CN216599664U - Automatic change test platform device - Google Patents
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- CN216599664U CN216599664U CN202220116137.3U CN202220116137U CN216599664U CN 216599664 U CN216599664 U CN 216599664U CN 202220116137 U CN202220116137 U CN 202220116137U CN 216599664 U CN216599664 U CN 216599664U
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Abstract
The utility model discloses an automatic test platform device, which comprises: the system comprises a singlechip, a display, a DC quick charging interface, an Ethernet, a communication module, a dry contact output interface and a DC310V input detection interface; the output end of a display of the single chip microcomputer is connected with the input end of the display, the output end of a DC quick charging interface of the single chip microcomputer is connected with the input end of the DC quick charging interface, the single chip microcomputer is connected with the Ethernet, the single chip microcomputer is connected with the communication module, and the output end of a dry contact output interface of the single chip microcomputer is connected with the input end of the dry contact output interface; the input end of the DC310V input detection interface of the single chip microcomputer is connected with the output end of the DC310V input detection interface. In the technical scheme, the single chip microcomputer, the display, the DC quick charging interface, the Ethernet, the communication module, the dry contact output interface and the DC310V input detection interface are arranged; the automatic test platform device can simultaneously detect various devices, so that the detection efficiency is improved.
Description
Technical Field
The utility model relates to the technical field of intelligent equipment, in particular to an automatic test platform device.
Background
In the prior art, because various terminal devices have various communication interfaces in the test process, a plurality of different test terminals are needed to test the quality of a produced product, and the plurality of test terminals cannot be well compatible. Therefore, when the terminal to be tested is detected, an operator needs to continuously replace the testing equipment to detect different functions and interfaces on the terminal to be tested, and the detection mode is not only low in efficiency, but also possible to damage the terminal to be tested due to frequent plugging and unplugging of the connector.
SUMMERY OF THE UTILITY MODEL
In view of the above problems, the present application provides an automatic testing platform device to improve the efficiency of product detection.
In order to achieve the above object, the present application provides an automatic test platform device, including: the system comprises a singlechip, a display, a DC quick charging interface, an Ethernet, a communication module, a dry contact output interface and a DC310V input detection interface;
the output end of a display of the single chip microcomputer is connected with the input end of the display, the output end of a DC quick charging interface of the single chip microcomputer is connected with the input end of the DC quick charging interface, the single chip microcomputer is connected with the Ethernet, the single chip microcomputer is connected with the communication module, and the output end of a dry contact output interface of the single chip microcomputer is connected with the input end of the dry contact output interface;
the input end of the DC310V input detection interface of the single chip microcomputer is connected with the output end of the DC310V input detection interface.
In the technical solution of the embodiment of the present application, the communication module includes: an RS232 interface and/or an RS485 interface;
the RS232 interface is connected with the single chip microcomputer, and the RS485 interface is connected with the single chip microcomputer.
In the technical solution of the embodiment of the present application, the DC fast charging interface includes: a DC5V fast charging interface and/or a DC12V fast charging interface;
The output end of a DC5V quick-charging interface of the single chip microcomputer is connected with the input end of a DC5V quick-charging interface, and the output end of a DC12V quick-charging interface of the single chip microcomputer is connected with the input end of a DC12V quick-charging interface.
In the technical solution of the embodiment of the present application, the method further includes: a buzzer; and the buzzer output end of the singlechip is connected with the input end of the buzzer.
In the technical solution of the embodiment of the present application, the method further includes: an AC24V input detection interface and/or an AC220V input detection interface;
the input end of an AC24V input detection interface of the single chip microcomputer is connected with the output end of the AC24V input detection interface, and the input end of an AC220V input detection interface of the single chip microcomputer is connected with the output end of an AC220V input detection interface.
In the technical solution of the embodiment of the present application, the method further includes: an AC220V voltage detection interface and/or an AC24V voltage detection interface;
the input end of the AC220V voltage detection interface of the single chip microcomputer is connected with the output end of the AC220V voltage detection interface, and the input end of the AC24V voltage detection interface of the single chip microcomputer is connected with the output end of the AC24V voltage detection interface.
In the technical solution of the embodiment of the present application, the method further includes: an AC220V with current detection output interface, an AC24V with current detection output interface and/or a DC12V with current detection output interface;
The input end of an AC220V electrified current detection output interface of the single chip microcomputer is connected with the output end of an AC220V electrified current detection output interface, the input end of an AC24V electrified current detection output interface of the single chip microcomputer is connected with the output end of an AC24V electrified current detection output interface, and the input end of a DC12V electrified current detection output interface of the single chip microcomputer is connected with the output end of a DC12V electrified current detection output interface.
In the technical solution of the embodiment of the present application, the method further includes: a DC12V input detection interface and/or a DC5V input detection interface;
the input end of a DC12V input detection interface of the single chip microcomputer is connected with the output end of the DC12V input detection interface, and the input end of a DC5V input detection interface of the single chip microcomputer is connected with the output end of a DC5V input detection interface.
In the technical solution of the embodiment of the present application, the method further includes: the DC12V fan detects the interface, the singlechip with DC12V fan detects interface connection.
Different from the prior art, the technical scheme is characterized in that the singlechip, the display, the DC fast charging interface, the Ethernet, the communication module, the dry contact output interface and the DC310V input detection interface are arranged; the automatic test platform device can simultaneously detect various devices, so that the detection efficiency is improved.
The foregoing description is only an overview of the technical solutions of the present application, and the present application can be implemented according to the content of the description in order to make the technical means of the present application more clearly understood, and the following detailed description of the present application is given in order to make the above and other objects, features, and advantages of the present application more clearly understandable.
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Various additional advantages and benefits will become apparent to those of ordinary skill in the art upon reading the following detailed description of the preferred embodiments. The drawings are only for purposes of illustrating the preferred embodiments and are not to be construed as limiting the application. Also, like parts are designated by like reference numerals throughout the drawings. In the drawings:
FIG. 1 is a block diagram of an automated test platform assembly;
FIG. 2 is a flow chart of an automated test platform apparatus;
FIG. 3 is a first circuit diagram of the automated test platform assembly;
FIG. 4 is a second electrical schematic of the automated test platform apparatus;
FIG. 5 is a third circuit diagram of the automated test platform apparatus;
fig. 6 is a fourth circuit diagram of the automated test platform apparatus.
Detailed Description
Embodiments of the present invention will be described in detail below with reference to the accompanying drawings. The following examples are merely used to more clearly illustrate the technical solutions of the present application, and therefore are only examples, and the protection scope of the present application is not limited thereby.
Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs; the terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the application; the terms "including" and "having," and any variations thereof, in the description and claims of this application and the description of the above figures are intended to cover non-exclusive inclusions.
In the description of the embodiments of the present application, the technical terms "first", "second", and the like are used only for distinguishing different objects, and are not to be construed as indicating or implying relative importance or implicitly indicating the number, specific order, or primary-secondary relationship of the technical features indicated. In the description of the embodiments of the present application, "a plurality" means two or more unless specifically defined otherwise.
Reference herein to "an embodiment" means that a particular feature, structure, or characteristic described in connection with the embodiment can be included in at least one embodiment of the application. The appearances of the phrase in various places in the specification are not necessarily all referring to the same embodiment, nor are separate or alternative embodiments mutually exclusive of other embodiments. It is explicitly and implicitly understood by one skilled in the art that the embodiments described herein can be combined with other embodiments.
In the description of the embodiments of the present application, the term "and/or" is only one kind of association relationship describing the association object, and means that three relationships may exist, for example, a and/or B, and may mean: a exists alone, A and B exist simultaneously, and B exists alone. In addition, the character "/" herein generally indicates that the former and latter associated objects are in an "or" relationship.
In the description of the embodiments of the present application, the term "plurality" refers to two or more (including two), and similarly, "plural sets" refers to two or more (including two sets), "plural pieces" refers to two or more (including two pieces).
In the description of the embodiments of the present application, the terms "center", "longitudinal", "transverse", "length", "width", "thickness", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", "axial", "radial", "circumferential", and the like, indicate orientations and positional relationships that are based on the orientations and positional relationships shown in the drawings, and are used for convenience in describing the embodiments of the present application and for simplification of the description, but do not indicate or imply that the device or element referred to must have a specific orientation, be configured and operated in a specific orientation, and thus, should not be construed as limiting the embodiments of the present application.
In the description of the embodiments of the present application, unless otherwise explicitly stated or limited, the terms "mounted," "connected," "fixed," and the like are used in a broad sense, and for example, may be fixedly connected, detachably connected, or integrated; mechanical connection or electrical connection is also possible; either directly or indirectly through intervening media, either internally or in any other relationship. The specific meanings of the above terms in the embodiments of the present application can be understood by those of ordinary skill in the art according to specific situations.
Referring to fig. 1 to 6, the present application discloses an automatic testing platform device, including: the system comprises a singlechip, a display, a DC quick charging interface, an Ethernet, a communication module, a dry contact output interface and a DC310V input detection interface; the output end of a display of the single chip microcomputer is connected with the input end of the display, the output end of a DC quick charging interface of the single chip microcomputer is connected with the input end of the DC quick charging interface, the single chip microcomputer is connected with the Ethernet, the single chip microcomputer is connected with the communication module, and the output end of a dry contact output interface of the single chip microcomputer is connected with the input end of the dry contact output interface; the input end of the DC310V input detection interface of the single chip microcomputer is connected with the output end of the DC310V input detection interface.
The Single-Chip Microcomputer is an integrated circuit Chip, is a small and perfect Microcomputer system formed by integrating functions of a central processing unit CPU with data processing capacity, a random access memory RAM, a read-only memory ROM, various I/O ports, interrupt systems, timers/counters and the like on a silicon Chip by adopting a super large scale integrated circuit technology, and is widely applied to the field of industrial control.
The single chip microcomputer is also called a single chip microcontroller, and is not a chip for completing a certain logic function, but a computer system is integrated on one chip. Compared with a computer, the single chip microcomputer is only short of I/O equipment.
The display is used for receiving the signal sent by the singlechip and forming an image, and the display can adopt an LCD display screen or an LED display screen. In this embodiment, the input end of the display is connected with the display output end of the single chip microcomputer, the single chip microcomputer outputs signals to the display, and the display screen displays data measured by the display device. Specifically, the display screen can display not only the current test state, but also the display results of the automated test platform device and the terminal to be tested.
Referring to fig. 3, the DC fast charging interface includes: the fast charging system comprises a DC5V fast charging interface (namely a 5v fast charging inlet in fig. 2) and a DC12V fast charging interface (namely a 12v fast charging inlet in fig. 2), wherein the output end of the DC5V fast charging interface of the single chip microcomputer is connected with the input end of the DC5V fast charging interface, and the output end of the DC12V fast charging interface of the single chip microcomputer is connected with the input end of the DC12V fast charging interface.
The DC5V quick charging interface is composed of 3 constant current charging triodes, and can provide a charging speed of about 600 mA. The quick interface is mainly applied to the condition that the terminal has 5V power supply inversion, the charging current of the terminal is too small, and the quick interface can quickly fully charge the power and accelerate the test.
The DC12V quick charging interface is composed of 3 constant current charging triodes and can provide a charging speed of about 600 mA. The quick interface is mainly applied to the condition that the terminal has 12V power supply inversion, the charging current of the terminal is too small, and the quick interface can be quickly full of electricity to achieve the voltage required by inversion and accelerate the test speed.
Referring to fig. 4, the ethernet is a computer local area network technology, since many terminals have the ethernet connection function, and the smart terminal can communicate with the terminal to be tested through the internet access. The two advantages are that one can judge whether the network port function of the tested terminal is normal through the network port connection, and the second can collect the data of the tested terminal through the network port, so that whether the function and the data on the board are abnormal can be directly judged.
The communication module includes: an RS232 interface and an RS485 interface; the RS232 interface is connected with the single chip microcomputer, and the RS485 interface (namely 485 communication in figure 2) is connected with the single chip microcomputer.
The RS232 interface is one of the current popular serial communication interfaces, full-duplex communication can be realized by using at least 3 lines, the transmission distance of the RS232 interface is far away from the TTL level, and the RS232 interface can transmit 30 meters in an ideal state and flexibly select the baud rate of communication.
The automatic test platform device also provides 3 paths of RS485 interfaces, and the RS485 interfaces have the characteristics of strong anti-interference capability and long transmission distance, and can support 128 transceivers at most to enable the transceivers to become preferred serial interfaces. The 3 paths of RS485 interfaces can be connected with tested terminals and can also be connected with other RS485 equipment. And the 3 paths of RS485 interfaces all provide 12V power supply, so that when the external equipment is connected, the external equipment can directly work without additionally providing power supply for the external equipment.
The output interface of the dry contact is 5 paths, when the tested terminal has the requirement of multi-path switching value input detection, the 5 output interfaces of the dry contact can completely meet the requirement of testing, and the multi-path switches on the tested terminal are synchronously detected. Whether the switch on the tested terminal and the expansion board has faults can be clearly detected through the dry contact output interface test platform.
Referring to fig. 3, in practical use, since the frequency of the DC310V input detection interface on the board is low, only one DC310V input detection interface needs to be provided in the present application.
In the technical scheme, the singlechip, the display, the DC fast charging interface, the Ethernet, the communication module, the dry contact output interface and the DC310V input detection interface are arranged; the automatic test platform device can simultaneously detect various devices, so that the detection efficiency is improved.
In fig. 1, arrows are used to indicate the direction of data flow; that is, taking an arrow between the single chip microcomputer and the display screen as an example, the single chip microcomputer can send instruction information to the display screen, and the display screen is used for receiving an instruction sent by the single chip microcomputer; taking an arrow between the single chip microcomputer and the RS485 interface as an example, the single chip microcomputer can send information such as instructions and data to the RS485 interface, the RS485 interface receives information such as instructions and data sent by the single chip microcomputer, and similarly, the RS485 interface can also send information such as data and instructions to the single chip microcomputer, and the single chip microcomputer can also receive information such as instructions and data sent by the RS485 interface.
According to some embodiments of the present application, referring to fig. 1, further comprising: a buzzer; and the buzzer output end of the singlechip is connected with the input end of the buzzer. The buzzer has the main function that when a certain item or a certain interface of the tested terminal goes wrong, an alarm is started when a final result is displayed.
Specifically, the buzzer is used for triggering the alarm function of the single chip microcomputer when the single chip microcomputer receives abnormal information when the equipment detects abnormality, so that an alarm is given out, and nearby workers can hear the alarm immediately, so that the response measures can be taken quickly.
According to some embodiments of the present application, referring to fig. 3 and 5, further comprising: an AC24V input detection interface and/or an AC220V input detection interface; the input end of an AC24V input detection interface of the single chip microcomputer is connected with the output end of the AC24V input detection interface, and the input end of an AC220V input detection interface of the single chip microcomputer is connected with the output end of an AC220V input detection interface.
When the tested terminal or expansion board has a 24V interface, the single chip microcomputer can receive the real-time state of the 24V interface on the tested terminal or expansion board through the AC24V input detection interface, and then judges whether the tested terminal product or the expansion board has a fault.
The number of the AC220V input detection interfaces is 6, and because the tested terminal product and the expansion board are both provided with the AC220V output interfaces, the AC220V input detection interface test platform can clearly detect whether the AC220V output interfaces on the tested terminal and the expansion board are in failure.
According to some embodiments of the present application, referring to fig. 3, 5 and 6, the automated test platform assembly further comprises: an AC220V voltage detection interface and/or an AC24V voltage detection interface; the input end of the AC220V voltage detection interface of the single chip microcomputer is connected with the output end of the AC220V voltage detection interface, and the input end of the AC24V voltage detection interface of the single chip microcomputer is connected with the output end of the AC24V voltage detection interface.
When the tested terminal or expansion board has an AC24V voltage interface, the single chip microcomputer can receive the AC24V voltage interface on the tested terminal or expansion board through the AC24V voltage detection interface, and further judge whether the tested terminal product or expansion board has a fault.
When the tested terminal or expansion board has an AC220V voltage interface, the single chip microcomputer can receive the AC220V voltage interface on the tested terminal or expansion board through the AC220V voltage detection interface, and further judge whether the tested terminal product or expansion board has a fault.
According to some embodiments of the present application, referring to fig. 3 and 6, the automated test platform assembly further comprises: the system comprises an AC220V with current detection output interface, an AC24V with current detection output interface and/or a DC12V with current detection output interface; the input end of an AC220V electrified current detection output interface of the single chip microcomputer is connected with the output end of an AC220V electrified current detection output interface, the input end of an AC24V electrified current detection output interface of the single chip microcomputer is connected with the output end of an AC24V electrified current detection output interface, and the input end of a DC12V electrified current detection output interface of the single chip microcomputer is connected with the output end of a DC12V electrified current detection output interface.
When the test current is needed, the automatic test platform device can compare the read current value with the actual load current value on the tested terminal or the expansion board, and can know whether the current and the voltage on the tested terminal board are normal or not through the method.
Specifically, the AC220V with the current detection output interface on the test platform is docked with the AC220V input interface of the terminal under test, so that whether the AC220V input interface of the terminal under test fails can be quickly detected; the AC24V with current detection output interface on the test platform is in butt joint with the AC24V input interface of the tested terminal, so that whether the AC24V input interface of the tested terminal fails or not can be quickly detected; the DC12V with the current detection output interface on the test platform is in butt joint with the DC12V input interface of the tested terminal, so that whether the DC12V input interface of the tested terminal fails or not can be quickly detected.
According to some embodiments of the present application, referring to fig. 6, further comprising: a DC12V input detection interface and/or a DC5V input detection interface; the input end of a DC12V input detection interface of the single chip microcomputer is connected with the output end of the DC12V input detection interface, and the input end of a DC5V input detection interface of the single chip microcomputer is connected with the output end of a DC5V input detection interface.
The DC12V input detection interface is 6 paths, and when a tested terminal is provided with a plurality of paths of 12V output interfaces, the plurality of paths of DC12V input detection interfaces can simultaneously detect a plurality of 12V output interfaces on the tested terminal; specifically, the DC12V input detection interface on the test platform is docked with the 12V output interface of the terminal under test, so that whether the 12V output interface of the terminal under test fails can be quickly detected.
The DC5V input detection interface is 2 paths, and when a plurality of paths of 5V output interfaces are arranged on the tested terminal, the plurality of paths of DC5V input detection interfaces can simultaneously detect a plurality of 5V output interfaces on the tested terminal; specifically, the DC5V input detection interface on the test platform is docked with the 5V output interface of the terminal under test, so that whether the 5V output interface of the terminal under test fails can be quickly detected.
According to some embodiments of the present application, referring to fig. 4, further comprising: the DC12V fan detects the interface, the singlechip with DC12V fan detects interface connection.
The DC12V fan detection interface is 6 paths, and the DC12V fan detection interface can be connected with a fan interface on a terminal to be tested at the same time; specifically, the DC12V fan detection interface on the test platform is docked with the fan interface of the terminal under test, so that whether the fan interface of the terminal under test fails can be quickly detected, that is, whether the power supply of the 12V fan interface on the terminal under test is normal is determined. Of course, in some implementations, the DC12V fan detection interface also provides an analog speed interface to verify that the fan is operating properly.
In some embodiments, the automated test platform apparatus further comprises: the output end of the DC12V output detection interface is connected with the input end of the DC12V output detection interface on the single chip microcomputer, and because a plurality of tested terminals are supplied with power by 12V, the 12V upper surface also has a rated load, and the power supply from the interface to the terminals can know the power consumption of the tested terminals and can also check whether the load current output by 12V on the board is normal.
It should be further described that, referring to fig. 2, when the testing platform detects the terminal or the expansion board, first, the ethernet of the testing platform is connected to the ethernet interface of the terminal to be tested, and whether the ethernet of the terminal to be tested is abnormal is determined, if not, the testing is continuously performed, and if so, the single chip drives the buzzer to alarm, and then drives the display screen to display the testing result.
The output interface of the tested terminal is connected with each input interface of the test platform, and data is collected to judge whether the output of the terminal product is abnormal or not; if the abnormal condition exists, the singlechip drives the buzzer to alarm, and then drives the display screen to display a detection result; if there is no abnormality, the detection is terminated. The output interface of the tested terminal is connected with each output interface of the test platform, and data are collected to judge whether the input of the terminal product is abnormal or not; if the abnormal condition exists, the singlechip drives the buzzer to alarm, and then drives the display screen to display a detection result; if there is no abnormality, the detection is terminated.
When the charging interface is detected, connecting the DC12V quick charging interface of the test platform with the 12V charging interface of the tested terminal to judge whether the charging interface of the terminal product is abnormal or not; if the detected terminal is abnormal and the 5V charging interface of the detected terminal is continuously detected to be abnormal, if the detected terminal is abnormal, the single chip microcomputer drives the display screen to display a detection result. Because some tested terminals may only have 5V charging interfaces, after 12V charging interfaces are detected, the 5V charging interfaces need to be detected. If the 5V charging interface is detected to be abnormal, the single chip microcomputer drives the display screen to display a detection result; if the 5V charging interface is detected to be abnormal, the single chip microcomputer drives the display screen to display a detection result.
An RS485 interface of a tested terminal is connected with the RS485 interface to collect data of the tested terminal, and then the singlechip drives the buzzer to alarm and further drives the display screen to display a detection result; if there is no abnormality, the detection is terminated.
Connecting a fan interface of a tested terminal with a DC12V fan detection interface of a test platform, and collecting the state of the fan to judge whether the fan of a terminal product is normally started; if the buzzer is started normally, the single chip microcomputer further judges whether the fan rotating speed can be detected or not, if the fan rotating speed is detected, the single chip microcomputer drives the display screen to display the fan rotating speed, if the fan rotating speed is not detected, a fan fault alarm is generated, then the single chip microcomputer drives the buzzer to give an alarm, and further the single chip microcomputer drives the display screen to display a detection result.
Finally, it should be noted that: the above embodiments are only used to illustrate the technical solutions of the present application, and not to limit the same; although the present application has been described in detail with reference to the foregoing embodiments, those of ordinary skill in the art will understand that: the technical solutions described in the foregoing embodiments may still be modified, or some or all of the technical features may be equivalently replaced; such modifications and substitutions do not depart from the spirit and scope of the present disclosure, and the present disclosure should be construed as being covered by the claims and the specification. In particular, the technical features mentioned in the embodiments can be combined in any way as long as there is no structural conflict. The present application is not intended to be limited to the particular embodiments disclosed herein but is to cover all embodiments that may fall within the scope of the appended claims.
Claims (9)
1. An automated test platform apparatus, comprising: the system comprises a singlechip, a display, a DC quick charging interface, an Ethernet, a communication module, a dry contact output interface and a DC310V input detection interface;
the output end of a display of the single chip microcomputer is connected with the input end of the display, the output end of a DC quick charging interface of the single chip microcomputer is connected with the input end of the DC quick charging interface, the single chip microcomputer is connected with the Ethernet, the single chip microcomputer is connected with the communication module, and the output end of a dry contact output interface of the single chip microcomputer is connected with the input end of the dry contact output interface;
The input end of the DC310V input detection interface of the single chip microcomputer is connected with the output end of the DC310V input detection interface.
2. The automated test platform device of claim 1, wherein the communication module comprises: an RS232 interface and/or an RS485 interface;
the RS232 interface is connected with the single chip microcomputer, and the RS485 interface is connected with the single chip microcomputer.
3. The automated test platform device of claim 1, wherein the DC fast charging interface comprises: a DC5V fast charging interface and/or a DC12V fast charging interface;
the output end of a DC5V quick-charging interface of the single chip microcomputer is connected with the input end of a DC5V quick-charging interface, and the output end of a DC12V quick-charging interface of the single chip microcomputer is connected with the input end of a DC12V quick-charging interface.
4. The automated test platform device of claim 1, further comprising: a buzzer; and the buzzer output end of the singlechip is connected with the input end of the buzzer.
5. The automated test platform assembly of claim 1, further comprising: an AC24V input detection interface and/or an AC220V input detection interface;
the input end of an AC24V input detection interface of the single chip microcomputer is connected with the output end of the AC24V input detection interface, and the input end of an AC220V input detection interface of the single chip microcomputer is connected with the output end of an AC220V input detection interface.
6. The automated test platform device of claim 1, further comprising: an AC220V voltage detection interface and/or an AC24V voltage detection interface;
the input end of the AC220V voltage detection interface of the single chip microcomputer is connected with the output end of the AC220V voltage detection interface, and the input end of the AC24V voltage detection interface of the single chip microcomputer is connected with the output end of the AC24V voltage detection interface.
7. The automated test platform device of claim 1, further comprising: the system comprises an AC220V with current detection output interface, an AC24V with current detection output interface and/or a DC12V with current detection output interface;
the input end of an AC220V with current detection output interface of the single chip microcomputer is connected with the output end of an AC220V with current detection output interface, the input end of an AC24V with current detection output interface of the single chip microcomputer is connected with the output end of an AC24V with current detection output interface, and the input end of a DC12V with current detection output interface of the single chip microcomputer is connected with the output end of a DC12V with current detection output interface.
8. The automated test platform device of claim 1, further comprising: a DC12V input detection interface and/or a DC5V input detection interface;
The input end of a DC12V input detection interface of the single chip microcomputer is connected with the output end of the DC12V input detection interface, and the input end of a DC5V input detection interface of the single chip microcomputer is connected with the output end of the DC5V input detection interface.
9. The automated test platform device of claim 1, further comprising: the fan detection device comprises a DC12V fan detection interface, and the single chip microcomputer is connected with the DC12V fan detection interface.
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| Application Number | Priority Date | Filing Date | Title |
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| CN202220116137.3U CN216599664U (en) | 2022-01-17 | 2022-01-17 | Automatic change test platform device |
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| Application Number | Priority Date | Filing Date | Title |
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| CN202220116137.3U CN216599664U (en) | 2022-01-17 | 2022-01-17 | Automatic change test platform device |
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| CN202220116137.3U Active CN216599664U (en) | 2022-01-17 | 2022-01-17 | Automatic change test platform device |
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| CN (1) | CN216599664U (en) |
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Effective date of registration: 20240510 Address after: No.45 Guoyang, Rongqiao village, Shangjie Town, Minhou County, Fuzhou City, Fujian Province, 350100 Patentee after: Fuzhou Yixiang telecommunication Co.,Ltd. Country or region after: China Address before: 350108 Chaozhi, 13 / F, Zhongqing building, Haixi science and Technology Park, Shangjie Town, Minhou County, Fuzhou City, Fujian Province Patentee before: FUJIAN SUPWIT GROUP CO.,LTD. Country or region before: China |