CN216955086U - TOF module test bench - Google Patents

TOF module test bench Download PDF

Info

Publication number
CN216955086U
CN216955086U CN202220552304.9U CN202220552304U CN216955086U CN 216955086 U CN216955086 U CN 216955086U CN 202220552304 U CN202220552304 U CN 202220552304U CN 216955086 U CN216955086 U CN 216955086U
Authority
CN
China
Prior art keywords
test
cover plate
tof module
bench
plate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN202220552304.9U
Other languages
Chinese (zh)
Inventor
徐渊
熊维强
姚浩东
黄芳
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Optical Micro Information Technology Hefei Co ltd
Original Assignee
Shenzhen Guangwei Technology Co ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shenzhen Guangwei Technology Co ltd filed Critical Shenzhen Guangwei Technology Co ltd
Application granted granted Critical
Publication of CN216955086U publication Critical patent/CN216955086U/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Landscapes

  • Testing Resistance To Weather, Investigating Materials By Mechanical Methods (AREA)

Abstract

The utility model provides a TOF module test bench, which comprises: the test board and the test cover plate; one end of the test cover plate is hinged with the test board, and the other end of the test cover plate is connected with the test board in a buckling manner; the test bench is provided with a groove for placing the PCBA component; the test cover plate is used for detachably fixing the TOF module on the test bench. Fix the TOF module on the testboard through the test apron, the PIN needle and the TOF module electricity of PCBA subassembly are connected, alright in order to accomplish the test, accomplish the test after, from the testboard take off can, need not work such as welding repeatedly, avoided the damage to the TOF module, save time and human cost by a wide margin.

Description

TOF module test bench
Technical Field
The application relates to the field of images, especially relates to a TOF module testboard.
Background
TOF (time of flight) module mainly includes light source, optical lens, sensitization chip and computational element and constitutes, need burn work such as software, demarcation and test crosstalk before using, often weld TOF module in the prior art on the PCB board earlier and carry out relevant test again, take off TOF module after accomplishing tests such as burning and demarcation again, dismouting work is comparatively loaded down with trivial details like this, and the equipment that involves is also comparatively many, leads to TOF module to damage easily.
SUMMERY OF THE UTILITY MODEL
The utility model aims to provide a TOF module test bench which can solve the problems that operation is complex, damage is easily caused, a large amount of time is wasted, labor cost is wasted and the like when a TOF module is tested.
In order to solve the above problems, the present invention provides a TOF module testing platform, comprising: the test board and the test cover plate; one end of the test cover plate is hinged with the test board, and the other end of the test cover plate is connected with the test board in a buckling manner; the test bench is provided with a groove for placing the PCBA component; the test apron is used for fixing TOF module detachably on the testboard.
Furthermore, one end of a test board in the TOF module test board is hinged with the test cover plate through a pin shaft; the other end of the test board is provided with a buckling shaft, the test cover plate is correspondingly provided with a buckling rotating shaft, the buckling rotating shaft is rotatably sleeved with a buckle, and the buckle and the buckling shaft form buckling connection.
Furthermore, the lock catch in the TOF module test bench comprises a hook and a first plane; the test cover plate is correspondingly provided with a second plane; a pressure spring is arranged between the first plane and the second plane; the lock catch is tightly connected with the buckle shaft in a clamping way under the action of the elasticity of the pressure spring.
Further, still be provided with the gleitbretter between testboard and the test cover plate in above-mentioned TOF module testboard, the gleitbretter can slide for the testboard.
Furthermore, a sliding groove is formed in one side, facing the test board, of the test cover plate in the TOF module test board, and the sliding sheet is arranged in the sliding groove; the slide sheet is provided with a test hole for detecting the TOF module;
furthermore, the slip sheet in the TOF module test bench is provided with a protruding part, a limit groove is correspondingly arranged on the test cover plate, the protruding part is arranged in the limit groove, and two ends of the slip sheet are exposed out of the area of the test cover plate and bent to form folding lugs.
Furthermore, waist-shaped holes are formed in the sliding sheet in the TOF module test board, and the sliding sheet penetrates through the waist-shaped holes through bolts to be connected with the test cover plate.
Furthermore, a module test window is formed in the test cover plate in the TOF module test platform; the module testing window is a conical hole and is arranged corresponding to the groove in position; the side of the conical surface hole with the smaller diameter faces the test bench.
Further, the recess still is provided with the module tray that is used for placing the TOF module towards test apron one side in above-mentioned TOF module testboard.
Further, still include in the above-mentioned TOF module testboard: a PCBA component; the PCBA component comprises a PIN needle, a bottom plate, a middle plate and a top plate; the PIN sequentially penetrates through the top plate, the middle plate and the bottom plate; the top plate and the bottom plate are formed by drilling a PCB; mounting holes are formed in four corners of the bottom plate; the middle plate is made of heat-conducting silicone grease; the PCBA component is installed below the test board, and the PIN PIN is inserted into the groove.
Fix the TOF module on the testboard through the test apron, the PIN needle and the TOF module electricity of PCBA subassembly are connected, alright in order to accomplish the test, accomplish the test after, from the testboard take off can, need not work such as welding repeatedly, avoided the damage to the TOF module, save time and human cost by a wide margin.
Drawings
FIG. 1 is a schematic structural diagram according to an embodiment of the present invention;
FIG. 2 is an exploded schematic view according to an embodiment of the present invention;
FIG. 3 is a schematic illustration of another angular explosion according to an embodiment of the present invention;
FIG. 4 is a top view of an embodiment according to the present invention in a first position;
FIG. 5 is a top view of an embodiment according to the present invention in a second position;
fig. 6 is a sectional view taken along line a-a in fig. 4.
Reference numerals:
1: PCBA subassembly
11: PIN needle
12: top board
13: middle class
14: base plate
2: test board
21: pin shaft
22: torsion spring
23: fastening shaft
24: groove
25: module tray
3: test cover plate
31: buckle rotating shaft
32: buckle
321: clamp hook
33: second plane
34: pressure spring
35: sliding vane
351: waist-shaped hole
352: test hole
353: projecting part
354: folding ear
36: sliding chute
37: limiting groove
38: module test window
4: TOF module
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the present invention will be described in further detail with reference to the accompanying drawings in conjunction with the following detailed description. It should be understood that the description is intended to be exemplary only, and is not intended to limit the scope of the present invention. Moreover, in the following description, descriptions of well-known structures and techniques are omitted so as to not unnecessarily obscure the concepts of the present invention. In the description of the present invention, it should be noted that the terms "first", "second", and "third" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance.
Referring to fig. 1-6, the present invention shows a TOF module 4 test station 2 comprising a test station 2, a test lid 3, and a PCBA assembly 1 for testing the TOF module 4.
Wherein PCBA subassembly 1 includes PIN needle 11, roof 12, medium plate 13 and bottom plate 14, and PIN needle 11 runs through roof 12, medium plate 13 and bottom plate 14 in proper order, and roof 12 and bottom plate 14 are formed by PCB board drilling, and four angles of bottom plate 14 are provided with the mounting hole respectively, and bottom plate 14 prints the circuit in advance according to actual test needs. The middle plate 13 is made of heat-conducting silicone grease, the specific size can be adjusted according to actual needs, and the PIN PINs 11 protruding out of the bottom plate 14 can be electrically connected with other external circuits through flat cables.
Test apron 3 detachably installs in the top of testboard 2, and 3 one end of test apron is articulated with testboard 2, and the other end is connected with testboard 2 buckle. In order to open and close conveniently, the hinge joint of the test board 2 and the test cover plate 3 in this embodiment is connected through a pin 21, and a torsion spring 22 is sleeved in the pin 21, the test cover plate 3 can be opened by springing, the other end of the test board 2 is provided with a fastening shaft 23, the test cover plate 3 is correspondingly provided with a fastening rotating shaft 31, a fastener 32 is sleeved on the fastening rotating shaft 31, the fastener 32 can rotate around the fastening rotating shaft 31 and form fastening connection with the fastening shaft 23, and meanwhile, in order to make the fastening connection more stable, the fastener 32 specifically comprises a hook 321 and a first plane, the test cover plate 3 is correspondingly provided with a second plane 33, a pressure spring 34 is arranged between the first plane and the second plane 33, and then the fastener 32 is tightly fastened and connected with the fastening shaft 23 under the elastic force of the pressure spring 34, so that the fastening connection between the test cover plate 3 and the test board 2 is more stable. When the buckle 32 is pulled to compress the compression spring 34, the hook 321 is disengaged from the buckle rotating shaft 31, and the test cover plate 3 is separated from the test bench 2 under the action of the torsion spring 22.
Testboard 2 has a recess 24 that link up from top to bottom, and PCBA subassembly 1 passes through the bolt and installs in testboard 2 one side that does not face test cover plate 3, and PIN needle 11 inserts in the recess 24, and recess 24 is provided with the module tray 25 that is used for placing TOF module 4 towards test cover plate 3's one side, and the top of testboard 2 still is provided with promptly, puts into module tray 25 with TOF module 4 in, PIN needle 11 alright with TOF module 4 elastic contact and electricity be connected.
This embodiment still includes gleitbretter 35, gleitbretter 35 sets up between test apron 3 and testboard 2, gleitbretter 35 can slide by testboard 2 relatively, in order to let slide more in the same direction as smooth, be provided with spout 36 towards testboard 2 one side at test apron 3, gleitbretter 35 is placed in spout 36, waist shape hole 351 has been seted up on the gleitbretter 35, the bolt passes waist shape hole 351 and is connected with test apron 3, two test holes 352 have still been seted up on the gleitbretter 35, test hole 352 can be the quad slit, shape such as round hole, the concrete size and the position of test hole 352 are arranged according to actual conditions, do not shelter from the receiving and dispatching module of TOF module can. For positioning convenience, the test cover plate 3 is further provided with a limiting groove 37, the sliding sheet 35 is provided with a protruding part 353, the protruding part 353 is arranged in the limiting groove 37, and when the sliding sheet 35 slides to a first position in a first direction, the protruding part 353 is blocked by one end of the limiting groove 37; when the slide 35 slides in the second direction to the second position, the protrusion 353 is received by the other end of the limiting groove 37. In order to facilitate the sliding of the sliding sheet 35, the two ends of the sliding sheet 35 are bent to form the folding ears 354 in the areas exposed out of the test cover plate 3, and when the sliding sheet 35 moves, the folding ears 354 can also be blocked by the side edges of the test cover plate 3, and a limiting effect can also be achieved.
The test cover 3 is further provided with a module test window 38, the position of which just corresponds to the groove 24 on the test platform 2, the module test window 38 is a conical hole penetrating through the test cover 3, and the side with the smaller diameter of the conical hole faces the test platform 2. In addition, in order to facilitate the burning calibration test, the aperture of the module test window 38 facing the test platform 2 is smaller than the extension size of the TOF module 4, so that the TOF module 4 can be pressed.
When in use, the PCBA component 1 is firstly arranged below the test board 2, the PIN 11 is inserted into the groove 24, then the TOF module 4 is placed on the module tray 25, the test cover plate 3 is covered with the test bench 2, the buckle 32 is connected with the buckle shaft 23 in a buckling mode, then the PIN PIN 11 is in elastic contact with the TOF module 4 to form electric connection, then, the sliding plate 35 is slid to the first position, as shown in FIG. 4, which is a normal test state, so as to perform the recording calibration test, and the sliding plate 35 is slid to the second position, as shown in fig. 5, in the crosstalk testing state, it is tested whether the emitted light enters the receiving module through the retaining wall between the TOF module emitting module and the receiving module to affect the testing result, thereby completing a series of functional tests, and thus saving the risk of damage caused by repeated welding and saving a lot of valuable time and cost for mass production.
It is to be understood that the above-described embodiments of the present invention are merely illustrative of or explaining the principles of the utility model and are not to be construed as limiting the utility model. Therefore, any modification, equivalent replacement, improvement and the like made without departing from the spirit and scope of the present invention should be included in the protection scope of the present invention. Further, it is intended that the appended claims cover all such changes and modifications that fall within the scope and bounds of the appended claims, or equivalents of such scope and bounds.

Claims (10)

1. The utility model provides a TOF module testboard which characterized in that includes:
the test board and the test cover plate;
one end of the test cover plate is hinged with the test board, and the other end of the test cover plate is connected with the test board in a buckling mode;
the test bench is provided with a groove for placing a PCBA component;
the test cover plate is used for detachably fixing the TOF module on the test bench.
2. The TOF module testing bench of claim 1, wherein:
one end of the test board is hinged with the test cover plate through a pin shaft;
the test bench other end is provided with detains the axle, the test apron corresponds and is provided with the buckle pivot, the buckle pivot is rotationally overlapped and is equipped with the hasp, the hasp with detain the axle and form the buckle and be connected.
3. The TOF module testing bench of claim 2, wherein:
the lock catch comprises a clamping hook and a first plane;
the test cover plate is correspondingly provided with a second plane;
a pressure spring is arranged between the first plane and the second plane;
the lock catch is tightly connected with the lock shaft in a clamping manner under the action of the elasticity of the pressure spring.
4. The TOF module testing bench of claim 1, wherein:
a slip sheet is also arranged between the test platform and the test cover plate,
the slide may slide relative to the test stand.
5. The TOF module testing bench of claim 4, wherein:
a sliding groove is formed in one side, facing the test board, of the test cover plate, and the sliding sheet is arranged in the sliding groove;
the slide sheet is provided with a test hole for detecting the TOF module.
6. The TOF module testing bench of claim 4, wherein:
the sliding sheet is provided with a bulge, a limit groove is correspondingly arranged on the test cover plate, and the bulge is arranged in the limit groove;
and two ends of the sliding sheet are exposed out of the area of the test cover plate and bent to form folding lugs.
7. The TOF module testing bench of claim 4, wherein:
the slide sheet is provided with a waist-shaped hole, and the slide sheet penetrates through the waist-shaped hole through a bolt to be connected with the test cover plate.
8. The TOF module testing bench of claim 1, wherein:
the test cover plate is provided with a module test window;
the module testing window is a conical hole and is arranged corresponding to the groove in position;
the side of the conical surface hole with the smaller diameter faces the test bench.
9. The TOF module testing bench of claim 1, wherein:
the recess orientation test apron one side still is provided with the module tray that is used for placing the TOF module.
10. The TOF module testing bench of any of claims 1 to 9 further comprising:
a PCBA component;
the PCBA component comprises a PIN needle, a bottom plate, a middle plate and a top plate;
the PIN needle sequentially penetrates through the top plate, the middle plate and the bottom plate;
the top plate and the bottom plate are formed by drilling a PCB;
mounting holes are formed in four corners of the bottom plate;
the middle plate is made of heat-conducting silicone grease;
the PCBA assembly is mounted below the test table, and the PIN PINs are inserted into the grooves.
CN202220552304.9U 2022-01-04 2022-03-11 TOF module test bench Active CN216955086U (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
CN202220018642 2022-01-04
CN2022200186424 2022-01-04

Publications (1)

Publication Number Publication Date
CN216955086U true CN216955086U (en) 2022-07-12

Family

ID=82294315

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202220552304.9U Active CN216955086U (en) 2022-01-04 2022-03-11 TOF module test bench

Country Status (1)

Country Link
CN (1) CN216955086U (en)

Similar Documents

Publication Publication Date Title
CN216955086U (en) TOF module test bench
KR20100059093A (en) Semiconductor testing socket
RU2007106236A (en) HOLDER
CN219524379U (en) General type pad pasting ware and pad pasting suit device
CN211700635U (en) Display screen upset detection mechanism
CN201044260Y (en) Notebook computer antenna fixing structure
CN215375511U (en) Linkage type display screen test fixture
CN212162696U (en) Power supply device for communication equipment
CN208780737U (en) A kind of test suite
JPH07254468A (en) Ic measuring socket
CN208937656U (en) A kind of change of current change tap switch on-line diagnosing apparatus
US6582246B1 (en) Foldable connector assembly for electronic device
CN214473753U (en) Integrated circuit test support plate
CN211978667U (en) Testing device of optical module
CN216673132U (en) Camera assembly and electronic equipment
CN212341247U (en) Test fixture based on PSU
CN214901154U (en) Camera module test fixture
CN213147866U (en) U disk type temperature and humidity recorder with folding ports
CN217820692U (en) Portable circuit board testing device
CN219533243U (en) Annular component test base
CN211628600U (en) It shows many screen concatenation formula training room show screens to patrol and examine show
CN218229959U (en) Portable body temperature pastes receiver and body temperature monitoring devices
CN219285337U (en) Chip test system and test platform
CN218727701U (en) Test tool
CN217787159U (en) Flip formula detection tool

Legal Events

Date Code Title Description
GR01 Patent grant
GR01 Patent grant
CP03 Change of name, title or address
CP03 Change of name, title or address

Address after: 230000 8th floor, phase IV, intelligent technology park, No. 3963 Susong Road, Hefei Economic and Technological Development Zone, Anhui Province

Patentee after: Optical micro information technology (Hefei) Co.,Ltd.

Address before: 518000 c1309, innovation Plaza, No. 2007, Pingshan Avenue, Liulian community, Pingshan street, Pingshan District, Shenzhen, Guangdong Province

Patentee before: SHENZHEN GUANGWEI TECHNOLOGY Co.,Ltd.