CN216717643U

CN216717643U - Durability test system of NTC product

Info

Publication number: CN216717643U
Application number: CN202122598764.3U
Authority: CN
Inventors: 俞兴华; 张显平; 陈仁建; 陈博; 高洪亮; 纪灵爽; 吴鸿鹏
Original assignee: Xiamen Set Electronics Co Ltd
Current assignee: Xiamen Set Electronics Co Ltd
Priority date: 2021-10-27
Filing date: 2021-10-27
Publication date: 2022-06-10
Anticipated expiration: 2031-10-27

Abstract

The utility model relates to the field of NTC tests, in particular to a durability test system of an NTC product. The utility model discloses a durability test system of an NTC product, which comprises a power supply, test equipment and a resistor box, wherein the power supply, the test equipment and the resistor box are sequentially and electrically connected to form a test loop, the test equipment is used for installing the NTC product to be tested so that the NTC product to be tested is connected into the test loop, a load resistor unit is arranged in the resistor box and used for providing a load resistor in the test loop, and a toggle switch is arranged on the resistor box and used for adjusting the resistance value of the load resistor unit. The utility model can realize the durability test of the NTC product, and has the advantages of convenient and quick adjustment of the load resistance, high adjustment precision, high safety and compact and simple structure.

Description

Durability test system of NTC product

Technical Field

The utility model belongs to the field of NTC tests, and particularly relates to a durability test system of an NTC product.

Background

The NTC (negative Temperature coefficient) thermistor is a thermistor with a negative Temperature coefficient, the resistance of which is exponentially reduced along with the Temperature rise, and the thermistor can be used for manufacturing Temperature measurement, Temperature compensation and Temperature control components, power type components and the like to inhibit the surge current of a circuit.

The NTC product test comprises a pattern test and a UL certification test, and the UL certification test comprises a durability test. When the NTC product is subjected to a durability test, a load resistor and a capacitor are arranged in a test loop, wherein the load resistor is used for simulating the impedance of a load, and the capacitor is used for simulating the capacitive reactance of the load. In order to adjust the magnitude of the test current, the resistance value of the load resistor needs to be adjustable. The existing load resistors with adjustable resistance values are all realized by adopting sliding varistors, and have the following defects: the adjusting precision is low, the required resistance value needs to be adjusted, the fine adjustment needs to be carried out repeatedly and repeatedly, the adjustment is inconvenient, the speed is low, and the safety is low.

In addition, the existing testing device for testing the durability of the NTC product is built on a workbench, the circuit of the whole testing device is messy, the testing safety is low, and the testing effect is easy to interfere.

Disclosure of Invention

The present invention is directed to provide a system for testing durability of an NTC product to solve the above-mentioned problems.

In order to achieve the purpose, the utility model adopts the technical scheme that: the utility model provides a durability test system of NTC product, includes power, test equipment and resistance box, and power, test equipment and resistance box electricity in proper order connect and constitute the test circuit, and test equipment is arranged in installing the NTC product that awaits measuring and makes the NTC product that awaits measuring insert in the test circuit, is equipped with load resistance unit in the resistance box for provide the load resistance in the test circuit, is equipped with toggle switch on the resistance box, is used for adjusting the resistance size of load resistance unit.

Furthermore, the load resistance unit comprises a plurality of sub-load resistances, the number of the toggle switches is the same as that of the sub-load resistances, and the sub-load resistances are respectively connected in series with the toggle switches one by one and then are connected in parallel.

Furthermore, the test equipment comprises a cabinet body, the cabinet body is provided with a test chamber, the test chamber is provided with a first chamber door capable of being opened, a test tool is arranged in the test chamber, and the test tool is used for fixing the NTC product to be tested and enabling the NTC product to be tested to be connected into the test loop.

Furthermore, the test fixture is provided with a fixing structure, the fixing structure comprises a wiring terminal, and the wiring terminal is used for locking the pin of the NTC product to be tested on the test fixture so as to enable the NTC product to be tested to be connected into the test loop.

Further, the test circuit still includes electric capacity and discharge resistance, and electric capacity and load resistance are parallelly connected to be set up, and discharge resistance and the parallelly connected setting of electric capacity, the cabinet body still is equipped with first electric cavity, and first electric cavity is equipped with the second chamber door that can open, and electric capacity and discharge resistance detachably set up in first electric cavity.

Furthermore, a first mounting bracket is arranged in the first electrical chamber, the bleeder resistor is detachably fixed on the first mounting bracket and connected in the test circuit, and the detachable fixed connection mode can be threaded connection, snap connection and the like.

Furthermore, a second mounting bracket is arranged in the first electrical chamber, a slot is formed in the second mounting bracket, and the capacitor is detachably inserted in the slot and connected in the test loop.

Furthermore, a second electrical cavity is further arranged in the cabinet body, a main control circuit is arranged in the second electrical cavity, and the main control circuit is used for controlling the on-off of the test loop.

Furthermore, the cabinet body is also provided with a door opening detection mechanism, and the door opening detection mechanism is used for detecting the opening and closing state of the first cavity door and transmitting the opening and closing state to the main control circuit to perform on-off control of the test loop.

Furthermore, the number of the power supplies is two, and the output voltages of the two power supplies are different.

The utility model has the beneficial technical effects that:

the NTC product durability test device can realize the NTC product durability test, adjusts the size of the load resistor by toggling the switch, and has the advantages of convenient and quick adjustment, high adjustment precision, high safety and compact and concise whole system structure.

Drawings

In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the drawings needed to be used in the description of the embodiments will be briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art to obtain other drawings based on these drawings without creative efforts.

FIG. 1 is a block diagram of an embodiment of the present invention;

FIG. 2 is a block diagram of a resistor box according to an embodiment of the present invention;

FIG. 3 is a block diagram of a test apparatus according to an embodiment of the present invention;

FIG. 4 is a diagram of an open state of a test apparatus in accordance with an embodiment of the present invention;

FIG. 5 is a block diagram of a test fixture according to an embodiment of the present invention;

FIG. 6 is a diagram of a fixed structure of a capacitor according to an embodiment of the present invention;

FIG. 7 is a fixed structure diagram of a bleeder resistor in accordance with an embodiment of the present invention;

FIG. 8 is a circuit diagram of a test loop according to an embodiment of the present invention;

FIG. 9 is a circuit diagram of a load resistance unit according to an embodiment of the present invention;

fig. 10 is a block diagram of another embodiment of the present invention.

Detailed Description

To further illustrate the various embodiments, the utility model provides the accompanying drawings. The accompanying drawings, which are incorporated in and constitute a part of this disclosure, illustrate embodiments of the utility model and, together with the description, serve to explain the principles of the embodiments. Those skilled in the art will appreciate still other possible embodiments and advantages of the present invention with reference to these figures. Elements in the figures are not drawn to scale and like reference numerals are generally used to indicate like elements.

The utility model will now be further described with reference to the accompanying drawings and detailed description.

As shown in fig. 1 to 9, a system for testing durability of an NTC product includes a power supply 1, a testing device 2, and a resistor box 3, where the power supply 1, the testing device 2, and the resistor box 3 are sequentially electrically connected to form a testing loop, the testing device 2 is used to install an NTC product 4 to be tested and to make the NTC product 4 to be tested access into the testing loop, a load resistor unit is disposed in the resistor box 3 and is used to provide a load resistor Rload in the testing loop to simulate impedance of a load, and a toggle switch 31 is disposed on the resistor box and is used to adjust a resistance value of the load resistor unit. The size of the load resistor Rload is adjusted through the toggle switch 31, the adjustment is convenient and quick, the adjustment precision is high, and the safety is high.

Specifically, the load resistance unit includes a plurality of sub-load resistances, the number of the toggle switches 31 is the same as the number of the sub-load resistances, and the plurality of sub-load resistances are respectively connected in series with the plurality of toggle switches 31 one by one and then are connected in parallel, but not limited thereto. Different sub-load resistors are connected into the test loop by toggling different toggle switches, so that the resistance of the load resistor Rload is adjusted, and the current in the test loop is adjusted. The more the number of sub-load resistors and toggle switches 31, the more current steps of the adjustable test loop, and the higher the accuracy can be made.

Fig. 7 shows a circuit structure diagram in which the number of the sub-load resistors and the toggle switches 31 is 8, the 8 sub-load resistors are Rload1-Rload8, the 8 toggle switches 31 are K1-K8, and the toggle switches K1-K8 can be used alone to form 8 gear current adjustments or used in combination to form more current gear adjustments. Of course, in some embodiments, the number of the sub-load resistors and the number of the toggle switches 31 may also be less than 8, or may also be more than 8, and is specifically set according to actual needs.

The resistances of the sub-load resistors can be the same or different, and the specific resistance can be selected according to actual conditions.

In this embodiment, the resistor box 3 is a rectangular parallelepiped structure, and the toggle switch 31 is disposed on the front panel of the resistor box 3, so that the structure is compact, the operation is convenient, but not limited thereto.

In this embodiment, the testing apparatus 2 includes a cabinet 21, the cabinet 21 is provided with a testing chamber 22, the testing chamber 22 is provided with an openable first chamber door 221, a testing tool 25 is disposed in the testing chamber 22, and the testing tool 25 is used for fixing the NTC product 4 to be tested and connecting the NTC product 4 to be tested into the testing circuit.

Through setting up test chamber 22, and test chamber 22 sets up the first chamber door 221 that can open, both be convenient for dismouting NTC product 4 that awaits measuring, can make NTC product 4 that awaits measuring be in the enclosure space again, be difficult for receiving external environment interference, test effect is good.

In this embodiment, the cabinet 21 is a rectangular parallelepiped structure, so that the structure is reasonable and compact, but not limited thereto, and in some embodiments, the structure of the cabinet 21 may be set according to actual situations.

In this embodiment, the testing chamber 22 is disposed at the upper right portion of the cabinet 21, which is more reasonable in structure and more convenient for use, but not limited thereto, and in some embodiments, the testing chamber 22 may be disposed at other positions of the cabinet 21.

In this embodiment, the testing tool 25 is provided with a fixing structure, the fixing structure includes a lockable connection terminal 251, and the connection terminal 251 is used for locking the pin of the NTC product 4 to be tested on the testing tool 25 so as to electrically connect the NTC product 4 to be tested into the testing loop. By adopting the fixing structure, the structure is simple, the dismounting is convenient, the fixing effect is good, but the fixing structure is not limited by the structure, and in some embodiments, the fixing structure can also be realized by adopting other existing fixing structures. Preferably, the connecting terminal is made of ceramic materials.

Preferably, in the present embodiment, the number of the fixing structures is multiple, and the fixing structures are used for fixing a plurality of NTC products 4 to be tested on the testing tool 25 so that the plurality of NTC products 4 to be tested are connected in series and are connected into the testing loop, as illustrated in fig. 5, 3 NTC products 4 to be tested are fixed in series. The fixed knot constructs to set up a plurality ofly, can once test a plurality of NTC products, improves efficiency of software testing.

In this embodiment, the first chamber door 221 is provided with a transparent observation window 222, so as to facilitate observation of the inside of the testing chamber 22, and the use is easier.

Further, the test circuit further includes a capacitor C1 and a bleeder resistor Rb, the capacitor C1 is used for simulating the capacitive reactance of the load, the capacitor C1 and the load resistor Rload are connected in series in the test circuit after being connected in parallel, and the bleeder resistor Rb is connected in parallel with the capacitor C1 and is used for bleeding the electric quantity of the capacitor C1, more specifically, the circuit is shown in fig. 8, wherein SW1 is a switch, B1 is a rectifier bridge, and D1 is a diode, which is a more conventional test circuit, and is not to be described in detail, but is not limited thereto.

The cabinet body 21 still is equipped with first electric cavity 23, first electric cavity 23 is equipped with the second cavity 231 that can open, electric capacity C1 sets up in first electric cavity 23 with bleeder resistance Rb detachably, adopt this structure, not only conveniently change electric capacity C1 and/or bleeder resistance Rb, thereby can be applicable to the test of the NTC product of different specifications, and extensive applicability, and separate electric capacity C1 and bleeder resistance Rb and the NTC product 4 that awaits measuring, can not influence the NTC product 4 that awaits measuring, the test effect is better.

In this embodiment, the first electric chamber 23 is disposed at the lower portion of the cabinet 21, which is more reasonable and compact, but not limited thereto, and in some embodiments, the first electric chamber 23 may be disposed at other positions of the cabinet 21.

In this embodiment, the first mounting bracket 26 is disposed in the first electrical cavity 23, and the bleeder resistor Rb is locked to the first mounting bracket 26 by a screw (not shown) to be electrically connected in series in the test circuit.

In this embodiment, the second mounting bracket 27 is disposed in the first electrical chamber 23, the second mounting bracket 27 is disposed with a slot 271, and the capacitor C1 is detachably inserted into the slot 271 for electrical connection and connected in series in the test circuit, which is easy to implement and convenient to disassemble and assemble, but not limited thereto, and in some embodiments, the capacitor C1 may also be fixedly mounted in other detachable fixing manners.

In this embodiment, the cabinet body 21 is further provided with a second electrical chamber 24, the second electrical chamber 24 is provided with a main control circuit, and the main control circuit is used for controlling the on/off of the test loop to perform the durability test. The main control circuit can be realized by a PLC controller and the like.

The second electric chamber 24 is provided with an openable third chamber door 241, which facilitates installation and maintenance of the main control circuit, and the second electric chamber 24 is arranged on the left side of the testing chamber 22 (i.e. the upper left portion of the cabinet 21), so that the overall structure is more compact and reasonable, but not limited thereto.

Further, in this embodiment, the cabinet body 21 is further provided with a door opening detection mechanism 28, and the door opening detection mechanism 28 is configured to detect the opening and closing state of the first cavity door 221 and transmit the opening and closing state to the main control circuit to perform on-off control of the test loop, so that when the first cavity door 221 is opened, the test loop is powered off, and the safety is further improved.

In this embodiment, the door opening detection mechanism 28 is disposed inside the first chamber door 221, and may be implemented by a micro switch, a proximity sensor, or the like.

Further, in this embodiment, a touch screen 29 is further provided, the touch screen 29 is connected to the main control circuit, and the touch screen 29 is used for displaying relevant information and setting test parameters (such as power-on time and power-on times).

In this embodiment, the touch screen 29 is disposed on the front side of the cabinet 21 and corresponds to the second electrical chamber 24, and the structure is compact and reasonable, but not limited thereto.

Further, in this embodiment, an ammeter 200 is further disposed on the front side of the cabinet 21, and the ammeter 200 is used to display a current value flowing through the test loop, so as to facilitate to intuitively know the current magnitude of the test loop.

In this embodiment, the ammeter 200 is disposed above the touch screen 9, so that the overall structure is compact and reasonable, but not limited thereto.

In this embodiment, the power source 1 is an ac power source, but is not limited thereto. Preferably, the number of the power supplies 1 is two, and the output voltages of the two power supplies 1 are different, and are respectively 120V and 240V, but not limited thereto, so that the working voltage is selectable, the applicability is improved, and the two power supplies 1 can also supply power together, thereby reducing the load of the power supplies 1 and improving the safety and reliability. Of course, the operating frequencies of the two power supplies 1 may also be different, such as 50Hz and 60Hz, respectively.

In some embodiments, the number of power supplies 1 may be 1 or more than 2.

Furthermore, the number of the test fixture 25, the number of the load resistance unit, the number of the capacitor C1, and the number of the bleed-off resistor Rb are all multiple, in this embodiment, the number of the test fixture 25, the number of the load resistance unit, the number of the capacitor C1, and the number of the bleed-off resistor Rb are all 9, 9 test fixtures 25, the number of the load resistance units, the number of the capacitor C1, and the number of the bleed-off resistor Rb are respectively connected in a one-to-one correspondence manner to form 9 independent test loops, all powered by the power supply 1, so that 9 sets of NTC product tests can be performed simultaneously, and the test efficiency is improved. Of course, in some embodiments, the number of the test fixture 25, the load resistor unit, the capacitor C1, and the bleeder resistor Rb may be set according to actual needs.

The gears of the load resistance units can be the same or different, so that the test device is suitable for more different test requirements.

Preferably, in this embodiment, the resistance box 3 is provided separately from the test equipment 2. The resistance box 3 has large heat dissipation, is separately arranged with the test equipment 2, does not influence the environmental temperature of the test chamber 22, and has better test effect.

During testing, the first chamber door 221 is opened, the NTC product 4 to be tested is fixed on the testing tool 25 and enters the testing loop, the first chamber door 221 is closed, testing parameters are set through the touch screen 29, then testing is started, the main control circuit correspondingly controls the on-off of the testing loop according to the set testing parameters so as to test the durability of the NTC product 4 to be tested, the testing principle is very mature in the prior art, and details are not given.

Of course, in some embodiments, the NTC product durability test system may further include an auxiliary test device 5, as shown in fig. 10 (the auxiliary test device 5 in the figure is only a simple illustration), where the auxiliary test device 5 has substantially the same structure as the test device, and is different from the environment of the test chamber of the auxiliary test device 5 and the environment of the test chamber 22 of the test device 2, for example, the environment of the test chamber of the auxiliary test device 5 is a high-temperature environment, the environment of the test chamber 22 of the test device 2 is a normal-temperature environment, and the auxiliary test device 5 and the test device 2 are switched by the switch to be electrically connected with the power supply 1 and the resistor box 3, so as to implement test loops of different test conditions.

The NTC product durability test device can realize NTC product durability test, adjusts the size of the load resistor by toggling the switch, is convenient to adjust, high in adjustment precision and high in safety, and the whole system is compact and concise in structure.

While the utility model has been particularly shown and described with reference to a preferred embodiment, it will be understood by those skilled in the art that various changes in form and detail may be made therein without departing from the spirit and scope of the utility model as defined by the appended claims.

Claims

1. A durability test system of NTC product which characterized in that: the testing device is used for installing an NTC product to be tested and enabling the NTC product to be tested to be connected into the testing loop, a load resistance unit is arranged in the resistance box and used for providing load resistance in the testing loop, and a toggle switch is arranged on the resistance box and used for adjusting the resistance value of the load resistance unit.

2. The NTC product durability test system of claim 1, wherein: the load resistance unit comprises a plurality of sub-load resistors, the number of the toggle switches is the same as that of the sub-load resistors, and the sub-load resistors are respectively connected in series with the toggle switches one by one and then are connected in parallel.

3. The NTC product durability test system of claim 1, wherein: the test equipment comprises a cabinet body, wherein a test chamber is arranged in the cabinet body, a first chamber door capable of being opened is arranged in the test chamber, and a test tool is arranged in the test chamber and used for fixing an NTC product to be tested so that the NTC product to be tested can be connected into a test loop.

4. The NTC product durability test system of claim 3, characterized in that: the test fixture is provided with a fixing structure, the fixing structure comprises a wiring terminal, and the wiring terminal is used for locking a pin of the NTC product to be tested on the test fixture so as to enable the NTC product to be tested to be connected into the test loop.

5. The NTC product durability test system of claim 3, characterized in that: the test circuit still includes electric capacity and bleeder resistor, and electric capacity and load resistance are parallelly connected to be set up, and the bleeder resistor sets up with electric capacity is parallelly connected, and the cabinet body still is equipped with first electric cavity, and first electric cavity is equipped with the second chamber door that can open, and electric capacity and bleeder resistor detachably set up in first electric cavity.

6. The NTC product durability test system of claim 5, characterized in that: a first mounting bracket is arranged in the first electrical chamber, and the bleeder resistor is detachably fixed on the first mounting bracket and connected in the test loop.

7. The NTC product durability test system of claim 5, characterized in that: and a second mounting bracket is arranged in the first electrical chamber, a slot is formed in the second mounting bracket, and the capacitor is detachably inserted in the slot and connected in the test loop.

8. The NTC product durability test system of claim 3, characterized in that: the cabinet body is also internally provided with a second electric cavity, the second electric cavity is provided with a main control circuit, and the main control circuit is used for controlling the on-off of the test loop.

9. The NTC product durability test system of claim 8, wherein: the cabinet body is also provided with a door opening detection mechanism, and the door opening detection mechanism is used for detecting the opening and closing state of the first cavity door and transmitting the opening and closing state to the main control circuit to carry out on-off control of the test loop.

10. The NTC product durability test system of claim 1, wherein: the number of the power supplies is two, and the output voltages of the two power supplies are different.