CN216792618U

CN216792618U - TFT test jig

Info

Publication number: CN216792618U
Application number: CN202122484841.2U
Authority: CN
Inventors: 李德
Original assignee: Huangshi Xipu Electronic Technology Co ltd
Current assignee: Huangshi Xipu Electronic Technology Co ltd
Priority date: 2021-10-15
Filing date: 2021-10-15
Publication date: 2022-06-21
Anticipated expiration: 2031-10-15

Abstract

The utility model discloses a TFT test jig which comprises a base station, wherein the upper surface of the base station is used for placing a TFT, and a baffle is fixedly arranged on the upper surface of the base station; the horizontal fixing mechanism comprises a top block movably arranged on the base station and a first spring used for driving the top block to be close to the baffle; the top block and the baffle plate clamp the TFT in the horizontal direction; the vertical fixing mechanism comprises two guide posts oppositely arranged on the base station, a pressing block sleeved with the two guide posts and a second spring for driving the pressing block to move downwards; the pressing block presses the TFT on the upper surface of the base platform. Through set up baffle, horizontal fixed establishment and vertical fixed establishment on the base station, carry out all-round fixed on the horizontal direction and the vertical direction to the TFT of placing on the base station, ensure that TFT is fixed steadily, avoid TFT to remove easily to it is not hard up to lead to being connected between TFT and the test thimble.

Description

TFT test jig

Technical Field

The utility model relates to the technical field of TFT (thin film transistor) testing equipment, in particular to a TFT testing frame.

Background

Tft (thinfilm transistor) is an abbreviation for thin film transistor. The liquid crystal display device is characterized in that each liquid crystal pixel point is driven by a thin film transistor integrated behind the pixel point, so that screen information can be displayed at high speed, high brightness and high contrast, the liquid crystal display device is one of the best LCD color display devices at present, the effect of the liquid crystal display device is close to that of a CRT display, and the liquid crystal display device is the mainstream display device on notebook computers and desktop computers at present.

In production, the TFT needs to be tested so as to ensure the normal performance of the TFT; generally, the TFT is fixed through a test frame, and then the TFT is connected with electricity through a test thimble and other components; in the TFT test jig disclosed in publication No. CN206096712U, it is difficult to stably fix the TFT, and loose connection between the TFT and the test thimble is likely to occur.

SUMMERY OF THE UTILITY MODEL

In view of the above, the present invention provides a TFT testing jig, which can solve the problem of instability of the existing TFT testing jig in fixing the TFT at least to some extent.

The technical scheme of the utility model is realized as follows:

a TFT test rack comprising:

the upper surface of the base station is used for placing the TFT, and a baffle is fixedly arranged on the upper surface of the base station;

the horizontal fixing mechanism comprises a top block movably arranged on the base station and a first spring used for driving the top block to be close to the baffle; the top block and the baffle plate clamp the TFT in the horizontal direction;

the vertical fixing mechanism comprises two guide posts oppositely arranged on the base station, a pressing block sleeved with the two guide posts and a second spring for driving the pressing block to move downwards; the pressing block presses the TFT on the upper surface of the base platform.

As a further alternative of the TFT testing jig, the horizontal fixing mechanism includes a first T-shaped groove concavely formed on the base platform, the top block is movably disposed in the first T-shaped groove, the first spring is disposed in the first T-shaped groove, one end of the first spring is fixed to a side wall of the first T-shaped groove, and the other end of the first spring is fixed to the top block; the upper part of the top block protrudes out of the first T-shaped groove, so that the TFT is pushed.

As a further alternative of the TFT testing jig, the upper portion of the guide post is provided with an external thread, the upper portion of the guide post is connected with an adjusting ring through a thread, the second spring is sleeved on the guide post, one end of the second spring abuts against the lower surface of the adjusting ring, and the other end of the second spring abuts against the pressing block.

As a further alternative of the TFT testing jig, the base station is further provided with a supporting mechanism, the supporting mechanism includes a second T-shaped groove concavely formed on the base station, a supporting block is arranged in the second T-shaped groove, and an upper portion of the supporting block protrudes out of the second T-shaped groove; the supporting block can move along the second T-shaped groove so as to be positioned below the pressing block or be positioned away from the pressing block; when the supporting block is positioned below the pressing block, a gap for placing the TFT is formed between the pressing block and the upper surface of the base platform.

As a further alternative of the TFT test rack, a lifting handle is arranged on the pressing block and is positioned between the two guide pillars.

As a further alternative of the TFT test rack, a force rod is fixedly arranged above the lifting handle, and two ends of the force rod are detachably connected with the top ends of the two guide rods respectively.

As a further alternative of the TFT testing jig, a threaded hole is formed in the top end of the guide rod, a connection hole is formed in the end of the force applying rod, and a fixing bolt penetrates through the connection hole and is threadedly connected to the threaded hole, so that the guide rod and the force applying rod are fixed.

The utility model has the following beneficial effects: through set up baffle, horizontal fixed establishment and vertical fixed establishment on the base station, carry out all-round fixed on the horizontal direction and the vertical direction to the TFT of placing on the base station, ensure that TFT is fixed steadily, avoid TFT to remove easily to it is not hard up to lead to being connected between TFT and the test thimble.

Drawings

In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to the drawings without creative efforts.

FIG. 1 is a schematic structural diagram of a TFT test rack according to the present invention;

FIG. 2 is a schematic structural diagram of a TFT testing jig according to the present invention;

FIG. 3 is an exploded view of a TFT tester according to the present invention;

fig. 4 is an enlarged view of a in fig. 3.

In the figure: 1. a base station; 11. a baffle plate; 2. a horizontal fixing mechanism; 21. a top block; 22. a first spring; 23. a first T-shaped groove; 3. a vertical fixing mechanism; 31. a guide bar; 311. a threaded hole; 32. briquetting; 321. lifting the handle; 33. a second spring; 34. an adjusting ring; 35. a force application rod; 351. connecting holes; 36. fixing the bolt; 4. a support mechanism; 41. a support block; 42. a second T-shaped groove; 100. and a TFT.

Detailed Description

The technical solutions in the embodiments of the present invention will be described clearly and completely below, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.

In the description of the present invention, it is to be understood that the terms "upper", "lower", "front", "rear", "vertical", "horizontal", "inner", "outer", etc. indicate orientations or positional relationships based on those shown in the drawings, and are only for convenience in describing the present invention and simplifying the description, but do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and thus, should not be construed as limiting the present invention.

In the present invention, unless otherwise expressly stated or limited, the terms "mounted," "connected," "secured," and the like are to be construed broadly and can, for example, be fixedly connected, detachably connected, or integrally formed; can be mechanically or electrically connected; either directly or indirectly through intervening media, either internally or in any other relationship. The specific meanings of the above terms in the present invention can be understood by those skilled in the art according to specific situations.

In the present invention, unless otherwise expressly stated or limited, the first feature "on" or "under" the second feature may be directly contacting the first and second features or indirectly contacting the first and second features through an intermediate. Also, a first feature "on," "above," and "over" a second feature may be directly on or obliquely above the second feature, or may simply mean that the first feature is at a higher level than the second feature. A first feature being "under," "below," and "beneath" a second feature may be directly under or obliquely under the first feature, or may simply mean that the first feature is at a lesser elevation than the second feature.

Referring to fig. 1-4, a TFT testing jig is shown, which includes a base platform 1, an upper surface of the base platform 1 is used for placing TFTs, and a baffle 11 is fixed on the upper surface of the base platform 1; the horizontal fixing mechanism 2 comprises a top block 21 movably arranged on the base station 1 and a first spring 22 used for driving the top block 21 to be close to the baffle plate 11; the top block 21 and the baffle 11 clamp the TFT in the horizontal direction; the vertical fixing mechanism 3 comprises two guide posts oppositely arranged on the base platform 1, a pressing block 32 and a second spring 33, wherein the pressing block 32 is sleeved with the two guide posts, and the second spring 33 is used for driving the pressing block 32 to move downwards; the pressing block 32 presses the TFT on the upper surface of the base 1.

In other words, referring to fig. 2, the TFT100 is fixed on the base 1, and by providing the baffle 11, the horizontal fixing mechanism 2, and the vertical fixing mechanism 3 on the base 1, the TFT placed on the base 1 is fixed in all directions in the horizontal direction and the vertical direction, so that the TFT is stably fixed, and the TFT is prevented from easily moving, and the connection between the TFT and the test thimble is not loosened.

In the above embodiment, referring to fig. 1 and fig. 3, the horizontal fixing mechanism 2 includes a first T-shaped groove 23 concavely disposed on the base platform 1, the top block 21 is movably disposed in the first T-shaped groove 23, the first spring 22 is disposed in the first T-shaped groove 23, one end of the first spring 22 is fixed to a side wall of the first T-shaped groove 23, and the other end of the first spring 22 is fixed to the top block 21; the upper part of the top block 21 protrudes out of the first T-shaped groove 23, so that the TFT100 is pushed.

In some specific embodiments, in order to avoid the clamping of the TFT due to the too high pressure of the pressing block 32 on the TFT100 and the unstable fixation of the TFT100 due to the too low pressure of the pressing block 32 on the TFT, referring to fig. 2 and 3, the upper portion of the guide pillar is provided with an external thread, on which an adjusting ring 34 is screwed, the second spring 33 is sleeved on the guide pillar, one end of the second spring 33 abuts against the lower surface of the adjusting ring 34, and the other end abuts against the pressing block 32. In this way, the adjusting ring 34 can be screwed to sleeve the position of the adjusting ring 34 on the guide rod 31, so as to adjust the pressure of the second spring 33 on the pressing block 32. In this way, the adjusting ring 34 can be adjusted for adaptive adjustment of pressure when fixing TFTs of different thicknesses. Wherein, an insulating rubber may be further disposed at the bottom of the pressing block 32, so as to avoid a violent impact between the pressing block 32 and the TFT.

In some specific embodiments, for convenience of operation, referring to fig. 2 and 3, a supporting mechanism 4 is further disposed on the base platform 1, the supporting mechanism 4 includes a second T-shaped groove 42 recessed on the base platform 1, a supporting block 41 is disposed in the second T-shaped groove 42, and an upper portion of the supporting block 41 protrudes out of the second T-shaped groove 42; the supporting block 41 is movable along the second T-shaped groove 42 so as to be located below the pressing piece 32 or away from below the pressing piece 32; when the supporting block 41 is located below the press block 32, a gap for placing the TFT is provided between the press block 32 and the upper surface of the base 1. Thus, when the TFT needs to be placed on the base platform 1, the pressing block 32 can be lifted first, the supporting block 41 is moved to the position below the pressing block 32, and after the pressing block 32 is put down, a gap is formed between the pressing block 32 and the upper surface of the base platform 1, so that the TFT can be placed in; at this time, the inspector only needs to pull the push block open, put in the TFT, release the push block, clamp the TFT100 together with the baffle 11, lift the press block 32, remove the supporting block 41 below the press block 32, and finally put down the press block 32, and the press block 32 presses the TFT on the upper surface of the base table 1.

In some embodiments, to facilitate lifting of the press block 32, referring to fig. 1 and 3, the lifting handle is positioned between two guide posts. In order to facilitate the force application of the maintainers, a force rod 35 is fixedly arranged above the lifting handle, and two ends of the force rod 35 are detachably connected with the top ends of the two guide rods 31 respectively. Specifically, the inspector can hold the stressing rod 35 and the lifting handle 321 at the same time, and when the inspector holds the handle 321, the pressing block 32 is lifted by making the handle close to the stressing rod 35; therefore, the force of the detection personnel can be conveniently exerted. In addition, in order to fix the force application rod 35, referring to fig. 4 again, the top end of the guide rod 31 is provided with a threaded hole 311, the end of the force application rod 35 is provided with a connecting hole 351, and the fixing bolt 36 passes through the connecting hole 351 and is screwed into the threaded hole 311, so that the guide rod 31 and the force application rod 35 are fixed.

The above description is only for the purpose of illustrating the preferred embodiments of the present invention and is not to be construed as limiting the utility model, and any modifications, equivalents, improvements and the like that fall within the spirit and principle of the present invention are intended to be included therein.

Claims

1. A TFT test rack, comprising:

2. The TFT testing jig according to claim 1, wherein the horizontal fixing mechanism includes a first T-shaped groove concavely formed on the base, the top block is movably disposed in the first T-shaped groove, the first spring is disposed in the first T-shaped groove, and one end of the first spring is fixed to a side wall of the first T-shaped groove while the other end is fixed to the top block; the upper part of the top block protrudes out of the first T-shaped groove, so that the TFT is pushed.

3. The TFT testing jig according to claim 1, wherein the upper portion of the guide post has an external thread, an adjusting ring is threadedly connected to the external thread, the second spring is sleeved on the guide post, one end of the second spring abuts against a lower surface of the adjusting ring, and the other end of the second spring abuts against the pressing block.

4. The TFT testing jig according to claim 3, wherein the base is further provided with a supporting mechanism, the supporting mechanism comprises a second T-shaped groove concavely formed on the base, a supporting block is arranged in the second T-shaped groove, and the upper part of the supporting block protrudes out of the second T-shaped groove; the supporting block can move along the second T-shaped groove so as to be positioned below the pressing block or be positioned away from the pressing block; when the supporting block is positioned below the pressing block, a gap for placing the TFT is formed between the pressing block and the upper surface of the base platform.

5. The TFT testing jig according to claim 4, wherein a lifting handle is arranged on the pressing block and is positioned between the two guide posts.

6. The TFT test jig of claim 5, wherein a force bar is fixedly arranged above the lifting handle, and two ends of the force bar are detachably connected with the top ends of the two guide rods respectively.

7. The TFT test rack according to claim 6, wherein the top end of the guide rod is provided with a threaded hole, the end of the stressing rod is provided with a connecting hole, and a fixing bolt penetrates through the connecting hole and is in threaded connection with the threaded hole, so that the guide rod and the stressing rod are fixed.