CN217007590U

CN217007590U - Novel no pressure chip test seat

Info

Publication number: CN217007590U
Application number: CN202123352457.3U
Authority: CN
Inventors: 杨晓华; 季广华
Original assignee: Suzhou Yingshimi Semiconductor Technology Co ltd
Current assignee: Suzhou Yingshimi Semiconductor Technology Co ltd
Priority date: 2021-12-28
Filing date: 2021-12-28
Publication date: 2022-07-19
Anticipated expiration: 2031-12-28

Abstract

The utility model provides a novel pressure-free chip test seat which comprises a base and an upper cover which are matched, wherein fixing components are symmetrically arranged on two sides of the base, each fixing component comprises a pressing block and a first connecting shaft, the first end of each pressing block is rotatably connected with the upper cover through the first connecting shaft, and two ends of each first connecting shaft are connected to the base in a sliding mode; in an initial state, the first connecting shaft is positioned at a first position, the pressing block is horizontally arranged, and the second end of the pressing block is pressed on the chip to be tested; when the upper cover is pressed down, the first connecting shaft is located at the second position, and the pressing block is placed in an inclined mode. According to the utility model, the first connecting shaft moves between the first position and the second position, so that the opening angle of the pressing block is larger, the chip is easier to place and take out, and the smoothness of the downward pressing movement of the upper cover is ensured; in addition, through the setting of pushing down the guide way and pushing down the deflector, the jam problem that the upper cover pushed down has further been avoided.

Description

Novel no pressure chip test seat

Technical Field

The utility model relates to the field of chip testing, in particular to a novel pressure-free chip testing seat.

Background

The non-pressure type chip test seat comprises a base and an upper cover, and when no downward pressure is applied to the upper cover, the corresponding pressing block can be pressed on the chip, and when the downward pressure is applied to the upper cover, the chip can be released and taken out.

The existing non-pressure chip test seat has the following problems:

(1) when the upper cover moves downwards relative to the base, the problem of jamming is easy to occur;

(2) the existing pressing block has a small opening angle and is not easy to take out a chip.

Disclosure of Invention

In order to solve the problems, the utility model provides a novel pressure-free chip test seat.

The main content of the utility model comprises:

a novel pressure-free chip test seat comprises a base and an upper cover which are matched, wherein a hollow accommodating space is formed in the center of the base, and a chip to be tested is placed in the accommodating space; fixing components are symmetrically arranged on two sides of the base and comprise pressing blocks and first connecting shafts, the first ends of the pressing blocks are rotatably connected with the upper cover through the first connecting shafts, and two ends of the first connecting shafts are slidably connected to the base; in an initial state, the first connecting shaft is positioned at a first position, the pressing block is horizontally arranged, and the second end of the pressing block is pressed on the chip to be tested; when the upper cover is pressed down, the first connecting shaft is located at the second position, and the pressing block is obliquely placed.

Preferably, the base comprises a base body, the base body comprises a first surface and a second surface which are arranged oppositely, and a third surface and a fourth surface which are arranged oppositely, the first surface and the second surface are provided with pressing block mounting grooves, and the pressing block mounting grooves are communicated with the accommodating space; and the two ends of the first connecting shaft are slidably connected to the side wall of the pressing block mounting groove.

Preferably, a first sliding guide hole which is obliquely arranged is formed in the side wall of the pressing block mounting groove, the first sliding guide hole comprises a first hole end and a second hole end, and the height of the first hole end is greater than that of the second hole end; in an initial state, two ends of the first connecting shaft are positioned at first hole ends of the two sliding guide holes; when the upper cover is pressed down, two ends of the first connecting shaft are positioned at the second hole ends of the two first sliding guide holes.

Preferably, the fixing assembly further comprises a second connecting shaft, the second connecting shaft is rotatably mounted at the second end of the pressing block, and the second connecting shaft moves along the horizontal direction in the pressing process of the upper cover.

Preferably, the inner wall of the pressing block mounting groove is further provided with second sliding guide holes, and two ends of the second connecting shaft horizontally move in the two second sliding guide holes.

Preferably, the third surface and the fourth surface are provided with downward-pressing guide grooves, the upper cover comprises an upper cover body and downward-pressing guide plates extending downwards from two sides of the upper cover body, and the downward-pressing guide plates are arranged in the downward-pressing guide grooves.

Preferably, the device further comprises a reset assembly, wherein the reset assembly is arranged between the upper cover and the base and used for enabling the upper cover to reset to an initial state after being pressed downwards.

Preferably, the reset assembly comprises a guide post and a reset spring sleeved on the guide post.

The utility model has the beneficial effects that: the utility model provides a novel pressure-free chip test seat, which is characterized in that a first connecting shaft moves between a first position and a second position, so that the opening angle of a pressing block is larger, a chip is easier to place and take out, and the smoothness of the downward pressing movement of an upper cover is ensured; in addition, through the setting of pushing down the guide way and pushing down the deflector, further avoided the upper cover to push down the bite problem.

Drawings

FIG. 1 is a schematic overall exploded view of the present invention;

FIG. 2 is a schematic structural diagram of the present invention in a test state;

FIG. 3 is a schematic structural view of the present invention in an open state;

reference numerals:

1-a base; 10-a base body; 100-a containing space; 110-a briquetting mounting groove; 120-a first sliding guide hole; 120-1-a first bore end; 120-2-second pore end; 130-a second slide guide hole; 140-pressing down the guide groove; 2, covering the cover; 20-upper cover body; 21-pressing down the guide plate; 3-a fixing component; 30-briquetting; 31-a first connecting shaft; 32-a second connecting shaft; 4-chip.

Detailed Description

The technical scheme protected by the utility model is specifically explained in the following by combining the attached drawings.

Please refer to fig. 1 to 3. The utility model provides a novel pressure-free chip test base, which comprises a base 1 and an upper cover 2 which are matched with each other, wherein the upper cover 2 covers the base 1, a corresponding mounting base (please refer to fig. 2 and fig. 3) is arranged below the base 1, a chip can be placed on the mounting base through the lower cover 2, then the upper cover 2 is reset, and a certain pressure can be applied to the chip through a fixing component 3 so as to enable the chip to be stably contacted with pins in the mounting base, so that the test can be started, for example, fig. 2 is a schematic structural diagram of the utility model in a test state, and fig. 3 is a schematic opening state diagram when the chip needs to be placed and taken out and the upper cover 2 is applied with a certain pressure to enable the chip to move downwards.

Specifically, referring to fig. 1, the base 1 includes a base body 10, the base body 10 includes a first surface and a second surface which are oppositely disposed, and a third surface and a fourth surface which are oppositely disposed, a hollow accommodating space 100 is formed in the center of the base body 10, and a corresponding hollow groove is also formed in the upper cover 2, so that the chip 4 can be placed in the upper cover, and in order to mount the fixing component 3, a pressing block mounting groove 110 is formed in the first surface and the second surface, and the pressing block mounting groove 100 is communicated with the accommodating space 100, so that the fixing component 3 can move in the pressing block mounting groove 110 and the accommodating space 100 along with the pressing and resetting of the upper cover 2. The fixing component 3 comprises a pressing block 30, a first connecting shaft 31 and a second connecting shaft 32, wherein the first connecting shaft 31 is rotatably mounted on a first end of the pressing block 30 and the upper cover 2, the second connecting shaft 32 is rotatably mounted on a second end of the pressing block 30, and the second end of the pressing block 30 is pressed on the chip 4 in a test state; as the upper cover 2 is pressed down, the two ends of the first connecting shaft 31 move from the first position to the second position in the briquette mounting groove 110, and correspondingly, the two ends of the second connecting rotating shaft 32 also make corresponding horizontal movement in the briquette mounting groove.

In this embodiment, a first sliding guide hole 120 is formed in the side wall of the briquetting mounting groove 100, the first sliding guide hole 120 includes a first hole end 120-1 and a second hole end 120-2, and the height of the first hole end 120-1 is greater than the height of the second hole end 120-2; meanwhile, horizontal second sliding guide holes 130 are further formed in two side walls of the briquette mounting groove 110, and both ends of the second connecting shaft 32 horizontally move in the second sliding guide holes 130. In an initial state, i.e., a test state, two ends of the first connecting shaft 31 are located at the first hole ends 120-1 of the two sliding guide holes, and two ends of the second connecting shaft 32 are located at the inner ends of the two second sliding guide holes 130, at this time, the press block is horizontally arranged; when the upper cover 2 is pressed down, two ends of the first connecting shaft 31 are located at the second hole ends 120-2 of the two first sliding guide holes 120, and two ends of the second connecting shaft 32 are located at the outer ends of the two second sliding guide holes 130, at this time, the press block is arranged in an inclined manner, that is, the test socket is in an open state.

In order to further avoid the problem of jamming in the pressing process, the third surface and the fourth surface are provided with pressing guide grooves 140, the upper cover 2 comprises an upper cover body 20 and pressing guide plates 21 extending downwards from two sides of the upper cover body 20, and the pressing guide plates 21 are arranged in the pressing guide grooves 140.

In order to better restore the test state from the open state, the test socket further comprises a resetting component which is arranged between the upper cover 2 and the base 1 and is used for resetting the upper cover 2 to the initial state after being pressed down.

In one embodiment, the reset assembly comprises a guide post and a reset spring sleeved on the guide post, wherein the guide post can be arranged on the upper cover 2 or on the base 1, and only a guide hole is required to be correspondingly formed in the base 1 or the upper cover 2.

The above description is only an embodiment of the present invention, and not intended to limit the scope of the present invention, and all modifications of equivalent structures and equivalent processes performed by the present specification and drawings, or directly or indirectly applied to other related technical fields, are included in the scope of the present invention.

Claims

1. A novel pressure-free chip test seat is characterized by comprising a base and an upper cover which are matched, wherein a hollow accommodating space is arranged in the center of the base, and a chip to be tested is placed in the accommodating space; fixing components are symmetrically arranged on two sides of the base and comprise pressing blocks and first connecting shafts, the first ends of the pressing blocks are rotatably connected with the upper cover through the first connecting shafts, and two ends of the first connecting shafts are slidably connected to the base; in an initial state, the first connecting shaft is positioned at a first position, the pressing block is horizontally arranged, and the second end of the pressing block is pressed on the chip to be tested; when the upper cover is pressed down, the first connecting shaft is located at the second position, and the pressing block is placed in an inclined mode.

2. The novel pressure-free chip test socket according to claim 1, wherein the base comprises a base body, the base body comprises a first surface and a second surface which are arranged oppositely and a third surface and a fourth surface which are arranged oppositely, the first surface and the second surface are provided with a press block mounting groove, and the press block mounting groove is communicated with the accommodating space; and the two ends of the first connecting shaft are connected to the side wall of the pressing block mounting groove in a sliding manner.

3. The novel pressure-free chip testing seat as claimed in claim 2, wherein the side wall of the pressing block mounting groove is provided with a first sliding guide hole which is obliquely arranged, the first sliding guide hole comprises a first hole end and a second hole end, and the height of the first hole end is greater than that of the second hole end; in an initial state, two ends of the first connecting shaft are positioned at first hole ends of the two sliding guide holes; when the upper cover is pressed down, two ends of the first connecting shaft are positioned at the second hole ends of the two first sliding guide holes.

4. The novel pressure-free chip testing seat according to claim 3, wherein the fixing assembly further comprises a second connecting shaft, the second connecting shaft is rotatably mounted at the second end of the pressing block, and the second connecting shaft moves in the horizontal direction in the process of pressing down the upper cover.

5. The novel pressure-free chip testing seat as claimed in claim 4, wherein the inner wall of the pressing block mounting groove is further provided with second sliding guide holes, and two ends of the second connecting shaft horizontally move in the two second sliding guide holes.

6. The novel pressure-free chip testing socket as claimed in claim 2, wherein the third surface and the fourth surface are formed with a pressing guide groove, the upper cover comprises an upper cover body and pressing guide plates extending downward from two sides of the upper cover body, and the pressing guide plates are disposed in the pressing guide grooves.

7. The novel pressure-free chip testing socket as claimed in any one of claims 1 to 6, further comprising a reset component, wherein the reset component is disposed between the upper cover and the base, and is used for resetting the upper cover to an initial state after being pressed down.

8. The novel pressure-free chip test socket as claimed in claim 7, wherein the reset assembly comprises a guide post and a reset spring sleeved on the guide post.