuit comprises a testing coil, the lower die further comprises a limiting seat covered on the PCB, a first limiting groove and a second limiting groove are arranged on one surface of the limiting seat close to the upper die at intervals, the spring needle extends into the first limiting groove, and the testing coil is aligned with the second limiting groove. The testing device meets the testing requirements of NFC products and ferrites, saves the cost of purchasing equipment and saves a large amount of time for erecting the equipment, and is beneficial to improving the testing efficiency.

Description

Testing device

Technical Field

The utility model relates to the technical field of detection equipment, in particular to a testing device.

Background

Ferrite is widely applied to various communication products, particularly wireless charging equipment and NFC equipment as a soft magnetic material, and the key indexes of the performance of a ferrite magnetic sheet are the magnetic permeability and the magnetic loss of the ferrite magnetic sheet.

In the manufacturing process of present NFC equipment, need carry out performance test to the ferrite monomer before NFC equipment assembly, and carry out performance test to NFC equipment after the equipment is accomplished, because current check out test set can only carry out the detection of single product, the commonality is not good, consequently need prepare two sets of test instrument and build two sets of test lines respectively and carry out the performance test of ferrite monomer and the performance test of NFC equipment, lead to the cost and the cost of labor of purchasing equipment to rise, be unfavorable for reducing the manufacturing cost of NFC equipment.

SUMMERY OF THE UTILITY MODEL

The technical problem to be solved by the utility model is as follows: provided is a test device with good universality.

In order to solve the technical problems, the utility model adopts the technical scheme that: a testing device comprises a testing instrument and a workbench, wherein an upper die and a lower die which are matched with each other are arranged on the workbench, the upper die is arranged on the workbench in a liftable manner along a vertical direction, the lower die comprises a fixed seat fixed on the workbench, a PCB electrically connected with the testing instrument is arranged on one surface of the fixed seat close to the upper die, a first testing circuit, a second testing circuit and a dial switch are arranged on the PCB, the dial switch is used for controlling the on-off of the first testing circuit and the second testing circuit, the first testing circuit comprises a spring needle, the second testing circuit comprises a testing coil, the lower die further comprises a limiting seat covered on the PCB, a first limiting groove and a second limiting groove are arranged on one surface of the limiting seat close to the upper die at intervals, and the spring needle extends into the first limiting groove, the test coil is aligned with the second limiting groove.

Furthermore, go up the mould including removing the seat, it is close to remove the seat the one side of lower mould has connected gradually first briquetting and second briquetting, first briquetting have with first spacing groove matched with is spacing protruding, the second briquetting with second spacing groove cooperatees.

Furthermore, the workbench is further provided with a guide rail, the guide rail is arranged in the vertical direction, and the movable seat is slidably arranged on the guide rail.

Furthermore, a driving piece is further arranged on the workbench and used for driving the moving seat to move along the guide rail.

Furthermore, the driving part is an air cylinder, and an air pressure valve used for adjusting air pressure of the air cylinder is further arranged on the workbench.

Furthermore, the electric control box is electrically connected with the driving piece.

Further, still be equipped with a plurality of control button on the workstation, control button respectively with automatically controlled box electric connection.

Furthermore, an SMA socket for the connection of the test instrument is further arranged on the PCB.

Furthermore, the test device also comprises a connecting cable, one end of the two opposite ends of the connecting cable is connected with the test instrument, and the other end of the connecting cable is connected with the SMA socket.

Further, the test instrument is a network analyzer.

The utility model has the beneficial effects that: the testing device provided by the utility model positions ferrite or NFC equipment to be tested through the matching of an upper die and a lower die, wherein the lower die comprises a fixed seat, a limiting seat and a PCB positioned between the fixed seat and the limiting seat, the limiting seat is provided with a first limiting groove matched with an NFC product and a second limiting groove matched with the ferrite, the NFC product can be tightly pressed in the first limiting groove and the ferrite is tightly pressed in the second limiting groove after the upper die is matched with the lower die, the PCB is provided with a first testing circuit for testing the performance of the NFC product and a second testing circuit for testing the performance of the ferrite, wherein the first testing circuit comprises a spring pin which extends into the first limiting groove and is communicated with the NFC product, the second testing circuit comprises a testing coil which is aligned with the second limiting groove and interacts with the ferrite, and the PCB is provided with a dial switch for controlling the connection and disconnection of the first testing circuit and the second testing circuit, the performance test of NFC products can be carried out when first test circuit switch-on and second test circuit switch-off, the performance test of ferrite can be carried out when first test circuit switch-off and second test circuit switch-on, and then can switch testing arrangement through control dial switch, make testing arrangement satisfy the test demand of NFC products and ferrite simultaneously, need not to repeatedly build the test circuit or purchase many sets of equipment, save the time of erecting equipment in a large number when practicing thrift the cost of purchasing equipment, do benefit to and improve efficiency of software testing, and easy operation, easy to use.

Drawings

Fig. 1 is a schematic structural diagram of a testing apparatus according to a first embodiment of the utility model;

FIG. 2 is a schematic structural diagram of a worktable in a testing apparatus according to a first embodiment of the present invention;

FIG. 3 is a side view of a stage of the testing apparatus according to the first embodiment of the present invention;

fig. 4 is a schematic structural diagram of an upper mold in a testing apparatus according to a first embodiment of the present invention;

fig. 5 is a schematic structural view of a lower die in the testing apparatus according to the first embodiment of the present invention;

FIG. 6 is a top view of a PCB board in the testing device according to the first embodiment of the present invention;

fig. 7 is a bottom view of a PCB board in the testing device according to the first embodiment of the utility model.

Description of the reference symbols:

1. a work table; 11. a guide rail; 12. a pneumatic valve; 13. a control button; 14. banana head; 2. testing the instrument; 3. an upper die; 31. a movable seat; 32. a first pressing block; 33. a second pressing block; 34. a limiting bulge; 4. a lower die; 41. a fixed seat; 42. a limiting seat; 43. a first limit groove; 44. a second limit groove; 45. a through hole; 5. a PCB board; 51. a first test line; 52. a second test line; 53. a pogo pin; 54. testing the coil; 55. an SMA pad; 56. a switch pad; 6. connecting a cable; 7. an electric control box.

Detailed Description

In order to explain technical contents, achieved objects, and effects of the present invention in detail, the following description is made with reference to the accompanying drawings in combination with the embodiments.

Referring to fig. 1 to 7, a testing device includes a testing instrument 2 and a workbench 1, the workbench 1 is provided with an upper die 3 and a lower die 4 which are matched with each other, the upper die 3 is arranged on the workbench 1 in a lifting manner along a vertical direction, the lower die 4 includes a fixing seat 41 fixed on the workbench 1, one surface of the fixing seat 41 close to the upper die 3 is provided with a PCB 5 electrically connected with the testing instrument 2, the PCB 5 is provided with a first testing circuit 51, a second testing circuit 52 and a dial switch, the dial switch is used for controlling the on-off of the first testing circuit 51 and the second testing circuit 52, the first testing circuit 51 includes a pogo pin 53, the second testing circuit 52 includes a testing coil 54, the lower die 4 further includes a limiting seat 42 covering the PCB 5, one surface of the limiting seat 42 close to the upper die 3 is provided with a first limiting groove 43 and a second limiting groove 44 at an interval, the pogo pin 53 extends into the first stopper groove 43, and the test coil 54 is aligned with the second stopper groove 44.

As can be seen from the above description, the beneficial effects of the present invention are: the testing device provided by the utility model can be switched by controlling the dial switch, so that the testing device can meet the testing requirements of NFC products and ferrites, the universality is strong, repeated construction of testing lines or purchase of multiple sets of equipment is not needed, the cost of purchasing the equipment is saved, the time for erecting a large number of equipment is saved, the testing efficiency is improved, the operation is simple, and the use is easy.

Further, go up mould 3 including removing seat 31, it is close to remove seat 31 the one side of lower mould 4 has connected gradually first briquetting 32 and second briquetting 33, first briquetting 32 have with first spacing groove 43 matched with spacing arch 34, second briquetting 33 with second spacing groove 44 cooperatees.

As can be seen from the above description, the upper die 3 includes the movable seat 31 and the first press block 32 and the second press block 33 sequentially connected to the movable seat 31, and the first press block 32 and the second press block 33 can be driven by the movement of the movable seat 31 to move, so that the limiting protrusion 34 on the first press block 32 extends into the first limiting groove 43 to position the NFC product in the first limiting groove 43, or the second press block 33 extends into the second limiting groove 44 to position the ferrite, thereby preventing the NFC product and the ferrite from generating unexpected movement in the test process.

Further, still be equipped with guide rail 11 on the workstation 1, guide rail 11 sets up just along vertical direction the removal seat 31 slidable sets up on guide rail 11.

As is apparent from the above description, the movement of the movable base 31 is guided by the guide rail 11 provided on the table 1, and the first presser 32 or the second presser 33 is prevented from being displaced due to the deviation of the movable base 31.

Further, a driving part is further arranged on the workbench 1, and the driving part is used for driving the moving seat 31 to move along the guide rail 11.

As can be seen from the above description, the driving member disposed on the working platform 1 drives the movable base 31 to automatically lift, thereby reducing manual operations.

Further, the driving part is an air cylinder, and an air pressure valve 12 for adjusting air pressure of the air cylinder is further arranged on the workbench 1.

As can be seen from the above description, the pneumatic valve 12 is provided to adjust the pressure generated by the upper mold 3 on the lower mold 4 under the actuation of the cylinder, so as to prevent the NFC product or ferrite on the lower mold 4 from being damaged by pressure.

Furthermore, the device also comprises an electric control box 7, and the electric control box 7 is electrically connected with the driving piece.

Further, still be equipped with a plurality of control button 13 on the workstation 1, control button 13 respectively with automatically controlled box 7 electric connection.

As can be seen from the above description, the operations such as the movement of the upper die 3 and the switching of the dial switch are realized through the control button 13 arranged on the workbench 1, so that the use of the testing device is convenient.

Further, an SMA socket for connecting the test instrument 2 is further arranged on the PCB 5.

Further, still include connecting cable 6, one end in the 6 relative both ends of connecting cable with test instrument 2 is connected, the other end with the SMA socket is connected.

As can be seen from the above description, the SMA socket on the PCB 5 and the test instrument 2 are connected by a cable so as to connect the test instrument 2 with the PCB 5.

Further, the testing apparatus 2 is a network analyzer.

Example one

Referring to fig. 1 to 7, a first embodiment of the present invention is: a testing device is used for detecting the performance of an NFC product and ferrite and judging whether the performance of the NFC product or the ferrite is qualified.

As shown in fig. 1, testing arrangement includes workstation 1 and test instrument 2, be equipped with matched with on workstation 1 and go up mould 3 and lower mould 4, wherein lower mould 4 is fixed on workstation 1, it is in to go up mould 3 but set up along vertical direction liftable on the workstation 1, and the NFC product or the ferrite of awaiting measuring places on lower mould 4, through the removal of going up mould 3 can be in NFC product or ferrite location go up mould 3 with between the lower mould 4 to carry out the die sinking after the test is accomplished in order to take out the NFC product or the ferrite of test completion.

Please combine fig. 2 and 5, the lower die 4 includes a fixing seat 41 fixed on the worktable 1, the fixing seat 41 is close to one side of the upper die 3 is provided with a PCB board 5 and the PCB board 5 is electrically connected with the testing instrument 2, the PCB board 5 is far away from one side of the fixing seat 41 is further covered with a limiting seat 42, a first limiting groove 43 and a second limiting groove 44 are arranged on the limiting seat 42 at intervals, wherein the first limiting groove 43 is used for positioning the NFC product, and the second limiting groove 44 is used for positioning the ferrite. After being placed into the first limiting groove 43, the NFC product is communicated with the PCB 5, namely the NFC product can be tested by the testing instrument 2, or after being placed into the second limiting groove 44, the ferrite is conducted with the PCB 5, and the testing instrument 2 is used for testing the performance of the ferrite.

As shown in fig. 2, 6 and 7, a first test line 51 for testing the performance of the NFC product and a second test line 52 for testing the performance of the ferrite are disposed on the PCB 5, a dial switch for controlling the on/off of the first test line 51 and the on/off of the second test line 52 is further disposed on the PCB 5, the test apparatus can be switched by operating the dial switch, the performance test of the NFC product can be performed when the first test line 51 is switched on and the second test line 52 is switched off, and the performance test of the ferrite can be performed when the first test line 51 is switched off and the second test line 52 is switched on, so that the test apparatus can simultaneously meet the requirements of performing the performance test on the NFC product and the ferrite, and the universality of the test apparatus is improved.

Specifically, the first test circuit 51 includes a spring pin 53, a through hole 45 for the spring pin 53 to pass through is formed in the limiting seat 42, the spring pin 53 extends into the first limiting groove 43, when an NFC product is placed into the first limiting groove 43 and the upper die 3 and the lower die 4 are closed, the spring pin 53 is connected with the NFC product and conducts the NFC product with the first test circuit 51, and at this time, the test instrument 2 can be used for testing the performance of the NFC product. The second test circuit 52 comprises a test coil 54, the second position-defining slot 44 is aligned with the test coil 54, and when ferrite is placed in the second position-defining slot 44 and the upper mold 3 and the lower mold 4 are closed, the test coil 54 interacts with the ferrite to test the performance of the ferrite by the test instrument 2.

Optionally, the test instrument 2 is preferably a network analyzer, and the test instrument 2 may be an existing network analyzer.

As shown in fig. 2, preferably, the shape of the first position-limiting groove 43 is identical to the shape of the NFC product to be tested, and the shape of the second position-limiting groove 44 is identical to the shape of the ferrite to be tested, so that the positions of the NFC product and the ferrite on the position-limiting base 42 are kept stable. The test requirements of various antennas such as LTE, GPD, WiFi, NR, mmW and the like can be met by replacing the limiting seat 42 of the first limiting groove 43 or the second limiting groove 44 with different shapes, and the PCB board 5 with corresponding test circuits can be replaced, so that the test equipment can meet the requirements of testing various antennas, and the universality of the test equipment is further improved.

Referring to fig. 1 and 5, an SMA socket is further disposed on the PCB 5, an SMA pad 55 for welding the SMA socket and a switch pad 56 for welding the dial switch are further disposed on the PCB 5, and the SMA pad 55 and the dial switch pad 56 are respectively communicated with the first test circuit 51 and the second test circuit 52. The testing device further comprises a connecting cable 6 used for conducting the PCB 5 with the testing instrument 2, one end of the two opposite ends of the connecting cable 6 is connected with the SMA socket on the PCB 5, and the other end of the connecting cable is connected with the testing instrument 2, so that the PCB 5 is connected with the testing instrument 2 conveniently.

As shown in fig. 2 and 4, the upper mold 3 includes a moving seat 31, a first pressing block 32 and a second pressing block 33 are sequentially connected to a surface of the moving seat 31 close to the lower mold 4, the first pressing block 32 has a limiting protrusion 34 matched with the first limiting groove 43, and a surface of the second pressing block 33 close to the lower mold 4 is matched with the second limiting groove 44. After the upper die 3 and the lower die 4 are closed, the limiting protrusion 34 extends into the first limiting groove 43 to press the NFC product in the first limiting groove 43 onto the lower die 4, and ensure that the pogo pin 53 is conducted with the NFC product, and meanwhile, the second press block 33 partially extends into the second limiting groove 44 to press the ferrite in the second limiting groove 44 onto the lower die 4.

Preferably, the second pressing block 33 is made of copper, so that the opening of the second limiting groove 44 is closed by the second pressing block 33, thereby preventing the sensitivity of the testing apparatus 2 from being reduced due to the leakage of the magnetic field generated by the testing coil 54, and ensuring that the data obtained by the testing apparatus 2 is reliable.

Referring to fig. 2 and 3, a guide rail 11 is disposed on the workbench 1 in the vertical direction, the movable base 31 is slidably disposed on the guide rail 11, a driving member for driving the movable base 31 to slide on the guide rail 11 is further disposed on the workbench 1, and the driving member drives the movable base 31 to slide along the guide rail 11 in the vertical direction, so that automatic mold closing and mold opening can be achieved.

In this embodiment, the cylinder is chooseed for use to the driving piece, still be equipped with on the workstation 1 and be used for the adjustment the atmospheric pressure valve 12 of cylinder atmospheric pressure, need pass through before testing NFC product and ferrite the atmospheric pressure valve 12 will the atmospheric pressure of cylinder is adjusted to suitable within range, avoids go up mould 3 with when lower mould 4 is closed it is right to go up mould 3 the too big result of pressure that lower mould 4 produced is placed NFC product or ferrite sheet damage on the lower mould 4.

As shown in fig. 1, the testing device further comprises an electric control box 7, the driving member is electrically connected with the electric control box 7, the workbench 1 is further provided with a plurality of control buttons 13, the control buttons 13 are respectively electrically connected with the electric control box 7, the control buttons 13 comprise control buttons for enabling the upper die 3 to move towards the lower die 4 and controlling the starting button for resetting the upper die 3, the driving member can be controlled to move by pressing the control buttons 13, and the upper die 3 is pressed down or reset.

In detail, for the convenience workstation 1 with automatically controlled box 7 is connected, be equipped with a plurality of banana heads 14 on one of them lateral wall of workstation 1, the driving piece reaches control button 13 respectively with banana head 14 electric connection, automatically controlled box 7 and corresponding can realize after banana head 14 connects subassembly on the workstation 1 with automatically controlled box 7's electric connection.

Referring to fig. 1, the working process of the testing apparatus provided in this embodiment is as follows: firstly, the PCB 5 and the test instrument 2 are connected through the connecting cable 6, the test instrument 2 is calibrated, then the workbench 1 and the electric control box 7 are connected, the electric control box 7 is electrified, and the air pressure of the air cylinder is adjusted to be within a proper range through adjusting the air pressure valve 12.

When testing the NFC product, toggle the dial switch to make first test circuit 51 switch on and will second test circuit 52 break off, put into the first spacing groove 43 with the NFC product of awaiting measuring, press control button 13 makes go up mould 3 action and with lower mould 4 cooperation, the NFC product was compressed tightly at this moment in the first spacing groove 43 just pogo pin 53 with PCB board 5 switches on, can measure the performance of NFC product through testing instrument 2. If the performance of the NFC product is within the allowable range, the NFC product passes the test, the upper die 3 is automatically reset and can be taken out, if the performance of the NFC product is unqualified, the driving piece locks the position of the upper die 3 to indicate that the NFC product is unqualified, and at the moment, the control button 13 needs to be manually operated to enable the upper die 3 to be reset and then the NFC product can be taken out.

When the ferrite is tested, the dial switch is shifted to disconnect the first test circuit 51 and connect the second test circuit 52, the ferrite to be tested is placed in the second limiting groove 44, the control button 13 is pressed to enable the upper die 3 to act and be matched with the lower die 4, the ferrite is pressed in the second limiting groove 44 at the moment, the ferrite is aligned with the test coil 54, and the performance of the ferrite can be measured through the test instrument 2. If the performance of the ferrite is within the allowable range, the ferrite product passes the test, the upper die 3 automatically resets and the ferrite can be taken out, if the performance of the ferrite is not qualified, the driving piece locks the position of the upper die 3 to indicate that the ferrite is not qualified, and at the moment, the ferrite can be taken out after the upper die 3 is reset by manually operating the reset button.

In summary, the testing device provided by the utility model switches the testing device by controlling the on-off of the first testing circuit and the second testing circuit on the PCB through the thin code switch, so that the testing device can meet the testing requirements of NFC products and ferrites at the same time, the universality is strong, only one set of equipment needs to be adopted and a testing loop is built once, the equipment purchasing cost is effectively reduced, and the time for building the testing loop is saved; the test device is simple to operate, the performance test of the NFC product and the ferrite and the discrimination of good products and defective products can be realized by pressing the control button, and the quality of the NFC product and the ferrite can be conveniently controlled; when the testing device tests different types of antenna products, the corresponding limiting seat and the PCB are replaced, so that various types of antenna products can be tested on the testing device, and the universality is good; testing arrangement assembly is simple, through connecting cable and the banana head of setting on the workstation can be convenient with workstation, test instrument and automatically controlled box switch-on, convenient operation, the test circuit of being convenient for is set up.

The above description is only an embodiment of the present invention, and is not intended to limit the scope of the present invention, and all equivalent modifications made by the present invention and the contents of the accompanying drawings, which are directly or indirectly applied to the related technical fields, are included in the scope of the present invention.

Claims

1. The utility model provides a testing arrangement, includes test instrument and workstation, its characterized in that: the workbench is provided with an upper die and a lower die which are matched with each other, the upper die is arranged on the workbench in a lifting way along the vertical direction, the lower die comprises a fixed seat fixed on the workbench, one surface of the fixed seat close to the upper die is provided with a PCB electrically connected with the test instrument, the PCB board is provided with a first test circuit, a second test circuit and a dial switch, the dial switch is used for controlling the on-off of the first test circuit and the second test circuit, the first test circuit comprises a spring pin, the second test circuit comprises a test coil, the lower die further comprises a limiting seat covered on the PCB, spacing seat is close to the one side interval of going up the mould is equipped with first spacing groove and second spacing groove, the spring needle stretches into in the first spacing groove, test coil with the second spacing groove aligns.

2. The test device of claim 1, wherein: go up the mould including removing the seat, it is close to remove the seat the one side of lower mould has connected gradually first briquetting and second briquetting, first briquetting have with first spacing groove matched with is spacing protruding, the second briquetting with second spacing groove cooperatees.

3. The test device of claim 2, wherein: the workbench is further provided with a guide rail, the guide rail is arranged in the vertical direction, and the movable base is arranged on the guide rail in a sliding mode.

4. The test device of claim 3, wherein: the workbench is further provided with a driving piece, and the driving piece is used for driving the movable base to move along the guide rail.

5. The test device of claim 4, wherein: the driving piece is an air cylinder, and the workbench is further provided with an air pressure valve for adjusting air pressure of the air cylinder.

6. The test device of claim 4, wherein: still include automatically controlled box, automatically controlled box with driving piece electric connection.

7. The test device of claim 6, wherein: still be equipped with a plurality of control button on the workstation, control button respectively with automatically controlled box electric connection.

8. The test device of claim 1, wherein: and the PCB is also provided with an SMA socket for the connection of the test instrument.

9. The test device of claim 8, wherein: still including connecting the cable, one end in the relative both ends of connecting the cable with test instrument connects, the other end with the SMA socket is connected.

10. The test device of claim 1, wherein: the test instrument is a network analyzer.