CN217007420U

CN217007420U - Chip test fixture

Info

Publication number: CN217007420U
Application number: CN202220320905.7U
Authority: CN
Inventors: 殷凌一
Original assignee: Ningbo Xince Electronic Technology Co ltd
Current assignee: Ningbo Xince Electronic Technology Co ltd
Priority date: 2022-02-17
Filing date: 2022-02-17
Publication date: 2022-07-19
Anticipated expiration: 2032-02-17

Abstract

The utility model relates to a chip test fixture which comprises a main body, wherein the main body comprises a base and an upper cover, the upper cover is rotatably connected with the base, the base is provided with inwards-recessed chip placing grooves, two sides of each chip placing groove are provided with electric connector placing grooves, the electric connector placing grooves are communicated with the chip placing grooves, the electric connector placing grooves are provided with electric connectors, at least two electric connectors are arranged, the bottoms of the electric connector placing grooves are provided with first through holes, each electric connector comprises a conductive end connected with the corresponding chip pin and a protruding pin extending downwards, the conductive end is arranged below the corresponding chip, the protruding pins penetrate through the first through holes, one side of the base is provided with a clamping groove, the upper cover is provided with a clamping plate, the clamping plate is provided with a buckle matched with the clamping groove, and the clamping plate is rotatably connected with the upper cover. The chip testing clamp has the following advantages: the structure is simple, the chip is convenient to mount and fix, the fixing effect is good, the appearance of the chip cannot be damaged, and the chip is convenient to replace.

Description

Chip test fixture

Technical Field

The utility model relates to the field of chip testing, in particular to a chip testing clamp.

Background

Before the chip is packaged and manufactured and leaves factory, multiple testing procedures are required to screen and eliminate defective products, maintain the quality of chip products and avoid increasing the cost of subsequent product maintenance. The connection of the existing chip usually adopts a welding mode, and if the mode is adopted in the test, the appearance of the chip can be influenced, and the replacement after the test is also troublesome.

SUMMERY OF THE UTILITY MODEL

The utility model aims to solve the technical defects and provide a chip test fixture which does not damage the appearance of a chip and is convenient to replace.

The utility model provides a chip test fixture which comprises a main body, wherein the main body comprises a base and an upper cover, the upper cover is rotatably connected with the base, the base is provided with an inwards concave chip placing groove, two sides of the chip placing groove are provided with electric connector placing grooves, the electric connector placing grooves are communicated with the chip placing grooves, the electric connector placing grooves are provided with at least two electric connectors, the bottom of each electric connector placing groove is provided with a first through hole, each electric connector comprises a conductive end connected with the chip pins and a downward extending pin, the conductive ends are arranged below the chips, the extending pins penetrate through the first through holes, one side of the base is provided with a clamping groove, the upper cover is provided with a clamping plate, the clamping plate is provided with a buckle matched with the clamping groove, and the clamping plate is rotatably connected with the upper cover.

In order to fix the chip firmly, a connecting section is arranged between the conductive end of the electric connector and the extending foot, and a gap is arranged between the connecting section and the bottom surface of the electric connector placing groove.

For the radiating effect good, the upper cover is provided with a second through hole, the second through hole is provided with a radiating block, and the bottom of the radiating block is abutted to the surface of the chip and is connected with the upper cover through a bolt.

For the radiating effect good, base and upper cover both sides all are equipped with the breach, and chip placing groove bottom is equipped with the thermovent.

In order to facilitate positioning and fixing, a fixing boss is arranged at the bottom of the base.

For the buckle reliably resets, the upper cover is equipped with first recess towards cardboard one side, is equipped with the second recess on the first recess, is equipped with reset spring on the second recess, and the cardboard includes riser and diaphragm, and the diaphragm setting is on first recess, and reset spring and diaphragm butt, the buckle setting is in the riser bottom.

In order to facilitate unlocking, a shifting block protruding outwards is arranged between the vertical plate and the transverse plate.

For more pleasing to the eye, the base is equipped with the third recess towards riser one side, and draw-in groove and riser setting are on the third recess.

The chip testing clamp has the following advantages that: simple structure, chip installation is fixed convenient, and fixed effectual, can not cause the damage to the outward appearance of chip, and it is convenient to change the chip, adopts radiating block and louvre, and the radiating effect is good, buckle convenient to use, and the appearance is pleasing to the eye.

Drawings

FIG. 1 is a schematic structural view of embodiment 1 of the present invention;

FIG. 2 is a schematic view of the structure of embodiment 1 of the present invention with the upper lid portion removed;

FIG. 3 is a schematic structural view of embodiment 2 of the present invention;

FIG. 4 is a sectional view of embodiment 2 of the present invention;

fig. 5 is a schematic view of the structure of embodiment 2 of the present invention with the upper cover portion removed.

In the figure: the heat dissipation structure comprises a main body 1, a base 2, an upper cover 3, a chip placing groove 4, an electric connector placing groove 5, an electric connector 6, a first through hole 7, a conductive end 8, a protruding foot 9, a clamping groove 10, a clamping plate 11, a buckle 12, a connecting section 13, a gap 14, a second through hole 15, a heat dissipation block 16, a notch 17, a heat dissipation opening 18, a fixing boss 19, a first groove 20, a second groove 21, a reset spring 22, a vertical plate 23, a transverse plate 24, a shifting block 25, a third groove 26 and a chip 27.

Detailed Description

To further illustrate the technical means and effects of the present invention for achieving the intended purpose of the utility model, the following detailed description of the embodiments, structures, features and effects according to the present invention will be made with reference to the accompanying drawings and preferred embodiments.

Example 1:

the chip testing jig provided by the embodiment, as shown in fig. 1 and fig. 2, includes a main body 1, the main part 1 includes base 2 and upper cover 3, upper cover 3 rotates with base 2 to be connected, be equipped with inside sunken chip standing groove 4 on the base 2, 4 both sides of chip standing groove are equipped with electric connector standing groove 5, electric connector standing groove 5 communicates with each other with chip standing groove 4, be equipped with electric connector 6 on the electric connector standing groove 5, electric connector 6 is no less than two, electric connector standing groove 5 bottom is equipped with first through-hole 7, electric connector 6 includes electrically conductive end 8 of being connected with the chip foot and the foot 9 that stretches out downwards, electrically conductive end 8 sets up in chip 27 below, stretch out foot 9 and wear to establish on first through-hole 7, base 2 one side is equipped with draw-in groove 10, be equipped with cardboard 11 on the upper cover 3, be equipped with on the cardboard 11 with draw-in groove 10 complex buckle 12, cardboard 11 rotates with upper cover 3 to be connected. In this embodiment, the two electric connectors 6 are symmetrically arranged, and a reset torsion spring is arranged between the clamping plate 11 and the upper cover 3, so that the buckle 12 can keep a locking state.

Through the above design, chip standing groove 4 is used for placing chip 27, and electric connector standing groove 5 is used for placing electric connector 6, and first through-hole 7 is convenient for stretch out of foot 9, and electrically conductive end 8 contacts with the chip foot, stretches out foot 9 and is convenient for be connected with test equipment, and draw-in groove 10 and buckle 12 cooperation are fixed, guarantee that the lid of upper cover 3 closes the fixed after. When the connector is used, the upper cover 3 is pressed downwards, so that the chip 27 is contacted with the conductive end 8, and the buckle 12 is buckled into the clamping groove 10.

The device simple structure, chip 27 installation is fixed convenient, and fixed effectual, can not cause the damage to chip 27's outward appearance, and it is convenient to change chip 27.

Example 2:

in order to fix the chip 27 firmly, as shown in fig. 3-5, in addition to the features described in embodiment 1, a connection section 13 is disposed between the conductive end 8 and the protruding pin 9 of the electrical connector 6, and a gap 14 is disposed between the connection section 13 and the bottom surface of the electrical connector placement groove 5.

For good heat dissipation effect, the upper cover 3 is provided with a second through hole 15, the second through hole 15 is provided with a heat dissipation block 16, and the bottom of the heat dissipation block 16 is abutted to the surface of the chip 27 and is connected with the upper cover 3 through a bolt. In this embodiment, the heat dissipation block 16 is made of copper.

In order to achieve good heat dissipation effect, notches 17 are formed in the two sides of the base 2 and the two sides of the upper cover 3, and a heat dissipation opening 18 is formed in the bottom of the chip placement groove 4.

In order to facilitate positioning and fixing, a fixing boss 19 is arranged at the bottom of the base 2.

For the buckle 12 to reset reliably, the upper cover 3 is provided with a first groove 20 towards one side of the clamping plate 11, the first groove 20 is provided with a second groove 21, the second groove 21 is provided with a reset spring 22, the clamping plate 11 comprises a vertical plate 23 and a transverse plate 24, the transverse plate 24 is arranged on the first groove 20, the reset spring 22 is abutted against the transverse plate 24, and the buckle 12 is arranged at the bottom of the vertical plate 23.

In order to unlock the lock, a shifting block 25 which protrudes outwards is arranged between the vertical plate 23 and the transverse plate 24.

For more pleasing to the eye, base 2 is equipped with third recess 26 towards riser 23 one side, and draw-in groove 10 and riser 23 set up on third recess 26.

Through the design, the gap 14 can provide a compression space for the connecting section 13, so that when the chip 27 is pressed, the conductive end 8 can be pressed down, and the conductive end 8 is in close contact with the chip pin; the second through hole 15 is used for accommodating the heat dissipation block 16, the bottom of the heat dissipation block 16 is in contact with the surface of the chip 27, and heat can be transferred to the heat dissipation block 16 while the chip 27 is fixed, so that the heat can be dissipated more quickly; the notch 17 and the heat dissipation port 18 can facilitate air circulation and heat dissipation of the chip; the fixed boss 19 can play a role in positioning, and is more convenient to install with a testing device; the reset spring 22 can provide reset power for the buckle 12, the buckle 12 is kept in a locked state, the first groove 20 is used for accommodating the transverse plate 24, the overall size is reduced, the weight is reduced, and the appearance is more attractive, the second groove 21 is used for installing the reset spring 22 to prevent the reset spring 22 from moving, and due to the design of the vertical plate 23 and the transverse plate 24 on the clamping plate 11, the vertical height can be prevented from being too high, the height is reduced, and the space is saved; the design of the shifting block 25 is more convenient for opening the buckle 12; the third groove 26 can accommodate the riser 23, reducing the overall volume, reducing weight, and being more aesthetically pleasing.

Although the present invention has been described with reference to the preferred embodiments, it should be understood that various changes, substitutions and alterations can be made herein without departing from the spirit and scope of the utility model as defined by the appended claims.

Claims

1. The utility model provides a chip test fixture, including main part (1), its characterized in that main part (1) includes base (2) and upper cover (3), upper cover (3) rotate with base (2) and are connected, be equipped with inside sunken chip standing groove (4) on base (2), chip standing groove (4) both sides are equipped with electric connector standing groove (5), electric connector standing groove (5) communicate with each other with chip standing groove (4), be equipped with electric connector (6) on electric connector standing groove (5), electric connector standing groove (5) bottom is equipped with first through-hole (7), electric connector (6) are including electrically conductive end (8) and stretch out foot (9), stretch out foot (9) and wear to establish on first through-hole (7), base (2) one side is equipped with draw-in groove (10), be equipped with cardboard (11) on the upper cover (3), be equipped with on cardboard (11) with draw-in groove (10) complex buckle (12).

2. The chip test fixture of claim 1, wherein: a connecting section (13) is arranged between the conductive end (8) of the electric connector (6) and the extending foot (9), and a gap (14) is arranged between the connecting section (13) and the bottom surface of the electric connector placing groove (5).

3. The chip test fixture of claim 2, wherein: and a second through hole (15) is formed in the upper cover (3), and a heat dissipation block (16) is arranged on the second through hole (15).

4. The chip test fixture of claim 3, wherein: the chip placing device is characterized in that notches (17) are arranged on two sides of the base (2) and two sides of the upper cover (3), and a heat radiating opening (18) is formed in the bottom of the chip placing groove (4).

5. The chip test fixture of claim 4, wherein: the bottom of the base (2) is provided with a fixed boss (19).

6. The chip test fixture of claim 5, wherein: upper cover (3) are equipped with first recess (20) towards cardboard (11) one side, are equipped with second recess (21) on first recess (20), are equipped with reset spring (22) on second recess (21), and cardboard (11) include riser (23) and diaphragm (24), and diaphragm (24) set up on first recess (20), and reset spring (22) and diaphragm (24) butt, and buckle (12) set up in riser (23) bottom.

7. The chip test fixture of claim 6, wherein: and a shifting block (25) which protrudes outwards is arranged between the vertical plate (23) and the transverse plate (24).

8. The chip test fixture of claim 7, wherein: base (2) are equipped with third recess (26) towards riser (23) one side, and draw-in groove (10) and riser (23) set up on third recess (26).